TW201310038A - Probe device - Google Patents

Abstract

The invention discloses a probe device. The probe device includes a device body, a sliding part, a probe head, a spring, and a force adjusting mechanism. The device body includes a stopping portion and an end surface. The sliding part is disposed in the device body in a slidable way and is capable of being stopped by the stopping portion from being sliding toward the end surface. The probe head is connected to an end portion of the sliding part and protrudes out the end surface. The force adjusting mechanism is disposed in the device body and includes a sleeve and a manipulation part. An end of a spring is connected to the sliding part. The other end of the spring is urged against a bottom surface of the sleeve. The manipulation part is connected to a sidewall of the sleeve and is exposed out of the device body. The manipulation part is capable of being operative to adjust a relative position of the sleeve and the device body to change the deformation of the spring, so as to achieve the purpose of providing adjustable test force.

Description

Probe device

The present invention relates to a probe device, and more particularly to a probe device with a test force adjustable.

At present, three-meter electric meters, multi-function measuring instruments and surface impedance testers on the market need to be matched with test probes. The measurement object of the test probe can be used in various forms such as wires, circuit boards, sockets, floors, metal tubes or connector terminals, and the like. Most probe types are rods, clips or heavy hammers. The test probes are mostly made of metal, and the heads of the test probes are mostly pointed, clawed or hooked. The back end of the test probe is covered with plastic as insulation for hand-held; the end is wire and terminal. When using, connect the terminal to the meter, and the person holds the test probe and applies any force to the object to be tested.

In order to prevent EMI, the electronic product case will be surface treated in the casing to be used as EMI shielding, such as plastic casing coating treatment, and as a die-cast casing for film treatment. The quality of the surface treatment engineering will affect the EMI protection effect, so the quality control is important. The thickness of the film produced after surface treatment is between 0.01 and 0.03 mm. To measure the film, it is necessary to test only the surface of the film and not to test the substrate to avoid measurement distortion. However, in the above test probe design, because there is no design of the test force setting, each measurement value may be different, and even the variation of the measurement value may substantially affect the effectiveness of the quality control, and may be caused during the measurement process. The surface of the object is damaged, and the function of the object to be tested is invalidated.

In view of the problems in the prior art, it is an object of the present invention to provide a probe device that provides an adjustable test force so that measurement conditions are controlled and damage to the surface of the object to be tested can be avoided.

The probe device of the present invention comprises a device body, a slider, a probe head, a spring and a force adjustment mechanism. The device body includes a blocking portion and an end surface. The slider is slidably disposed on the device body and is slidable by the stopper to prevent continued sliding toward the end surface, the slider having one end. The probe head is coupled to the end and protrudes from the end face in an alternative manner. One of the first ends of the spring is coupled to the slider. The force adjustment mechanism is disposed on the device body, the force adjustment mechanism includes a sleeve and an operating member, the sleeve has a bottom surface and a side wall, and a second end of the spring abuts the bottom surface, the operating member is connected to the The side wall is exposed to the body of the device, and the operating member is operable to adjust a position of the sleeve relative to one of the body of the device to change the amount of deformation of the spring.

In use, the probe head is retracted toward the device body after contacting the surface of the object to be tested, so that the spring is compressed until the end surface of the device body abuts against the object to be tested, and the test force applied to the probe head at this time is Provided by the compressed spring, the present invention utilizes the force adjustment mechanism to adjust the amount of deformation of the spring, that is, to set the test force to provide nearly the same measurement condition for each measurement, and to avoid damage. The surface of the object to be tested.

The advantages and spirit of the present invention will be further understood from the following detailed description of the invention.

Please refer to FIG. 1 to FIG. 4 , FIG. 1 is a schematic diagram of a probe device 1 according to a preferred embodiment of the present invention, FIG. 2 is an exploded perspective view of the probe device 1 , and FIG. 3 is a probe device. 1 is a cross-sectional view taken along line XX of Fig. 1, and Fig. 4 is a cross-sectional view of the probe device 1 taken along line YY of Fig. 1. The probe device 1 includes a device body 12, a slider 14, a probe head 16, a spring 18, and a force adjustment mechanism 20. The slider 14, the spring 18 and the force adjustment mechanism 20 are disposed in the device body 12. The probe head 16 is connected to the slider 14 and can expose the device body 12. The force adjustment mechanism 20 adjusts the deformation amount of the spring 18 to achieve adjustment and application. The test force of the probe head 16.

In detail, the device body 12 includes a tube body 122, a rear cover 124, a screw 126 and a stopper portion 128. The tube body 122 has a front end opening 1222, a rear end opening 1224, a side opening 1226, and two screw holes 1228, 1230. The tube body 122 has an end surface 1232 at the front end opening 1222. The rear cover 124 is coupled to the tubular body 122 from the rear end opening 1224 with respect to the end surface 1232 and has a through hole 1242. The screw 126 is locked from the outside of the tubular body 122 into the screw hole 1228 and protrudes from the inner wall of the tubular body 122. The stopper portion 128 is locked from the outside of the tubular body 122 into the screw hole 1230 by a screw and protrudes from the inner wall of the tubular body 122. The slider 14 has a rod shape and is slidably disposed in the tube body 122. The slider 14 has a front end portion 142, a rear end portion 144, and blind holes 146, 148 formed in the front end portion 142 and the rear end portion 144, respectively. The blind hole 148 faces the through hole 1242 so that an external connector 2 (shown in broken lines in FIGS. 3 and 4) can be inserted into the blind hole 148 through the through hole 1242 to realize electrical connection; The external connector 2 can also be connected to the connection port of an electric meter. The sliding member 14 also includes a convex ring 150. The sliding member 14 is blocked by the blocking portion 128 by the retaining portion 128 to prevent further sliding toward the end surface 1232, so that the sliding member 14 can be prevented from slipping out of the tubular body 122. The probe head 16 includes a connecting post 162 that is inserted into the blind hole 146 by the connecting post 162 to be coupled to the front end portion 142 and protrudes from the end surface 1232.

In addition, in the embodiment, the probe head 16 is a flat-bottom probe head, and the probe head 16 is designed in an alternative manner. Therefore, in practice, the probe head 16 can also be replaced with one according to requirements. The glyph probe head 17 (shown in phantom in Figure 2), or other contoured probe head; again, in the present embodiment, the contour of the probe head 16 conforms to the front end opening 1222, which is advantageous for exploration. The needle 16 slides stably with respect to the housing 122, but the invention is not limited thereto. It is to be noted that the stopping portion 128 prevents the sliding member 14 from slipping off the tubular body 122 by the design of the structural interference. Therefore, the blocking portion 128 can also be directly formed by the inner wall structure of the tubular body 122, for example, for example. When the tubular body 122 is formed, a convex ring is drawn on the inner wall of the tubular body 122, and the convex ring 150 of the sliding member 14 can also be blocked.

In addition, the spring 18 is sleeved on the sliding member 14. One end 182 of the spring 18 is connected to the sliding member 14. In this embodiment, the end 182 of the spring 18 directly abuts the convex ring 150 with respect to the front end portion 142, but the present invention does not This is limited. For example, the end 182 of the spring 18 is directly inserted into a hole in the side surface of the slider 14, or otherwise fixed. The power adjustment mechanism 20 includes a sleeve 202 and an operating member 204. The sleeve 202 has a bottom surface 2022 and a side wall 2024. The sleeve 202 has a through hole 2026 in the bottom surface 2022. The sleeve 202 is disposed in the tubular body 122 and sleeved on the sliding member 14 and the spring 18, wherein the sliding member 14 can pass through the through hole 2026, and the other end 184 of the spring 18 abuts against the bottom surface 2022, that is, the spring 18 is compressed and disposed on Between the sleeve 202 and the collar 150. The sleeve 202 has an external thread 2028 on the side wall 2024. The operating member 204 is a ring member and has an internal thread 2042. The operating member 204 is disposed in the tubular body 122 and sleeved on the sleeve 202 such that the internal thread 2042 is connected to the external thread 2028. The operating member 204 is exposed to the device body 12 through the side opening 1226 so that the user can operate (eg, rotate) the operating member 204 to adjust the relative position of the sleeve 202 to one of the tubular bodies 122 to change the amount of deformation of the spring 18. In addition, in the present embodiment, the rear cover 124 has a function of preventing the sleeve 202 from coming off the tube body 122 from the rear end opening 1224, but the through hole 1242 of the rear cover 124 allows the slider 14 to slide.

Please refer to FIG. 5 and FIG. 6 , FIG. 5 is a cross-sectional view of the probe device 1 adjusted at the position of the sleeve 202, and FIG. 6 is a cross-sectional view of the probe device 1 of FIG. 5 during measurement. The cross-sectional positions of Figs. 5 and 6 are the same as those of Fig. 4. Please also refer to Figures 4 to 6. In general, in the structure of the probe device 1, the spring 18 is pre-stressed, so the full length of the spring 18 in FIG. 4 is defined as the length L1, and the length of the spring 18 is not the natural length of the spring 18, but based on the general spring. The linear variation characteristic of 18, the length L1 still has to be used as a calculation basis for the spring value of the spring 18 due to compression. In Fig. 5, the spring 18 is further shortened by adjustment by the force adjustment mechanism 20, and the amount of shortening is defined as the length L2. Upon measurement, the probe head 16 will retract toward the tube body 122, which will further compress the spring 18. In the present embodiment, when the end surface 1232 is pressed against the surface 3 of the object to be measured (indicated by a thick solid line), the probe head 16 stops from being retracted into the tube body 122, and the amount of compression is defined as the length L3, as shown in FIG. Show.

Since the length L1 is fixed after the device, and the length L2 is fixed after adjustment, and the length L3 is a fixed compression amount when measuring, the total compression amount of the spring 18 is fixed at each measurement, that is, the test force is fixed. It solves the problem that the variability of the measured value is too large or damages the measured object due to different force applied by the operator in each measurement in the prior art. Therefore, the compression amount L2 can be set by adjusting the relative position of the sleeve 202 and the tubular body 122, thereby setting the total compression amount of the spring 18, that is, setting the test force. In addition, in the embodiment, in order to ensure that the operating member 204 rotates, the sleeve 202 can be displaced relative to the tubular body 122 without rotating together with the operating member 204. The outer surface of the sleeve 202 forms a long groove 2030, and the screw 126 extends. The sleeve 202 is inserted into the long groove 2030 to restrict the rotation of the sleeve 202, and when the relative position of the sleeve 202 and the tube body 122 is adjusted, the screw 126 can be further rotated into the screw hole 1228 to press the sleeve 202 to realize the fixing sleeve. 202 features. In practice, the mechanism for limiting the rotation of the sleeve 202 can also be achieved by a tube having a non-circular cross section.

In addition, referring to FIGS. 1 to 3, in order to facilitate the user to accurately adjust the force adjustment mechanism 20, the tube body 122 has a slit window 130 and a plurality of scale marks 132 formed along the slit window 130, each scale mark 132 indicating A test force value, the digital sign of the test force value can also be directly engraved on the scale mark 132 in the implementation; in this embodiment, to simplify the drawing, the corresponding test force value is not engraved next to the scale mark 132. Number symbol. An indicator mark 2032 is formed on the outer surface of the sleeve 202. The indicator mark 2032 can be exposed through the slit window 130. The user can operate the force adjustment mechanism 20 to align the indicator mark 2032 with one of the scale marks 132 to mark the scale. The test force value indicated by the mark 132 is used as the set test power. In practice, for the EMI film electrical measurement, the plurality of scale marks 132 can be set in the range of 120g to 300g, and each scale difference can be set to 15g; however, the invention is not limited thereto. In principle, the test force range value applicable to the probe device 1 depends on the total compression amount, the spring constant, and the like which can be set by the spring 18, which can be easily set by those having ordinary knowledge in the art based on the foregoing description, Let me repeat.

Please refer to FIG. 7 and FIG. 8. FIG. 7 is a schematic diagram of the probe device 1 testing a housing 4 having an EMI-proof coating, and FIG. 8 is a cross-section of the sidewall 42 of the housing 4 along the line ZZ in FIG. Figure. The inner surface of the casing 4 is formed with a conductive coating covering the side wall 42 of the casing 4, the bottom plate 44, the groove 422 formed in the side wall 42, and the surface of the screw post 46 disposed on the bottom plate 44. In the general test environment, two sets of probe device 1 and one electric meter 5 will be used, and the two sets of probe device 1 and the electric meter 5 are electrically connected by wires (shown in thick solid lines in Fig. 7), and the probe device is first used. The probe head 16 of 1 contacts the surface of the screw post 46 as shown by the probe device 1 shown by the solid line. Next, the probe device 1 is pressed down (as shown by the arrow in FIG. 7) until the end surface 1232 of the tube body 122 also contacts the surface of the screw post 46, and the measured value is read from the electric meter 5. The measurement of the surface of the bottom plate 44 is also the same as shown by the probe device 1 shown by a broken line. For the measurement of the bottom surface of the groove 422 of the side wall 42, since the width of the groove 422 is insufficient to allow the probe head 16 to protrude, the probe device 1 can be replaced with a flat-shaped probe head 17 so as to be able to protrude into the groove 422, such as Figure 8; next, the measurement is performed according to the aforementioned measurement operation procedure, and will not be further described.

It should be noted that, as shown in FIG. 9 , when the external connector 2 is too large to protrude into the through hole 1242 of the rear cover 124 , a metal adapter 152 is attached to the end portion 144 of the slider 14 . The rear end portion 144 is logically extended to facilitate the electrical connection of the external connector 2 from the outside to the slider 14. Similarly, another metal adapter 154 is attached to the front end 142 of the slider 14, and the front end portion 142 is logically extended to facilitate the mounting of the probe head 16 (or the replacement of the probe head 17). It is to be noted that, in the foregoing embodiments, the front end portion 142 is engaged with the metal adapter 154 or the probe head 16, or the front end portion 142 is coupled to the probe head 16 by a threaded structure.

Please refer to FIG. 10 and FIG. 11 , FIG. 10 is a schematic diagram of a probe device 7 according to another preferred embodiment of the present invention, and FIG. 11 is a cross section of the probe device 7 along the line WW of FIG. 10 . Figure. The probe device 7 is substantially identical in structure to the probe device 1, the main difference being that the adjustment mechanism of the force adjustment mechanism 21 of the probe device 7 is different from the force adjustment mechanism 20 of the probe device 1, and the details are as follows. With the force adjustment mechanism 21, the tube body 123 of the probe device 7 has a toothed opening 134. The toothed opening 134 has a plurality of engaging grooves 1342. The sleeve 212 of the force adjusting mechanism 21 is disposed in the tube body 123 and sleeved thereon. The sliding member 14 and the spring 18, the end 184 of the spring 18 abuts against the bottom surface 2122 of the sleeve 212. The operating member 214 of the force adjusting mechanism 21 includes a cantilever portion 2142, a pressing portion 2144 and a engaging portion 2146. The cantilever portion 2142 The fixed end 2148 is connected to the side wall 2124 of the sleeve 212. The pressing portion 2144 and the engaging portion 2146 are located at the free end 2150 of the cantilever portion 2142. The engaging portion 2146 is engaged with one of the plurality of engaging grooves 1342, and the pressing portion 2144 is self-toothed. The opening 134 protrudes from the tubular body 123. The pressing portion 2144 can be pressed to disengage the engaging portion 2146 from the engaging groove 1342. At this time, the user can move the sleeve 212 via the pressing portion 2144 to adjust the amount of deformation of the spring 18, and the test force can be set. In practice, a plurality of scale marks 136 may be formed to correspond to the plurality of engagement slots 1342, and each scale mark 136 indicates a test force value for the user to adjust the reference. Compared with the probe device 7 and the probe device 1, the probe device 1 can provide stepless test force adjustment, increasing the flexibility of the user to set the test force; the probe device 7 can provide fixed value test force adjustment, increase the set test strength Precision. For other descriptions of the components of the probe device 7, please refer to the related description of the probe device 1 described above, and details are not described.

As described in the foregoing embodiments, when the probe device of the present invention measures the object to be tested, the probe head is retracted into the body of the device, so that the surface of the object to be touched by the probe head is subjected to the force of the probe. The spring within the device is determined, not by the user's force. In practical use, the user can adjust the deformation amount of the spring by the force adjustment mechanism of the probe device to indirectly control the test force, thereby providing stable measurement conditions. Therefore, the present invention can provide stable measurement conditions to effectively suppress measurement variation, and can adjust test strength in accordance with different properties of the object to be tested to avoid damage to the surface of the object to be tested.

The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

1, 7. . . Probe device

2. . . External connector

3. . . Surface of the object to be tested

4. . . case

5. . . Electric meter

12. . . Device body

14. . . Slide

16, 17. . . Probe head

18. . . spring

20, 21. . . Power adjustment mechanism

42. . . Side wall

44. . . Bottom plate

46. . . Screw column

122, 123. . . Tube body

124. . . Back cover

126. . . Screw

128. . . Stop

130. . . Long narrow window

132, 136. . . Tick mark

134. . . Toothed opening

142. . . Front end

144. . . Back end

146, 148. . . Blind hole

150. . . Convex ring

152, 154. . . Metal adapter

162. . . Connecting column

182, 184. . . end

202, 212. . . Sleeve

204, 214. . . Operating part

422. . . groove

1222. . . Front opening

1224. . . Back end opening

1226. . . Side opening

1228, 1230. . . Screw hole

1232. . . End face

1242. . . Through hole

1342. . . Engagement slot

2022, 2122. . . Bottom

2024, 2124. . . Side wall

2026. . . Through hole

2028. . . External thread

2030. . . Long slot

2032. . . Indicator mark

2042. . . internal thread

2142. . . Cantilever

2144. . . Pressing part

2146. . . Clamping department

2148. . . Fixed end

2150. . . Free end

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of a probe device in accordance with a preferred embodiment of the present invention.

Fig. 2 is an exploded perspective view of the probe device of Fig. 1.

Figure 3 is a cross-sectional view of the probe device taken along line X-X of Figure 1.

Figure 4 is a cross-sectional view of the probe device taken along line Y-Y of Figure 1.

Fig. 5 is a cross-sectional view showing the probe device adjusted to the position of the sleeve in Fig. 1.

Figure 6 is a cross-sectional view of the probe device of Figure 5 as measured.

Fig. 7 is a schematic view showing the housing of the probe device having the EMI-resistant coating in Fig. 1.

Figure 8 is a cross-sectional view of the side wall of the casing taken along line Z-Z of Figure 7.

Figure 9 is a schematic cross-sectional view of a probe device in accordance with another embodiment of the present invention.

Figure 10 is a schematic illustration of a probe device in accordance with another preferred embodiment of the present invention.

Figure 11 is a cross-sectional view of the probe device taken along line W-W of Figure 10.

2. . . External connector

14. . . Slide

16. . . Probe head

18. . . spring

122. . . Tube body

124. . . Back cover

126. . . Screw

130. . . Long narrow window

142. . . Front end

144. . . Back end

146, 148. . . Blind hole

150. . . Convex ring

162. . . Connecting column

182, 184. . . end

204. . . Operating part

1222. . . Front opening

1224. . . Back end opening

1226. . . Side opening

1228. . . Screw hole

1232. . . End face

1242. . . Through hole

2022. . . Bottom

2024. . . Side wall

2026. . . Through hole

2028. . . External thread

2030. . . Long slot

2042. . . internal thread

Claims (11)

A probe device comprising: a device body comprising a stop portion and an end surface; a sliding member disposed in the slidable manner on the device body and capable of being blocked by the stop portion to prevent continued to the end face Sliding, the sliding member has a first end portion; a spring, the first end of the spring is connected to the sliding member; a force adjusting mechanism is disposed on the device body, the force adjusting mechanism comprises a sleeve and an operating member The sleeve has a bottom surface and a side wall, a second end of the spring abuts the bottom surface, the operating member connects the side wall and is exposed to the device body, and the operating member can be operated to adjust the sleeve and the device a relative position of the body to change the amount of deformation of the spring; and a probe head coupled to the first end of the slider in an alternative manner and protruding from the end surface of the apparatus body, the probe head The spring can be compressed to compress the probe head to align the end face. The probe device of claim 1, wherein the device body comprises a tube body, the tube body has an opening, the sleeve is disposed in the tube body and has an external thread on the side wall, and the operating member is a ring And having an internal thread, the operating member is disposed in the tube body and exposed through the opening, and the operating member is sleeved on the sleeve such that the internal thread is coupled to the external thread. The probe device of claim 2, wherein the device body comprises a screw, the outer surface of the sleeve forms a long slot, and the screw is locked from the outside of the tube body into the tube body and extends into the slot to limit Or fix the sleeve. The probe device of claim 2, wherein the device body comprises a back cover, the rear cover is connected to the tube body with respect to the end surface and has a first through hole, the back cover can block the sleeve, The sleeve has a second through hole on the bottom surface, the sliding member passes through the second through hole and has a second end portion opposite to the first end portion and a blind hole formed in the second end portion The blind hole is inserted into the blind hole through the first through hole. The probe device of claim 2, wherein the tube body has an elongated window, a plurality of scale marks are formed beside the elongated window, and an indicator mark is formed on an outer surface of the sleeve, the indicator mark is exposed through the elongated window . The probe device of claim 1, wherein the device body comprises a tube body, the tube body has a toothed opening, the toothed opening has a plurality of engaging grooves, and the sleeve is disposed in the tube body, The operating member includes a cantilever portion, a pressing portion and an engaging portion, the fixed end of the cantilever portion is connected to the side wall, the pressing portion and the engaging portion are located at the free end of the cantilever portion, and the engaging portion and the plurality of the engaging portions One of the engaging grooves is engaged, and the pressing portion protrudes from the toothed opening to the tubular body and can be pressed to disengage the engaging portion from the engaging groove. The probe device of claim 6, wherein the plurality of tick marks are formed adjacent to the plurality of engagement slots. The probe device of claim 1, wherein the device body comprises a tube body, the blocking portion is disposed in the tube body, the sliding member is disposed in the tube body and includes a convex ring, wherein the sliding member is The collar is blocked by the stop. The probe device of claim 8, wherein the stopper is formed by a screw from the outside of the tubular body and protruding from the inner wall of the tubular body. The probe device of claim 8, wherein the first end of the spring abuts the convex ring with respect to the first end. The probe device of claim 1, wherein the first end has a blind hole, the probe head includes a connecting post, and the probe head is inserted into the blind hole by the connecting post to connect to the first Ends.