TW201248326A - Negative photosensitive resin composition, cured film, partition wall, black matrix, method for producing partition wall, method for producing black matrix, color filter, and organic el element - Google Patents

Negative photosensitive resin composition, cured film, partition wall, black matrix, method for producing partition wall, method for producing black matrix, color filter, and organic el element Download PDF

Info

Publication number
TW201248326A
TW201248326A TW101114725A TW101114725A TW201248326A TW 201248326 A TW201248326 A TW 201248326A TW 101114725 A TW101114725 A TW 101114725A TW 101114725 A TW101114725 A TW 101114725A TW 201248326 A TW201248326 A TW 201248326A
Authority
TW
Taiwan
Prior art keywords
group
compound
photosensitive resin
ink
resin composition
Prior art date
Application number
TW101114725A
Other languages
Chinese (zh)
Other versions
TWI522746B (en
Inventor
Hideyuki Takahashi
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of TW201248326A publication Critical patent/TW201248326A/en
Application granted granted Critical
Publication of TWI522746B publication Critical patent/TWI522746B/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • G03F7/031Organic compounds not covered by group G03F7/029
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/201Filters in the form of arrays
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509Filters, e.g. light shielding masks
    • G02F1/133514Colour filters
    • G02F1/133516Methods for their manufacture, e.g. printing, electro-deposition or photolithography
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0046Photosensitive materials with perfluoro compounds, e.g. for dry lithography
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0388Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/12Light sources with substantially two-dimensional radiating surfaces

Abstract

Provided are: a negative photosensitive resin composition which has good ink repellency and good reproducibility of a line width of a mask; and a partition wall which is obtained using the composition and has uniform quality. This negative photosensitive resin is characterized by containing: (A) an ink-repellent agent that has a side chain containing -CFXRf (wherein X represents a hydrogen atom, a fluorine atom or a trifluoromethyl group, and Rf represents a fluorine atom or a fluoroalkyl group which may have an ether oxygen atom and has 20 or less carbon atoms, while having at least one hydrogen atom substituted by a fluorine atom) or -(SiR1R2-O)n-SiR3R4R5 (wherein, each of R1, R2, R3 and R4 represents a hydrogen atom, an alkyl group, a cycloalkyl group or an aryl group, R5 represents a hydrogen atom or an organic group having 1-10 carbon atoms, and n represents an integer of 1-200); (B) a photopolymerization initiator that is an oxime ester compound having a nitro group in each molecule; and (C) an alkali-soluble resin.

Description

201248326 六、發明說明: C ^"明戶斤屬椅々貝3 發明領域 本發明係有關於負型感光性樹脂組成物、硬化膜、隔 壁及黑色矩陣與其製造方法、濾色器以及有機EL元件。 L jIu-發明背景 光阻組成物係當作形成諸如濾色器之像素間的隔壁、 有機EL(Electro-Luminescence)顯示元件之像素間的隔壁、 有機EL照明之元件間的隔壁、將有機TFT(Thin Film Transistor :薄膜電晶體)陣列的各TFT隔開的隔壁、液晶表 示元件之ITO電極的隔壁、電路佈線基板的隔壁等永久膜之 材料而備受矚目。 在電路佈線基板之製造上’已提出了在使電路佈線形 成之際將金屬分散液喷射塗佈之喷墨法。電路佈線圖案之 行成係由光阻組成物依據光刻法來進行,光阻組成物之塗 膜硬化物則利用作為隔壁。 在喷墨法中,必須防止相鄰像素間印墨混色的發生、 及防止在預定區域以外部分以喷墨噴射之材料凝固結塊的 情況,於是有提出一種含撥墨劑的光阻組成物(專利文獻 1〜3)。 先行技術文獻 專利文獻 專利文献1 :國際公開第2〇〇8/U6855號 3 201248326 專利文献2 :國際公開第2010/001976號 專利文献3 :國際公開第2010/013816號 【明内容】 發明概要 發明欲解決之課題 光阻組成物之曝光係使用曝光機來進行。從曝光機照 射之波長雖依裝置而異,一般來說,以使用在濾色器用之 近接(proximity)曝光方式而言,係照射33〇nnm下之光。相 對於此,以鏡投影型(MPA)方式而言,係將33〇11111以下之光 遮光來照射。因此,對光阻組成物也必須要求可對應MpA 方式之組成。又,鏡投影型MPA方式,相對於近接曝光方 式而言尚有可形成銳化之隔壁形狀等優點βκΜΡΑ方式中, 有時會尋求微細圖案化。 本發明目的係提供即使將3〇nm以下之曝光光線遮光但 撥墨性仍良好,遮罩之線寬再現性良好之負型感光性樹脂 組成物及利用§亥組成物所獲得之均質硬化膜、隔壁及黑色 矩陣以及其製造方法》本發明又一目的在於提供具有性能 良好之隔壁或黑色矩陣之濾色器及有機EL元件。 用以欲解決課題之手段 本發明係以下之[1]〜[15]。 Π]一種負型感光性樹脂組成物,其特徵在於含有: 撥墨劑(A) ’其具有側鏈,且該側鏈含有以下式(1)表示 之基或以下式(2)表示之基; 光聚合起始劑(B),其係於1分子内具有硝基之肟酯化 201248326 合物;及 鹼可溶性樹脂(c); -CFXRf (1) -(SiR'R2-〇)n_siR3R4R5 (2) 式(1)中’ X表示氫原子、氟原子或三氟曱基,Rf表示 可具有醚性氧原子且至少丨個氫原子經取代為氟原子之碳 原子數20以下之氟烷基或氟原子; 式(2)中,R1、R2、R3及R4獨立表示氫原子、烷基、環 烷基或芳基’ R5表示氫原子或碳原子數1〜10之有機基,η 表示1〜200之整數。 [2]如[1]之負型感光性樹脂組成物,其中前述光聚合起 始劑(Β)係由下式(3)構成之化合物; [化1]201248326 VI. Description of the invention: C ^"Ming's chair chair mussels 3 FIELD OF THE INVENTION The present invention relates to a negative photosensitive resin composition, a cured film, a partition wall and a black matrix, a method for producing the same, a color filter, and an organic EL element. L jIu-Invention Background The photoresist composition is formed as a partition between pixels such as a color filter, a partition between pixels of an organic EL (Electro-Luminescence) display element, a partition between elements of an organic EL illumination, and an organic TFT. In the (Thin Film Transistor) array, the partition walls of the TFTs, the partition walls of the liquid crystal display elements, the partition walls of the ITO electrodes, and the partition walls of the circuit wiring board are attracting attention. In the manufacture of circuit wiring boards, an ink jet method in which a metal dispersion is spray-coated while forming a circuit wiring has been proposed. The circuit wiring pattern is formed by a photoresist composition in accordance with a photolithography method, and the cured film of the photoresist composition is used as a partition wall. In the inkjet method, it is necessary to prevent the occurrence of ink mixed color between adjacent pixels, and to prevent agglomeration of a material which is ejected by inkjet ejection in a portion other than a predetermined region, and thus a photoresist composition containing an ink-repellent agent has been proposed. (Patent Documents 1 to 3). PRIOR ART DOCUMENT PATENT DOCUMENT PATENT DOCUMENT PATENT DOCUMENT 1: International Publication No. 2/8/6855 No. 3, No. 2010/001976 Patent Document 2: International Publication No. 2010/013816 [Explanation] Summary of Invention Invention The problem to be solved is that the exposure of the photoresist composition is performed using an exposure machine. The wavelength of the exposure from the exposure machine varies depending on the device. Generally, the light exposure at 33 〇 nnm is used for the proximity exposure method used in the color filter. In contrast, in the mirror projection type (MPA) method, light of 33 〇 11111 or less is shielded from light. Therefore, it is also necessary to have a composition corresponding to the MpA mode for the photoresist composition. Further, in the mirror projection type MPA method, there is an advantage that the shape of the partition wall which can be sharpened can be formed with respect to the proximity exposure method. In the βκΜΡΑ method, fine patterning may be sought. An object of the present invention is to provide a negative photosensitive resin composition which is excellent in ink repellent even when light is exposed to light of 3 〇 nm or less, and which has good line width reproducibility of a mask, and a homogeneous cured film obtained by using the composition Further, another object of the present invention is to provide a color filter having a good barrier or a black matrix and an organic EL element. Means for Solving the Problems The present invention is the following [1] to [15].负] A negative photosensitive resin composition comprising: an ink-repellent agent (A) having a side chain, and the side chain contains a group represented by the following formula (1) or a group represented by the following formula (2) a photopolymerization initiator (B) which is esterified with a nitro group in a molecule of 201248326; and an alkali-soluble resin (c); -CFXRf (1) -(SiR'R2-〇)n_siR3R4R5 ( 2) In the formula (1), 'X represents a hydrogen atom, a fluorine atom or a trifluoromethyl group, and Rf represents a fluoroalkyl group having 20 or less carbon atoms which may have an etheric oxygen atom and at least one hydrogen atom is substituted with a fluorine atom. Or a fluorine atom; in the formula (2), R1, R2, R3 and R4 independently represent a hydrogen atom, an alkyl group, a cycloalkyl group or an aryl group. R5 represents a hydrogen atom or an organic group having 1 to 10 carbon atoms, and η represents 1 An integer of ~200. [2] The negative photosensitive resin composition according to [1], wherein the photopolymerization initiator (Β) is a compound composed of the following formula (3);

式(3)中,R31表示碳原子數1〜2〇之烧基、碳原子數6〜30 之芳基、碳原子數7〜30之芳烷基或氰基;R32表示R41或 OR42,該R41及R42各自表示碳原子數1〜20之炫基、碳原子數 6〜30之芳基或碳原子數7〜30之芳烷基;R33表示碳原子數 1〜20之烷基、碳原子數6〜30之芳基或碳原子數7〜30之芳烷 201248326 基;R34及R35各自獨立,表示R41、OR42、氰基或鹵素原子; a及b各自獨立為〇〜3之整數’ c為ι~3之整數。 [3] 如[1]或[2]之負型感光性樹脂組成物,其更含有黑色 著色劑(〇)。 [4] 如[1]至[3]中任一項之負型感光性樹脂組成物,其更 含有交聯劑(G)。 [5] 如[1]至[4]中任一項之負型感光性樹脂組成物,其中 前述撥墨劑(A)係側鍵具有基(1)或基(2)且主鏈為煙鏈之化 合物。 [6] 如[5]之負型感光性樹脂組成物,其中前述撥墨劑(a) 具有酸性基。 [7] 如第[1]至[4]中任一項之負型感光性樹脂組成物,其 中前述撥墨劑(A)係於側鏈具有基(1)且主鏈為有機聚碎氧 鍵之化合物。 [8] 如[5]至[7]中任一項之負型感光性樹脂組成物,其中 前述撥墨劑(A)具有乙烯性雙鍵。 [9] 一種硬化膜’係使形成於基板上之如[1]至[8]中任— 項之負型感光性樹脂組成物之塗膜硬化而成者。 [10] —種隔壁,係用以於基板上設置劃分區而形成者, 其係由如[9]之硬化膜構成。 [11] 一種黑色矩陣,係用以於基板上設置劃分區而形成 者,其係由[9]之硬化膜所構成,且該硬化膜係由如[3]之負 型感光性樹脂組成物形成者。 [12] —種隔壁之製造方法,其特徵在於依序具有以下步 201248326 於基板上塗佈如[1]至中任一項之負型感光性樹脂 組成物而形成塗膜之步驟; 將前述塗膜加熱製成膜後,僅使該膜之預定部分曝光 而使其光硬化之步驟; 將前述已光硬化之部分以外之膜除去之步驟;及 將前述已光硬化之部分加熱而製得隔壁之步驟; 其中’於前述膜除去前後,前述已光硬化之部分的膜 厚變化為6〇nm以下。 [13] —種黑色矩陣之製造方法,係於如。2]之製造方法 中,使用如[3]之負型感光性樹脂組成物而製得前述隔壁作 為黑色矩陣。 [14] 種遽色益’具有基板、基板上之多數像素及位於 鄰接像素間之隔壁,其特徵在於:該隔壁係由如[丨]至[引中 任一項之負型感光性樹脂組成物之硬化膜構成。 [15] 種有機EL元件,具有.基板、基板上之多數像 素及位於鄰接像素間之隔壁’其特徵在於:該隔壁係由如 [1]至[8]中任一項之負型感光性樹脂組成物之硬化膜構成。 發明效果 藉由本發明,可提供一種負型感光性樹脂組成物,其 可製造即使是在減低曝光量,將330nm以下之曝光光線遮光 來進行曝光的情況,撥墨性仍良好,且遮罩之線寬再現良 好之隔壁。依據本發明,可提供湘上述本發明之負型感 光性樹脂組成物之均質硬化膜、性能良好之隔壁及黑色矩 201248326In the formula (3), R31 represents a decyl group having 1 to 2 carbon atoms, an aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms or a cyano group; and R32 represents R41 or OR42. R41 and R42 each represent a condensed group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms or an aralkyl group having 7 to 30 carbon atoms; and R33 represents an alkyl group having 1 to 20 carbon atoms and a carbon atom. An aryl group of 6 to 30 or an aralkyl group having a carbon number of 7 to 30, 201248326; R34 and R35 are each independently represented by R41, OR42, a cyano group or a halogen atom; and a and b are each independently an integer of 〇~3' c An integer from ι~3. [3] The negative photosensitive resin composition of [1] or [2], which further contains a black coloring agent (〇). [4] The negative photosensitive resin composition according to any one of [1] to [3] further comprising a crosslinking agent (G). [5] The negative photosensitive resin composition according to any one of [1] to [4] wherein the side of the ink-repellent (A) has a group (1) or a group (2) and the main chain is a smoke. Chain compound. [6] The negative photosensitive resin composition according to [5], wherein the ink repellent (a) has an acidic group. [7] The negative photosensitive resin composition according to any one of [1] to [4] wherein the ink-repellent agent (A) has a group (1) in a side chain and the main chain is an organic poly-crushed oxygen. The compound of the bond. [8] The negative photosensitive resin composition according to any one of [5] to [7] wherein the ink repellent (A) has an ethylenic double bond. [9] A cured film is obtained by curing a coating film of a negative photosensitive resin composition of any one of [1] to [8] formed on a substrate. [10] A partition wall formed by forming a divisional region on a substrate, which is composed of a cured film such as [9]. [11] A black matrix formed by providing a divisional region on a substrate, which is composed of a cured film of [9], and the cured film is composed of a negative photosensitive resin composition such as [3] Former. [12] A method for producing a partition wall, comprising the steps of: forming a coating film by coating the negative photosensitive resin composition of any one of [1] to [1] to the substrate in the following step: 201248326; a step of heating a coating film to form a film, exposing only a predetermined portion of the film to photohardening; a step of removing the film other than the photohardened portion; and heating the photohardened portion a step of partitioning; wherein 'the film thickness of the photohardened portion before and after the removal of the film is 6 〇 nm or less. [13] A method for manufacturing a black matrix is as follows. In the production method of 2], the partition wall is made to be a black matrix using the negative photosensitive resin composition of [3]. [14] The color ray has a substrate, a plurality of pixels on the substrate, and a partition wall between the adjacent pixels, wherein the partition wall is composed of a negative photosensitive resin such as [丨] to [#. The hardened film of the object is composed. [15] An organic EL device having a substrate, a plurality of pixels on the substrate, and a partition wall between the adjacent pixels, wherein the partition wall is negatively photosensitive according to any one of [1] to [8] A cured film of a resin composition. Advantageous Effects of Invention According to the present invention, it is possible to provide a negative-type photosensitive resin composition which can be manufactured by exposing exposure light of 330 nm or less to light exposure even when the exposure amount is reduced, and the ink repellency is good, and the mask is The line width reproduces well next door. According to the present invention, it is possible to provide a homogeneous cured film of the negative photosensitive resin composition of the present invention, a partition wall having good properties, and a black moment 201248326

陣以及其製造方法。進而,依據本發明,可獲得具備上述 本發明隔壁及黑色矩陣之性能良好之濾色器及有機ELS 件。 圖式簡單說明 第1圖係模式地顯示利用本發明負型感光性樹脂組成 物之光學元件用隔壁之製造例截面圖。 I:實施方式3 用以實施發明之形態 本說明書中,所謂酸價係指用以中和lg試料中之樹脂 酸等所需要的氫氧化鉀毫克數,係屬可依循JIS K 0070測定 方法而測定之數值。單位為mgKOH/g。 本說明書中,所謂總固態部分,係指在負型感光性樹 脂組成物所含成分中,隔壁之形成成分,其表示溶劑(H)等 由於隔壁形成過程中之加熱等而揮發的揮發性成分以外的 全部成分。 本說明書中的「(曱基)丙烯醯基…」,係「曱基丙烯醯 基…」與「丙烯醯基…」的統稱。(甲基)丙烯酸酯、(曱基) 丙烯醯胺、(曱基)丙烯醯樹脂亦相同。 本說明書中,所謂烴基,係表示僅由碳與氫所構成的 有機基。 本說明書中,係將塗佈負型感光性樹脂組成物而成的 膜稱為「塗膜」、使其乾燥後的狀態則稱為「膜」,進一步 將其硬化所得之膜則稱為「硬化膜」。 本說明書中,隔壁「表面」係僅作為指隔壁上面的用 201248326 έ吾來使用。因此,陪# 「 、 复表面」並不包含隔壁側面。 本說明書中的 ρ墨,係指經乾燥硬化後具有例如光學 性、電性機能之液體的統稱,並不侷限為習知所使用的著 色材料,主入前述印墨而形成之「像素」,亦同樣係 ;乍為表τ 分隔之各別地具有光學性、電性機能 的區間者。 本說明書中,所4田 π吗撥墨性,係指為了彈撥前述印墨而 適度地油性^者的特性其可侧如後述 之方法予以評價。 以下,說明本發明之實施形態。再者,本說明書中未 特別說明之情況下,%係表示質量%。 [撥墨劑(Α)] 本發明撥墨劑(Α)係具有側鏈之化合物,而該側鏈含有 以下式(1)表示之基(以下亦稱基(1))或以下式(2)表示之基 (以下亦稱基(2))。 -CFXRf (1) -(SiR'R2-〇)n-SiR3R4R5 (2) 式(1)中,X表示氫原子、氟原子、或三氟甲基,以表 示可具有鱗性氧原子且至少1個氫原子經取代為氟原子之 石炭原子數20以下之氟炫基、或敗原子。 式⑺中,R1、R2、R3及R4獨立,表示氫原子、烷基、 環烷基或芳基,R5表示氫原子或碳原子數1~1〇之有機基,η 表示1〜200之整數。 撥墨劑(Α)由於具有含基(1)或基(2)之側鏈,故而具有 9 201248326 表面遷移性,將由負型感光性樹脂M成物形成之塗膜加執 並乾燥作成膜時,會遷移至塗膜表面㈣。藉此,由將膜 硬化之硬化膜所構成之隔壁表面,展現出撥墨性,㈣墨 法注入之印墨不會從被稱為點陣之隔壁間開口部(成為像 素之處)溢出,相鄰接像素間之混色不易發生。 含基⑴或基(2)之側鏈,可藉由聚合反應直接形成,亦 可藉由聚合反應後之化學轉換來形成。 當式(1)中之Rf為可具有喊性氧原子且至少⑽氮原子 經取代為氟原子之碳原子數2(m下之妓基時,該敦烧基 中之氫原子亦可由氣原子以外的其他_素原子取代。其他 函素原子以氣原子為佳。X ’囉氧原子可躲於該敗烧 基之碳-碳_,亦可存在於職⑥基末端。又職烧基 之結構可《鏈結構、支鏈結構、環結構、或局部性具有 環之結構,以直鏈結構為佳。 基⑴方面’係以全氟烧基或含1個氫原子之多纽基為 佳,以全氟烧基尤佳。(惟,包含具有難氧原子者)。藉此, 由負型感光性樹脂組成物形成之隔壁其撥墨性可變得良 好0 基(1)之碳原子數在20以下,以4〜6為佳。這種情況下, 可赋予隔壁充分撥碰’同畴·(Α)與構成貞型感光性 樹脂組成物之其他成分的相溶性良好。在將貞㈣光性樹 脂組成物塗佈並形成塗料,撥墨劑(Α)彼此不會凝聚,可 形成外觀良好之隔壁。 作為基(1)者以碳原子數為4〜6之全氟烷基、或具有醚性 201248326 氧原子之碳原子數4〜9之全氟烷基為佳。 基(1)之具體例可舉如下。 -CF3 ^ -CF2CF3 ' -CF2CHF2 . >(CF2)2CF3 ' -(CF2)3CF3 λ -(CF2)4cf3、-(cf2)5CF3、-(CF2)6cf3、_(CF2)7cf3、-(cf2)8cf3、 -(CF2)9CF3、(CF2)"CF3、-(CF2)I5cf3、CF(CF3)0(CF2)5CF3、 -CF2〇(CF2CF2〇)pCF3(p 為 1〜8 之整數)、 -CF(CF3)〇(CF2CF(CF3)0)qC6Fi3(q 為卜4 之整數)、 _CF(CF3)〇(CF2CF(CF3)0)rC3F7(r為 i〜5之整數)。 作為基(1)者尤其以_(CF2)3CF3或_(CF2)5CF3為佳。 式(2)中’ R1及R2於各個錢燒單元可相同亦可不同。 就由負型感光性樹餘祕形成之隔魏現㈣撥墨性這 點=言’ R1、R2以氫原子、碳原子數㈣之烧基、環炫基、 或芳基為佳,以氫原子、曱基絲基較佳,所有的錢燒 單元之R1、R2為曱基尤佳。 几 式(2)中,R3、R1R5為鍵結於石夕氧⑽末端石夕原子之 基’可使R3及R4與R1、R2相同’適當的態樣亦相同。又, R5為有機基時’亦可含#㈣子、氧料等,心以氣原 子或碳原子數1〜5之烷基為佳。n係以之整數為佳, 2〜100之整數尤佳。 作為基⑺者係以、RW、RW全部為甲基為佳。 撥墨劑(A)係以進一步具有酸性基為佳。撥墨劑(A)若 具有酸性基’就負型感光性餘組成物對顯影液之溶解性 提升這點甚佳。 作為酸性基者,係以選自於由絲、紛性經基及確酸 11 201248326 基所構成群組之1種以上酸性基為佳。 就合成簡便這點而言,酸性基以存在於側鏈為佳。具 有酸性基之側鏈,可藉由具酸性基單體之聚合反應來开^ 成,亦可藉由聚合反應後之化學轉換來形成。 撥墨劑(A)係以具有聚氧伸烷基為佳。撥墨劑(a)若具 有聚氧伸烷基,則即使在顯影步驟中將壓力提高的情況 下,仍可持續撥墨性。進而,就可防止殘留在無法藉顯影 完全除去之點陣部分的殘膜產生這點而言甚佳。再者,本 發明中所使用的聚氧伸烷基方面,具體而言可舉以下式(ιι) 表不之基(以下亦稱基(11))等。 -(R2,0)m(R220)jR23 ...(H) 式(11)中,R及R 2各自獨立,表示碳原子數2〜4之伸 烷基,R23表示氫原子、或可具有取代基之碳原子數卜⑺之 烷基,個別地,m表示〇〜1〇〇之整數、j表示〇〜1〇〇之整數, m+j為4〜100之整數。 基(11)中,R21及R22各自獨立,表示碳原子數2〜4之伸 烷基。伸烷基之結構無論直鏈結構或支鏈結構皆可。R2i及 R22可相同亦可不同。這種R21及R22當中,以兩者各自獨立 且分別為-CH2CH2-或-C3H6-,或者是-CH2CH2-與-C4H8-之組 合為佳’以兩者為-CH2CH2_ ’ 或-CH2CH2-與-CH2CH(CH3)-之組合尤佳。 基(11)中,個別地,m表示〇〜100之整數、j表示〇〜100 之整數’而m與j以分別為0〜50為佳,以〇〜3〇尤佳。 又,m+j為4〜100之整數,以6〜50之整數為佳,8〜30之 12 201248326 • 錄尤佳。m+j若在上述範圍之下限値以上,則在顯影步驟 後進仃使用高壓水之喷射淋洗(Jetrinse)步驟時,撥墨性不易 低下。進而,殘膜不易發生。m+j若在上述範圍之:限値以 下,則後焙時撥墨劑(A)不致於移動至開口部,隔壁間開口 部之親印墨性變得充分,利用喷墨法塗佈印墨時,印墨可 在開口部充分濕潤擴散。 基(11)係表示具有m個(R21〇)單元與』個汉22〇)單元者, 關於(R21Q)單元與(R22〇)單元之鍵結順序並無㈣限制。總 之,於基(11)中’ m個(R2i0)單元與j個(心〇)單元可行例如 交互或隨機、或者飯段鍵結。 於基(11)中,R23為可具有取代基之碳原子數i〜1〇之烷 基時’其結構無論是直鍵結構、支鍵結構、環結構、局部 *· 性具有丨衣之結構荨皆可。又,具體而言,作為取代基者可 舉羧基、羥基、碳原子數1〜5之烷氧基等。本發明中,基(11) 中之R23係以碳原子數1〜5之直鏈、非取代烷基為佳,曱基 及乙基尤佳。Array and its manufacturing method. Further, according to the present invention, a color filter and an organic ELS device having excellent performance of the partition wall and the black matrix of the present invention described above can be obtained. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing a manufacturing example of a partition for an optical element using a negative photosensitive resin composition of the present invention. I: Embodiment 3 In the present specification, the acid value refers to the number of milligrams of potassium hydroxide required to neutralize the resin acid or the like in the lg sample, and the method can be measured according to JIS K 0070. The value measured. The unit is mgKOH/g. In the present specification, the total solid portion refers to a component forming a partition wall in the component contained in the negative photosensitive resin composition, and indicates a volatile component which is volatilized by heating or the like during the formation of the partition wall such as the solvent (H). All ingredients except. In the present specification, "(sulfenyl acrylonitrile)" is a general term for "mercapto propylene sulfhydryl..." and "acrylic fluorenyl...". The (meth) acrylate, (mercapto) acrylamide, and (fluorenyl) acryl resin are also the same. In the present specification, the hydrocarbon group means an organic group composed only of carbon and hydrogen. In the present specification, a film obtained by coating a negative photosensitive resin composition is referred to as a "coating film", and a state in which it is dried is referred to as a "film", and a film obtained by curing the film is referred to as " Hardened film." In this specification, the "surface" of the partition wall is used only as the upper surface of the partition wall for use in 201248326. Therefore, the accompanying #", complex surface" does not include the side of the partition. The ρ ink in the present specification is a general term for a liquid having, for example, optical properties and electrical functions after drying and hardening, and is not limited to a conventionally used coloring material, and a "pixel" formed by the ink being introduced into the ink. The same is true; 乍 is the interval between the optical and electrical functions of the table τ. In the present specification, the π 拨 ink repellency refers to a characteristic of a moderately oily property for plucking the ink, and the side can be evaluated by a method described later. Hereinafter, embodiments of the present invention will be described. Further, in the case where it is not particularly described in the present specification, % indicates mass%. [Ink-repellent agent (Α)] The ink-repellent agent (Α) of the present invention is a compound having a side chain, and the side chain contains a group represented by the following formula (1) (hereinafter also referred to as a group (1)) or a formula (2) ) The basis of the expression (hereinafter also referred to as the base (2)). -CFXRf (1) -(SiR'R2-〇)n-SiR3R4R5 (2) In the formula (1), X represents a hydrogen atom, a fluorine atom, or a trifluoromethyl group, to indicate that it may have a squamous oxygen atom and at least 1 Each of the hydrogen atoms is substituted with a fluorine atom having a number of carbon atoms of 20 or less, or a deficient atom. In the formula (7), R1, R2, R3 and R4 independently represent a hydrogen atom, an alkyl group, a cycloalkyl group or an aryl group, R5 represents a hydrogen atom or an organic group having 1 to 1 carbon atom, and η represents an integer of 1 to 200. . Since the ink-repellent (Α) has a side chain containing a base (1) or a base (2), it has a surface migration property of 9 201248326, and the coating film formed of the negative photosensitive resin M is added and dried to form a film. Will migrate to the surface of the coating (4). Thereby, the surface of the partition wall formed by the cured film which hardens the film exhibits ink repellency, and (4) the ink which is injected by the ink does not overflow from the opening portion (which becomes a pixel) between the partition walls called the dot matrix. Color mixing between adjacent pixels is not easy to occur. The side chain containing the group (1) or the group (2) may be directly formed by a polymerization reaction or may be formed by chemical conversion after the polymerization reaction. When Rf in the formula (1) is a sulfhydryl group having at least (10) nitrogen atoms substituted by a fluorine atom, the hydrogen atom in the sulphur group may also be a gas atom. Other than the 素 atom substitution. Other elements of the atom are preferably a gas atom. X '啰 oxygen atom can hide from the carbon-carbon _ of the deficient base, can also exist at the end of the 6 base. The structure may be "chain structure, branched structure, ring structure, or local structure having a ring structure, and a linear structure is preferred. The base (1) aspect is preferably a perfluoroalkyl group or a multi-nuclear group containing one hydrogen atom. It is especially preferable to use a perfluoroalkyl group (except for those having a hard-atomic atom). Thereby, the ink-repellent property of the partition formed of the negative-type photosensitive resin composition can be improved. The number is 20 or less, preferably 4 to 6. In this case, it is possible to impart sufficient compatibility between the partition walls and the other components constituting the quinoid photosensitive resin composition. (4) The photosensitive resin composition is coated and formed into a coating, and the ink-repellent agent (Α) does not aggregate with each other, and can form a good appearance next door. As the group (1), a perfluoroalkyl group having 4 to 6 carbon atoms or a perfluoroalkyl group having 4 to 9 carbon atoms having an etheric 201248326 oxygen atom is preferred. Specific examples of the group (1) may be used. As follows: -CF3 ^ -CF2CF3 ' -CF2CHF2 . >(CF2)2CF3 ' -(CF2)3CF3 λ -(CF2)4cf3, -(cf2)5CF3, -(CF2)6cf3, _(CF2)7cf3,- (cf2) 8cf3, -(CF2)9CF3, (CF2)"CF3, -(CF2)I5cf3, CF(CF3)0(CF2)5CF3, -CF2〇(CF2CF2〇)pCF3 (p is an integer from 1 to 8 ), -CF(CF3)〇(CF2CF(CF3)0)qC6Fi3 (q is an integer of 4), _CF(CF3)〇(CF2CF(CF3)0)rC3F7 (r is an integer of i~5). (1) In particular, _(CF2)3CF3 or _(CF2)5CF3 is preferred. In the formula (2), 'R1 and R2' may be the same or different in each of the money-burning units. It is separated by Wei (4) ink-repellent point = say 'R1, R2 is preferably a hydrogen atom, a carbon atom (4), a cyclosyl group, or an aryl group, preferably a hydrogen atom or a fluorenyl group. R1 and R2 of the money-burning unit are preferably sulfhydryl groups. In the formula (2), R3 and R1R5 are bonded to the base of the Shixi oxygen (10) terminal, and the R3 and R4 can be combined with R1 and R2. 'The appropriate pattern is also the same. Also, when R5 is an organic group', it may also contain #(四)子, oxygen, etc., and the heart is preferably a gas atom or an alkyl group having 1 to 5 carbon atoms. n is an integer Preferably, the integer of 2 to 100 is particularly preferable. As the base (7), it is preferable that all of RW and RW are methyl groups. It is preferred that the ink repellent (A) further has an acidic group. It is preferable that the ink-repellent (A) has an acidic group, and the solubility of the negative-type photosensitive residual composition to the developer is improved. The acidic group is preferably one or more kinds of acidic groups selected from the group consisting of silk, sulphate, and sulphate 11 201248326. In terms of ease of synthesis, the acidic group is preferably present in the side chain. The side chain having an acidic group can be formed by polymerization of an acidic group monomer or by chemical conversion after polymerization. The ink repellent (A) is preferably a polyoxyalkylene group. If the ink-repellent (a) has a polyoxyalkylene group, the ink repellent property can be maintained even if the pressure is increased in the developing step. Further, it is preferable to prevent the residual film from remaining in the lattice portion which cannot be completely removed by development. In addition, the polyoxyalkylene group used in the present invention may specifically be represented by the following formula (hereinafter referred to as the group (11)). -(R2,0)m(R220)jR23 (H) In the formula (11), R and R 2 each independently represent an alkylene group having 2 to 4 carbon atoms, R23 represents a hydrogen atom, or may have The alkyl group of the substituent carbon number (7), individually, m represents an integer of 〇~1〇〇, j represents an integer of 〇~1〇〇, and m+j is an integer of 4 to 100. In the group (11), R21 and R22 each independently represent an alkylene group having 2 to 4 carbon atoms. The structure of the alkyl group may be either a linear structure or a branched structure. R2i and R22 may be the same or different. Among these R21 and R22, each of them is independently -CH2CH2- or -C3H6-, or a combination of -CH2CH2- and -C4H8- is preferred as either -CH2CH2_' or -CH2CH2- and - A combination of CH2CH(CH3)- is preferred. In the group (11), m represents an integer of 〇~100, j represents an integer 〇~100, and m and j are preferably 0 to 50, respectively, and 〇~3〇 is particularly preferable. Further, m+j is an integer of 4 to 100, preferably an integer of 6 to 50, and 8 to 30 of 12 201248326 • Recorded by Yu Jia. When m + j is at least the lower limit of the above range, the ink repellency is not easily lowered when the jet rinsing step using high pressure water is carried out after the development step. Further, the residual film is less likely to occur. When m+j is in the above range: the limit is not more than the limit, the ink-repellent (A) does not move to the opening during the post-baking, and the ink resistance of the opening between the partition walls becomes sufficient, and the ink is applied by the inkjet method. In the case of ink, the ink can be sufficiently wetted and diffused at the opening. The base (11) indicates that there are m (R21〇) units and "Han 22" units, and there is no (four) restriction on the bonding order of the (R21Q) unit and the (R22〇) unit. In summary, the 'm(R2i0) unit and the j (heart) unit in the base (11) may be, for example, interactive or random, or a rice field bond. In the group (11), when R23 is an alkyl group having a carbon atom number i~1〇 which may have a substituent, the structure of the structure is a direct bond structure, a bond structure, a ring structure, and a local structure. It’s all right. Further, specific examples of the substituent include a carboxyl group, a hydroxyl group, and an alkoxy group having 1 to 5 carbon atoms. In the present invention, R23 in the group (11) is preferably a linear or unsubstituted alkyl group having 1 to 5 carbon atoms, particularly preferably an anthracenyl group or an ethyl group.

基(11)中 ’(R210)及(R220)之具體例可舉·ς:Η2(:6Η10(:Η2 〇-(式中 c6h10為環伸己基)、-CH20-、-CH2CH20-、-CH2CHSpecific examples of '(R210) and (R220) in the group (11) include Η2(:6Η10(:Η2 〇-(wherein c6h10 is a cyclohexyl group), -CH20-, -CH2CH20-, -CH2CH

(ch3)o-、-ch(ch3)o-、-ch2ch2ch2o-、-c(ch3)2o-、-CH (ch2ch3)o-、-ch2ch2ch2ch2o-、-CH(CH2CH2CH3)0-、- CH2(CH2)3CH20-、-CH(CH2CH(CH3)2)0-等。基(11)之具體 例,可舉(R210)及(R22〇)—起選自於前已例示之氧伸烷基、 m+j為4〜100且R23為CH3之基。 基(11)可單獨使用1種,亦可併用2種以上。又,將具有 13 201248326 基(11)之側鏈導入撥墨劑(A)—事係如後述,在藉由原祠_單 體聚合來製造撥墨劑(A)之際,具有基(11)之單體相對於原 料單體整體之摻混量,係以適當調整成可賦予撥墨劑(A)上 述顯影性提升效果又不致損及本發明效果之摻混量來進 行。 撥墨劑(A)以具有乙烯性雙鍵為佳。撥墨劑(A)若具有 乙烯性雙鍵,則乾燥時遷移至膜表面之撥墨劑(A),藉由在 曝光時該撥墨劑(A)彼此或該撥墨劑(A)與鹼可溶性樹脂(c) 反應’而容易在隔壁表面固定化,就這點而言頗為適當。 乙烯性雙鍵方面可舉(曱基)丙烯醯基、烯丙基、乙稀 基、乙烯基醚基加成聚合性不飽和基等。該等基之氮原子 的一部份或全部可由烴基取代。烴基方面以甲基為佳。 具有乙烯性雙鍵之側鏈朝撥墨劑(A)之導入係如後 述’對製造撥墨劑(A)時之原料單體一面適當調整摻混量並 一面加入具有反應性基之單體進行共聚合,接著使具有可 與前述反應性基鍵結之官能基及乙烯性雙鍵之化合物,與 所獲得之共聚物反應來進行。 作為撥墨劑(A)者係以於側鏈具有基(1)或基(2)且主鏈 為烴鏈之化合物為佳。以下亦稱主鏈為烴鏈之撥墨劑為 「撥墨劑(A1)」。 撥墨劑(A )可藉由例如將含有下述成分之原料單體共 I合來製造,該成分係:具有基(丨)之單體(al)或具有基(2) 之單體(a2),以及因應需要具有酸性基之單體(a3)、因應需 要具有聚氧伸烷基之單體(a4)。 201248326 又,撥墨劑(A1)具有乙烯性雙鍵時,可依下述來製造, 即:將已於上述原料單财進—步添加具有反應性基之單 體㈣的原料單體共聚合,接著使所獲得之共聚物、與具有 -、月』這反應性基鍵結之官能基及乙稀性雙鍵之化合物 (zl)進行反應來製造。 (單體(al)) 具有基(1)之單體(al)方面,以下述單體(aU)為佳。 CH2 = CR6CO〇. Y-CFXRf (all) 式中,R6表示氫原子、氟原子、氣原子、溴原子、碘 原子曱基、或二氟甲基β Y表示單鍵或碳原子數1〜6之不 3敦原子之2價有機基,就取得容易而言,以碳原子數2〜4 之伸烷基為佳。X及1^表示與基(1)相同意義,適當態樣亦 相同。 單體(all)之例方面可舉以下。 CH2 = CR6COOR7CFXRf CH2 = CR6C00R8NR9S02CFXRf CH2 = CR6COOR10NRnCOCFXRf CH2 = CR6COOCH2CH(OH)R12CFXRf 此處,R6表示與上述相同意義,R7、R8及R10表示碳原 子數1〜6之伸炫基’ R9及R11表示氫原子或曱基,r12表示單 鍵或碳原子數1〜4之伸烷基。 R7、R8及R1Q之具體例方面分別可舉-CH2-、-CH2CH2-、 -CH(CH3)-、-CH2CH2CH2-、-C(CH3)2-、-CH(CH2CH3)-、 -CH2CH2CH2CH2-、-CH(CH2CH2CH3)-、-CH2(CH2)3CH2-、 15 201248326 -CH(CH2CH(CH3)2)-等。 R 之具體例方面可舉-CH2_、-CH2CH2-、-CH(CH3)-、 -CH2CH2CH2- '-C(CH3)2. '-CH(CH2CH3)- '-CH2CH2CH2CH2- ' -CH(CH2CH2CH3)4 〇 單體(al l)之具體例方面可舉(曱基)丙烯酸2_(全氟己基) 乙酯、(甲基)丙烯酸2-(全氟丁基)乙酯等。 單體(all)可使用1種,亦可併用2種以上。 (單體(a2)) 具有基(2)之單體(a2)方面,係以下述單體(a2i)為佳。 CH2 = CR13COO-Z-(SiR'R2-〇)n-SiR3R4R5 (a21) 式中’ R13表示氫原子或曱基,Z表示單鍵或碳原子數 1〜6之2價有機基。R1、R2、R3、汉4及1^以及n係表示與基(2) 相同意義’適當態樣亦相同。 Z以碳原子數1〜6之2價烴基為佳。具體例方面可舉_ch 2-、-CH2CH2-、-ch(ch3)-、-CH2CH2CH2-、-C(CH3)2-、-c h(ch2ch3)-、-CH2CH2CH2CH2-、-CH(CH2CH2CH3)-、-CH2 (ch2)3ch2-、-ch(ch2ch(ch3)2)-等。(ch3)o-, -ch(ch3)o-, -ch2ch2ch2o-, -c(ch3)2o-, -CH(ch2ch3)o-, -ch2ch2ch2ch2o-, -CH(CH2CH2CH3)0-, -CH2(CH2 ) 3CH20-, -CH(CH2CH(CH3)2)0-, and the like. Specific examples of the group (11) include (R210) and (R22), which are selected from the above-exemplified oxygen alkyl groups, m+j is 4 to 100, and R23 is CH3. The base (11) may be used alone or in combination of two or more. Further, the side chain having the 13 201248326 group (11) is introduced into the ink-repellent (A), and as will be described later, when the ink-repellent (A) is produced by polymerization of the original 祠 monomer, the base (11) is provided. The blending amount of the monomer with respect to the entire raw material monomer is appropriately adjusted so as to impart the above-described developability improving effect to the ink-repellent (A) without impairing the blending amount of the effect of the present invention. The ink-repellent agent (A) preferably has an ethylenic double bond. If the ink-repellent (A) has an ethylenic double bond, the ink-repellent (A) which migrates to the surface of the film upon drying is obtained by the ink-repellent (A) or the ink-repellent (A) at the time of exposure. The alkali-soluble resin (c) reacts easily and is easily immobilized on the surface of the partition wall, which is quite suitable in this point. Examples of the ethylenic double bond include a (fluorenyl) acrylonitrile group, an allyl group, a vinyl group, and a vinyl ether group addition polymerizable unsaturated group. Some or all of the nitrogen atoms of the groups may be substituted by a hydrocarbon group. The methyl group is preferably a methyl group. The introduction of the side chain having the ethylenic double bond to the ink-repellent (A) is as described later, and the monomer having the reactive group is added to the raw material monomer at the time of producing the ink-repellent (A). The copolymerization is carried out, followed by reacting a compound having a functional group bondable with the above reactive group and an ethylenic double bond with the obtained copolymer. As the ink-repellent agent (A), a compound having a group (1) or a group (2) in the side chain and a main chain of a hydrocarbon chain is preferred. Hereinafter, the ink-repellent agent whose main chain is a hydrocarbon chain is referred to as "inking agent (A1)". The ink-repellent (A) can be produced, for example, by co-nucleating a raw material monomer having a component: a monomer having a radical (al) or a monomer having a radical (2) ( A2), and a monomer (a3) having an acidic group if necessary, and a monomer (a4) having a polyoxyalkylene group as needed. 201248326 Further, when the ink-repellent (A1) has an ethylenic double bond, it can be produced by copolymerizing a raw material monomer which has been added with a monomer (4) having a reactive group in the above-mentioned raw materials. Then, the obtained copolymer is reacted with a compound (zl) having a functional group bonded to a reactive group such as -, and a double bond. (Monomer (al)) In terms of the monomer (al) having a group (1), the following monomer (aU) is preferred. CH2 = CR6CO〇. Y-CFXRf (all) wherein R6 represents a hydrogen atom, a fluorine atom, a gas atom, a bromine atom, an iodine atom thiol group, or a difluoromethyl group β represents a single bond or a carbon number of 1 to 6 It is preferable to use a divalent organic group having 2 to 4 carbon atoms. X and 1^ have the same meaning as the base (1), and the appropriate aspect is also the same. Examples of the monomer (all) include the following. CH2 = CR6COOR7CFXRf CH2 = CR6C00R8NR9S02CFXRf CH2 = CR6COOR10NRnCOCFXRf CH2 = CR6COOCH2CH(OH)R12CFXRf Here, R6 represents the same meaning as above, and R7, R8 and R10 represent a condensed group having 1 to 6 carbon atoms. R9 and R11 represent a hydrogen atom or Indenyl, r12 represents a single bond or an alkylene group having 1 to 4 carbon atoms. Specific examples of R7, R8 and R1Q include -CH2-, -CH2CH2-, -CH(CH3)-, -CH2CH2CH2-, -C(CH3)2-, -CH(CH2CH3)-, -CH2CH2CH2CH2-, respectively. -CH(CH2CH2CH3)-, -CH2(CH2)3CH2-, 15 201248326 -CH(CH2CH(CH3)2)- and the like. Specific examples of R include -CH2_, -CH2CH2-, -CH(CH3)-, -CH2CH2CH2-'-C(CH3)2. '-CH(CH2CH3)- '-CH2CH2CH2CH2-'-CH(CH2CH2CH3)4 Specific examples of the fluorene monomer (al l) include (meth)acrylic acid 2_(perfluorohexyl)ethyl ester and (meth)acrylic acid 2-(perfluorobutyl)ethyl ester. One type of the monomers (all) may be used alone or two or more types may be used in combination. (Monomer (a2)) The monomer (a2) having the group (2) is preferably the following monomer (a2i). CH2 = CR13COO-Z-(SiR'R2-〇)n-SiR3R4R5 (a21) wherein R13 represents a hydrogen atom or a fluorenyl group, and Z represents a single bond or a divalent organic group having 1 to 6 carbon atoms. R1, R2, R3, Han 4 and 1^, and n are the same meanings as the base (2). Z is preferably a divalent hydrocarbon group having 1 to 6 carbon atoms. Specific examples include _ch 2-, -CH2CH2-, -ch(ch3)-, -CH2CH2CH2-, -C(CH3)2-, -ch(ch2ch3)-, -CH2CH2CH2CH2-, -CH(CH2CH2CH3)- , -CH2 (ch2)3ch2-, -ch(ch2ch(ch3)2)-, and the like.

單體(a21)之具體例方面可舉CH2 = CHCOO-CH2CH2-(S i(CH3)2-〇)n-Si(CH3)3、CH2 = CCH3COO-CH2CH2-(Si(CH3)2-〇)n-Si(CH3)3 ' CH2 = CHC00-CH2CH2CH2-(Si(CH3)2-0)n-Si (CH3)3、CH2 = CCH3C00-CH2CH2CH2-(Si(CH3)2-0)n-Si(CH 3)3 等。又,n為約 4、60、160。 單體(a21)方面可使用市售品。市售品方面可舉以下所 述者,皆為商品名。X-22-174DX(信越化學社製)、 16 201248326 . X-22-2426(信越化學社製)、Χ-22-2475(信越化學社製)。 單體(a21)可使用1種,亦可併用2種以上。 (單體(a3)) 撥墨劑(A1)具有酸性基時,宜與單體(al)〜(a2)—起使具 有酸性基之單體(a3)共聚合。 具有酸性基之單體(a3)方面,可舉具有羧基之單體、具 有紛性羥基之單體、具有磺酸基之單體等。 具有羧基之單體方面,可舉丙烯酸、甲基丙烯酸、醋 酸乙稀酯、巴豆酸、衣康酸、馬來酸、延胡索酸、桂皮酸 及該等之鹽等。 具有酚性羥基之單體方面可舉,鄰羥苯乙烯、間羥苯 . 乙烯、對羥苯乙烯等。又,可舉該等之苯環的1個以上之氫 ^ 原子經下述取代:曱基、乙基、正丁基等烷基、甲氧基、 乙氧基、正丁氧基等之烷氧基、鹵素原子、烷基之丨個以上 氫原子經ii素原子取代之_烷基、硝基、氰基、醯胺基之 化合物等。 具有磺酸基之單體方面,可舉乙烯基磺酸、苯乙烯磺 酸、(甲基)浠丙基磺酸、2-羥_3-(甲基)烯丙氧基丙烷磺酸、 (曱基)丙烯酸-2-磺乙酯、(甲基)丙烯酸_2_磺丙酯、2-羥_3-(甲 基)丙稀酿氧基丙烧磺酸' 2_(曱基)丙烯醯胺_2_甲基丙烷磺 酸0 單體(a3)方面’就取得容易這點而言係以丙烯酸或甲基 丙稀酸為佳。 單體(a3)可使用1種,亦可併用2種以上。 17 201248326 (單體(a4)) 用於撥墨劑(A1)之製造的具有基(11)之單體,宜為以下 式(12)表示之化合物(以下亦稱化合物(12))或以(13)表示之 化合物(以下亦稱化合物(13))。該等可單獨使用1種,亦可 併用2種以上。 CH2 = CR24-COO-W-(R210)m(R220)jR23 (12) CH2 = CR25-0-W-(R210)m(R220)jR23 (13) 式(12)及(13)中,R24及R25分別為氫原子、氣原子、溴 原子、碘原子、氰基、碳原子數1〜20之烷基、經碳原子數 7~20之芳基取代的烷基、碳原子數6〜20之芳基、或碳原子 數3〜20之環烷基。W係單鍵或碳原子數卜10之不具有氟原 子之2價有機基。-(R21〇)m(R22〇)jR23係基(11),R21、R22、 R23、m及j係表示與基(11)相同意義,適當範圍亦相同。 於化合物(12)及化合物(13),W為碳原子數1〜10之不具 有氟原子的2價有機基的情況,可舉R2l〇、R22〇以外之直鏈 結構、支鏈結構、環結構、局部性具有環之結構的碳原子 數1〜10之氧伸烧基、單鍵等。氧伸院基方面,具體而言可 舉 CH2C6Hl0CH2O(式中 C6H10 為環伸己基)、CH20、 ch2ch2o、ch2ch(ch3)o、ch(ch3)o、CH2CH2CH20、 C(CH3)20、ch(ch2ch3)o、ch2ch2ch2ch2o、 ch(ch2ch2ch3)o ' ch2(ch2)3ch2o、ch(ch2ch(ch3)2)o 等。其中,在化合物(12)及(13)中的W,就取得容易這點, 係以碳原子數2〜4之氧伸烷基為佳。 在化合物(12)及(13)中,R24及R25宜分別為氫原子、氣 18 201248326 原子、曱基、苯基、苯甲基等,以氫原子、氣原子、或甲 基尤佳。 以化合物(12)表示之化合物方面可舉如下。 CH2= CHOCH2C6Hi〇CH20(CH2CH20)mR23 > CH2 = CHO(CH2)40(CH2CH20)mR23。 以化合物(13)表示之化合物方面可舉如下。 CH2 = CHC00(CH2CH20)mR23、 CH2 = C(CH3)C00(CH2CH20)mR23、 CH2 = CHC00(CH2CH20)m(C3H60)jR23、 CH2 = C(CH3)C00(CH2CH20)m(C3H60)jR23、 CH2 = CHC00(C2H40)m(C4H80)jR23。 式中,m及j表示與基(11)相同意義,適當範圍亦#目@ QHw為環伸己基。QH4、(:3私、C#8為直鏈結構或支免妹 構任一者。R23表示與基(11)相同意義,適當範圍係以 子數1〜10之直鏈、非取代烷基為佳,曱基尤佳。 化合物(12)及(13)方面,可使用市售品。市售 舉以下之物。 品方面可 BLEMMER PME-400(商品名、日本油脂社製、 C(CH3)COO(CH2CH2〇)kCH3。式中k表示分子間平均值,匕 値為約9。以下,各市售品之分子式中的k、m、j全部表示 分子間平均值)、BLEMMER PME-1000(商品名、日本油脂 社製、CH2=C(CH3)C00(CH2CH20)kCH3。式中的k表示分 子間平均值,k値為23)、NKESTERM-230G :(商品名、新 中村化學社製、CH2 = C(CH3)C00(CH2CH20)kCH3。式中, 19 201248326 k為約 9)、NEW FRONTIER NF Bisomer PEM6E(商品名、第 一工業製藥社製、CH2 = C(CH3)C00(CH2CH20)kH:式中k 為約6)、Light Ester 130A(商品名、共榮社化學社製、CH2 =CHCOO(CH2CH20)kCH3。式中 k 為約 9)、BLEMMER ΑΕ-4〇0(商品名、日本油脂社製、CH2 = CHC00(CH2CH20)kH :式中 k 為約 10)、BLEMMER PP-800(商品名、日本油月旨社製、CH2 = C(CH3)C00(C3H60)kH。式中 k 為約 13)、BLEMMER 八卩-800(商品名、日本油脂社製、(:112 = (:11(:00((:3^160)1{1^。 式中k為約13)、BLEMMER 70PEP-350B(商品名、曰本油脂 杜製、CH2 = C(CH3)COO(C2H40)m(C3H60)jH。式中m為約5, j為約2)、BLEMMER 55PET-800(商品名、曰本油脂社製' CH2 = C(CH3)C00(C2H40)m(C4H80)|H。式中 m為約 10、j為 約5)。 (單體(a5)) 具有反應性基之單體(a5)方面,可舉具有羥基之單體、 具有乙烯性雙鍵之酸酐單體、具有羧基之單體、具有環氧 基之單體等。又,單體(a5)係以實質上不含基及基為 佳。 採用具有羧基之單體來作為具有酸性基之單體(a3),且 亦採用具有羧基之單體作為上述具有反應性基之單體(a5) 時’則將最終未導入乙烯性雙鍵而以羧基殘留者視為單體 (a3)。 已共聚合後的單體(a5)所具有的反應性基,藉由具有可 20 201248326 與該反應性基鍵結之官能基與乙烯性雙鍵之化合物(z 1)進 行反應,即形成具有側鏈且該側鏈具有乙烯性雙鍵的撥墨 劑(A1)。 具有經基之單體之具體例方面’可舉(曱基)丙晞酸2_ 羥乙酯、(曱基)丙烯酸2-羥丙酯、(甲基)丙烯酸3-羥丙酯、 (曱基)丙烯酸4-羥丁酯、(甲基)丙烯酸5-羥戊酯、(甲基)丙 烯酸6-羥己酯、(曱基)丙烯酸4-羥環己酯、新戊二醇單(曱基) 丙浠酸酯、(甲基)丙烯酸3-氣-2-經丙酯、丙三醇單(曱基) 丙烯酸酯、2-羥乙基乙烯基醚、4-羥丁乙烯基醚、環己二醇 單乙烯基醚、2-羥乙基烯丙基醚、N-羥曱基(曱基)丙烯醯 胺、N,N-雙(羥曱基)(曱基)丙烯醯胺等。 進一步,具有羥基之單體方面,也可以是末端為羥基 之具有聚氧伸烷基之單體。例如可舉ch2 = choch2c6h1q CH20(C2H4〇)hH(在此,h為!〜100之整數,以下相同)、CH2 = CHOC4H80(C2H40)hH、CH2 = CHC00C2H40(C2H40)hH、 CH2 = C(CH3)C00C2H40(C2H40)hH、CH2 = CHCOOC2H40 (C2H40)i(C3H60)gH(在此,i為0〜100之整數,g為l〜l〇〇之整 數,i+g為 1 〜100。以下相同)、CH2 = C(CH3)COOC2H40(C2 H40)i(C3H60)gH 等。 具有乙烯性雙鍵之酸酐單體之具體例方面可舉馬來酸 酐、衣康酸酐、檸康酸酐、曱基-5-降莰烯-2,3-二羧酸酐、 3,4,5,6-四氫苯二甲酸酸酐、順式-1,2,3,6-四氫苯二曱酸酐、 2-丁烯-1-基琥珀酸酐等。 具有羧基之單體之具體例方面可舉丙烯酸、曱基丙烯 21 201248326 酸、醋酸乙稀醋、巴豆酸、衣康酸、馬來酉交 '延胡索酸、 桂皮酸、或其等之鹽。 β具有環氧基之單體之具體例方面,可舉(甲基)丙稀酸環 氧丙基酯、丙烯酸3,4-環氧環己基甲酯。 (單體(a6)) 本發明中用於聚合之單體,若是具備了具有基⑴之單 體(al)或具有基(2)之單體⑽以及視需要具有酸性基之單 體⑷)、視需要具有聚氧伸烧基之單體(吟進而撥墨劑〆) 具有乙稀性雙鍵的情況下,雖含有具有反應性基之單體 (a5),但齐可含有該等單體以外的其他單體(a6)。 作為單體(a6)者可舉烴系烯烴類、乙烯基醚類、異丙稀 基醚類、烯丙基醚類、乙烯基酯類、烯丙基酯類、(曱基) 丙稀酸_、(甲基)丙騎賴、芳香族乙雜化合物、氣 烯烴類、共軛二烯類。於該等化合物亦可含有官能基而 官能基方面可舉例如幾基、⑨氧基等。;t其,f尤隔壁之耐 熱性優異而言,係以(甲基)丙烯酸酯類或(曱基)丙烯醯胺類 為佳。 再者,例舉作為具有上述反應性基之單體(a5)之具有環 氧基之單體,例如(曱基)丙烯酸環氧丙酯、丙烯酸3,4-環氧 環己基曱酯等亦可作為單體(a6)來使用。總之,本發明中將 °玄等具有環氧基之單體用於聚合時,若是於共聚合後未導 入乙烯性雙鍵之情況’該等具有環氧基之單體則分類至其 他單體(a6)°又’即使是已導人㈣性雙鍵之情況,若最終 未導入乙烯性雙鍵而是以環氧基殘留者,則視為其他單體 22 201248326 (a6) 〇 (撥墨劑(A1)之製造) 撥墨劑(A1)可藉由例如以下方法來合成。首先,將單體 溶解於溶劑並加熱,加入聚合起始劑使之共聚合。共聚合 反應中,因應需要可使鏈轉移劑存在。單體、聚合起始劑、 溶劑及鏈轉移劑可連續添加。 前述溶劑方面可舉乙醇、1-丙醇、2-丙醇、1-丁醇、乙 二醇等醇類;丙酮、2-丁酮、曱基異丁基酮、環己酮等酮 類;2-曱氧基乙醇、2-乙氧基乙醇、2-丁氧基乙醇等賽路蘇 類;2-(2-甲氧基乙氧基)乙醇、2-(2-乙氧基乙氧基)乙醇、 2-(2-丁氧基乙氧基)乙醇等卡必醇類;乙酸甲酯、乙酸基 酯、乙酸正丁酯、乳酸乙酯、乳酸正丁酯、乙二醇單曱基 醚乙酸酯、乙二醇單乙基醚乙酸酯、乙二醇單丁基醚乙酸 酯、二乙二醇單曱基醚乙酸酯、二乙二醇單乙基醚乙酸酯、 二乙二醇單丁基醚乙酸酯、丙二醇單曱基醚乙酸酯、乙二 醇二乙酸酯、丙二醇二乙酸酯、乙基-3-乙氧基丙酸酯、環 己醇乙酸酯、乳酸丁酯、丁内酯、3-曱基-3-甲氧基丁基 乙酸酯、乳酸乙酯、乳酸正丁酯、T -丁内酯、3-甲氧基丁 基乙酸酯、3-曱基-3-曱氧基丁基乙酸酯、丙三醇三乙酸酯 等酯類;二乙二醇二曱基醚、二乙二醇二乙基醚、二乙二 醇二丁基醚、三乙二醇二曱基醚、四乙二醇二曱基醚、丙 二醇二甲基ϋ、二丙二醇二曱基醚、二丁基醚、二乙二醇 乙基曱基醚等。 聚合起始劑方面可舉公知有機過氧化物、無機過氧化 23 201248326 物、偶氮化合物等。有機過氧化物、無機過氧化物可與還 元劑組合,作為氧化還原系觸媒來使用。 有機過氧化物可舉苯甲基過氧化物、月桂醯基過氧化 物、異丁烯基過氧化物、三級丁基羥過氧化物、三級丁基-異丙苯過氧化物等。無機過酸化物方面可舉過硫酸銨、 過硫酸納、過硫酸鉀、過氧化氫、過碳酸鹽等。偶氮化合 物方面可舉2,2’-偶氮雙異丁腈、1,1’-偶氮雙(環己酮-1-甲 腈)、2,2’-偶氮雙(2,4-二甲基戊腈)、2,2’-偶氮雙(4-曱氧基 -2,4-二甲基戊腈)、2,2’-偶氮雙異丁酸二甲酯、2,2’-偶氮雙 (2-甲脒基丙烷)二氣酸鹽等。 鏈轉移劑方面可舉正丁基硫醇、正十二烷基硫醇、三 級丁基硫醇、硫醇酸乙酯、硫二醇酸2-乙基己酯、2-硫醇乙 醇等硫醇類;氣仿、四氣化碳、四溴化碳等鹵素化烷基。 又,撥墨劑(Α1)為具有乙烯性雙鍵之情況下,可藉由使 如上述獲得之共聚物、與具有可與反應性基鍵結之官能基 與乙烯性雙鍵之化合物(zl)反應而獲得撥墨劑(Α1)。 相對於反應性基,具有可與該反應性基鍵結之官能基 與乙烯性雙鍵之化合物(zl)之組合方面,可舉例如以下組 合。 (1) 對羥基具有乙烯性雙鍵之酸酐、 (2) 對羥基具有異氰酸酯基與乙烯性雙鍵之化合物、 (3) 對羥基具有氣化醯基與乙烯性雙鍵之化合物、 (4) 對酸酐具有羥基與乙烯性雙鍵之化合物、 (5) 對羧基具有環氧基與乙烯性雙鍵之化合物、 24 201248326 (6)對環氧基具錢基與乙烯性雙鍵之化合物。 =具有綠與乙烯性雙鍵之化合物對環氧基反應後, 使1分子中具有2似域基之化合物之祕,對所生成之 羥基反應,便可於撥墨劑(A1)導入酸性基。 具有乙稀性雙鍵之酸酐之具體例方面,可舉上述之 例。具有異氰酸錄與乙雜雙鍵之化合物之具體例可舉 例^2 (甲基)丙職氧基乙基異氰酸s旨、m((甲基)丙 醯乳基甲基)乙基異氰酸醋。具有氯化醯基與乙稀性雙鍵之 化合物之《例方面,可舉(甲基)㈣醯基氯化物。具有經 基與乙烯性雙叙化合物之越财面,可舉上述具有經 基之單體之例。具有環氧基與乙舰雙鍵之化合物之具體 例’可舉上述具有環氧基之單體之例。具有減與乙歸性 雙鍵之化合物之具體例方面,可舉上述具有之單體之 例。又,1分子中具有2個以上羧基之化合物之酸酐之具體 例方面,可舉以上述單體㈣所示之具有乙稀性雙鍵之酸酐 之例。 使共聚物、與具有可與反應性基鍵結之官能基與乙稀 性雙鍵之化合物(zl)反應之際,用於反應之溶劑方面,可使 用在上述共聚物合成時所例示之溶劑。 又,以摻此聚合禁止劑為佳。作為聚合禁止劑者可舉 例如2,6-二-三級丁基-對-甲酚、三級丁基_對_苯醌。 又,亦可加入觸媒或中和劑。例如,使具有羥基之共 聚物、與具有異氰酸酯基與乙烯性雙鍵之化合物反應之情 況下,可使用二丁基錫二月桂酯等錫化合物等。使具有羥 25 201248326 基之共聚物、與具有氣化醯基與乙烯性雙鍵之化合物反應 之情況下,可使用驗性觸媒。 各單體相對於行共聚合之單體總質量之適當比率如 下。單體(al)或單體(a2)之比率以20〜80質量%為佳,30〜60 質量%尤佳。該比率若在上述範圍之下限値以上,則撥墨 劑(A1)會使由形成之硬化膜構成之隔壁表面張力降低,賦予 隔壁高撥墨性。若在上述範圍之上限値以下,則隔壁與基 材之密接性變得良好。 含有單體(a3)之情況下,其比率以2〜20質量%為佳, 4〜12質量%尤佳。若在上述範圍,負型感光性樹脂組成物 之顯影性變得良好。 含有單體(a4)之情況下,其比率以5〜70質量%為佳, 10〜60質量%較佳,15〜50質量%尤佳。若在上述範圍,則即 使在顯影步驟中提高壓力之情況下仍可維持撥液性。進 而,可防止殘膜發生。 在含有單體(a5)之情況下,其比率以20〜70質量%為 佳,30〜50質量%尤佳。透過源自以上述範圍含有之單體(a5) 之聚合單元,乙烯性雙鍵被導入,撥墨劑(A1)對隔壁表面之 固定化及顯影性變得良好。 含有其他單體(a6)之情況下,其比率以70質量%以下為 佳,50質量%以下尤佳。若在上述範圍,則鹼溶解性、顯 影性良好。 撥墨劑(A1)之製造中單體之適當組合如下。 (組合1) 26 201248326 單體(al):選自於由(曱基)丙烯酸2-(全氟丁基)乙酯及 (甲基)丙烯酸2-(全氟己基)乙酯所構成群組之至少1種、 單體(a3):選自於由丙烯酸及甲基丙烯酸所構成群組之 至少1種、 單體(a4):選自於由BLEMMER PME-400及BLEMMER PME-1000所構成群組之至少1種、 單體(a5):(曱基)丙烯酸2-經乙g旨。 使上述單體共聚合獲得共聚物之後,使選自於由2_(曱 基)丙烯醯氧基乙基異氰酸酯及丨,丨-雙曱基)丙烯醢氧基曱 基)乙基異氰酸酯所構成群組之至少1種反應,導入乙烯性 雙鍵之化合物。 (組合2) 單體(al):(曱基)丙烯酸2_(全氟丁基)乙酯及(甲基)丙烯 酸2-(全說己基)乙醋所構成群組之至少1種、 單體(a3):丙烯酸及甲基丙烯酸所構成群組之至少丨種、 單體(a4) : BLEMMER PME-400 及 BLEMMER PME-1000所構成群組之至少1種、 因應需要之單體(a6):選自於由(曱基)丙烯酸環氧丙 酯、丙烯酸3,4-環氧環己基曱酯、(甲基)丙烯酸甲酯、(曱 基)丙烯酸異莰酯及(曱基)丙烯酸環己酯所構成群組之至少 1種。 (組合3) 單體(al):選自於由(曱基)丙烯酸2_(全氟丁基)乙酯及 (甲基)丙烯酸2-(全氟己基)乙酯所構成群組之至少丨種、 27 201248326Specific examples of the monomer (a21) include CH2 = CHCOO-CH2CH2-(S i(CH3)2-〇)n-Si(CH3)3, CH2 = CCH3COO-CH2CH2-(Si(CH3)2-〇) n-Si(CH3)3 'CH2 = CHC00-CH2CH2CH2-(Si(CH3)2-0)n-Si(CH3)3, CH2 = CCH3C00-CH2CH2CH2-(Si(CH3)2-0)n-Si( CH 3) 3 and so on. Further, n is about 4, 60, and 160. A commercially available product can be used for the monomer (a21). Commercial products include the following, all of which are trade names. X-22-174DX (manufactured by Shin-Etsu Chemical Co., Ltd.), 16 201248326. X-22-2426 (manufactured by Shin-Etsu Chemical Co., Ltd.), Χ-22-2475 (manufactured by Shin-Etsu Chemical Co., Ltd.). One type of the monomer (a21) may be used, or two or more types may be used in combination. (Monomer (a3)) When the ink repellent (A1) has an acidic group, it is preferred to copolymerize the monomer (a3) having an acidic group together with the monomers (al) to (a2). The monomer having an acidic group (a3) may, for example, be a monomer having a carboxyl group, a monomer having a condensed hydroxyl group, or a monomer having a sulfonic acid group. Examples of the monomer having a carboxyl group include acrylic acid, methacrylic acid, ethylene glycol acetate, crotonic acid, itaconic acid, maleic acid, fumaric acid, cinnamic acid, and the like. Examples of the monomer having a phenolic hydroxyl group include o-hydroxystyrene, m-hydroxybenzene, ethylene, and p-hydroxystyrene. Further, one or more hydrogen atoms of the benzene ring may be substituted with an alkyl group such as a mercapto group, an ethyl group or a n-butyl group, or an alkyl group such as a methoxy group, an ethoxy group or a n-butoxy group. A compound of an oxy group, a halogen atom or an alkyl group in which one or more hydrogen atoms are substituted by a ii atom, a nitro group, a cyano group or a guanamine group. Examples of the monomer having a sulfonic acid group include vinylsulfonic acid, styrenesulfonic acid, (meth) propyl sulfonic acid, 2-hydroxy-3-(methyl)allyloxypropane sulfonic acid, ( Mercapto)-2-sulfoethyl acrylate, 2-propane propyl (meth)acrylate, 2-hydroxy-3-(methyl) propylene oxypropyl sulfonate ' 2 —(fluorenyl) propylene oxime The amine 2 - methylpropane sulfonic acid 0 monomer (a3) aspect is preferably acrylic or methacrylic acid in terms of ease. One type of the monomer (a3) may be used, or two or more types may be used in combination. 17 201248326 (monomer (a4)) The monomer having a group (11) for the production of the ink-repellent (A1), preferably a compound represented by the following formula (12) (hereinafter also referred to as a compound (12)) or (13) A compound (hereinafter also referred to as a compound (13)). These may be used alone or in combination of two or more. CH2 = CR24-COO-W-(R210)m(R220)jR23 (12) CH2 = CR25-0-W-(R210)m(R220)jR23 (13) In equations (12) and (13), R24 and R25 is a hydrogen atom, a gas atom, a bromine atom, an iodine atom, a cyano group, an alkyl group having 1 to 20 carbon atoms, an alkyl group substituted with an aryl group having 7 to 20 carbon atoms, and a carbon number of 6 to 20; An aryl group or a cycloalkyl group having 3 to 20 carbon atoms. W is a single bond or a carbon atom number of 10 which does not have a divalent organic group of a fluorine atom. -(R21〇)m(R22〇)jR23 is a group (11), and R21, R22, R23, m and j are the same meanings as the group (11), and the appropriate ranges are also the same. In the case of the compound (12) and the compound (13), when W is a divalent organic group having no fluorine atom and having 1 to 10 carbon atoms, a linear structure, a branched structure or a ring other than R2l〇 and R22〇 may be mentioned. An oxygen-expanding group having a structure of a ring having a ring structure of 1 to 10, a single bond, or the like. Specific examples of the oxygen stretching base include CH2C6H10CH2O (wherein C6H10 is a cyclohexyl group), CH20, ch2ch2o, ch2ch(ch3)o, ch(ch3)o, CH2CH2CH20, C(CH3)20, and ch(ch2ch3). o, ch2ch2ch2ch2o, ch(ch2ch2ch3)o 'ch2(ch2)3ch2o, ch(ch2ch(ch3)2)o, and the like. Among them, W in the compounds (12) and (13) is easily obtained, and an oxygen alkyl group having 2 to 4 carbon atoms is preferred. In the compounds (12) and (13), R24 and R25 are each preferably a hydrogen atom, a gas 18 201248326 atom, a fluorenyl group, a phenyl group or a benzyl group, and particularly preferably a hydrogen atom, a gas atom or a methyl group. The compound represented by the compound (12) is as follows. CH2=CHOCH2C6Hi〇CH20(CH2CH20)mR23 > CH2 = CHO(CH2)40(CH2CH20)mR23. The compound represented by the compound (13) is as follows. CH2 = CHC00(CH2CH20)mR23, CH2 = C(CH3)C00(CH2CH20)mR23, CH2 = CHC00(CH2CH20)m(C3H60)jR23, CH2 = C(CH3)C00(CH2CH20)m(C3H60)jR23, CH2 = CHC00(C2H40)m(C4H80)jR23. In the formula, m and j have the same meaning as the base (11), and the appropriate range is also #目HHw is a cyclohexyl group. QH4, (:3 private, C#8 is a linear structure or a support structure. R23 represents the same meaning as the base (11), and the appropriate range is a linear, unsubstituted alkyl group having a subnumber of 1 to 10. For the compound (12) and (13), a commercially available product can be used. The following products are commercially available. The product can be used as a BLEMMER PME-400 (trade name, manufactured by Nippon Oil & Fats Co., Ltd., C(CH3). COO(CH2CH2〇)kCH3. wherein k represents an intermolecular average value, and 匕値 is about 9. Hereinafter, k, m, and j in the molecular formula of each of the commercially available products represent an intermolecular average value), BLEMMER PME-1000 ( Product name, manufactured by Nippon Oil & Fats Co., Ltd., CH2=C(CH3)C00(CH2CH20)kCH3. In the formula, k represents the intermolecular average value, k値 is 23), and NKESTERM-230G: (trade name, manufactured by Shin-Nakamura Chemical Co., Ltd., CH2 = C(CH3)C00(CH2CH20)kCH3. In the formula, 19 201248326 k is about 9), NEW FRONTIER NF Bisomer PEM6E (trade name, manufactured by Daiichi Kogyo Co., Ltd., CH2 = C(CH3)C00(CH2CH20)kH In the formula, k is about 6), Light Ester 130A (trade name, manufactured by Kyoeisha Chemical Co., Ltd., CH2 = CHCOO(CH2CH20) kCH3. where k is about 9), BLEMMER ΑΕ-4〇0 (trade name, Japan) grease System, CH2 = CHC00(CH2CH20)kH: where k is about 10), BLEMMER PP-800 (trade name, manufactured by Nippon Oil Co., Ltd., CH2 = C(CH3)C00(C3H60)kH. where k is about 13), BLEMMER Gossip-800 (trade name, manufactured by Nippon Oil & Fats Co., Ltd., (:112 = (:11(:00((:3^160)1{1^. where k is about 13), BLEMMER 70PEP- 350B (trade name, 曰本油杜制, CH2 = C(CH3)COO(C2H40)m(C3H60)jH. where m is about 5, j is about 2), BLEMMER 55PET-800 (trade name, transcript) 'CH2 = C(CH3)C00(C2H40)m(C4H80)|H. In the formula, m is about 10 and j is about 5) (monomer (a5)) monomer having a reactive group (a5) In terms of a monomer having a hydroxyl group, an acid anhydride monomer having an ethylenic double bond, a monomer having a carboxyl group, a monomer having an epoxy group, etc. Further, the monomer (a5) is substantially free of a group. And a base is preferred. When a monomer having a carboxyl group is used as the monomer having an acidic group (a3), and a monomer having a carboxyl group is also used as the monomer having the reactive group (a5), it is not finally introduced. The ethylenic double bond and the carboxyl group remain as a monomer (a3). The reactive group of the monomer (a5) after the copolymerization is reacted by a compound (z 1) having a functional group bonded to the reactive group at 20 201248326 and an ethylenic double bond, thereby forming An ink-repellent (A1) having a side chain and having an ethylenic double bond. Specific examples of the monomer having a transradical group may be exemplified by 2-hydroxyethyl acrylate, 2-hydroxypropyl (meth) acrylate, 3-hydroxypropyl (meth) acrylate, ) 4-hydroxybutyl acrylate, 5-hydroxypentyl (meth) acrylate, 6-hydroxyhexyl (meth) acrylate, 4-hydroxycyclohexyl (meth) acrylate, neopentyl diol mono Propionate, 3-methyl-2-propyl (meth)acrylate, glycerol mono(decyl) acrylate, 2-hydroxyethyl vinyl ether, 4-hydroxybutyl vinyl ether, ring Hexanediol monovinyl ether, 2-hydroxyethyl allyl ether, N-hydroxydecyl (decyl) acrylamide, N, N-bis(hydroxymethyl) (fluorenyl) acrylamide, and the like. Further, in the case of a monomer having a hydroxyl group, a monomer having a polyoxyalkylene group having a terminal hydroxyl group may also be used. For example, ch2 = choch2c6h1q CH20(C2H4〇)hH (here, h is an integer from !100, the same applies hereinafter), CH2 = CHOC4H80(C2H40)hH, CH2 = CHC00C2H40(C2H40)hH, CH2 = C(CH3) C00C2H40(C2H40)hH, CH2 = CHCOOC2H40 (C2H40)i(C3H60)gH (here, i is an integer of 0 to 100, g is an integer of l~l〇〇, i+g is 1 to 100. The same applies hereinafter) , CH2 = C(CH3)COOC2H40(C2 H40)i(C3H60)gH, etc. Specific examples of the acid anhydride monomer having an ethylenic double bond include maleic anhydride, itaconic anhydride, citraconic anhydride, decyl-5-norbornene-2,3-dicarboxylic anhydride, 3, 4, 5, 6-tetrahydrophthalic anhydride, cis-1,2,3,6-tetrahydrophthalic anhydride, 2-buten-1-yl succinic anhydride, and the like. Specific examples of the monomer having a carboxyl group include acrylic acid and mercaptopropene 21 201248326 acid, ethyl acetate acetonate, crotonic acid, itaconic acid, and maleic acid, fumaric acid, cinnamic acid, or the like. Specific examples of the monomer having an epoxy group include (meth)acrylic acid oxypropyl ester and 3,4-epoxycyclohexyl methyl acrylate. (Monomer (a6)) The monomer used for the polymerization in the present invention has a monomer (al) having a group (1) or a monomer (10) having a group (2) and a monomer (4) having an acidic group as necessary) If the monomer having a polyoxyalkylene group (such as an ink repellent) has an ethylene double bond, it may contain a monomer having the reactive group (a5), but may contain the same Other monomer (a6) other than the body. Examples of the monomer (a6) include hydrocarbon olefins, vinyl ethers, isopropyl ethers, allyl ethers, vinyl esters, allyl esters, and (mercapto) acrylic acid. _, (methyl) propylene riding, aromatic ethyl compounds, gas olefins, conjugated dienes. These compounds may also contain a functional group, and examples of the functional group include a few groups, a oxy group, and the like. It is preferable that the heat resistance of the partition wall is excellent, and it is preferable to use (meth) acrylate or (fluorenyl) acrylamide. Further, as the monomer having an epoxy group as the monomer (a5) having the above reactive group, for example, (meth)acrylic acid propyl acrylate, acrylic acid 3,4-epoxycyclohexyl decyl ester, etc. It can be used as a monomer (a6). In the present invention, in the case where a monomer having an epoxy group such as a quinone is used for the polymerization, if the ethylenic double bond is not introduced after the copolymerization, the monomers having an epoxy group are classified into other monomers. (a6) ° and 'even if the four (4) double bond is introduced, if the epoxy double bond is not introduced but the epoxy group remains, it is regarded as another monomer 22 201248326 (a6) 〇 Production of Agent (A1) The ink-repellent (A1) can be synthesized by, for example, the following method. First, the monomer is dissolved in a solvent and heated, and a polymerization initiator is added to copolymerize it. In the copolymerization reaction, a chain transfer agent may be present as needed. The monomer, polymerization initiator, solvent and chain transfer agent can be continuously added. Examples of the solvent include alcohols such as ethanol, 1-propanol, 2-propanol, 1-butanol, and ethylene glycol; and ketones such as acetone, 2-butanone, decyl isobutyl ketone, and cyclohexanone; 2-cetoxyethanol, 2-ethoxyethanol, 2-butoxyethanol, etc.; sulphone; 2-(2-methoxyethoxy)ethanol, 2-(2-ethoxy ethoxy) Carbenol such as ethanol, 2-(2-butoxyethoxy)ethanol; methyl acetate, acetate, n-butyl acetate, ethyl lactate, n-butyl lactate, ethylene glycol monoterpenes Ethyl ether acetate, ethylene glycol monoethyl ether acetate, ethylene glycol monobutyl ether acetate, diethylene glycol monodecyl ether acetate, diethylene glycol monoethyl ether acetate Ester, diethylene glycol monobutyl ether acetate, propylene glycol monodecyl ether acetate, ethylene glycol diacetate, propylene glycol diacetate, ethyl-3-ethoxy propionate, ring Hexanol acetate, butyl lactate, butyrolactone, 3-mercapto-3-methoxybutyl acetate, ethyl lactate, n-butyl lactate, T-butyrolactone, 3-methoxy Esters such as butyl acetate, 3-mercapto-3-indolyl butyl acetate, glycerol triacetate; Dimercaptoether, diethylene glycol diethyl ether, diethylene glycol dibutyl ether, triethylene glycol didecyl ether, tetraethylene glycol didecyl ether, propylene glycol dimethyl hydrazine, dipropylene glycol Mercapto ether, dibutyl ether, diethylene glycol ethyl decyl ether and the like. The polymerization initiator may, for example, be an organic peroxide, an inorganic peroxide 23 201248326 or an azo compound. The organic peroxide and the inorganic peroxide can be used in combination with a reductant as a redox catalyst. The organic peroxide may, for example, be a benzyl peroxide, a lauryl peroxide, an isobutylene peroxide, a tertiary butyl hydroxy peroxide or a tertiary butyl cumene peroxide. Examples of the inorganic peracid include ammonium sulfate, sodium persulfate, potassium persulfate, hydrogen peroxide, percarbonate and the like. Examples of the azo compound include 2,2'-azobisisobutyronitrile, 1,1'-azobis(cyclohexanone-1-carbonitrile), and 2,2'-azobis (2,4-). Dimethylvaleronitrile), 2,2'-azobis(4-decyloxy-2,4-dimethylvaleronitrile), 2,2'-azobisisobutyric acid dimethyl ester, 2, 2'-Azobis(2-methylamidinopropane) dicarbonate. Examples of the chain transfer agent include n-butyl mercaptan, n-dodecyl mercaptan, tributyl thiol, ethyl thiolate, 2-ethylhexyl thiolate, 2-thiol ethanol, and the like. Mercaptans; halogenated alkyl groups such as gas, tetra-carbonized carbon, and carbon tetrabromide. Further, when the ink repellent (Α1) has an ethylenic double bond, the copolymer obtained as described above and the compound having a functional group bonded to a reactive group and an ethylenic double bond (zl) can be used. The reaction was carried out to obtain an ink repellency agent (Α1). The combination of the compound (zl) having a functional group bondable to the reactive group and the ethylenic double bond with respect to the reactive group may, for example, be the following combination. (1) An acid anhydride having an ethylenic double bond to a hydroxyl group, (2) a compound having an isocyanate group and an ethylenic double bond to a hydroxyl group, (3) a compound having a vaporized thiol group and an ethylenic double bond to a hydroxyl group, (4) a compound having a hydroxyl group and an ethylenic double bond for an acid anhydride, (5) a compound having an epoxy group and an ethylenic double bond to a carboxyl group, and a compound having a hydroxyl group and an ethylenic double bond in the group 201224326 (6). = The compound having a green and ethylenic double bond reacts with an epoxy group to give a compound having a 2-domain-like group in one molecule, and reacts with the generated hydroxyl group to introduce an acidic group into the ink-repellent (A1). . Specific examples of the acid anhydride having a vinyl double bond include the above examples. Specific examples of the compound having an isocyanic acid and an ethyl double bond can be exemplified by 2 (methyl) propyloxyethyl isocyanate s, m ((methyl) propyl sulfonyl methyl) ethyl Isocyanate vinegar. As an example of the compound having a ruthenium chloride group and an ethylenic double bond, (meth)(tetra)indenyl chloride can be mentioned. The more the face of the compound having a radical and an ethylenic compound, the above-mentioned monomer having a radical. Specific examples of the compound having an epoxy group and a double bond of the ethyl group are exemplified by the above monomer having an epoxy group. Specific examples of the compound having a reduced double bond and a double bond include the above-mentioned examples of the monomer. Further, specific examples of the acid anhydride of the compound having two or more carboxyl groups in one molecule include an acid anhydride having an ethylene double bond represented by the above monomer (IV). When the copolymer is reacted with a compound (zl) having a functional group capable of bonding with a reactive group and an ethylenic double bond, a solvent exemplified in the synthesis of the above copolymer can be used as a solvent for the reaction. . Further, it is preferred to incorporate the polymerization inhibiting agent. As the polymerization inhibiting agent, for example, 2,6-di-tertiary butyl-p-cresol or tertiary butyl-p-benzoquinone can be mentioned. Further, a catalyst or a neutralizing agent may also be added. For example, when a copolymer having a hydroxyl group and a compound having an isocyanate group and an ethylenic double bond are reacted, a tin compound such as dibutyltin dilaurate or the like can be used. In the case where a copolymer having a hydroxy 25 201248326 group is reacted with a compound having a vaporized thiol group and an ethylenic double bond, an inert catalyst can be used. The appropriate ratio of each monomer to the total mass of the monomers copolymerized is as follows. The ratio of the monomer (al) or the monomer (a2) is preferably from 20 to 80% by mass, particularly preferably from 30 to 60% by mass. When the ratio is at least the lower limit of the above range, the ink repellent (A1) lowers the surface tension of the partition wall formed of the formed cured film, and imparts high ink repellency to the partition wall. When the upper limit is less than or equal to the upper limit of the above range, the adhesion between the partition wall and the base material is good. When the monomer (a3) is contained, the ratio is preferably 2 to 20% by mass, more preferably 4 to 12% by mass. When it is in the above range, the developability of the negative photosensitive resin composition becomes good. In the case where the monomer (a4) is contained, the ratio is preferably 5 to 70% by mass, preferably 10 to 60% by mass, more preferably 15 to 50% by mass. If it is in the above range, the liquid repellency can be maintained even if the pressure is increased in the developing step. Further, the residual film can be prevented from occurring. In the case where the monomer (a5) is contained, the ratio is preferably 20 to 70% by mass, more preferably 30 to 50% by mass. By the polymerization unit derived from the monomer (a5) contained in the above range, an ethylenic double bond is introduced, and the ink-repellent (A1) is fixed to the surface of the partition wall and developability is improved. When the other monomer (a6) is contained, the ratio is preferably 70% by mass or less, more preferably 50% by mass or less. When it is in the above range, alkali solubility and developability are good. A suitable combination of the monomers in the manufacture of the ink-repellent (A1) is as follows. (Combination 1) 26 201248326 Monomer (al): selected from the group consisting of 2-(perfluorobutyl)ethyl (meth)acrylate and 2-(perfluorohexyl)ethyl (meth)acrylate At least one of the monomers (a3): at least one selected from the group consisting of acrylic acid and methacrylic acid, and the monomer (a4) selected from the group consisting of BLEMMER PME-400 and BLEMMER PME-1000 At least one of the groups, monomer (a5): (mercapto)acrylic acid 2- to ethyl ke. After copolymerizing the above monomers to obtain a copolymer, a group selected from the group consisting of 2-(indenyl)acryloxyethyl isocyanate and anthracene, fluorenyl bis-indenyl) propylene fluorenyl) ethyl isocyanate At least one reaction of the group, a compound in which an ethylenic double bond is introduced. (combination 2) monomer (al): at least one of a group consisting of (meth)acrylic acid 2_(perfluorobutyl)ethyl ester and (meth)acrylic acid 2-(allylhexyl)acetic acid (a3): at least one of a group consisting of acrylic acid and methacrylic acid, and a monomer (a4): at least one of a group consisting of BLEMMER PME-400 and BLEMMER PME-1000, and a monomer required (a6) : selected from (meth)acrylic acid propyl acrylate, 3,4-epoxycyclohexyl acrylate, methyl (meth) acrylate, isodecyl acrylate and (fluorenyl) acrylate ring At least one of the groups consisting of hexyl esters. (Combination 3) Monomer (al): at least selected from the group consisting of 2-(perfluorobutyl)ethyl (meth)acrylate and 2-(perfluorohexyl)ethyl (meth)acrylate Species, 27 201248326

單體(a4):選自於由BLEMmeR PME-400及BLEMMER PME-_所構成群纽之至少丨種、 單體(a5):(甲基)丙烯酸環氧丙酯 單體(a6) : 3,4_環氧環己基丙烯酸甲酯、(曱基)丙烯酸 甲自旨、(甲基)兩埽酸異莰酯及(曱基)丙烯酸環己酯所構成群 組之至少1種。 使上述單體共聚合獲得共聚物之後,使選自於由丙烯 酸及曱基丙烯酸所構成群組之至少1種反應,接著使選自於 由3,4,5,6-四氫笨二甲酸酐及順式-1,2,3,6-四氫苯二甲酸酐 所構成群組之至少丨種反應,而導入酸性基及乙烯性雙鍵之 化合物。 (組合4) 單體(al):(曱基)丙烯酸2-(全氟丁基)乙酯及(甲基)丙烯 酸2-(全敗己基)乙酯所構成群組之至少丨種、 單體(a2) : X-22-174DX、X-22-2426及X-22-247所構成 群組之至少1種、 單體(a3):丙烯酸及甲基丙烯酸所構成群組之至少1種、 單體(a4) : BLEMMER PME-400 及 BLEMMER PME-1000所構成群組之至少丨種、 單體(a5):(曱基)丙烯酸2_羥乙酯。 使上述單體共聚合獲得共聚物之後,使2-(甲基)丙烯醯 氧基乙基異氪酸酯及U-雙((曱基)丙烯醯氧基甲基)乙基異 氰酸醋所構成群組之至少1種反應,而導入乙烯性雙鍵之化 合物。 28 201248326 (組合5) 單體(a2) : X-22-174DX、X-22-2426及X-22-247所構成 群組之至少1種、 單體(a3):丙烯酸及甲基丙烯酸所構成群組之至少1種、 單體(a4) : BLEMMER PME-400 及 BLEMMER PME-1000所構成群組之至少丨種、 單體(a5):(曱基)丙稀酸2-經乙酯。 使上述單體共聚合獲得共聚物之後’使2_(曱基)丙烯醯 氧基乙基異氰酸酯及匕丨-雙^曱基)丙烯醯氧基甲基)乙基異 氰酸酯所構成群組之至少1種反應,而導入乙烯性雙鍵之化 合物。 撥墨劑(A1)具有乙烯性雙鍵時,共聚物與化合物(zl), 係以使其[化合物(zl)之官能基]/[共聚物之反應性基]之當 量比的値成為0.5〜2.0來置入為佳,〇·8~1·5尤佳。若在上述 範圍之下限値以上’則撥墨劑(Α1)朝隔壁之固定化變得良好。 若在上述範圍之上限値以下,則屬未反應化合物(ζ1)之不純 物變多,塗膜外觀惡化。再者,當單體(a3)與單體(a4)兩者 皆使用具有羧基之單體之情況下,只要調整共聚物與化合 物(zl)之置入量使撥墨劑(A〗)之酸價成為預定値即可。 撥墨劑(A1)具有基(1)之情況,撥墨劑(Αι)之氟原子含有 率以5〜50質量%為佳’ 1 〇〜4〇質量%較佳,2〇〜35質量。/〇尤 佳。若在上述範圍之下限値以上,撥墨劑(Αι)使隔壁表面張 力降低之效果佳,可獲得撥墨性優異之隔壁。若在上述範 圍之上限値以下,則與隔壁及基材之密接性變得良好。 29 201248326 撥墨劑(A1)具有基(2)之情況下’撥墨劑(a1)之砂原子人 有率以0.1〜25質量%為佳,0.5〜10質量。/〇尤佳。若在上述範 圍之下限値以上,撥墨劑(A1)可賦予使得形成之隔壁的表面 張力降低以及提高印墨輕落性之效果。若在上述範圍之上 限値以下,則與隔壁及基材之密接性變得良好。 撥墨劑(A1)之酸價以l50mgKOH/g以下為佳, 10〜100mgKOH/g尤佳。若在上述範圍,可使負型感光性樹 脂組成物兼具朝顯影液之溶解性與展現撥墨性兩者。 撥墨劑(A1)含有乙烯性雙鍵時的量,以〇5χΐ〇3~5χ l〇-Wl/g為佳,lxl(^〜4.5xl(r3_/g尤佳。若在上述範圍貝: 撥墨劑(A1)朝隔壁之固定化及顯影性變得良好。 撥墨劑(V)之數目平均分子量(Mn)以5χ1〇3〜咖〇4為 佳,8XH)3〜9xl〇4較佳’ 1χ1〇4〜7χ1〇4尤佳。若在上述範圍則 鹼溶解性、顯影性良好。 、 量(Mw)以 ΐ.2χΐ〇4〜2〇χ1〇4 一 12xl〇4尤佳。若在上述範 撥墨劑(A1)之質量平均分子 為佳 ’ 2xl04〜15xl〇4較佳,3χ1〇4 圍則鹼溶解性、顯影性良好。 又以是側鏈具有基⑴且主物 Λ氧鏈之化合物為佳。以下,Φ 1 ^ 撥墨劑⑷為「撥墨劑(a2)」。*主鏈為有機聚石夕偏 :撥墨献㈣含叫她加之水解㈣ 下式(15)表不之水解性碎 或其科水輪崎::::下撕咖 解丨生石夕燒化合物混合物、 30 201248326 S玄混合物之部分水解縮合物所構成。Monomer (a4): at least one selected from the group consisting of BLEMmeR PME-400 and BLEMMER PME-_, monomer (a5): glycidyl (meth)acrylate monomer (a6): 3 At least one selected from the group consisting of 4_epoxycyclohexyl acrylate, (mercapto)acrylic acid, (meth)isodecyl decanoate, and (fluorenyl)cyclohexyl acrylate. After copolymerizing the above monomers to obtain a copolymer, at least one selected from the group consisting of acrylic acid and methacrylic acid is selected, followed by being selected from 3,4,5,6-tetrahydrobenzal A compound in which at least one of a group consisting of an acid anhydride and cis-1,2,3,6-tetrahydrophthalic anhydride is introduced into an acid group and an ethylenic double bond. (Combination 4) Monomer (al): at least anthracene, monomer of a group consisting of 2-(perfluorobutyl)ethyl (meth)acrylate and 2-(hexa-hexyl)ethyl (meth)acrylate (a2) : at least one of a group consisting of X-22-174DX, X-22-2426, and X-22-247, and at least one of a group consisting of a monomer (a3): acrylic acid and methacrylic acid, Monomer (a4): At least one of the groups consisting of BLEMMER PME-400 and BLEMMER PME-1000, monomer (a5): 2-hydroxyethyl (meth) acrylate. After copolymerizing the above monomers to obtain a copolymer, 2-(meth)acrylomethoxyethyl isodecanoate and U-bis((fluorenyl)acryloxymethyl)ethyl isocyanate are added. A compound in which at least one of the groups is reacted to introduce an ethylenic double bond. 28 201248326 (combination 5) monomer (a2): at least one of the groups consisting of X-22-174DX, X-22-2426 and X-22-247, monomer (a3): acrylic acid and methacrylic acid At least one of the group, monomer (a4): at least one of the group consisting of BLEMMER PME-400 and BLEMMER PME-1000, monomer (a5): (mercapto) acrylate 2-ethyl ester . After copolymerizing the above monomers to obtain a copolymer, at least 1 of the group consisting of 2_(indenyl) propylene oxiranyl ethyl isocyanate and fluorenyl methoxymethyl) ethyl isocyanate The compound is introduced into a compound having an ethylenic double bond. When the ink-repellent (A1) has an ethylenic double bond, the copolymer and the compound (zl) have an equivalent ratio of [the functional group of the compound (zl)] / [reactive group of the copolymer] to 0.5. ~2.0 to insert is better, 〇·8~1·5 is especially good. If it is at or above the lower limit of the above range, the fixing of the ink-repellent (Α1) to the partition wall becomes good. When the upper limit of the above range is 値 or less, the amount of impurities which are unreacted compounds (ζ1) increases, and the appearance of the coating film deteriorates. Further, in the case where both the monomer (a3) and the monomer (a4) use a monomer having a carboxyl group, the adjustment of the amount of the copolymer and the compound (zl) is adjusted so that the ink repellent (A) is The acid price becomes a predetermined price. In the case where the ink-repellent (A1) has the base (1), the fluorine atom content of the ink-repellent (Α1) is preferably 5 to 50% by mass, preferably 1 〇 to 4 〇% by mass, and 2 〇 to 35 mass%. /〇 Especially good. When the ink is at or above the lower limit of the above range, the ink-repellent (Αι) is excellent in the effect of lowering the surface tension of the partition wall, and a partition wall excellent in ink-repellent property can be obtained. When the upper limit is less than or equal to the above range, the adhesion to the partition wall and the substrate becomes good. 29 201248326 In the case where the ink repellent (A1) has the base (2), the sand atomic probability of the ink repellent (a1) is preferably 0.1 to 25% by mass, and 0.5 to 10% by mass. /〇尤佳. If it is at least the lower limit of the above range, the ink-repellent (A1) imparts an effect of lowering the surface tension of the formed partition walls and improving the ink drop. If it is less than or equal to the above range, the adhesion to the partition wall and the substrate becomes good. The acid value of the ink-repellent (A1) is preferably 150 mgKOH/g or less, and more preferably 10 to 100 mgKOH/g. When it is in the above range, the negative photosensitive resin composition can have both solubility to the developer and ink repellency. The amount of the ink-repellent (A1) containing the ethylenic double bond is preferably 〇5χΐ〇3~5χ l〇-Wl/g, lxl(^~4.5xl (r3_/g is especially good. If in the above range: The fixing of the ink-repellent (A1) to the partition wall and the developability are good. The number average molecular weight (Mn) of the ink-repellent (V) is preferably 5χ1〇3~Curry4, 8XH)3~9xl〇4 It is preferable that it is excellent in alkali solubility and developability in the above range. The amount (Mw) is preferably ΐ.2χΐ〇4~2〇χ1〇4 to 12xl〇4. The mass average molecular weight of the above-mentioned ink-repellent agent (A1) is preferably '2x10~15xl〇4, and the alkali solubility and developability of 3χ1〇4 are good. Further, the side chain has a group (1) and the main substance is oxygenated. The compound of the chain is preferred. Hereinafter, the Φ 1 ^ ink-repellent (4) is the "inking agent (a2)". * The main chain is the organic polylithic eclipse: the ink is given (four) contains the hydrolysis and (4) the following formula (15) It is composed of a hydrolyzed granule or a hydrolyzed condensate of the mixture of 30 201248326 S sin.

Rf-CFX-Q'.Six.3 · . . (Η) R P'SlXVP) · · · (15) (式(14)及(15)中之記號如以下。 又及1^/與上述相同, Q _碳原子數1〜1〇之不含氟原子之2價有機基, rHI :碳原子數1~6之烴基, X1、X2 :水解性基, P : 0、1 或2, 惟’式(14)中之3個Χι、式(15)中之(4__χ2 ρ個炉 可互異亦可相同。) 撥墨劑(A2)之㈣子含有率以1〇〜55質量%為佳,u 質量%較佳,15〜30質量%尤佳,氟原子含有率若在上述範 圍,可對由負型感光性樹脂組成物獲得之隔壁賦予優異之 撥墨性及撥墨性之耐紫外線/臭氧性。 撥墨劑(A2)以具有矽醇基(即鍵結於矽原子之羥基)為 佳。石夕醇基之數目係以每1個矽原子有〇. 2〜3 5個為佳,〇 2〜2 個較佳,〇·5〜丨.5個尤佳。若在上述範圍之下限値以上在 利用負变感光性樹脂組成物形成隔壁之際,可防止撥墨劑 (A2)從基板表面脫離。若在上述範圍之上限値以下,則撥墨 劑(A2)在負型感光性樹脂組成物中與溶劑或其他成分之相 溶性佳。 又,撥墨劑(A2)中之石夕醇基數目,係依據藉由29_· 所測定之具有㈣基之Si基、與不具树醇基之&基的峰值 31 201248326 面積比來求出。 其部物含有㈣化合物(a7)或 物。 、 〃矽烷化合物(a8)或其部分水解縮合 斤明水解性石夕院化合物之 能性水解性石夕燒化合物藉由水^水解縮0物係指多官 寡聚物(多聚體解、繼之脫水縮合所生成之 水解性2 解於溶劑程度之高分子量體。又, a本發月滅合物之2〜4量體等屬較低分子量之多聚體也 =二的部分水解縮合物。部分水解縮合物具有水解 於相對f M ’切科未反應水解性基。屬 / L 子量之部分轉縮合物主要具切醇基,而 ^乂低分子量之部分水解縮合物甚而也會具有水解性 :::解縮合物具有進—步縮合或水解之結果 =!?:之高分子量硬化物之性質。部分水解縮合 Α疋夕聚體化程度不同的寡聚物之混合物。 在預縮合物可藉㈣如錢觸_水的存在下, 等來件下將水解㈣統合物預定時間 藉由斤獲付之部分水解縮合物之多聚體化程度,可 …文濃又、反應溫度、反應時間等來適當調整。 ^者,下述顯示水解性錢化合物比率的莫耳比在 3水解㈣院化合物至少任—者是部分水解縮合物之情 之上述莫耳比係源自各水解性石夕烧化合物之 之比。 32 201248326 (以式(14)表示之水解性矽烷化合物) 如前述式(M)所示,石夕烧化合物㈣係具有基⑴之水解 性石夕烧化合物。前述式㈣中,Q1是連結基⑴與水解性石夕 院基(-SiXS)之2價有機基,碳原子數卜1〇之不含敗原子之之 價有機基。當Q1係以分別於右側之鍵上鍵結Si、於左側之 鍵上鍵結R-CFX-來表示時,具體來說係以^氏^-⑴為 卜5之整數)、_CH2〇(CH2)i2 (i2為卜4之整數)、 _s〇2NRl-(CH2)i3_(Rl為氫原子、甲基、或乙基,i3為1以上 且與R之碳原子數合計為4以下之整數)、-(C == 0)-NR-(CHJiHR1同上述,i4為1以上且與Ri之礙原子數合 計為4以下之整數)來表示之基為佳。Qi方面,iHs2*3之 -(CH2)ii-較佳 ’ -(CH2)2-尤佳。 基⑴為碳原子數1〜6之全氟烷基時,上述Q1係以 -(CHJi^il同上述)所表示之基為佳。u係以2〜4之整數為 佳,il為2之-(CH2)2-尤佳。 基(1)為含醚性氧原子之碳原子數4〜9之全氟烷基時,上 述Q1 係以-(CH2)ir、-CH2〇(CH2)i2-、-SC^NR^-CCH%-、-(c sOVNR^CHJi4·表示之基⑴〜丨斗及!^同上述)為佳。這種情 況下’ -(CH2)2-尤佳。 式(14)中,X1表示鍵結於矽原子之水解性基^ χΐ可舉 烷氧基、lS素原子醯基、異氰酸酯基、胺基及胺基之氫經 烷基取代之基。以碳原子數i〜4之烷氧基或函素原子為佳, 以曱氧基、乙氧基、氣原子尤佳。該基藉由水解反應成為 羥基(矽醇基),進一歩行分子間縮合反應而形成Si-0-Si鍵 33 201248326 之反應可順利地進行。 矽烷化合物(a7)之具體例可舉以下化合物。 F(CF2)4CH2CH2Si(OCH3)3、F(CF2)4CH2CH2Si(OCH2CH 3)3、F(CF2)4CH2CH2SiCl3、F(CF2)6CH2CH2Si(OCH3)3、F(CF 2)6CH2CH2Si(OCH2CH3)3、F(CF2)6CH2CH2SiCl3。 CF3OCF3CF2CF2CH2CH2Si(OCH3)3 ' F(CF2)20CF2CF20 CF2CF2OCF2CF2OCF2CH2CH2Si(OCH2CH3)3、CF3OCF(CF3) CF2CH2CH2CH2Si(OCH3)3。 F(CF2)2OCF2CF2OCF2CH2CH2CH2Si(OCH3)3、F(CF2)20 (CF2)20(CF2)2CH2CH2Si(0CH3)3。 F(CF2)3OCF2CF2CH2CH2SiCl3、F(CF2)30CF(CF3)CF20 (CF2)2CH2CH2Si(OCH3)3。 作為矽烷化合物(a7)方面,其中以F(CF2)6CH2CH2Si(0 CH3)3、F(CF2)6CH2CH2Si(〇CH2CH3)3、F(CF2)6CH2CH2SiCl 3、F(CF2)3〇CF(CF3)CF2〇(CF2)2CH2CH2Si(OCH3)3等尤佳。 水解性i夕烧化合物混合物所含之水解性妙院化合物方 面,矽烷化合物(a7)可單獨使用丨種亦可併用2種以上。 又,前述水解性矽烷化合物混合物亦可含有矽烷化合 物⑹之部分水雜合物。但是,比起部分水解縮合物,二 石夕烧化合物(a7)單體較佳。 (以式(15)表示之水解性矽烷化合物) 以前述式(15)表示之傾化合物(a8),係與上述魏化 合物(37卜起作為在水解性㈣化合物混合物中所含水解 性矽烷化合物來使用。 34 201248326 式(15)中,RHI係以碳原子數丨〜4之烷基為佳,曱基或乙 基較佳,以甲基尤佳。燒基以外之rHI方面,可舉乙烯基或 烯丙基等烯基、苯基或環烷基等具有環之烴基。 X2為水解性基,與上式(15)中之X1包括適宜態様在内 皆相同。ρ為0、1或2。惟,ρ為2時之2個RH1、及(4-ρ)個之 X2可各自互異或相同。 矽烷化合物(a8)係以ρ為〇之4官能性化合物、或4^3 官能性化合物為佳。 於撥墨劑(A2) ’係藉由源自矽烷化合物(a7)之基⑴及源 自矽烷化合物08)之11出而展現撥水性,主要是藉由基(1)而 展現撥油性。又,欲使撥墨劑(A2)之硬化物展現充分撥油性 時,相對於撥墨劑(A2)中基(1)與RHi之合計,基⑴之比率以 偏高為佳。p=〇時’撥墨劑(A2)中的基(1)比率變高而撥油 性提升,或造膜性佳。p= 1或2時,藉由RH1以某程度存在, 撥墨劑(A2)變得容易溶於烴系溶劑,於基板表面形成負型感 光性樹脂組成物塗膜時可選擇較廉價之溶劑。 矽烷化合物(a8)係以如下化合物為佳。又,可使用矽烷 化合物(a8)之部分水解縮合物來代替矽烷化合物(ag)。部分 水解縮合物係以相對較低分子量之化合物為佳。部分水解 縮合物可舉例如下述之物。Rf-CFX-Q'.Six.3 · . . (Η) R P'SlXVP) · · · (15) (The symbols in equations (14) and (15) are as follows. Also 1^/ is the same as above , Q _ carbon atom number 1 to 1 〇 of a fluorine-free atom of a divalent organic group, rHI: a hydrocarbon group having 1 to 6 carbon atoms, X1, X2: a hydrolyzable group, P: 0, 1 or 2, only ' Among the three formulas in the formula (14), the formula (15) (4__χ2 ρ furnaces may be different from each other.) The (4) sub-content of the ink-repellent (A2) is preferably from 1 〇 to 55 mass%. u is preferably a mass%, and is preferably 15 to 30% by mass. When the fluorine atom content is in the above range, it is possible to impart excellent ink repellency and ink repellent resistance to the partition wall obtained from the negative photosensitive resin composition. Ozone. The ink-repellent (A2) is preferably a decyl group (ie, a hydroxyl group bonded to a ruthenium atom). The number of the base group is 〇. 2~3 5 is preferred. 〇2~2 is preferable, and 〇5~丨.5 is particularly preferable. When the partition wall is formed by using the negative-change photosensitive resin composition at the lower limit of the above range, the ink repellent (A2) can be prevented. Detach from the surface of the substrate. If it is below the upper limit of the above range, The ink-repellent (A2) is preferably compatible with the solvent or other components in the negative-type photosensitive resin composition. Further, the number of the base alcohol groups in the ink-repellent agent (A2) is determined by 29_· The ratio of the Si group of the (4) group to the peak of the & base group without a phenolic group 31 201248326. The content thereof contains (4) the compound (a7) or the substance, the decane compound (a8) or a partial hydrolysis thereof. The condensable jinming hydrolyzable Shixi compound compound can be hydrolyzed by a water-hydrolyzed compound, which is a hydrolyzable 2 solution obtained by polycondensation and subsequent dehydration condensation. a high molecular weight body at a solvent level. Further, a 2~4 quantity body of the present month is a partial hydrolysis condensate of a lower molecular weight multimer. The partial hydrolysis condensate has hydrolysis to a relative f. M 'Ceco unreacted hydrolyzable group. The partial condensate of the genus / L sub-mass mainly has a mercaptan group, and the partially hydrolyzed condensate of low molecular weight will even have hydrolyzability::: the decondensate has a - the result of condensation or hydrolysis =!?: the nature of the high molecular weight hardened material. Part of the water Decondensing a mixture of oligomers having different degrees of polymerization. In the presence of the precondensate, the hydrolyzed (tetra) complex is allowed to be paid by the amount of time in the presence of (4) such as money touch water. The degree of multimerization of the partially hydrolyzed condensate can be appropriately adjusted, such as concentration, reaction temperature, reaction time, etc. ^, the following shows the molar ratio of the hydrolyzable money compound in the 3 hydrolysis (four) compound compound at least The above molar ratio is derived from the ratio of each hydrolyzable sulphur compound. 32 201248326 (hydrolyzable decane compound represented by formula (14)) It is shown that the compound (4) of the Shixia compound has a hydrolyzable stone compound of the group (1). In the above formula (4), Q1 is a divalent organic group of a linking group (1) and a hydrolyzable stone base (-SiXS), and the number of carbon atoms is 1 valent. When Q1 is represented by bonding Si on the key on the right side and R-CFX- on the key on the left side, specifically, the integer is ^^(1) is the integer of 5), _CH2〇(CH2) I2 (i2 is an integer of 4), _s〇2NRl-(CH2)i3_ (R1 is a hydrogen atom, a methyl group, or an ethyl group, and i3 is 1 or more and the total number of carbon atoms of R is an integer of 4 or less) - (C == 0) - NR - (CHJiHR1 is the same as above, and i4 is 1 or more and the total number of hindered atoms of Ri is an integer of 4 or less). In terms of Qi, -HCH2*3 - (CH2) ii - preferably ‘ -(CH2)2- is preferably. When the group (1) is a perfluoroalkyl group having 1 to 6 carbon atoms, the above Q1 is preferably a group represented by -(CHJi^il and the above). The u is preferably an integer of 2 to 4, and the il is 2 - (CH2) 2 - preferably. When the group (1) is a perfluoroalkyl group having 4 to 9 carbon atoms and having an etheric oxygen atom, the above Q1 is -(CH2)ir, -CH2〇(CH2)i2-, -SC^NR^-CCH %-, -(c sOVNR^CHJi4· indicates that the base (1) ~ the bucket and the !^ are the same as above). In this case, '-(CH2)2- is especially good. In the formula (14), X1 represents a hydrolyzable group bonded to a ruthenium atom, and a hydrogen group of the alkoxy group, the sulfonate group, the isocyanate group, the amine group and the amine group may be substituted with an alkyl group. The alkoxy group or the atom of the atom having a carbon number of i to 4 is preferred, and the decyloxy group, the ethoxy group or the gas atom is particularly preferred. The reaction is carried out by a hydrolysis reaction to a hydroxyl group (sterol group), and an intermolecular condensation reaction is carried out to form a Si-0-Si bond. The reaction of 201248326 can be smoothly carried out. Specific examples of the decane compound (a7) include the following compounds. F(CF2)4CH2CH2Si(OCH3)3, F(CF2)4CH2CH2Si(OCH2CH3)3, F(CF2)4CH2CH2SiCl3, F(CF2)6CH2CH2Si(OCH3)3, F(CF 2)6CH2CH2Si(OCH2CH3)3, F(( CF2) 6CH2CH2SiCl3. CF3OCF3CF2CF2CH2CH2Si(OCH3)3'F(CF2)20CF2CF20CF2CF2OCF2CF2OCF2CH2CH2Si(OCH2CH3)3, CF3OCF(CF3) CF2CH2CH2CH2Si(OCH3)3. F(CF2)2OCF2CF2OCF2CH2CH2CH2Si(OCH3)3, F(CF2)20(CF2)20(CF2)2CH2CH2Si(0CH3)3. F(CF2)3OCF2CF2CH2CH2SiCl3, F(CF2)30CF(CF3)CF20(CF2)2CH2CH2Si(OCH3)3. As the decane compound (a7), among them, F(CF2)6CH2CH2Si(0 CH3)3, F(CF2)6CH2CH2Si(〇CH2CH3)3, F(CF2)6CH2CH2SiCl3, F(CF2)3〇CF(CF3)CF2 It is particularly preferable that 〇(CF2)2CH2CH2Si(OCH3)3 or the like. In the hydrolyzable compound compound, the decane compound (a7) may be used singly or in combination of two or more kinds. Further, the hydrolyzable decane compound mixture may further contain a partial water hybrid of the decane compound (6). However, the monomer (a7) monomer is preferred over the partially hydrolyzed condensate. (hydrolyzable decane compound represented by the formula (15)) The compound (a8) represented by the above formula (15) is a hydrolyzable decane compound contained in the hydrolyzable (tetra) compound mixture. 34 201248326 In the formula (15), RHI is preferably an alkyl group having a carbon number of 丨~4, preferably a fluorenyl group or an ethyl group, preferably a methyl group, and a rHI other than the alkyl group. a hydrocarbyl group having a ring such as an alkenyl group such as a allylic group, a phenyl group or a cycloalkyl group, etc. X2 is a hydrolyzable group, and is the same as X1 in the above formula (15), including a suitable state. ρ is 0, 1 or 2. Two RH1 and (4-ρ) X2 each having ρ is 2 may be mutually different or the same. The decane compound (a8) is a tetrafunctional compound having ρ as a ruthenium or a 4^3 function. The compound is preferred. The ink-repellent (A2)' exhibits water repellency by the 11-derived from the decane compound (a7) and from the decane compound 08), mainly by the base (1). Show oily. Further, when the cured product of the ink-repellent (A2) is to exhibit sufficient oil repellency, the ratio of the base (1) is preferably higher than the total of the base (1) and RHi in the ink-repellent (A2). When p = 〇, the ratio of the base (1) in the ink-repellent (A2) becomes high, and the oil repellency is improved, or the film forming property is good. When p = 1 or 2, the ink repellent (A2) becomes readily soluble in the hydrocarbon solvent by the presence of RH1 to a certain extent, and a relatively inexpensive solvent can be selected when a negative photosensitive resin composition coating film is formed on the surface of the substrate. . The decane compound (a8) is preferably the following compound. Further, a partial hydrolysis condensate of the decane compound (a8) may be used instead of the decane compound (ag). Partially hydrolyzed condensates are preferably relatively low molecular weight compounds. The partially hydrolyzed condensate may, for example, be as follows.

Si(OCH3)4、Si(OCH2CH3)4、CH3Si(OCH3)3、 CH3Si(OCH2CH3)3、CH3CH2Si(OCH3)3、 CH3CH2Si(OCH2CH3)3、(CH3)2Si(OCH3)2、 (CH3)2Si(OCH2CH3)2、(C6H5)Si(OCH2CH3)3、 35 201248326Si(OCH3)4, Si(OCH2CH3)4, CH3Si(OCH3)3, CH3Si(OCH2CH3)3, CH3CH2Si(OCH3)3, CH3CH2Si(OCH2CH3)3, (CH3)2Si(OCH3)2, (CH3)2Si( OCH2CH3)2, (C6H5)Si(OCH2CH3)3, 35 201248326

Si(OCH3)4之部分水解縮合物(例如cqlcOAT社製之甲 基Silicate 51(商品名))、a partially hydrolyzed condensate of Si(OCH3)4 (for example, methylthioate 51 (trade name) manufactured by cqlcOAT),

Si(〇CH2CH3)4之部分水解縮合物(例如coLCOAT社製 之乙基Silicate 40、乙基Silicate48(皆為商品名))。 本發明水解性矽烷化合物混合物所含之水解性矽烷化 合物方面’石夕烧化合物(a8)係可單獨使用1種或併用2種以 上。併用2種以上時’可與4官能性化合物及/或3官能性化 合物一起併用2官能性化合物。 水解性矽烷化合物混合物中之矽烷化合物(a8)含量,相 對於矽烷化合物(a7)之1莫耳,矽烷化合物(a8)以〇丨〜9莫耳 為佳,0.5〜9莫耳尤佳。甚且,亦可含有矽烷化合物(a7)及 石夕院化合物(a8)以外的水解性矽烷化合物(以下稱矽烷化合 物(a9))或矽烷化合物(a9)之部分水解縮合物。 (石夕院化合物(a9)) 矽烷化合物(a 9)係具有水解性基之2官能性或3官能性 矽烷化合物,只要是矽烷化合物(a7)及矽烷化合物(a8)共縮 合之化合物即可,可使用公知>5夕烧化合物。 矽烷化合物(a9)方面,較佳者係於前述式(丨5)中,以具 有由碳原子數7以上烴基或經反應性基取代之烴基之結構 的石夕烧化合物來代替RH1為佳。惟,式(15)中p為2時,2個 RHI之1為RHI亦可。反應性基以(曱基)丙烯醯氧基、胺基、 烴基取代胺基、環氧基等為佳。尤其以(曱基)丙烯醯氧基等 具有乙烯性雙鍵之反應性基為佳。 適當之矽烷化合物(a9)係具有乙烯性雙鍵之具有反應 36 201248326 性基之水解性矽烷化合物,以具有(甲基)丙烯醯氧基取代烷 基之三烷氧基矽烷或二烷氧基矽烷尤佳。藉由使用具有乙 烯性雙鍵之矽烷化合物(a9)可獲得具有乙烯性雙鍵之撥墨 劑(A2)。 尤其適當之化合物矽烷化合物(a9)之具體例可舉以下。 CH2 = C(CH3)COO(CH2)3Si(OCH3)3、 CH2= C(CH3)COO(CH2)3Si(OCH2CH3)3、 CH2 = CHCOO(CH2)3Si(OCH3)3 ' CH2 = CHCOO(CH2)3Si(OCH2CH3)3、 [CH2 = C(CH3)COO(CH2)3]CH3Si(OCH3)2、 [CH2 = C(CH3)COO(CH2)3]CH3Si(OCH2CH3)2、 (C6H5)NH(CH2)3Si(OCH3)3。 本發明水解性矽烷化合物混合物中所含水解性矽烷化 合物方面,矽烷化合物(a9)可單獨使用丨種,亦可併用2種以 上。 本發明水解性石夕院化合物混合物中之石夕院化合物(W) 之摻混里,相對於矽烷化合物(a7)及矽烷化合物(W)之合計 量1莫耳,以5莫耳以下為佳,4莫耳以下尤佳。 水解性魏化合物混合物t,可摻混丨官能财烧化合 作為水難頻化合物。以紐魏化合物在使水解性 境化合物混合物水解縮合成部分水解縮合物之際,係作 ^分子量調整劑的功能。亦即,其係使料製造較低分子 八^部分水解縮合物之目的或防止部分轉縮合物過度高 乃里化成為溶劑不溶性之目的等。依據目的之部分水解 37 201248326 縮合物分子量,可適當調節其使用量。 1官能性外化合物方面,係以前述式⑽中p為3之結 構之化。物或,、燒基二魏燒為佳。該等化合物中之坑基 以碳數4以下為佳,曱基或乙基尤佳。 本U負型感光性樹脂組成物中使用之撥墨劑(八2),係 上述原料之水解性钱化合物混合物或其部分水解縮合 物X聚。度等不同之多數縮合物所構成之部分水解縮合 物的混合物為佳。亦即,撥墨劑(A2)係以使用魏化合物(a°7) 及喊化合物㈣作為必須成分,且任意使时院化合物 (a9)所製&之#分水解縮合物為佳。該部分水觸合物係以 石夕烧化合物(a7) 化合物㈣、任意混合找化合物 ㈣、繼之使舰合物部分水解縮合所製造之物為佳。又, 石夕烧化合物(a7)、残化合物⑽)、⑽化合物㈣之替代 品亦可使用各自之部分水解縮合物。 中,水解性基或矽醇基全部完全水解、 之情況下的化學式 使用石夕院化合物(a7)與石夕烧化合物㈣所製造〇 水解縮合物,Μ具有以下式(16)表以平均組成式: 者。惟,實際上是水解性基切醇基殘存之生成物(部= 解縮合物),而以化學式表示該生成物有困難。以式(1: 7 示之平均組成式,係在如上述而製造之部分水^= 院鍵 縮合成為;δ夕氣 38 (16) (16)201248326 [化2] Rf~CFX~Q1'Si〇3/2 • S . _ 式(16)中,Rf、rhi、卩丨及卩之適當範圍與上述相同。$、 t係聚合度不同之多數部分水解縮合物中各單元之平均存 在莫耳數。 具有以式(16)表示之平均組成式結構之部分水解縮合 物中推測力別源時烧化合物㈣及^^化合物㈣之單 疋呈隨機排列。再者’使时烧化合物(a7)及石找化合物(a8) 時的平均組成式(16)中之s/t(莫耳比),以撥墨劑(A2)整體平 二。係作為石夕烧化合物(a7)相對於水解性石夕燒化合物 混口物中矽烷化合物(a8)之含量而在上述範圍,亦即以 10/1〜90(莫耳比)為佳,10/5〜90(莫耳比)尤佳。 使用石夕烧化合物(a7)、石夕烧化合物㈣及石夕院化合物 ㈣來製造撥墨劑(A2)之情況下,式⑽中成為具有源自石夕 烧化合物(a9)之進-步共縮合之平均組成式結構。 作為撥墨劑(A2)者以下述石夕烧化合物之混合物的部分 水解縮合物為佳。 (組合6) 石夕院化合物⑹:選自2-(全敦己基)乙基三甲氧基石夕烧 及2-(全氟丁基)乙基三甲氧基矽烷之至少丨種、 石夕烧化合物㈣··四乙氧基石夕烧或四乙氧基石夕烧與甲基 三乙氧基矽烷。 39 201248326 (組合7) 矽烷化合物(a7):選自2-(全氟己基)乙基三甲氧基矽烷 及2-(全氟丁基)乙基三曱氧基矽烷之至少1種、 矽烷化合物(a8):四乙氧基矽烷或四乙氧基矽烷與甲基 三乙氧基矽烷、 1官能性矽烷化合物:六甲基二矽氧烷或三甲基曱氧基 石夕烧。 (組合8) 矽烷化合物(a7):選自2-(全氟己基)乙基三曱氧基矽烷 及2-(全氟丁基)乙基三曱氧基矽烷之至少1種、 矽烷化合物(a8):四乙氧基矽烷或四乙氧基矽烷與曱基 三乙氧基碎烧、 矽烷化合物(a9) : 3-丙烯醯氧基丙基三曱氧基矽烷或3-曱基丙烯醯氧基丙基三甲氧基矽烷。 (組合9) 矽烷化合物(a7):選自2-(全氟己基)乙基三甲氧基矽烷 及2-(全氟丁基)乙基三曱氧基矽烷之至少1種、 矽烷化合物(a8):四乙氧基矽烷或四乙氧基矽烷與甲基 三乙氧基矽烷、 矽烷化合物(a9) : 3-丙烯醯氧基丙基三曱氧基矽烷或3-曱基丙烯醯氧基丙基三曱氧基石夕烧、 1官能性矽烷化合物:六甲基二矽氧烷或三甲基甲氧基 石夕烧。 (組合10) 40 201248326 石夕烧化合物(a7):選自2-(全氟己基)乙基三甲氧基矽烷 及2-(全氟丁基)乙基三曱氧基石夕烧之至少1種、 矽烷化合物(a8):四乙氧基矽烷或四乙氧基矽烷與甲基 三乙氧基矽烷、 石夕烧化合物(a9) : 3-環氧丙氧基丙基三曱氧基矽烷、 1官能性矽烷化合物:六曱基二矽氧烷或三曱基甲氧基 矽院。 本發明負型感光性樹脂組成物中之撥墨劑(A2),於曝 光、硬化等過程中,所含矽醇基進一步縮合,推測可形成 即使照射紫外線/臭氧仍展現優異撥墨性之隔壁。 本發明負型感光性樹脂組成物中撥墨劑(A2)之數目平 均分子量(Μη)以500以上為佳,少於ιοοο,οοο為佳’而少於 iO’OOO尤佳。數目平均分子量(Μη)若在上述範圍之下限値 以上’則利用負型感光性樹脂組成物形成隔壁之際,可防 止自基板表面脫離。數目平均分子量(Μη)若低於上述範圍 之上限値’則對溶劑之溶解性良好,作業性佳。撥墨劑(Α2) 之數目平均分子量(Μη)可藉由選擇反應條件等來調整。 (撥墨劑(Α2)之製造) 本發明負型感光性樹脂組成物中之撥墨劑(A2 ),若是屬 於部分水解縮合物之情況,可藉由將上述水解性石夕院化合 物混合物水解使之部分縮合(以下亦稱反應步驟)來製造。水 解及部分縮合一如上述,乃是由水解性基之水解反應所致 之矽醇基生成與矽醇基彼此脫水縮合反應所致之矽氧烷鍵 生成的反應。反應步驟中,可採用通常使水解性矽烷化合 41 201248326 物進仃水解縮妓應之反祕件,無 如水、觸媒、有機溶劑等。 限制’可使用例 於反應步驟使用水之情況,其量係 化合物混合物⑽質量份,以25〜9,9⑽=水解性錢 100〜1 900皙%八〇· /+ 貝置份為佳, 1,900質量份尤佳。藉由使水量在上 合反應之控侧得料。 ’ ’水解及縮 用於反應步驟之觸媒,可使用鹽醆、访λ , 酸等無機酸、酷酸、草酸、馬來酸等=、硝酸、碟 媒量,相對於水解性碎烧化合物混 較用之觸 〇·〇卜1。質量份為佳,0.W質量份尤佳。°〇質量份’以 於上述反應步驟亦可使用有機溶 耆’可使用在將水解性石夕烧化合物進為°亥有機’谷劑 ® 丁水解、縮合反應之 際通常所使用的有機溶劑,具體而言, 』使用已例舉(撥墨 劑(A )之製造)之有機溶劑。有機溶劑可單 $使用1種,亦可 讲角2種以上。 反應步驟中,有機溶劑之量,相對 ;水解性矽烷化合 物滿合物⑽質量份’以25〜9,900質量份為佳·q,議 質量份尤佳。 所獲得之部分水解縮合物,與反應步驟所採用之溶劑 /起摻混至負型感光性樹脂組成物。於县 尺,作為用於反應 少鄉之溶财㈣制可使撥錢(a2)切醇基穩定狀 滚劑為佳。可使矽醇基穩定化之溶劑可舉具有羥美且在Μ 。匸下之比介電率(ε)為5〜20範圍之化合物。 具體而言’可舉碳原子數2〜8個之二醇系單院細乙酸 42 201248326 雜劑:二醇系單烧基醚溶劑、吻⑽(乙二醇二曱基鱗)系 浴劑、碳原子數2〜4個之烴系醇等。更具體而言,二 烧基鱗乙酸_溶劑方面可舉两二醇單甲基喊乙酸醋u : 8·3)、一醇系單貌基醚溶财面可舉丙二醇單甲基^(ε : 12·3),烴系醇方面可舉2-丙醇(ε : 19 92)等。丙二醇單甲 基鱗因石夕醇基之穩定化效果高這點而尤其適宜。 ,反應步驟係在室溫起至溶劑沸點之溫度下’在適當攪 拌條件下來貫;^為佳。反應時間視所使用之原料成分量、 反應/皿度、搜拌條件等而定,大致為〇5〜24小時,適當可 舉〇】時。反應結束後,所獲得之撥墨劑(Α2)可未進行 示去有。機♦劑便使之含在本發明負型感光性樹脂組成物 中。亦可#由通常方法將有機溶劑除去並將撥墨劑(Α2)單離 之後’使之含在負型感光性樹脂組成物中。 本發月負型感光性樹脂組成物中之撥墨劑(Α)之含有 率在負型感光性樹脂組成物中之總固態部分中,以 0-01〜10質量%為佳。 使用撥墨劑(Α1)作為撥墨劑(Α)之情況下,其含量以 貝量/°較佳,G·2〜1質量%尤佳。若使撥墨劑(Α)之含 率在上述範圍之下限値以上,則降低所形成之隔壁表 、效果優異,可獲得撥墨性優異之隔壁。若在上述範 之上限値以下’則隔壁與基材之《性良好。 吏用曰撥墨劑(A)作為撥墨劑⑷之情況下其含量以 質二%較佳’ 〇.2〜3質量%尤佳。撥墨劑(八2)之含量若 述1巳圍則負型感光性樹脂組成物之貯藏穩定性優 43 201248326 異,且由該負型感光性樹脂組成物所得之光學元件隔壁撥 墨性優異,具有滑順表面。 本發明中之撥墨劑(A)可於1分子内兼具:具有基(1)之 側鏈與具有基(2)之側鏈兩者。又,本發明負型感光性樹脂 組成物亦可含有:具有基(1)之側鏈之撥墨劑(A)、與具有基 (2)之側鏈之撥墨劑(A)兩者。該等情況下,負型感光性樹脂 組成物可展現高撥墨性與印墨轉落性。 [光聚合起始劑(B)] 本發明負型感光性樹脂組成物含有光聚合起始劑 (B) ’ δ玄光聚合起始劑(b)係於1分子内具有硝基之將酯化人 物。 光聚合起始劑(Β)係以下式(3)表示之化合物為佳。 [化3]A partially hydrolyzed condensate of Si (〇CH2CH3) 4 (e.g., ethyl Silicate 40 manufactured by CoLCOAT Co., Ltd., ethyl Silicate 48 (all trade name)). The hydrolyzable decane compound (a8) which is contained in the hydrolyzable decane compound mixture of the present invention may be used alone or in combination of two or more. When two or more kinds are used in combination, a bifunctional compound may be used in combination with a tetrafunctional compound and/or a trifunctional compound. The content of the decane compound (a8) in the hydrolyzable decane compound mixture is preferably 1 to 9 moles per mole of the decane compound (a7), and preferably 0.5 to 9 moles. Further, a partially hydrolyzed condensate of a hydrolyzable decane compound (hereinafter referred to as decane compound (a9)) or a decane compound (a9) other than the decane compound (a7) and the Shixiyuan compound (a8) may be contained. (Shi Xiyuan Compound (a9)) The decane compound (a 9) is a bifunctional or trifunctional decane compound having a hydrolyzable group, and may be a compound which is co-condensed with a decane compound (a7) and a decane compound (a8). A well-known > The decane compound (a9) is preferably a compound of the above formula (丨5), and it is preferred to substitute RH1 as a compound having a structure of a hydrocarbon group having a hydrocarbon group of 7 or more or a hydrocarbon group substituted with a reactive group. However, when p is 2 in the formula (15), 1 of the two RHIs may be RHI. The reactive group is preferably a (mercapto) acryloxy group, an amine group, a hydrocarbon group-substituted amine group, an epoxy group or the like. In particular, a reactive group having an ethylenic double bond such as a (fluorenyl) acryloxy group is preferred. Suitable decane compound (a9) is a hydrolyzable decane compound having an ethylenic double bond having a reactive group 36 201248326, and a trialkoxy decane or dialkoxy group having a (meth) propylene oxime group substituted alkyl group. Decane is especially good. An ink-repellent (A2) having an ethylenic double bond can be obtained by using a decane compound (a9) having an ethylenic double bond. Specific examples of the compound decane compound (a9) which are particularly suitable are exemplified below. CH2 = C(CH3)COO(CH2)3Si(OCH3)3, CH2= C(CH3)COO(CH2)3Si(OCH2CH3)3, CH2 = CHCOO(CH2)3Si(OCH3)3 ' CH2 = CHCOO(CH2) 3Si(OCH2CH3)3, [CH2 = C(CH3)COO(CH2)3]CH3Si(OCH3)2, [CH2 = C(CH3)COO(CH2)3]CH3Si(OCH2CH3)2, (C6H5)NH(CH2 ) 3Si(OCH3)3. In the hydrolyzable decane compound contained in the hydrolyzable decane compound mixture of the present invention, the decane compound (a9) may be used singly or in combination of two or more. In the blend of the Shixiyuan compound (W) in the hydrolyzable Shixia compound mixture of the present invention, the total amount of the decane compound (a7) and the decane compound (W) is 1 mole, preferably 5 moles or less. 4 or less is especially good. The hydrolyzable Wei compound mixture t can be blended with a ruthenium functional compound as a water-frequency compound. The Neuwei compound is a function of a molecular weight modifier when the hydrolyzable compound mixture is hydrolyzed to a partial hydrolysis condensate. That is, it is intended to produce a lower molecular weight condensate of a lower molecular weight or to prevent excessive conversion of a partial conversion condensate to the purpose of solvent insolubility. Partial hydrolysis according to purpose 37 201248326 The molecular weight of the condensate can be appropriately adjusted. In the case of the monofunctional external compound, the structure of p in the above formula (10) is 3. The substance or, the base of the Wei Wei is better. The pit base in the compounds is preferably a carbon number of 4 or less, and a mercapto group or an ethyl group is particularly preferred. The ink-repellent (8-2) used in the composition of the U-negative photosensitive resin is a hydrolyzable money compound mixture of the above-mentioned raw materials or a partially hydrolyzed condensate thereof. A mixture of partially hydrolyzed condensates composed of a plurality of different condensates is preferred. That is, the ink-repellent (A2) is preferably an essential component of the compound (a) and the compound (4), and is preferably a hydrolyzed condensate of the compound (a9). The water-synthesis component is preferably a compound prepared by mixing the compound (4) of the compound (a7), arbitrarily mixing the compound (4), and then partially hydrolyzing and condensing the hydrate. Further, as a substitute for the compound of the ceramsite (a7), the residual compound (10), and the compound (4), the respective partial hydrolysis condensates may be used. In the case where the hydrolyzable group or the sterol group is completely hydrolyzed, the chemical formula using the cerium compound (a7) and the cerium compound (4) is used to form a hydrazine hydrolysis condensate, and the hydrazine has the following formula (16) to have an average composition. Type: However, it is actually a product (part = decondensed product) remaining in the hydrolyzable sterol group, and it is difficult to express the product by a chemical formula. The average composition of the formula (1: 7) is obtained by condensing part of the water produced as described above ^= 院 ̄ ̄ ̄; δ 夕 38 (16) (16) 201248326 [Chemical 2] Rf~CFX~Q1'Si 〇3/2 • S . _ In formula (16), the appropriate ranges of Rf, rhi, 卩丨 and 卩 are the same as above. The average presence of each unit in the partial hydrolysis condensate of different t and t polymerization degrees is Mohr. The partial hydrazine of the partially hydrolyzed condensate having the average compositional structure represented by the formula (16) is a random arrangement of the compound (4) and the compound (4), and the compound (a7) And the average composition of the compound (a8) and the s/t (mole ratio) in the formula (16), and the ink-repellent agent (A2) as a whole is two. It is used as the compound of the smelting compound (a7) relative to the hydrolyzability. The content of the decane compound (a8) in the mixture of the smelting compound is in the above range, that is, preferably 10/1 to 90 (mole ratio), and more preferably 10/5 to 90 (mole ratio). In the case where the ink-repellent agent (A2) is produced by the compound of the ceremonial compound (a7), the compound of the kiln (4), and the compound of the shixi compound (4), the compound (10) is derived from the compound (a9). The average composition of the step-co-co-condensation. It is preferred that the ink-repellent agent (A2) is a partially hydrolyzed condensate of a mixture of the following compounds: (combination 6) Shi Xiyuan compound (6): selected from 2-全 己 ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) ) Burned with methyltriethoxydecane. 39 201248326 (combination 7) decane compound (a7): selected from 2-(perfluorohexyl)ethyltrimethoxydecane and 2-(perfluorobutyl)ethyltriazine At least one of oxoxane, decane compound (a8): tetraethoxy decane or tetraethoxy decane with methyl triethoxy decane, monofunctional decane compound: hexamethyldioxane or trimethyl a combination of a decane compound (a7): selected from the group consisting of 2-(perfluorohexyl)ethyltrimethoxy decane and 2-(perfluorobutyl)ethyltrimethoxy decane At least one, decane compound (a8): tetraethoxy decane or tetraethoxy decane and decyl triethoxy pulverization, decane compound (a9): 3-propene oxime a propyl decyloxy decane or a 3-mercapto propylene methoxy propyl trimethoxy decane. (Combination 9) a decane compound (a7): selected from the group consisting of 2-(perfluorohexyl)ethyltrimethoxynonane and At least one of 2-(perfluorobutyl)ethyltrimethoxy decane, decane compound (a8): tetraethoxy decane or tetraethoxy decane with methyl triethoxy decane, decane compound (a9 : 3-propenyloxypropyltrimethoxy decane or 3-mercaptopropenyloxypropyltrimethoxy oxan, 1-functional decane compound: hexamethyldioxane or trimethyl The methoxy stone is burned. (Combination 10) 40 201248326 Shi Xia Shao Compound (a7): at least one selected from the group consisting of 2-(perfluorohexyl)ethyltrimethoxydecane and 2-(perfluorobutyl)ethyltrimethoxylate , decane compound (a8): tetraethoxy decane or tetraethoxy decane with methyl triethoxy decane, shixi burning compound (a9): 3-glycidoxypropyl trimethoxy decane, A 1-functional decane compound: hexamethylene dioxane or trimethyl methoxy fluorene. In the negative photosensitive resin composition of the present invention, the ink repellent (A2) is further condensed in the process of exposure, hardening, etc., and it is presumed that it can form an excellent ink repellency even if it is irradiated with ultraviolet light/ozone. . In the negative photosensitive resin composition of the present invention, the number of the ink-repellent agent (A2) is preferably 500 or more, more preferably less than ιοοο, οοο, and less than iO'OOO. When the number average molecular weight (?n) is at or below the lower limit of the above range, when the partition wall is formed by the negative photosensitive resin composition, detachment from the surface of the substrate can be prevented. When the number average molecular weight (?n) is less than the upper limit 値' of the above range, the solubility in a solvent is good and workability is good. The number average molecular weight (?n) of the ink-repellent (?2) can be adjusted by selecting reaction conditions and the like. (Production of ink-repellent agent (Α2)) The ink-repellent agent (A2) in the negative-type photosensitive resin composition of the present invention can be hydrolyzed by hydrolyzing the above-mentioned hydrolyzed stone compound mixture if it is a partially hydrolyzed condensate. It is produced by partial condensation (hereinafter also referred to as a reaction step). The hydrolysis and partial condensation are as described above, and the reaction of the sterol group formation by the hydrolysis reaction of the hydrolyzable group with the formation of the oxime bond by the dehydration condensation reaction of the sterol groups with each other. In the reaction step, a reverse component which is usually hydrolyzed by a hydrolyzable decane compound can be used, such as water, a catalyst, an organic solvent, and the like. Restriction 'may be used in the case where water is used in the reaction step, the amount is a mixture of the compound (10) parts by mass, 25~9, 9 (10) = hydrolyzable money 100~1 900%% gossip / / + beacon, preferably 1 900 parts by mass is especially good. By making the amount of water on the controlled side of the upper reaction. ' 'The catalyst used for hydrolysis and reduction in the reaction step can be used as a mineral acid such as salt strontium, λ, acid, acid, oxalic acid, maleic acid, etc., nitric acid, disc medium, relative to hydrolyzable calcined compound Mix and use the touch 〇 〇 1 1. The mass portion is preferred, and the 0.W mass portion is particularly preferred. 〇 〇 〇 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以Specifically, an organic solvent which has been exemplified (manufactured by the ink-repellent (A)) is used. The organic solvent can be used in one type or in two or more types. In the reaction step, the amount of the organic solvent is relatively good, and the hydrolyzable decane compound full compound (10 parts by mass) is preferably 25 to 9,900 parts by mass. The partially hydrolyzed condensate obtained is blended with the solvent/reaction used in the reaction step to a negative photosensitive resin composition. In the county ruler, as a solution for the lack of wealth in the township (four) system can make money (a2) cut alcohol-based stable roller is better. The solvent which can stabilize the sterol group is exemplified by hydroxymei and in oxime. The ratio of the dielectric ratio (ε) of the underarm is in the range of 5 to 20. Specifically, a diol-based single-chamber fine acetic acid having a carbon number of 2 to 8 may be used. 201200326: a diol-based monoalkyl ether solvent, a kiss (10) (ethylene glycol ruthenium-based) bath, A hydrocarbon-based alcohol having 2 to 4 carbon atoms. More specifically, the dialkyl squamous acid _ solvent can be exemplified by two diol monomethyl ketone acetate vinegar u : 8 · 3), monool monomolecular ether lyophilized surface can be propylene glycol monomethyl ^ (ε 12:3) The hydrocarbon-based alcohol may, for example, be 2-propanol (ε: 19 92). The propylene glycol monomethyl scale is particularly suitable because of its high stabilizing effect. The reaction step is carried out at a temperature from room temperature to the boiling point of the solvent, under appropriate agitation conditions; The reaction time depends on the amount of the raw material component to be used, the reaction/dish degree, the mixing conditions, and the like, and is approximately 〜5 to 24 hours, as appropriate. After the completion of the reaction, the obtained ink-repellent (?2) may not be shown. The agent is contained in the negative photosensitive resin composition of the present invention. Alternatively, the organic solvent may be removed by a usual method and the ink-repellent (?2) may be left alone to be contained in the negative-type photosensitive resin composition. The content of the ink repellent (Α) in the negative photosensitive resin composition of the present invention is preferably 0 to 10% by mass in the total solid portion of the negative photosensitive resin composition. In the case where an ink-repellent (Α1) is used as the ink-repellent (Α), the content thereof is preferably in the amount of shell/°, and particularly preferably in G·2 to 1% by mass. When the content of the ink repellent (Α) is at least the lower limit of the above range, the partition wall formed is excellent in the effect, and the partition wall having excellent ink repellency can be obtained. If it is below the upper limit of the above range, then the partition wall and the substrate have good properties. In the case where the ink repellent (A) is used as the ink repellent (4), the content thereof is preferably 2% by mass or more preferably 2% by mass to 3% by mass. The content of the ink-repellent agent (Eight 2) is as follows: the storage stability of the negative-type photosensitive resin composition is excellent, and the optical component obtained from the negative-type photosensitive resin composition is excellent in ink-repellent property. With a smooth surface. The ink-repellent (A) in the present invention can have both a side chain having a group (1) and a side chain having a group (2) in one molecule. Further, the negative photosensitive resin composition of the present invention may further contain both an ink-repellent (A) having a side chain of the group (1) and an ink-repellent (A) having a side chain of the base (2). In these cases, the negative photosensitive resin composition exhibits high ink repellency and ink drop property. [Photopolymerization Initiator (B)] The negative photosensitive resin composition of the present invention contains a photopolymerization initiator (B) 'The δ ray photopolymerization initiator (b) is esterified with a nitro group in one molecule. character. The photopolymerization initiator (Β) is preferably a compound represented by the following formula (3). [Chemical 3]

式(3)中,R31表示碳原子數1〜20之烷基、碳原子數6〜30 之芳基、碳原子數7~30之芳基烷基或氰基。R32表示R41或 OR42,該R41及R42分別表示碳原子數1〜20之烷基、碳原子數 6〜30之芳基或碳原子數7~30之芳烷基。R33表示碳原子數 1〜20之烷基、碳原子數6〜30之芳基或碳原子數7〜30之芳烷 44 201248326 基。R34及R35各自獨立,表示R41、〇R42、氰基或鹵素原子。 R41及R42與上述相同。a及b各自獨立,為〇〜3之整數,c為1〜3 之整數。 R31方面,烷基、芳基及芳烷基之原子可進一步經OR43、 COR44、SR45、NR46R47、-NCOR48-〇COR49、氰基、函素原 子'~CR50=CR51R52或-CO-CR53 = CR54R55所取代,R43、R44、 R45、R46、R47、R48、R49、R50、R51、R52、R53、R54及 R55 各自獨立,表示氫原子、碳原子數1~20之烷基、碳原子數 6〜30之芳基、碳原子數7〜30之芳基烷基或碳原子數2〜20之 雜環基。 作為R32者,烷基、芳基及芳烷基之氫原子可進一步經 鹵素原子取代。 以上述R31、R33、R43〜R55所表示之取代基之伸烧基部 分之亞曱基’藉由不飽和鍵、醚鍵、硫醚鍵、醋鍵、硫酷 鍵、醯胺鍵或胺曱酸乙酯鍵而中斷1〜5次亦無妨,上述取代 基之烷基部分可以是支鏈側鏈,也可以是環狀烷基,上述 取代基之烷基末端也可以是不飽和鍵。R3亦可與鄰接之苯 環一起形成環。 本發明中之肟酯化合物因肟之雙鍵而存在有幾何異構 物,但並不將該等予以區別,式(3)及後述例示化合物係表 示兩者之混合物或其中一者,並非限定表示異構物之結構。 以上述R41〜R55表示之烷基方面,可舉曱基、乙基、丙 基、異丙基、丁基、異丁基、二級丁基、三級丁基、戊基、 異戊基、三級戊基、己基、庚基、辛基、異辛基、2-乙基 45 201248326 己基、三級辛基、壬基、異壬基、癸基、異癸基、Η—院 基、十二烧基、十四院基、十六烧基、十八院基、二十烧 基、環戊基、環己基、環己基曱基、乙烯基、烯丙基、丁 烯基、乙烯基、丙烯基、曱氧基乙基、乙氧基乙基、丙氧 基乙基、戊基氧乙基、辛基氧乙基、曱氧基乙氧基乙基、 乙氧基乙氧基乙基、丙氧基乙氧基乙基、曱氧基丙基、2-曱氧基-1-甲基乙基等。 以R41〜R55表示之芳基方面,可舉苯基、艿基、二曱苯 基、乙基苯基、氣苯基、萘基、蒽基、菲基、經上述烷基 取代1個以上之苯基、聯苯基、萘基、蒽基等。 以R41〜R55表示之芳烷基方面,可舉苯甲基、氣苯曱基、 α-甲基苯甲基、二甲基苯曱基、苯基乙基、苯基乙 烯基等。 以R43〜R55表示之雜環基方面,可適當舉吡啶基、嘧啶 基、芙喃基、噻吩基、四氫芙喃基、二氧五.環烷基、苯并 σ号。坐-2-基、四氩β底喃基、。比11各°定基(pyrrolidyl)、°米。坐α定基、 。比嗤α定基、噻唾α定基、異°塞。坐。定基、α号。坐D定基、異σ号唾。定 基、派。定基、旅讲、味琳基等5〜7員雜環。 R33可與鄰接之苯環一起形成之環方面,可舉環戊環、 環己環、環庚、苯環、哌啶環、咮啉環、内酯環、内醯胺 環等5〜7員環。 可取代R41〜R55之鹵素原子及以R34、R35表示之鹵素原 子方面,可舉氣、氣、漠、峨。 上述取代基之伸烧基部分的亞曱基,藉由不飽和鍵、 46 201248326 喊鍵、硫謎鍵、酯鍵、硫酯鍵、酿胺鍵或胺曱酸乙醋鍵而 中斷1〜5次亦無妨,這時中斷之鍵結基可以是1種或2種以上 之基,若是可連續中斷之基則亦町連續中斷2個以上。又’ 上述取代基之烷基部分可以是支鏈側鏈,也可以是環狀烷 基,上述取代基之烧基末端也可以是不飽和鍵。 本發明之肟酯化合物中,在式(3)中,R31為碳原子數 11〜20之烷基、碳原子數6〜30之芳基、碳原子數7〜30之芳烷 基者;或R33為以醚鍵或酯鍵中斷1〜5次之碳原子數1〜12之 烷基、碳原子數13~20之烷基者,尤其,R31為碳原子數11〜20 之烧基或碳原子數6〜30之芳基者;或者,R33為烧基之伸院 基部分之亞甲基可以醚鍵或酯鍵中斷1〜5次之碳原子數8以 上之支鏈烧基;烧基伸烧基部分之亞曱基為可以喊鍵或醋 鍵中斷1〜5次之碳原子數13以上之烷基者;R33為藉由醚鍵 中斷1〜5次之烷基者;R33為藉由酯鍵中斷1〜5次之燒基者, 則合成容易且感度高,或作為聚合起始劑使用時,於、容劑 中溶解1質量%以上,滿足作為光聚合起始劑要求,因而屬 適宜。該溶解度測定以在20〜30。(:下進行為佳。作為上述货 劑’係以丙二醇-1-單甲基醚-2-乙酸酯或環己綱為佳 本發明之肟酯化合物’係如下式(4)及下式所厂、。 使之透過R31或R32二量化。 ’、可 47 (4)201248326 [化4]In the formula (3), R31 represents an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, an arylalkyl group having 7 to 30 carbon atoms or a cyano group. R32 represents R41 or OR42, and R41 and R42 each represent an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms or an aralkyl group having 7 to 30 carbon atoms. R33 represents an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms or an aralkyl group having 7 to 30 carbon atoms. R34 and R35 are each independently and represent R41, 〇R42, cyano or a halogen atom. R41 and R42 are the same as described above. a and b are each independent, and are integers of 〇3, and c is an integer of 1 to 3. In the case of R31, the atoms of the alkyl group, the aryl group and the aralkyl group may further be subjected to OR43, COR44, SR45, NR46R47, -NCOR48-〇COR49, cyano, a functional atom '~CR50=CR51R52 or -CO-CR53 = CR54R55 Substituting, R43, R44, R45, R46, R47, R48, R49, R50, R51, R52, R53, R54 and R55 are each independently represented by a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, and a carbon number of 6 to 30. An aryl group, an arylalkyl group having 7 to 30 carbon atoms or a heterocyclic group having 2 to 20 carbon atoms. As the R32, a hydrogen atom of an alkyl group, an aryl group and an aralkyl group may be further substituted by a halogen atom. The fluorenyl group of the extended-burning moiety of the substituent represented by the above R31, R33, R43 to R55 is bonded by an unsaturated bond, an ether bond, a thioether bond, a vinegar bond, a sulfur bond, a guanamine bond or an amine oxime. The acid ethyl ester bond may be interrupted 1 to 5 times. The alkyl moiety of the above substituent may be a branched side chain or a cyclic alkyl group, and the alkyl terminal of the above substituent may be an unsaturated bond. R3 may also form a ring together with an adjacent benzene ring. The oxime ester compound of the present invention has geometric isomers due to the double bond of ruthenium, but does not distinguish between them. The formula (3) and the exemplified compounds described below represent a mixture or a combination of the two, and are not limited thereto. Indicates the structure of the isomer. The alkyl group represented by the above R41 to R55 may, for example, be an alkyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, an isobutyl group, a secondary butyl group, a tertiary butyl group, a pentyl group or an isopentyl group. Tertiary pentyl, hexyl, heptyl, octyl, isooctyl, 2-ethyl 45 201248326 hexyl, tertiary octyl, decyl, isodecyl, fluorenyl, isodecyl, fluorene-hospital, ten Dialkyl, fourteen base, sixteen base, eighteen yard base, twenty burn base, cyclopentyl, cyclohexyl, cyclohexyldecyl, vinyl, allyl, butenyl, vinyl, Propylene, methoxyethyl, ethoxyethyl, propoxyethyl, pentyloxyethyl, octyloxyethyl, decyloxyethoxyethyl, ethoxyethoxyethyl , propoxyethoxyethyl, methoxypropyl, 2-decyloxy-1-methylethyl and the like. Examples of the aryl group represented by R41 to R55 include a phenyl group, a decyl group, a diphenylene group, an ethylphenyl group, a gas phenyl group, a naphthyl group, an anthracenyl group, a phenanthryl group, and one or more of the above alkyl groups. Phenyl, biphenyl, naphthyl, anthryl and the like. Examples of the aralkyl group represented by R41 to R55 include a benzyl group, a gastriphenyl group, an α-methylbenzyl group, a dimethylphenyl fluorenyl group, a phenylethyl group, and a phenylvinyl group. Examples of the heterocyclic group represented by R43 to R55 include a pyridyl group, a pyrimidinyl group, a fluorenyl group, a thienyl group, a tetrahydrofuranyl group, a dioxypentacycloalkyl group, and a benzo σ group. Sitting 2-yl, tetra-argon beta-mercapto,. More than 11 ° pyrylidyl, ° meters. Sitting on the basis of α. It is more specific than 嗤α, thiophene α, and iso-plug. sit. Fixed base, alpha number. Sit D base, different sigma number. Set the base, send. Fixed base, brigade, taste Linji and other 5 to 7 members of the heterocyclic ring. The ring formed by R33 together with the adjacent benzene ring may be a 5 to 7 member such as a cyclopentane ring, a cyclohexane ring, a cycloheptyl group, a benzene ring, a piperidine ring, a porphyrin ring, a lactone ring or an indoleamine ring. ring. The halogen atom of R41 to R55 and the halogen atom represented by R34 and R35 may be substituted for gas, gas, moisture and hydrazine. The fluorenylene group of the above-mentioned substituent is interrupted by an unsaturated bond, 46 201248326 screaming bond, sulfur crypto bond, ester bond, thioester bond, urethane bond or amine acetoacetate bond. In this case, the key group to be interrupted may be one or two or more types. If the base can be continuously interrupted, the line is interrupted continuously by two or more. Further, the alkyl moiety of the above substituent may be a branched side chain or a cyclic alkyl group, and the terminal of the substituent may be an unsaturated bond. In the oxime ester compound of the present invention, in the formula (3), R31 is an alkyl group having 11 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, or an aralkyl group having 7 to 30 carbon atoms; R33 is an alkyl group having 1 to 12 carbon atoms and an alkyl group having 13 to 20 carbon atoms interrupted by an ether bond or an ester bond, and particularly, R31 is a carbon atom or carbon having 11 to 20 carbon atoms. The aryl group having an atomic number of 6 to 30; or, the methylene group of the radical group of the group of the alkyl group may be interrupted by an ether bond or an ester bond for 1 to 5 times, and a branched alkyl group having 8 or more carbon atoms; The fluorenyl group of the alkyl group is an alkyl group having 13 or more carbon atoms interrupted by a singly or vinegar bond; R33 is an alkyl group interrupted by an ether bond for 1 to 5 times; When the ester bond is interrupted for 1 to 5 times, the synthesis is easy and the sensitivity is high, or when it is used as a polymerization initiator, it is dissolved in the solvent at a mass ratio of 1% by mass or more, and is required to be a photopolymerization initiator. suitable. The solubility is measured at 20 to 30. (The following is preferred. The above-mentioned cargo agent is a propylene glycol compound in which propylene glycol-1-monomethyl ether-2-acetate or cyclohexyl is preferred. The following formula (4) and the following formula are used. The factory, so that it is quantified by R31 or R32. ', can 47 (4) 201248326 [4]

[化5][Chemical 5]

(5) 以式(3)表示之肟酯化合物之具體例,可舉以下述化合 物No. 1〜71所示之化合物。 48 201248326 [化6] 也合袂N〇. i :化僉物化含禅叫.3(5) Specific examples of the oxime ester compound represented by the formula (3) include the compounds represented by the following compounds No. 1 to 71. 48 201248326 [化6] 合合袂N〇. i : 佥化化化化禅叫.3

化争特抑>.4 记合物《0,'S: ft;舍物Μα 6Debate for special suppression >.4 characterization "0, 'S: ft; Μ物Μ α 6

化合換Νό 7 化台物(No/8 ft含物No, 9Compounding and changing 7 Chemicals (No/8 ft inclusion No, 9

49 201248326 [化7]49 201248326 [Chem. 7]

也僉物Να 1 β 化合物to, 17 化合物Np: t SAlso drug substance α 1 β compound to, 17 compound Np: t S

化合物执J. 2? 化合物H〇.?3: 佑合物Να 24Compound J. 2? Compound H〇.?3: conjugate Να 24

化合物如.28Compounds such as .28

化合物N〇.:29 化合物No. 30Compound N〇.:29 Compound No. 30

50 201248326 [化8] 化合物No. 3150 201248326 [Chem. 8] Compound No. 31

化合物版34Compound Edition 34

Q- v.O :J〇:Q- v.O :J〇:

化会物《α 37 ΟChemical composition "α 37 Ο

ο 化含物No. 38ο化含物No. 38

0丫r° u 化·k妫 也杳物No. 400丫r° u化·k妫 Also 杳物No. 40

化合物你.41 化会物Νρ·42Compound you.41 Chemicals Νρ·42

ft台物Να 43Ft台Να 43

51 201248326 [化9] 化合!^)...44 化台物私..舡 化全触51 201248326 [化9] 合合!^)...44 化台物私..舡化全触

化合珣14? iU0m〇.48 化食物N。,49Compound 珣14? iU0m〇.48 Food N. ,49

條物No·吣 化合钕I仏 他台—0. 52Article No. 吣 钕 仏 I 仏 Other Taiwan — 0. 52

.化合物缸53 彳匕含物No. 54:Compound Cylinder 53 彳匕物物 No. 54:

52 201248326 [化 ίο] 化含物洳.57 化含物No:玷52 201248326 [化 ίο] 含物洳.57 化物物 No:玷

化合物No,:5S 化含铯1<〇.00Compound No,: 5S containing 铯1<〇.00

53 201248326 [化 li]53 201248326 [化 li]

以式(3)表示之肟酯化合物可依據例如下式(6)之反應 式,藉由以下方法來製造。首先,使硕。卡°坐化合物1與醯基 氣化物2在氣化鋅存在下反應獲得醯基體3。接著,在DMF 存在下使醯基體3與羥胺鹽酸鹽反應獲得肟化合物4。接 著,使肟化合物4與酸酐5或醯基氣化物5’反應獲得式(3)表 示之將酯化合物。 54 201248326 [化 12] (N〇j)eThe oxime ester compound represented by the formula (3) can be produced by the following method, for example, according to the reaction formula of the following formula (6). First of all, make a master. The compound 1 and the sulfhydryl group 2 are reacted in the presence of zinc hydride to obtain a ruthenium matrix 3. Next, the hydrazine base 3 is reacted with hydroxylamine hydrochloride in the presence of DMF to obtain hydrazine compound 4. Next, the hydrazine compound 4 is reacted with the acid anhydride 5 or the hydrazine-based vaporized product 5' to obtain an ester compound represented by the formula (3). 54 201248326 [化12] (N〇j)e

(N〇2)〇 入 暖基铤化物2(N〇2) 〇 Into warm base telluride 2

酸基傾3Acid base 3

(N〇2)o ^OH(N〇2)o ^OH

(6) C1 醢基铤化物51 (3) (BSI化合物〉 肟化合物4 本發明負型感光性樹脂組成物中之光聚合起始劑(Β) 含有比率,在負型感光性樹脂組成物之總固態部分中,以 1〜15質量%為佳,2〜1〇質量%較佳,3〜6質量%尤佳。若在 上述範圍則硬化性良好’在曝光步驟、顯影步驟中可形成 接近遮罩圖案之圖案或線寬。尤其,即使是在硬化膜表面 藉由截止濾波器等將330nm以下曝光光線遮光之情況下,甚 且低曝光量下撥墨性仍良好。 本發明負型感光性樹脂組成物中,亦可併用光聚八起 始劑(B)以外的光聚合起始劑。 可併用之光聚合起始劑方面,可舉笨曱基、二乙醯基、 甲基苯基乙醛酸酯、9,1〇·菲醌等α ·二酮類;苯偶姻等醯偶 姻類;苯偶姻曱基醚、笨偶姻乙基醚、苯偶姻異丙基醚等 55 201248326 醯偶姻醚類;噻噸酮、2-氣噻噸酮、2-曱基噻噸酮、2,4-二 甲基°塞嘲@^、異丙基°塞嘲酮、2,4-二乙基°塞°頓酮、2,4-二氣 噻噸酮、2,4-二異丙基噻噸酮、噻噸酮-4-橫酸等噻噸酮類; 二苯酮、4,4'-雙(二甲胺基)二苯酮、4,4'-雙(二乙胺基)二笨 酮等二苯酮類;苯乙酮、2-(4-甲苯磺醯氧基)-2-苯基苯乙 酮、對二曱胺基苯乙酮、2,2·-二甲氧基-2-苯基苯乙酮、對 曱氧基苯乙酮、2-曱基-[4-(曱硫基)苯基]-2-咮啉基-1-丙 酮、2-苯甲基-2-二甲胺基-1-(4-咮啉基苯基)-丁烷-1-酮等苯 乙酮類;蒽醌、2-乙基蒽醌、莰醌、1,4-萘醌等醌類;2-二 曱胺基苯甲酸乙酯、4-二曱胺基苯曱酸乙酯、4-二曱胺基笨 甲酸(正丁氧基)乙酯、4-二曱胺基苯甲酸異戊酯、4-二曱胺 基苯甲酸-2-乙基己酯等胺基苯甲酸類;氣苯乙酮、三鹵化 曱基苯硬等_化合物;醯基氧化膦類;過氧化二三級丁基 等過氧化物;1,2-辛二酮、苯硫基)_,2-(〇-苯曱醯肟)、 乙綱1-[9-乙基-6·(2-曱基苯甲醯基)-9H-甲醯基-3-基]-l-(〇- 乙醯肟)等肟酯類;三乙醇胺、甲基二乙醇胺、三異丙醇胺、 正丁胺、N-甲基二乙醇胺、甲基丙烯酸二乙胺基乙酯等脂 肪族胺類;2-硫醇基苯并咪唑、2_硫醇基苯并唑、2_硫醇 基笨并°塞°坐、丨,4· 丁醇雙(3-硫醇基丁酸酯)、三(2-硫醇基丙 醯氧基乙基)異三聚氰酸酯、新戊四醇四(3-硫醇基丁酸酯) 等硫醇化合物等。 其中’二苯_類、胺基苯甲酸類、脂肪族胺類及硫醇 化Q物,若與其他光聚合起始劑一起使用會顯現出增感效 果而為較佳。 56 201248326 負型感光性樹脂組成物巾含有光聚合起始劑⑻以外 之光聚合起始劑時’其含有比率係,在負型感光性樹脂組 成物之總固態部分中,㈣f量%以下為佳,丨〜15質量錄 佳,2〜10質量。/。尤佳。 、 [鹼可溶性樹脂(C)] 鹼可溶性樹脂(C)並無特殊限定,惟可舉例:含有具酸 性基之側鏈與具乙雜魏之__^Μ)、於環氧樹 脂導入酸性基與乙雜魏續雖i_2)、具贿基之側鍵 與具乙雜雙鍵之舰的單體(C1_3)等。料可單獨使用i 種’亦可併用2種以上。 樹脂(CM),可藉下述來合成,即,將具有經基、絲、 環氧基等反應&基之單體肖具有醆性k單體進行共聚 合,而可獲得含有具反應性基之側鏈與具酸性基之側鍵的 共聚合物,且使該共聚合物、與具有能_反應性基鍵結 之官能基與乙烯性雙鍵的化合物,溶解於溶劑中以使發生 反應,藉此合成者。 具經基的單體,可舉例:(甲基)丙烯酸2_羥乙酯、(甲 基)丙烯酸2-羥丙酯、(甲基)丙烯酸3_羥丙酯、(曱基)丙烯酸 4-羥丁酯、(甲基)丙烯酸5-羥戊酯、(甲基)丙烯酸6_羥己酯、 (甲基)丙烯酸4-羥環己酯、新戊二醇單(甲基)丙烯酸酯、(曱 基)丙烯酸3-氯-2-羥丙酯、丙三醇單(甲基)丙烯酸酯、2_羥 乙基乙烯醚、4-羥丁基乙烯基醚、環己烷二醇單乙烯基醚、 2-羥乙基烯丙基醚、N-羥曱基(甲基)丙烯醯胺、ν,ν—雙(羥 甲基)(曱基)丙烯醯胺等。 57 201248326 具羧基的單體,可舉例:丙烯酸、曱基丙烯酸、醋酸 乙烯酯、巴豆酸、衣康酸、馬來酸、延胡索酸、桂皮酸及 其等之鹽等。另外,該等單體亦可使用作為具有酸性基的 單體。 具環氧基之單體,可舉例如:環氧丙基(甲基)丙烯酸 酯、丙烯酸3,4-環氧環己基曱酯等。 具酸性基的單體並無特殊限定,惟除前述具羧基之單 體外,具磷酸基之單體方面可舉例如2-(曱基)丙烯醯氧基乙 烷磷酸等。 上述具反應性基之單體與具酸性基之單體的共聚合, 可依習知方法實施。 具有羥基以作為反應性基的單體,可舉例:具乙烯性 雙鍵的酸酐、具有異氰酸酯基與乙烯性雙鍵的化合物、具 有氣化醯基與乙烯性雙鍵的化合物等。 具乙烯性雙鍵的酸酐,可舉例:馬來酸酐、衣康酸酐、 檸康酸酐、甲基-5-降莰烯-2,3-二羧酸酐、3,4,5,6-四氫酞酸 酐、順式-1,2,3,6-四氫酞酸酐、2-丁烯-1-基琥珀酸酐等。 具有異氰酸酯基與乙烯性雙鍵的化合物,可舉例:2-(甲 基)丙烯醯氧乙基異氰酸酯、1,1-雙((甲基)丙烯醯氧甲基)乙 基異氰酸酯等。 具有氣化醯基與乙烯性雙鍵的化合物,可舉例(甲基) 丙稀醯氣等。 具有羧基作為反應性基的單體,可舉具有環氧基與乙 烯性雙鍵的化合物。該化合物可舉例:環氧丙基(曱基)丙烯 58 201248326 酸酯、丙烯酸3,4-環氧環己基甲騎等。亦可使在此生成之經 基與缓酸之脫水縮合部分成為環狀結構之一部分的酸肝反 應’於樹脂(C1-1)中導入羧基。 具有環氧基作為反應性基之單體,可舉具有缓基與乙 稀性雙鍵的化合物。該化合物的具體例可舉:丙稀酸、甲 基丙烯酸、醋酸乙稀醋、巴豆酸、衣康酸、馬來酸、延胡 索酸、桂皮酸及其等之鹽等。亦可使由此而生的幾基與以 緩酸之脫水縮合部分為環狀結構—部分的酸針發生反應, 於樹脂(CM)中導入羧基。 樹脂(C1-2)係可藉由使環氧樹脂與具有叛基與乙稀性 雙鍵的化合物反應後,與多鹼性緩酸或其脫水物發生反應 " 而合成。 ‘ 具體上,藉由使環氧樹脂與具有羧基和乙烯性雙鍵之 化合物發生反應,乙雜雙鍵會導人至環氧樹脂中。接著, 使多驗性緩S变或其脫水物對導入了乙稀性雙鍵之環氧樹脂 發生反應’藉此可將羧基導入。 %氧樹脂方面並無特殊限定,惟可例舉:雙盼A型環氧 樹脂、雙酚F型環氧樹脂、酚醛型環氧樹脂、曱酚酚醛型環 氧樹脂、三酚甲烷型環氧樹脂、具萘骨架的環氧樹脂、以 下式(Cl-2a)表示的具聯苯骨架的環氧樹脂、以下式(Cl_2b) 表示的環氧樹脂、以下式(Cl-2c)表示之具聯苯骨架的環氧 樹脂等。 59 201248326 [化 13](6) C1 mercapto halide 51 (3) (BSI compound) 肟 compound 4 The photopolymerization initiator (Β) content ratio in the negative photosensitive resin composition of the present invention, in the negative photosensitive resin composition In the total solid portion, it is preferably 1 to 15% by mass, preferably 2 to 1% by mass, more preferably 3 to 6% by mass, and if it is in the above range, the curability is good 'in the exposure step and the development step, it is close to each other. The pattern or the line width of the mask pattern. In particular, even when the exposure light of 330 nm or less is shielded by a cut filter or the like on the surface of the cured film, the ink repellency is good even at a low exposure amount. In the resin composition, a photopolymerization initiator other than the photopolymerization initiator (B) may be used in combination. The photopolymerization initiator which may be used in combination may, for example, be a fluorenyl group, a diethyl fluorenyl group or a methylbenzene group. Α-diketones such as acetaldehyde, 9,1, and phenanthrene; acetoin such as benzoin; benzoin thiol ether, benzoin ethyl ether, benzoin isopropyl ether Etc 55 201248326 醯 姻 醚 ether; thioxanthone, 2- thioxanthone, 2-mercaptothioxanthone, 2,4-dimethyl ° 嘲 @ @ ^, Propyl cyproterone, 2,4-diethyl thiopentanone, 2,4-dioxathioxanthone, 2,4-diisopropylthioxanthone, thioxanthone-4-transacid a thioxanthone; a benzophenone such as benzophenone, 4,4'-bis(dimethylamino)benzophenone or 4,4'-bis(diethylamino)diphenyl ketone; acetophenone , 2-(4-toluenesulfonyloxy)-2-phenylacetophenone, p-diguanylacetophenone, 2,2·-dimethoxy-2-phenylacetophenone, peptone Oxyacetophenone, 2-mercapto-[4-(indolyl)phenyl]-2-indolyl-1-propanone, 2-benzyl-2-dimethylamino-1-(4) Acetophenones such as -porphyrinylphenyl)-butan-1-one; anthraquinones such as hydrazine, 2-ethylhydrazine, anthracene, and 1,4-naphthoquinone; 2-diaminophenylbenzene Ethyl formate, ethyl 4-diguanyl benzoate, 4-diammonium benzoic acid (n-butoxy)ethyl ester, isoamyl 4-diguanyl benzoate, 4-diamine Aminobenzoic acid such as 2-ethylhexyl benzoate; acetophenone, sulfonium trihalide benzoate, etc.; fluorenyl phosphine oxide; peroxide such as dibutyl butyl peroxide; 1,2-octanedione, phenylthio)_,2-(anthracene-benzoquinone), acetylene 1-[9-ethyl-6·(2-曱Anthracene esters such as benzamidine)-9H-methylindol-3-yl]-l-(〇-acetamidine); triethanolamine, methyldiethanolamine, triisopropanolamine, n-butylamine, N - an aliphatic amine such as methyldiethanolamine or diethylaminoethyl methacrylate; 2-thiolbenzimidazole, 2-thiolbenzoxazole, 2-thiol-based , hydrazine, 4 · butanol bis (3-thiol butyrate), tris (2-thiol propyl methoxyethyl) iso-cyanate, neopentyl alcohol tetrakis (3-thiol) A thiol compound or the like. Among them, the 'diphenyl-based, the aminobenzoic acid, the aliphatic amine and the thiolated Q are preferred to be used together with other photopolymerization initiators to exhibit a sensitizing effect. 56 201248326 When the negative photosensitive resin composition material contains a photopolymerization initiator other than the photopolymerization initiator (8), the content ratio is (in the total solid portion of the negative photosensitive resin composition, (4) f%% or less Good, 丨 ~ 15 quality recorded good, 2 ~ 10 quality. /. Especially good. [Alkali-soluble resin (C)] The alkali-soluble resin (C) is not particularly limited, but may be exemplified by a side chain having an acidic group and a __^Μ having an acetyl group, and an acidic group introduced into the epoxy resin. Although it is continued with i b), the side key with a bribe base and the single (C1_3) of the ship with a double double bond. The materials may be used alone or in combination of two or more. The resin (CM) can be synthesized by copolymerizing a monomer having a reaction group of a radical, a silk, an epoxy group, and the like, to obtain a reactivity. a side chain of a base and a copolymer having a side bond of an acidic group, and the copolymer, a compound having a functional group bonded to a reactive group and an ethylenic double bond, dissolved in a solvent to cause occurrence The reaction is thereby synthesized by the person. The monomer having a mercapto group can be exemplified by 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate, and 4-(meth)acrylic acid 4- Hydroxybutyl ester, 5-hydroxypentyl (meth)acrylate, 6-hydroxyhexyl (meth)acrylate, 4-hydroxycyclohexyl (meth)acrylate, neopentyl glycol mono(meth)acrylate, (fluorenyl) 3-chloro-2-hydroxypropyl acrylate, glycerol mono(meth) acrylate, 2- hydroxyethyl vinyl ether, 4-hydroxybutyl vinyl ether, cyclohexane diol monoethylene Ethyl ether, 2-hydroxyethyl allyl ether, N-hydroxydecyl (meth) acrylamide, ν, ν-bis(hydroxymethyl)(fluorenyl) acrylamide, and the like. 57 201248326 The monomer having a carboxyl group may, for example, be acrylic acid, mercaptoacrylic acid, vinyl acetate, crotonic acid, itaconic acid, maleic acid, fumaric acid, cinnamic acid or the like. Further, these monomers can also be used as a monomer having an acidic group. Examples of the epoxy group-containing monomer include epoxypropyl (meth)acrylate and 3,4-epoxycyclohexyldecyl acrylate. The monomer having an acidic group is not particularly limited, and examples of the monomer having a phosphate group in addition to the above-mentioned monomer having a carboxyl group include, for example, 2-(indenyl)acryloxyethoxyacetic acid. The copolymerization of the above-mentioned monomer having a reactive group and a monomer having an acidic group can be carried out by a conventional method. The monomer having a hydroxyl group as a reactive group may, for example, be an acid anhydride having an ethylenic double bond, a compound having an isocyanate group and an ethylenic double bond, or a compound having a vaporized thiol group and an ethylenic double bond. Examples of the acid anhydride having an ethylenic double bond include maleic anhydride, itaconic anhydride, citraconic anhydride, methyl-5-norbornene-2,3-dicarboxylic anhydride, and 3,4,5,6-tetrahydrogen. Anthracene anhydride, cis-1,2,3,6-tetrahydrophthalic anhydride, 2-buten-1-yl succinic anhydride, and the like. The compound having an isocyanate group and an ethylenic double bond may, for example, be 2-(meth)acryloyloxyethyl isocyanate or 1,1-bis((meth)acrylomethoxymethyl)ethyl isocyanate. The compound having a vaporized thiol group and an ethylenic double bond may, for example, be (meth) acrylonitrile or the like. The monomer having a carboxyl group as a reactive group may, for example, be a compound having an epoxy group and an ethylenic double bond. The compound can be exemplified by epoxypropyl (indenyl) propylene 58 201248326 acid ester, 3,4-epoxycyclohexyl methacrylate or the like. It is also possible to introduce a carboxyl group into the resin (C1-1) by causing the acid-hepatic reaction which is a part of the cyclic structure to be formed by the dehydration condensation portion of the base and the acid-reducing portion. The monomer having an epoxy group as a reactive group may be a compound having a slow group and an ethylenic double bond. Specific examples of the compound include acrylic acid, methacrylic acid, ethyl acetate vinegar, crotonic acid, itaconic acid, maleic acid, fumaric acid, cinnamic acid, and the like. Further, the resulting group may be reacted with an acid needle which is a cyclic structure-partially dehydrated condensed portion, and a carboxyl group is introduced into the resin (CM). The resin (C1-2) can be synthesized by reacting an epoxy resin with a compound having a repellent and an ethylenic double bond, and reacting with a polybasic slow acid or an anhydrate thereof. Specifically, by reacting an epoxy resin with a compound having a carboxyl group and an ethylenic double bond, an ethylene double bond is introduced into the epoxy resin. Then, the multi-inspective S is changed or the dehydrated product thereof is reacted with an epoxy resin into which an ethylene double bond has been introduced, whereby the carboxyl group can be introduced. The % oxygen resin is not particularly limited, but may be exemplified by a double-presence A type epoxy resin, a bisphenol F type epoxy resin, a novolac type epoxy resin, a nonphenolic novolac type epoxy resin, and a trisphenol methane type epoxy resin. A resin, an epoxy resin having a naphthalene skeleton, an epoxy resin having a biphenyl skeleton represented by the following formula (Cl-2a), an epoxy resin represented by the following formula (Cl_2b), and a combination represented by the following formula (Cl-2c) An epoxy resin such as a benzene skeleton. 59 201248326 [Chem. 13]

(式(Cl_2a)中’ v係1〜5〇,以2〜1〇為佳。且苯環的氫原 子各自獨立,亦可經取代為碳數丨〜12的烷基、鹵素原子或 可具有取代基之苯基。) [化 14](In the formula (Cl_2a), 'v is 1 to 5 Å, preferably 2 to 1 Å. The hydrogen atoms of the benzene ring are each independently, and may be substituted with an alkyl group having a carbon number of 1212 or 12, or may have a halogen atom or may have Substituent phenyl.) [Chem. 14]

(式(C1-2b)中’以、…、心及r64各自獨立,為氣原 子、氣原子或碳數1〜5的烧基;w為〇〜1〇。) [化 15](In the formula (C1-2b), ',, ..., the heart and r64 are each independently a gas atom, a gas atom or a carbon number of 1 to 5; w is 〇~1〇.) [Chem. 15]

(式(Cl-2c)中’苯環的氫原子各自獨立,亦可經取代為 碳數1〜12的烷基、ii素原子、或可具取代基之苯某 0〜10。) 再者,令以式(Cl-2aHCl-2c)表示的環氧樹脂與具有 60 201248326 羧基及乙烯性雙鍵的化合物進行反應後、與多鹼性m酸針 進行反應的情況下,多鹼性缓酸肝係使用二叛酸針及四叛 酸二酐的混合物者較佳。藉由改變二羧酸酐及四叛酸二酐 的比率可控制分子量。 樹脂(C1-2)係可使用市售品。市售品可舉例如(均為商 品名):KAYARAD PCR-1069、K-48C、CCR-1105、 CCR-1115、CCR-1159H、CCR-1235、TCR-1025、 TCR-1064H、TCR-1286H、ZAR-1535H、ZAR-2002H、 ZFR-1491H、ZFR-1492H、ZCR-1571H、ZCR-1569H、 ZCR-1580H、ZCR-1581H、ZCR-1588H、ZCR-1642H、 ZCR-1664H、ZCR-1761H、ZAR-2001H(以上均為日本化藥 公司製)、EX1010(Nagase chemtex公司製)等。 單體(C1-3)方面,可舉例如:2,2,2-三丙烯醯氧基甲基 乙基酞酸酯(NKESTERCBX-1新中村化學工業社製)等。 驗可溶性樹脂(C)方面,就能夠抑制顯影時塗膜剝離而 得到高解析度圖案之點、線的直線性良好之點及維持後焙 步驟後的外觀,而易於獲得平滑塗膜表面之點而言,係以 使用樹脂(C1-2)者較佳。 樹脂(C1-2)方面’特佳的是對雙酚A型環氧樹脂導入了 酸性基與乙烯性雙鍵的樹脂、對雙酚F型環氧樹脂導入了酸 性基與乙烯性雙鍵的樹脂、對酚醛型環氧樹脂導入了酸性 基與乙烯性雙鍵的樹脂、對甲酚酚醛型環氧樹脂導入了酸 性基與乙烯性雙鍵的樹脂、或對三酚甲烷型環氧樹脂導入 了酸性基與乙烯性雙鍵的樹脂,以及對以式(Cl-2a)〜(Cl-2c) 61 201248326 表示之環氧樹脂導入了酸性基與乙稀性雙鍵的樹脂。 鹼可溶性樹脂(C)的質量平均分子量(Mw),係以 1·5χ103〜3〇χ103者較佳,2χ103〜15χ103尤佳。又,數量平均 分子量(Μη)係以500〜2〇χ103者較佳,1·〇χ103〜ΙΟχΙΟ3尤佳。 質量平均分子量(Mw)及質量平均分子量(Μη)在上述範圍 之下限値以上時,曝光時之硬化充分;在前述範圍之上限 値以下時,顯影性會呈良好。 鹼可溶性樹脂(C)於1分子内具有的乙烯性雙鍵之數 量,係以平均3個以上者較佳、6個以上尤佳。乙烯性雙鍵 的數量在前述範圍之下限値以上時,曝光部分與未曝光部 分的鹼溶解度易出現差異,而可以更低的曝光量形成細微 圖案。 鹼可溶性樹脂(C)的酸價,係以10〜200mgKOH/g者較 佳、30〜150mgKOH/g更佳、50〜100mgKOH/g尤佳。酸價為 上述範圍時,負型感光性樹脂組成物的儲存穩定性及顯影 性會呈良好。 負型感光性樹脂組成物中所含之驗可溶性樹脂(C)可 以是1種,也可以是2種以上之混合物。 本發明負型感光性樹脂組成物中鹼可溶性樹脂(C)之 含有比率,在負型感光性樹脂組成物總固態部分中以10〜50 質量%為佳,12〜40質量%較佳,15〜30質量%尤佳。含有率 為上述範圍時,顯影性良好。 [負型感光性樹脂組成物] 本發明負型感光性樹脂組成物含有撥墨劑(A)、光聚合 62 201248326 起始劑(B)、鹼可溶性樹脂(C)、視需要之黑色著色劑(D)、 高分子分散劑(E)、分散助劑(F)、交聯劑(G)及溶劑(Η)。進 而,亦可含有以下熱交聯劑(I)、矽烷耦合劑(J)、微粒子(Κ)、 填酸化合物(L)及其他添加劑。 藉由使用本發明負型感光性樹脂組成物,即使將330nm 以下之曝光光線遮光,撥墨性仍良好,可製造遮罩之線寬 再現性良好之負型感光性樹脂組成物、及利用該組成物所 得之均質隔壁。因此,即使是要求微細圖案之情況也足以 對應。其理由推測如下。 作為光聚合起始劑者,必須是可有效率地吸收超過 330nm曝光光線而活性化之高感度化合物,可選擇光聚合起 始劑(B)。 依據本發明人之知見,若將330nm以下之曝光光線遮 光,有隔壁表面之硬化性極端降低,表面撥墨部分容易削 減,撥墨性低劣之傾向。若是含有光聚合起始劑(B)之負型 感光性樹脂組成物’可使隔壁表面硬化性提高。在作為撥 墨劑而含有朝隔壁表面遷移性不佳之化合物之負型感光性 樹脂組成物中,隔壁表面硬化之際,或撥墨劑未完全移動 至隔壁表面,而藉由使用朝隔壁表面之遷移性良好之撥墨 劑,撥墨性變得良好。 撥墨劑與光聚合起始劑(B)之組合,除上述硬化性、表 面遷移性以外,必須是負型感光性樹脂組成物可塗工之黏 度且穩定之組合。依據本發明人之檢討,找出了撥墨劑(a) 與光聚合起始劑(B)之組合。 63 201248326 [黑色著色劑(D)] 本發明之負型感光性樹脂組成物亦可含有黑色著色劑 ⑼。 當將負型感光性樹脂組成物用於使用形成黑矩陣亦即 將包圍液晶顯示元件的濾色器之R、G、B三色像素之格子 狀黑色部分者時’宜含有黑色著色劑(D)。 黑色著色劑(D)係可舉例如:碳黑、苯胺黑、蒽醌系黑 色顏料、茈系黑色顏料,具體係有如C.I·色料黑1、6、7、 12 ' 20、31等。亦可使用例如:將紅色顏料 '藍色顏料、 綠色顏料、次甲基偶氮系顔料等有機顏料或無機顏料的混 合物。黑色著色劑(D)就價格、遮光性大小之點而言,以碳 黑為佳,且碳黑亦可利用諸如樹脂等施行表面處理。又, 為調整色調亦可併用藍色顏料或紫色顏料。關於黑色矩 陣· ON · ARRAY型濾色器、或有機EL元件,尋求低介電 率或高電阻之塗膜或隔壁。爲了獲得如前述之塗膜或隔 壁,以使用上述有機顏料之混合物、次曱基偶氮系黑色顏 料為佳。 就黑色矩陣形狀的觀點而言,作為碳黑者係以依BET 法所測付之比表面積為50〜20〇m2/g者為佳。當比表面積為 50m2/g以上時,黑色矩陣形狀不易劣化。而為2〇〇m2/g以下 時’碳黑不會過度吸附分散助劑’因此不需要為能顯現出 諸物性而混合大量的分散助劑。 又,就感度的觀點而言,作為碳黑者以酞酸二丁酯的 吸油量在120cm3/100g以下者為佳,越少越佳。 64 201248326 進而,碳黑之利用穿透式電子顯微鏡觀察所測得之平 均一次粒徑較佳係20〜50nm。平均一次粒徑為20nm以上 時,能夠高濃度地分散,容易得到經時穩定性良好的負型 感光性樹脂組成物。為50nm以下時,黑矩陣形狀不易劣化。 此外,利用穿透式電子顯微鏡觀察之平均二次粒徑較佳係 80〜200nm。 在使本發明之負型感光性樹脂組成物中含有黑色著色 劑(D)而使用於黑色矩陣形成等的情況下,該負型感光性樹 脂組成物中之黑色著色劑(D)的含有率,在負型感光性樹脂 組成物總固態部分中,黑色著色劑(G)以15〜80質量。/。為佳, 20〜70質量%較佳,25〜65質量%尤佳。若為前述範圍,則所 得之負型感光性樹脂組成物的感度便呈良好,且所形成之 隔壁的遮光性優異。 [高分子分散劑(E)] 負型感光性樹脂組成物在含有前述黑色著色劑(D)等 分散性材料的情況下,為提升分散性,宜含有高分子分散 劑(E)。高分子分散劑(E)並無特別限定,可例舉:胺甲酸乙 酯系、聚醯亞胺系、醇酸樹脂系、環氧系、聚酯系、三聚 氰胺系、酚系、丙烯醯系、聚醚系、氣化乙烯系、氣化乙 烯醋酸乙烯系共聚合體系、聚醯胺系、聚碳酸酯系等,惟 以胺曱酸乙酯系與聚酯系為佳。此外,高分子分散劑(E)亦 可具有源自於環氧乙烯及/或環氧丙烯之構成單元。 在使用高分子分散劑(E)以分散黑色著色劑(G)的情況 下,考量到對黑色著色劑(D)的親和性,宜使用具鹼性基之 65 201248326 高分子分散劑(E)者。鹼性基並無特別限定,惟可舉例為1 級、2級或3級胺基。 高分子分散劑(E)亦可使用市售品。市售品方面可舉 例:DISPARLON DA-7301(商品名,楠本化成公司製)、b YK161、BYK162、BYK163、BYK182(以上皆為商品名、B YK-CHEMIE公司製)、SOLSPERSE5000、SOLSPERSEi7〇 00(以上皆為商品名、Zeneca公司製)等。 高分子分散劑(E)的使用量,相對於黑色著色劑(D),以 5〜30質量%為佳,10〜25質量%尤佳。使用量為上述範圍之 下限値以上時,黑色著色劑(G)之分散性則有所提升;為上 述範圍之上限値以下時,負型感光性樹脂組成物之顯影性 係呈良好。 [分散助劑(F)] 負型感光性樹脂組成物,在分散助劑(F)方面,亦可含 有駄花青系顏料衍生物或金屬酞花青磺胺化合物。分散助 劑(F),咸認具有吸附於黑色著色劑等之分散性材料與高 分子分散劑(E)而提升分散穩定性的功能。 [交聯劑(G)] 本發明的負型感光性樹脂組成物,亦可含有交聯劑(G) 作為促進自由基硬化之任意成分。交聯劑(G)較佳係於丨分 子中具有2個以上乙烯性雙鍵且不具酸性基的化合物。藉由 使負型感光性樹脂組成物含有交聯劑(G),可提升曝光時前 述鹼可溶性樹脂(C)的硬化性,且可降低在形成隔壁時的曝 光量。 1 66 201248326 於1分子中具有2個以上乙烯性雙鍵且不具酸性基的交 聯劑(G),若為具有此一條件之化合物則並無特別限制,惟 可舉例如:二乙二醇二(甲基)丙稀酸醋、四乙二醇二(甲基) 丙稀酸酯、三丙二醇二(曱基)丙烯酸酯、新戊二醇二(曱基) 丙烯酸酯、1,9-壬二醇二(曱基)丙烯酸酯、三羥甲基丙烷三 (曱基)丙烯酸酯、新戊四醇三(曱基)丙烯酸酯、新戊四醇四 (曱基)丙烯酸酯、二三羥甲基丙烷四(曱基)丙烯酸酯、二新 戊四醇五(甲基)丙烯酸酯' 二新戊四醇六(甲基)丙烯酸酯 等、乙氧化三聚異氰酸三丙烯酸酯、ε-己内酯改性三-(2-丙 烯醯氧乙基)三聚異氰酸酯、雙{4-(烯丙基雙環[2.2.1]庚-5-烯-2,3-二羧基醯亞胺)苯基}曱烷、Ν,Ν1-間-伸茬基-雙(烯丙 基雙環[2.2.1]庚-5-烯-2,3-二羧基醯亞胺)、胺曱酸乙酯丙 烯酸酯等。該等係可單獨使用1種,亦可併用2種以上。 交聯劑(G)可使用市售商品。市售品可舉例如: KAYARAD DPHA(商品名、日本化藥公司製、二新戊四醇 五丙烯酸酯與二新戊四醇六丙烯酸酯的混合物);NK ESTER A-9530(商品名、新中村化學工業社製、二新戊四醇 五丙烯酸酯與二新戊四醇六丙烯酸酯的混合物));V#802(商 品名、大阪有機化學工業社製、二新戊四醇丙烯酸醋、二 新戊四醇丙烯酸酯及四新戊四醇丙烯酸酯的混合物)、NK 酯A-9300(商品名、新中村化學工業社製、乙氧化三聚異 氰酸三丙烯酸酯);NK ESTERA-9300-1CL(商品名、新中村 化學工業社製、ε-己内酯改性三-(2-丙烯醯氧乙基)三聚異氰 酸酯);ΒΑΝΙ-Μ(商品名、九善石油化學社製、雙(4_(稀丙 67 201248326 基雙環[2·2·1]庚-5-烯-2,3-二羧基醯亞胺)苯基}甲烷);及 BANI-X(商品名、丸善石油化學社製、ν,ν·-間-伸茬基-雙(烯 丙基雙環[2.2.1]庚-5-烯-2,3-二羧基醯亞胺))等。胺甲酸乙 酯丙烯酸酯舉例可為日本化藥公司製的KAYARAD UX系 列’具體的商品名可舉例為:UX-3204、UX-61(H、UX-0937、 DPHA-40H ' UX-5000、UX-5002D-P20等。 其中,KAYARAD DPHA及NK ESTER A-9530,由於可 提升從負型感光性樹脂組成物所得硬化膜的敏感度,故屬 較佳。NK ESTER A-9300、BANI-M及BANI-X,從賦予硬 化膜硬度而抑制熱塌的觀點來看係屬較佳。NK ESTER A-9300-1CL,由賦予硬化膜柔軟性的觀點來看係屬較佳。 胺甲酸乙酯丙烯酸酯,因著能夠實現適當的顯影時間且顯 影性呈良好故屬較佳。 本發明負型感光性樹脂組成物中交聯劑(G)的含有比 率’在負型感光性樹脂組成物之總固態部分中,佔3〜3〇質 量°/。為佳,5〜20質量%較佳,7〜15質量%甚佳。若在上述範 圍,則負型感光性樹脂組成物之鹼顯影性可變良好。 [溶劑(H)] 本發明負型感光性樹脂組成物係視需要而含有溶劑 (H)。若含有溶劑(H) ’則由於負型感光性樹脂組成物的黏 度降低,負型感光性樹脂組成物對基板上的塗佈較容易進 行。可形成均勻的負型感光性樹脂組成物塗膜。另外,負 型感光性樹脂組成物為不含溶劑(H)的情況下,負型感光性 樹脂組成物的塗膜,即與負型感光性樹脂組成物之膜為同 68 201248326 一物。 本發明的負型感光性樹脂組成物所含有的溶劑(Η),若 能將負型感光性樹脂組成物所含之上述撥墨劑(Α)、光聚合 起始劑(Β)、鹼可溶性樹脂(〇、視需要之黑色著色劑(D)、 高分子分散劑(Ε)、分散助劑(F)及交聯劑(G)、甚且後述任 意成分均勻溶解或分散’且具有使負型感光性樹脂組成物 對欲形成隔壁之基材的塗佈均一且簡便的功能,並對該等 成分不具反應性,則溶劑並無特別限制,可使用例如與在 合成撥墨劑(Α)時所用溶劑相同的溶劑。 負型感光性樹脂組成物中所含溶劑(Η)之含有比率,視 負型感光性樹脂組成物之組成或用途等而異,負型感光性 樹脂組成物中,宜以50〜99質量。/。來摻混,以6〇〜95質量% 較佳,65〜90質量%尤佳。 本發明負型感光性樹脂組成物,係含有撥墨劑(Α)、光 聚合起始劑(Β)、鹼可溶性樹脂(C),並因應需求含有黑色著 色劑〇D)、高分子分散劑(Ε)、分散助劑(f)、交聯劑(g)及溶 劑(H)再者,亦可含有以下熱交聯劑⑴、矽烷耦合劑(j)、微 粒子(K)、填酸化合物(L)及其他添加劑。 [熱交聯劑(I)] 熱交聯劑⑴係具有2個以上能與羧基及/或羥基反應 之基團的化合物。熱父聯劑(I),在驗可溶性樹脂(B)為具有 羧基及/或羥基的情況下,係具有與鹼可溶性樹脂(B)反應、 使硬化膜交聯密度增高而使耐熱性提升的作用。 熱交聯劑⑴方面較佳係可例舉選自於由胺基樹脂、環 69 201248326 氧化合物、噚唑啉化合物、聚異氰酸酯化合物、及聚羰二 醯亞胺化合物所構成群組中之至少一種者。該等化合物係 可單獨使用’亦可併用2種以上。 本發明之負型感光性樹脂組成物中熱交聯劑(F)之含有 比率,在負型感光性樹脂組成物之總固態部分中,以卜50 質量°/〇為佳,5〜30質量%較佳。若在上述範圍内,則所得 之負型感光性樹脂組成物的顯影性便呈良好。 [矽烷耦合劑(J)] 若使用矽烷偶合劑(J),則由獲得之負型感光性樹脂組 成物所形成之硬化膜的基材密接性會有所提升。 矽烷偶合劑(J)的具體例,係可舉例如:四乙氧基矽烷、 3-環氧丙氧基丙基三甲氧基石夕燒、曱基三甲氧基石夕烧、乙 烯基三曱氧基矽烷、3-甲基丙烯醯氧基丙基三曱氧基矽 烷、3-氣丙基三曱氧基矽烷、3-硫醇基丙基三甲氧基矽烷、 3-胺基丙基三乙氧基矽烷、十七氟辛基乙基三曱氧基矽 烷、含聚氧化伸烷鏈的三乙氧基矽烷等。該等可單獨使用, 亦可併用2種以上。 矽烧耦合劑(J)可使用市售品。市售品方面可舉 KBM5013(商品名、信越化學社製、3_丙烯醯氧基丙基三甲 氧基矽烷)等。 本發明負型感光性組成物中之矽烷耦合劑(j)之含有比 率’在負型感光性樹脂組成物總固態部分中宜為〇 1〜2〇質 量。/。,甚佳為1〜10質量%。若為上述範圍之下限値以上,則 由負型感光性樹脂組成物形成之硬化_基材密著性會增 70 201248326 加;若為前述範圍之上_以下,則撥墨性會呈良好。 [微粒子(κ)] +負型感光性樹脂組成物,視需要亦可含有微粒子(κ)。 藉由4植子(Κ) ’可防止由負型感光性樹脂組成物所獲 得之隔壁發生熱塌。 微粒子(Κ)並無特別限制,可例舉:氧化石夕、氧化錐、 氣化鎂、銦摻雜氧化錫叫録換雜氧化錫(ΑΤ0)等無機 系微粒子,聚乙烯、聚甲基丙稀酸甲醋(ΡΜ祖)等有機系微 粒子时里耐熱性時’以無機系微粒子為佳·若考量取 传谷易性或分散穩定性,則以氧切或氧化錯尤佳。此外, 負型感光性樹脂組成物為含有黑色著色劑⑹及高分子分 散劑(Η)的情況時’若考量該高分子分散劑(Η)的吸附能, 則微粒子(Κ)細帶貞t者紐。再者,若考量貞型感光性 樹脂組成物之曝光感度,微粒子係以在曝光時不吸收所昭 射光者為佳,而以不吸收超高壓水銀燈之主發光波長…’射 線(365nm)、Η射線(勸㈣、G射線(436nm)者尤佳。 微粒子(K)方面係以二氧化石夕為佳。二氧化石夕方面以膠 體二氧化矽為佳。一般而言,作為膠體二氧化矽者有:二 散於水之二氧切水溶膠、以有機溶餘代水之有機二: 化矽溶膠,惟係以有機溶劑作為分散媒使用之有機二~氧 矽溶膠為佳。 氣化 這種有機二氧化矽溶膠,可使用市售品市售品方面 可舉如下,任一者皆為日産化學工業社製之商品名 PMA-ST(二氧切粒徑·· 1Q〜2Gnm、二氧切固態部分^ 71 201248326 質望:%、丙二醇單曱基乙酸酯:70質量%)、Npc ST(二氧化 矽粒徑:10〜20nm、二氧化矽固態部分:3〇質量%、正丙基 赛路蘇:70質量%。)、IPA-ST(二氧化矽粒徑:1〇〜2〇nm、 二氧化矽固態部分:30質量%'1卩八:7〇質量等。 本發明負型感光性樹脂組成物中微粒子(κ)之含有比 率,在負型感光性樹脂組成物之總固態部分中,以3〜4〇質 量%為佳,5〜30質量%尤佳。甚佳者為7質量%以上而少於 25質量%。含有比率若在上述範圍,則撥墨性良好,負型 感光性樹脂組成物之貯藏穩定性良好。 [磷酸化合物(L)] 本發明負型感光性樹脂組成物,視需要亦可含有璘酸 化合物(L)。藉由使負型感光性樹脂組成物含有磷酸化合物 (L) ’可提升與基板之密接性。作為磷酸化合物(L)者,可舉 單(甲基)丙烯醯氧基乙基磷酸酯、二(曱基)丙烯醯氧基乙基 磷酸酯、三(甲基)丙烯醯氧基乙基磷酸酯等。 [其他添加劑] 本發明負型感光性樹脂組成物中,還可視需要含有硬 化促進劑、增黏劑、塑化劑、消泡劑、調平劑、抗縮孔劑、 紫外線吸收劑等。 [負型感光性樹脂組成物之適當組合] 本發明負型感光性樹脂組成物,宜配合用途或要求特 性來選擇組成與摻混比。 本發明負型感光性樹脂組成物中’各種摻混成分之較 佳組成係如下所示。 72 201248326 撥墨劑(A):前述撥墨劑(A1)之適當組合丨〜5或前述撥墨 劑(A2)之適當組合6〜10,在負型感光性樹脂組成物之總固 態部分中為〇.〇1〜10質量%、 光聚合起始劑(B):國際公開第2008/078678號記載之化 合物No_l~58,在負型感光性樹脂組成物之總固態部分中為 0.01 〜10質量。/〇、 鹼可溶性樹脂(C):於(Cl-2a)、(Cl-2b)、(Cl-2c)及曱 酚酚醛清漆型環氧樹脂導入酸性基與乙烯性雙鍵之樹脂所 構成群組之至少1種,在負型感光性樹脂組成物之總固態部 分中為12〜40質量%、 溶劑(H) : 2-丙醇、丁内酯、3-甲氧基丁基乙酸酯、 二乙二醇二曱基醚、二乙二醇乙基甲基醚、二丙二醇二曱 基醚、丙二醇單甲基醚己酸酯、環己酮及乳酸丁酯所構成 群組之至少1種,在負型感光性樹脂組成物中為50〜99質量 %。 [負型感光性樹脂組成物之製造方法] 製造負型感光性樹脂組成物之方法,係撥墨劑(A)、光 聚合起始劑(B)、鹼可溶性樹脂(C)、視需要之黑色著色劑 (D)、高分子分散劑(E)、分散助劑(F)、交聯劑(G)及溶劑(E), 進而,混合以下之熱交聯劑(I)、矽烷偶合劑(J)、微粒子(K)、 磷酸化合物(L)及其他添加劑相之方法較佳。 本發明之負型感光性樹脂組成物,係如同一般負型感 光性組成物,可使用作為光刻法等之材料,而使該組成物 塗膜硬化所獲得之硬化膜,可使用作為一般負型感光性樹 73 201248326 脂組成物硬化膜所使用之光學元件構件。 [光學元件用隔壁的製造方法] 適用於製造在基板上具有複數像素與位於鄰接像素間 之隔壁的光學元件用隔壁。 將本發明負型感光性樹脂組成物塗佈於上述基板上而 形成塗膜(塗卿砂驟);接著,訂述_騎加熱(預 賠步驟);接著’僅將前述塗膜屬成為隔壁之部分施行曝光 而使其感光硬化(曝光步驟);接著,將前述經光硬化部分以 外的塗膜去除,而㈣由前述塗膜之光硬化部分所構成之 隔壁(顯影步驟);接著’對前述已形成之隔壁施行加熱(後 焙步驟)’藉此即可製作光學元件用之隔壁。 再者,本發明之負型感光性樹脂組成物含有黑色著色 劑(D)時,光學元件用隔壁係以黑色矩陣形成。 基板材質並無特別限定,可使用例如各種玻璃板;聚 醋(聚對笨二曱酸乙二s旨等)' 聚馳(聚乙烯、聚丙稀等)、 聚碳酸離、聚甲基丙稀酸甲醋、聚碾、聚醯亞胺、聚(甲基) 丙稀酸樹脂等熱塑性塑膠片;環氧樹脂、不飽和聚醋等熱 硬化性樹腊之硬化片等。尤其基於耐熱性這點,以玻璃板、 聚酿亞胺等耐熱性塑膠為佳。 第1圖係模式地顯示採用本發明負型感光性樹脂組成 物之光學元件用隔壁之製造例截面圖。第1(1)圖係顯示於基 板1上形成有由本發明負型感光性樹脂組成物構成之塗膜2 的狀態之戴面圖。第1(11)圖係模式地顯示曝光步驟之圖。 第ι(πι)圖係顯示顯影步驟後之基板丨與基板上形成之隔壁6 74 201248326 之截面圖。 以下,利用第1圖,具體說明利用本發明負型感光性樹 脂組成物之光學元件用隔壁之製造方法。 (塗膜形成步驟) 如第1(1)圖的截面所示,在基板丄上塗佈前述本發明之 負型感光性糾日組成物’而形成由負型感光性樹脂組成物 所構成之塗膜2° X ’在基板1上形成負㈣光性樹脂組成 物的塗膜2之前’最好先將基板丨之負龍光性職組成物 的塗佈面’利用醇洗淨或紫外線/臭氧洗淨等方法施行洗 淨0 負沒感光性樹脂級成物的塗佈方法方面,只要是形成 膜厚均勻之塗蘭方法職無特殊限制,可舉例如:旋塗 法、喷塗法、狹縫式塗佈法、輥塗佈法、旋轉塗佈法、棒 塗佈法等一般塗膜形成所用方法。 塗膜2之膜厚係考量最終所得之隔壁的高度而決定。塗 膜2之膜# ’宜為最終所得隔壁之高度的100〜3,000〇/〇, 100〜2,000%尤佳 1.3〜65μιη尤佳。 塗膜2之膜厚以〇 3〜325μηι為佳, (預焙步驟) :上述成步驟在基板i上所形成的㈣2施行 M、得至j膜2。藉由該加熱,構成塗膜2的負型感光性樹 ==括?_成分會揮發 '去除,而獲 近。加熱·的膜。此外’撥墨劑(A)遷移至塗膜表面附 〇…、方法係可舉例如將基板1與_2-起利用諸如加 75 201248326 熱板、烘箱等加熱,施予50〜120°C且10〜2,000秒鐘左右之 加熱處理的方法。 另外,雖然如上述,可藉由預焙步驟之加熱將溶劑等 揮發成分去除,但亦可在預焙步驟前另外設置除加熱(乾燥) 以外的真空乾燥等乾燥步驟以去除溶劑等揮發成分。此 外,為不致發生塗膜外觀的不均,並為有效率地施行乾燥, 更佳係將由前述預焙步驟所施行之兼具乾燥功能的加熱, 與真空乾燥合併使用。真空乾燥的條件依照各成分的種 類、調配比例等而異,較佳係可在500〜10Pa且10〜300秒鐘 左右的寬廣範圍内實施。 (曝光步驟) 如第1(11)圖所示,隔著預定圖案之遮罩4將光5照射至 膜2。光5僅穿透過上述遮罩4缺口的預定圖案部分,並到達 基板1上之膜,僅該部分會光硬化。所以,在進行隔壁之形 成時,前述預定圖案的形狀係適當設計成隔壁之形狀。 例如,後焙步驟後,隔壁寬度平均以ΙΟΟμηι以下為佳, 20μΓη以下甚佳。又,相鄰隔壁間的距離平均以500μηι以下 為佳,300μηι以下甚佳。採用之遮罩宜為已構成為可使形 成圖案在上述範圍者。 第1(11)圖中,經光照射的膜之曝光部分3,係由負型感 光性樹脂組成物的硬化膜構成;另一方面,未曝光部分則 呈未硬化之負型感光性樹脂組成物之膜2本身殘存的狀態。 所照射的光5,可舉例如:可見光;紫外線;遠紫外線; KrF準分子雷射、ArF準分子雷射、F2準分子雷射、Kr2準分 76 201248326 子雷射、KrAr準分子雷射、μ準分子雷射等準分子雷射; X射線,電子束等。X,照射光5係以波長1〇〇〜6〇〇nm的電 磁波為佳,較佳係具有分佈於3〇〇〜5〇〇nm範圍内的光線,i 射線(365nm)、h射線(405nm)、g射線(436nm)尤佳。再者, 在例如採用鏡投影型(MPA)方式曝光方法之情況下,係將 330nm以下電磁波截止來照射曝光光線。如此,於本發明製 造方法中,亦可因應需要,進行已將330nm以下電磁波截止 之曝光。 照射裝置可使用公知超高壓水銀燈或深紫外光燈等。 曝光量,以藉由截止渡波器等將33〇nm以下電磁波截止之情 況下之丨線為基準,以5〜1,咖為佳,5〜2(K)mj/cm2較 佳10 100mJ/cm更佳,15〜5〇mJ/cm2尤佳。若曝光量為上 述範圍的下限值以上,貞彳成為隔壁之貞型感光性樹脂組成 物的硬化充分’在後續顯影中不易發生溶解或從基板i上剝 離。右在上述範圍的上限值以下,則可獲得高解析度。由 f發:負型感光性樹脂組成物所獲得之硬化膜表面,即使 疋在藉由截止渡波器等將33—以下電磁波截止之情況 下,撥墨性尤其良好。 ★光時間係依照曝光量、負型用感光組成物的組成、 塗膜的厚度等而佳 ,5〜20秒尤佳。 (顯影步驟) 使用顯影液進行顯影,將第1(11)圖所表示之基板1上的 未曝2去除。藉此’即獲得如第1(111)圖之截面圖所示 1板1與M6的結構’其係在前述基板上由負型感光性 77 201248326 樹脂組成物之硬化膜所形成者。此外,由隔壁6與基板[所 包圍的部分,係利用印墨注入等形成像素之通稱點陣7的部 分。所得之基板10,經後述後焙步驟,會成為可使用於以 噴墨式製作光學元件用的基板。 顯影液係可使用含有例如無機鹼類、胺類、醇胺類、 四級敍鹽等鹼類的驗水溶液。此外,在顯影液中為求溶 解性的提升與去除殘渣,可添加諸如界面活性劑或醇等有 機溶劑。 顯影時間(使顯影液接觸的時間)以5〜180秒鐘為佳。此 外,顯影方法係可例舉諸如滿液法、浸塗法、淋灑法等。 顯影後,藉由施行高壓水洗或流水洗淨,並利用壓縮空氣 或壓縮氮氣使其風乾,便可將基板丨與隔壁6上之水分去除。 又,於顯影步驟前後成為隔壁之部分之硬化膜膜厚變 化以60nm以下為佳,5〇nm較佳,45nm以下尤佳。膜厚變化 若在60nm以下,用以展現曝光後之硬化膜表層撥墨性之撥 墨層充分殘存於表面,後焙後之硬化膜撥墨性變得良好。 (後焙步驟) 將基板1上的隔壁6加熱。加熱之方法係有例如將基板1 '、隔盍6起利用諸如加熱板、烘箱等加熱,施行15〇〜250 C 5 90刀鉍之加熱處理的方法。藉由該加熱處理,便使 基板丨上由負型感光性樹脂組成物之硬化膜所構成之隔壁6 更進步硬化’且由隔壁6與基板丨所圍成的點陣7形狀亦會 更固定化0另外,治·、上 r則述加熱溫度以180°C以上尤佳。若加熱 *度過低為隔壁6的硬化不充分,無法獲得充分的耐 78 201248326 化性,在其後的喷墨塗佈步驟中將印墨注入點陣7中時恐 有因δ亥印墨中所含之溶劑導致隔壁6發生膨潤、或印墨滲出 的可此性。反之,若加熱溫度過面,則恐會有導致隔壁6發 生熱分解的可能性。 本發明之負型感光性樹脂組成物,隔壁寬度之平均宜 在1〇〇μιη以下,以20μπ1Η下尤佳,再者,相鄰之隔壁間的 距離(點陣寬度)的平均以500μηι以下為佳,3〇〇μιη以下甚 佳。又,隔壁高度的平均以0.05〜50μιη為佳,〇.2〜1〇μιη尤佳。 由本發明負型感光性樹脂組成物形成之塗膜硬化膜之 撥墨〖生,可以水及丙一醇1 _單甲基_ 2_乙酸酯(以下亦稱 PGMEA)之接觸角來估計’水之接觸角以90度以上為佳,95 度以上較佳。又,PGMEA之接觸角以30度以上為佳,35度 以上較佳,40度以上尤佳。塗膜硬化膜之撥墨性,以水之 接觸角為90度以上且PGMEA之接觸角在30度以上尤佳。 [光學元件之製造方法] 藉上述製造方法在基板上形成隔壁之後,再對於由上 述基板與上述隔賴包®之區_露_基板表面施行親 墨化處理(親印墨化處理步驟);接著,對上述區域利用喷墨 法注入印墨,而形成前述像素(印墨注入步驟)。又,在光學 元件之製造中親印墨化處理步驟並非必要步驟,有時會= 所製造之光學元件而定並未進行。 (親印墨化處理步驟) 親墨化處理的方法係可舉例如:藉驗水溶液所行之洗 淨處理、料雜淨處理、紫外_、_淨處理、準分子 79 201248326 洗淨處理、電暈放電處理、氧I胳* 乳電漿處理等方法。 藉鹼水溶液所行之洗淨處 &理’係使用鹼水溶液(氫氧化 鉀、四甲基氫氧化财錢等)洗淨基板表狀濕式處理。 紫外線洗淨處理,係使用紫外線洗淨基板表面之乾式 處理。 紫外線/臭氧洗淨處理,你 货'使用發出185nm與254nm光 之低壓水銀燈洗淨基板表面之乾式處理 準分子洗淨處理,係使用二里 淨基板表蚊乾歧理。幻72nm光之Μ分子燈洗 電暈放電處理,係利用 , , 頌向電壓,使大氣中產生電 暈放電,而將基板表面洗淨之乾式處理 氧電聚處理,主要係使用在 觸發器使氧激發,形成反庫 冋項電源等作為 成應性_「電t狀態」,並用其將 基板表面料之It核理。 用兵將 親印墨化處理之方法 ^ 方面,就簡便性觀點而言,鉸佳 係紫外線/錢洗料料乾核理法 =較佳 市售裝置來產生。在势冰、卜臭氣可使用 Μ外線/臭氧裝置内部放 之基板,於空氣中’以室溫下、K1。分鐘左右 隔壁撥油㈣範_進行處理,藉此便可 理。另外,關於處理睥Μ 视Ρ墨化處 調整為不會損及隔η、要配合各個紫外線/臭氧農置, 巧个曰貝及^壁之撥油性範圍的時間便可。 藉由該親印墨化處理,藉由充分進行 殘留於點陣之雜質形成後 化,如此而可防止^所可充分謀求點陣之親印墨 用所件光學元件之彩色顯示表示裝置 80 201248326 等的白斑點現象。 (印墨注入步驟) 此係於親印墨化處理步驟後之點陣,利用入 印墨而形成像素之步驟。該步驟可使用喷 土 用的喷墨,並依-般方法依樣實施。此種像素形==使 用的喷墨裝置方面並無特別限制,可使用例 墨連續性喷射出並利用磁場進行控制之方法、使^電元 件間歇性仙出印墨汁方法、對印墨施行加熱_衫發 泡而間歇性噴射出之方料各種方法时墨裝置。 使用本發明負型感光性樹脂組成物所製造之光學元 件,係可舉例如渡色器、有機虹顯示元件、有機tft:列 等。 [濾色器之製造] 隔壁的形成、點陣的親印墨化處理、以噴墨法所行的 印墨注入係如上所述。在濾色器中,所形成的像素形狀可 為例如·條紋型、馬赛克型、三角型' 4像素配置型等公知 任一排列型式。 用於像素形成的印墨主要係含有著色成分、黏結劑樹 脂成分及溶劑。著色成分較佳係使用耐熱性、耐光性等均 優異的顏料及染料。黏結劑樹脂成分較佳係透明且耐熱性 優異之樹脂’可舉例如:丙烯酸樹脂、三聚氰胺樹脂、胺 甲酸S旨樹脂等。水性印墨含有:作為溶劑的水及視需要的 水〉谷性有機溶劑,且含有作為黏結劑樹脂成分的水溶性樹 脂或水分散性樹脂,並視需要含有各種助劑。此外’油性 81 201248326 印墨係含有作為溶劑的有機溶劑,且含有作為黏結劑樹脂 成分之可溶於有機溶劑中的樹脂,並視需要含有各種助劑。 再者’經利用喷墨法注入印墨之後,最好視需要施行 乾燥、加熱硬化及紫外線硬化。 在像素形成後,視需要而形成保護膜層。保護膜層宜 基於提升表面平坦性之目的,以及阻止來自隔壁或像素部 之印墨溶出物到達液晶層之目的來形成。在形成有保護膜 層之情況下,宜事先將隔壁之撥墨性去除。若未將撥墨性 去除’則會排斥保護用塗佈液,導致無法獲得均句膜厚, 因而最好避免。將隔壁撥墨性去除之方法,可舉電毁灰化 加工(Plasma Ashing)處理、光灰化加工處理等。 進一步視需要,為求使用濾色器所製得之液晶面板之 南品質化,宜將光阻式間隙子(photo spacer)形成於由隔壁 構成的黑矩陣上。 [有機EL顯示元件的製造] 在形成隔壁之前,於玻璃等透明基材上,利用錢鑛法 等進行諸如銀摻雜氧化銦(IT〇)等透明電極之製膜,並視需 要將透明電極蝕刻為冀望之圖案。接著,使用本發明負型 感光性樹脂組成物形成隔壁,龙施行點陣的親印墨化處理 後’使用喷墨法對點陣將電洞輸送材料、發光材料之溶液 依序進行塗佈、乾燥,形成電洞輸送層、發光層。其後, 利用蒸鍍法等形成諸如鋁等電極,便可獲得有機EL顯示元 件的像素。 [有機TFT陣列的製造] 82 201248326 經由以下(i)〜(in)之步驟即可製造有機tft陣列。 ⑴在_等翻基材上個本發” _光性樹脂电 °在._的親墨化處理後,使用喷墨法,對 .占陣施仃間極電極材料溶液之塗佈而形成閘極電極。 ⑻在使閑極電極形成後,使閘絕緣膜形成於其上。使 用树明負型感光性樹脂組成物在閘絕_上形成隔 化處理後’使用喷墨法對 ~ 沒極電極㈣溶液之㈣,㈣«極•祕電極 "㈣在使源極•祕電極形成之後,使用本發明負型感 光性樹脂組成物形成隔壁以包圍涵蓋—對源極•沒極電極 在内之區域,在施行點陣的親墨化處理後,使 點陣施行有機半導體溶液之塗佈,使有機半導體層形成於 源極•汲極電極之間。 又’(i)〜(iii)中’可各自僅在i步驟中利用到已採用本發 明負型感光性樹脂組成物之隔壁,亦可在2個以上之步驟中 利用到採用本發明負型感光性樹脂組成物之隔壁。 [有機EL照明元件之製造] 此係可與有機EL顯示元件之製造同樣施行來製造。發 光層係可藉由噴墨來層積發出紅、綠、藍等各色之發光體, 亦可將前述發光體分塗於平面上。 實施例 以下利用實施例進一步詳細說明本發明,惟本發明並 不限定於該等實施例。又,例丨〜21為實施例,例31〜33為比 較例。 83 201248326 各測定係依以下方法來進行。 數目平均分子量(Μη)係藉由凝膠滲透層析法,以聚苯 乙烯為標準物質進行測定。 撥墨劑(Α)中氟原子之含有比率,係以1,4-二三氟甲基 苯為標準物質,藉由19F NMR測定來求取。撥墨劑(Α)中 乙烯性雙鍵之量,係以1,4-二三氟甲基苯作為標準物質,藉 由1H NMR測定來求取。 酸價(mgKOH/g)及1分子中之乙烯性雙鍵數目,係由原 料單體之摻混比率求取之理論値。 合成例及實施例中使用之化合物略語如下。 (用於撥墨劑(A1)之合成之化合物) MEK : 2-丁酮。 C6FMA : CH2 = C(CH3)COOCH2CH2(CF2)6F。 MAA :甲基丙烯酸。 MMA :甲基丙烯酸甲酯。 PME400 : BLEMMER PME-400(曰本油月旨社製。α-曱 基-ω-甲基丙烯醯氧基聚(氧乙烯)。CH2 = C(CH3)C00(CH2CH20)kCH3 :式中之k表示分子間平均値, k値為約9)。 PME1000 : BLEMMER PME-1000(日本油脂社製。α-甲基-ω-甲基丙烯醯氧基聚(氧乙烯)。CH2 = C(CH3)C00(CH2CH20)kCH3 :式中之k表示分子間平均値, k値為23)。 乂-65:商品名(和光純藥社製。2,2'-偶氮雙(2,4-二曱基 84 201248326 戊腈。))。 2-HEMA :曱基丙烯酸2-羥乙酯。 GMA:甲基丙烯酸環氧丙酯。 AOI : 2-丙烯醯氧基乙基異氰酸酯(昭和電工社製、商 品名:Karenz AOI。)。 DBTDL ·二丁基錫二月桂醋。 TBQ :三級丁基-對-苯醌。 (用於撥墨劑(A2)之合成之化合物) 化合物(a7-l) : CF3(CF2)5CH2CH2Si(OCH3)3(旭硝子社 製)。 化合物(a8-l) : Si(0C2H5)4(C0LC0AT社製)。 化合物(a9-l) : CH2 = CHCOO(CH2)3Si(OCH3)3(東京化 成工業社製)。 TMMS:三f基甲氧基石夕烧[(阳成⑴阳爪東京化成 工業社製)。 PGME:丙二醇單曱基鍵。 PGMEA :丙二醇單甲基趟乙酸醋。 (光聚合起始劑(B)) 上述化合物Νο·1〜3、化合物No.7、化合物Ν〇 ι〇、化合 物NCU2、化合物No.20、化合物Ν〇·33、化合物n〇各賢 化合物Νο·53〜58所示之化合物。 (光聚合起始劑(Β)以外之光聚合起始劑) ΟΧΕ02 :乙 _ (ethanone) i_r〇 -, „ 1 A己基_6·(2_甲基苯曱 基)-9Η-咔唑醯_3-基]-1-(0-乙酿社 G 醯基)(Ciba Specialty 85 201248326(In the formula (Cl-2c), the hydrogen atoms of the 'benzene ring are each independently, and may be substituted with an alkyl group having 1 to 12 carbon atoms, a ii atom, or a benzene having a substituent of 0 to 10. , in the case of reacting an epoxy resin represented by the formula (Cl-2aHCl-2c) with a compound having a carboxyl group and an ethylenic double bond of 60 201248326, and reacting with a polybasic acid acid needle, a polybasic acid retardation It is preferred that the liver system use a mixture of two tacrotic needles and four retinoic acid dianhydrides. The molecular weight can be controlled by changing the ratio of the dicarboxylic anhydride and the tetra-baric acid dianhydride. A commercially available product can be used for the resin (C1-2). Commercially available products (for example, trade names): KAYARAD PCR-1069, K-48C, CCR-1105, CCR-1115, CCR-1159H, CCR-1235, TCR-1025, TCR-1064H, TCR-1286H, ZAR-1535H, ZAR-2002H, ZFR-1491H, ZFR-1492H, ZCR-1571H, ZCR-1569H, ZCR-1580H, ZCR-1581H, ZCR-1588H, ZCR-1642H, ZCR-1664H, ZCR-1761H, ZAR- 2001H (all of which are manufactured by Nippon Kayaku Co., Ltd.) and EX1010 (manufactured by Nagase Chemex Co., Ltd.). In the case of the monomer (C1-3), for example, 2,2,2-tripropenyloxymethylethyl phthalate (NKESTERCBX-1, manufactured by Shin-Nakamura Chemical Co., Ltd.) or the like can be mentioned. In the case of the soluble resin (C), it is possible to suppress the peeling of the coating film during development, to obtain a high-resolution pattern, to obtain a line with good linearity, and to maintain the appearance after the post-baking step, and to easily obtain a smooth coating film surface. In general, it is preferred to use a resin (C1-2). In the case of the resin (C1-2), it is particularly preferable to introduce a resin having an acidic group and an ethylenic double bond into a bisphenol A type epoxy resin, and to introduce an acidic group and an ethylenic double bond to the bisphenol F type epoxy resin. Resin, a resin in which an acidic group and an ethylenic double bond are introduced to a novolac type epoxy resin, a resin in which an acidic group and an ethylenic double bond are introduced to a p-cresol novolac type epoxy resin, or a trisphenol methane type epoxy resin is introduced. A resin having an acidic group and an ethylenic double bond, and a resin having an acidic group and an ethylene double bond introduced into the epoxy resin represented by the formula (Cl-2a) to (Cl-2c) 61 201248326. The mass average molecular weight (Mw) of the alkali-soluble resin (C) is preferably from 1. 5 χ 103 to 3 〇χ 103, and particularly preferably from 2 χ 103 to 15 χ 103. Further, the number average molecular weight (??) is preferably 500 to 2? 103, and more preferably 1 to 〇χ103 to ΙΟχΙΟ3. When the mass average molecular weight (Mw) and the mass average molecular weight (?n) are at least the lower limit of the above range, the curing at the time of exposure is sufficient. When the upper limit of the above range is 値 or less, the developability is good. The number of the ethylenic double bonds which the alkali-soluble resin (C) has in one molecule is preferably 3 or more, and more preferably 6 or more. When the number of the ethylenic double bonds is more than the lower limit 値 of the above range, the alkali solubility of the exposed portion and the unexposed portion is likely to be different, and a fine pattern can be formed with a lower exposure amount. The acid value of the alkali-soluble resin (C) is preferably from 10 to 200 mgKOH/g, more preferably from 30 to 150 mgKOH/g, even more preferably from 50 to 100 mgKOH/g. When the acid value is in the above range, the storage stability and developability of the negative photosensitive resin composition are good. The test soluble resin (C) contained in the negative photosensitive resin composition may be one type or a mixture of two or more types. The content ratio of the alkali-soluble resin (C) in the negative photosensitive resin composition of the present invention is preferably 10 to 50% by mass in the total solid portion of the negative photosensitive resin composition, and preferably 12 to 40% by mass, preferably 15 ~30% by mass is especially good. When the content is in the above range, the developability is good. [Negative photosensitive resin composition] The negative photosensitive resin composition of the present invention contains an ink-repellent (A), photopolymerization 62 201248326 initiator (B), an alkali-soluble resin (C), and optionally a black colorant. (D), a polymer dispersant (E), a dispersing aid (F), a crosslinking agent (G), and a solvent (Η). Further, it may contain the following thermal crosslinking agent (I), decane coupling agent (J), fine particles (Κ), acid-filling compound (L), and other additives. By using the negative photosensitive resin composition of the present invention, even if the exposure light of 330 nm or less is shielded from light, the ink repellency is good, and a negative photosensitive resin composition having good line width reproducibility of the mask can be produced, and the negative photosensitive resin composition can be produced. The homogeneous partition obtained from the composition. Therefore, even a case where a fine pattern is required is sufficient. The reason is presumed as follows. As the photopolymerization initiator, it is necessary to be a high-sensitivity compound which can efficiently absorb an exposure light exceeding 330 nm, and a photopolymerization initiator (B) can be selected. According to the inventors' knowledge, when the exposure light of 330 nm or less is shielded, the hardenability of the surface of the partition wall is extremely lowered, and the ink-repellent portion of the surface is easily reduced, and the ink-repellent property tends to be inferior. The negative photosensitive resin composition containing the photopolymerization initiator (B) can improve the surface hardenability of the partition walls. In the negative photosensitive resin composition containing a compound having poor mobility toward the surface of the partition wall as an ink-repellent agent, when the surface of the partition wall is hardened, or the ink-repellent agent is not completely moved to the surface of the partition wall, by using the surface toward the partition wall The ink-repellent agent with good mobility has a good ink repellency. The combination of the ink-repellent agent and the photopolymerization initiator (B) must be a combination of a workable viscosity and a stable composition of the negative-type photosensitive resin composition in addition to the above-mentioned hardenability and surface migration property. According to the review by the inventors, a combination of the ink-repellent (a) and the photopolymerization initiator (B) was found. 63 201248326 [Black coloring agent (D)] The negative photosensitive resin composition of the present invention may further contain a black coloring agent (9). When the negative photosensitive resin composition is used for the lattice black portion of the R, G, and B color pixels of the color filter which forms the black matrix, that is, the liquid crystal display element, it is preferable to contain the black colorant (D). . Examples of the black colorant (D) include carbon black, aniline black, an anthraquinone black pigment, and an anthraquinone black pigment, specifically as C. I. Color black 1, 6, 7, 12 '20, 31, etc. For example, a mixture of an organic pigment such as a red pigment, a blue pigment, a green pigment, or a methine azo pigment, or an inorganic pigment may be used. The black coloring agent (D) is preferably carbon black in terms of price and shading size, and the carbon black may be subjected to surface treatment using, for example, a resin. Further, in order to adjust the color tone, a blue pigment or a purple pigment may be used in combination. Regarding the black matrix, ON · ARRAY type color filter, or organic EL element, a coating film or a partition wall having a low dielectric constant or high resistance is sought. In order to obtain a coating film or a partition wall as described above, it is preferred to use a mixture of the above organic pigments and a fluorene-based azo black pigment. From the viewpoint of the shape of the black matrix, it is preferred that the carbon black is a specific surface area of 50 to 20 〇 m 2 /g as measured by the BET method. When the specific surface area is 50 m 2 /g or more, the shape of the black matrix is not easily deteriorated. On the other hand, when it is 2 〇〇 m 2 /g or less, the carbon black does not excessively adsorb the dispersing aid. Therefore, it is not necessary to mix a large amount of dispersing aid in order to exhibit physical properties. Further, from the viewpoint of sensitivity, as the carbon black, the oil absorption amount of dibutyl phthalate is preferably 120 cm 3 / 100 g or less, and the smaller the better. 64 201248326 Further, the average primary particle diameter of the carbon black measured by a transmission electron microscope is preferably 20 to 50 nm. When the average primary particle diameter is 20 nm or more, the dispersion can be carried out at a high concentration, and a negative photosensitive resin composition having good stability with time can be easily obtained. When it is 50 nm or less, the shape of the black matrix is not easily deteriorated. Further, the average secondary particle diameter observed by a transmission electron microscope is preferably 80 to 200 nm. When the negative color photosensitive resin composition of the present invention contains a black coloring agent (D) and is used for black matrix formation or the like, the content ratio of the black coloring agent (D) in the negative photosensitive resin composition In the total solid portion of the negative photosensitive resin composition, the black colorant (G) is 15 to 80 mass. /. Preferably, 20 to 70% by mass is preferred, and 25 to 65% by mass is particularly preferred. When it is in the above range, the sensitivity of the negative photosensitive resin composition obtained is good, and the barrier rib formed by the barrier is excellent. [Polymer dispersing agent (E)] When the dispersible material such as the black coloring agent (D) is contained, the polymer dispersing agent (E) is preferably a polymer dispersing agent (E). The polymer dispersant (E) is not particularly limited, and examples thereof include urethane type, polyimide type, alkyd type, epoxy type, polyester type, melamine type, phenol type, and acrylonitrile type. A polyether system, a vaporized ethylene system, a vaporized ethylene vinyl acetate copolymerization system, a polyamidamide system, a polycarbonate system, etc., preferably an amine phthalate type or a polyester type. Further, the polymer dispersant (E) may have a constituent unit derived from ethylene oxide and/or propylene oxide. In the case where the polymer dispersant (E) is used to disperse the black colorant (G), the affinity for the black colorant (D) is considered, and it is preferable to use the base group 65 201248326 polymer dispersant (E) By. The basic group is not particularly limited, and may be exemplified by a grade 1, a grade 2 or a grade 3 amine group. Commercially available products can also be used as the polymer dispersant (E). Commercial products can be exemplified by DISPARLON DA-7301 (trade name, manufactured by Nanben Chemical Co., Ltd.), b YK161, BYK162, BYK163, BYK182 (all of which are trade names, B YK-CHEMIE company), SOLSPERSE 5000, SOLSPERSEi 7〇00 ( All of the above are trade names, manufactured by Zeneca Corporation, etc. The amount of the polymer dispersant (E) to be used is preferably 5 to 30% by mass, more preferably 10 to 25% by mass based on the black colorant (D). When the amount of use is at least the lower limit of the above range, the dispersibility of the black colorant (G) is improved. When the amount is less than or equal to the upper limit of the above range, the developability of the negative photosensitive resin composition is good. [Dispersing aid (F)] The negative photosensitive resin composition may contain a phthalocyanine pigment derivative or a metal phthalocyanine sulfonamide compound in terms of the dispersing aid (F). The dispersing aid (F) has a function of adsorbing a dispersible material such as a black coloring agent and a high molecular dispersing agent (E) to enhance dispersion stability. [Crosslinking Agent (G)] The negative photosensitive resin composition of the present invention may contain a crosslinking agent (G) as an optional component for promoting radical hardening. The crosslinking agent (G) is preferably a compound having two or more ethylenic double bonds in the oxime and having no acidic group. By including the crosslinking agent (G) in the negative photosensitive resin composition, the curability of the alkali-soluble resin (C) at the time of exposure can be improved, and the amount of exposure at the time of forming the partition walls can be reduced. 1 66 201248326 A crosslinking agent (G) having two or more ethylenic double bonds in one molecule and having no acidic group is not particularly limited as long as it is a compound having such a condition, and examples thereof include diethylene glycol. Di(meth)acrylic acid vinegar, tetraethylene glycol di(meth) acrylate, tripropylene glycol bis(indenyl) acrylate, neopentyl glycol bis(indenyl) acrylate, 1,9- Decanediol bis(indenyl) acrylate, trimethylolpropane tris(decyl) acrylate, pentaerythritol tris(decyl) acrylate, pentaerythritol tetrakis(meth) acrylate, two or three Hydroxymethylpropane tetrakis(meth)acrylate, dipentaerythritol penta(meth)acrylate dipentaerythritol hexa(meth)acrylate, ethoxylated trimeric isocyanate triacrylate, ε-Caprolactone modified tris-(2-propenyl oxiranyl) trimeric isocyanate, bis{4-(allylbicyclo[2. 2. 1]hept-5-ene-2,3-dicarboxy quinone imine)phenyl}decane, fluorene, fluorene 1-inter-extension thiol-bis(allylbicyclo[2. 2. 1] hept-5-ene-2,3-dicarboxy quinimine), ethyl citrate acrylate, and the like. These may be used alone or in combination of two or more. A commercially available product can be used as the crosslinking agent (G). Commercially available products include, for example, KAYARAD DPHA (trade name, manufactured by Nippon Kayaku Co., Ltd., a mixture of dipentaerythritol pentaacrylate and dipentaerythritol hexaacrylate); NK ESTER A-9530 (trade name, new a mixture of dipentaerythritol pentaacrylate and dipentaerythritol hexaacrylate, manufactured by Nakamura Chemical Industry Co., Ltd.); V#802 (trade name, Osaka Organic Chemical Industry Co., Ltd., dipentaerythritol acrylate vinegar, a mixture of dipentaerythritol acrylate and tetrapentaerythritol acrylate), NK ester A-9300 (trade name, manufactured by Shin-Nakamura Chemical Industry Co., Ltd., ethoxylated trimeric isocyanate triacrylate); NK ESTERA- 9300-1CL (trade name, manufactured by Shin-Nakamura Chemical Industry Co., Ltd., ε-caprolactone modified tris-(2-propenyl oxiranyl) trimeric isocyanate); ΒΑΝΙ-Μ (trade name, manufactured by Jiushan Petrochemical Co., Ltd.) , bis (4_(dihydropropyl 67 201248326 bisbicyclo[2·2·1]hept-5-ene-2,3-dicarboxy quinone imine)phenyl}methane); and BANI-X (trade name, Maruzen Oil Chemical system, ν, ν · - m-extension thiol-bis (allyl bicyclo [2. 2. 1] Hept-5-ene-2,3-dicarboxy quinone imine)) and the like. The urethane acrylate can be exemplified by the KAYARAD UX series manufactured by Nippon Kayaku Co., Ltd. The specific trade names can be exemplified by: UX-3204, UX-61 (H, UX-0937, DPHA-40H 'UX-5000, UX -5002D-P20, etc. Among them, KAYARAD DPHA and NK ESTER A-9530 are preferred because they can improve the sensitivity of the cured film obtained from the negative photosensitive resin composition. NK ESTER A-9300, BANI-M and BANI-X is preferred from the viewpoint of imparting hardness to the cured film and suppressing thermal collapse. NK ESTER A-9300-1CL is preferred from the viewpoint of imparting flexibility to the cured film. The ester is preferable because it can realize an appropriate development time and has good developability. The content ratio of the crosslinking agent (G) in the negative photosensitive resin composition of the present invention is the total of the negative photosensitive resin composition. In the solid portion, it is preferably 3 to 3 Å by mass, preferably 5 to 20% by mass, and preferably 7 to 15% by mass. If it is in the above range, the alkali developability of the negative photosensitive resin composition may be [Solvent (H)] The negative photosensitive resin composition of the present invention contains a solvent (H) as needed. When the solvent (H) is contained, the viscosity of the negative photosensitive resin composition is lowered, and the coating of the negative photosensitive resin composition on the substrate is facilitated. A uniform negative photosensitive resin composition coating film can be formed. When the negative photosensitive resin composition contains no solvent (H), the coating film of the negative photosensitive resin composition, that is, the film of the negative photosensitive resin composition is the same as 68 201248326. The solvent (Η) contained in the negative photosensitive resin composition of the present invention can be used as the above-mentioned ink repellent (Α), photopolymerization initiator (Β), and alkali solubility in the negative photosensitive resin composition. Resin (〇, if necessary, black colorant (D), polymer dispersant (Ε), dispersing aid (F), and cross-linking agent (G), even if any of the components described later are uniformly dissolved or dispersed' and have a negative The solvent of the photosensitive resin composition is uniform and simple to the coating of the substrate to be formed, and the solvent is not particularly limited, and the solvent can be used, for example, in combination with a synthetic ink (Α). The solvent used in the same solvent. Negative photosensitive resin The content ratio of the solvent (Η) contained in the product varies depending on the composition or use of the negative photosensitive resin composition, and the negative photosensitive resin composition is preferably mixed with 50 to 99 mass%. It is preferably 6 to 95% by mass, more preferably 65 to 90% by mass. The negative photosensitive resin composition of the present invention contains an ink-repellent agent, a photopolymerization initiator (yttrium), and an alkali-soluble resin. (C), and if necessary, contain a black colorant 〇D), a polymer dispersant (Ε), a dispersing aid (f), a crosslinking agent (g), and a solvent (H), and may also contain the following heat A coupling agent (1), a decane coupling agent (j), a fine particle (K), an acid-filling compound (L), and other additives. [Thermal Crosslinking Agent (I)] The thermal crosslinking agent (1) is a compound having two or more groups capable of reacting with a carboxyl group and/or a hydroxyl group. When the soluble resin (B) has a carboxyl group and/or a hydroxyl group, the hot-parent (I) reacts with the alkali-soluble resin (B) to increase the crosslinking density of the cured film and improve heat resistance. effect. The thermal crosslinking agent (1) is preferably selected from the group consisting of an amine resin, a ring 69 201248326 oxygen compound, an oxazoline compound, a polyisocyanate compound, and a polycarbodiimide compound. One kind. These compounds may be used singly or in combination of two or more. The content ratio of the thermal crosslinking agent (F) in the negative photosensitive resin composition of the present invention is preferably 50 mass%/〇 in the total solid portion of the negative photosensitive resin composition, and 5 to 30 mass. % is better. When it is in the above range, the developability of the resulting negative photosensitive resin composition is good. [Centane Coupling Agent (J)] When the decane coupling agent (J) is used, the substrate adhesion of the cured film formed of the obtained negative photosensitive resin composition is improved. Specific examples of the decane coupling agent (J) include, for example, tetraethoxy decane, 3-glycidoxypropyltrimethoxy oxalate, decyltrimethoxy sulphur, and vinyltrimethoxy. Decane, 3-methacryloxypropyltrimethoxy decane, 3-apropylpropyltrimethoxy decane, 3-thiolpropyltrimethoxydecane, 3-aminopropyltriethoxylate Base decane, heptafluorooctylethyltrimethoxy decane, triethoxy decane containing a polyoxyalkylene chain, and the like. These may be used alone or in combination of two or more. Commercially available products can be used as the cockroach coupling agent (J). Commercially available products include KBM5013 (trade name, Shin-Etsu Chemical Co., Ltd., 3_acryloxypropyltrimethoxydecane). The content ratio of the decane coupling agent (j) in the negative photosensitive composition of the present invention is preferably 〇 1 to 2 〇 in the total solid portion of the negative photosensitive resin composition. /. Very good for 1 to 10% by mass. When it is more than the lower limit of the above range, the hardening_substrate adhesion formed by the negative photosensitive resin composition is increased by 70 201248326, and if it is _ or less of the above range, the ink repellency is good. [Microparticle (κ)] + Negative photosensitive resin composition may contain fine particles (κ) as needed. It is possible to prevent thermal collapse of the partition wall obtained by the negative photosensitive resin composition by 4 plantings. The fine particles (Κ) are not particularly limited, and examples thereof include: oxidized oxidized stone, oxidized cone, magnesia, and indium doped tin oxide, inorganic fine particles such as tin oxide (ΑΤ0), polyethylene, polymethyl propylene In the case of organic fine particles such as dilute acid vinegar (ΡΜ祖), it is preferable to use inorganic fine particles when heat resistance is used. If oxygen transfer or dispersion stability is taken into consideration, oxygen cut or oxidation error is preferable. In the case where the negative photosensitive resin composition contains a black coloring agent (6) and a polymer dispersing agent (Η), the amount of fine particles (Κ) of the polymer dispersing agent (Η) is considered. New Zealand. Further, in consideration of the exposure sensitivity of the 贞-type photosensitive resin composition, the fine particles are preferably such that they do not absorb the illuminating light during exposure, and do not absorb the main illuminating wavelength of the ultrahigh pressure mercury lamp... 'ray (365 nm), Η Radiation (persuasion (4), G-ray (436 nm) is preferred. Microparticles (K) are preferred for silica dioxide. Separate silica dioxide is preferred for colloidal cerium oxide. In general, as colloidal cerium oxide. There are two organic bismuth sols which are dispersed in water and dissolved in water, and organic sols which are organically dissolved in water, but it is preferably used as an organic solvent as a dispersing medium. As an organic cerium oxide sol, commercially available products can be used as follows, and any of them is a product name of PMA-ST manufactured by Nissan Chemical Industries Co., Ltd. (dioxy-cut size·1Q~2Gnm, dioxane) Cut solid portion ^ 71 201248326 Quality: %, propylene glycol monodecyl acetate: 70% by mass), Npc ST (cerium dioxide particle size: 10 to 20 nm, cerium oxide solid portion: 3 〇 mass%, positive C Kisei Lusu: 70% by mass.), IPA-ST (cerium dioxide particle size: 1〇~2 Nm, cerium oxide solid portion: 30% by mass '1 卩 8: 7 〇 mass, etc. The content ratio of fine particles (κ) in the negative photosensitive resin composition of the present invention, the total solid state of the negative photosensitive resin composition In the part, it is preferably 3 to 4% by mass, more preferably 5 to 30% by mass, and most preferably 7% by mass or more and less than 25% by mass. If the content ratio is in the above range, the ink repellent property is good, and negative. The storage stability of the photosensitive resin composition is good. [Phosphate Compound (L)] The negative photosensitive resin composition of the present invention may contain a phthalic acid compound (L) as needed. By forming a negative photosensitive resin The compound containing the phosphoric acid compound (L)' can improve the adhesion to the substrate. As the phosphoric acid compound (L), mono (meth) acryloxyethyl phosphate, bis(indenyl) propylene oxy group B can be mentioned. Phosphate, tris(methyl) propylene methoxyethyl phosphate, etc. [Other Additives] The negative photosensitive resin composition of the present invention may further contain a hardening accelerator, a tackifier, a plasticizer, or Defoamer, leveling agent, anti-cratering agent, UV absorption [Appropriate Combination of Negative Photosensitive Resin Composition] The negative photosensitive resin composition of the present invention preferably has a composition and a blend ratio in accordance with the use or desired characteristics. The negative photosensitive resin composition of the present invention is various. The preferred composition of the blending component is as follows: 72 201248326 Ink-repellent (A): a suitable combination of the above-mentioned ink-repellent (A1) 丨 5 or a suitable combination of the above-mentioned ink-repellent (A2) 6 to 10, The total solid portion of the negative photosensitive resin composition is 〇. 〇1 to 10% by mass, the photopolymerization initiator (B): Compound No. 1-58 to 58 in the International Publication No. 2008/078678, which is 0 in the total solid portion of the negative photosensitive resin composition. 01 ~ 10 quality. /〇, alkali-soluble resin (C): a group of resins in which an acidic group and an ethylenic double bond are introduced in (Cl-2a), (Cl-2b), (Cl-2c) and an anthraquinone novolac type epoxy resin. At least one of the groups is 12 to 40% by mass in the total solid portion of the negative photosensitive resin composition, and the solvent (H): 2-propanol, butyrolactone, 3-methoxybutyl acetate At least 1 group consisting of diethylene glycol didecyl ether, diethylene glycol ethyl methyl ether, dipropylene glycol didecyl ether, propylene glycol monomethyl ether hexanoate, cyclohexanone, and butyl lactate The amount is 50 to 99% by mass in the negative photosensitive resin composition. [Manufacturing Method of Negative Photosensitive Resin Composition] A method of producing a negative photosensitive resin composition is an ink repellent (A), a photopolymerization initiator (B), an alkali soluble resin (C), and optionally Black coloring agent (D), polymer dispersing agent (E), dispersing aid (F), crosslinking agent (G), and solvent (E), and further, mixing the following thermal crosslinking agent (I), decane coupling agent The method of (J), fine particles (K), phosphoric acid compound (L) and other additive phases is preferred. The negative photosensitive resin composition of the present invention is a general negative photosensitive composition, and can be used as a material such as photolithography, and the cured film obtained by curing the composition coating film can be used as a general negative. Type photosensitive tree 73 201248326 Optical element member used for the cured film of the fat composition. [Manufacturing Method of Partition for Optical Element] It is applied to a partition wall for an optical element having a plurality of pixels on a substrate and a partition wall between adjacent pixels. The negative photosensitive resin composition of the present invention is applied onto the substrate to form a coating film (coating sand); then, the heating is performed (pre-compensation step); then, the coating film is simply formed as a partition wall. a part of which is subjected to exposure to be photohardened (exposure step); then, the coating film other than the photohardenable portion is removed, and (4) a partition wall composed of the photocured portion of the coating film (development step); The partition wall which has been formed is subjected to heating (post-baking step), whereby the partition wall for the optical element can be produced. Further, when the negative photosensitive resin composition of the present invention contains a black coloring agent (D), the partition walls for optical elements are formed of a black matrix. The material of the substrate is not particularly limited, and for example, various glass plates can be used; polyacetic acid (polypyrene diacetate, etc.), poly (polyethylene, polypropylene, etc.), polycarbonate, polymethyl methacrylate Thermoplastic plastic sheets such as acid methyl vinegar, poly-milling, poly-imine, poly(methyl) acryl resin; hardened sheets of thermosetting wax such as epoxy resin and unsaturated polyester. In particular, based on heat resistance, a heat-resistant plastic such as a glass plate or a polyacrylonitrile is preferred. Fig. 1 is a cross-sectional view showing a manufacturing example of a partition for an optical element using the negative photosensitive resin composition of the present invention. Fig. 1(1) is a front view showing a state in which the coating film 2 composed of the negative photosensitive resin composition of the present invention is formed on the substrate 1. The first (11) diagram schematically shows a diagram of the exposure step. The first ι(πι) diagram shows a cross-sectional view of the substrate 后 after the development step and the partition wall 6 74 201248326 formed on the substrate. Hereinafter, a method for producing a partition for an optical element using the negative photosensitive resin composition of the present invention will be specifically described with reference to Fig. 1 . (Coating film forming step) As shown in the cross section of Fig. 1 (1), the negative photosensitive composition of the present invention is applied onto the substrate ' to form a negative photosensitive resin composition. Coating film 2° X 'Before forming the coating film 2 of the negative (tetra) photoresin composition on the substrate 1 'It is preferable to first wash the coated surface of the substrate with the negative photosensitive material composition by alcohol or ultraviolet/ozone In the method of applying the method of washing, etc., the coating method of the photosensitive resin composition is not particularly limited as long as it is a uniform coating method, and examples thereof include spin coating, spray coating, and narrow coating. A method for forming a general coating film such as a slit coating method, a roll coating method, a spin coating method, or a bar coating method. The film thickness of the coating film 2 is determined in consideration of the height of the partition wall finally obtained. The film # of the coating film 2 is preferably 100 to 3,000 Å/〇, preferably 100 to 2,000%, of the height of the finally obtained partition wall. 3~65μιη especially good. The film thickness of the coating film 2 is preferably 〇 3 to 325 μηι (pre-baking step): in the above-described forming step, M4 is formed on the substrate i, and the film J is obtained. By this heating, the negative photosensitive tree constituting the coating film 2 ==? The _ component will evaporate 'removal and get closer. Heated film. In addition, the 'inking agent (A) migrates to the surface of the coating film. The method is, for example, heating the substrate 1 and the _2- using a hot plate such as a 75 201248326, an oven, etc., and applying 50 to 120 ° C and A method of heat treatment for about 10 to 2,000 seconds. Further, as described above, the volatile component such as a solvent may be removed by heating in the prebaking step, but a drying step such as vacuum drying other than heating (drying) may be additionally provided before the prebaking step to remove volatile components such as a solvent. Further, in order not to cause unevenness in the appearance of the coating film and to perform drying efficiently, it is more preferable to use a combination of the drying function performed by the pre-baking step and vacuum drying. The conditions for vacuum drying vary depending on the type of each component, the blending ratio, and the like, and are preferably carried out in a wide range of about 500 to 10 Pa and about 10 to 300 seconds. (Exposure step) As shown in Fig. 1 (11), the light 5 is irradiated to the film 2 through the mask 4 of a predetermined pattern. The light 5 penetrates only the predetermined pattern portion of the gap of the above-mentioned mask 4 and reaches the film on the substrate 1, and only this portion is photohardened. Therefore, when the partition wall is formed, the shape of the predetermined pattern is appropriately designed into the shape of the partition wall. For example, after the post-baking step, the width of the partition walls is preferably ΙΟΟμηι or less, and preferably 20 μΓη or less. Further, the distance between the adjacent partition walls is preferably 500 μm or less on average, and preferably 300 μηη or less. The mask to be used is preferably constructed so that the pattern can be formed in the above range. In the first (11) diagram, the exposed portion 3 of the light-irradiated film is composed of a cured film of a negative photosensitive resin composition; on the other hand, the unexposed portion is composed of an uncured negative photosensitive resin. The state in which the film 2 itself remains. The irradiated light 5 may be, for example, visible light; ultraviolet light; far ultraviolet light; KrF excimer laser, ArF excimer laser, F2 excimer laser, Kr2 quasi-segment 76 201248326 sub-laser, KrAr excimer laser, Excimer lasers such as μ excimer lasers; X-rays, electron beams, etc. X, the illumination light 5 is preferably an electromagnetic wave having a wavelength of 1 〇〇 to 6 〇〇 nm, preferably having a light distribution in the range of 3 〇〇 to 5 〇〇 nm, i-ray (365 nm), h-ray (405 nm). ), g-ray (436nm) is especially good. Further, in the case of, for example, a mirror projection type (MPA) exposure method, electromagnetic waves of 330 nm or less are turned off to illuminate the exposure light. As described above, in the production method of the present invention, exposure to an electromagnetic wave of 330 nm or less can be performed as needed. As the irradiation device, a known ultrahigh pressure mercury lamp or a deep ultraviolet lamp or the like can be used. The amount of exposure is preferably 5 to 1 based on the twist line in the case where the electromagnetic wave of 33 〇 nm or less is cut off by a cut-off waver or the like, preferably 5 to 2 (K) mj/cm 2 and preferably 10 100 mJ/cm. More preferably, 15~5〇mJ/cm2 is especially good. When the amount of exposure is at least the lower limit of the above range, the 感光-type photosensitive resin composition which is a partition wall is sufficiently hardened to be dissolved or peeled off from the substrate i during subsequent development. When the right is below the upper limit of the above range, high resolution can be obtained. The surface of the cured film obtained by the f-type negative photosensitive resin composition is particularly excellent in the ink repellency even when the electromagnetic wave of 33 Å or less is cut off by a cut-off ferrite or the like. ★The light time is preferably based on the exposure amount, the composition of the photosensitive composition for the negative type, the thickness of the coating film, etc., preferably 5 to 20 seconds. (Developing Step) Development was carried out using a developing solution to remove the unexposed 2 on the substrate 1 shown in Fig. 1 (11). Thus, the structure of the first plate 1 and the M6 as shown in the cross-sectional view of Fig. 1 (111) is obtained, which is formed of a cured film of a negative photosensitive material 77 201248326 resin composition on the substrate. Further, the partition wall 6 and the substrate [the portion surrounded by the ink are injected by ink or the like to form a portion of the pixel which is called the dot matrix 7. The obtained substrate 10 is subjected to a post-baking step which will be described later, and is used as a substrate for producing an optical element by an ink jet method. As the developer, an aqueous solution containing an alkali such as an inorganic base, an amine, an alcohol amine or a quaternary salt can be used. Further, in order to improve the solubility and remove the residue in the developer, an organic solvent such as a surfactant or an alcohol may be added. The development time (the time for bringing the developer into contact) is preferably 5 to 180 seconds. Further, the developing method may, for example, be a flooding method, a dip coating method, a shower method or the like. After development, the substrate crucible and the moisture on the partition wall 6 can be removed by performing high-pressure water washing or running water washing and air-drying with compressed air or compressed nitrogen. Further, the film thickness of the cured film which is a part of the partition wall before and after the development step is preferably 60 nm or less, more preferably 5 Å, and particularly preferably 45 nm or less. When the film thickness is changed to 60 nm or less, the ink-repellent layer for exhibiting the ink-repellent property of the surface of the cured film after the exposure sufficiently remains on the surface, and the ink-repellent property of the cured film after the post-baking becomes good. (Post-baking step) The partition wall 6 on the substrate 1 is heated. The method of heating is, for example, a method in which the substrate 1' and the barrier 6 are heated by a heating means such as a hot plate or an oven to perform a heat treatment of 15 〇 to 250 C 5 90 knives. By this heat treatment, the partition wall 6 composed of the cured film of the negative photosensitive resin composition on the substrate is further hardened, and the shape of the dot matrix 7 surrounded by the partition wall 6 and the substrate is also fixed. In addition, it is preferable to treat the heating temperature at 180 ° C or higher. If the heating degree is too low, the hardening of the partition wall 6 is insufficient, and sufficient resistance cannot be obtained, and in the subsequent ink-jet coating step, when the ink is injected into the dot matrix 7, there is a fear that the ink is printed in the dot matrix 7. The solvent contained in the solvent causes the partition wall 6 to swell or the ink to ooze out. On the other hand, if the heating temperature is over the surface, there is a possibility that the partition wall 6 may thermally decompose. In the negative photosensitive resin composition of the present invention, the average width of the partition walls is preferably 1 μm or less, more preferably 20 μπ 1 Η, and the average distance between the adjacent partition walls (dot array width) is 500 μm or less. Good, 3〇〇μιη is very good. Also, the average height of the partition wall is 0. 05~50μιη is better, 〇. 2~1〇μιη especially good. The ink of the cured film of the coating film formed by the negative photosensitive resin composition of the present invention can be estimated from the contact angle of water and propanol 1 _ monomethyl _ 2 - acetate (hereinafter also referred to as PGMEA). The contact angle of water is preferably 90 degrees or more, and more preferably 95 degrees or more. Further, the contact angle of PGMEA is preferably 30 degrees or more, more preferably 35 degrees or more, and still more preferably 40 degrees or more. The ink repellency of the film-hardened film is preferably 90 degrees or more with respect to water and a contact angle of PGOEA of 30 degrees or more. [Manufacturing Method of Optical Element] After the partition wall is formed on the substrate by the above-described manufacturing method, the ink-repellent treatment is performed on the surface of the substrate and the substrate of the spacer package (the ink-printing process step); Next, the ink is injected into the above region by an inkjet method to form the aforementioned pixel (ink injection step). Further, in the manufacture of the optical element, the step of the ink-printing process is not an essential step, and the optical element to be manufactured may not be performed. (Phi-inking treatment step) The method of the ink-removing treatment may be, for example, a washing treatment by an aqueous solution, a treatment of impurities, a UV treatment, a treatment of excimer 79 201248326, and a treatment. Halo discharge treatment, oxygen I * milk plasma treatment and other methods. The washing place by the aqueous alkali solution is washed with an alkali aqueous solution (potassium hydroxide, tetramethyl hydroxide, etc.) to clean the substrate. The ultraviolet cleaning treatment is a dry treatment in which the surface of the substrate is washed with ultraviolet rays. UV/Ozone cleaning treatment, you use the dry treatment of the surface of the substrate with a low-pressure mercury lamp emitting 185nm and 254nm light. Excimer washing treatment is based on the use of Erli net substrate for mosquito dryness. The illusion of 72nm light Μ molecular lamp wash corona discharge treatment, the use of, the 颂 voltage, so that the corona discharge in the atmosphere, the surface of the substrate is washed by the dry treatment oxygen polymerization, mainly used in the trigger The oxygen is excited, and the anti-coupling power source is formed as the conformation_"electric t state", and it is used to check the surface of the substrate. In terms of simplicity, in terms of simplicity, the hinged UV/money wash material dry core method = better commercially available device to produce. In the case of potential ice and odor, the substrate placed inside the Μ external line/ozone device can be used in the air at room temperature, K1. In about minutes, the oil is drained (4) in the next door, so that it can be handled. In addition, it is only necessary to adjust the temperature of the 睥Μ Ρ Ρ 不会 不会 不会 不会 、 、 、 、 、 、 、 、 、 、 、 、 、 、 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 By performing the ink-printing process, it is possible to prevent the formation of impurities remaining in the lattice, and thus it is possible to prevent the color display device 80 of the optical element for the printed ink which can sufficiently achieve the dot matrix. White speckle phenomenon. (Ink Injecting Step) This is a step of forming a pixel by using ink in the dot matrix after the step of the ink-printing process. This step can be carried out by using an ink jet for blasting, and is carried out in a conventional manner. Such a pixel shape==the ink jet device to be used is not particularly limited, and a method in which the ink is continuously ejected and controlled by a magnetic field, a method of intermittently printing the ink, and heating the ink can be used. _ The shirt is foamed and intermittently sprayed out of the various methods of the ink device. The optical element produced by using the negative photosensitive resin composition of the present invention may, for example, be a color filter, an organic rainbow display element, or an organic tft: column. [Manufacturing of Color Filter] The formation of the partition walls, the dot-inking ink treatment of the dot matrix, and the ink jetting by the ink jet method are as described above. In the color filter, the pixel shape to be formed may be any known arrangement such as a stripe type, a mosaic type, or a triangular type '4-pixel arrangement type. The ink used for pixel formation mainly contains a coloring component, a binder resin component, and a solvent. The coloring component is preferably a pigment or a dye which is excellent in heat resistance and light resistance. The resin component of the binder is preferably a resin which is transparent and excellent in heat resistance, and examples thereof include an acrylic resin, a melamine resin, and an amine formic acid S resin. The water-based ink contains water as a solvent and, if necessary, water, a gluten-based organic solvent, and contains a water-soluble resin or a water-dispersible resin as a binder resin component, and optionally contains various auxiliary agents. Further, 'Oilability 81 201248326 Ink contains an organic solvent as a solvent, and contains a resin which is soluble in an organic solvent as a binder resin component, and optionally contains various auxiliary agents. Further, after the ink is injected by the ink jet method, it is preferred to perform drying, heat curing, and ultraviolet curing as needed. After the formation of the pixel, a protective film layer is formed as needed. The protective film layer is preferably formed for the purpose of improving the flatness of the surface and preventing the ink eluate from the partition wall or the pixel portion from reaching the liquid crystal layer. In the case where a protective film layer is formed, it is preferable to remove the ink repellency of the partition wall in advance. If the ink-repellent property is not removed, the protective coating liquid is repelled, and the uniform film thickness cannot be obtained, so it is preferable to avoid it. The method of removing the ink repellency of the partition wall may be a laser ashing process or a light ashing process. Further, as needed, in order to optimize the quality of the liquid crystal panel obtained by using the color filter, a photo spacer should be formed on the black matrix composed of the partition walls. [Production of Organic EL Display Element] Before forming the partition walls, a transparent electrode such as silver-doped indium oxide (IT〇) is formed on a transparent substrate such as glass by a money ore method, and a transparent electrode is formed as needed. Etching is a pattern of hope. Next, the negative photosensitive resin composition of the present invention is used to form a partition wall, and after the ink-printing process of the dot matrix is performed, the solution of the hole transport material and the light-emitting material is sequentially applied to the dot matrix by an inkjet method. Drying forms a hole transport layer and a light-emitting layer. Thereafter, an electrode such as aluminum is formed by an evaporation method or the like to obtain a pixel of the organic EL display element. [Manufacture of Organic TFT Array] 82 201248326 An organic tft array can be manufactured through the following steps (i) to (in). (1) On the _ etc. flip the substrate on the hair" _ light resin electricity ° °. After the ink-repellent treatment of _, use the inkjet method, right. The gate electrode is formed by coating the solution of the electrode material between the electrodes. (8) After the idle electrode is formed, the gate insulating film is formed thereon. After using the Shuming negative photosensitive resin composition to form a partitioning treatment on the gate ', 'Using the inkjet method for the ~ 极 electrode (4) solution (4), (4) «极•秘电极" (4) in the source of the secret After the electrode is formed, the negative photosensitive resin composition of the present invention is used to form a partition wall to surround the region covering the source and the electrodeless electrode, and after performing the inking treatment of the dot matrix, the dot matrix is subjected to the organic semiconductor solution. The coating is performed such that an organic semiconductor layer is formed between the source and drain electrodes. Further, in the '(i) to (iii)', the partition wall to which the negative photosensitive resin composition of the present invention has been used may be used only in the step i, or the negative type of the present invention may be used in two or more steps. The partition wall of the photosensitive resin composition. [Manufacture of Organic EL Lighting Element] This can be produced in the same manner as the production of an organic EL display element. The luminescent layer can be formed by laminating an illuminant of various colors such as red, green, and blue by inkjet, or the illuminant can be applied to a flat surface. EXAMPLES Hereinafter, the present invention will be described in further detail by way of the examples, but the invention should not be construed as limited. Further, the examples ~21 are examples, and the examples 31 to 33 are comparative examples. 83 201248326 Each measurement was performed by the following method. The number average molecular weight (??) is determined by gel permeation chromatography using polystyrene as a standard substance. The content ratio of fluorine atoms in the ink-repellent (Α) was determined by 19F NMR measurement using 1,4-ditrifluoromethylbenzene as a standard material. The amount of the ethylenic double bond in the ink-repellent (Α) was determined by 1H NMR measurement using 1,4-ditrifluoromethylbenzene as a standard material. The acid value (mgKOH/g) and the number of ethylenic double bonds in one molecule are theoretically determined from the blending ratio of the raw materials. The compounds used in the synthesis examples and the examples are abbreviated as follows. (Compound for the synthesis of ink-repellent (A1)) MEK: 2-butanone. C6FMA : CH2 = C(CH3)COOCH2CH2(CF2)6F. MAA: methacrylic acid. MMA: methyl methacrylate. PME400 : BLEMMER PME-400 (manufactured by 曰本油月株式会社. α-Mercapto-ω-methacryloxyloxypoly(oxyethylene). CH2 = C(CH3)C00(CH2CH20)kCH3: k in the formula Indicates the intermolecular mean enthalpy, k 値 is about 9). PME1000 : BLEMMER PME-1000 (manufactured by Nippon Oil & Fats Co., Ltd. α-methyl-ω-methacryloxyloxypoly(oxyethylene). CH2 = C(CH3)C00(CH2CH20)kCH3: where k represents intermolecular The average 値, k値 is 23).乂-65: Trade name (made by Wako Pure Chemical Industries, Ltd. 2,2'-azobis (2,4-dimercapto 84 201248326 valeronitrile.)). 2-HEMA: 2-hydroxyethyl methacrylate. GMA: glycidyl methacrylate. AOI: 2-propenyloxyethyl isocyanate (manufactured by Showa Denko Co., Ltd., trade name: Karenz AOI.). DBTDL · Dibutyltin dilaurin vinegar. TBQ: tertiary butyl-p-benzoquinone. (Compound for the synthesis of the ink-repellent (A2)) Compound (a7-l): CF3(CF2)5CH2CH2Si(OCH3)3 (manufactured by Asahi Glass Co., Ltd.). Compound (a8-1): Si(0C2H5)4 (C0LC0AT). Compound (a9-l): CH2 = CHCOO(CH2)3Si(OCH3)3 (manufactured by Tokyo Chemical Industry Co., Ltd.). TMMS: trif-methoxy methoxy sulphate [(Yang Cheng (1) Yangchong Tokyo Chemical Industry Co., Ltd.). PGME: propylene glycol monothiol bond. PGMEA: propylene glycol monomethyl hydrazine acetate. (Photopolymerization initiator (B)) The above compounds Νο·1~3, compound No. 7. Compound Ν〇 ι〇, compound NCU2, compound No. 20. Compound Ν〇·33, compound n〇 each compound Νο·53~58. (Photopolymerization initiator other than photopolymerization initiator (Β)) ΟΧΕ02 : B _ (ethanone) i_r〇-, „ 1 A hexyl _6·(2_methylbenzoinyl)-9Η-carbazole oxime _3-基]-1-(0-乙制社G 醯基)(Ciba Specialty 85 201248326

Chemicals社製、商品名:OXE02)。 IR907 :商品名;IRGACURE907、BASF社製、2-曱基 -1-[4-(甲基硫)苯基]-2-味。林基丙烧-1-嗣。 EAB : 4,4’-雙(二乙基胺基)二苯基酮(東京化成工業社 製)。 (鹼可溶性樹脂(C)) EX1010:於以上式(Cl-2b)表示之環氧樹脂導入乙烯性 雙鍵與酸性基之樹脂(Nagase chemteX社製、商品名: EX-1010。固態部分:60質量%、PGMEA : 40質量%。)。 ZCR1761 :於以上式(Cl-2a)表示之具有聯苯基骨架之 環氧樹脂導入乙烯性雙鍵與酸性基之樹脂(日本化藥社 製、商品名:ZCR-1761H。固態部分:60質量%、PGMEA : 40質量%。)。 ZCR1642 :於以上式(ci-2a)表示之具有聯苯基骨架之 環氧樹脂導入乙烯性雙鍵與酸性基之樹脂(日本化藥社 製、商品名:ZCR-1642H。固態部分:60質量%、PGMEA : 40質量%)。 C-1:使甲盼酚醛清漆型環氧樹脂與丙烯酸繼之丨,2,3,6-四氫敌酸針反應而導入丙烯醯基與羧基之樹脂,將該樹脂 以已烷純化而得之樹脂,固態部分70〇/〇、酸價6〇mgKOH/g、 PGMEA : 30質量%。 ZAR2002 :商品名;KAYARAD ZAR-2002、日本化 藥社製’於雙酴A型環氧樹脂導入羧基與乙烯性雙鍵之樹 脂、固態部分70%、酸價6〇mgK〇H/g、PGMEA : 3〇質量%。 86 201248326 (黑色著色劑(D)) CB :碳黑分散液(平均2次粒徑:120nm、碳黑:20質 量%、胺價18mgKOH/g之聚胺曱酸酯系高分子分散劑:5質 量%、PGMEA : 75 質量°/。)。 混合有機顏料:C.I. Pigment Blue 156、C.I. Pigment red 254、C.I. Pigment yellow 139及高分子分散劑之l〇 : 5 : 5 : 5之混合物(固態部分:25質量%、PGMEA : 75質量%)。 (交聯劑(G)) UX5002:多官能胺曱酸酯丙烯酸酯寡聚物(日本化藥社 製、商品名:KAYARAD UX-5002D-P20。固態部分:80 質量%、PGMEA : 20 質量%)。 A9300CL : ε-己内酯改質叁·(2-丙烯醯氧基乙基)異三 聚異氰酸酯(新中村化學工業社製、商品名:NK ESTER A-9300-1CL)。 A9530:二新戊四醇六丙烯酸酯與二新戊四醇五丙烯酸 酯之混合品(新中村化學工業社製、商品名:NK ESTER A-9530)。 (溶劑(Η)) PGMEA :丙二醇1-單甲基趟2-乙酸酯。 IPA : 2-丙醇。 (矽烷耦合劑(J)) KBM5013 :商品名(信越化學社製。3_丙烯醯氧基丙基 彡甲氧基矽烷)。 (微粒子(K)) 87 201248326 IPA-ST :商品名(日産化學工業社製。有機二氧化矽凝 膠、固態部分:30質量%、IPA : 70質量%)。 [合成例1 :撥墨劑(A^l)之合成] 於具備攪拌機之内容積1L之高壓釜中置入 MEK(420g)、C6FMA(90g)、MAA(9g)、PME 1000(8 lg)及聚 合起始劑V-65(0.2g),在氮氣中一面攪拌並一面在50°C下使 之24小時聚合,合成粗聚合物。於所獲得之粗聚合物溶液 加入己烷再沉純化後,進行真空乾燥,獲得撥墨劑 (A-l)(158.6g)。撥墨劑(A^l)係數目平均分子量(Μη)為 64,690、質量平均分子量(Mw)為92,270。 [合成例2 :撥墨劑(AL2)之合成] 於具備攪拌機之内容積1L之高壓釜中置入 MEK(420g)、C6FMA(85g)、2-HEMA(50g)、PME400(36g)、 MAA(9g)及聚合起始劑V-65(0.7g),在氮氣中一面攪拌並一 面在50°C下使之24小時聚合,獲得聚合物〇)溶液。 (乙烯性雙鍵之導入) 於具備攪拌機之内容積1L之高壓釜中置入上述聚合物 (1)溶液(500g)、AOI(45.6g) ' DBTDL(0.13g)、TBQ(1.6g)及 MEK(17.1g),一面攪拌並一面在4〇。〇下使之24小時反應, 而於聚合物(1)導入乙烯性雙鍵。於所獲得之溶液中加入己 烷再沉純化後’進行真空乾燥,獲得撥墨劑0^2)(165.0g)。 撥墨劑(八匕2)係數目平均分子量(Μη)為41,200,質量平均分 子量(Mw)為11〇, 800’氟原子含有比率為2〇.6質量%,乙烯 性雙鍵之量(C = C量、66xl0-3m〇1/g,酸價為 88 201248326 25.0mgKOH/g。 [合成例3〜4 :撥墨劑(Ah)及(A1-”之合成] 於撥墨劑(A1-:!)之合成中,將原料之摻混如表1所示變 更,此外藉由同樣的共聚合反應,獲得撥墨劑(AL3)及 (AU)。所獲得之撥墨劑(A1·^)及(AU)之數目平均分子量 (Μη)、質量平均分子量(Mw)、氟原子之含有比率(質量%)、 酸價(mgKOH/g)顯示於表1。 [合成例5 :撥墨劑(A1·^)之合成] 於聚合物(1)之合成中,將原料之摻混如表1所示變更, 此外藉由同樣的共聚合反應,獲得聚合物(2)。在撥墨劑 (A1-〗)之合成中,除了將原料之摻混如表1所示變更之外藉 由同樣的反應,於聚合物(2)導入乙烯性雙鍵,獲得撥墨劑 (A1-〗)。所獲得之撥墨劑(A]-5)之重量平均分子量(Μη)、數 目平均分子量(Mw)、氟原子之含有比率(質量%)、酸價 (mgKOH/g)、乙烯性雙鍵之量(C = C量、xl(T3mol/g)顯示於 表1。 89 201248326 [表i] 描组01 (A1-” (A1-2) (Α'-3) (A1 Η) (A'-5) C6FMA 80 85 99 108 85 MAA 9 9 9 18 9 m PME400 - 36 63 一 36 合 PME1000 81 一 - 一 一 物 2-HEMA — 50 - _ 50 固 盟 QMA - 一 9 18 一 料 MMA — — - 36 一 V-65 02 0.7 0.3 1.9 3 MEK 420 420 420 420 420 聚合物 «含物(1〉 7 500 J 一 这 SI 之溶液 »含物:(2> / — / / 500 AOI / 45.6 / / 45.6 & DBTDL / 0.13 / / 0.13 入 TBQ / 1.6 / / 1.6 MEK 17.1 / 17.1 锒 收串(β) 158.6 165 162.3 160.1 165 Β)目平均分子Β (Μη) 64.690 41,200 64,700 24.470 12.850 之 ttl平均分子1 (Mw) 92.270 110300 94.020 52,830 32,400 睹 物 性 氪臞子含有比单 (霣 fi%) 28>β 20.6 31.4 34.3 20.6 (mgKOH/g) 32.6 25 32.6 6&3 25 C=Cft( X lO^mol/g) 1.66 [合成例6 :撥墨劑(A2-l)之製造] 於具備攪拌機之l,000cm3三口燒瓶中置入化合物 (a7-l)之ll_8g、化合物(a8-l)之29.4g、化合物(a9-l)之29.4g、 TMMS之29.4g ’獲得水解性矽烷化合物混合物。接著,於 該混合物置入PGMEA之564.7g,製成溶液(原料溶液)。 於獲得之原料溶液中,在40。(:下一面攪拌並一面滴下 1.0%鹽酸水溶液52.0g。滴下結束後,在40°C下攪拌5小時, 以PGMEA溶液(撥墨劑(a2])濃度:10質量%。以下,亦稱 「(A2_l)液」)獲得撥墨劑(a2-1)。再者,使用氣相層析法測 定反應液,確認作為原料之各化合物在檢出極限以下。 所獲得之撥墨劑(A2-l)之數目平均分子量(Μη)、質量平 均分子量(Mw)、氟原子之含有比率與撥墨劑(α2-1)之置入 量組成(莫耳%)一倂顯示於表2。 90 201248326 [合成例7 :撥墨劑(A2-2)之製造] 於具備授拌機之1,000cm3三口燒瓶中置入化合物 (a7-l)之 16.7g、化合物(a8-l)之 41.7g、化合物(a9-l)之 41.7g ’獲得水解性矽烷化合物混合物。接著,於該混合物 中置入PGME之564.7g,製成溶液(原料溶液)。 於所獲得之原料溶液在4 0 °C下一面攪拌並一面滴下 1.0°/。硝酸水溶液之65.7g。滴下結束後,在40。(:下攪拌5小 時,以PGME溶液(撥墨劑(A2-2)濃度:10質量%。以下稱 「(A2-2)液」)獲得撥墨劑(A2-2)再者,使用氣相層析法測 定反應液,確認作為原料之各化合物在檢出極限以下。 所獲得之撥墨劑(A2-2)之數目平均分子量(Μη)、質量平 均分子量(Mw)、氟原子含有比率與撥墨劑(Α2-2)之置入量 組成(莫耳%)—倂顯示於表2。 [表2] 撥 墨 劑 置入组成() 溶剤 分子量 氧原子含有 比率(%> (a7-D (a8-1) Ca9-1) TMMS 教目平均 分子莒 (Μη) 質竃平均 分子望 (Mw) Aa-1 12 29 29 29 PGMEA 780 850 21 A2-2 17 42 42 — PGME 805 860 26 [例1〜24及例31〜33 :負型感光性樹脂組成物之調製、 隔壁之形成與評價] 以表3及表4所示比率(質量%),摻混撥墨劑(Α)、光聚 合起始劑(Β)、鹼可溶性樹脂(C)、黑色著色劑(D)、交聯劑 (G)、溶劑(Η)、矽烷耦合劑(J)及微粒子(Κ)獲得負型感光性 樹脂組成物。 91 201248326 利用旋塗法,於玻璃基板上塗佈負型感光性樹脂組成 物後,在100C下2分鐘使之於熱板上乾燥,形成膜厚2〇以 m之塗膜。接著,通過遮罩(遮光部1〇〇 V mx2〇〇 a m '光透 過部20μ m之格子狀圖案),藉由超高壓水銀燈(利用戴止濾 波器將330nm以下波長遮光。主要是由丨線、h線及g線構成 之混合線)對塗膜照射表3及表4所示之預定曝光量。 接下來,將未曝光部分浸潰於無機鹼型顯影液(橫濱油 脂工業社製、商品名Semi-clean DL-A4之1〇倍稀釋水溶液) 進行顯影,將未曝光部藉由水洗去,使之乾燥。 接著,於熱板上’在220°C下加熱1小時,藉此獲得圖 案已形成之玻璃基板(1)。又,除了不使用上述遮罩來曝光 以外係與上述同樣施行’獲得塗膜硬化膜已形成之玻璃基 板(2)。針對玻璃基板(1)或(2),利用以下所示方法測定線 寬、顯影後膜削減、撥墨性(PGMEA接觸角)並評價。結果 顯示於表3及表4。 (線寬) 針對上述玻璃基板(1),利用超深度形狀測定顯微鏡 VK-850〇(KEYENCE社製)來測定光透過部20 // m之格子狀 圖案線寬。線寬愈接近遮罩之光透過部之20# m,表示愈可 再現遮罩之線寬。 ψ (顯影後膜削減) 針對上述玻璃基板(1) ’利用高精度微細形狀測定機 SURFCORDER ET4000 A(小坂研究所製)來測定曝光部分 (硬化膜)之顯影前膜厚(THK1)及顯影後膜厚(THK2)。以自 92 201248326 1丨主_、厚減去顯後膜厚之値作為㈣㈣肖1丨減。該値 ‘丄示負型感光性樹脂組成物之光硬化愈良好。 (撥墨性) ~ 系藉由上述玻璃基板(2)之硬化膜表面之接 觸角(度)來評價。所謂接觸角係在固體與液體接觸之點上固 體表面對液體表面之接線所構成的角,以包含液體之角度 來疋義。3彡肖度愈大表*硬化膜之撥墨性愈佳。 …藉由静滴法,準據JISR 3257「基板玻璃表面之可濕潤 式驗方法」於基材上測定表面的3處擺放PGMEA滴,針 f各PGMEA滴進仃測定。液滴係2心滴,測定係在抓 下進行。接觸角係以3測定値之平均値(n = 3)來表示。 93 201248326 寸 1 A1—2 I in o' 化合《1 No.50 L^〇J 1 25.0 1 60.0 1 IO σί 1 60.0 1 ! 25.0 I 1 17.8 I ! 48.2 I 1 19.7 1 O CO LAS-B I CO r" A1-2 I ΙΩ d 化合物 i No.49 1 5Q 1 L^〇 60.0 I ΙΟ αί I 60.0 | Ι25Ό I 17-9 ? 1 47.5 I '19.5 1 ¢0 CO 49.3 | w— i A1-5 I d 化合物 No.48 1 -5-0 1 1 25 0 1 [βαρ 1 \Λ οΐ | 60.0 | L2A〇J 18-0 〇 ·« I 48.2 | 1 19-8 1 CJ C3 :50.1 | #· 1 A1-4 I V) d 化合tt No.47 [5.0」 25.0 | 1 60.0 1 Ift σ> I 60.0 I 1 25.〇J 1 17.9 I CM 丨 48.0 1 1 19-9 I <M m 丨 50-2 | 〇 1 A1-3 I ΙΛ d 化合物 No.46 1 5.0 1 丨25』—I 1 60.0 1 ΙΑ αΐ 160.0 丨 25 0 1 I 17.8 ! 1 48.2 1 I 18.8 1 CQ CQ 50.0 A I A1-2 I μ d |化合物 ! No.45 1 5Q 1 I 25^ I 1 35.0 1 1 7-〇 1 1 2.5 1 L^pJ I 20.0 | 53.0 | 丨 25.0 1 1 7.0 1 I 18-9 I 0Θ CO 1 480 ί 丨 20.4 1 (〇 CSJ | 50.9 | QC I a'-z I η d 化合物 No.33 i_5-〇 1 ^5.0 I 1 35.0 1 \ι^ 1 \Λ csi 1 5-Q 1 | 20.0 ] | 53.0 | 1 25.0 1 〇 Μ.9-2| (A CO Li_8-〇J 20.5 m CM I 51.3 | I A1-2 I IA 0 1化合物 | No.20 1 5-Q. 1 25-0J 1 35.0」 Ι^-ο 1 1 2 5 1 丨 5.0 1 1 20.0 | 53.0 1 1 25-Q 1 〇 卜’ 丨 19.0 | CD n 1 48.0 1 I 20.3 1 U) CM | 50.5 | <D I ΑΊ-1 I - 化合物 No.12 1 5-0 -1 |25X) J 1 60.0 1 9^1 1 60.0 1 丨 25.0 1 18.1」 O 咿 1 4Θ.5 丨19.7」 04 CO 1 52.3 | ΙΑ Ιαί-ι I m 〇 化合 No.10 o tri |25.〇1 Ιθο.ο I αί | 60.0 1 L^s.o | Lie〇! o ·«· L4L7 1 1 19-8 | 44.4 1 La1-» 1 U) d :化合物 No.7 1 5-Q 1 | 20 0 | 60.0 1^5 1 1 5.0 ; | 60.0 | [25.0 | 0) 1—仍1 l」0-5 I to n 1 49.5 | « 1 AM i ΙΛ o' |化合徐 ! No.3 1 5.0 1 l25〇 I 1 35.0 1 1 7.0 1 U) 1 5.0 | | 20.0 | | 53.0 1 125Q 1 1. 7·0 1 丨 18.2 1 m 1 2 1 I 20.6 | U) CJ 1 51.5 | Csl 1 ΑΊ-1 | I 0-5 I 化合物 No.2 i 50 1 L25-Q I 35.0 1 丨 7·0 1 \Ω Μ* 〇 in' 1 2〇.〇 ! | 53.0 | 1 25.0 | 丨 7.0 1 卜 8.0 | CO CO 1 49.0 1 I 20.3 | 00 CM | 50.8 | - LamJ U) d 化合物 No.1 1 5.0 1 丨 25.0 .1 60.0 1 ιτ> 0)’ | 60.0 | [25.0 1 LUAJ eg Ll9) o 03 1 49.9 | s I 種頚 I I 固薛部分 I 1 ! mm 1_ 1 固瓱部分 1 1 径頚 1 1 固態部分 1 | 種頚 1 1 固瓱部分 1 ΕΧ1010 | I ZCR1761 | I ZCR1642 1 1_〇Σΐ_1 1 ZAR2002H 1 |gb+高分子分啟囫1 mm 猫轾 1 UX5002 1 1 A9300CL 1 1 Α9530 1 丨 KB紙013 | I IPAST | 1 PGMEA | I 頊己面 | 1_ΙΡΑ_I 1 PGME 1 想克(/£〇0 | 顳影後瞑削M (nm> I 1 PGMEA接觸角Γ ) 1 iISa ifL m> | 顔彰後膜削減(run) | | PGMEA接觸角(e > | 光聚合起始問(B) ((B)以外〉 驗可溶性m脂 (〇 1_CB_1 涅合有楢顔料 *3 | 矽烷IS合剤 (J) I | ί3粒子〇〇 ! ΐ 1掇液性 ι i祖液性 | 撥墨閉 光聚合起始劑 黑色著色刮(D) 交瞄到 Έ 熙 Q [ 味兀虫 20mJ/cm2 暍光M 40mJ/cm2 固趄部分 中之 質里% .组成物中 之質呈96 評價 94 201248326 (0 IamJ U) 6 [OXE02I I g-g_i | 20.0 | 60.0 ί 9-5」 Ls,〇_J I 60.0 | L25-〇J 1 16-2 1 Q0 MQQ J 丨 17.8 I i 28.0 1 « ΓαΜ 1 ΙΑ d IOXE02 k 5-Q I 1 1 1 35.0 | i^oJ in CsJ 〇 tA m〇 1 1 53.0 ] 25.0 1 q 卜’ 1 _!§·〇」 〇 | 23.0 | 丨卫.5」 \e> (〇 32.0 1 η Γ^Ί v> d IOXE02I L 51」 L25.0 J 1 60.0 1 U) 0) 1 60.0 j Lzs-o 1 □EE S I 20,0 | L 17.3 j 〇 1 26.0 1 5 r· 化合tt No.33 ο in | 23.0 ] 34.5 L^〇」 u> csi 0 to 1 20.0 1 1 53.0 ] 1 25.0 1 ο 1 1&-5J g lA^oJ 1 20.8 1 03 <0 1 44.4 1 C0 Csi 1 Aa-2 I 0.5 i 化合fls| No.33 I 2.0 : IIR907 1 2.0 _ i § 〇 147.5_| Ll2,〇—」 I 35.0 I 1 20.0 1 LAP J 1 60.0 1 120-1-1 U> 令 La5>〇J 1-21-5J CO 147.2 1 Μ W r^=n T— 化合物 No.33 I g-〇 I | IR907i L g-0 1 L_47.5 i 115 1 I 60.0 1 1 25.0 1 [20 5 1 A 145 5 1 1 22.0 1 CO CQ 1 48.1 I Ί·· Csi I A'il u> d 化合物 N〇>se O to 25,01 1 βο.ο | \n A ! 60.0 1 [25^_J 1 1 0> w 1 48.0 1 1 20.0I ψ· 〇 I 50.1 I Ο CM d 化合物 No.57 O U) L25.0J I 60.0 1 \Λ 〇i 1 60.0 1 ί.25·0」 1 17 s 1 L47.B_J Li^jJ CM t 49.5 | α> 1 A-2 J L〇^J 化合物 No.56 〇 Ui 25,0 J I 60.0 1 U) 0> 25.0 I 1-17,9 J 1 48.1」 丨Ί9·8」 ¢4 CO i 49.5 CO — I A1^ 1 tA 6 化合物 No.55 o tn 25.0 1 60.0 1 \Λ Φ 1 βαο 1 125.0 I I 17.8 1 N 苛 1 48.0 1 1 18.7 1 <0 0Ϊ 49.4 r· I A1-2| (A 6 化合物 No.54 o 1Λ 1 25.0 1 1 60.0 1 \Λ 〇ί I 60.0 I [ 25.0 I 1 13AJ 1 47.9_| 1 20.0 1 0 m 50.1 〇 I A1-? I LA d 化合物 No.53 o tn 25.0 1 βα.ο 1 ]Λ <n L§〇^ I 1?5,0_| I17.9J M 417」 CO 49.8 in T" La1-?」 tA 化合物 No.51 〇 25.—0— 1 60.0 1 u> ai 1 βο.ο 1 [250 ! 1B.0 I 〇 I 46,0 1 1 20.0 1 5 | 49.9 s L— 種頚 …」 | 固痪部分 I 種頚 I 固態部分 I L—一 輕__________] 1 固態部分 j 1 種類 | 1___固態部分_I 1 EX1010 I 1 2CR17G1 I 1 2CR1642 I 1 . 0-1 一1 1 ZAR2002H |〇曰+高分子分散剧| 赶镝 «ΓΝ- 如¢: I UX5002 1 I A9300CL 1 1 A9530 1 1 KBM5013 1 1 1PAST 1 1 PGMEA 1 i 一 《Β*_____________1 ! iPA 1 L_ PGME_I 線芘Um) I 瓸髟後腥削滅I Lfgmea接觸角C > I iSS <Mm) 1 1 顯彩後胆削滅<nm> 1 S m Si 2 0 a 撥墨翊<A) 光聚合起始到(B) ((B)以外) 鹸可溶性樹脂 (C) 1 os.. 1 混合有機顔料 3 #-s 3 m 如 m % ΐ 1祖液性 」 !撥液性 光聚合起始圈 黑色著色圈(D> 交脚阀 微粒子 溶闳 皞光堊 20mJ/cm2 硪光s 40mJ/cm2 固態部分 中:Z 質靈% 组成物中 之質s% Φϋ韵I趟米妇函埋刼铤蓉 95 201248326 J 24之負型感光性樹脂組成物皆為光硬化良好。又, 由該組成物形成之硬化膜,撥墨性良好且可再現遮罩線寬。 另方面,例31〜33之負型感光性樹脂組成物,並未使用 1刀子内具有ί肖基之柄旨化合物作為光聚合起始劑因此曝光 量與20m;/em2及4〇m】/em2皆在顯影後膜職超過⑼⑽,光硬 化不充分。又,卿成之硬化義撥·不充分且無法再現 遮罩線寬< 產業上可利用性 本發明負型感光性樹脂組成物,可製造出即使在減低曝 光$或將330nm以下曝光光線予以遮光進行曝光之情況下,撥 墨性仍良好且遮罩線寬之再現良好之隔壁。 本發明負型感光性樹脂組成物可適當使用於隔壁之形 成,而使用在採喷墨紀錄技術法之濾色器製造、有機EL表示 元件製造。 又,在此援引2011年4月28日申請之日本專利申請案 20U-102039號之說明書、申請專利範圍、圖式及摘要之全部 内容,納入作為本發明說明書之揭示。 【圖式簡單說明】 第1圖係模式地顯示利用本發明負型感光性樹脂組成 物之光學元件用隔壁之製造例截面圖。 【主要元件符號說明】 1···基板 3…塗膜曝光部分 2··•負型感光性樹脂組成物之 4…遮罩 塗膜 5…光 96 201248326 6···隔壁 10…喷墨方式用光學元件用基 7…點陣 板 97Chemicals company, trade name: OXE02). IR907: trade name; IRGACURE 907, manufactured by BASF Corporation, 2-mercapto-1-[4-(methylthio)phenyl]-2-flavor. Lin Ke Bing Yi-1-嗣. EAB : 4,4'-bis(diethylamino)diphenyl ketone (manufactured by Tokyo Chemical Industry Co., Ltd.). (Alkali-soluble resin (C)) EX1010: A resin obtained by introducing an ethylenic double bond and an acidic group into an epoxy resin represented by the above formula (Cl-2b) (manufactured by Nagase ChemteX, trade name: EX-1010. Solid portion: 60 Mass%, PGMEA: 40% by mass.). ZCR1761: A resin obtained by introducing an ethylenic double bond and an acidic group into an epoxy resin having a biphenyl skeleton represented by the above formula (Cl-2a) (manufactured by Nippon Kayaku Co., Ltd., trade name: ZCR-1761H. Solid portion: 60 mass) %, PGMEA: 40% by mass.). ZCR1642: a resin obtained by introducing an ethylenic double bond and an acidic group into an epoxy resin having a biphenyl skeleton represented by the above formula (ci-2a) (manufactured by Nippon Kayaku Co., Ltd., trade name: ZCR-1642H. Solid portion: 60 mass) %, PGMEA: 40% by mass). C-1: a resin obtained by reacting a phenolic phenol varnish type epoxy resin with an acrylic acid followed by a ruthenium 2,3,6-tetrahydrocaproic acid needle to introduce an acryl oxime group and a carboxyl group, and purifying the resin with hexane The resin, solid portion 70 〇 / 〇, acid value 6 〇 mg KOH / g, PGMEA: 30% by mass. ZAR2002: trade name; KAYARAD ZAR-2002, manufactured by Nippon Kayaku Co., Ltd., a resin in which a carboxyl group and an ethylenic double bond are introduced in a double-type A epoxy resin, a solid portion 70%, an acid value of 6〇mgK〇H/g, PGMEA : 3〇% by mass. 86 201248326 (black coloring agent (D)) CB: carbon black dispersion (average secondary particle diameter: 120 nm, carbon black: 20% by mass, amine valence: 18 mgKOH/g of polyamine phthalate polymer dispersant: 5 Mass %, PGMEA: 75 mass ° /.). Mixed organic pigment: C.I. Pigment Blue 156, C.I. Pigment red 254, C.I. Pigment yellow 139 and a polymer dispersant: a mixture of 5:5:5 (solid portion: 25% by mass, PGMEA: 75% by mass). (crosslinking agent (G)) UX5002: a polyfunctional amine phthalate acrylate oligomer (manufactured by Nippon Kasei Co., Ltd., trade name: KAYARAD UX-5002D-P20. Solid portion: 80% by mass, PGMEA: 20% by mass ). A9300CL: ε-caprolactone modified 叁·(2-propenyl methoxyethyl) isotrimeric polyisocyanate (manufactured by Shin-Nakamura Chemical Co., Ltd., trade name: NK ESTER A-9300-1CL). A9530: a mixture of dipentaerythritol hexaacrylate and dipentaerythritol pentaacrylate (manufactured by Shin-Nakamura Chemical Co., Ltd., trade name: NK ESTER A-9530). (Solvent (Η)) PGMEA: propylene glycol 1-monomethyl hydrazine 2-acetate. IPA: 2-propanol. (decane coupling agent (J)) KBM5013: trade name (manufactured by Shin-Etsu Chemical Co., Ltd.. 3_acryloxypropyl methoxymethoxy decane). (Microparticles (K)) 87 201248326 IPA-ST : Trade name (manufactured by Nissan Chemical Industries, Ltd. Organic cerium oxide gel, solid portion: 30% by mass, IPA: 70% by mass). [Synthesis Example 1: Synthesis of Ink Repellent (A^1)] MEK (420 g), C6FMA (90 g), MAA (9 g), and PME 1000 (8 lg) were placed in an autoclave having a volume of 1 L of a stirrer. Further, a polymerization initiator V-65 (0.2 g) was stirred while stirring under nitrogen for 24 hours at 50 ° C to synthesize a crude polymer. After the obtained crude polymer solution was added to hexane and further purified, vacuum drying was carried out to obtain an ink-repellent (A-1) (158.6 g). The ink-repellent (A^l) had a number average molecular weight (??) of 64,690 and a mass average molecular weight (Mw) of 92,270. [Synthesis Example 2: Synthesis of Ink Repellent (AL2)] MEK (420 g), C6FMA (85 g), 2-HEMA (50 g), PME400 (36 g), MAA were placed in an autoclave having a volume of 1 L of a stirrer. (9 g) and a polymerization initiator V-65 (0.7 g) were stirred while stirring under nitrogen for 24 hours at 50 ° C to obtain a polymer oxime solution. (Introduction of Ethylene Double Bond) The above polymer (1) solution (500 g), AOI (45.6 g) 'DBTDL (0.13 g), TBQ (1.6 g) and the autoclave having an internal volume of 1 L of a stirrer were placed. MEK (17.1 g), while stirring and one side at 4 Torr. The underarm was allowed to react for 24 hours, and the ethylenic double bond was introduced into the polymer (1). After the hexane was added to the obtained solution and then purified, vacuum drying was carried out to obtain an ink-repellent (0 2) (165.0 g). The ink-repellent (Bagua 2) has a number average molecular weight (Μη) of 41,200, a mass average molecular weight (Mw) of 11〇, a 800' fluorine atom content ratio of 2〇.6 mass%, and an amount of an ethylenic double bond. (C = C amount, 66xl0-3m〇1/g, acid value: 88 201248326 25.0 mgKOH/g. [Synthesis Example 3 to 4: ink-repellent (Ah) and (A1-" synthesis] In the synthesis of A1-:!), the blending of the raw materials was changed as shown in Table 1, and the ink-repellent (AL3) and (AU) were obtained by the same copolymerization reaction. The obtained ink-repellent (A1) The number average molecular weight (Μη), the mass average molecular weight (Mw), the fluorine atom content ratio (% by mass), and the acid value (mgKOH/g) of ^) and (AU) are shown in Table 1. [Synthesis Example 5: Dialing Synthesis of Ink (A1·^) In the synthesis of the polymer (1), the blending of the raw materials was changed as shown in Table 1, and the polymer (2) was obtained by the same copolymerization reaction. In the synthesis of the ink (A1-), except that the blending of the raw materials is changed as shown in Table 1, the same reaction is carried out, and an ethylenic double bond is introduced into the polymer (2) to obtain an ink-repellent agent (A1- 〗). The weight of the obtained ink (A]-5) The average molecular weight (Μη), the number average molecular weight (Mw), the fluorine atom content ratio (% by mass), the acid value (mgKOH/g), and the amount of the ethylenic double bond (C = C amount, xl (T3 mol/g) show In Table 1. 89 201248326 [Table i] Drawing 01 (A1-" (A1-2) (Α'-3) (A1 Η) (A'-5) C6FMA 80 85 99 108 85 MAA 9 9 9 18 9 m PME400 - 36 63 a 36 and PME1000 81 one-one-one 2-HEMA — 50 - _ 50 Gu Meng QMA - one 9 18 one material MMA — — - 36 one V-65 02 0.7 0.3 1.9 3 MEK 420 420 420 420 420 Polymer «Containment (1> 7 500 J - This SI solution » contains: (2 > / - / / 500 AOI / 45.6 / / 45.6 & DBTDL / 0.13 / / 0.13 into TBQ / 1.6 / / 1.6 MEK 17.1 / 17.1 锒 串 (β) 158.6 165 162.3 160.1 165 目) 目 Β 64 64 Μ 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 64 Single (霣fi%) 28>β 20.6 31.4 34.3 20.6 (mgKOH/g) 32.6 25 32.6 6&3 25 C=C Ft ( X lO^mol/g) 1.66 [Synthesis Example 6: Production of ink-repellent (A2-l)] In a 1,000 cm3 three-necked flask equipped with a stirrer, ll_8 g of the compound (a7-1) and a compound (a8) were placed. 29.4 g of -l), 29.4 g of compound (a9-1), and 29.4 g of TMMS' obtained a mixture of hydrolyzable decane compounds. Next, 564.7 g of PGMEA was placed in the mixture to prepare a solution (raw material solution). In the obtained raw material solution, at 40. (: 52.0 g of a 1.0% hydrochloric acid aqueous solution was added dropwise while stirring, and after the completion of the dropwise addition, the mixture was stirred at 40 ° C for 5 hours to obtain a PGMEA solution (liquid ink (a2)) concentration: 10% by mass. (A2_l) liquid") The ink-repellent (a2-1) was obtained. Further, the reaction liquid was measured by gas chromatography, and it was confirmed that each compound as a raw material was below the detection limit. The obtained ink-repellent (A2- l) The number average molecular weight (Μη), the mass average molecular weight (Mw), the fluorine atom content ratio, and the ink-removing agent (α2-1) composition (mol%) are shown in Table 2. 90 201248326 [Synthesis Example 7: Production of Ink Repellent (A2-2)] 16.7 g of the compound (a7-1) and 41.7 g of the compound (a8-1) were placed in a 1,000 cm3 three-necked flask equipped with a mixer. 41.7 g of the compound (a9-1) was obtained as a mixture of hydrolyzable decane compounds. Next, 564.7 g of PGME was placed in the mixture to prepare a solution (raw material solution). The obtained raw material solution was at 40 ° C. While stirring, 65.7 g of an aqueous solution of nitric acid was added dropwise. After the completion of the dropwise addition, the mixture was stirred at 40 ° for 5 hours with a PGME solution ( The concentration of the ink (A2-2): 10% by mass. Hereinafter, the "(A2-2) liquid" is obtained). The ink-repellent (A2-2) is obtained, and the reaction liquid is measured by gas chromatography, and it is confirmed as a raw material. Each compound is below the detection limit. The number average molecular weight (Μη), mass average molecular weight (Mw), fluorine atom content ratio, and ink-repellent (Α2-2) of the obtained ink-repellent (A2-2) are placed. The composition of the amount (% by mole) - 倂 is shown in Table 2. [Table 2] Composition of the ink-repellent agent () 剤 剤 molecular weight oxygen atom content ratio (% > (a7-D (a8-1) Ca9-1) TMMS Teaching average molecular weight (Μη) Quality average molecular weight (Mw) Aa-1 12 29 29 29 PGMEA 780 850 21 A2-2 17 42 42 — PGME 805 860 26 [Examples 1 to 24 and Examples 31 to 33: Negative Preparation of photosensitive resin composition, formation and evaluation of partition walls] In the ratios (% by mass) shown in Tables 3 and 4, an ink-repellent (Α), a photopolymerization initiator (Β), an alkali-soluble resin was blended. (C), black colorant (D), crosslinking agent (G), solvent (Η), decane coupling agent (J), and fine particles (Κ) to obtain a negative photosensitive resin composition. 91 201248326 Using a spin coating method, On a glass substrate After coating the negative photosensitive resin composition, it was dried on a hot plate at 100 C for 2 minutes to form a coating film having a film thickness of 2 Å, and then passed through a mask (light shielding portion 1 〇〇 V mx2 〇〇 Am 'light transmission portion 20 μm grid pattern), by ultra-high pressure mercury lamp (shading wavelength below 330 nm by a wear stop filter). The coating film is mainly irradiated with a predetermined exposure amount shown in Tables 3 and 4 by a mixing line composed of a twist line, an h line, and a g line. Next, the unexposed portion was immersed in an inorganic alkali-type developing solution (manufactured by Yokohama Oil & Fats Co., Ltd., trade name: Semi-clean DL-A4, a 1-fold diluted aqueous solution), and the unexposed portion was washed with water to make the unexposed portion. Dry. Then, it was heated at 220 ° C for 1 hour on a hot plate, whereby a glass substrate (1) in which the pattern was formed was obtained. Further, the glass substrate (2) on which the cured film of the coating film was formed was carried out in the same manner as described above except that the above-mentioned mask was not used for exposure. With respect to the glass substrate (1) or (2), the line width, the film reduction after development, and the ink repellency (PGMEA contact angle) were measured and evaluated by the following methods. The results are shown in Tables 3 and 4. (Line width) The grid-like pattern line width of the light-transmitting portion 20 // m was measured by the ultra-depth shape measuring microscope VK-850 (manufactured by KEYENCE Co., Ltd.). The line width is closer to 20# m of the light transmitting portion of the mask, indicating that the line width of the mask can be reproduced. ψ (film reduction after development) The pre-development film thickness (THK1) of the exposed portion (cured film) and the developed image were measured by the high-precision micro-shape measuring machine SURFCORDER ET4000 A (manufactured by Otaru Laboratory) for the above-mentioned glass substrate (1) Film thickness (THK2). From 92 201248326 1 丨 main _, thickness minus the apparent film thickness as (four) (four) Xiao 1 丨 reduction. This 丄 丄 shows that the photohardening of the negative photosensitive resin composition is better. (Ink repellency) ~ was evaluated by the contact angle (degree) of the surface of the cured film of the above glass substrate (2). The contact angle is the angle formed by the solid surface to the liquid surface at the point where the solid is in contact with the liquid, and is defined by the angle containing the liquid. The greater the degree of diarrhea, the better the ink repellency of the sclerosing film. By placing the PGMEA drops on the surface of the substrate by the static drop method, JISR 3257 "wettable test method for the surface of the substrate glass", the needles were measured by dropping each PGMEA. The droplets were 2 core drops, and the measurement was carried out under grasping. The contact angle is expressed as the average enthalpy (n = 3) of 3 measurements. 93 201248326 Inch 1 A1—2 I in o' Combination “1 No.50 L^〇J 1 25.0 1 60.0 1 IO σί 1 60.0 1 ! 25.0 I 1 17.8 I ! 48.2 I 1 19.7 1 O CO LAS-B I CO r" A1-2 I ΙΩ d Compound i No.49 1 5Q 1 L^〇60.0 I ΙΟ αί I 60.0 | Ι25Ό I 17-9 ? 1 47.5 I '19.5 1 ¢0 CO 49.3 | w— i A1-5 I d Compound No. 48 1 -5-0 1 1 25 0 1 [βαρ 1 \Λ οΐ | 60.0 | L2A〇J 18-0 〇·« I 48.2 | 1 19-8 1 CJ C3 :50.1 | #· 1 A1 -4 IV) d compound tt No.47 [5.0" 25.0 | 1 60.0 1 Ift σ> I 60.0 I 1 25.〇J 1 17.9 I CM 丨48.0 1 1 19-9 I <M m 丨50-2 | 〇1 A1-3 I ΙΛ d Compound No.46 1 5.0 1 丨25』—I 1 60.0 1 ΙΑ αΐ 160.0 丨25 0 1 I 17.8 ! 1 48.2 1 I 18.8 1 CQ CQ 50.0 AI A1-2 I μ d | Compound! No.45 1 5Q 1 I 25^ I 1 35.0 1 1 7-〇1 1 2.5 1 L^pJ I 20.0 | 53.0 | 丨25.0 1 1 7.0 1 I 18-9 I 0Θ CO 1 480 ί 丨20.4 1 (〇CSJ | 50.9 | QC I a'-z I η d Compound No.33 i_5-〇1 ^5.0 I 1 35. 0 1 \ι^ 1 \Λ csi 1 5-Q 1 | 20.0 ] | 53.0 | 1 25.0 1 〇Μ.9-2| (A CO Li_8-〇J 20.5 m CM I 51.3 | I A1-2 I IA 0 1 compound| No.20 1 5-Q. 1 25-0J 1 35.0" Ι^-ο 1 1 2 5 1 丨5.0 1 1 20.0 | 53.0 1 1 25-Q 1 〇卜' 丨19.0 | CD n 1 48.0 1 I 20.3 1 U) CM | 50.5 | <DI ΑΊ-1 I - Compound No.12 1 5-0 -1 |25X) J 1 60.0 1 9^1 1 60.0 1 丨25.0 1 18.1" O 咿1 4Θ .5 丨19.7” 04 CO 1 52.3 | ΙΑ Ιαί-ι I m 〇 合 No.10 o tri |25.〇1 Ιθο.ο I αί | 60.0 1 L^so | Lie〇! o ·«· L4L7 1 1 19-8 | 44.4 1 La1-» 1 U) d : Compound No.7 1 5-Q 1 | 20 0 | 60.0 1^5 1 1 5.0 ; | 60.0 | [25.0 | 0) 1—still 1 l”0 -5 I to n 1 49.5 | « 1 AM i ΙΛ o' | Compound Xu! No.3 1 5.0 1 l25〇I 1 35.0 1 1 7.0 1 U) 1 5.0 | | 20.0 | | 53.0 1 125Q 1 1. 7 · 0 1 丨 18.2 1 m 1 2 1 I 20.6 | U) CJ 1 51.5 | Csl 1 ΑΊ-1 | I 0-5 I Compound No. 2 i 50 1 L25-Q I 35.0 1 丨7·0 1 \Ω Μ* 〇in' 1 2〇.〇! | 53 .0 | 1 25.0 | 丨7.0 1 卜 8.0 | CO CO 1 49.0 1 I 20.3 | 00 CM | 50.8 | - LamJ U) d Compound No.1 1 5.0 1 丨25.0 .1 60.0 1 ιτ> 0)' | 60.0 [25.0 1 LUAJ eg Ll9) o 03 1 49.9 | s I species 固 II solid part I 1 ! mm 1_ 1 solid part 1 1 diameter 1 1 1 solid part 1 | species 1 1 1 solid part 1 ΕΧ 1010 | I ZCR1761 | I ZCR1642 1 1_〇Σΐ_1 1 ZAR2002H 1 |gb+polymer split 1 mm cat 轾1 UX5002 1 1 A9300CL 1 1 Α9530 1 丨KB paper 013 | I IPAST | 1 PGMEA | I 顼己面 | 1_ΙΡΑ_I 1 PGME 1 think gram (/£〇0 | 颞 瞑 M M (nm> I 1 PGMEA contact angle Γ) 1 iISa ifL m> | Yan Zhang after film cut (run) | | PGMEA contact angle (e > Photopolymerization start (B) (Besides (B)> Detecting soluble m-fat (〇1_CB_1 Nirvana 楢 pigment*3 | 矽 IS 剤 剤 (J) I | ί3 〇〇 〇〇! ΐ 1 掇 性 ι i 祖 液 | 墨 墨 闭 闭 闭 闭 闭 闭 闭 闭 交 Q Q Q [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ [ Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q The quality of the composition is 96 evaluation 94 201248326 (0 IamJ U) 6 [OXE02I I g-g_i | 20.0 | 60.0 ί 9-5" Ls, 〇_JI 60.0 | L25-〇J 1 16-2 1 Q0 MQQ J 丨17.8 I i 28.0 1 « ΓαΜ 1 ΙΑ d IOXE02 k 5-QI 1 1 1 35.0 | i^oJ in CsJ 〇tA m〇1 1 53.0 ] 25.0 1 q 卜' 1 _!§·〇” 〇| 23.0丨卫.5” \e> (〇32.0 1 η Γ^Ί v> d IOXE02I L 51” L25.0 J 1 60.0 1 U) 0) 1 60.0 j Lzs-o 1 □EE SI 20,0 | L 17.3 j 〇1 26.0 1 5 r· Compound tt No.33 ο in | 23.0 ] 34.5 L^〇” u> csi 0 to 1 20.0 1 1 53.0 ] 1 25.0 1 ο 1 1&-5J g lA^oJ 1 20.8 1 03 <0 1 44.4 1 C0 Csi 1 Aa-2 I 0.5 i compound fls| No.33 I 2.0 : IIR907 1 2.0 _ i § 〇147.5_| Ll2, 〇—” I 35.0 I 1 20.0 1 LAP J 1 60.0 1 120-1-1 U> Let La5>〇J 1-21-5J CO 147.2 1 Μ W r^=n T—Compound No.33 I g-〇I | IR907i L g-0 1 L_47.5 i 115 1 I 60.0 1 1 25.0 1 [20 5 1 A 145 5 1 1 22.0 1 CO CQ 1 48.1 I Ί·· Csi I A'il u> d 〇N〇>se O to 25,01 1 βο.ο | \n A ! 60.0 1 [25^_J 1 1 0> w 1 48.0 1 1 20.0I ψ· 〇I 50.1 I Ο CM d Compound No. 57 OU) L25.0J I 60.0 1 \Λ 〇i 1 60.0 1 ί.25·0" 1 17 s 1 L47.B_J Li^jJ CM t 49.5 | α> 1 A-2 JL〇^J Compound No.56 〇Ui 25,0 JI 60.0 1 U) 0> 25.0 I 1-17,9 J 1 48.1" 丨Ί9·8" ¢4 CO i 49.5 CO — I A1^ 1 tA 6 Compound No.55 o tn 25.0 1 60.0 1 \Λ Φ 1 βαο 1 125.0 II 17.8 1 N harsh 1 48.0 1 1 18.7 1 <0 0Ϊ 49.4 r· I A1-2| (A 6 compound No.54 o 1Λ 1 25.0 1 1 60.0 1 \Λ 〇ί I 60.0 I [ 25.0 I 1 13AJ 1 47.9_| 1 20.0 1 0 m 50.1 〇I A1-? I LA d Compound No. 53 o tn 25.0 1 βα.ο 1 ]Λ <n L§〇^ I 1? 5,0_| I17.9J M 417" CO 49.8 in T" La1-?" tA Compound No.51 〇25.—0—1 60.0 1 u> ai 1 βο.ο 1 [250 ! 1B.0 I 〇I 46,0 1 1 20.0 1 5 | 49.9 s L- species 頚..." | Solid part I species 頚I solid state Sub-IL—one light __________] 1 solid part j 1 type | 1___ solid part _I 1 EX1010 I 1 2CR17G1 I 1 2CR1642 I 1 . 0-1 1 1 ZAR2002H |〇曰+polymer dispersion drama | «ΓΝ- 如¢: I UX5002 1 I A9300CL 1 1 A9530 1 1 KBM5013 1 1 1PAST 1 1 PGMEA 1 i One "Β*_____________1 ! iPA 1 L_ PGME_I 芘Um) I 瓸髟 腥 腥 I I Lfgmea contact angle C > I iSS <Mm) 1 1 After the coloring, the gallbladder is destroyed <nm> 1 S m Si 2 0 a Ink 翊<A) Photopolymerization starts to (B) (Beyond (B)) 鹸Soluble Resin (C) 1 os.. 1 Mixed Organic Pigment 3 #-s 3 m As m % ΐ 1 Ancestral Liquidity! ! Liquid-emitting photopolymerization starting ring black coloring ring (D> Optical 垩 20mJ/cm2 硪 light s 40mJ/cm2 Solid part: Z 质灵% s% in the composition Φϋ韵I趟米女函 buried Cistanche 95 201248326 J 24 negative photosensitive resin composition Good for light hardening. Further, the cured film formed of the composition has good ink repellency and can reproduce the mask line width. On the other hand, the negative photosensitive resin compositions of Examples 31 to 33 were not used as a photopolymerization initiator in a knife, so that the exposure amount was 20 m; /em2 and 4〇m]/ Em2 is more than (9) (10) after development, and the photohardening is insufficient. In addition, the hardening of the singularity is insufficient, and the mask line width cannot be reproduced. INDUSTRIAL APPLICABILITY The negative photosensitive resin composition of the present invention can be manufactured by reducing the exposure amount by 30 or less. In the case of light-shielding exposure, the ink-repellent property is still good and the reproduction of the mask line width is good. The negative photosensitive resin composition of the present invention can be suitably used for the formation of a partition wall, and can be produced by a color filter manufactured by an ink jet recording technique or an organic EL. The disclosure of Japanese Patent Application No. 20-102039, filed on Apr. 28, 2011, the entire disclosure of which is incorporated herein in [Brief Description of the Drawings] Fig. 1 is a cross-sectional view showing a manufacturing example of a partition for an optical element using the negative photosensitive resin composition of the present invention. [Description of main component symbols] 1···substrate 3...coating film exposure part 2··•negative photosensitive resin composition 4...mask coating film 5...light 96 201248326 6··· partition 10...inkjet method Using optical elements with base 7...lattice plate 97

Claims (1)

201248326 七、申請專利範圍: 1. 一種負型感光性樹脂組成物,其特徵在於含有: 撥墨劑(A),其具有側鏈,且該側鏈含有以下式(1) 表示之基或以下式(2)表示之基; 光聚合起始劑(B),其係於1分子内具有硝基之肟酯 化合物;及 驗可溶性樹脂(C); -CFXRf (1) -(SiR'R2-0)n-SiR3R4R5 (2) 式(1)中,X表示氫原子、氟原子或三氟曱基,以表 示可具有醚性氧原子且至少1個氫原子經取代為氟原子 之碳原子數20以下之氟烷基或氟原子; 式(2)中,R1、R2、R3及R4獨立表示氫原子、烷基、 環烷基或芳基,R5表示氫原子或碳原子數1〜10之有機 基,η表示1〜200之整數。 2. 如申請專利範圍第1項之負型感光性樹脂組成物,其中 前述光聚合起始劑(Β)係由下式(3)構成之化合物; [化1]201248326 VII. Patent application scope: 1. A negative photosensitive resin composition characterized by comprising: an ink-repellent agent (A) having a side chain, and the side chain contains a base represented by the following formula (1) or below a base represented by the formula (2); a photopolymerization initiator (B) which is an oxime ester compound having a nitro group in one molecule; and a soluble resin (C); -CFXRf (1) - (SiR'R2- 0) n-SiR3R4R5 (2) In the formula (1), X represents a hydrogen atom, a fluorine atom or a trifluoromethyl group, and represents a carbon atom which may have an etheric oxygen atom and at least one hydrogen atom is substituted with a fluorine atom. a fluoroalkyl group or a fluorine atom of 20 or less; in the formula (2), R1, R2, R3 and R4 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group or an aryl group, and R5 represents a hydrogen atom or a carbon atom number of 1 to 10; The organic group, η represents an integer of from 1 to 200. 2. The negative photosensitive resin composition of claim 1, wherein the photopolymerization initiator (Β) is a compound composed of the following formula (3); 98 201248326 式(3)中,R31表示碳原子數卜20之烷基、碳原子數 6〜30之芳基、碳原子數7〜30之芳烷基或氰基;R32表示 R41或OR42,該R41及R42各自表示碳原子數1〜20之烷基、 碳原子數6〜30之芳基或碳原子數7〜30之芳烷基;R33表 示碳原子數1〜20之烷基 '碳原子數6〜30之芳基或碳原子 數7〜30之芳烷基;R34及R35各自獨立,表示R41、OR42、 氰基或鹵素原子;a及b各自獨立為0〜3之整數’ c為1〜3 之整數。 3.如申請專利範圍第1或2項之負塑感光性樹脂組成物,其 更含有黑色著色劑(D)。 4_如申請專利範圍第1至3項中任一項之負型感光性樹脂 組成物,其更含有交聯劑(G)。 5·如申請專利範圍第1至4項中任〆項之負型感光性樹脂 組成物,其中前述撥墨劑(A)係側鏈具有基⑴或基(2)且 主鏈為烴鏈之化合物。 6. 如申請專利範圍第5項之負型感光性樹脂組成物’其中 前述撥墨劑(A)具有酸性基。 7. 如申請專利範圍第1至4項中任一項之負型感光性樹脂 組成物,其中前述撥墨劑(A)係於側鏈具有基(1)且主鏈 為有機聚石夕氧鍵之化合物。 8. 如申請專利範圍第5至7項中任一項之負型感光性樹脂 組成物’其中前述撥墨劑(A)具有乙烯性雙鍵。 9. 一種硬化膜,係使形成於基板上之如申請專利範圍第1 至8項中任一項之負型感光性樹脂組成物之塗膜硬化而 99 201248326 成者。 10, 一種隔壁,係用以於基板上設置劃分區而形成者,其係 由如申請專利範圍第9項之硬化膜構成。 11. 一種黑色矩陣,係用以於基板上設置劃分區而形成者, 其係由如申請專利範圍第9項之硬化膜所構成,且該硬 化膜係由如申請專利範圍第3項之負型感光性樹脂組成 物形成者。 】2·—種隔壁之製造方法,其特徵在於依序具有以下步驟· 於基板上塗佈如申請專利範圍第1至8項中任_ 只 之負型感光性樹脂組成物而形成塗膜之步驟; 將前述塗膜加熱製成膜後,僅使該膜之預定部分曝 光而使其光硬化之步驟; 將前述已光硬化之部分以外之膜除去之步驟;及 將前述已光硬化之部分加熱而製得隔壁之步驟. 其中,於前述膜除去前後,前述已光硬化之部分的 膜厚變化為60nm以下。 U.—種黑色矩陣之製造方法,係於如申請專利範圍第12項 之製造方法中’使用如申請專利範圍第3項之負型感光 性樹脂組成物而製得前述隔壁作為黑色矩陣。 4·種據色器’具有基板、基板上之多數像素及位於鄰接 像素間之隔壁,其特徵在於:該隔壁係由如申請專利範 圍第1至8項中任一項之負型感光性樹脂組成物之硬化 膜構成。 15·—種有機EL元件,具有:基板、基板上之多數像素及位 100 201248326 於鄰接像素間之隔壁,其特徵在於:該隔壁係由如申請 專利範圍第1至8項中任一項之負型感光性樹脂組成物 之硬化膜構成。 10198 201248326 In the formula (3), R31 represents an alkyl group having 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms or a cyano group; and R32 represents R41 or OR42. R41 and R42 each represent an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms or an aralkyl group having 7 to 30 carbon atoms; and R33 represents an alkyl group having 1 to 20 carbon atoms. An aryl group of 6 to 30 or an aralkyl group having 7 to 30 carbon atoms; R34 and R35 each independently represent R41, OR42, cyano or a halogen atom; and a and b are each independently an integer of 0 to 3' c is An integer from 1 to 3. 3. The negative plastic photosensitive resin composition according to claim 1 or 2, which further contains a black colorant (D). The negative photosensitive resin composition according to any one of claims 1 to 3, which further contains a crosslinking agent (G). 5. The negative photosensitive resin composition according to any one of claims 1 to 4, wherein the side of the ink-repellent (A) has a group (1) or a group (2) and the main chain is a hydrocarbon chain. Compound. 6. The negative photosensitive resin composition of claim 5, wherein the ink-repellent (A) has an acidic group. 7. The negative photosensitive resin composition according to any one of claims 1 to 4, wherein the ink-repellent agent (A) has a group (1) in a side chain and the main chain is an organic poly-stone. The compound of the bond. 8. The negative photosensitive resin composition of any one of claims 5 to 7, wherein the ink-repellent (A) has an ethylenic double bond. A cured film obtained by curing a coating film of a negative photosensitive resin composition according to any one of claims 1 to 8 which is formed on a substrate. A partition wall formed by forming a partition on a substrate, which is composed of a cured film as in claim 9 of the patent application. A black matrix formed by providing a divisional region on a substrate, which is composed of a cured film as in claim 9 of the patent application, and the cured film is negative as in the third item of the patent application. A type of photosensitive resin composition is formed. A method for producing a partition wall, which comprises the steps of: forming a coating film on a substrate by coating a negative photosensitive resin composition as in any of claims 1 to 8 on a substrate. a step of heating the film to a predetermined portion of the film to be photohardened; a step of removing the film other than the photohardened portion; and the photohardenable portion The step of heating to obtain a partition wall. The film thickness of the photohardened portion before and after the removal of the film is 60 nm or less. U. A method for producing a black matrix, which is obtained by using the negative photosensitive resin composition of claim 3 of the patent application, as the black matrix. 4. The color filter 'having a substrate, a plurality of pixels on the substrate, and a partition wall between the adjacent pixels, wherein the partition wall is a negative photosensitive resin according to any one of claims 1 to 8. The cured film of the composition is composed. An organic EL device having: a substrate, a plurality of pixels on the substrate, and a spacer 100 between the adjacent pixels, wherein the partition is made of any one of the first to eighth aspects of the patent application. A cured film of a negative photosensitive resin composition. 101
TW101114725A 2011-04-28 2012-04-25 A negative photosensitive resin composition, a hardened film, a partition wall and a black matrix, a method of manufacturing the same, a color filter, and an organic EL element TWI522746B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011102039 2011-04-28

Publications (2)

Publication Number Publication Date
TW201248326A true TW201248326A (en) 2012-12-01
TWI522746B TWI522746B (en) 2016-02-21

Family

ID=47072146

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101114725A TWI522746B (en) 2011-04-28 2012-04-25 A negative photosensitive resin composition, a hardened film, a partition wall and a black matrix, a method of manufacturing the same, a color filter, and an organic EL element

Country Status (5)

Country Link
JP (1) JP5910629B2 (en)
KR (1) KR101842317B1 (en)
CN (1) CN103502888B (en)
TW (1) TWI522746B (en)
WO (1) WO2012147626A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579271B (en) * 2013-08-22 2017-04-21 東友精細化工有限公司 A color photosensitive resin composition, color filter and display device comprising the same

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013058386A1 (en) * 2011-10-21 2013-04-25 旭硝子株式会社 Method for manufacturing ink-repellent agent, negative-type photosensitive resin composition, partition wall, and optical device
JP5890297B2 (en) * 2011-12-22 2016-03-22 東京応化工業株式会社 Photosensitive resin composition, color filter and display device using the same, oxime ester compound, and photopolymerization initiator
CN103838084B (en) * 2012-11-26 2020-06-16 住友化学株式会社 Photosensitive resin composition
WO2014084190A1 (en) * 2012-11-27 2014-06-05 富士フイルム株式会社 Photocurable composition, transfer material, cured product, method for producing cured product, method for producing resin pattern, cured film, liquid crystal display device, organic el display device, and touch panel display device
WO2014084279A1 (en) 2012-11-28 2014-06-05 旭硝子株式会社 Negative photosensitive resin composition, cured resin film, partition wall and optical element
JP5890355B2 (en) * 2013-07-31 2016-03-22 東京応化工業株式会社 Photosensitive resin composition
JP6269467B2 (en) * 2013-12-27 2018-01-31 富士フイルム株式会社 Color filter manufacturing method and solid-state image sensor manufacturing method
JP6294689B2 (en) * 2014-02-06 2018-03-14 株式会社Adeka Photocurable composition
JP2015172664A (en) * 2014-03-12 2015-10-01 株式会社タムラ製作所 photosensitive resin composition
WO2015163379A1 (en) * 2014-04-25 2015-10-29 旭硝子株式会社 Negative photosensitive resin composition, partition, and optical element
US10109691B2 (en) 2014-06-25 2018-10-23 Joled Inc. Method for manufacturing organic EL display panel
CN106444282A (en) * 2015-08-13 2017-02-22 常州强力先端电子材料有限公司 Photosensitive resin composition containing oxime ester photoinitiator and application of photosensitive resin composition
JP6421161B2 (en) * 2015-11-27 2018-11-07 株式会社タムラ製作所 Photosensitive resin composition
TWI761230B (en) * 2015-12-08 2022-04-11 日商富士軟片股份有限公司 Radiation-sensitive resin composition, cured film, pattern forming method, solid-state imaging element, and image display device
KR102025359B1 (en) * 2016-03-08 2019-09-25 삼성에스디아이 주식회사 Photosensitive resin composition, black column spacerusing the same and color filter
CN108475019B (en) * 2016-03-29 2022-02-11 株式会社艾迪科 Black photosensitive resin composition
CN107325206B (en) * 2016-04-12 2018-12-18 常州强力先端电子材料有限公司 One kind oxime ester lightlike initiating agent containing nitrocarbazole and its preparation method and application
KR101976660B1 (en) * 2016-07-13 2019-05-09 삼성에스디아이 주식회사 Photosensitive resin composition, photosensitive resin layer using the same and display device
KR102374939B1 (en) * 2016-09-16 2022-03-16 가부시키가이샤 아데카 Curable composition, cured product, and method for manufacturing cured product
KR101991699B1 (en) * 2016-09-26 2019-06-21 삼성에스디아이 주식회사 Photosensitive resin composition, black pixel defining layer using the same and display device
KR102121424B1 (en) * 2016-12-02 2020-06-10 삼성에스디아이 주식회사 Photosensitive resin composition, black pixel defining layer using the same and display device
TWI677761B (en) * 2016-12-23 2019-11-21 奇美實業股份有限公司 Negative photosensitive resin composition for black matrix, black matrix, color filter, and liquid crystal display device
JP6845469B2 (en) * 2017-02-27 2021-03-17 三菱ケミカル株式会社 Colored cured film for image display devices, photosensitive coloring composition for image display devices, and image display devices
JP2018180168A (en) * 2017-04-07 2018-11-15 ホヤ レンズ タイランド リミテッドHOYA Lens Thailand Ltd Method for manufacturing optical member with processed pattern formed thereon
JP7047642B2 (en) * 2017-09-05 2022-04-05 Jsr株式会社 Photosensitive composition for partition wall formation, partition wall and display element
KR20190094731A (en) * 2018-02-05 2019-08-14 동우 화인켐 주식회사 Colored photosensitive resin composition, color pixel and display device produced using the same
WO2019176785A1 (en) * 2018-03-14 2019-09-19 東レ株式会社 Negative photosensitive coloring composition, cured film, and touch panel using same
JP2019178191A (en) * 2018-03-30 2019-10-17 東ソー株式会社 Fluorine resin
TW202008078A (en) 2018-07-20 2020-02-16 日商三菱化學股份有限公司 Photosensitive colored resin composition, cured product, image display device and lighting
KR102111461B1 (en) * 2018-10-25 2020-05-15 엘지전자 주식회사 Display device using semiconductor light emitting device and method for manufacturing the same
JP7175168B2 (en) * 2018-11-29 2022-11-18 東京応化工業株式会社 Photosensitive resin composition, method for producing patterned cured film, and patterned cured film

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008298859A (en) * 2007-05-29 2008-12-11 Asahi Glass Co Ltd Photosensitive composition, partition using the same, method for producing partition, method for producing color filter, method for producing organic el display element and method for producing organic tft array
JP2009244729A (en) * 2008-03-31 2009-10-22 Fujifilm Corp Photosensitive resin composition, light-shielding color filter and method of producing the same, and solid-state image sensor
JP2010061041A (en) * 2008-09-05 2010-03-18 Jsr Corp Radiation-sensitive composition, color filter, black matrix, and liquid crystal display element
JP2010186175A (en) * 2009-01-16 2010-08-26 Mitsubishi Chemicals Corp Coloring composition for color filter, color filter, and use thereof
JP2010215575A (en) * 2009-03-18 2010-09-30 Toyo Ink Mfg Co Ltd New oxime ester compound, radical polymerization initiator containing the same, polymerizable composition, negative type resist by using the same and method for forming image pattern by using the same
CN102459171B (en) 2009-06-17 2014-07-09 东洋油墨Sc控股株式会社 Oxime ester compound, radical polymerization initiator, polymerizable composition, negative resist and image pattern
JP2011022384A (en) * 2009-07-16 2011-02-03 Toppan Printing Co Ltd Black colored composition, method for producing black matrix and color filter
TWI475006B (en) * 2009-09-08 2015-03-01 Nippon Steel & Sumikin Chem Co Photopolymerization initiator and photosensitive composition
JP5627273B2 (en) * 2010-04-15 2014-11-19 東洋インキScホールディングス株式会社 Photosensitive coloring composition and color filter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579271B (en) * 2013-08-22 2017-04-21 東友精細化工有限公司 A color photosensitive resin composition, color filter and display device comprising the same
CN111399340A (en) * 2013-08-22 2020-07-10 东友精细化工有限公司 Colored photosensitive resin composition, color filter and display device comprising same
CN111399340B (en) * 2013-08-22 2024-01-30 东友精细化工有限公司 Colored photosensitive resin composition, color filter comprising same, and display device

Also Published As

Publication number Publication date
CN103502888B (en) 2016-05-25
CN103502888A (en) 2014-01-08
TWI522746B (en) 2016-02-21
JPWO2012147626A1 (en) 2014-07-28
WO2012147626A1 (en) 2012-11-01
JP5910629B2 (en) 2016-04-27
KR20140018319A (en) 2014-02-12
KR101842317B1 (en) 2018-03-26

Similar Documents

Publication Publication Date Title
TW201248326A (en) Negative photosensitive resin composition, cured film, partition wall, black matrix, method for producing partition wall, method for producing black matrix, color filter, and organic el element
KR102624898B1 (en) Resin composition, light-blocking film, method for producing light-blocking film, and substrate having partitioning wall attached thereto
TWI431424B (en) A photosensitive composition, a partition wall, a black matrix, and a color filter
JP6115471B2 (en) Negative photosensitive resin composition, partition, black matrix, and optical element
TWI413864B (en) Silsesquioxane-containing compound and method for preparing the same
KR101420470B1 (en) Photosensitive composition, partition wall, and black matrix
JP6572769B2 (en) Negative photosensitive resin composition, cured film obtained by curing the same, method for producing the same, optical device including the same, and back-illuminated CMOS image sensor
TWI509361B (en) A negative photosensitive resin composition, a partition member for an optical element, a method of manufacturing the same, a method for producing an optical element having the partition wall, and a plating agent solution
WO2007061115A1 (en) Process for producing organic el, color filter and diaphragm
TW201013316A (en) Negative working photosensitive composition, partition wall for optical element using the nagative working photosensitive composition, and optical element comprising the partition wall
TWI666235B (en) Ink repellent, negative photosensitive resin composition, partition wall and optical element
CN111771163B (en) Negative photosensitive coloring composition, cured film, and touch panel using same
TWI567495B (en) Negative photosensitive resin composition
TWI529492B (en) Negative photosensitive resin composition, partition wall and optical element
TWI576667B (en) A partially hydrolyzed condensate, a dialing agent, a negative photosensitive resin composition, a hardened film, a partition wall, and an optical element
TW201423277A (en) Ink-repellent composition, negative photosensitive resin composition, hardened film, partition wall, and optical element
TW201243500A (en) Negative photosensitive resin composition and coating film
TW201308007A (en) Negative photosensitive resin composition, partition wall, black matrix, color filter, and liquid crystal display element
TW201421163A (en) Partial hydrolysis-condensation product and ink repellent agent using same
TW201840601A (en) A black colored photosensitive resin composition and display device produced using the same
TW202140632A (en) Radiation-sensitive composition, cured film and manufacturing method thereof, semiconductor element, display element and polymer to provide a radiation-sensitive composition capable of obtaining a film having excellent development adhesion
KR20180047318A (en) Photosensitive resin composition, cured film prepared therefrom, and electronic device incorporating cured film