201243314 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種識別不定形狀之樹脂之種類之樹脂 識別裝置”更詳細而言’關於一種使用紅外分光測定以非 接觸識別樹脂種類之樹脂識別裝置。 【先前技術】 於空調、電視、洗衣機等電氣製品中，廣泛使用聚丙 稀（PP，Polypropylene)、聚苯乙烯（ps，p〇lystyrene)、 丙稀腈丁二烯苯乙烯共聚物（ABS， acrylonitrile-butadienestyrene)之類的各種樹脂。因此，於 自廢棄製品回收之樹脂片（碎片）中混雜有各種樹脂，故 必需篩選每一種類之樹脂片，以將樹脂片作為用於新製品 之材料進行再利用。 於將廢祕脂資源再生之回收工廠中，必需有效地篩選 每一種類經細小粉碎之樹脂片，因此，已知一種利用紅外 分光測定將由輸送帶搬送之樹脂片之種類識別後進行分類 之樹脂分類裝置。例如於專利文獻i記載之分類裝置中對 試樣（樹脂片）照射紅外干涉光，將該反射光檢測後供給 至傅立葉轉換（Fourier transf〇rm)處理等信號處理，但由於 試樣之表面形狀不定，故一般之光學系難以將充分強度之 =射光導入至檢測器。因此，採用利用積分球形狀之=定 至’使反射光聚焦地導入至檢測器之構成。 然而實際上，難以使用此種球面鏡，將反射光有效 201243314 地聚光於檢測器之受光面。其原因在於，一般而言，傅立 葉轉換紅外分光測定中利用之檢測器之受光面之面積較 小，若於專利文獻1記載之離軸光學系中使用球面鏡，則 因其像差導致光束自檢測器之受光面溢出。因如此之原 因，於一般之紅外分光光度計中之反射測定裝置中，幾乎 毫無例外地將橢圓面鏡或拋物面鏡之類的非球面鏡用於光 學系（參照非專利文獻1等）。 然而，先前之一般之反射測定裝置用之光學系係使試 樣之反射面之高度固定（為固定）作為前提，對此，於上 述之樹脂分類裝置中，由輸送帶搬送而來的樹脂片之高度 之變動較大。因此，由樹脂片之表面擴散反射之光之聚光 效率變得相當低’不易以充分之精度識別樹脂種類。又， 先前之一般之反射測定裝置用之光學系不僅於試樣之上 方，而且必需亦於試樣之下方配置光學元件，從而阻礙設 置輸送帶等搬送機構。再者，該問題亦同樣存在於如專利 文獻1之使用積分球狀之測定室之情形。 [先前技術文獻] [專利文獻] 專利文獻1 :曰本特開平8-300354號公報 [非專利文獻] 非專利文獻1 :「分析計測機器FTIR TALK vol.l( 1990 ) 漫反射法之初步知識」、股份有限公司島津製作所、[平成 23年2月28日檢索]、網際網路<URL : http : //www. an. shimadzu.co.jp/ftir/support/lib/ftirtalk/talk 1 / intro. 4 201243314 htm> 【發明内容】 [發明所欲解決之問題] 即’作為於如上所述之樹脂公 類裝置中用以識別樹脂 片種類之傅立葉轉換紅外分光 ^ 4疋褒置之條件，重要的是 即便3式樣之向度及表面形狀為 ^ , L ^ 个疋’亦可有效地將擴散反 射光聚光地導入至檢測器之受光 風一从 尤面’以及構成光學系之光 干7G件以+成為搬送試樣之裝置 K叹置或維護等之障礙之 方式配置。 本發明係為解決如此之問題而^ 喂向疋成者，且主要目的在 於提供一種樹脂識別裝置，即便依 很序搬送而來的試樣之高 度產生變動且表面形狀不定，亦可 4有效地將來自試樣之擴 散反射光聚光’執行高感光度及精产 两度之分光測定，因此， 可提高樹脂種類之識別能力。又，本發明之另一目的在於 提供-種樹脂識別裝置，其係利用用以測定來自試樣之擴 散反射光之光學系小型且其配置不會， 个T珉為甙樣搬送裝置等 之障礙之紅外分光測定者。 [解決問題之技術手段] 為解決上述課題而完成本發明係，_種樹脂識別裝 置，係對依序搬送至測定位置即樹脂片之試樣照射紅外干 涉光，檢測來自該試樣之反射光，並根掳 I很嫘利用傅立葉轉換 所得之資訊判別該試樣之樹脂種類，其特徵在於. 於試樣之上方空間具有使紅外干涉夯.a,—, 丁7九即測定光反射而 201243314 照射至試樣之照射側非球面鏡、與使來自該試樣之反射光 反射而向檢測器傳送之射出側非球面鏡； 以入射側平面與射出側平面交又之方式，定義上述照 射側非球面鏡及上述射出側非球面鏡之配置，該入射側平 面載有向上述照射側非球面鏡導入之測定光之導入光轴與 對於該測定光由該照射側非$ 由/…町w非球面鈿反射且照射至試樣之測 定光之入射光軸’該射出側平面載有對於照射至上述試樣 之測定光由該試樣反射且朝向上述射出側非球面鏡之反射 先之反射光軸與對於該反射光由該射出側非球面鏡反射而 取出之反射光之導出光軸。 '則之般之正反射測定裝置或擴散反射測定裝置 中之照射光學系及射出光學系中，上述入射側平面與上述 射出側平面處於同一平面。即，向照射側光學系導入之測 疋先之導入光轴，對於該測定光由該照射側光學系反射且 照射至試樣之測定光之入射光軸、對於照射至試樣之測定 先由S玄试樣進行反射且朝向射出光學系之反射光之反射光 轴以及對於該反射光由該射出光學系進行反射取出之反 射光之導出光軸均載置於同—平面上。 二此相對’於本發明之樹脂識別裝置中，入射側平面 與射出側平面並非同一平而=▲ — 父又，且試樣之測定點（測 疋先接觸並且反射光射出之點）位於該交叉線上。即，於 本發明之樹脂識別裝置中， 地展開，藉此，可將昭射;It地）而非2維 b m +學系及射出光學系之光學元件 聚集地配置於試樣之上方空間。 6 201243314 再者’作為本發明之樹脂識別裝置中利用之非球面 鏡於導入至照射側非球面鏡之測定光為平行光束（其係 才曰大致平行之光束而非嚴密之平行光束）之情形時，使用 抛物面鏡即可，而導人至照射側非球面鏡之測定光為發散 光束或聚合光束之情形時，使用橢圓面鏡即可。 照射側非球面鏡及射出側非球面鏡之數值孔徑να (numerical aperture )係對應於入射光軸與反射光軸所成之 角度。若該數值孔徑較小則擷取之反射光之光量較少，感 光度下降。另一方面，t值孔徑越大焦深越淺’相對於試 樣位置之上限變動、即高度變動之容許範圍變窄。因此， 對於一方面一定程度地確保測定位置中相對於試樣之高度 變動之谷許聋色圍，—* -v 万面實施尚感光度、向精度之分光測 疋’則必需將數值孔徑限制於適當之範圍内。一般而言， 粉碎後之樹脂片之尺寸為丨mm至6 mm左右為止，因此， 識別時之試樣之高度變動設想為±3 mm左右就足夠。為對 應此較理想，使照射側非球面鏡及射出側非球面鏡之數 值孔徑為0.05〜0.2左右之範圍内，因此，將入射光軸與反 射光軸所成之角度限制於1〇〜5〇。左右之範圍内即可。藉 此，即便試樣之高度變動亦可對檢測器輸送充分強度之反 射光。 於本發明之樹脂識別裝置巾，只要入射側平面與射出 側平面於包含測定點之交又線上交又即可，因此，上述導 入光軸與上述導出光軸之位置關係之自由度較大。例如， 藉由構成為導入光軸與導出光軸載置於同一平面上，而相 201243314 互較近地配置照射側非球面鏡與射出側非球 面鏡，因此有201243314 VI. Description of the Invention: [Technical Field] The present invention relates to a resin identification device for identifying a type of resin of an indefinite shape "more specifically" regarding a resin identification using a non-contact identification resin type using infrared spectrometry [Prior Art] Polypropylene (PP, Polypropylene), polystyrene (ps, p〇lystyrene), acrylonitrile butadiene styrene copolymer (ABS) is widely used in electrical products such as air conditioners, televisions, and washing machines. Various resins such as acrylonitrile-butadienestyrene. Therefore, various kinds of resins are mixed in the resin sheet (fragment) recovered from waste products, so it is necessary to screen each type of resin sheet to use the resin sheet as a new product. The material is reused. In the recycling plant where the waste secret resources are regenerated, it is necessary to effectively screen each type of finely pulverized resin sheet. Therefore, it is known to identify the type of the resin sheet conveyed by the conveyor belt by infrared spectrometry. a resin classification device that is classified later, for example, the classification device described in Patent Document i The sample (resin sheet) is irradiated with infrared interference light, and the reflected light is detected and supplied to a signal processing such as Fourier transform (Fourier transf〇rm) processing. However, since the surface shape of the sample is not constant, it is difficult for the general optical system to be sufficient. The intensity = the light is introduced into the detector. Therefore, the configuration in which the shape of the integrating sphere is fixed to 'the reflected light is focused into the detector. However, in practice, it is difficult to use the spherical mirror to effectively gather the reflected light 201243314. The reason is that the light-receiving surface of the detector used in the Fourier transform infrared spectrometry is generally small in area, and in the off-axis optical system described in Patent Document 1, a spherical mirror is used. Because of the aberration, the light beam overflows from the light-receiving surface of the detector. For this reason, in the reflection measuring device in the general infrared spectrophotometer, an aspherical mirror such as an elliptical mirror or a parabolic mirror is almost without exception. For the optical system (see Non-Patent Document 1, etc.). However, the optical system used in the conventional general reflection measuring device makes the test. In the resin classification device described above, the height of the resin sheet conveyed by the conveyor belt is large. Therefore, the surface of the resin sheet is diffused and reflected by the surface of the resin sheet. The light collecting efficiency becomes quite low. It is difficult to identify the resin type with sufficient precision. Moreover, the optical system used in the conventional general reflection measuring device is not only above the sample, but also the optical element must be placed under the sample. In addition, this problem also occurs in the case where the measuring chamber using the integrating sphere is used as in Patent Document 1. [Prior Art Document] [Patent Document] Patent Document 1: 曰本特Japanese Patent Publication No. Hei 8-300354 [Non-Patent Document] Non-Patent Document 1: "Preliminary Analysis of the FTIR TALK vol.l (1990) Diffuse Reflectance Method", Shimadzu Corporation, [February 28, 2009] Search], Internet <URL: http : //www. an. shimadzu.co.jp/ftir/support/lib/ftirtalk/talk 1 / intro. 4 201243314 htm> [Summary] [Inventory] The problem is that, as the condition of the Fourier-converted infrared spectroscopy for identifying the kind of the resin sheet in the resin type device as described above, it is important that even if the dimension and surface shape of the pattern are ^, L ^ 疋 ' can also effectively condense the diffuse reflection light into the detector, and receive the light from the sleek 'and the light-drying 7G constituting the optical system to + sigh or maintain the device K to transport the sample The way to wait for obstacles. The present invention is directed to solving such a problem, and the main object of the present invention is to provide a resin identification device which can effectively perform even if the height of the sample which is conveyed in a very orderly manner changes and the surface shape is indefinite. The spectroscopic measurement of the diffuse reflection light from the sample is performed to perform high-sensitivity and two-degree spectroscopic measurement, thereby improving the recognition ability of the resin type. Further, another object of the present invention is to provide a resin identification device which is small in that an optical system for measuring diffuse reflection light from a sample is small and its arrangement is not required, and the T珉 is a barrier transport device or the like. Infrared spectrometry. [Means for Solving the Problems] In order to solve the above problems, the present invention is directed to a resin identification device that irradiates infrared light to a sample of a resin sheet that is sequentially transferred to a measurement position, and detects reflected light from the sample. And the root 掳I very 嫘 uses the information obtained by Fourier transform to determine the resin type of the sample, which is characterized in that the space above the sample has infrared interference 夯.a, -, D. An aspherical mirror that illuminates the irradiation side of the sample, and an emission side aspherical mirror that reflects the reflected light from the sample and transmits it to the detector; and the illumination side aspherical mirror is defined by the intersection of the incident side plane and the emission side plane And the arrangement of the emission side aspherical mirror, wherein the incident side plane carries an introduction optical axis of the measurement light introduced into the illumination side aspherical mirror, and the measurement light is reflected by the illumination side non-spherical/... The incident optical axis of the measurement light that is irradiated onto the sample, the emission side plane carrying the measurement light that is irradiated onto the sample is reflected by the sample and directed toward the emission side aspherical surface The first reflection optical axis of the reflector for reflection of the reflected light extraction side is reflected by the aspherical mirror is emitted to the optical axis of light derived. In the illumination optical system and the emission optical system in the regular reflection measuring apparatus or the diffuse reflection measuring apparatus, the incident side plane and the emitting side plane are flush with each other. In other words, the optical axis introduced into the irradiation-side optical system is first introduced into the optical axis, and the measurement optical light is reflected by the irradiation-side optical system and is incident on the incident optical axis of the measurement light of the sample, and the measurement of the irradiation to the sample is performed first. The reflected optical axis of the S-shaped sample that is reflected and reflected toward the exiting optical system and the derived optical axis of the reflected light that is reflected and extracted by the exiting optical system are all placed on the same plane. In the resin identification device of the present invention, the plane of the incident side and the plane of the exit side are not flush with each other, and the target point of the sample (the point at which the sample is first touched and the reflected light is emitted) is located. Cross on the line. That is, in the resin identification device of the present invention, it is developed so that the optical elements of the two-dimensional b m + system and the emission optical system can be collectively arranged in the space above the sample. 6 201243314 Further, as the aspherical mirror used in the resin identification device of the present invention, when the measurement light introduced into the illumination side aspherical mirror is a parallel beam (which is a substantially parallel beam rather than a strictly parallel beam), A parabolic mirror can be used, and when the measurement light to the illumination side aspherical mirror is a diverging beam or a converging beam, an elliptical mirror can be used. The numerical aperture να (numerical aperture) of the illumination side aspherical mirror and the exit side aspherical mirror corresponds to the angle formed by the incident optical axis and the reflected optical axis. If the numerical aperture is small, the amount of light that is extracted and reflected is small, and the sensitivity is lowered. On the other hand, the larger the t-value aperture is, the shallower the focal depth is, and the allowable range of the upper limit variation with respect to the sample position, that is, the height variation is narrowed. Therefore, it is necessary to limit the numerical aperture to the extent that the height of the measurement position relative to the height of the sample is to be determined to a certain extent, and the ** -v surface is subjected to the sensitivity and the accuracy of the spectroscopic measurement. Within the appropriate range. In general, the size of the pulverized resin sheet is about 丨mm to about 6 mm. Therefore, it is sufficient that the height variation of the sample at the time of recognition is about ±3 mm. In order to achieve this, it is preferable that the numerical aperture of the irradiation side aspherical mirror and the exit side aspherical mirror is in the range of about 0.05 to 0.2, so that the angle formed by the incident optical axis and the reflected optical axis is limited to 1 〇 to 5 。. It can be in the range of left and right. Therefore, even if the height of the sample changes, the detector can deliver sufficient intensity of the reflected light. In the resin identification device of the present invention, the incident side plane and the exit side plane may be intersected at the intersection including the measurement point. Therefore, the degree of freedom in the positional relationship between the introduction optical axis and the derived optical axis is large. For example, by arranging that the introduction optical axis and the derivation optical axis are placed on the same plane, and the phase 201243314 is arranged closer to each other, the illumination side aspherical mirror and the emission side aspherical mirror are arranged.
置高度錯開，將導入光軸與導出光軸載置於不同平面上 [發明之效果] 置，即便於試樣為不定形狀 可將充分強度之反射光有效 ，可正確地識別各種形狀、 根據本發明之樹脂識別裝置， 且其向度產生變動之情形時，可课 地聚集，傳送至檢測器。藉此，月 尺寸之樹脂片之種類。又，無需於試樣之下方側（背面側） 配置光學元件，又，可使試樣與光學元件之間隔充分地分 離，因此，不會對例如將試樣搬送至測定位置之輸送帶等 搬送裝置之設置造成障礙，維護性亦良好。 【實施方式】 參照隨附圖式’對本發明之一實施例之樹脂識別裝置 進行說明》圖1係本實施例之樹脂識別裝置之主要部分之 構成圖，圖2係用以對試樣進行紅外分光測定之光學系之 概略立體圖，圖3係顯示圖2所示之光學系之光軸之位置 關係的示意圖。 該樹脂識別裝置具備：由光源部1，包含紅外光源1 1、 聚光鏡12、14及光闡13 4 ;干涉儀2，包含半反射鏡21、 固定鏡22、以及由馬達4所構成之驅動部24往返驅動之移 動鏡23 ;紅外檢測器4，係MCT ( mercury cadmium teUuride，汞碲化鎘（HgCdTe )檢測器等；入出射光學系3， 8 201243314 包含載置於輸送帶7上移動之試樣8照射測定光之照射側 拋物面鏡31、將來自試樣8之反射光取出之射出側抛物面 鏡3 2、以及使取出之反射光一面聚合一面向紅外檢測器4 傳送之聚光鏡33 ;傅立葉轉換處理部5，處理由紅外檢測 器4檢測之信號，算出反射光譜；以及樹脂種類判別部6， 使用反射先t晋資料，判別樹脂種類。圖丨（a )係對入出射 光學系3及輸送帶7以其移動方向正交於紙面之方向進行 描繪者，圖1(b)係以移動方向為左右方向描繪所得之圖。 對本實施例之樹脂識別裝置之概略性動作進行說明。 右自光源部1將波數4〇〇〜4〇〇〇 cnT1左右之範圍之紅外光 導入至干涉儀2，則干涉儀2以半反射鏡21將該紅外光分 割，移動鏡23與固定鏡22分別進行反射，再次由半反射 鏡21進行合併，藉此，生成紅外干涉光。該紅外干涉光經 由入出射光學系3照射至輸送帶7上之試樣8。試樣8係稱 作破碎機殘餘物（shredder residue)之樹脂片，且藉由輸送 帶7逐次依序搬運。紅外干涉光中之特定波長之紅外光係 相應於試樣8所含之成分被吸收，並將該紅外光以外之紅 外光進订反射。該反射光係經由入出射光學系3傳送至紅 外檢測器4,紅外檢測器4將與受光之光之強度相應之檢測 信號傳送至傅立葉轉換處理部5。 紅外干涉光係隨著時間經過強度進行變化之光，因 此，反射光亦同樣地產生強度變化。因此，傅立葉轉換處 理。P 5藉由將檢測仏唬進行傅立葉轉換且將時間軸轉換為 頻率軸，而取得特定之波數範圍之反射光譜。樹脂種類判 201243314 別部6係自該反射光譜獲得反映應識狀樹脂所具有之吸 收光譜之特徵性且典型性之光譜形狀之i個或複數個波數 域群之反射光譜職，判$是否與上述應識別之樹脂一 致’且根據其判定結果，判斷試樣8之樹脂種類。又，於 省判疋中亦可使用藉由將反射光譜進行克拉莫-克若尼 (Kramers-Kronig)轉換而獲得之吸收光譜，判定複數個特 定波數中有無波蜂，並根據其判^結果判錢脂種類。 傅立葉轉換紅外分光測定對象之樹脂片為不定形狀， 且尺寸亦不固疋。其中，樹脂片係經破碎機粉碎者，故不 存在極大之尺寸，且尺寸係限制於某一特定之範圍内，最 小1 mm以下最大6 mm左右之範圍内。因此，輸送帶7上 之试樣8之上表面之高度變動亦限制於特定範圍内。此處， 於測定位置中設想之試樣高度之最大變動幅度為±3瓜瓜。 照射側拋物面鏡3 1及射出側拋物面鏡32均為朝向該 抛物面鏡入射之光束之光軸與自該拋物面鏡射出之光束之 光軸所成之角度為90之離軸角90。之拋物面鏡。其中，此 處係自干涉儀2朝向入出射光學系3導入之紅外干涉光為 平行光束，故使用抛物面鏡’但於該紅外干涉光為擴散光 束或聚合光束之情形時’代替拋物面鏡而使用橢圓面鏡。 於本實施例之樹脂識別裝置中，其特徵在於··如圖2、 圖3所示’載有入射至照射側拋物面鏡3 1之反射面之光束 之光軸即導入光轴S1及自照射側拋物面鏡3 1之反射面反 射且一面聚光一面照射至試樣8之測定光之入射光軸S2的 平面Pin、與載有對於上述測定光自試樣8上之測定點q發 10 201243314 出且朝向射出側抛物面鏡3 2之反射面之光束之光軸即反射 光軸S3及自射出側抛物面鏡32之反射面反射且成為大致 平行光之導出光軸S4的平面Pout並非同一面上而是交叉。 因此，該等光軸S1〜S4並非限制於1個面内而是3維地展 開。 又，以入射光軸S2與反射光軸S3所成之角度0處於 10〜50°之範圍内之方式，定義照射側拋物面鏡31與射出 側拋物面鏡32之配置。因此，2個抛物面鏡3丨、32為同一 焦距之情形時，該等抛物面鏡3 1、3 2之數值孔徑να處於 〇·〇5〜0.25之範圍内。其如下所述，即便存在試樣8之高度 變動之情形時，亦以獲得足以判別試樣8之樹脂種類之強 度之信號之方式實驗性地導出之數值範圍。 作為本實施例之樹脂識別裝置之測定例，說明對於遍 及3500〜5〇〇 cm·1之波數範圍之ABS樹脂片，使入射光轴 S2與反射光軸S3所成之角度0為34.4。、波數解析度為16 cm 1進行測定之情形。測定對象之樹脂片係黑色、白色大、 白黃色小’但任一者之反射光譜均於2250 cm·1附近測定類 似波峰之光譜。此係ABS樹脂中特有之CN官能基之波峰。 一般而言’可知於近紅外區域中，與用以使樹脂色為黑色 之之吸收相比，其他成分之吸收較小，故難以識別，累色 之樹脂，但使用紅外光之情形時，即便黑色樹脂亦可與白 色或白黃色之樹脂同樣地進行CN官能基之檢測。因此，樹 脂種類判別部6可藉由於反射光譜上判定源自CN官能基之 波峰之有無，而判定測定對象試樣是否為ABS樹脂。 201243314 圖4係計測將黑色之ps 時之PS樹脂中特有之CH官…乍象且改變試樣高度 b 土的反射變化（波數域3000 ^前後 > 所得^果。亦於此時’人射光軸S2與反射光 軸S3所成之角度Θ為34.4。，且波數解析度為Μ…。由 該圖可知’即，於—般認為難以測定之黑色樹脂中，亦可 於試樣上表面高度為_4 m 之靶圍中，觀測CH官 能基之反射率之局部變化1，可知即便存在此種程度之 試樣高度㈣’亦可自反射光譜獲得進行作為PS樹脂之判 定必需之。再者，亦於將人射光軸S2與反射光抽S3 所成之角度0變更為46.4。進行計測所得之結果中，確認即 便存在容許高度略微降低之情形，但亦可同樣地識別ps樹 脂特有之官能基回應。 如上所述，即便於認知難以於近紅外光中根據反射光 譜識別樹脂種類之黑色樹脂之情形時，本發明之樹脂識別 裝置亦可利用紅外光而識別樹脂種類。 t 本發明之樹脂識別裝置並未限定於上述實施例之形 態’可進行各種變形。例如’於上述實施例之構成中，導 入光轴^與導出光軸S4係位於大致同一平面上（即大致 相同之问度）且大致平行，但導入光軸W與導出光轴以 無需為同一平面上’又，亦無需平行。因此，不僅拋物面 :3 1 32之配置之自由度較高’而且干涉儀2或紅外檢測 器與入出射光學系3之位置關係之自由度亦較高。又， 上述實施例係於樣品入射前設置紅外干涉部，但即便於樣 品反射後進行設置亦可獲得相同之效果。 12 201243314 又，應當暸解上述實施例僅為本發明之一例，故關於 上述記載以外之方面’即便於本發明之精神之範圍内添加 適當修正，.追加、變更’亦包含於本案申請專利範圍中。 【圖式簡單說明】 圖 圖1係本發明之一實施例之樹脂識別裝置之概略構成 Z/係本實施例之樹脂識別裝置中之紅外分光測定部 之光學系的概略立體圖。 意圖 圖3係顯示圖2所示之光學系 之光軸之位置關係的示 化之變黑色。S樹-之高度時之反射光譜變 【 2 4 6 主要元件符號說明】 光源部 干涉儀 入出射光學系 紅外檢測器 傅立葉轉換處理部 樹脂種類判别部 輸送帶 試樣 紅外光源 13 11 201243314 12 、 14 、 33 聚光鏡 13 光闌 21 半反射鏡 22 固定鏡 23 移動鏡 24 驅動部 3 1 照射側抛物面鏡 32 射出側拋物面鏡 SI 導入光軸 S2 入射光軸 S3 反射光轴 S4 導出光軸 Q 測定點 θ 角度 Pin ' Pout 平面 14When the height is shifted, the introduction optical axis and the derivation optical axis are placed on different planes [effect of the invention], and even if the sample has an indefinite shape, the reflected light of sufficient intensity can be effectively used, and various shapes can be correctly recognized. In the case where the resin identification device of the invention is changed in the degree of orientation, it can be gathered in a class and transmitted to the detector. Thereby, the type of resin sheet of the month size. Further, since it is not necessary to dispose the optical element on the lower side (back side) of the sample, and the distance between the sample and the optical element can be sufficiently separated, for example, the conveyance of the sample to the measurement position or the like is not carried out. The installation of the device creates obstacles and maintains good performance. [Embodiment] A resin identification device according to an embodiment of the present invention will be described with reference to the accompanying drawings. Fig. 1 is a configuration diagram of a main part of the resin identification device of the present embodiment, and Fig. 2 is for infrared irradiation of a sample. A schematic perspective view of the optical system of the spectroscopic measurement, and FIG. 3 is a schematic view showing the positional relationship of the optical axes of the optical system shown in FIG. The resin identification device includes a light source unit 1 including an infrared light source 1 1 , condensing mirrors 12 and 14 , and a light guide 13 4 . The interferometer 2 includes a half mirror 21 , a fixed mirror 22 , and a driving unit composed of the motor 4 . 24 reciprocating mobile mirror 23; infrared detector 4, MCT ( mercury cadmium teUuride, mercury cadmium telluride (HgCdTe) detector, etc.; inlet and exit optical system 3, 8 201243314 including the test carried on the conveyor belt 7 The sample 8 irradiates the illumination side parabolic mirror 31, the exit side parabolic mirror 3 which takes out the reflected light from the sample 8, and the reflected light which is taken out and the condensing mirror 33 which is transmitted to the infrared detector 4; Fourier transform The processing unit 5 processes the signal detected by the infrared detector 4 to calculate a reflection spectrum, and the resin type determining unit 6 determines the resin type using the reflection first data. Fig. a (a) is the accommodating optical system 3 and the transport The belt 7 is drawn in a direction in which the moving direction is orthogonal to the plane of the paper, and Fig. 1(b) is a diagram in which the moving direction is drawn in the left-right direction. The schematic operation of the resin identifying apparatus of the present embodiment is performed. When the right self-light source unit 1 introduces infrared light having a range of about 4 〇〇 to 4 〇〇〇 cnT1 to the interferometer 2, the interferometer 2 divides the infrared light by the half mirror 21, and moves the mirror 23 and The fixed mirrors 22 are respectively reflected and combined again by the half mirror 21 to generate infrared interference light, which is irradiated to the sample 8 on the conveyor belt 7 via the entrance and exit optical system 3. The sample 8 is called a resin sheet as a shredder residue, and sequentially transported by the conveyor belt 7. The infrared light of a specific wavelength in the infrared interference light is absorbed corresponding to the components contained in the sample 8, and the Infrared light other than infrared light is reflected and reflected. The reflected light is transmitted to the infrared detector 4 via the input/exit optical system 3, and the infrared detector 4 transmits a detection signal corresponding to the intensity of the received light to the Fourier transform processing unit 5. The interference light system changes light with intensity over time. Therefore, the reflected light also produces a change in intensity. Therefore, Fourier transform processing. P 5 performs Fourier transform by detecting 仏唬 and transforms the time axis. For the frequency axis, the reflection spectrum of a specific wavenumber range is obtained. The resin type is judged to be 201243314. The 6 series are obtained from the reflection spectrum to obtain the characteristic and typical spectral shape of the absorption spectrum of the identifiable resin. Or the reflection spectrum of a plurality of wavenumber domain groups, whether $ is consistent with the above-mentioned resin to be identified, and based on the determination result, the resin type of the sample 8 is judged. The absorption spectrum is obtained by the Kramer-Kronig conversion, and the presence or absence of a wave bee is determined in a plurality of specific wave numbers, and the type of money is judged according to the result of the judgment. The resin sheet of the Fourier transform infrared spectroscopic measurement object has an indefinite shape and is not fixed in size. Among them, the resin sheet is pulverized by the crusher, so there is no extremely large size, and the size is limited to a certain range, and the minimum is 1 mm or less and the maximum is about 6 mm. Therefore, the height variation of the upper surface of the sample 8 on the conveyor belt 7 is also limited to a specific range. Here, the maximum variation range of the sample height assumed in the measurement position is ±3 melon. The illumination side parabolic mirror 31 and the exit side parabolic mirror 32 are both off-axis angles 90 at an angle of 90 between the optical axis of the beam incident toward the parabolic mirror and the optical axis of the beam emerging from the parabolic mirror. Parabolic mirror. Here, since the infrared interference light introduced from the interferometer 2 toward the input/exit optical system 3 is a parallel beam, a parabolic mirror is used, but when the infrared interference light is a diffused beam or a concentrated beam, the surface mirror is used instead of the parabolic mirror. Elliptical mirror. In the resin identification device of the present embodiment, as shown in Fig. 2 and Fig. 3, the optical axis of the light beam incident on the reflecting surface of the irradiation-side parabolic mirror 31 is introduced into the optical axis S1 and self-illumination. The plane Pin of the incident optical axis S2 of the measurement light which is reflected by the reflection surface of the side parabolic mirror 31 and which is irradiated onto the sample 8 while being condensed, and the measurement point q on the sample 8 for the measurement light are carried. 10 201243314 The plane Pout of the optical axis of the light beam that is directed toward the reflecting surface of the output side parabolic mirror 32, that is, the reflected optical axis S3 and the reflecting surface of the parabolic mirror 32 that is reflected by the output side, and which is substantially parallel light, is not the same plane. It is a cross. Therefore, the optical axes S1 to S4 are not limited to one plane but are expanded three-dimensionally. Further, the arrangement of the irradiation side parabolic mirror 31 and the emission side parabolic mirror 32 is defined such that the angle 0 formed by the incident optical axis S2 and the reflected optical axis S3 is in the range of 10 to 50°. Therefore, when the two parabolic mirrors 3A and 32 are at the same focal length, the numerical apertures να of the parabolic mirrors 3 1 and 3 2 are in the range of 〇·〇5 to 0.25. As described below, even in the case where the height of the sample 8 is varied, a numerical range experimentally derived in such a manner as to obtain a signal sufficient to discriminate the strength of the resin of the sample 8 is obtained. As a measurement example of the resin identification device of the present embodiment, the angle 0 between the incident optical axis S2 and the reflected optical axis S3 is 34.4 for the ABS resin sheet having a wavenumber range of 3500 to 5 〇〇 cm·1. The case where the wave number resolution is 16 cm 1 is measured. The resin sheet to be measured was black, white, and white-yellow, but the reflectance spectrum of either of them was measured at around 2250 cm·1. This is the peak of the CN functional group unique to the ABS resin. In general, it is known that in the near-infrared region, compared with the absorption for making the resin color black, the absorption of other components is small, so it is difficult to recognize the resin which is tired, but when infrared light is used, even The black resin can also be tested for the CN functional group in the same manner as the white or white-yellow resin. Therefore, the resin type discriminating unit 6 can determine whether or not the sample to be measured is an ABS resin by determining the presence or absence of a peak derived from the CN functional group in the reflection spectrum. 201243314 Figure 4 is a measure of the reflection of the characteristic of the CH resin in the PS resin when the black ps is measured and changes the height of the sample b (wave number field 3000 ^ before and after > the result of the ^ fruit. Also at this time 'people The angle Θ formed by the optical axis S2 and the reflected optical axis S3 is 34.4, and the wave number resolution is Μ... As can be seen from the figure, that is, in the black resin which is generally considered to be difficult to measure, it may be on the sample. In the target circumference with a surface height of _4 m, the local change 1 of the reflectance of the CH functional group was observed, and it was found that even if the sample height (4) of such a degree is present, it is necessary to obtain the measurement of the PS resin from the reflection spectrum. In addition, the angle 0 formed by the human light axis S2 and the reflected light extraction S3 is also changed to 46.4. It is confirmed that the allowable height is slightly lowered in the measurement result, but the ps resin specificity can be similarly recognized. In response to the above, even in the case where it is difficult to recognize a black resin of a resin type according to a reflection spectrum in near-infrared light, the resin identification device of the present invention can recognize the resin type by using infrared light. The resin identification device of the invention is not limited to the embodiment of the above embodiment, and various modifications are possible. For example, in the configuration of the above embodiment, the introduction optical axis and the derivation optical axis S4 are substantially flush with each other (that is, substantially the same). Questioning) and substantially parallel, but the introduction of the optical axis W and the derivation of the optical axis do not need to be on the same plane 'again, there is no need to be parallel. Therefore, not only the parabolic surface: the degree of freedom of the configuration of 3 1 32 is higher' and the interferometer 2 or The degree of freedom in the positional relationship between the infrared detector and the entrance and exit optical system 3 is also high. Further, in the above embodiment, the infrared interference portion is provided before the sample is incident, but the same effect can be obtained even if the sample is reflected after being reflected. 201243314 It is to be understood that the above-described embodiments are merely examples of the present invention. Therefore, in addition to the above description, "additional and modified" are added to the scope of the present application even if appropriate modifications are added within the scope of the spirit of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a resin identification device according to an embodiment of the present invention. FIG. 1 is a resin identification device of the present embodiment. A schematic perspective view of the optical system of the infrared spectrometry unit. Fig. 3 shows the change of the positional relationship of the positional relationship of the optical axes of the optical system shown in Fig. 2. The reflection spectrum of the height of the S-tree is changed [2 4 6 Description of main components and symbols] Light source unit interferometer into and out of the optical system Infrared detector Fourier transform processing unit Resin type discriminating part Conveyor belt sample Infrared light source 13 11 201243314 12, 14 , 33 Condenser 13 Optical 阑 21 Half mirror 22 Fixed mirror 23 Moving mirror 24 Driving part 3 1 Irradiation side parabolic mirror 32 Output side parabolic mirror SI Introduction optical axis S2 Incident optical axis S3 Reflected optical axis S4 Derived optical axis Q Measuring point θ Angle Pin ' Pout Plane 14