201217773 六、發明說明： 【發明所屬之技術領域】 本發明是有關於一種測量光源發光特性之方法，特別 是關於測量隨光源周圍之溫度變化之光源發光特性之 法。 【先前技術】 在將發光二極體設置于照明儀器時，各廠商需要解決 之技術問題就是散熱問題。雖然散熱效率得到了提高，但 發光二極體晶片之發熱量仍相當高。若不具備散熱措施之 發光二極體晶片之溫度過高，則將導致晶片本身或包裝樹 脂之劣化。尤其是，若周邊溫度高，則將使晶片溫度變得 更高，最終降低發光效率，縮短晶片壽命。另外，晶片溫 度之上升所導致之光速、波長之變化和顏色之變化等，給 元件開發人員或照明設計人員在確保顏色再現性或連續變 化性方面帶來困難。因此，在開發將發光二極體晶片之熱 擴散至外部之技術過程中，在周圍溫度（ambient temperature)條件下之光特性評價是必須的。 發光二極體等光源之發光特性可用光學積分器測量。 圖1為利用現有技術光學積分器之光源光學特性的測量方 法之順序圖。如圖1所示，利用現有技術光學積分器之光 源光學特性測量方法如下：將欲檢查光學特性之光源固定 於光學積分器中央部S100。向光源施加電源S200。利用 電加熱器和風扇向光學積分器内部供應加熱空氣S300。測 量光學積分器之内部溫度，若溫度低於預定之檢查溫度， 4 201217773 Λ. 則向電加熱器供應電源以加熱空氣，*若溫度高於預定溫 度以上’則切斷電源供應。另外，通過同時調節風扇之旋 ，速度來調節空氣之供應量，以完成對光學積分器内部溫 ^調節。部分光學積分器通過在其内部設置散熱風扇來 =光學積分H之内部溫度s彻。若中空内部之溫度達到 檢查溫度，則評價光源之光學特性S50(^ 【發明内容】 停件之光學特性隨光學二極體晶片之散熱 影響較大⑴散熱面為垂直亦 =之201217773 VI. Description of the Invention: [Technical Field] The present invention relates to a method for measuring the light-emitting characteristics of a light source, and more particularly to a method for measuring the light-emitting characteristics of a light source as a function of temperature around the light source. [Prior Art] When the light-emitting diode is placed on a lighting instrument, the technical problem that each manufacturer needs to solve is the heat dissipation problem. Although the heat dissipation efficiency is improved, the heat generation of the LED chip is still quite high. If the temperature of the LED chip without heat dissipation is too high, it will cause deterioration of the wafer itself or the packaging resin. In particular, if the peripheral temperature is high, the wafer temperature will be made higher, eventually reducing the luminous efficiency and shortening the wafer life. In addition, the speed of light, the change in wavelength, and the change in color caused by the rise in wafer temperature have made it difficult for component developers or lighting designers to ensure color reproducibility or continuous variation. Therefore, in the development of a technique for diffusing heat of a light-emitting diode wafer to the outside, evaluation of optical characteristics under ambient temperature conditions is necessary. The light-emitting characteristics of a light source such as a light-emitting diode can be measured by an optical integrator. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a sequence diagram showing a method of measuring the optical characteristics of a light source using a prior art optical integrator. As shown in Fig. 1, the optical source optical characteristic measuring method using the prior art optical integrator is as follows: The light source to be inspected for optical characteristics is fixed to the central portion S100 of the optical integrator. A power source S200 is applied to the light source. The heated air S300 is supplied to the inside of the optical integrator using an electric heater and a fan. Measure the internal temperature of the optical integrator. If the temperature is lower than the predetermined check temperature, 4 201217773 Λ. Supply power to the electric heater to heat the air. * If the temperature is higher than the predetermined temperature, turn off the power supply. In addition, the supply of air is adjusted by simultaneously adjusting the rotation and speed of the fan to complete the internal temperature adjustment of the optical integrator. A part of the optical integrator is set to have an internal temperature s of the optical integral H by providing a heat dissipating fan inside. If the temperature inside the hollow reaches the inspection temperature, the optical characteristic of the light source is evaluated. S50 (^ [Content of the invention] The optical characteristics of the stop member have a large influence on the heat dissipation of the optical diode chip (1) the heat dissipation surface is vertical.
則散熱面向下亦或向上與否；3)發光期J :=溫度差異;4)發光二極體周邊風速;5)J:和 極體周邊之流體流動等。 發光一 性4=:;::::=，測量光源光學特 根據作為測量物件之光面之散熱現象。因此， 達到熱平衡之時間有傳面處理情況，其 ，平:狀態而需在調節二:二？外而:達 時，根據風速和接觸面 子控制4 ’而在此 ，同’因此’較之無風狀態之二m體散熱之影 高，導致獲得錯誤之測量值:υ1條件，光源之效率變 尤其是，若在光學稽八。„ 制對流所產生之強制散熱風扇’則因強 201217773 另外，若為發光二極體相關產品，則因其形狀各異， ==器=體之流動，且由光學積分器内部結 值因此’導致獲得特性較實際之光源 與特述!的’本發明利用光學積分器之光源光 制由用於向内部供應空氣之供氣 藉、用練制上述供氣料所供應之以之 量:ΐ構成之光學積分器測量光源茲特性： ^特徵在於’包括如下步驟：a)在上述光學積分器内部設 置上述光源’ b)向上述光源供應電源；e)運行上述田产 ，節部件及上述供氣部件向上述光學積的内部供應二 。之/皿度經測量而達到衝擊溫度 (Ta) ’則停止上述供氣部件之運行以進行等待直到溫 f ^測量溫度（ΤΠ〇 ; e)測量上述主體内部之溫度變 =幅度，以判定主體内部溫度是否穩定；及f)若 =溫=等r並保存上述光源光學特性，而若 μΪΓΓ光學積分器之光源光學特性測量方法具有 :下第一、因在發光二極體周邊不存在人為空氣流 動之狀態下測量’因此，*會獲得錯誤之啦值。另外， 量結果之再現性好。第二、可在與實際光源 之使用狀_似的狀態下測量隨溫度變化之光源之光學特 6 1 1201217773 性。第二、通過設置拍爾帖(Peltier)元件，在檢杳光源光學 特性時，不僅控制光學積分器内部溫度，還控制光源自身 溫度。 為讓本發明之上述和其他目的、特徵和優點能更明顯 易懂，下文特舉較佳實施例，並配合所附圖式，作詳細說 明如下。 【實施方式】 下面，結合附圖來對本發明一實施例進行詳細說明。 但是，本發明實施例可變形為各種其他形式，而且本發明 之範圍不受下面詳述之實施例之限制。本發明之實施例之 目的是幫助具備本領域一般知識之人更好地理解本發明。 圖2為用於本發明利用光學積分器之光源光學特性測 量方法之光學積分器一實施例概略圖。如圖2所示，本實 施例光學積分器100 ’包括：主體10，形成實際為球形之 中空體；光源支撐台50，固定設置於主體之中空體。主體 10包括：第一貫通孔10-3，供向設置于光源支撐台5〇 一 端部之光源供應電源之電線通過；第二貫通孔1〇·4，向主 體10之中空内部供應經調節溫度之空氣。未說明標記貫通 孔10-1和10-2各為檢測器11和起到補充作用之輔助光源 12而设置。檢測器11使用照度計（iiiuminanceineter) ^ 分光輻射儀（spectroradiometer )。照度計是測量光照度之 裝置’較之測量分光輻射照度之分光輻射儀，具有態 範圍（dynamic range)非常廣之優點，但不能測量分光^ 性。分光輻射儀是測量分光輻射照度之裝置，是可用于'則 201217773t. 量發光-極體光度、輻射度、顏色特性等之多用途裝置。 因被附著之照度計德$值有可能受溫度之影響 ，因此採 取隔熱措施為宜。 附圖標記13及14各為隔板（Baffle)。本實施例之 光源20為高亮度發光二極體^因發光二極體絲由晶粒 (chipdie)和杯（cup)、端子線（terminalwire)、環氧 化物=(epoxy molding)等各種結構構成且具有比較大 ，熱J量，因此，達到動態熱平衡需要相當之時間。尤其 是，若為白色發光二極體，則將在普通藍色發光二極體晶 片上塗布黃色螢紐（例如，YAG: Ce粉末）製作而成， 因此’其分光特性除受發光二極體晶片特性之影響之外， 還受螢光體之光學躲之影響，具有非常廣之分光線寬 度而且’因螢光體之溫度依賴性尤其高，溫度越高榮光 效率:降越明顯，因此，環境溫度對測量之影響較大。 光源支撐台50為中空之管狀，其一端設置於上述主體 =之中空中心部，而另一端固定於主體中空之内周面，以 =閉上述主體之第一貫通孔1〇_3。在光源支撐台5〇之中 空内部，有向光源20供應電源之電線通過。 …在主體10之形成第二貫通孔10-4之外周面，設置供 氣b 30。在供氣管内部設置電加熱器31，而在電加熱器^ 連接有控制器40以控制供應至電加熱器之電源。另外，々 ，器40連接於設置在主體1〇之溫度感測器51，以根據^ 得之溫度值來控制供應至電加熱器之電源值，從而控制供 應至主體10中空之空氣溫度。溫度感測器51使用熱電^ 8 201217773 (Thermocouple)。另外，在供氣管30外部，連接用於供 應空氣之供氣部件32。雖然未圖示，但在本實施例中設置 有通過電機驅動之風扇。風扇設置於供氣管30内部。控制 器40連接於與風扇連接之電機，以根據溫度感測器51之 測量值來輸入控制風扇之旋轉速度。 在如圖2所示之光學積分器一實施例中，作為測量溫 度之部件將熱電偶（Thermocouple)設置於主體10内部， 但也可採用在主體外部設置非接觸式測溫儀以測量溫度之 方法。非接觸式測溫儀是指以在遠離欲測量之物件之狀態 下測量溫度之溫度計。非接觸式測溫儀有光學高溫計 (Optical Pyrometer )、輻射高溫計（Radiation Pyrometer)、 紅外線溫度計（Infrared Thermometer)等。 因一般使用之熱電偶（Thermocouple)之被覆為黃色 系’因此’吸收短波長之光而反射長波長之光。因此，在 不同之波長影響測量值。在外部設置非接觸式測溫儀之方 式’可避免產生上述誤差。 圖3為利用本發明一實施例光學積分器之光源光學特 性測里方法的順序圖。如圖3所示，利用本發明光學積分 器之光源光學特性測量方法如下： 首先’在S1步驟將發光二極體光源固定于光源支撐 台。此時，需防止發光二極體之表面被污染。 接著，在S2步驟向上述發光二極體施加正向偏置電 流設定值。較佳地，在施加電流之後等待3〜5分鐘以達到 熱平衡。 201217773 * l 在S3步驟’向電加熱器31供應電源並驅動供氣部件 32之風扇’以使加熱空氣供應至光學積分器主體1〇内部 之中空區。 在S4步驟’比較設置於中空之中心部發光二極體光 源周圍之溫度感測器51所測得之光源周圍之溫度和預定 之衝擊溫度（Ta)，若達到衝擊溫度（Ta)，則停止供氣 部件32之風扇之運行。若光源周圍之溫度低於衝擊溫度 (Ta) ’則知_南電加熱器31之溫度並提高風扇之旋轉速 度，以達到衝擊溫度（Ta)。 圖4為在如圖3所示之測量方法中隨時間變化之光源 周圍溫度曲線圖。如圖4所示，隨著被電加熱器31加熱之 空氣通過風扇而供應至光學積分器内部，光源周圍之溫度 逐漸上升直至達到衝擊溫度（Ta)。衝擊溫度（Ta)是高 於欲測量光源特性之測量溫度（Tm)之溫度，是達到測量 溫度（Tm)之中間步驟。若光源周圍之溫度達到衝擊溫度 (Ta)，則停止風扇並等待，以使光源周圍之溫度自然降 低至測量溫度（Tm)。所設定之衝擊溫度（Ta)根據與測 里光源光學特性之測量溫度（Tm)有所不同。圖5為測量 溫度（Tm)和衝擊溫度（Ta)關係曲線圖。如圖5所示， 測量溫度（Tm)越高衝擊溫度（Ta)也越高，而衝擊溫度 (Ta)和測量溫度（Tm)之間大致存在二次函數關係。若 光源周圍之溫度降低至測量溫度（Tm)，則進入下一步。 在S5步驟’判斷光學積分器主體内部溫度是否達到 適合於評價光學特性之穩定狀態。測量一定時間内光源周 1 1201217773 圍之溫度並將溫度之變化幅度與預定之允許範圍進行比 較，從而判斷穩定與否。 若有必要，除溫度之變化幅度之外’還可通過測量先 學積分器主體内部之無風狀態與否’判斷穩定與否。可將 風速計直接設置於光學積分器内部以測量無風狀態與否， 但可能因風速計而產生光學特性測量誤差，因此，通過如 下方法測量為宜。 首先，在主體内部設置風速計。接著，利用所設置 風速計來測量在改變風扇旋轉速度和衝擊溫度之各情兄 下，達到無風狀態所需時間。接著，利用上述所測得之 料製作查找表（lookup table)。最後，移除風速計以处 準備過程。在實際測量光學特性時，利用查找表查找^風 扇之旋轉速度和衝擊溫度之無風狀態到達時間之後，與所 經過之時間進行比較，以判斷是否為無風狀態。 ^ 在S6步驟，若判定S5步驟之光學積分器主體内部穩 定，則保存通過照度計（illuminance meter)或分光輕射儀 (spectroradiometer)等檢測器u測得之光學特性資料。 另外，還保存施加于發光二極體之正向偏置電源值、發光 二極體接合f壓值、光源周圍之溫度值等測量條件。若判 定S5步驟之光學積分||主體㈣不穩定，則在等待預定 時間之後，返回S5步驟再次判斷穩定與否。 另外’若在改變測量溫度（Tm)之同時測量光源光學 特性，則纟S6步驟保存光學特性資料和測量條件值之後， 在S7步驟’判斷是否達到最大測量溫度（Tmax)。若未 201217773Then, the heat dissipation surface is also downward or upward; 3) the illuminating period J: = temperature difference; 4) the surrounding wind speed of the illuminating diode; 5) J: and the fluid flow around the polar body. Luminous property 4=:;::::=, measuring the optical properties of the light source according to the heat dissipation phenomenon of the light surface as the measuring object. Therefore, the time to reach the heat balance has a face-to-face treatment situation, which is flat: the state needs to be adjusted two: two? External: When it is reached, according to the wind speed and the contact surface control 4', here, the same as the 'then' is higher than the windless state of the two m body heat dissipation, resulting in the wrong measurement value: υ1 condition, the efficiency of the light source is especially Yes, if it is in the optical. „ Forced cooling fan generated by convection is strong 201217773 In addition, if it is a light-emitting diode related product, its shape varies, == device = body flow, and the internal value of the optical integrator is therefore ' The light source of the present invention utilizing an optical integrator is supplied by the air supply for supplying air to the inside, and is supplied by the above-mentioned air supply material: ΐ The constructed optical integrator measures the source characteristics: ^ is characterized by 'including the following steps: a) providing the above-mentioned light source 'b) inside the optical integrator to supply power to the light source; e) operating the above-mentioned field, section parts and the above-mentioned gas supply The component supplies two to the inside of the optical product described above. The vessel is measured to reach the impact temperature (Ta)', and then the operation of the gas supply member is stopped to wait until the temperature f^measures the temperature (ΤΠ〇; e) to measure the above subject The internal temperature changes = amplitude to determine whether the internal temperature of the body is stable; and f) if = temperature = equal r and saves the optical characteristics of the above source, and if the optical characteristics of the source of the μΪΓΓ optical integrator The method has the following steps: the first one is measured in the state where there is no artificial air flow around the light-emitting diode. Therefore, * will obtain the wrong value. In addition, the reproducibility of the quantity result is good. Second, it can be in actual and actual In the state of use of the light source, the optical characteristic of the light source that changes with temperature is measured. Secondly, by setting the Peltier element, not only the optical integrator is controlled when the optical characteristics of the light source are detected. The above and other objects, features, and advantages of the present invention will become more apparent and understood. The embodiments of the present invention are described in detail below with reference to the accompanying drawings. However, the embodiments of the present invention may be modified in various other forms, and the scope of the present invention is not limited by the embodiments described below. The purpose is to help those skilled in the art to better understand the present invention. Figure 2 is an optical characteristic measurement of a light source for use in an optical integrator of the present invention. An optical integrator of the measuring method is an overview of the embodiment. As shown in Fig. 2, the optical integrator 100' of the present embodiment comprises: a main body 10, which forms a hollow body which is actually spherical; the light source supporting table 50 is fixedly disposed in the hollow of the main body. The main body 10 includes a first through hole 10-3 through which a wire for supplying power to a light source provided at one end of the light source support table 5 is passed, and a second through hole 1〇·4 for supplying to the hollow interior of the main body 10. Temperature-adjusted air. It is not illustrated that the marker through-holes 10-1 and 10-2 are each provided for the detector 11 and the supplementary auxiliary light source 12. The detector 11 uses a illuminometer (iiiuminanceineter) ^ spectroradiometer ). An illuminometer is a device that measures illuminance. Compared to a spectroradiometer that measures illuminance of spectroscopic radiation, it has the advantage of having a very wide dynamic range, but cannot measure spectroscopic properties. The spectroradiometer is a device for measuring the illuminance of spectroscopic radiation, and is a multi-purpose device that can be used for '201217773t. luminosity-polarity luminosity, irradiance, color characteristics, and the like. Since the attached illuminance meter value may be affected by temperature, it is advisable to take insulation measures. Reference numerals 13 and 14 are each a baffle. The light source 20 of the embodiment is a high-brightness light-emitting diode. The light-emitting diode wire is composed of various structures such as a chip die and a cup, a terminal wire, and an epoxy molding. And it has a relatively large amount of heat J, so it takes a considerable amount of time to reach the dynamic heat balance. In particular, in the case of a white light-emitting diode, a yellow fluorescent button (for example, YAG: Ce powder) is applied to a common blue light-emitting diode wafer, so that the light-receiving property is excluded from the light-emitting diode. In addition to the influence of the characteristics of the wafer, it is also affected by the optical hiding of the phosphor, and has a very wide range of light widths and 'because the temperature dependence of the phosphor is particularly high, the higher the temperature, the more efficient the glory efficiency is. The ambient temperature has a large influence on the measurement. The light source support table 50 has a hollow tubular shape, one end of which is disposed at the hollow central portion of the main body, and the other end of which is fixed to the inner peripheral surface of the hollow body of the main body to close the first through hole 1〇_3 of the main body. Inside the light source support table 5, there is a wire through which the power source 20 is supplied with power. The supply air b 30 is provided on the outer peripheral surface of the main body 10 where the second through hole 10-4 is formed. An electric heater 31 is provided inside the air supply pipe, and a controller 40 is connected to the electric heater to control the power supply to the electric heater. Further, the damper 40 is connected to the temperature sensor 51 provided in the main body 1 to control the power supply value supplied to the electric heater in accordance with the temperature value obtained, thereby controlling the temperature of the air supplied to the hollow of the main body 10. The temperature sensor 51 uses a thermoelectric ^ 8 201217773 (Thermocouple). Further, outside the air supply pipe 30, a gas supply member 32 for supplying air is connected. Although not shown, in the present embodiment, a fan driven by a motor is provided. The fan is disposed inside the air supply pipe 30. The controller 40 is connected to a motor connected to the fan to input the rotational speed of the control fan based on the measured value of the temperature sensor 51. In an embodiment of the optical integrator as shown in FIG. 2, a thermocouple is placed inside the main body 10 as a component for measuring temperature, but a non-contact thermometer can be disposed outside the main body to measure the temperature. method. A non-contact thermometer is a thermometer that measures temperature in a state away from the object to be measured. Non-contact thermometers include an optical pyrometer, a Radiation Pyrometer, and an infrared thermometer. The thermocouple used in general is covered in a yellow color. Therefore, light of a short wavelength is absorbed to reflect light of a long wavelength. Therefore, the measured values are affected at different wavelengths. The method of setting the non-contact thermometer on the outside can avoid the above error. Fig. 3 is a sequence diagram showing a method for measuring optical characteristics of a light source using an optical integrator according to an embodiment of the present invention. As shown in Fig. 3, the optical characteristic measurement method of the light source using the optical integrator of the present invention is as follows: First, the light-emitting diode light source is fixed to the light source support table in the step S1. At this time, it is necessary to prevent the surface of the light-emitting diode from being contaminated. Next, a forward bias current setting value is applied to the above-described light emitting diode in step S2. Preferably, it is waited for 3 to 5 minutes after the application of the current to achieve thermal equilibrium. 201217773 * l At the step S3, 'the power is supplied to the electric heater 31 and the fan of the air supply member 32' is driven to supply the heated air to the hollow portion inside the optical integrator main body 1. In step S4, 'the temperature around the light source measured by the temperature sensor 51 disposed around the hollow central portion of the light-emitting diode source and the predetermined impact temperature (Ta) are compared, and if the impact temperature (Ta) is reached, the stop is stopped. The operation of the fan of the air supply unit 32. If the temperature around the light source is lower than the impact temperature (Ta)', then the temperature of the south electric heater 31 is increased and the rotational speed of the fan is increased to reach the impact temperature (Ta). Fig. 4 is a graph showing the temperature around the light source as a function of time in the measuring method shown in Fig. 3. As shown in Fig. 4, as the air heated by the electric heater 31 is supplied to the inside of the optical integrator through the fan, the temperature around the light source gradually rises until the impact temperature (Ta) is reached. The impact temperature (Ta) is a temperature higher than the measured temperature (Tm) at which the characteristics of the light source are to be measured, and is an intermediate step to reach the measured temperature (Tm). If the temperature around the source reaches the impact temperature (Ta), stop the fan and wait so that the temperature around the source naturally drops to the measured temperature (Tm). The set impact temperature (Ta) differs depending on the measured temperature (Tm) of the optical characteristics of the source. Fig. 5 is a graph showing the relationship between the measured temperature (Tm) and the impact temperature (Ta). As shown in Fig. 5, the higher the measured temperature (Tm), the higher the impact temperature (Ta), and the quadratic function relationship between the impact temperature (Ta) and the measured temperature (Tm). If the temperature around the light source drops to the measured temperature (Tm), proceed to the next step. At step S5, it is judged whether or not the internal temperature of the optical integrator body reaches a stable state suitable for evaluating optical characteristics. Measure the temperature of the light source circumference 1 1201217773 within a certain period of time and compare the temperature change range with the predetermined allowable range to judge whether it is stable or not. If necessary, in addition to the temperature variation, it can be judged whether it is stable or not by measuring the windless state inside the integrator body. The anemometer can be directly placed inside the optical integrator to measure the windless state, but the optical characteristic measurement error may occur due to the anemometer. Therefore, it is better to measure by the following method. First, an anemometer is placed inside the main body. Next, the anemometer is used to measure the time required to reach the windless state under the change of the fan rotation speed and the impact temperature. Next, a lookup table is created using the above measured materials. Finally, remove the anemometer to prepare for the process. When actually measuring the optical characteristics, the lookup table is used to find the windless state arrival time of the rotational speed and the impact temperature of the fan, and compared with the elapsed time to determine whether it is a windless state. ^ In the step S6, if it is determined that the inside of the optical integrator body of the step S5 is stable, the optical characteristic data measured by the detector u such as an illuminance meter or a spectroradiometer is stored. In addition, measurement conditions such as a forward bias power supply value applied to the light-emitting diode, a voltage value of the light-emitting diode junction f, and a temperature value around the light source are also stored. If it is determined that the optical integral || body (4) of the step S5 is unstable, after waiting for a predetermined time, it returns to the step S5 to judge whether it is stable or not. Further, if the optical characteristics of the light source are measured while changing the measurement temperature (Tm), after the optical characteristic data and the measurement condition value are saved in the step S6, it is judged in step S7 that the maximum measurement temperature (Tmax) is reached. If not 201217773
x L 達到最大測量温度（Tmax)，則在S8步驟改變所設定之 衝擊溫度（Ta)值。另外，通過重複S3至S6步驟，獲取 隨測量溫度（Tm)變化之光學特性資料。 接著，結合圖6來說明在改變施加于發光二極體之電 源值和測量溫度（Tm )之同時測量光源光學特性之方法。 若在改變施加于發光二極體之電源值（Pa)和測量溫度 (Tm)之同時測量光源光學特性，則在S6步驟保存光學 特性資料和測量條件值之後，在S9步驟，判斷是否達到 最大電流值（Imax)。若達到最大電流值（imax)，則在 Sl〇步驟判斷是否達到最大測量溫度（Tmax)。若達到最 大測置溫度（Tmax)，則結束測量。而若未達到最大測量 溫度（Tmax)，則在S11步驟變更衝擊溫度設定值之後， 重複S3至S6步驟以獲取光學特性資料。 若在S9步驟之判斷結果為未達到最大電流值 (Imax)，則在S12步驟判斷是否達到最大測量溫度 (Tmax)。若達到最大測量溫度（Tmax)，則在S12步 驟變更衝擊溫度設定值之後，重複S2至S6步驟以獲取光 學特性資料。若在S12步驟未達到最大測量溫度，則在S11 步驟變更衝擊溫度設定值之後，重複S3至S6步驟以獲取 光學特性資料。 圖7為利用本發明又一實施例的光學積分器之光源光 學特性測量方法順序圖。如圖7所示之實施例，除還包括 在光源支撐台設置珀爾帖元件以直接冷卻光源之步驟S14 之外，與如圖3所示之實施例相同。上述測量方法適合於 12 201217773 具備強制冷卻料之發光二鋪等光源之光學特性測量。 上述實施例僅用以說明本發明而非限制，本領域之普 ，技術人貞應當理解，可峭本發料行修改、變化或者 #同替換。 例如，本實施例在給發光二極體施加正向偏置電源設 疋值之後，向電加熱器31供應電源並驅動 風扇’以將加熱空氣供應至光學積分器主體^^之中空 區之後，當達到測量溫度時，就測量光學 =光二極體在-定溫度條件下被點亮瞬間之光學特=，、 =S5步驟，光學積分器主體内部是否達_於測量 :特性之穩疋狀紅後，向發光二極體施加電源設定值 乂進仃測量。另外’可根據需要而變更各步驟之進行順序。 另^本實施例利用如圖2所示之球形狀之光學積分 盗來測1光學特性，但也可使用其他形狀之光學積分器經 目同之步驟絲雜，而這屬於本翻之專利範圍。 例如，可使用半球形狀之光學積分器測量。 另外，本實施例在光學積分器主體内部中央設置光源 絲躲’但若光財方祕，财將光源設置於 先予積分器主體㈣之後經相同之步驟來測量光學特性。 另外’本實施例在達到衝擊溫度（τ〇之後停止 之風ΐ運行，但也可在停止風扇運行之同時降低電 π，、、、器31的溫度，以達到測量溫度（Tm)。 - 本發明已啸佳實施例揭露如上，然其並非用以 限疋本發明，任何熟習此技藝者，在不脫離本發明之精神 13 201217773 和範圍内，當可作此 範圍當視後附動與潤飾，因此本發明之保護 【圖式簡單說明】利_所界定者為準。 量方法的^序^ f有細的光學積分之辆光學特性測 量方法之光學積分11之光源光學特性測 予積刀器一實施例概略圖。 性測量方明—實施例光學積分器之光源光學特 周圍溫度=^圖3所7^之測量方料__化之光源 圖。圖5為測量溫度（Tm)和衝擊溫度（叫的關係曲線 圖ό為利用本發明另一實施例的#與g、 學特性測量方法_序圖。…I齡器之光源光 圖7為利用本發明又一實施例光 特性測量方法_序圖。 ” ϋ之7b源光予 【主要元件符號說明】 10 :主體 1〇-1 :貫通孔 10-2 :貫通孔 10-3 :第一貫通孔 10-4 :第二貫通孔 11 :檢測器 201217773When x L reaches the maximum measured temperature (Tmax), the set impact temperature (Ta) value is changed in step S8. Further, by repeating the steps S3 to S6, the optical characteristic data as a function of the measured temperature (Tm) is obtained. Next, a method of measuring the optical characteristics of the light source while changing the power source value and the measured temperature (Tm) applied to the light-emitting diode will be described with reference to FIG. If the optical characteristics of the light source are measured while changing the power supply value (Pa) and the measurement temperature (Tm) applied to the light-emitting diode, after the optical characteristic data and the measurement condition value are saved in step S6, it is judged whether the maximum is reached in step S9. Current value (Imax). If the maximum current value (imax) is reached, it is determined in the Sl〇 step whether the maximum measured temperature (Tmax) is reached. If the maximum measured temperature (Tmax) is reached, the measurement is ended. If the maximum measurement temperature (Tmax) is not reached, after changing the impact temperature set value in step S11, the steps S3 to S6 are repeated to obtain optical characteristic data. If the result of the determination in step S9 is that the maximum current value (Imax) has not been reached, it is judged in step S12 whether or not the maximum measured temperature (Tmax) is reached. If the maximum measured temperature (Tmax) is reached, the S2 to S6 steps are repeated to obtain the optical characteristic data after changing the impact temperature set value in step S12. If the maximum measured temperature is not reached in step S12, after changing the impact temperature set value in step S11, the steps S3 to S6 are repeated to acquire the optical characteristic data. Fig. 7 is a sequence diagram showing a method of measuring optical characteristics of a light source using an optical integrator according to still another embodiment of the present invention. The embodiment shown in Fig. 7 is identical to the embodiment shown in Fig. 3 except that it further includes a step S14 of providing a Peltier element to directly cool the light source at the light source support table. The above measurement method is suitable for measuring the optical characteristics of a light source such as a light-emitting two-station with forced cooling material. The above-described embodiments are only intended to illustrate the invention, and are not intended to be limiting, and those skilled in the art should understand that the invention can be modified, changed, or replaced. For example, after applying a forward bias power supply setting value to the light emitting diode, the present embodiment supplies power to the electric heater 31 and drives the fan ' to supply the heated air to the hollow region of the optical integrator body. When the measured temperature is reached, the optical ==5, step =1, step of the optical integrator is illuminated at the temperature of the optical diode, and the internal part of the optical integrator is up to _ measured: the characteristic redness of the characteristic After that, the power supply set value is applied to the light-emitting diode. In addition, the order of the steps can be changed as needed. In addition, this embodiment uses the optical shape of the ball shape as shown in FIG. 2 to measure the optical characteristics, but other optical integrators can also be used to perform the same steps, which belongs to the patent scope of the present disclosure. . For example, it can be measured using a hemispherical shape optical integrator. In addition, in this embodiment, a light source wire is disposed in the center of the optical integrator main body. However, if the light source is disposed before the integrator main body (4), the optical characteristics are measured through the same steps. In addition, in the present embodiment, the air temperature is stopped after the impact temperature is reached (τ 〇, but the temperature of the electric π, , , , 31 can also be reduced while the fan is stopped to reach the measured temperature (Tm). The invention has been disclosed as above, but it is not intended to limit the invention, and anyone skilled in the art can attach and retouch the scope when it does not deviate from the spirit of the present invention 13 201217773. Therefore, the protection of the present invention [simplified description of the drawing] is defined by the definition of _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ A schematic diagram of an embodiment of the apparatus. The measurement of the light source of the optical integrator of the optical integrator of the embodiment is as follows: Figure 5 shows the measured temperature (Tm) and The impact temperature (referred to as a relationship graph # is a method for measuring the characteristic characteristics of the other embodiment of the present invention.) The source light of the I-age device is shown in Fig. 7 as a light characteristic measurement using still another embodiment of the present invention. Method _ sequence diagram. ϋ 7b source I [REFERENCE NUMERALS 10 main components: a body 1〇-1: through hole 10-2: through-hole 10-3: first through hole 10-4: second through-hole 11: a detector 201217773
χ L 12 :輔助光源 20 :光源 30 :供氣管 31 :電加熱器 32 :供氣部件 控制器 40χ L 12 : Auxiliary light source 20 : Light source 30 : Air supply pipe 31 : Electric heater 32 : Air supply unit Controller 40