TW201329661A - Pressure control system and method - Google Patents

Pressure control system and method Download PDF

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TW201329661A
TW201329661A TW101100331A TW101100331A TW201329661A TW 201329661 A TW201329661 A TW 201329661A TW 101100331 A TW101100331 A TW 101100331A TW 101100331 A TW101100331 A TW 101100331A TW 201329661 A TW201329661 A TW 201329661A
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positive pressure
test
pressure
vacuum
solenoid valve
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TW101100331A
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TWI490673B (en
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Kuang-Hsiang Liu
Li-Ming Cheng
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King Yuan Electronics Co Ltd
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Abstract

The present invention discloses a test pressure control system and method, and particularly discloses a test pressure control system and method capable of transferring the test pressure into vacuum (or negative pressure) and transferring the test pressure into positive pressure. The test pressure control system comprises a vacuum control module for providing vacuum and a positive pressure control module for providing positive pressure. Therefore, the test pressure control system has both functions of providing vacuum to test device (or area) and providing positive pressure to test device (or area). The test pressure control system is cheaper than the conventional test pressure control system because both of vacuum control module and positive pressure control module are fabricated by the cheap components, for example electrically-controlled proportioning valve and solenoid valve. Therefore, the cost of testing is decreased significantly by the test pressure control system.

Description

測試壓力控制系統與方法Test pressure control system and method

  本發明提供一種測試壓力控制系統與方法,特別是有關一種可以在真空(或負壓)與正壓之間切換的測試壓力控制系統與方法。The present invention provides a test pressure control system and method, and more particularly to a test pressure control system and method that can be switched between vacuum (or negative pressure) and positive pressure.

  隨著積體電路元件(IC)與微機電元件(MEMS)發展的日新月異,越來越多具有不同功能與種類的IC與MEMS被設計與發展出來,而所需要的測試環境與條件也越來越多樣與繁複。特別是針對不同的種類的IC或MEMS所需要的測試壓力也不同,有的需要在真空下進行測試,有的需要在高壓下進行測試,但是一般的測試機台往往只能提供一特定的壓力進行測試,例如真空、或是一特定的正壓,但是並無法對真空度或正壓進行分段的控制,也無法進行真空與正壓的切換,所以也就不能提供同一測試機台不同的測試壓力(真空與正壓)對待測元件進行測試,而使得傳統的測試機台無法兼具真空下測試與正壓下進行測試的功能。With the rapid development of integrated circuit components (ICs) and microelectromechanical components (MEMS), more and more ICs and MEMS with different functions and types have been designed and developed, and the required test environments and conditions are also coming. The more diverse and complex. In particular, the test pressures required for different types of ICs or MEMS are different. Some need to be tested under vacuum, and some need to be tested under high pressure, but the general test machine often only provides a specific pressure. Test, such as vacuum, or a specific positive pressure, but can not control the vacuum or positive pressure, and can not switch between vacuum and positive pressure, so it can not provide the same test machine different The test pressure (vacuum and positive pressure) is tested on the component to be tested, so that the traditional test machine can not combine the test under vacuum and the test under positive pressure.

  有鑑於此,目前已經發展出來可以分段控制不同的真空度或正壓的測試機台,而提供不同的真空度或正壓對各種IC與MEMS進行測試,但這類的測試機台往往需要價格昂貴以及構造複雜的特殊真空幫浦或壓力控制系統,才能達到分段控制真空度或正壓的效果,這些昂貴的設備對於測試成本來說是很大的負擔,並且對於現今降低測試成本(cost down)的要求來說是相互違背的。其次,這類的測試機台仍然無法在同一機台上進行真空與正壓之間的切換,而無法同時具有提供真空進行測試以及提供正壓進行測試的功能,而僅能單獨對於真空度進行分段控制,或僅能對於正壓進行分段控制。然而,對於很多IC或MEMS來說是需要在真空與正壓下進行測試的,特別是一些壓力感測器(pressure sensor)或壓力感測元件等需要在數種不同的測試壓力下進行測試,尤其是同時需要在真空與正壓下進行測試,因此,往往需要在不同的測試機台上進行測試,這些昂貴的測試機台與在具有不同測試壓力測試機台之間轉換所需的時間,不但增加了測試的時間與成本,更降低了測試的產能。In view of this, it has been developed to test different vacuum or positive pressure test machines in stages, and provide different vacuum or positive pressure to test various ICs and MEMS, but such test machines often need High-cost and complex vacuum pumps or pressure control systems can achieve segmental control of vacuum or positive pressure. These expensive equipment are a heavy burden for test costs and reduce test costs today ( The cost down) requirements are mutually exclusive. Secondly, such test machines are still unable to switch between vacuum and positive pressure on the same machine, and cannot simultaneously provide vacuum for testing and positive pressure for testing, but only for vacuum. Segmentation control, or segmentation control only for positive pressure. However, for many ICs or MEMS, it is necessary to test under vacuum and positive pressure. In particular, some pressure sensors or pressure sensing components need to be tested under several different test pressures. In particular, it is necessary to test under vacuum and positive pressure at the same time. Therefore, it is often necessary to test on different test machines. The time required for these expensive test machines to be converted between machines with different test pressure tests, Not only increases the time and cost of testing, but also reduces the productivity of the test.

  因此,亟需要一種可以結構與組裝簡單、可以在真空(或負壓)與正壓之間切換而同時具有提供真空進行測試以及正壓進行測試的功能、以及低成本的測試壓力控制系統來降低測試的成本與時間,並且增加測試的產能。Therefore, there is a need for a test pressure control system that can be structurally and simply assembled, can be switched between vacuum (or negative pressure) and positive pressure, while providing vacuum for testing and positive pressure testing, and a low-cost test pressure control system. Test the cost and time and increase the capacity of the test.

  本發明之一目的為提供一種結構與組裝簡單、以及低成本的測試壓力控制系統,可以在真空(或負壓)與正壓之間切換而同時具有提供給同一測試機台真空測試以及正壓測試的功能,並且可以對真空與正壓進行分段控制。It is an object of the present invention to provide a test pressure control system that is simple in construction and assembly, and low in cost, and can be switched between vacuum (or negative pressure) and positive pressure while providing vacuum test and positive pressure to the same test machine. The function of the test, and the vacuum and positive pressure can be segmented.

  本發明之一目的為提供一種測試壓力控制方法,藉由一結構與組裝簡單、以及低成本的測試壓力控制系統而可以提供真空(或負壓)與正壓給同一測試機台對IC或MEMS(壓力感測器或壓力感測元件)進行測試,並且可以對真空與正壓進行分段控制。It is an object of the present invention to provide a test pressure control method which can provide vacuum (or negative pressure) and positive pressure to the same test machine pair IC or MEMS by a simple and low-cost test pressure control system. (Pressure sensor or pressure sensing element) is tested and segmented control of vacuum and positive pressure.

  根據本發明之一目的,本發明提供一種測試壓力控制系統,包含:一真空控制機構與一測試區連接,用以控制測試區對待測元件進行測時的真空度或負壓;以及一正壓控制機構與測試區連接,用以控制測試區對待測元件進行測時的正壓,其中,測試壓力控制系統可以依照待測元件的種類以及所需測試壓力(真空度與正壓),在真空控制機構與正壓控制機構之間切換,以提供測試區對待測元件測試時所需的真空度(或負壓)與壓力(或正壓)。當在真空(或負壓)下進行測試時,真空控制機構會與測試區連通而提供一預設的真空度(或負壓),並且正壓控制機構會關閉而不與測試區連通,以避免干擾測試區的真空度。當在正壓下進行測試時,正壓控制機構會與測試區連通而提供一預設的正壓,並且真空控制機構會關閉而不與測試區連通,以避免干擾測試區的壓力。由於真空控制機構與正壓控制機構皆為價格低廉的比例閥與電磁閥依照一特殊設計的配置而組裝而成,所以此測試壓力控制系統不但價格低廉、組裝容易,且兼具提供真空(或負壓)與正壓進行測試的功能。According to an aspect of the present invention, there is provided a test pressure control system comprising: a vacuum control mechanism coupled to a test zone for controlling a vacuum or a negative pressure of a test component to be tested; and a positive pressure The control mechanism is connected to the test area for controlling the positive pressure during the test area of the test component, wherein the test pressure control system can be in accordance with the type of the component to be tested and the required test pressure (vacuum and positive pressure) in the vacuum The control mechanism is switched between the control mechanism and the positive pressure control mechanism to provide the vacuum (or negative pressure) and pressure (or positive pressure) required for testing the component to be tested in the test zone. When testing under vacuum (or negative pressure), the vacuum control mechanism communicates with the test zone to provide a predetermined degree of vacuum (or negative pressure), and the positive pressure control mechanism is closed without communicating with the test zone. Avoid interference with the vacuum in the test area. When testing under positive pressure, the positive pressure control mechanism will communicate with the test zone to provide a predetermined positive pressure, and the vacuum control mechanism will be closed without communicating with the test zone to avoid interference with the pressure in the test zone. Since the vacuum control mechanism and the positive pressure control mechanism are assembled according to a special design configuration of the low-cost proportional valve and the electromagnetic valve, the test pressure control system is not only inexpensive, easy to assemble, but also provides vacuum (or Negative pressure) and positive pressure test function.

  根據本發明之另一目的,本發明提供一種測試壓力控制系統,步驟包含:(1)提供一測試壓力系統,其中,測試壓力控制系統包含一由一抽氣幫浦、一真空比例閥、以及一真空電磁閥等價格低廉且組裝簡單的零件所組成的真空控制機構,與一由一正壓供給源、至少一正壓比例閥、一第一正壓電磁閥、以及一第二正壓電磁閥等價格低廉且組裝簡單的零件組成的正壓控制機構;(2)真空控制步驟,藉由抽氣幫浦對一測試區抽氣而控制測試區達到預定的真空度; (3)正壓控制步驟,藉由正壓供給源對測試區打氣而控制測試區達到預定的正壓;以及(4)洩壓步驟,藉由打開第二正壓電磁閥,而使得測試區與外部大氣連通,而讓測試區與外部大氣壓力達成平衡。其中,測試壓力控制系統在由步驟(2)真空控制步驟對測試區提供預設的真空或負壓進行測試,轉換成進行步驟(3)正壓控制步驟對測試區提供預設的正壓進行測試之前,需要先進行步驟(4)洩壓步驟以避免由真空(或負壓)轉換成正壓時,過度急速地打氣或充氣而對測試區中的待測元件造成傷害。同樣的,測試壓力控制系統在由步驟(3)正壓控制步驟對測試區提供預設的正壓進行測試,轉換成進行步驟(2)真空控制步驟對測試區提供預設的真空或負壓進行測試之前,需要先進行步驟(4)洩壓步驟以避免由正壓轉換成真空(或負壓)時,過度急速地抽氣而對測試區中的待測元件造成傷害。藉由價格低廉的比例閥與電磁閥配置成的真空控制機構與正壓控制機構構成一測試壓力控制系統,可以讓同一個測試機台(或測試區)可以在真空(負壓)與正壓之間自由轉換,而使其兼具真空(負壓)下進行測試與正壓下進行測試的測試壓力控制方法。According to another aspect of the present invention, the present invention provides a test pressure control system, the steps comprising: (1) providing a test pressure system, wherein the test pressure control system comprises a pumping pump, a vacuum proportional valve, and a vacuum control mechanism composed of a low-cost and simple-assembled component such as a vacuum solenoid valve, and a positive pressure supply source, at least a positive pressure proportional valve, a first positive pressure solenoid valve, and a second positive pressure electromagnetic a positive pressure control mechanism consisting of a valve and other components that are inexpensive and simple to assemble; (2) a vacuum control step that controls the test zone to reach a predetermined degree of vacuum by pumping a test zone; (3) positive pressure a control step of controlling the test zone to reach a predetermined positive pressure by pumping the test zone with a positive pressure supply; and (4) a pressure relief step of connecting the test zone to the outside atmosphere by opening the second positive pressure solenoid valve Let the test area balance with the external atmospheric pressure. Wherein, the test pressure control system tests the preset vacuum or negative pressure of the test zone by the vacuum control step of step (2), and converts to perform the step (3) positive pressure control step to provide a preset positive pressure to the test zone. Before the test, the step (4) pressure relief step is required to avoid excessively rapid airing or inflation when the vacuum (or negative pressure) is converted into a positive pressure to cause damage to the component to be tested in the test area. Similarly, the test pressure control system tests the test zone with a preset positive pressure by the step (3) positive pressure control step, and converts it into a step (2) vacuum control step to provide a preset vacuum or negative pressure to the test zone. Before performing the test, the step (4) pressure relief step is required to avoid excessively rapid pumping of the device under test to cause damage to the component to be tested in the test zone when the positive pressure is converted into a vacuum (or a negative pressure). The vacuum control mechanism and the positive pressure control mechanism configured by the low-cost proportional valve and the solenoid valve constitute a test pressure control system, so that the same test machine (or test zone) can be under vacuum (negative pressure) and positive pressure The test pressure control method is freely convertible, and it is tested under vacuum (negative pressure) and tested under positive pressure.

  因此,本發明提供了一種測試壓力控制系統與方法,其藉由一價格低廉且配置簡單的比例閥與電磁閥的配置組合,提供測試機台可以在真空(負壓)與正壓之間自由轉換,並且兼具提供與控制真空(負壓)進行測試以及提供與控制正壓進行測試的功能,進而降低測試成本與時間,並且增加測試產率。Accordingly, the present invention provides a test pressure control system and method that provides a test machine that can be free between vacuum (negative pressure) and positive pressure by a combination of a low cost and simple configuration of a proportional valve and a solenoid valve. Conversion, and both provide and control vacuum (negative pressure) for testing and provide control and control of positive pressure for testing, thereby reducing test cost and time, and increasing test yield.

  本發明的一些實施例詳細描述如下。然而,除了該詳細描述外,本發明還可以廣泛地在其他的實施例施行。亦即,本發明的範圍不受已提出之實施例的限制,而以本發明提出之申請專利範圍為準。其次,當本發明之實施例圖示中的各元件或步驟以單一元件或步驟描述說明時,不應以此作為有限定的認知,即如下之說明未特別強調數目上的限制時本發明之精神與應用範圍可推及多數個元件或結構並存的結構與方法上。再者,在本說明書中,各元件之不同部分並沒有完全依照尺寸繪圖,某些尺度與其他相關尺度相比或有被誇張或是簡化,以提供更清楚的描述以增進對本發明的理解。而本發明所沿用的現有技藝,在此僅做重點式的引用,以助本發明的闡述。Some embodiments of the invention are described in detail below. However, the present invention may be widely practiced in other embodiments in addition to the detailed description. That is, the scope of the present invention is not limited by the embodiments of the present invention, and the scope of the patent application proposed by the present invention shall prevail. In the following, when the elements or steps in the embodiments of the present invention are described in a single element or step description, the present invention should not be construed as limiting, that is, the following description does not particularly emphasize the numerical limitation. The spirit and scope of application can be derived from the structure and method in which many components or structures coexist. In addition, in the present specification, the various parts of the elements are not drawn in full accordance with the dimensions, and some dimensions may be exaggerated or simplified compared to other related dimensions to provide a clearer description to enhance the understanding of the present invention. The prior art of the present invention, which is used in the prior art, is only referred to herein by reference.

  參照第一圖,其為本發明之一實施例之測試壓力控制系統100的簡單示意圖。測試壓力控制系統100藉由一管路與一測試機台或一測試機台上的測試區400連接。測試壓力控制系統100包含一真空控制機構200,用以提供與控制測試區400對待測元件進行測時的真空度或負壓,以及一正壓控制機構300,用以提供與控制測試區400對待測元件進行測時的正壓。因此,測試壓力控制系統100可以在真空控制機構200與正壓控制機構300之間切換,而依照所需的測試真空度(或負壓)與壓力(正壓),而提供測試區400對待測元件測試時所需的真空度(或負壓)與壓力(正壓),特別是提供壓力感測器或壓力感測元件由真空(或負壓)到正壓(或高壓)的測試。其中,真空控制機構200與正壓控制機構300可以藉由同一管路與測試區400(或測試機台)連接,而分別提供測試區400(或測試機台)真空(或負壓)與正壓(或高壓)進行測試,如第一圖所示,但是真空控制機構與正壓控制機構也可以分別藉由不同的管路與測試區 (或測試機台)連接,而分別提供測試區 (或測試機台)真空(或負壓)與正壓(或高壓)進行測試。Referring to the first figure, which is a simplified schematic diagram of a test pressure control system 100 in accordance with one embodiment of the present invention. The test pressure control system 100 is coupled to a test station or test area 400 on a test machine by a conduit. The test pressure control system 100 includes a vacuum control mechanism 200 for providing a vacuum or negative pressure for measuring the component to be tested in the test zone 400, and a positive pressure control mechanism 300 for providing and controlling the test zone 400. The positive pressure of the measuring component is measured. Therefore, the test pressure control system 100 can switch between the vacuum control mechanism 200 and the positive pressure control mechanism 300, and provide the test zone 400 to be tested according to the required test vacuum (or negative pressure) and pressure (positive pressure). The degree of vacuum (or negative pressure) and pressure (positive pressure) required for component testing, in particular, the provision of a pressure sensor or pressure sensing element from vacuum (or negative pressure) to positive pressure (or high pressure). Wherein, the vacuum control mechanism 200 and the positive pressure control mechanism 300 can be connected to the test zone 400 (or the test machine) by the same pipeline, and respectively provide the test zone 400 (or test machine) vacuum (or negative pressure) and positive Pressing (or high pressure) for testing, as shown in the first figure, but the vacuum control mechanism and the positive pressure control mechanism can also be connected to the test area (or test machine) by different pipes, respectively, and the test areas are respectively provided. Or test machine) vacuum (or negative pressure) and positive pressure (or high pressure) for testing.

  參照第二圖,其為測試壓力控制系統100的詳細配置的示意圖。測試壓力控制系統100中的真空控制機構200包含一抽氣幫浦202,用以對測試區400進行抽氣而提供測試區400所需的真空度(或負壓),一真空比例閥204,用以調節抽氣幫浦202對測試區400的抽氣量,而調節控制測試區400內的真空度(或負壓),以及一真空電磁閥206,用以控制抽氣幫浦202是否與測試區400連通,而控制真空控制機構200(或抽氣幫浦202)是否對測試區400進行抽真空。抽氣幫浦202與真空比例閥204以管路相互連接,真空電磁閥206則介於真空比例閥204與測試區400之間,而分別以管路與真空比例閥204和測試區400連接。Referring to the second figure, it is a schematic diagram of a detailed configuration of the test pressure control system 100. The vacuum control mechanism 200 in the test pressure control system 100 includes a pumping pump 202 for pumping the test zone 400 to provide the vacuum (or negative pressure) required for the test zone 400, a vacuum proportional valve 204, For adjusting the pumping amount of the pumping pump 202 to the test zone 400, and adjusting the vacuum degree (or negative pressure) in the control test zone 400, and a vacuum solenoid valve 206 for controlling whether the pumping pump 202 is tested and tested. The zone 400 is in communication and the vacuum control mechanism 200 (or the pumping pump 202) is controlled to evacuate the test zone 400. The pumping pump 202 and the vacuum proportional valve 204 are connected to each other by a pipeline. The vacuum solenoid valve 206 is interposed between the vacuum proportional valve 204 and the test zone 400, and is connected to the vacuum proportional valve 204 and the test zone 400 by a pipeline, respectively.

  當測試區400需要真空或負壓進行測試時,真空比例閥204與真空電磁閥206會打開,使得抽氣幫浦202與測試區400連通,而可以將測試區400內的氣體抽出,並且經由真空比例閥204調節控制抽氣幫浦202對測試區400的抽氣量與抽氣速率,而可以精確地使測試區400達到預設的真空度或負壓。因此,使用一般價格低廉且可以達到真空程度的抽氣幫浦,例如一般無法控制不同真空度的真空幫浦或一般簡易的真空幫浦,即可以提供測試區400不同的真空度或負壓,而不需要如傳統的測試壓力控制系統需要使用價格昂貴且結構複雜的特殊(真空)幫浦來達成不同真空度或負壓。真空比例閥204為一電控比例閥,其真空度的控制範圍大約在-101.3kpa-0kpa之間,但不以此為限,而是可以依照設計與需求,採取不同真空控制範圍的電控比例閥。When the test zone 400 requires vacuum or negative pressure for testing, the vacuum proportional valve 204 and the vacuum solenoid valve 206 are opened, so that the pumping pump 202 is in communication with the test zone 400, and the gas in the test zone 400 can be withdrawn and passed via The vacuum proportional valve 204 adjusts the amount of pumping and pumping rate of the pumping pump 202 to the test zone 400, and can accurately bring the test zone 400 to a preset vacuum or negative pressure. Therefore, the use of a pumping pump which is generally inexpensive and can achieve a degree of vacuum, such as a vacuum pump which generally cannot control different degrees of vacuum or a generally simple vacuum pump, can provide different vacuum or negative pressure in the test zone 400, There is no need to use a special (vacuum) pump that is expensive and structurally complex to achieve different vacuum or negative pressure, as is the case with conventional test pressure control systems. The vacuum proportional valve 204 is an electronically controlled proportional valve, and the vacuum degree control range is about -101.3kpa-0kpa, but not limited thereto, but can be electronically controlled according to design and requirements. Proportional valve.

  另外,真空控制機構200更包含一真空過濾器208設置於真空電磁閥206與該測試區400之間,而分別以管路與真空電磁閥206和該測試區400連接,用以對由測試區400抽出的氣體進行過濾,而將會抽出的氣體中會對真空控制機構200產生傷害的物質去除,以防止這些物質會對抽氣幫浦202、真空比例閥204或是真空電磁閥206造成傷害。In addition, the vacuum control mechanism 200 further includes a vacuum filter 208 disposed between the vacuum solenoid valve 206 and the test zone 400, and connected to the vacuum solenoid valve 206 and the test zone 400, respectively, for use in the test zone. 400 extracted gas is filtered, and the gas to be extracted will remove the damage caused by the vacuum control mechanism 200, so as to prevent the substances from causing damage to the pumping pump 202, the vacuum proportional valve 204 or the vacuum solenoid valve 206. .

  測試壓力控制系統100中的正壓控制機構300包含一正壓供給源302,用以提供氣體通入測試區400而提供正壓,數個正壓比例閥308a、308b、308c,用以控制不同範圍的正壓,一第一正壓電磁閥312,用以控制測試區400是否與正壓比例閥308a、308b、或308c導通,以及一第二正壓電磁閥314,用以控制第一正壓電磁閥312是否與測試區400導通。其中,正壓比例閥308a、308b、308c彼此並聯而設置正壓供給源302與第一正壓電磁閥312之間,而以管路分別與正壓供給源302和第一正壓電磁閥312連接。第一正壓電磁閥312則設置於彼此並聯的正壓比例閥308a、308b、308c與測試區400之間,並以管路分別與並聯的正壓比例閥308a、308b、308c和測試區400連接。第一正壓電磁閥312在打開時會使正壓比例閥308a、308b、308c與測試區400連通,而在關閉時則會測試區400與外部大氣連通,即第一正壓電磁閥312在關閉時會連通外部大氣。在第一正壓電磁閥312與測試區400之間設置有第二正壓電磁閥314,而以管路分別與第一正壓電磁閥312和測試區400連接。The positive pressure control mechanism 300 in the test pressure control system 100 includes a positive pressure supply source 302 for providing gas to the test zone 400 to provide positive pressure, and a plurality of positive pressure proportional valves 308a, 308b, 308c for controlling different A positive pressure range, a first positive pressure solenoid valve 312 for controlling whether the test zone 400 is electrically connected to the positive pressure proportional valve 308a, 308b, or 308c, and a second positive pressure solenoid valve 314 for controlling the first positive Whether the pressure solenoid valve 312 is electrically connected to the test zone 400. The positive pressure proportional valves 308a, 308b, and 308c are disposed in parallel with each other to provide a positive pressure supply source 302 and a first positive pressure solenoid valve 312, and the pipelines are respectively connected to the positive pressure supply source 302 and the first positive pressure solenoid valve 312. connection. The first positive pressure solenoid valve 312 is disposed between the positive pressure proportional valves 308a, 308b, 308c and the test zone 400 connected in parallel with each other, and is respectively connected with the positive pressure proportional valves 308a, 308b, 308c and the test zone 400 in parallel. connection. The first positive pressure solenoid valve 312 causes the positive pressure proportional valves 308a, 308b, 308c to communicate with the test zone 400 when opened, and when closed, the test zone 400 communicates with the outside atmosphere, ie, the first positive pressure solenoid valve 312 is When connected, it will connect to the outside atmosphere. A second positive pressure solenoid valve 314 is disposed between the first positive pressure solenoid valve 312 and the test zone 400, and is connected to the first positive pressure solenoid valve 312 and the test zone 400 by a pipeline.

  在第二圖所示的實施例中,正壓控制機構300具有第一正壓比例閥308a、第二正壓比例閥308b、第三正壓比例閥308c等三個彼此並聯的正壓比例閥,三者分別具有不同的壓力範圍,其中,第一正壓比例閥308a的正壓控制範圍在0kpa-100kpa之間、第二正壓比例閥308b的正壓控制範圍在0kpa-500kpa之間、以及第三正壓比例閥308c的正壓控制範圍在0kpa-900kpa之間,而可以分別將正壓供給源302對測試區400的充氣量與充氣速率做不同的範圍的調節控制,以分段調控的方式使測試區400達到不同範圍的正壓或高壓,而可以因應測試壓力感測元件所需的不同的測試壓力以及不同種類的待測元件對測試壓力的要求。以上述舉例的第一正壓比例閥308a、第二正壓比例閥308b、第三正壓比例閥308c的壓力範圍進行說明,舉例來說,在待測元件需要以在50kpa的壓力下進行測試時,即所需的測試壓力落在第一正壓比例閥308a 0kpa-100kpa的壓力範圍內,即打開壓力範圍為0kpa-100kpa的第一正壓比例閥308a,而第二正壓比例閥308b與第三正壓比例閥308c則是關閉,藉由第一正壓比例閥308a對正壓供給源302對測試區400的充氣量與充氣速率進行調節控制,使得正壓供給源302以一固定的充氣量與充氣速率對測試區400進行充氣,而將測試區400內壓力保持在50kpa的壓力下。相同的,當所需的測試壓力落在第二正壓比例閥308b 0kpa-500kpa的正壓控制範圍內,即打開第二正壓比例閥308b進行壓力的調控,而關閉第一正壓比例閥308a與第三正壓比例閥308c,而當所需的測試壓力落在第三正壓比例閥308c 0kpa-900kpa的正壓控制範圍內,即打開第三正壓比例閥308c進行壓力的調控,而關閉第一正壓比例閥308a與第二正壓比例閥308b。In the embodiment shown in the second figure, the positive pressure control mechanism 300 has three positive pressure proportional valves connected in parallel with each other, such as a first positive pressure proportional valve 308a, a second positive pressure proportional valve 308b, and a third positive pressure proportional valve 308c. The three have different pressure ranges, wherein the positive pressure control range of the first positive pressure proportional valve 308a is between 0 kPa and 100 kPa, and the positive pressure control range of the second positive pressure proportional valve 308b is between 0 kPa and 500 kPa. And the positive pressure control range of the third positive pressure proportional valve 308c is between 0 kPa and 900 kPa, and the range of the positive pressure supply source 302 to the inflation rate and the inflation rate of the test zone 400 can be separately controlled to segment The manner of regulation allows the test zone 400 to reach a range of positive or high pressures, and can be adapted to the different test pressures required to test the pressure sensing components and the test pressure requirements of the different types of components to be tested. The pressure range of the first positive pressure proportional valve 308a, the second positive pressure proportional valve 308b, and the third positive pressure proportional valve 308c exemplified above is described. For example, the component to be tested needs to be tested at a pressure of 50 kPa. When the required test pressure falls within the pressure range of the first positive pressure proportional valve 308a 0kpa-100kpa, that is, the first positive pressure proportional valve 308a whose opening pressure ranges from 0kpa to 100kpa, and the second positive pressure proportional valve 308b The third positive pressure proportional valve 308c is closed, and the first positive pressure proportional valve 308a adjusts the inflation amount and the inflation rate of the positive pressure supply source 302 to the test zone 400, so that the positive pressure supply source 302 is fixed. The amount of inflation and the rate of inflation rate the test zone 400 while maintaining the pressure within the test zone 400 at a pressure of 50 kPa. Similarly, when the required test pressure falls within the positive pressure control range of the second positive pressure proportional valve 308b 0kpa-500kpa, the second positive pressure proportional valve 308b is opened for pressure regulation, and the first positive pressure proportional valve is closed. 308a and the third positive pressure proportional valve 308c, and when the required test pressure falls within the positive pressure control range of the third positive pressure proportional valve 308c 0kpa-900kpa, that is, the third positive pressure proportional valve 308c is opened for pressure regulation, The first positive pressure proportional valve 308a and the second positive pressure proportional valve 308b are closed.

  然而,正壓控制機構中的正壓比例閥的數量並不以第二圖所示的實施例為限,而是可以依照需求減少正壓比例閥的數量,例如減少為1個、2個,但是正壓控制機構內至少具有一個正壓比例閥,或者也可以增加正壓比例閥的數量,例如4個、5個、6個甚至更多個,使得正壓控制機構可以進行更多段的正壓控制,理論上,隨著持續增加具有更高正壓或壓力控制範圍的正壓比例閥,可以使得正壓控制機構300(或壓力控制系統100)獲得更高的壓力控制範圍。另外,這些具有不同正壓控制範圍的正壓比例閥不限於上述的正壓控制範圍組合,而是可以依照需求採取其他的正壓控制範圍的組合。However, the number of positive pressure proportional valves in the positive pressure control mechanism is not limited to the embodiment shown in the second figure, but the number of positive pressure proportional valves can be reduced according to requirements, for example, one or two. However, the positive pressure control mechanism has at least one positive pressure proportional valve, or can also increase the number of positive pressure proportional valves, for example, four, five, six or even more, so that the positive pressure control mechanism can carry more segments. Positive pressure control, in theory, can increase the pressure control range of positive pressure control mechanism 300 (or pressure control system 100) as the positive pressure proportional valve with a higher positive pressure or pressure control range is continuously increased. In addition, these positive pressure proportional valves having different positive pressure control ranges are not limited to the above-described positive pressure control range combination, but other combinations of positive pressure control ranges may be adopted as required.

  在測試區400需要正壓或高壓進行測試時,會根據測試區400所需要的正壓或高壓,選擇一具有適合的壓力範圍的正壓比例閥308a、308b或308c並將其打開,而將其他的正壓比例閥關閉,並且打開第一正壓電磁閥312與第二正壓電磁閥314,使得正壓供給源302與測試區400連通,而對測試區400注入氣體或充氣。通過選擇的正壓比例閥308a、308b或308c調節控制正壓供給源302對測試區400的充氣量與充氣速率,可以精確地使測試區400達到預設的正壓或高壓而進行測試。When the test zone 400 requires a positive pressure or a high pressure for testing, a positive pressure proportional valve 308a, 308b or 308c having a suitable pressure range is selected and opened according to the positive pressure or high pressure required by the test zone 400, and The other positive pressure proportional valves are closed and the first positive pressure solenoid valve 312 and the second positive pressure solenoid valve 314 are opened such that the positive pressure supply source 302 is in communication with the test zone 400 and the test zone 400 is infused or inflated. By controlling the positive pressure proportional valve 308a, 308b or 308c to control the amount of inflation and inflation of the positive pressure supply source 302 to the test zone 400, the test zone 400 can be accurately tested to a predetermined positive or high pressure.

  另外,在正壓供給源302與正壓比例閥308a、308b、308c之間設置有一正壓過濾器304,而分別與正壓供給源302以及正壓比例閥308a、308b、308c連接,用以對由正壓供給源302提供的氣體進行過濾,避免對氣體中的有害物質進入測試區400以及正壓控制機構300內的各組件,例如正壓比例閥308a、308b、308c、第一正壓電磁閥312、與第二正壓電磁閥314等,而對測試區內的待測元件以及正壓控制機構300內的各組件造成傷害。正壓控制機構300更包含一調節閥306,調節閥306設置於正壓供給源302與正壓比例閥308a、308b、308c之間,即設置於正壓過濾器304與正壓比例閥308a、308b、308c之間,用以調節正壓供給源302提供的氣體,而使正壓供給源302對測試區400穩定地輸入氣體。每一正壓比例閥308a、308b、308c與第一電磁閥312之間皆設置有一逆止閥310a、310b、310c,而分別連接正壓比例閥308a、308b、308c與第一電磁閥312,用以防止測試區400的氣體灌入正壓比例閥308a、308b、308c中,以及防止正壓供給源302通入測試區400的氣體回頭灌入正壓比例閥308a、308b、308c中。In addition, a positive pressure filter 304 is disposed between the positive pressure supply source 302 and the positive pressure proportional valves 308a, 308b, and 308c, and is connected to the positive pressure supply source 302 and the positive pressure proportional valves 308a, 308b, and 308c, respectively. The gas supplied by the positive pressure supply source 302 is filtered to prevent harmful substances in the gas from entering the test zone 400 and components in the positive pressure control mechanism 300, such as positive pressure proportional valves 308a, 308b, 308c, first positive pressure The solenoid valve 312, the second positive pressure solenoid valve 314, and the like cause damage to the components to be tested in the test zone and the components in the positive pressure control mechanism 300. The positive pressure control mechanism 300 further includes a regulating valve 306 disposed between the positive pressure supply source 302 and the positive pressure proportional valves 308a, 308b, 308c, that is, disposed in the positive pressure filter 304 and the positive pressure proportional valve 308a, Between 308b and 308c, the gas supplied from the positive pressure supply source 302 is adjusted, and the positive pressure supply source 302 stably inputs the gas to the test zone 400. A check valve 310a, 310b, 310c is disposed between each of the positive pressure proportional valves 308a, 308b, 308c and the first electromagnetic valve 312, and the positive pressure proportional valves 308a, 308b, 308c and the first electromagnetic valve 312 are respectively connected. The gas for preventing the test zone 400 is prevented from being poured into the positive pressure proportional valves 308a, 308b, 308c, and the gas returning from the positive pressure supply source 302 to the test zone 400 is prevented from being poured into the positive pressure proportional valves 308a, 308b, 308c.

  正壓供給源302為一供氣源,其可以為廠務供氣系統或是打氣幫浦,或是在提供更高測試壓力的需求下,可以兼具廠務供氣系統與打氣幫浦,以提供所需的高壓進行測試。測試壓力控制系統100更包含一控制器(圖中未示),用以控制測試壓力控制系統100的所有作動,例如用以控制真空控制機構200進行真空度的控制、控制正壓控制機構300進行正壓的控制、以及控制真空控制機構200與正壓控制機構300之間的切換。控制器可以為一可以控制測試壓力控制系統100的所有作動的電腦、處理器、或是應用程式。其次,測試壓力控制系統100還包含一壓力計316,其設置於真空控制機構200、正壓控制機構300、以及該測試區之間400,用以偵測測試區400內的壓力,而將所偵測的測試區400內的壓力值回傳給控制器,供控制器判斷、修正、與調節測試區400內的測試壓力。壓力計316為一可測量正壓與負壓的正負壓壓力計或壓力感測器。The positive pressure supply source 302 is a gas supply source, which may be a factory gas supply system or a pumping pump, or may be combined with a factory gas supply system and a pumping pump under the demand of providing higher test pressure. Test to provide the required high pressure. The test pressure control system 100 further includes a controller (not shown) for controlling all actions of the test pressure control system 100, for example, for controlling the vacuum control mechanism 200 to perform vacuum degree control, and controlling the positive pressure control mechanism 300. The control of the positive pressure and the switching between the vacuum control mechanism 200 and the positive pressure control mechanism 300 are controlled. The controller can be a computer, processor, or application that can control all of the actuation of the test pressure control system 100. Next, the test pressure control system 100 further includes a pressure gauge 316 disposed between the vacuum control mechanism 200, the positive pressure control mechanism 300, and the test zone 400 for detecting the pressure in the test zone 400. The detected pressure value in the test zone 400 is transmitted back to the controller for the controller to determine, correct, and adjust the test pressure in the test zone 400. The pressure gauge 316 is a positive and negative pressure gauge or a pressure sensor that can measure positive and negative pressures.

  測試壓力控制系統100分別藉由其內的真空控制機構200提供與控制測試區400內的真空度或負壓,藉由正壓控制機構300提供與控制測試區400內的正壓或高壓,並且藉由真空控制機構200與正壓控制機構300之間的切換,使得測試區400(或測試機台)內的測試壓力可以在真空(或負壓)與正壓之間切換,讓待測元件(例如壓力感測器或壓力感測元件)在同一測試區400(或測試機台)可以在真空(或負壓)下進行測試與在正壓下進行測試,以及讓測試區400(或測試機台)可以兼具真空(或負壓)下進行測試與在正壓下進行測試的功能,以滿足不同待測元件的測試壓力要求,所以不需要準備各種具有不同測試壓力的測試機台,僅以單一測試機台搭配測試壓力控制系統100即可以達到不同測試壓力的測試,而可以大幅地減少因購買具有不同測試壓力的測試機台所增加的測試成本,以及省略傳統測試機台因測試壓力不同造成需要轉換不同的測試機台所花費的時間成本,進而大幅地增加測試的產率。The test pressure control system 100 provides and controls the positive pressure or the high pressure in the test zone 400 by the positive pressure control mechanism 300 by the vacuum control mechanism 200 therein and the vacuum or negative pressure in the control test zone 400, respectively. By switching between the vacuum control mechanism 200 and the positive pressure control mechanism 300, the test pressure in the test zone 400 (or test machine) can be switched between vacuum (or negative pressure) and positive pressure, allowing the component to be tested (eg pressure sensor or pressure sensing element) can be tested under vacuum (or negative pressure) in the same test area 400 (or test machine) and tested under positive pressure, and test area 400 (or test) The machine can be tested under vacuum (or negative pressure) and tested under positive pressure to meet the test pressure requirements of different components to be tested, so it is not necessary to prepare various test machines with different test pressures. Tests with different test pressures can be achieved with a single test machine in conjunction with the test pressure control system 100, which can significantly reduce the cost of testing for the purchase of test machines with different test pressures, and Slightly different because of the traditional test machine pressure testing time costs caused by the need to convert different test machine it takes, thus increasing the yield of the test significantly.

  另外,測試壓力控制系統100中的真空控制機構200是由價格低廉且組裝簡單的抽氣幫浦、電控比例閥以及電磁閥等零件所裝配而成,而正壓控制機構300也是由價格低廉且組裝簡單的調節閥、電控比例閥、逆止閥以及電磁閥等零件所裝配而成,亦即測試壓力控制系統100皆是由這些價格低廉且組裝簡單零件,依照本發明特殊的裝配與組合組裝而成的,所以在成本上相對於傳統的測試機台的測試壓力控制機構或系統,不但成本低廉且可兼具提供測試機台真空(或負壓)與正壓(或高壓)進行測試的功能,這是一般傳統的測試機台所無法做到的。In addition, the vacuum control mechanism 200 in the test pressure control system 100 is assembled from components such as an air pump, an electronically controlled proportional valve, and a solenoid valve which are inexpensive and simple to assemble, and the positive pressure control mechanism 300 is also inexpensive. And assembled with simple adjustment valve, electronically controlled proportional valve, check valve and solenoid valve, etc., that is, the test pressure control system 100 is made of these inexpensive and simple assembly parts, according to the special assembly and Combined with the test, the cost control mechanism or system relative to the traditional test machine is not only low cost but also provides the test machine vacuum (or negative pressure) and positive pressure (or high pressure). The function of the test, which is not possible with the traditional test machine.

  此外,本發明藉由提供此包含由一抽氣幫浦202、一真空比例閥204、以及一真空電磁閥206組成的真空控制機構200,與由一正壓供給源302、至少一正壓比例閥308a、308b、308c、一第一正壓電磁閥312、以及一第二正壓電磁閥314組成的正壓控制機構300的測試壓力控制系統100,而進一步提供一控制測試壓力之方法。測試壓力控制系統100的作動以及藉由提供測試壓力控制系統100而提供的控制測試壓力的方法將在下文詳細說明,下列說明請同時參照第二圖、第三圖、第四圖、第五圖、以及第六圖。In addition, the present invention provides a vacuum control mechanism 200 comprising a pumping pump 202, a vacuum proportional valve 204, and a vacuum solenoid valve 206, and a positive pressure supply source 302, at least one positive pressure ratio A test pressure control system 100 of positive pressure control mechanism 300, consisting of valves 308a, 308b, 308c, a first positive pressure solenoid valve 312, and a second positive pressure solenoid valve 314, further provides a method of controlling the test pressure. The operation of the test pressure control system 100 and the method of controlling the test pressure provided by providing the test pressure control system 100 will be described in detail below. Please refer to the second, third, fourth, and fifth figures for the following description. And the sixth picture.

  首先,請參照第二圖與第三圖,第三圖為本發明之一實施例之控制測試壓力之方法的流程圖。此一方法包含下列步驟:(1)提供一如第二圖所示之測試壓力控制系統100而與一測試機台或測試機台內的測試區400連接(步驟500);(2)真空控制步驟,藉由啟動測試壓力控制系統100的真空控制機構200,使抽氣幫浦202與測試區400連通,而對測試區400抽氣以控制測試區400達到預定的真空度或負壓(步驟600);(3)正壓控制步驟,藉由啟動測試壓力控制系統100的正壓控制機構200,使正壓供給源302與測試區400連通,而對測試區400充氣或打氣以控制測試區400達到預定的正壓(步驟700);以及(4)洩壓步驟,藉由打開正壓控制機構200內的第二正壓電磁閥,而使得測試區400與外部大氣連通,而讓測試區400與外部大氣壓力達成平衡(步驟800)。此一方法除了步驟(1)提供一測試壓力控制系統100(步驟500)必需先執行才可以進行後續的步驟(2)真空控制步驟(步驟600)、步驟(3)正壓控制步驟(步驟700)、以及步驟(4)洩壓步驟(步驟800),並沒有一定的順序需要先執行那一個步驟,而是依照當時測試區400內所需要的測試壓力,選擇執行步驟(2)真空控制步驟(步驟600)或是步驟(3)正壓控制步驟(步驟700)。換言之,當提供測試壓力控制系統100後,若測試區400的待測元件需要在真空或負壓進行,則先執行步驟(2)真空控制步驟(步驟600),反之,若測試區400的待測元件需要在正壓進行,則先執行步驟(3)正壓控制步驟(步驟700)。但是要注意的是,此一控制測試壓力的方法因應測試需求,可以在步驟(2)真空控制步驟(步驟600)與步驟(3)正壓控制步驟(步驟700)之間切換,而將測試區400內的壓力因應測試需求由真空或負壓轉換成正壓,或是由正壓轉換成真空或負壓,但是,無論是由步驟(2)真空控制步驟(步驟600)切換為步驟(3)正壓控制步驟(步驟700),或是由步驟(3)正壓控制步驟(步驟700) 切換為步驟(2)真空控制步驟(步驟600),都需要先執行步驟(4)洩壓步驟(步驟800),防止對測試區400過度急速打氣或抽氣,導致一時間太大量的氣體灌入測試區400或由測試區400抽出,以避免壓力增加或降低過快而對測試區400中的待測元件造成傷害。First, please refer to the second figure and the third figure. The third figure is a flowchart of a method for controlling the test pressure according to an embodiment of the present invention. The method comprises the following steps: (1) providing a test pressure control system 100 as shown in the second figure and connecting to a test station 400 in a test machine or test machine (step 500); (2) vacuum control In the step, by starting the vacuum control mechanism 200 of the test pressure control system 100, the pumping pump 202 is connected to the test zone 400, and the test zone 400 is evacuated to control the test zone 400 to reach a predetermined vacuum or negative pressure (steps) 600); (3) a positive pressure control step, by starting the positive pressure control mechanism 200 of the test pressure control system 100, the positive pressure supply source 302 is connected to the test zone 400, and the test zone 400 is inflated or pumped to control the test zone. 400 reaches a predetermined positive pressure (step 700); and (4) a pressure relief step, by opening a second positive pressure solenoid valve in the positive pressure control mechanism 200, causing the test zone 400 to communicate with the outside atmosphere, and allowing the test zone 400 is balanced with external atmospheric pressure (step 800). In addition to the step (1), the method of providing a test pressure control system 100 (step 500) must be performed before the subsequent steps (2) vacuum control step (step 600) and step (3) positive pressure control step (step 700). And step (4) pressure relief step (step 800), and there is no certain order that needs to be performed first, but according to the test pressure required in the test area 400 at that time, the execution step (2) vacuum control step is selected. (Step 600) or Step (3) Positive Pressure Control Step (Step 700). In other words, after the test pressure control system 100 is provided, if the component to be tested of the test zone 400 needs to be performed under vacuum or negative pressure, the step (2) vacuum control step (step 600) is performed first, and if the test zone 400 is to be The measuring element needs to be performed at a positive pressure, and then the step (3) positive pressure control step (step 700) is performed first. However, it should be noted that this method of controlling the test pressure can be switched between the step (2) vacuum control step (step 600) and the step (3) positive pressure control step (step 700) in response to the test requirement, and the test will be performed. The pressure in zone 400 is converted to a positive pressure by vacuum or negative pressure, or by a positive pressure to vacuum or negative pressure, but is switched from step (2) vacuum control step (step 600) to step ( 3) Positive pressure control step (step 700), or step (3) positive pressure control step (step 700) switch to step (2) vacuum control step (step 600), both need to perform step (4) pressure relief first Step (step 800), preventing excessively rapid airing or pumping of the test zone 400, causing too much gas to be poured into the test zone 400 or extracted by the test zone 400 for a time to avoid pressure increase or decrease too fast for the test zone 400 The component under test causes damage.

  測試壓力控制系統100的作動同樣包含真空控制步驟(步驟600)、正壓控制步驟(步驟700)、以及洩壓步驟(步驟800)等三個步驟(或作動)。同樣的,在測試壓力控制系統100進行真空控制步驟(步驟600)與正壓控制步驟(步驟700)之間的切換時,都需先進行洩壓步驟(步驟800),以避免壓力增加或降低過快而對測試區400中的待測元件造成傷害。下文將對於測試壓力控制系統100的作動,即真空控制步驟(步驟600)、正壓控制步驟(步驟700)、以及洩壓步驟(步驟800),同時也是本發明之控制測試壓力之方法中的步驟(2)、(3)、與(4)進行詳細說明。The actuation of the test pressure control system 100 also includes three steps (or actuations) of a vacuum control step (step 600), a positive pressure control step (step 700), and a pressure relief step (step 800). Similarly, when the test pressure control system 100 performs a switching between the vacuum control step (step 600) and the positive pressure control step (step 700), the pressure relief step (step 800) is first performed to avoid pressure increase or decrease. Too fast to cause damage to the component under test in the test zone 400. The operation of the test pressure control system 100, that is, the vacuum control step (step 600), the positive pressure control step (step 700), and the pressure relief step (step 800), as well as the method of controlling the test pressure of the present invention, will be hereinafter described. Steps (2), (3), and (4) are described in detail.

  首先,請同時參照第二圖與第四圖,第四圖為前述真空(或負壓)控制步驟(步驟600)的流程圖。首先,當測試區400需要建立真空或負壓以對待測元件進行測試時,測試壓力控制系統100的控制器會發出一訊號通知真空控制機構200啟動去開啟真空比例閥204,而準備提供與控制測試區400內的測試壓力到達一預設真空度或負壓(步驟602)。接著,開啟並且調整真空比例閥204依照所需的真空度打開一定的比例,而對測試區400進行一預設(或所需)真空度或負壓的控制(步驟602)。然後,控制器會檢查真空控制機構200中的第一正壓電磁閥312是否已經關閉(步驟606)。若第一正壓電磁閥312未關閉,控制器則會將第一正壓電磁閥312關閉(步驟608),以防止正壓供給源302(正壓控制機構300)與測試區400連通而對測試區400充氣而導致無法達到預定的真空度或負壓。接著,再檢查第二正壓電磁閥314是否已經關閉(步驟610)。反之,在步驟606中,確認第一正壓電磁閥312已經關閉,則控制器會直接檢查第二正壓電磁閥314是否已經關閉(步驟610)。First, please refer to the second and fourth figures at the same time, and the fourth figure is a flow chart of the aforementioned vacuum (or negative pressure) control step (step 600). First, when the test area 400 needs to establish a vacuum or a negative pressure to test the component to be tested, the controller of the test pressure control system 100 sends a signal to the vacuum control mechanism 200 to start to open the vacuum proportional valve 204, and is ready to provide and control. The test pressure within test zone 400 reaches a predetermined vacuum or negative pressure (step 602). Next, the vacuum proportional valve 204 is opened and adjusted to open a certain ratio in accordance with the required degree of vacuum, and a predetermined (or desired) degree of vacuum or negative pressure is applied to the test zone 400 (step 602). The controller then checks if the first positive pressure solenoid valve 312 in the vacuum control mechanism 200 has been closed (step 606). If the first positive pressure solenoid valve 312 is not closed, the controller will close the first positive pressure solenoid valve 312 (step 608) to prevent the positive pressure supply source 302 (positive pressure control mechanism 300) from communicating with the test zone 400. The test zone 400 is inflated resulting in failure to achieve a predetermined vacuum or negative pressure. Next, it is checked again whether the second positive pressure solenoid valve 314 has been closed (step 610). Conversely, in step 606, confirming that the first positive pressure solenoid valve 312 has been closed, the controller will directly check if the second positive pressure solenoid valve 314 has been closed (step 610).

  在步驟610中,經檢查,若第二正壓電磁閥314未關閉,控制器則會將第二正壓電磁閥314關閉(步驟612),以防止正壓供給源302(正壓控制機構300)與測試區400連通而對測試區400充氣而導致無法達到預定的真空度或負壓,以及防止外部大氣與測試區400連通而導致測試區400無法達到預定的真空度或負壓。反之,若在步驟610中,確認第二正壓電磁閥314已經關閉,控制器會直接打開真空電磁閥206 (步驟614),使得測試區400與抽氣幫浦202(真空控制機構200)連通,使抽氣幫浦202經過真空比例閥204調節對測試區400的抽氣量與抽氣速率,而對測試區400進行抽氣,以使測試區400精確達到所需的(或預設的)真空度或負壓。In step 610, it is checked that if the second positive pressure solenoid valve 314 is not closed, the controller will close the second positive pressure solenoid valve 314 (step 612) to prevent the positive pressure supply source 302 (positive pressure control mechanism 300). The test zone 400 is inflated in communication with the test zone 400 to cause a predetermined vacuum or negative pressure to be reached, and the external atmosphere is prevented from communicating with the test zone 400, resulting in the test zone 400 failing to reach a predetermined vacuum or negative pressure. On the other hand, if it is confirmed in step 610 that the second positive pressure solenoid valve 314 has been closed, the controller will directly open the vacuum solenoid valve 206 (step 614), so that the test zone 400 is connected to the pumping pump 202 (vacuum control mechanism 200). The pumping pump 202 is adjusted by the vacuum proportional valve 204 to the pumping amount and the pumping rate of the test zone 400, and the test zone 400 is evacuated so that the test zone 400 can accurately reach the required (or preset). Vacuum or negative pressure.

  接著,參照第二圖與第五圖,第五圖為前述正壓控制步驟(步驟700)的流程圖。首先,當測試區400需要在正壓(或高壓)下對待測元件進行測試時,測試壓力控制系統100的控制器會依照所需的或所設定的壓力,選擇正壓控制機構300中的一具有適合的正壓控制範圍的正壓比例閥308a、308b、或308c(步驟702),並且發出一訊號通知並開啟被選定的正壓比例閥308a、308b、或308c依照所需的正壓打開一定的比例,而對測試區400進行一預設(或所需)正壓的控制(步驟704)。Next, referring to the second and fifth figures, the fifth figure is a flowchart of the aforementioned positive pressure control step (step 700). First, when the test zone 400 needs to be tested under positive pressure (or high pressure), the controller of the test pressure control system 100 selects one of the positive pressure control mechanisms 300 according to the required or set pressure. A positive pressure proportional valve 308a, 308b, or 308c having a suitable positive pressure control range (step 702), and signaling a signal and opening the selected positive pressure proportional valve 308a, 308b, or 308c to open in accordance with the desired positive pressure A certain ratio is applied to the test zone 400 for a predetermined (or desired) positive pressure control (step 704).

  接著,控制器檢查真空控制機構200中的真空電磁閥206是否已經關閉(步驟706)。若真空電磁閥206還未關閉,控制器則會關閉真空電磁閥206(步驟708),避免真空控制機構200(或抽氣幫浦202)與測試區400連通,而導致對測試區400同時進行抽氣與充氣,造成測試區400無法達到所需的(或預設的)正壓。在真空電磁閥206關閉(步驟708)後,控制器會打開第一正壓電磁閥312,使得第一正壓電磁閥312與外部大氣斷開(步驟710)。反之,在步驟706中,若確認真空電磁閥206已經關閉,控制器則會直接打開第一正壓電磁閥312,使得第一正壓電磁閥312與外部大氣斷開(步驟710)。Next, the controller checks if the vacuum solenoid valve 206 in the vacuum control mechanism 200 has been closed (step 706). If the vacuum solenoid valve 206 has not been closed, the controller will close the vacuum solenoid valve 206 (step 708) to prevent the vacuum control mechanism 200 (or the pumping pump 202) from communicating with the test zone 400, resulting in simultaneous testing of the test zone 400. Pumping and aeration causes the test zone 400 to fail to achieve the desired (or preset) positive pressure. After the vacuum solenoid valve 206 is closed (step 708), the controller opens the first positive pressure solenoid valve 312 such that the first positive pressure solenoid valve 312 is disconnected from the outside atmosphere (step 710). On the other hand, in step 706, if it is confirmed that the vacuum solenoid valve 206 has been closed, the controller directly opens the first positive pressure solenoid valve 312, causing the first positive pressure solenoid valve 312 to be disconnected from the outside atmosphere (step 710).

  最後,在第一正壓電磁閥312打開(步驟710)之後,控制器會打開第二正壓電磁閥314,使得測試區400與正壓控制機構300(或正壓供給源302)連通,使正壓供給源302經過正壓比例閥308a、308b、或308c調節對測試區400的抽氣量與抽氣速率,而對測試區400進行充氣或打氣,以使測試區400精確達到所需的(或預設的)正壓。Finally, after the first positive pressure solenoid valve 312 is opened (step 710), the controller opens the second positive pressure solenoid valve 314 to cause the test zone 400 to communicate with the positive pressure control mechanism 300 (or the positive pressure supply source 302). The positive pressure supply source 302 regulates the amount of pumping and pumping rate to the test zone 400 via the positive pressure proportional valve 308a, 308b, or 308c, and inflates or inflates the test zone 400 to accurately achieve the desired test zone 400 ( Or preset) positive pressure.

  接著,參照第二圖與第六圖,第六圖為前述洩壓步驟(步驟800)的流程圖。當測試區400內的測試壓力需要由真空(或負壓)轉換成正壓以進行測試時,或需要由正壓轉換成真空(或負壓)以進行測試時,控制器會檢查正壓控制機構300中的第一正壓電磁閥312是否關閉(步驟802)。若第一正壓電磁閥312未關閉,控制器則會關閉正壓控制機構300中的第一正壓電磁閥(步驟804),使得第一正壓電磁閥312與外部大氣接通。在步驟802中,若確認第一正壓電磁閥312已關閉,控制器則會直接檢查第二正壓電磁閥314是否打開(步驟806)。若第二正壓電磁閥314未打開,控制器會將第二正壓電磁閥314打開(步驟808),使得測試區400通過第一正壓電磁閥312與外部大氣連通,而使得測試區400內壓力與外部大氣平衡,即使得測試區400內壓力回到一大氣壓。在此步驟中,若測試區400原本為真空或負壓,外部大氣則會對測試區400充氣,直到測試區400與外部大氣達成壓力平衡為止,若測試區400原本為大於外部大氣的正壓,測試區400會將氣體輸入外部大氣,直到測試區400與外部大氣達成壓力平衡為止。另外,若第二正壓電磁閥314原本就是打開的,則在步驟804關閉第一正壓電磁閥312時,測試區400會直接與外部大氣接通,而進行洩壓。Next, referring to the second and sixth figures, the sixth figure is a flow chart of the aforementioned pressure relief step (step 800). When the test pressure in the test zone 400 needs to be converted from vacuum (or negative pressure) to positive pressure for testing, or when it needs to be converted from positive pressure to vacuum (or negative pressure) for testing, the controller checks the positive pressure control. Whether the first positive pressure solenoid valve 312 in the mechanism 300 is closed (step 802). If the first positive pressure solenoid valve 312 is not closed, the controller closes the first positive pressure solenoid valve in the positive pressure control mechanism 300 (step 804) such that the first positive pressure solenoid valve 312 is connected to the outside atmosphere. In step 802, if it is confirmed that the first positive pressure solenoid valve 312 is closed, the controller directly checks whether the second positive pressure solenoid valve 314 is open (step 806). If the second positive pressure solenoid valve 314 is not open, the controller will open the second positive pressure solenoid valve 314 (step 808), so that the test zone 400 communicates with the external atmosphere through the first positive pressure solenoid valve 312, so that the test zone 400 The internal pressure is balanced with the external atmosphere, i.e., the pressure in the test zone 400 is returned to atmospheric pressure. In this step, if the test zone 400 is originally vacuum or negative pressure, the external atmosphere will inflate the test zone 400 until the test zone 400 reaches a pressure balance with the external atmosphere, if the test zone 400 is originally a positive pressure greater than the external atmosphere. The test zone 400 will pass gas into the outside atmosphere until the test zone 400 reaches a pressure balance with the outside atmosphere. In addition, if the second positive pressure solenoid valve 314 is originally open, when the first positive pressure solenoid valve 312 is closed in step 804, the test zone 400 is directly connected to the outside atmosphere to perform pressure relief.

  藉由上述作動與步驟,本發明之測試壓力控制系統與本發明之控制測試壓力之方法,可以對同一測試機台或測試區提供真空(或負壓)與正壓進行測試,並且由於本發明之測試壓力控制系統具有真空控制機構與正壓控制機構分別控制測試機台(或測試區)內的真空度與壓力,所以可以在真空(或負壓)與正壓之間自由地切換而因應不同測試壓力與真空度的需求。因此,所以不需要準備各種具有不同測試壓力的測試機台,僅以單一測試機台搭配測試壓力控制系統即可以達到不同測試壓力的測試,而可以大幅地減少因購買具有不同測試壓力的測試機台所增加的測試成本,以及省略傳統測試機台因測試壓力不同造成需要轉換不同的測試機台所花費的時間成本,進而大幅地增加測試的產率。另外,由於本發明之測試壓力控制系統(真空控制機構與正壓控制機構)皆為價格低廉的比例閥與電磁閥依照一特殊設計的配置而組裝而成,所以此測試壓力控制系統相較於傳統的測試壓力控制系統不但價格低廉且組裝容易,故可以大幅縮減測試成本。By the above actions and steps, the test pressure control system of the present invention and the method for controlling the test pressure of the present invention can provide vacuum (or negative pressure) and positive pressure to the same test machine or test zone for testing, and The test pressure control system has a vacuum control mechanism and a positive pressure control mechanism respectively controlling the degree of vacuum and pressure in the test machine (or test zone), so that it can be freely switched between vacuum (or negative pressure) and positive pressure to cope with Different test pressures and vacuum requirements. Therefore, it is not necessary to prepare a variety of test machines with different test pressures, and only a single test machine with a test pressure control system can achieve different test pressure tests, and can greatly reduce the purchase of test machines with different test pressures. The increased test cost of the station and the omission of the time cost of the traditional test machine due to the different test pressures required to convert different test machines, thereby greatly increasing the test yield. In addition, since the test pressure control system (vacuum control mechanism and positive pressure control mechanism) of the present invention is assembled according to a special design configuration of the low-cost proportional valve and the electromagnetic valve, the test pressure control system is compared with Traditional test pressure control systems are not only inexpensive but also easy to assemble, so they can significantly reduce test costs.

100...測試壓力控制系統100. . . Test pressure control system

200...真空控制機構200. . . Vacuum control mechanism

202...抽氣幫浦202. . . Pumping pump

204...真空比例閥204. . . Vacuum proportional valve

206...真空電磁閥206. . . Vacuum solenoid valve

208...真空過濾器208. . . Vacuum filter

300...正壓控制機構300. . . Positive pressure control mechanism

302...正壓供給源302. . . Positive pressure supply

304...正壓過濾器304. . . Positive pressure filter

306...調節閥306. . . Regulating valve

308、308a、308b、308c...正壓比例閥308, 308a, 308b, 308c. . . Positive pressure proportional valve

310、310a、310b、310c...逆止閥310, 310a, 310b, 310c. . . Check valve

312...第一正壓電磁閥312. . . First positive pressure solenoid valve

314...第二正壓電磁閥314. . . Second positive pressure solenoid valve

316...壓力計316. . . pressure gauge

400...測試區400. . . Test area

500...提供一測試壓力控制系統步驟500. . . Provide a test pressure control system step

600...真空控制步驟600. . . Vacuum control step

602-616...真空控制步驟中的各步驟602-616. . . Steps in the vacuum control step

700...正壓控制步驟700. . . Positive pressure control step

702-712...正壓控制步驟中的各步驟702-712. . . Each step in the positive pressure control step

800...洩壓步驟800. . . Pressure relief step

802-808...洩壓步驟中的各步驟802-808. . . Steps in the pressure relief step

第一圖為本發明之一實施例之測試壓力控制系統的簡單示意圖。

第二圖為本發明之一實施例之測試壓力控制系統的詳細配置的示意圖。

第三圖為本發明之一實施例之測試壓力控制系統作動以及本發明之一實施例之測試壓力控制系統方法的流程圖。

第四圖為本發明之真空(或負壓)控制步驟的流程圖。

第五圖為本發明之正壓控制步驟的流程圖。

第六圖為本發明之洩壓步驟的流程圖。
The first figure is a simplified schematic diagram of a test pressure control system in accordance with one embodiment of the present invention.

The second figure is a schematic diagram of a detailed configuration of a test pressure control system according to an embodiment of the present invention.

3 is a flow chart of a method of testing a pressure control system and a method of testing a pressure control system in accordance with an embodiment of the present invention.

The fourth figure is a flow chart of the vacuum (or negative pressure) control step of the present invention.

The fifth figure is a flow chart of the positive pressure control step of the present invention.

Figure 6 is a flow chart of the pressure relief step of the present invention.

100...測試壓力控制系統100. . . Test pressure control system

200...真空控制機構200. . . Vacuum control mechanism

300...正壓控制機構300. . . Positive pressure control mechanism

400...測試區400. . . Test area

Claims (20)

一測試壓力控制系統,包含:
  一真空控制機構與一測試區連接,用以提供與控制該測試區對待測元件進行測時的真空度或負壓;以及
  一正壓控制機構與該測試區連接,用以提供與控制該測試區對待測元件進行測時的正壓,其中,該測試壓力控制系統可以依照所需的測試真空度與壓力而在該真空控制機構與該正壓控制機構之間切換,而提供該測試區對待測元件測試時所需的真空度與壓力。
A test pressure control system comprising:
a vacuum control mechanism is coupled to a test zone for providing a vacuum or a negative pressure for controlling the component to be tested in the test zone; and a positive pressure control mechanism is coupled to the test zone for providing and controlling the test The positive pressure during the measurement of the component to be tested, wherein the test pressure control system can switch between the vacuum control mechanism and the positive pressure control mechanism according to the required test vacuum and pressure, and provide the test zone to treat Measure the vacuum and pressure required for component testing.
如申請專利範圍第1項所述之測試壓力控制系統,其中該真空控制機構包含:
一抽氣幫浦,用以對該測試區進行抽氣而提供該測試區所需的真空度;
一真空比例閥與該抽氣幫浦連接,用以控制真空度;以及
一真空電磁閥介於該真空比例閥與該測試區之間,而分別於該真空比例閥與該測試區連接,用以控制是否對該測試區進行抽真空。
The test pressure control system of claim 1, wherein the vacuum control mechanism comprises:
a pumping pump for pumping the test area to provide the vacuum required for the test area;
a vacuum proportional valve is connected to the pumping pump for controlling the degree of vacuum; and a vacuum solenoid valve is interposed between the vacuum proportional valve and the test zone, and the vacuum proportional valve is respectively connected to the test zone, To control whether the test area is evacuated.
如申請專利範圍第2項所述之測試壓力控制系統,其中該真空控制機構更包含一真空過濾器設置於該真空電磁閥與該測試區之間,用以對由該測試區抽出的氣體進行過濾。The test pressure control system of claim 2, wherein the vacuum control mechanism further comprises a vacuum filter disposed between the vacuum solenoid valve and the test zone for performing gas extracted by the test zone. filter. 如申請專利範圍第1項所述之測試壓力控制系統,其中該正壓控制機構包含:
  一正壓供給源,用以提供氣體通入該測試區而提供正壓;
  數個正壓比例閥並聯而與該正壓供給源連接,用以控制不同範圍的正壓;
  一第一正壓電磁閥,介於該等正壓比例閥與該測試區之間,而連接該正壓比例閥與該測試區,用以控制該測試區是否與該正壓比例閥導通;以及
  一第二正壓電磁閥,介於該第一正壓電磁閥與該測試區之間,而連接該第一正壓電磁閥與該測試區,用以控制該第一正壓電磁閥是否與該測試區導通。
The test pressure control system of claim 1, wherein the positive pressure control mechanism comprises:
a positive pressure supply source for providing gas to the test zone to provide a positive pressure;
a plurality of positive pressure proportional valves are connected in parallel to the positive pressure supply source for controlling different ranges of positive pressures;
a first positive pressure solenoid valve interposed between the positive pressure proportional valve and the test zone, and connected to the positive pressure proportional valve and the test zone for controlling whether the test zone is electrically connected to the positive pressure proportional valve; And a second positive pressure solenoid valve between the first positive pressure solenoid valve and the test zone, and connecting the first positive pressure solenoid valve and the test zone for controlling whether the first positive pressure solenoid valve is Conducted with the test area.
如申請專利範圍第4項所述之測試壓力控制系統,其中該正壓控制機構更包含一正壓過濾器,設置於該正壓供給源與該等正壓比例閥之間,而分別與該正壓供給源以及該等正壓比例閥連接,用以對由該正壓供給源提供的氣體進行過濾。The test pressure control system of claim 4, wherein the positive pressure control mechanism further comprises a positive pressure filter disposed between the positive pressure supply source and the positive pressure proportional valve, respectively A positive pressure supply source and the positive pressure proportional valves are coupled to filter the gas supplied by the positive pressure supply. 如申請專利範圍第5項所述之測試壓力控制系統,其中該正壓控制機構更包含一調節閥設置於該正壓過濾器與該等正壓比例閥之間,用以調節該正壓供給源提供的氣體。The test pressure control system of claim 5, wherein the positive pressure control mechanism further comprises a regulating valve disposed between the positive pressure filter and the positive pressure proportional valve for adjusting the positive pressure supply. The gas supplied by the source. 如申請專利範圍第4項所述之測試壓力控制系統,其中每一該正壓比例閥與該第一電磁閥之間皆設置有一逆止閥,而分別連接該正壓比例閥與該第一電磁閥,用以防止該測試區的氣體灌入該等正壓比例閥中。The test pressure control system of claim 4, wherein each of the positive pressure proportional valve and the first electromagnetic valve is provided with a check valve, and the positive pressure proportional valve and the first are respectively connected A solenoid valve is used to prevent gas in the test zone from being poured into the positive pressure proportional valves. 如申請專利範圍第4項所述之測試壓力控制系統,其中該等正壓比例閥包含一第一正壓比例閥、一第二正壓比例閥、以及一第三正壓比例閥,分別控制不同範圍的正壓。The test pressure control system of claim 4, wherein the positive pressure proportional valve comprises a first positive pressure proportional valve, a second positive pressure proportional valve, and a third positive pressure proportional valve, respectively controlled Different ranges of positive pressure. 如申請專利範圍第1項所述之測試壓力控制系統,其中該測試壓力控制系統更包含一壓力計設置於該真空控制機構、該正壓控制機構、以及該測試區之間,而用以偵測該測試區的壓力。The test pressure control system of claim 1, wherein the test pressure control system further comprises a pressure gauge disposed between the vacuum control mechanism, the positive pressure control mechanism, and the test zone for detecting The pressure in the test zone was measured. 如申請專利範圍第9項所述之測試壓力控制系統,其中該壓力計為一可測量正壓與負壓的正負壓壓力計或壓力感測器。The test pressure control system of claim 9, wherein the pressure gauge is a positive and negative pressure gauge or a pressure sensor capable of measuring positive pressure and negative pressure. 如申請專利範圍第1項所述之測試壓力控制系統,其中該測試壓力控制系統更包含一控制器,用以控制該真空控制機構進行真空度的控制、該正壓控制機構進行正壓的控制、以及該真空控制機構與該正壓控制機構之間的切換。The test pressure control system of claim 1, wherein the test pressure control system further comprises a controller for controlling the vacuum control mechanism to perform vacuum degree control, and the positive pressure control mechanism performs positive pressure control. And switching between the vacuum control mechanism and the positive pressure control mechanism. 一種控制測試壓力之方法,包含:
(1)提供一測試壓力系統,該測試壓力控制系統包含一由一抽氣幫浦、一真空比例閥、以及一真空電磁閥組成的真空控制機構,與一由一正壓供給源、至少一正壓比例閥、一第一正壓電磁閥、以及一第二正壓電磁閥組成的正壓控制機構;
  (2)真空控制步驟,藉由該抽氣幫浦對一測試區抽氣而控制該測試區達到預定的真空度;
  (3)正壓控制步驟,藉由該正壓供給源對該測試區打氣而控制該測試區達到預定的正壓;以及
  (4)洩壓步驟,藉由打開該第二正壓電磁閥,而使得該測試區與外部大氣連通,而讓該測試區與外部大氣壓力達成平衡。
A method of controlling test pressure comprising:
(1) providing a test pressure system, the test pressure control system comprising a vacuum control mechanism consisting of a pumping pump, a vacuum proportional valve, and a vacuum solenoid valve, and a positive pressure supply source, at least one a positive pressure proportional control valve, a first positive pressure solenoid valve, and a second positive pressure solenoid valve comprising a positive pressure control mechanism;
(2) a vacuum control step of controlling the test zone to a predetermined degree of vacuum by pumping a test zone by the pumping pump;
(3) a positive pressure control step of controlling the test zone to reach a predetermined positive pressure by pumping the test zone by the positive pressure supply; and (4) a pressure relief step by opening the second positive pressure solenoid valve, The test zone is connected to the outside atmosphere, and the test zone is balanced with the external atmospheric pressure.
如申請專利範圍第12項所述之控制測試壓力之方法,其中該步驟(2)包含:
  調整該真空比例閥進行一預設真空度或負壓的控制;
  關閉該第一正壓電磁閥與該第二正壓電磁閥,避免該正壓控制機構、外部大氣與該測試區連通;以及
  打開該真空電磁閥,使得該測試區與該抽氣幫浦連通,而對該測試區進行抽氣而達到預設的真空度或負壓。
The method for controlling test pressure as described in claim 12, wherein the step (2) comprises:
Adjusting the vacuum proportional valve to perform a preset vacuum or negative pressure control;
Closing the first positive pressure solenoid valve and the second positive pressure solenoid valve to prevent the positive pressure control mechanism and the external atmosphere from communicating with the test zone; and opening the vacuum solenoid valve to connect the test zone to the pumping pump And the test zone is evacuated to reach a preset vacuum or negative pressure.
如申請專利範圍第13項所述之控制測試壓力之方法,其中該步驟(2)更包含一發出一訊號通知該真空比例閥進行一預設真空度或負壓的控制的步驟。The method for controlling the test pressure as described in claim 13 wherein the step (2) further comprises the step of issuing a signal to notify the vacuum proportional valve to perform a predetermined vacuum or negative pressure control. 如申請專利範圍第13項所述之控制測試壓力之方法,其中該步驟(2)更包含一檢查該第一正壓電磁閥及該第二正壓電磁閥是否已經關閉的步驟。The method of controlling test pressure as described in claim 13 wherein the step (2) further comprises the step of checking whether the first positive pressure solenoid valve and the second positive pressure solenoid valve have been closed. 如申請專利範圍第12項所述之控制測試壓力之方法,其中該步驟(3)包含:
  選擇一正壓比例閥並調整該正壓比例閥進行一預設正壓的控制;
  關閉該真空電磁閥,避免該真空控制機構與該測試區連通;
  打開該第一正壓電磁閥,使得該第一正壓電磁閥與外部大氣斷開;以及
打開該第二正壓電磁閥,使得該測試區與該正壓供給源連通,而對該測試進行打氣而達到預設的正壓。
The method for controlling test pressure as described in claim 12, wherein the step (3) comprises:
Selecting a positive pressure proportional valve and adjusting the positive pressure proportional valve to perform a predetermined positive pressure control;
Closing the vacuum solenoid valve to prevent the vacuum control mechanism from communicating with the test zone;
Opening the first positive pressure solenoid valve to disconnect the first positive pressure solenoid valve from the external atmosphere; and opening the second positive pressure solenoid valve to connect the test zone with the positive pressure supply source, and performing the test Pump up to reach the preset positive pressure.
如申請專利範圍第16項所述之控制測試壓力之方法,其中該步驟(3)更包含一發出一訊號通知被選擇的正壓比例閥進行一預設正壓的控制的步驟。The method for controlling the test pressure as described in claim 16 wherein the step (3) further comprises the step of issuing a signal to notify the selected positive pressure proportional valve to perform a predetermined positive pressure control. 如申請專利範圍第16項所述之控制測試壓力之方法,其中該步驟(3)更包含一檢查該真空電磁閥是否已經關閉的步驟。A method of controlling a test pressure as described in claim 16 wherein the step (3) further comprises the step of checking whether the vacuum solenoid valve has been closed. 如申請專利範圍第12項所述之控制測試壓力之方法,其中該步驟(4)包含:
  檢查該第一正壓電磁閥是否關閉,若否則關閉該第一正壓電磁閥;以及
  檢查該第二正壓電磁閥是否打開,若否則打開該第一正壓電磁閥,使得該測試區經由該第一正壓電磁閥和該第二正壓電磁閥而與外部大氣連通,而讓該測試區與外部大氣達成平衡。
The method for controlling test pressure as described in claim 12, wherein the step (4) comprises:
Checking whether the first positive pressure solenoid valve is closed, if otherwise closing the first positive pressure solenoid valve; and checking whether the second positive pressure solenoid valve is open, if the first positive pressure solenoid valve is otherwise opened, the test area is The first positive pressure solenoid valve and the second positive pressure solenoid valve are in communication with the outside atmosphere to balance the test zone with the outside atmosphere.
申請專利範圍第12項所述之控制測試壓力之方法,其中在由該步驟(2)轉換到該步驟(3)時,以及由該步驟(3)轉換到該步驟(2)時都需先執行步驟(4),以避免急速打氣或抽氣而對該測試區中的待測元件造成傷害。The method for controlling the test pressure described in claim 12, wherein when the step (2) is switched to the step (3), and the step (3) is switched to the step (2), Perform step (4) to avoid injury caused by rapid airing or pumping to the component under test in the test area.
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