TW201206548A - Filter apparatus, filter housing method, and exposure device - Google Patents

Filter apparatus, filter housing method, and exposure device Download PDF

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Publication number
TW201206548A
TW201206548A TW100111764A TW100111764A TW201206548A TW 201206548 A TW201206548 A TW 201206548A TW 100111764 A TW100111764 A TW 100111764A TW 100111764 A TW100111764 A TW 100111764A TW 201206548 A TW201206548 A TW 201206548A
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TW
Taiwan
Prior art keywords
frame
filter
shape
shape changing
handle
Prior art date
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TW100111764A
Other languages
Chinese (zh)
Inventor
Koichi Katsura
Keiji Matsuura
Yoshinari Horita
Takashi Masukawa
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Nikon Corp
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Publication of TW201206548A publication Critical patent/TW201206548A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D53/00Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
    • B01D53/02Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by adsorption, e.g. preparative gas chromatography
    • B01D53/04Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by adsorption, e.g. preparative gas chromatography with stationary adsorbents
    • B01D53/0407Constructional details of adsorbing systems
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D2257/00Components to be removed
    • B01D2257/40Nitrogen compounds
    • B01D2257/406Ammonia
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D2257/00Components to be removed
    • B01D2257/70Organic compounds not provided for in groups B01D2257/00 - B01D2257/602
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D2258/00Sources of waste gases
    • B01D2258/02Other waste gases
    • B01D2258/0216Other waste gases from CVD treatment or semi-conductor manufacturing

Abstract

A filter apparatus is equipped with: a frame for holding filters; filter boxes that are disposed on at least parts of the sides of the frame, that face the end surface side of the frame, and that are equipped with shape-modified parts that are modified to the outside of the frame; and casings that house the filter boxes. The casings have positioning blocks that positions the frame by engaging with the shape-changing parts of the frame, and partition plates that are pressed by the end surfaces of the frame. The filters can be set in such a manner as to make positioning easy.

Description

201206548 六、發明說明: 【發明所屬之技術領域】 本發明係關於保持用以除去例如氣體中之不純物等之 過渡益之過滤器裝置、過滤器之收容方法、具備該過滤器 裝置之曝光裝置、以及用以使用此曝光裝置製造例如半導 體元件、&晶顯示元件、或攝影元件等之元件製造方法。 【先前技術】 在用以製造例如半導體元件等電子元件(微型元件)之 微影製程中使用之曝光裝置中’為了得到高曝光精度(解像 度及定位精度等),需將照明光學系統之照明特性及投影光 學系統之成像特性維持於既定之狀態且將設置標線片(或光 罩等)、投影光學系統、以及晶圓(或玻璃板等)之空間維持 於既定之環境。因此,以往包含曝光裝置之照明光學系統 之部分、標線片載台、投影光學系統、以及晶圓載台等 之曝光本體部設置於箱型腔室内,於此腔室内具備空調裝 置,該空調裝置係將控制成既定溫度且通過濾塵器之清淨 氣體(例如空氣)以降流方式及側流方式供給。 又’曝光裝置中,為了對應近年之電路圖案之顯著微 細化要求,曝光用光之波長不斷變短,最近係使用KrF準 分子雷射光(波長248nm)及進一步大致為真空紫外區之ArF 準分子雷射光(波長193nm)作為曝光用光。在使用此種短波 長之曝光用光時,當於曝光用光所通過之空間(例如鏡筒之 内°卩二間)内存在微量之有機物之氣體(有機系氣體)時,曝 201206548 光用光之透射率即會降低,且有因曝光用光與有機系氣體 之反應而於透鏡元件$光學元件之表面產生霧才勿質之虞。 再者,最好係從供應至腔室内之氣體亦除去與塗布於晶圓 之光阻(感光材料)反應之鹼性物質之氣體(鹼系氣體)等。 因此,以往係於曝光裝置之空調裝置之氣體之擷取 部,設有用以從供給至腔室内之氣體除去有機系氣體及/ 或鹼系氣體等之複數個化學過濾器(參照例如專利文獻丨)。 [專利文獻] [專利文獻1]國際公開第2004/ 108252號說明書 【發明内容】 以往之曝光裝置中,在將化學過濾器設置於盒體内 時,例如將收納化學過濾器之平板狀框架以橫置(過濾器面 成為紹直方向之面向)搬入至抵接於盒體内之側壁後,作業 者係將該框架沿該側壁相對過濾器面於法線方向移動至既 夂之設置位置為止。此情形下,若於框架之端面與形成有 該盒體之通氣用開口之分隔構件之面之間有間隙,即有包 含不純物之氣體不通過化學過濾器而經由此間隙被供給至 曝光本體部之虞。因此,用以將該框架正確地定位於其設 置位置之時間變長、進而使用完畢之化學過濾器之更換時 間亦變長。 再者,曝光裝置中,由於對應被要求之曝光精度之更 加提升而增加所設置之化學過濾器之數目,因此需正確且 有效率地進行化學過濾器之更換。 201206548 本發明有鑑於上述情事,其目的在於能將過濾器之設 置以容易定位之方式進行。 根據本發明之第1態樣,提供一種過濾器裝置,係收 容過濾器。此過濾器裝置,具備:第丨過濾器箱,具備保 持第1過;慮器之第1框架,以及設於該第1框架之側面中 第1側面之至少一部分、從該第丨框架之兩個端面中一端 面側往另一端面側且變化至該第i框架外側之第丨形狀變 化部;以及收容部,係收容該第丨過濾器箱;該收容部, 具備支撐該第1框架之與該第丨側面相異之側面之第丨底 座構件、卡合於該第i框架之該第丨形狀變化部以定位該 第1框架之第1定位構件、以及藉由該第丨定位構件與該 第1形狀變化部卡合而按壓該第丨框架之該一端面之第】 分隔構件。 又’根據本發明之第2態樣,提供一種曝光裝置,係 以曝光用光經由圖案使基板曝光,其特徵在於,具備:腔 室,收納使該基板曝光之曝光本體部;本發明之過濾器裝 置;以及空調裝置,將從該腔室之外部擷取之氣體經由該 過渡器裝置送至該腔室内β 又,根據本發明之第3態樣,提供一種過濾器之收容 方法,係將過濾器收容於收容部。此收容方法,包含:準 備第1過濾器箱之步驟,該第1過濾器箱具備保持第丨過 濾器之第1框架,以及設於該第"匡架之側面中第i側面 之至少一部分、從該第丨框架之兩個端面中一端面側往另 一端面側且變化至該第丨框架外側之第丨形狀變化部;將 201206548 ^ 1框架之與該帛1側面相鄰之側面載置於該收容部之 介Λ本座構件表面之步驟;使該第1框架之該第1形狀變 Ρ卡合於該收容部之帛丨定位構件,以使該第i框架往 騎谷部之第1分隔構件之方向移動之步驟;以及將該第! 王架之該端面透過第1密封構件按壓於該收容部之該第工 分隔構件之步驟。 又,根據本發明之第4態樣,提供一種元件製造方法, 其特徵在於’包含:使用本發明之曝光裝置使感光性基板 曝光之動作;以及處理該曝光後感光性基板之動作。 根據本發明’例如係將第i框架之第i形狀變化部卡 合於第1定位構件’使帛1框架移動至S 1分隔構件側, 藉此第1框架(第1過濾器)對收容部内之目標位置,能將第 1框架之設置以容易定位之方式進行。 【實施方式】 以下’參照圖1〜圖7説明本發明之較佳實施形態。 圖1,係顯示本實施形態之由掃描步進機構成之掃描曝 光型曝光裝置EX之一部分切除圖。圖1中,曝光裝置Εχ 具備:產生曝光用光(曝光用照明光)EL之光源部2、以曝光 用光EL照明標線片R(光罩)之照明光學系統ILS、保持標 線片R並移動之標線片載台RST、以及將標線片R之圖案 之像投影至塗布有光阻(感光材料)之晶圓w (基板)表面之投 影光學系統PL。再者,曝光裝置EX具備保持晶圓W並移 動之晶圓載台WST、其他驅動機構及感測器類等、保管複 201206548 數片標線片之標線片庫9、保管複數片未曝光及/或曝光完 畢之晶圆之晶圓匣7、以及統籌控制曝光裝置EX之動作之 主控制裝置(未圖示)。此等之從光源部2至主控制裝置(未 圖示)之構件,設置於例如半導體元件製造工廠之潔淨室内 之第1地F L1之上面。 又’曝光裝置EX具備設置於地FL1上之箱狀之高氣密 性腔室10 ’腔室10内部,例如被具有兩個開口(以擋門24R 及24W開閉)之分隔構件10d區劃成曝光室1 〇a與裝載室 l〇b。又’於曝光室1〇a内設置有包含照明光學系統ILs、 標線片載台RST、投影光學系統PL、以及晶圓載台wst之 曝光本體部4,於裝載室1〇b内設置有分別包含標線片庫9 及晶圓E 7之標線片裝载系統及晶圓裝載系統。 又’曝光裂置EX具備用以進行腔室1〇内部整體之空201206548 VI. [Technical Field] The present invention relates to a filter device for holding a transition benefit such as impurities in a gas, a method for accommodating a filter, an exposure device including the filter device, And a method of manufacturing a component for manufacturing, for example, a semiconductor element, a & crystal display element, or a photographic element using the exposure apparatus. [Prior Art] In an exposure apparatus used for manufacturing a lithography process such as an electronic component (micro component) such as a semiconductor element, in order to obtain high exposure precision (resolution, positioning accuracy, etc.), illumination characteristics of an illumination optical system are required. And the imaging characteristics of the projection optical system are maintained in a predetermined state and the space for setting the reticle (or mask, etc.), the projection optical system, and the wafer (or glass plate, etc.) is maintained in an established environment. Therefore, in the past, the portion of the illumination optical system including the exposure device, the reticle stage, the projection optical system, and the exposure main body portion of the wafer stage or the like are provided in the box chamber, and the air chamber is provided in the chamber. It is controlled to a predetermined temperature and is supplied by a clean gas (for example, air) of the dust filter in a downflow manner and a side flow manner. In the 'exposure device, the wavelength of the exposure light is shortened in response to the demand for refinement of the circuit pattern in recent years. Recently, KrF excimer laser light (wavelength 248 nm) and ArF excimer which is further in the vacuum ultraviolet region are used. Laser light (wavelength 193 nm) is used as exposure light. When using such short-wavelength exposure light, when there is a trace amount of organic matter gas (organic gas) in the space through which the exposure light passes (for example, in the inside of the lens barrel), exposure 201206548 The transmittance of light is lowered, and there is a possibility that fogging occurs on the surface of the lens element $optical element due to the reaction between the exposure light and the organic gas. Further, it is preferable to remove a gas (alkaline gas) which is an alkaline substance which reacts with a photoresist (photosensitive material) applied to the wafer from the gas supplied into the chamber. Therefore, the gas extraction unit of the air conditioner of the exposure apparatus is provided with a plurality of chemical filters for removing organic gas and/or alkali gas from the gas supplied into the chamber (see, for example, Patent Document丨). [Patent Document 1] [Patent Document 1] International Publication No. 2004/108252 [Invention] In a conventional exposure apparatus, when a chemical filter is placed in a casing, for example, a flat frame in which a chemical filter is housed is used. When the transverse direction (the surface of the filter surface is in the direction of the straight direction) is carried into the side wall of the casing, the operator moves the frame along the side wall of the side wall relative to the filter surface to the set position. . In this case, if there is a gap between the end surface of the frame and the surface of the partition member in which the ventilation opening of the casing is formed, the gas containing the impurity is supplied to the exposed body portion through the gap without passing through the chemical filter. After that. Therefore, the time for properly positioning the frame at its set position becomes longer, and the replacement time of the used chemical filter becomes longer. Further, in the exposure apparatus, since the number of chemical filters to be set is increased corresponding to the required increase in exposure accuracy, it is necessary to accurately and efficiently perform the replacement of the chemical filter. 201206548 The present invention has been made in view of the above circumstances, and an object thereof is to enable the setting of a filter to be easily positioned. According to a first aspect of the present invention, a filter device is provided which accommodates a filter. The filter device includes a second filter case including a first frame that holds the first filter, and at least a part of the first side surface of the first frame, and two of the second frame. The first end surface side of the end surface is changed to the second shape change portion on the outer side of the i-th frame; and the accommodating portion is for accommodating the second filter case; the accommodating portion is provided to support the first frame a second base member on a side different from the second side surface, and a first positioning member that is engaged with the first shape changing portion of the i-th frame to position the first frame, and the first positioning member and the second positioning member The first shape changing portion is engaged with the first partition member that presses the one end surface of the second frame. Further, according to a second aspect of the present invention, an exposure apparatus is provided which exposes a substrate by exposure light through a pattern, and is characterized in that: a chamber is provided to house an exposed main body portion for exposing the substrate; and the filter of the present invention And an air conditioning device, wherein the gas extracted from the outside of the chamber is sent to the chamber through the transition device, and according to the third aspect of the present invention, a method for accommodating the filter is provided. The filter is housed in the housing portion. The accommodating method includes the step of preparing a first filter case having a first frame for holding the second filter and at least a portion of the i-side of the side of the truss a second shape change portion from one end surface side to the other end surface side of the second end surface of the second frame to the outer side of the second frame; the side surface of the 201206548 ^ 1 frame adjacent to the side surface of the crucible 1 is a step of placing the first receiving portion of the first frame on the surface of the receiving member; and engaging the first shape of the first frame with the positioning member of the receiving portion to move the i-th frame to the valley portion a step of moving the direction of the first partition member; and the first! The end face of the king frame is pressed against the first partition member of the accommodating portion by the first sealing member. According to a fourth aspect of the present invention, there is provided a method of manufacturing a device, comprising: an operation of exposing a photosensitive substrate using the exposure apparatus of the present invention; and an operation of processing the photosensitive substrate after the exposure. According to the present invention, for example, the i-th shape changing portion of the i-th frame is engaged with the first positioning member ′, and the 帛1 frame is moved to the S 1 partition member side, whereby the first frame (first filter) is placed in the accommodating portion. The target position allows the setting of the first frame to be easily positioned. [Embodiment] Hereinafter, preferred embodiments of the present invention will be described with reference to Figs. 1 to 7 . Fig. 1 is a partially cutaway view showing a scanning exposure type exposure apparatus EX constituted by a scanning stepper of the embodiment. In Fig. 1, an exposure apparatus 具备 includes a light source unit 2 that generates exposure light (exposure illumination light) EL, an illumination optical system ILS that illuminates a reticle R (mask) with exposure light EL, and a holding reticle R The moving reticle stage RST and the image of the pattern of the reticle R are projected onto the projection optical system PL of the surface of the wafer w (substrate) coated with the photoresist (photosensitive material). Further, the exposure apparatus EX includes a wafer stage WST that holds the wafer W and moves, other driving mechanisms, sensors, and the like, and stores a reticle library 9 of a plurality of 201206548 reticle, and stores a plurality of unexposed portions. / or the wafer 匣 7 of the exposed wafer and the main control device (not shown) that controls the operation of the exposure device EX. The members from the light source unit 2 to the main control unit (not shown) are provided, for example, on the upper surface of the first floor F L1 in the clean room of the semiconductor element manufacturing factory. Further, the exposure apparatus EX includes a box-like high airtight chamber 10' chamber 10 provided on the ground FL1, and is partitioned into an exposure member 10d, for example, by two partitions (opening and closing with the shutters 24R and 24W). Room 1 〇a and loading chamber l〇b. Further, an exposure main body portion 4 including an illumination optical system ILs, a reticle stage RST, a projection optical system PL, and a wafer stage wst is provided in the exposure chamber 1A, and is provided in the load chamber 1b. The reticle loading system and wafer loading system including the reticle library 9 and the wafer E 7 are included. Further, the exposure rupture EX has an empty space for performing the entire interior of the chamber 1

t空調系統,具備:設置於第i ;2地FL2上面且具有串聯配置 器裝置26、具有設置於地FL2 同裝置30、設置於曝光室1〇3上 卜收納照明光學系統ILS之副腔 1 9R、以及配置於投影光學系統 。過濾器裝置26係從經由配管 L AR除去既定之不純物,將已 A1所示經由第1管32供給至 空調本體部3 1、通過設 201206548 於地F L1之開口遠社办*田祕Ar7 1,也 、’〇二调本體部31與腔室ι〇之内部之第2 管35、以及配置於例如第2管35之途中且從於内部流動之 空氣除去微小粒子(微粒)之ULPA過濾器(ultra L〇w Penetration Ai卜filter)等遽塵器36。管% 35及配管Μ,係 使用例如不鑛鋼3戈氟樹月旨等污染物質之產生量少之材㈣ 成。 空調本體部31具備:控制經由第i管32供給之空氣 之溫度之溫度控制部33A、控制該空氣之濕度之漏度控制部 33B、以及將該空氣送至第2管35側之風扇馬達34。該空 氣被控制於溫度為2(rc〜3〇〇c之範圍内之例如23。。,經由 第2管35及吹出口 18以降流方式供給至曝光室i〇a内部。 腔室10内部藉由此空氣之供給被設定成正壓狀態。又第 2管35内之空氣經由分歧管35&及3讣與對應之吹出口 ay 及吹出口 19R供給至曝光室1〇a内。曝光室1〇a内之空氣 一部分亦流入裝載室1 Ob。 作為一例,流動於腔室10内部(曝光室10a)之空氣,通 過°又於腔至底面之多數個開口 45a及設於地fli之多數 個開口 45b流至地下之排氣管44内,排氣管料内之空氣 經由未圖示之過濾器排出。此外,亦能使流至排氣管44之 空氣之全部或一部分返回至配管25側而再利用。 以下,圆1中,係與投影光學系統PL之光軸Αχ平行 地取Ζ軸,在與ζ軸垂直之平面(在本實施形態中為大致水 平面)内與圖1之紙面垂直地取乂軸,與圖丨之紙面平行地 取Υ軸來說明。本實施形態中,掃描曝光時之標線片尺及 201206548 晶圆w之掃描方向係γ方向。又,將繞與χ轴、γ轴、z 軸平行之軸之旋轉方向亦稱為0X、0y、0Z方向。 首先,設置於腔室10外側之地FL1上之光源部2,具 備產生ArF準分子雷射光(波長193nm)作為曝光用光el之 曝光光源、以及將該曝光用光EL導至照明光學系統ils之 光束送光光學系統。光源部2之曝光用光EL之射出端,係 通過腔室ίο之+ γ方向側面上部之開口配置於曝光室 内。此外,亦能使用KrF準分子雷射光源(波長248nm)等紫 外脈衝雷射光源、YAG雷射之諧波產生光源、固態雷射(半 導體雷射等)之諧波產生裝置、或水銀燈(i線等)等作為曝光 光源。 … 又,配置於腔室10内上部之照明光學系統ILs,如例 如美國發明專利申請公開第2003/0025890號說明書等所 揭示,具備包含光學積分器等之照度均一化光學系統、標 線片遮簾、以及聚光光學系統等。照明光學系统ILS係藉 由曝光用光E L以大致均-照度照明以標線片遮簾規定之標 線片R之圖案面之於X方向細長之狹縫狀照明區域。 ,^成於^^線片R之圖案區域中照明區域内之圖案像, m由兩側遠心且投影倍率^為縮小倍率(例如1 / 4)之投 影光學系統PL成像投影至晶圓w之表面。 又,於腔室ίο之曝光室10a内之&FU上透過複數 個台座U設置有下部框架12,於下部框架12之中央部固 定有平板狀之底座構件13’於底座構件"上透過例如三處 振。14支承有平板狀之晶圓底座wb,於晶圓底座 10 201206548 之與χγ平面平行之上面透過空氣軸承將晶圓載台暫載 置成可移動於X方向、γ方向且可旋轉於02方向。又於 下。卩框架1 2之上端,透過配置成包圍晶圓底座之例如 三處之防振台15支承有光學系統框架16。於光學系統框架 16中央部之開口配置有投影光學系統pL,於光學系統框架 16上將上部框架17固定成包圍投影光學系統PL。The air conditioning system includes: a sub-chamber 1 disposed on the i-th; 2-ground FL2 and having a series arranging device 26, a sub-chamber 1 disposed on the ground FL2, and a sub-chamber 1 disposed in the exposure chamber 1? 9R, and is arranged in the projection optical system. The filter device 26 removes a predetermined impurity from the pipe L AR, and supplies the A1 as indicated by A1 to the air-conditioning main unit 3 via the first pipe 32, and passes through the opening of the 2012 F. Further, the second tube 35 inside the main body portion 31 and the chamber ι, and the ULPA filter in which fine particles (fine particles) are removed from the air flowing inside the second tube 35, for example, are disposed. (ultra L〇w Penetration Ai Bu filter) and the like 36. In the case of the tube % 35 and the piping Μ, for example, a material having a small amount of pollutants such as a non-mineral steel 3 fluorocarbon tree is used. The air-conditioning main unit 31 includes a temperature control unit 33A that controls the temperature of the air supplied through the i-th tube 32, a leak control unit 33B that controls the humidity of the air, and a fan motor 34 that sends the air to the second tube 35 side. . The air is controlled to be, for example, 23 in a range of 2 (rc to 3 〇〇c), and is supplied to the inside of the exposure chamber i〇a through the second tube 35 and the air outlet 18 in a downflow manner. The supply of air is set to a positive pressure state. The air in the second tube 35 is supplied to the exposure chamber 1A via the manifolds 35 & and 3讣 and the corresponding outlets ay and outlets 19R. The exposure chamber 1 A part of the air in the 〇a also flows into the loading chamber 1 Ob. As an example, the air flowing inside the chamber 10 (exposure chamber 10a) passes through a plurality of openings 45a from the cavity to the bottom surface and a plurality of openings Fli The opening 45b flows into the underground exhaust pipe 44, and the air in the exhaust pipe is discharged through a filter (not shown). Further, all or part of the air flowing to the exhaust pipe 44 can be returned to the pipe 25 side. Hereinafter, in the circle 1, the axis is taken in parallel with the optical axis 投影 of the projection optical system PL, and is perpendicular to the plane of the paper of FIG. 1 in a plane perpendicular to the ζ axis (in the present embodiment, a substantially horizontal plane). Take the 乂 axis and take the Υ axis in parallel with the paper surface of the 丨 来. In the embodiment, the scanning line of the scanning exposure and the scanning direction of the 201206548 wafer w are in the γ direction. Further, the rotation direction of the axis parallel to the χ axis, the γ axis, and the z axis is also referred to as 0X, 0y, First, the light source unit 2 provided on the ground FL1 outside the chamber 10 is provided with an exposure light source that generates ArF excimer laser light (wavelength: 193 nm) as exposure light el, and guides the exposure light EL to illumination. The light beam transmitting optical system of the optical system ils. The emitting end of the exposure light EL of the light source unit 2 is disposed in the exposure chamber through an opening in the upper side of the cavity γ γ direction. Further, a KrF excimer laser can also be used. An ultraviolet pulse laser light source such as a light source (wavelength 248 nm), a harmonic generation light source of a YAG laser, a harmonic generation device of a solid state laser (semiconductor laser or the like), or a mercury lamp (i line, etc.) are used as an exposure light source. Illumination optical system ILs disposed in the upper portion of the chamber 10, as disclosed in, for example, the specification of the US Patent Application Publication No. 2003/0025890, having an illuminance uniformizing optical system including an optical integrator, and a reticle a curtain, a concentrating optical system, etc. The illumination optical system ILS illuminates the pattern surface of the reticle R defined by the exposure light EL by a substantially uniform illuminance in a slit shape in the X direction. The illumination area. ^ is formed in the pattern area of the pattern area of the ^R line R, and the projection optical system PL is projected onto the crystal by the telecentricity of both sides and the projection magnification is reduced (for example, 1 / 4) Further, a lower frame 12 is disposed through the plurality of pedestals U in the &FU in the exposure chamber 10a of the chamber ίο, and a flat base member 13' is fixed to the base at the central portion of the lower frame 12. The component " is transmitted through, for example, three vibrations. The wafer base wb is supported by the flat wafer base wb, and the wafer carrier is temporarily placed in the X direction and the γ direction and rotatable in the 02 direction by the air bearing on the wafer pedestal 10 201206548 parallel to the χ γ plane. Again. At the upper end of the frame 12, the optical system frame 16 is supported by, for example, three anti-vibration tables 15 arranged to surround the wafer base. A projection optical system pL is disposed in the opening of the central portion of the optical system frame 16, and the upper frame 17 is fixed to surround the projection optical system PL on the optical system frame 16.

又,於光學系統框架16底面之+ γ方向端部固定有Y 軸之雷射干涉儀21WY’於其底面之+ 乂方向端部固定有χ 軸之雷射干涉儀(未圖示)。由此等干涉儀構成之晶圓干涉 儀,分別對晶圓載台WST之側面之反射面(或移動鏡)照射 複數軸之測量用光束,以例如投影光學系統pL之側面之參 照鏡(未圖示)為基準,測量載台WST之X方向、γ方向之 位置、以及θχ、θγ θζ方向之旋轉角,將測量值供給至 主控制裝置(未圖示)。 主控制裝置(未圖示)内之載台控制系統’係根據上述晶 圓干涉儀之測量值及自動聚焦感測器(未圖示)之測量值: 透過包含線性馬達等之驅動機構(未圖示)控制晶圓^ WST之义方向、γ方向之位置及速度與方向之旋轉角口 且將晶圓載台WST内之z載台(未圖示)控制成晶圓w 面對焦於投影光學系統PL之像面。又’亦設有用以進 線片R及晶圓w之對準之對準系統ALG等。 τ 另-方面,於上部框架17之+ 丫方向上部固 照明光學系統ILS之副腔室22。再者,於上部框架17之: XY平面平行之上面透過空氣軸承將標線片載台RST載置 201206548 成可定速移動於Y方向且能往X方向移動及往0z方向扩 轉。 疋 又,於上部框架17上面之+ Y方向端部固定有丫軸之 雷射干涉儀21RY,於其上面之+ x方向端部固定有χ軸之 雷射干涉儀(未圖示)。由此等干涉儀構成之標線片干涉儀, 分別對設於標線片載台RST之移動鏡21Μγ等照射複數轴 之測量用光束,以例如投影光學系統PL之側面之參照鏡(未 圖示)為基準,測量標線片載台WST之X方向、γ方向之位 置、以及0 X、0 y、θ Z方向之旋轉角,將測量值供給至主 控制裝置(未圖示)。 主控制裝置(未圖示)内之載台控制系統,係根據該標線 ^干涉儀之測量值等料包含線性馬達等之驅動機構(未圖 不)控制標線片載台RST之Y方向之速度及位置、χ方向之 位置、以及θζ方向之旋轉角等。 又,本實施形態之曝光裝置ΕΧ為液浸型時,係從配置 於投影光學系統PL下端之光學構件之下面之包含例如環狀 嘴頭之局部液浸機構(未圖示),對投影光學系統pL前端之 光學構件與晶圓W之間之局部液浸區域供給既定之液體(純 水等)。作為該局部液浸機構,可使用例如於美國發明專利 申請公開第撕/ 242247號說明書等所揭示之液浸機構。 此外,曝光裝置EX為乾燥型時,無需具備該液浸機構。 又,在裝載室内部,於上方之支承台67上面設置 有標線片庫9及水平多關節型機器手即標線片裝載器8。標 線片裝載器8,係通過以分隔構#咖之_ 24r開閉之開 ⑧ 12 201206548 口,在標線片庫9與標線片載台RST之間進行標線片r之 更換。 又,在裝載室10b内部,於下方之支承台68上面設置 有晶圓E 7與在與晶圓E 7之間進行晶圓之取出或置:之 水平多關節型機器手6a。於水平多關節型 設置有與水平多關節型機器…起構成 晶圓搬送裝置6b。晶圓搬送裝置6b,係通過以分隔構件_ 之擋門24评開閉之開口在水平多關節型機器手6 台WST之間搬送晶圓w。 接著’在曝光裝置以之曝光時,首先進行標線片Μ 晶圓W之對準。其後,開始對標線片r照射曝光用光此, 藉由一邊經由投影光學系統PL將標線片尺之圖案之一部分 像投影至日日日圓W表面之—個照射區域,—邊以投影光學系 統PL之投影倍率々為速度比將標線片載台rst與晶圓載台 WST同步移動(同步掃描)於γ方向之掃描曝光動作,於該 照射區域轉印標線片U圖案像。其後,反覆進行透過晶 圓載台WST將晶圓w步進移動於χ方向、γ方向之動作與 上述掃描曝光動作’以步進掃描方式於晶圓w之全部照射 區域轉印標線片R之圖案像。 八 本實施形態之曝光裝置EX,4 了將照明光學系 . 之*、、、明特性(照度均一性等)及投影光學系統之成像 朵(解像度等)維持於既定狀態,且將設置標線片r、投影 “、、先PL·以及晶圓W之環境氣氛(空間)維持於既定之 環境,以高曝光精度(解像度、定位精度等)進行曝光,係如 13 201206548 上述具備整體空調系統,該整體空調系統包含將經溫度控 制之清淨空氣以降流方式供給至腔室10内部之空調襄 30 ° 又’該整體空調系統具備局部空調部。亦即,從第 管35之分歧管35b及35a分別對副腔室22底面之吹出部 1 9R及光學系統框架1 6底面之吹出部丨9 w供給經溫度控制 之清淨空氣。此情形下,吹出部19R及i9w,分別配置於 標線片載台RST用之Y軸之雷射干涉儀21RY及晶圓載台 WST用之Y軸之雷射干涉儀21WY之測量用光束之光^ 上。吹出部19R,19W,係分別將經溫度控制之空氣以大致 均一之風速分布以降流方式(或亦可係側流方式)對測量用 光束之光路上吹出。同樣地,亦對χ軸之雷射干涉儀之測 :用光束之光路局部地供給經溫度控制之空氣。藉此,能 ,由標線片干涉儀21R及晶圆干涉儀21W等高精度地測量 標線片載台RST及晶圓載台WST之位置。 又,於裝載室10b内設置有局部空調裝置^局部空 置60具備配置於支承台68底面之小型風扇馬達^、 將以風扇馬達61送出之空氣供給至 於標線片庫9及晶…之上方之吹:口之二62'以及配置 之前端部分離至分別對吹出口 65及66供仏☆户。& 62R及62W。又,於吹出口 65及;:…: 別設置有祕過據器等滤塵器,於風二:附 62内,設置有收納化學過滤器(用 W寸近 ^ 3¾ ^,Λ ., ^ 方既疋不純物)之遣 濾态相63, 64。作為—例,過濾器 相63之化學過濾器係時 ⑧ 14 201206548 去有機系氣體(有機物之氣體),過濾器箱64之化學過濾器 係除去鹼系氣體(鹼性物質之氣體)及酸性氣體(酸性物質之 乳體)。 在裝載室i〇b内使局部空調裝置60動作後,從風扇馬 達61送出之空氣,經由過渡器箱63,64及管62從吹出口 65及66分別以降流方式被供給至配置有標線片庫9及晶圓 匣7之空間。接著,流動於標線片庫9周圍之空氣,經由 支承台67周圍、支承台67下方之晶圓匣7周圍、以及支 承台68周圍返回至風扇馬達61。又,從吹出口 66供給至 晶圓匣7周圍之空氣,經由支承台68周圍返回至風扇馬達 接著,返回至風扇馬達6 1之空氣,再次經由過濾器箱 63, 64及濾塵器從吹出口 65, 66供給至裝載室i〇b内◎如 此,藉由局部空調裝置6〇,裝載室1〇b内之空氣保持於清 淨之狀態。 其次’說明本實施形態之整體空調系統中,連結於空 調裝置30之過濾器裝置26之構成及作用。過濾器裝置26 具有於Y方向細長之經氣密化之箱狀盒體28、將盒體28 内之二間在大致水平面内於γ方向分成四個之與平面平 打之分隔板42Α,42Β,42C、與分隔板42Α,42Β, 42C各自 之一面(圖1中為+Υ方向之面)緊貼而設置之第1種類之過 渡器箱38、第2種類之過濾器箱4〇、以及第i種類之過渡 8過;慮器裝置2 6具有兩種類且三個(三段)串聯配置 之過渡器箱38, 40。以下,將第i種類之過遽器箱%亦稱 為第1過濾器箱38,將第2種類之過濾器箱4〇亦稱為第ι 15 201206548 過濾器箱40。 本實施形態中’過濾器箱之過濾器面設置於與水平面 交叉之方向、例如過濾器箱之過濾器面設置於χζ面内。 此外’過滤器箱之過滤器面亦可設置成相對ΧΖ面傾 斜。此情形下’只要於過濾器箱之框架設置面形成錐狀或 於盒體28之底板28h設置錐狀構件即可。 本實施形態中’將此過濾器箱之設置狀態設為橫置, 以下說明之。 進而,過濾器裝置26,具有在過濾器箱38, 4〇之插入 時或更換時,為了開啟用以取出或置入過濾器箱38, 4〇之 窗部28b(參照圖2),而於盒體28在複數處透過鉸鏈機構 29h(參照圖3)可開閉地安裝之門29。於盒體28之+γ方向 端部之第1空間之上板形成有開口 28a,於此開口 28a安裝 有擷取空調用空氣AR之配管25之端部,於盒體28之^ 方向側壁形成有開口 28g,於盒體28之_γ方向端部之第4 空間透過開口 2 8 g連結有第1管3 2。 圖2係顯示已將圖1中之盒體28之門29開啟之狀熊 之過濾器裝置26。圖2中,為了說明方便,盒體28及^ 29、以及分隔板42A〜42C係以兩點鍊線表示。圓2中,於 門29固定有用以在以門29關閉盒體28之窗部2讣時密閉 窗部28b之周邊及分隔板42A〜42C之端部與門29之間才 墊片46。墊片46能由耐蝕性優異且脫氣較少之材料、 鐵氟龍(杜邦公司之註冊商標)之片體、或矽 楚。 16 201206548 於1體28内部中,橫置成分別緊貼_γ 分隔板42Α及+Υ方a _ 4 门知邛之 , 万向端崢之分隔板42之第1過濾器箱38, 係於框架50之開D撕(參照圖3)保持有用以除 體(有機物之氣體)之化學 機糸乱 _ 亿予過/慮13 51者。又,橫置成緊貼中 央之刀隔板42B之第2過遽器帛40,係於框架55之開口 5/f(參照3)保持有除去氨或胺等驗性系氣體(驗性物質之 氣體)及酸性氣體(·酴Λ产 (峻11物質之氣體)之化學過濾器56者。 各過濾器箱38,40之Υ方向寬度為例如200〜400_, 各過渡器箱38, 4G之重量為例如10〜20kg左右。 、作為有機系氣體除去用之化學過濾H 51,可使用例如 活性碳型過渡器或陶£型過攄器等。χ,作為驗系氣體及 酸性,體除去用之化學過遽胃56,能使用添加劑活性碳型 過濾态、離子交換樹脂型過濾器、離子交換纖維型過濾器、 或添加劑陶竞型過據器等。又’框架5〇,55、分隔板二〜 42C、盒冑28、以及門29,分別由具有耐㈣且脫氣等較 少之㈣、例如於表面形成有氧化皮膜(氧化銘等)之紹(經 氧化處理之鋁)或不鏽鋼等形成。此外,框架50, 55等亦能 以包含具㈣錢且脫氣較少之材料(以聚乙烯覆蓋之層板 或款系樹脂等)等形成。 此外’藉由除去有機系氣體,使腔室1〇之曝光室…Further, a laser interferometer 21WY' having a Y-axis fixed to the end portion in the + γ direction of the bottom surface of the optical system frame 16 is fixed with a x-axis laser interferometer (not shown) at the end portion of the bottom surface in the +? direction. The wafer interferometer formed by the interferometer irradiates the reflection surface (or the moving mirror) on the side of the wafer stage WST with the measurement beam of the plurality of axes, for example, the reference mirror of the side of the projection optical system pL (not shown) Based on the measurement, the X direction of the stage WST, the position in the γ direction, and the rotation angle in the θ χ and θ γ θ directions are measured, and the measured value is supplied to a main control device (not shown). The stage control system in the main control unit (not shown) is based on the measured value of the wafer interferometer and the measured value of the autofocus sensor (not shown): through a drive mechanism including a linear motor or the like (not The figure shows the direction of the wafer WST, the position in the gamma direction, and the rotation angle of the velocity and direction, and controls the z stage (not shown) in the wafer stage WST to be the wafer w surface to focus on the projection optics. The image side of the system PL. Further, an alignment system ALG for aligning the wafer R and the wafer w is also provided. In other respects, the sub-chamber 22 of the illumination optical system ILS is fixed to the upper portion of the upper frame 17 in the + direction. Further, in the upper frame 17: the XY plane is parallel to the upper surface, and the reticle stage RST is placed through the air bearing. 201206548 The fixed speed can be moved in the Y direction and can be moved in the X direction and in the 0z direction. Further, a laser interferometer 21RY having a x-axis is fixed to the upper end of the upper frame 17 at the +Y direction, and a x-axis laser interferometer (not shown) is fixed to the upper end in the +x direction. The reticle interferometer formed by the interferometer, respectively, irradiates the measuring beam of the plurality of axes on the moving mirror 21 Μ γ or the like provided on the reticle stage RST, for example, a reference mirror on the side of the projection optical system PL (not shown) Based on the reference, the X-direction of the reticle stage WST, the position in the γ direction, and the rotation angles in the 0 X, 0 y, and θ Z directions are measured, and the measured values are supplied to a main control device (not shown). The stage control system in the main control unit (not shown) controls the Y direction of the reticle stage RST according to the measurement value of the reticle interferometer, etc., including a linear motor or the like (not shown). Speed and position, position in the χ direction, and rotation angle in the θ ζ direction. Further, when the exposure apparatus according to the present embodiment is a liquid immersion type, a partial liquid immersion mechanism (not shown) including, for example, an annular nozzle disposed on the lower surface of the optical member disposed at the lower end of the projection optical system PL is used for projection optics. A local liquid (pure water, etc.) is supplied to a partial liquid immersion area between the optical member of the front end of the system pL and the wafer W. As the partial liquid immersion mechanism, for example, a liquid immersion mechanism disclosed in the specification of the Japanese Patent Application Laid-Open No. 242247, and the like can be used. Further, when the exposure apparatus EX is of a dry type, it is not necessary to provide the liquid immersion mechanism. Further, in the interior of the loading chamber, a reticle magazine 9 and a horizontal multi-joint type robot, that is, a reticle loader 8, are provided on the upper support table 67. The reticle loader 8 replaces the reticle r between the reticle library 9 and the reticle stage RST by opening and closing the partition 8 00 _ 24r. Further, inside the loading chamber 10b, a wafer E7 and a horizontal articulated robot hand 6a for taking out or placing a wafer between the wafer E7 are provided on the lower support table 68. The horizontal multi-joint type is provided with a horizontal multi-joint type machine to constitute a wafer transfer device 6b. In the wafer transfer apparatus 6b, the wafer w is transferred between the horizontal articulated robots 6STST by the opening which is opened and closed by the shutter 24 of the partition member. Next, when the exposure apparatus is exposed thereto, the alignment of the reticle Μ wafer W is first performed. Thereafter, the reticle r is irradiated with the exposure light, and a part of the pattern of the reticle scale is projected onto the surface of the sunday W by the projection optical system PL, and the projection is performed. The projection magnification 光学 of the optical system PL is a scanning exposure operation in which the reticle stage stage rst and the wafer stage WST are synchronously moved (synchronously scanned) in the γ direction, and the reticle U pattern image is transferred in the irradiation area. Thereafter, the wafer w is stepwise moved in the χ direction and the γ direction through the wafer stage WST, and the scanning exposure operation is performed. The reticle R is transferred to all the irradiation areas of the wafer w by the step scanning method. The pattern image. The exposure apparatus EX, 4 of the eighth embodiment maintains the illumination characteristics, the brightness characteristic (illuminance uniformity, etc.), and the imaging magnification (resolution) of the projection optical system in a predetermined state, and sets the marking line. The ambient atmosphere (space) of the sheet r, the projection ", the first PL, and the wafer W is maintained in a predetermined environment, and exposure is performed with high exposure accuracy (resolution, positioning accuracy, etc.), for example, 13 201206548, which has an overall air conditioning system, The overall air conditioning system includes an air conditioner that supplies temperature-controlled clean air to the interior of the chamber 10 in a downflow manner. The air conditioning system has a partial air conditioning unit. That is, the manifolds 35b and 35a from the tube 35 are provided. The temperature-controlled clean air is supplied to the blow-out portion 19R of the bottom surface of the sub-chamber 22 and the blow-out portion w9w of the bottom surface of the optical system frame 16. In this case, the blow-out portions 19R and i9w are respectively disposed on the reticle The Y-axis laser interferometer 21RY for the RST and the Y-axis laser interferometer 21WY for the wafer stage WST are used for the measurement beam. The blow-outs 19R, 19W are temperature-controlled respectively. The air is distributed at a substantially uniform wind speed in a downflow manner (or in a lateral flow manner) to the optical path of the measuring beam. Similarly, the laser interferometer is also measured by the optical path of the beam. The temperature-controlled air can thereby accurately measure the positions of the reticle stage RST and the wafer stage WST by the reticle interferometer 21R and the wafer interferometer 21W. Further, in the load chamber 10b A partial air conditioner is provided. The partial vacant unit 60 includes a small fan motor disposed on the bottom surface of the support base 68, and supplies the air sent by the fan motor 61 to the top of the reticle library 9 and the crystal: the second 62' And before the arrangement, the ends are separated to supply the outlets 65 and 66 respectively. & 62R and 62W. Also, at the outlet 65 and;:...: do not have a filter such as a secret filter, in the wind Two: In the 62, there is a chemical filter (with W inch near ^ 33⁄4 ^, Λ ., ^ square 疋 疋 impurities), the filter phase 63, 64. As an example, the chemical filtration of the filter phase 63 When the system is 8 14 201206548, the organic gas (organic gas) The chemical filter of the filter case 64 removes an alkali gas (a gas of an alkaline substance) and an acid gas (a milk of an acidic substance). After the local air conditioner 60 is operated in the load chamber i〇b, the fan motor is operated. The air sent out 61 is supplied to the space in which the reticle library 9 and the wafer cassette 7 are disposed, from the air outlets 65 and 66, respectively, via the transition boxes 63, 64 and the tubes 62. Then, the flow is carried on the reticle. The air around the reservoir 9 is returned to the fan motor 61 via the periphery of the wafer holder 7 around the support table 67 and around the support table 67. Further, the air supplied from the air outlet 66 to the periphery of the wafer cassette 7 is supplied. Returning to the fan motor via the periphery of the support base 68, the air returning to the fan motor 61 is again supplied to the load chamber i〇b from the air outlets 65, 66 via the filter boxes 63, 64 and the dust filter. The local air conditioner 6 〇, the air in the load chamber 1 〇 b is kept in a clean state. Next, the configuration and operation of the filter device 26 connected to the air conditioner 30 in the overall air conditioning system of the present embodiment will be described. The filter device 26 has a box-shaped case 28 which is elongated in the Y direction and which is elongated in the Y direction, and a partition plate 42 which is divided into four planes in the γ direction in a substantially horizontal plane in a substantially horizontal plane. 42C and the first type of transition box 38 and the second type of filter case 4, which are provided in close contact with one of the partition plates 42A, 42A, and 42C (the surface in the +Υ direction in Fig. 1). And the transition 8 of the i-th type; the device 26 has two types and three (three-stage) transition boxes 38, 40 arranged in series. Hereinafter, the i-th type of filter box % is also referred to as a first filter case 38, and the second type of filter case 4 is also referred to as a first type 15 201206548 filter case 40. In the present embodiment, the filter surface of the filter case is disposed in a direction intersecting with the horizontal plane, for example, the filter surface of the filter case is disposed in the surface of the filter. In addition, the filter face of the filter box can also be arranged to tilt relative to the face. In this case, it is only necessary to form a tapered member on the frame installation surface of the filter case or a tapered member on the bottom plate 28h of the casing 28. In the present embodiment, the installation state of the filter case is set to be horizontal, which will be described below. Further, the filter device 26 has a window portion 28b (see FIG. 2) for opening or inserting the filter case 38 when the filter case 38, 4 is inserted or replaced. The casing 28 is openably and closably mounted to the door 29 through a hinge mechanism 29h (refer to Fig. 3). An opening 28a is formed in the upper space of the first space of the end portion of the casing 28 in the +γ direction, and an end portion of the pipe 25 for drawing the air-conditioning air AR is attached to the opening 28a, and is formed in the side wall of the casing 28 The opening 28g has a first tube 3 2 connected to the fourth space through opening 28 g at the end in the ?-γ direction of the casing 28. Fig. 2 is a view showing a filter device 26 of a bear that has opened the door 29 of the casing 28 of Fig. 1. In Fig. 2, for convenience of explanation, the casings 28 and 29, and the partition plates 42A to 42C are indicated by two-dot chain lines. In the circle 2, the door 29 is fixed to allow the gasket 46 to be formed between the periphery of the sealed window portion 28b and the end portions of the partition plates 42A to 42C and the door 29 when the window portion 2 of the casing 28 is closed by the door 29. The gasket 46 can be made of a material having excellent corrosion resistance and less degassing, a sheet of Teflon (registered trademark of DuPont), or a ruthenium. 16 201206548 In the interior of the body 18, the first filter case 38 of the partition plate 42 of the universal end is placed transversely to the _γ partition plate 42 Α and the Υ a a _ 4 door, respectively. The opening of the frame 50 (refer to FIG. 3) maintains a chemical machine that is useful for removing the body (the gas of organic matter). Further, the second filter 40 that is placed in contact with the center knife partition 42B is placed in the opening 5/f (see 3) of the frame 55, and an inert gas such as ammonia or amine is removed. The gas filter) and the chemical filter 56 of the acid gas (the gas of the 1111 substance). The width of the filter boxes 38, 40 in the Υ direction is, for example, 200 to 400 _, and each transition box 38, 4G The weight is, for example, about 10 to 20 kg. As the chemical filtration H 51 for organic gas removal, for example, an activated carbon type reactor or a ceramic type filter can be used. Chemically used in the stomach 56, can use additives activated carbon filter state, ion exchange resin filter, ion exchange fiber filter, or additive Tao Jing type of instrument, etc.. 'Frame 5, 55, separated Plates 2 to 42C, cassettes 28, and doors 29 are respectively made of (4) resistant to depletion (4), for example, an oxide film (oxidized aluminum) or stainless steel formed on the surface. In addition, the frame 50, 55, etc. can also contain (4) money and less degassing Material (so as to cover the laminate of a polyethylene or paragraph-based resin) or the like. Further 'by removing the organic gas, the chamber of the exposure chamber 1〇 ...

内曝光用光EL之透射率福斗,B M 町半徒升且藉由有機系氣體與曝光用 光EL之相互作用抑制形成於光學元件表面之霧物質之產 生。又,藉由除去鹼系氣體及酸性氣體,抑制晶圓w之光 阻特性之變化等。特別| ’當光阻為化學放大型光阻時, 17 201206548 若於空氣中有氨或胺等鹼系氣體,即有產生之酸反應而於 光阻表面形成難溶化層之虞。因此,特別是除去氨或胺等 鹼系氣體為有效。 此外,圖1之裝載室10b内之過濾器箱63,64内之化 學過濾器之構成,與化學過濾器5丨,56之構成相同。不過, 過’慮器相6 3,6 4較過遽器箱3 8,4 0小型亦可。 又,過濾器裝置26,具有固定於盒體28之-X方向之 側壁28i且分別將過濾器箱38, 4〇, 38定位於分隔板42八, 42B,42C之定位塊48A,48B,48C、以及分別將過濾器箱^ 4〇,38在2方向中央附近對定位塊48八,4884^彈壓之移 動用桿58A,58B, 58C。定位塊48A,48B,48C具有由分別 相對zy平面順時針以既定錐角0(參照圖3)傾斜之平面構 成之錐部 48Aa,48Ba,48Ca。 圖3係顯示已將圖2中之盒體28之門29關閉之狀態 之過濾器裝置26之俯視之剖面圖。不過,圖3中,形成於 盒體28之上板之空氣擷取用開口叫係以兩點鍊線顯示: 圖3中’於分隔板42A〜42C分別形成有使通過過渡器箱 38, 40之空氣通過之開口 42Aa,42知,42心又,盒體μ 内之空間係被分隔板42Α〜42C&+Y方向依序分成四個空 間⑽仉⑽…第旧叫通過開口…連通於圖 1之配管25,第4空間28f通過開口 %連通於圖】之第】 管仏進而’定位塊48A〜48C之錐部48心〜4心之錐角 0彼此相等,錐以為例如2G°〜4『,作為-例,錐角0 18 201206548 又,彼此相同構成之移動用桿58A,58B,58C被連結成 可相對刀別固定於分隔板42B,42C及盒體28之+Y方向側 壁之支點構件59A,59B,59C(保持構件)繞與Z軸平行之軸 (0 2方向)旋轉。作為一例,移動用桿58A具有能旋轉地連 結於支點構件59A之桿58A1、固定於桿漏前端部之各 過濾盗相38側及與此相反之側之半球狀抵接構件59A2及 把手58A3。 其久,參照從圖2之分隔板42A及42B側分別觀看過 遽々器箱38及40時之立體圖即圖4⑷及圖4(b),說明過滤 器相38及40之構成。圖4⑷及圖4⑻中之正交座標系統 ,Z)係刀别表示過濾器箱%及在過濾器裝置%内 设置於作為目標之位置之狀態之座標系統。 如圖4(A)所示,第1過濾器箱38具有於中央部設有大 致正方形開口 50f之大致環狀框架5〇、保持於開口谢内 之化學過濾器Μ、以及固定於框架5〇之一對凸狀把手部 70Α。塾片54之材料與塾片46之材料相同。 再者,本實施形態中,於框架5〇之與χζ平行之_Υ方 向之第1端面5〇a’設有藉接著等固定成包圍開口 50f之大 致正方形環狀塾片54(密封構件)。此外,墊片54亦可設於 第1端面5〇a所緊貼之對象側(例如分隔板 此外,帛1過滤器箱38之開口 5〇f亦可係四 形或多角形。又,框架5。之形狀亦不限於正方形,亦Ϊ係 長方形或多角形。 〃 又,過滤器箱3 8 於框架50之四個側面中_χ方向側 19 201206548 側面及+x方向側之第2側面全面分別具有對稱之 山邛5〇b及第2錐部50c ’該第1錐部50b及第2錐部 C形成為從框冑50之與χζ平行之+γ方向之第2端面 g彺第1端面5〇“則傾斜至框架5〇外側之平面所構成。 此第2側面係隔著第i側面隔著化學過濾器%(或框架5〇 之開口 50f)相反側之面。第i錐部5〇b相對ζγ平面順時針 以錐角0傾斜,第2錐部5Ge相對ζγ平面逆時針以錐角必 斜錐角</»與圖3之定位塊48Α〜48C之錐部48Aa〜48Ca 之錐角相等。因此’圖3中,當設相對框架5〇之端面* 第錐up 50b所構成之角度為^時,角度〇與雜角之 和為90。。 圖4(A)中,於框架50之第i錐部5〇b之從中央部往ζ 方向偏移之位置固定有把手部70a,於框架5〇之第\錐部 5〇C之從中央部往+z方向偏移之位置固定有把手部7〇a。 亦印’相對框帛50中心,-對把手部7〇八位於大致點對稱 =位置。又’框架50之·Ζ方向及+z方向之側面係分別與 XY平面平行之設置面50d及50e。 將過濾器箱38之框架50之設置面5〇d載置於盒體μ 之第3空严曰 1 28e之底板28h上面,如圖3所示,使框架5q 史第1錐部50b接觸於定位塊48A之錐部48八&,且框架π 之端面50a透過墊片54緊貼於分隔板42A之狀態,係第3 :間28e内之過渡器箱38之設置位置Q1。過遽:器箱’38因 横置而藉由自重穩定靜止。此情形下’由於於定位塊砸 之錐部48Aa之與把手部70A對向之位置形成有凹部 20 201206548 48Ab,因此即使有把手部7〇A亦可將第i錐部5〇b緊貼於 錐部48Aa。 同樣地,在盒體28之第1空間28c内之設置位置Q3, 過濾器箱38之框架50之設置面5〇d載置於底板28h之上 面,框架50之第1錐部5〇b接觸定位塊48C之錐部48Ca, 且端面50a透過墊片54緊貼於分隔板42C。又,設於第i 錐部50b之把手部70A收納於定位塊48C之錐部48Ca之凹 部48Cb内。 再者,過濾器箱38,由於在卸除一對把手部7〇A之狀 態下,即使繞與Y軸平行之軸(0 y方向)旋轉丨8〇。形狀亦相 同,因此亦能將框架50之另一設置面5〇e載置於盒體28 之底板28h上。如上述將設置面5〇e载置於底板28h上時, 由於框架50之第2錐部50c接觸定位塊48A(48C)之錐部 48Aa(48Ca),設於第2錐部50〇之把手部7〇A收納於凹部 48Ab(48Cb)内,因此過濾器箱38能正確地設置於設置位置 Q1 或 Q3。 如圖4(B)所示,第2過濾器箱4〇具有與框架5〇相同 形狀之於中央部設有開口 55f之大致環狀框架55、保持於 開口 55f内之化學過濾器56。又,過濾器箱4〇,於框架55 之-X方向侧之側面及+X方向側之側面全面,分別具有第i 錐部55b及第2錐部55c,該第1錐部55b及第2錐部55c 對稱地形成為從+ Y方向之第2端面55g往一γ方向之第1 端面55a側以錐角0傾斜至框架55外側。第2過濾器箱4〇 與第1過濾器箱38同樣地’亦可於框架55之-Y方向之第 21 201206548 1端面55a將墊片54固定成包圍開口 55f。又,第2過濾器 箱40之開口 55f亦與第i過濾器箱38同樣地,可係四^形 等矩形或多角形。又,框架55之形狀亦不限於正方形,亦 可係長方形或多角形。此外’框架5〇, 55可藉由例如模成 形等來製造。 再者,過濾器箱40,具有固定於從第i錐部55b之中 央往+z方向偏移之位置、以及與此位置在框架55中心大致 點對稱之第2錐部55e上之位置之—對把手部。又,框 架55之-Z方向及+Z方向之側面分別係設置面550及55e。 本實施形態中’第i過濾器㈣及第 之形狀之相異點在於,各自之—對把手部⑽及鹰^ 置沿Z方向偏移於相反方向。又,此形狀之相異,即使采 過滤器箱38, 40往0y方向旋轉18〇。亦被維持。因此,^ 業者可容易地從外觀互相辨別過渡器帛38, 4()。進而,_ 4(A)之框架50之一對把手部7〇A例如被以螺栓(未圖示)匡 定於錐部50b,50c之螺孔,於從錐部鳩,5〇c中心在與相 手部肅對稱於z方向之位置設定有安裝區域ei e2(形威 有能安裝把手部70A之螺孔”因此,一對把手部7〇A對鈽 部鳩,50a之安裝位置,係沿與傾斜方向相異之方^ 實施形態中係、沿相對傾斜方向正交之方向為可變。因此 藉由將把手部70A安裝於框架5〇之安裝區域m,E2, 5〇可作為第2過濾器箱40用之框架55使用。 7地,目4(B)中,—對把手部細對框架Μ之錐部 ,5a之安裝位置,係沿在與安裝區域£3, ^之間益傾 22 201206548 70B安裝於框架55 1過濾器箱38用之 斜之方向為可變。因此,藉由將把手部 之安裝區域E3,E4,框架55可作為第 框架5 0使用。 將過據器箱40之框架55之設置面55d載置於盒體μ 之第2 "”8d之底板28h上面’如圖3所示使框架55 之第1錐部55b接觸於定位塊48A之錐部4似,且框架55 之端面…透過塾片54緊貼於分隔板42B之狀態,係第2 工間28d内之過濾器箱4〇之設置位置Q2。過濾器箱的因 橫置而藉由自重穩定靜止。此情形τ,由於於定位塊伽 之錐部彻a之與把手部應對向之位置形成有凹部4跡 因此即使有把手部70B亦可將第i錐部55b緊貼於錐部 48Ba。 再者,過濾器箱40亦同樣地,由於即使繞0 y方向旋 轉180°形狀亦相同,因此亦能在卸除一對把手部7〇a之狀 態下,將框架55之另一設置面55e載置於盒體28之底板 28h上。如上述將設置面55e載置於底板28h上時,由於框 罙55之第2錐部55c接觸定位塊48B之錐部48Ba,設於第 2錐部55c之把手部70B收納於凹部48Bb内,因此過濾器 箱40能正確地設置於設置位置q2。 此外,如圖2所示,定位塊48C之凹部48Cb之位置係 配合把手部70A而位於較低位置(定位塊48A之凹部48Ab 亦相同)’疋位塊4 8 B之凹部4 8 B b之位置係配合把手部7 0 B 而位於較高位置。因此,若欲將第2過濾器箱4〇設置於空 間28c或28e内之設置位置Q3或Q1,由於過濾器箱40之 23 201206548 把手部70B會與定位塊48C或48A之錐部4心或48Aa機 械干涉,因此能防止誤將過濾器箱4〇設置於設置位置Q3, Q1。同樣地’若欲將第i過濾器箱38設置於空間28d内之 設置位置Q2,由於過濾器箱38之把手部7〇A會與定位塊 48B之錐部48Ba機械干涉,因此能防止誤將過濾器箱38 設置於設置位置Q2 ^如上述,根據本實施形態,過濾器箱 38之把手部70A之位置與過濾器箱4〇之把手部7〇B之位 置相異,且對應之盒體28内之定位塊48A,48C之凹部48Aa 48Ca之位置與定位塊48B之凹部48Bb之位置相異。因此, 能防止於分隔板42A,42C前面設置具有化學過濾器56(用 以除去鹼系氣體及酸性氣體)之過濾器箱4〇,相反地,防止 於分隔板42B之前面設置具有化學過濾器51(用以除去有機 系氣體)之過濾器箱38。 接著’圖3中,於分隔板42A,42B,42C之前面之設置 位置Ql,Q2, Q3分別設置過濾器箱38, 40, 38後,以移動用 桿58A,58B,5 8C將各過濾器箱38, 40, 38彈壓於分隔板42A, 42B,42C ’在盒體28之門29被關閉之狀態下,藉由定位塊 48八〜48(:及移動用桿58人〜58(:,使分隔板42人〜42(:與過 濾器箱38, 40之樞架50, 55之間之氣密性被墊片54維持得 較高。此結果,盒體28之形成有開口 28a之上板與分隔板 42C所夾之第1空間28c内之氣體,必定在通過過濾器箱 38之化學過濾器5 1後,通過開口 42Ca,流入以分隔板42B 及42C所夾之第2空間28d。同樣地,空間28d内之氣體, 必定在通過過濾器箱40之化學過濾器56後,通過開口 24 201206548 42Ba ’流入以分隔板42A及42B所夾之第3空間28e。同 樣地’空間28e内之氣體,必定在通過過濾器箱38之化學 過濾器51後,通過開口 42Aa、分隔板42A背面之第4空 間28f、盒體28之側壁之開口 28g,流至圖2之第1管32。 因此’由於從盒體28之+Y方向之上部之開口 28a流入之空 氣AR,必定通過兩個(兩段;)之有機系氣體除去用之過濾器 箱38及一個(一段)之鹼系氣體及酸性氣體除去用之過濾器 箱40而供給至圖1之空調裝置3〇,因此腔室1〇内被供給 已高度除去不純物之空氣。 其次’參照圖5(A)〜圖6(B)、以及圖7(A)、圖7(B)之 流程圖說明過濾器箱38,40對盒體28之設置動作及更換動 作。圖5(A)〜圖6(B) ’分別係以剖面表示盒體28之過濾器 裝置26之俯視圖。 首先’於盒體28最初設置兩個過濾器箱38及一個過 滤器相38時’在圖7(A)之步驟1〇2中,準備圖4(a)之填充 有未使用之化學過濾器5 1之兩個過濾器箱38、以及圖4(B) 之填充有未使用之化學過濾器56之一個過濾器箱4〇。次一 步驟104中,在解除盒體28之鎖固(未圖示)而開啟門29 後,如圖5(A)中箭頭B1所示將移動用桿58A〜58c往前方 (盒體28之窗部28b之外側)開啟。 次一步驟106中,作業者抓持第一個過濾器箱38之把 手部70A,將過濾器箱38(框架50)之設置面5〇d載置於盒 體28之第3空間28e内之底板28h(參照圖2)上。接著,作 業者如以箭頭B2所示,將過濾器箱38壓入第3空間28e 25 201206548 内。次一步驟108中’如圖5(B)中箭頭B3所示,作業者使 過濾器箱38之第1錐部50b卡合(接觸)於定位塊48a之錐 部48Aa。過濾器箱38之一把手部7〇A收納於定位塊48a 之凹部48Ab内。接著,如以箭頭B4所示,將移動用桿58a 壓抵於過渡器箱38之第2錐部50c,開始過濾器箱38之移 動。次一步驟110中,作業者如圖6(A)中箭頭B5所示,使 移動用桿58A進一步旋轉,而將過濾器箱38往_>(方向及_γ 方向彈壓。藉此,如以箭頭B6所示,在過濾器箱38之框 架50之第1錐部50b接觸於定位塊48A之錐部48^之狀 態下’過濾器箱38移動至盒體28之設置位置Q1,過濾器 箱38(框架50)之端面50a經由墊片54緊貼於分隔板“A。 次一步驟112中,作業者抓持第二個過濾器箱4〇之把 手部70B,將過濾器箱40(框架55)之設置面55d載置於盒 體28之第2空間28d内之底板28h上。接著,作業者如Z 箭頭B7所示,將過濾器箱4〇壓入盒體28之第2空間28d 内。次-步驟114巾’作業者如圖6(B)所示,使過遽器箱 4〇之第i錐部55b卡合(接觸)於定位塊48B之錐部/8Ba, 將移動用桿58B壓抵於過濾器箱4〇之第2錐部5九。過滹 器箱4〇之一把手部雇收納於定位塊彻之凹部48Bb内: -人-步驟116中’作業者如箭頭B8所示,使移動用桿 ⑽進-步旋轉’如以箭頭B9所示,在過濾器箱4〇之框 架55之第1錐部55b接觸於定位塊48B之錐部48Ba之狀 t下,使過遽器箱40移動至盒體28内之設置位置。藉 此,過滤器箱40(框架55)之端面…經由墊片54緊貼於^ 26 201206548 隔板42B。次一步驟118中,如箭頭B1〇所示,在盒體28 之第1空間28c内移動第三個過濾器箱38,使移動用桿58C 旋轉而將過處器箱3 8設置於第1空間2 8 c内之設置位置。 次一步驟120中,關閉盒體28之門29而鎖固,藉此過濾 器箱38, 40之設置即結束。 此時,將過濾器箱38(40)之第!錐部5〇b(55b)壓抵於定 位塊48A(48B)之錐部48Aa(48Ba)而僅彈壓過濾器箱 38(40),㈣1|箱38(4G)即短時間設置於分隔板42a(42b) 前面之設置位置Q1(Q2)。因此,能以有效率地且容易地定 位之方式進行過濾器箱38(4〇)、進而此内部之化學過遽器 5 1 (56)對作為目標之位置之設置。 ,、人在進行益體28内之過濾器箱38, 4〇之更換時, 首先在圖7(B)之步驟122 Φ,/Mr / 中作業者係解除盒體28之鎖固 而開啟門29 ’而如圖以禁 國(β)以箭碩D1所示開啟移動用桿 58C。次一步驟124中,作紫去把抽姑 〇σ 忭系考抓持第1空間28c内之過濾 ,。 1女以箭碩D2所示搬出過濾器箱 38。次一步驟126中 拍 圆1Α)以箭碩D3所示開啟移動用 +干5 8 Β後’作業者抓持第2 *門9 .Α 弟工間28d内之過濾器箱40之把 手部70B,並將過濾器箱In the transmittance of the internal exposure light EL, B M is half-literated and the generation of the mist material formed on the surface of the optical element is suppressed by the interaction of the organic gas and the exposure light EL. Further, by removing the alkali gas and the acid gas, the change in the photoresist characteristics of the wafer w and the like are suppressed. In particular, when the photoresist is a chemically amplified photoresist, 17 201206548 If there is an alkali-based gas such as ammonia or amine in the air, the generated acid reacts to form an insoluble layer on the surface of the photoresist. Therefore, it is effective to remove an alkali-based gas such as ammonia or an amine. Further, the configuration of the chemical filter in the filter boxes 63, 64 in the loading chamber 10b of Fig. 1 is the same as that of the chemical filters 5, 56. However, it is also possible to pass the '6', 6 4, and the smaller than the box 3, 4, 0 0. Further, the filter device 26 has a side wall 28i fixed in the -X direction of the casing 28 and positions the filter boxes 38, 4, 38, respectively, at the positioning blocks 48A, 48B of the partition plates 42, eight, 42B, 42C, 48C, and the moving rods 58A, 58B, 58C which are respectively biased by the filter box 4, 38, 38 in the vicinity of the center in the 2 direction to the positioning block 48, 4884^. The positioning blocks 48A, 48B, 48C have tapered portions 48Aa, 48Ba, 48Ca which are formed by planes which are inclined clockwise with respect to the zy plane at a predetermined taper angle 0 (refer to Fig. 3). Fig. 3 is a plan sectional view showing the filter device 26 in a state in which the door 29 of the casing 28 of Fig. 2 has been closed. However, in Fig. 3, the air intake opening formed in the upper plate of the casing 28 is indicated by a two-dot chain line: in Fig. 3, 'the partition plates 42A to 42C are respectively formed to pass through the transition box 38, 40 air passes through the opening 42Aa, 42 knows, 42 heart, the space inside the box μ is divided into four spaces (10) 仉 (10) by the partition plate 42 Α ~ 42C & + Y direction ... the old call through the opening ... connected In the pipe 25 of Fig. 1, the fourth space 28f is connected to the figure through the opening %. The pipe and the taper portion 48 of the positioning blocks 48A to 48C are equal to each other, and the cone is equal to each other, for example, 2G°. ~4『, as an example, the taper angle is 0 18 201206548. The moving rods 58A, 58B, 58C having the same configuration are connected so as to be fixed to the partition plates 42B, 42C and the +Y direction of the casing 28 with respect to the blade. The side wall fulcrum members 59A, 59B, 59C (holding members) are rotated about an axis (0 2 direction) parallel to the Z axis. As an example, the movement lever 58A has a rod 58A1 rotatably coupled to the fulcrum member 59A, a hemispherical abutment member 59A2 and a handle 58A3 which are fixed to the filter stalks 38 side of the rod end portion and the opposite side. For a long time, the configuration of the filter phases 38 and 40 will be described with reference to Figs. 4(4) and 4(b), which are perspective views when the buffer boxes 38 and 40 are viewed from the side of the partition plates 42A and 42B of Fig. 2, respectively. In the orthogonal coordinate system in Fig. 4 (4) and Fig. 4 (8), the Z) system indicates the filter case % and the coordinate system which is placed in the state of the target position in the filter device %. As shown in Fig. 4(A), the first filter case 38 has a substantially annular frame 5A having a substantially square opening 50f at the center, a chemical filter 保持 held in the opening, and a frame 5〇. One of the pair of convex handle portions 70Α. The material of the crotch panel 54 is the same as that of the crotch panel 46. Further, in the present embodiment, the first end face 5〇a' in the Υ-direction parallel to the cymbal 〇 is provided with a substantially square annular cymbal 54 (sealing member) that is fixed to surround the opening 50f. . Further, the spacer 54 may be provided on the object side to which the first end face 5〇a abuts (for example, the partition plate, the opening 5〇f of the filter case 38 may be a quadrangle or a polygon. The shape of the frame 5 is not limited to a square, and is also a rectangular shape or a polygonal shape. 〃 Further, the filter case 3 8 is on the four sides of the frame 50, the side of the χ direction 19, the side of the 201206548 side, and the second side of the side of the +x direction. The first tapered portion 50b and the second tapered portion C are formed to have a second end face in the +γ direction parallel to the crucible of the frame 50, respectively. The 1st end face 5〇 is formed by a plane inclined to the outer side of the frame 5〇. The second side face is opposed to the opposite side of the chemical filter% (or the opening 50f of the frame 5〇) via the i-th side. The portion 5〇b is inclined clockwise at a taper angle 0 with respect to the ζγ plane, and the second taper portion 5Ge is opposite to the ζγ plane counterclockwise with a taper angle and a taper angle </» with the taper portion 48Aa of the positioning block 48Α~48C of FIG. The taper angle of 48Ca is equal. Therefore, in Fig. 3, when the angle formed by the end face *the upper face 50b of the opposite frame 5〇 is ^, the sum of the angle 〇 and the miscellaneous angle is 90. In Fig. 4(A), the handle portion 70a is fixed to the position of the i-th tapered portion 5〇b of the frame 50 which is offset from the center portion in the direction of the ,, and the center of the frame 5 is tapered from the center. The handle portion 7〇a is fixed at a position offset from the +z direction. The same is printed on the opposite side of the frame 50, and the handle portion 7 is located at a point symmetry = position. The side faces in the z direction are the setting faces 50d and 50e which are respectively parallel to the XY plane. The setting surface 5〇d of the frame 50 of the filter case 38 is placed on the bottom plate 28h of the third space 曰1 28e of the casing μ, As shown in FIG. 3, the first tapered portion 50b of the frame 5q is brought into contact with the tapered portion 488 of the positioning block 48A, and the end surface 50a of the frame π is in close contact with the partitioning plate 42A through the spacer 54. 3: The position of the transition box 38 in the 28e is set to Q1. After the raft: the box '38 is stabilized by its own weight due to the transverse direction. In this case, 'because of the taper portion 48Aa of the positioning block 与 and the handle portion 70A Since the concave portion 20 201206548 48Ab is formed at the opposite position, the i-th tapered portion 5〇b can be brought into close contact with the tapered portion 48Aa even with the handle portion 7A. Similarly, the first empty portion of the casing 28 The setting position Q3 in the space 28c, the setting surface 5〇d of the frame 50 of the filter box 38 is placed on the upper surface of the bottom plate 28h, and the first tapered portion 5〇b of the frame 50 contacts the tapered portion 48Ca of the positioning block 48C, and the end surface The 50a is in close contact with the partitioning plate 42C through the spacer 54. Further, the handle portion 70A provided in the i-th tapered portion 50b is housed in the recessed portion 48Cb of the tapered portion 48Ca of the positioning block 48C. Further, the filter case 38 is In a state where the pair of grip portions 7A are removed, even 丨8〇 is rotated about the axis (0 y direction) parallel to the Y-axis. The shape is also the same, so that the other setting surface 5〇e of the frame 50 can also be placed on the bottom plate 28h of the casing 28. When the installation surface 5〇e is placed on the bottom plate 28h as described above, the second tapered portion 50c of the frame 50 contacts the tapered portion 48Aa (48Ca) of the positioning block 48A (48C), and is disposed on the handle of the second tapered portion 50〇. The portion 7A is housed in the recess 48Ab (48Cb), so that the filter case 38 can be correctly set at the set position Q1 or Q3. As shown in Fig. 4(B), the second filter case 4A has a substantially annular frame 55 having an opening 55f at the center portion and a chemical filter 56 held in the opening 55f having the same shape as the frame 5''. Further, the filter case 4A is provided on the side surface on the -X direction side of the frame 55 and the side surface on the +X direction side, and has an i-th tapered portion 55b and a second tapered portion 55c, respectively, and the first tapered portion 55b and the second portion The tapered portion 55c is symmetrically formed so as to incline from the second end surface 55g in the +Y direction toward the first end surface 55a side in the γ direction at the taper angle 0 to the outside of the frame 55. The second filter case 4 is similarly to the first filter case 38. The spacer 54 may be fixed to surround the opening 55f at the end face 55a of the 21st 201206548 1 in the Y direction of the frame 55. Further, similarly to the i-th filter case 38, the opening 55f of the second filter case 40 may have a rectangular shape or a polygonal shape such as a square shape. Further, the shape of the frame 55 is not limited to a square, and may be a rectangle or a polygon. Further, the frame 5, 55 can be manufactured by, for example, molding. Further, the filter case 40 has a position fixed to a position shifted from the center of the i-th tapered portion 55b toward the +z direction, and a position on the second tapered portion 55e which is substantially point-symmetric with respect to the center of the frame 55. On the handle part. Further, the side faces of the frame 55 in the -Z direction and the +Z direction are provided with faces 550 and 55e, respectively. In the present embodiment, the difference between the i-th filter (four) and the first shape is that the handle portion (10) and the eagle are offset in the opposite directions in the Z direction. Further, this shape is different, even if the filter boxes 38, 40 are rotated 18 Hz in the 0y direction. Also maintained. Therefore, the operator can easily distinguish the transitioners 38, 4() from each other in appearance. Further, the handle portion 7A of one of the frames 50 of the _4 (A) is, for example, bolted (not shown) to the screw holes of the tapered portions 50b, 50c, at the center of the taper portion, 5〇c The mounting area ei e2 is set at a position symmetrical with the phase of the hand in the z direction (the shape of the handle can be attached to the handle hole 70A). Therefore, the mounting position of the pair of handle portions 7A to the 钸 鸠, 50a, In the embodiment, the direction orthogonal to the oblique direction is variable. Therefore, by attaching the handle portion 70A to the mounting region m of the frame 5, E2, 5 can be used as the second The filter box 40 is used by the frame 55. 7 ground, in item 4 (B), - the handle portion is thinned to the taper of the frame ,, and the mounting position of the 5a is between the mounting area and the mounting area. Tilting 22 201206548 70B Mounting to frame 55 1 The direction of the filter box 38 is variable. Therefore, the frame 55 can be used as the frame 50 by attaching the mounting portions E3, E4 of the handle portion. The setting surface 55d of the frame 55 of the case 40 is placed on the bottom plate 28h of the second "8d of the casing μ'. The first tapered portion 55b of the frame 55 is connected as shown in FIG. It is similar to the tapered portion 4 of the positioning block 48A, and the end surface of the frame 55 is in contact with the partition plate 42B through the cymbal 54, and is the installation position Q2 of the filter case 4 in the second working chamber 28d. The case is stabilized by its own weight due to the lateral position of the case. In this case, since the recessed portion 4 is formed at the position where the taper portion of the positioning block and the handle portion are facing, the handle portion 70B can be the i-th. The tapered portion 55b is in close contact with the tapered portion 48Ba. Further, the filter case 40 is also similar in shape to the 180° rotation in the 0 y direction, so that the pair of handle portions 7〇a can be removed. The other setting surface 55e of the frame 55 is placed on the bottom plate 28h of the casing 28. When the setting surface 55e is placed on the bottom plate 28h as described above, the second tapered portion 55c of the frame 55 contacts the positioning block 48B. Since the tapered portion 48Ba is housed in the recessed portion 48Bb by the handle portion 70B provided in the second tapered portion 55c, the filter case 40 can be accurately placed at the installation position q2. Further, as shown in Fig. 2, the recessed portion 48Cb of the positioning block 48C is provided. The position is in the lower position with the handle portion 70A (the recess 48Ab of the positioning block 48A is also the same) '疋 block The position of the recessed portion 4 8 B b of 4 8 B is located at a higher position in cooperation with the grip portion 7 0 B. Therefore, if the second filter case 4 is to be placed at the set position Q3 or Q1 in the space 28c or 28e, Since the handle portion 70B of the filter case 40 201206548 mechanically interferes with the core 4 or 48Aa of the positioning block 48C or 48A, it is possible to prevent the filter case 4 from being erroneously disposed at the set position Q3, Q1. If the i-th filter case 38 is to be placed at the set position Q2 in the space 28d, since the handle portion 7A of the filter case 38 mechanically interferes with the tapered portion 48Ba of the positioning block 48B, the filter case 38 can be prevented from being mistakenly moved. The position is set in the setting position Q2. As described above, according to the present embodiment, the position of the handle portion 70A of the filter case 38 is different from the position of the handle portion 7B of the filter case 4, and the positioning in the corresponding case 28 is performed. The position of the recess 48Aa 48Ca of the blocks 48A, 48C is different from the position of the recess 48Bb of the positioning block 48B. Therefore, it is possible to prevent the filter case 4〇 having the chemical filter 56 (to remove the alkali gas and the acid gas) from being disposed in front of the partition plates 42A, 42C, and conversely, to prevent the chemical layer 56 from being disposed in front of the partition plate 42B. A filter box 38 of a filter 51 (for removing organic gases). Next, in Fig. 3, after the filter boxes 38, 40, and 38 are disposed at the setting positions Q1, Q2, and Q3 in front of the partition plates 42A, 42B, and 42C, respectively, the respective filters are moved by the moving rods 58A, 58B, and 5 8C. The boxes 38, 40, 38 are biased against the partition plates 42A, 42B, 42C' in the state where the door 29 of the casing 28 is closed, by positioning blocks 48 to 48 (: and the moving rod 58 to 58 ( : The airtightness between the partition plates 42 to 42 (: and the pivots 50, 55 of the filter boxes 38, 40 is maintained high by the spacer 54. As a result, the opening of the casing 28 is formed. The gas in the first space 28c sandwiched between the upper plate 28a and the partition plate 42C must pass through the chemical filter 51 of the filter case 38, and pass through the opening 42Ca to flow into the partition plates 42B and 42C. Similarly, the gas in the space 28d must pass through the chemical filter 56 of the filter case 40, and then enters the third space 28e sandwiched by the partition plates 42A and 42B through the opening 24 201206548 42Ba '. Similarly, the gas in the space 28e must pass through the chemical filter 51 of the filter box 38, pass through the opening 42Aa, the fourth space 28f on the back side of the partition plate 42A, The opening 28g of the side wall of the body 28 flows to the first tube 32 of Fig. 2. Therefore, the air AR flowing in from the opening 28a in the upper portion of the +Y direction of the casing 28 must pass through two (two sections; The filter case 38 for removing gas and one (one) of the alkali-type gas and the filter case 40 for acid gas removal are supplied to the air conditioner 3 of FIG. 1, so that the chamber 1 is supplied with height removal. Air of impure material. Next, the installation and replacement of the cartridge 28 by the filter boxes 38, 40 will be described with reference to the flowcharts of Figs. 5(A) to 6(B) and Figs. 7(A) and 7(B). 5(A) to 6(B) are plan views showing the filter device 26 of the casing 28 in a cross section. First, two filter boxes 38 and one filter phase 38 are initially provided in the casing 28. At step 1〇2 of Fig. 7(A), the two filter boxes 38 filled with the unused chemical filter 51 are prepared in Fig. 4(a), and the filling of Fig. 4(B) is not A filter case 4 of the chemical filter 56 is used. In the next step 104, after the lock (not shown) of the case 28 is released and the door 29 is opened, as shown in Fig. 5(A) The heads B1 open the moving levers 58A to 58c to the front (the outer side of the window portion 28b of the casing 28). In the next step 106, the operator grips the handle portion 70A of the first filter case 38, and will The installation surface 5〇d of the filter case 38 (frame 50) is placed on the bottom plate 28h (refer to FIG. 2) in the third space 28e of the casing 28. Next, the operator will filter the filter as indicated by the arrow B2. The box 38 is pressed into the third space 28e 25 201206548. In the next step 108, as shown by an arrow B3 in Fig. 5(B), the operator engages (contacts) the first tapered portion 50b of the filter case 38 with the tapered portion 48Aa of the positioning block 48a. One of the handle portions 7A of the filter case 38 is housed in the recess 48Ab of the positioning block 48a. Next, as shown by an arrow B4, the movement lever 58a is pressed against the second tapered portion 50c of the transition box 38, and the movement of the filter case 38 is started. In the next step 110, the operator rotates the movement lever 58A as shown by an arrow B5 in Fig. 6(A), and the filter case 38 is biased toward the _> direction and the _γ direction. As indicated by an arrow B6, in a state where the first tapered portion 50b of the frame 50 of the filter case 38 comes into contact with the tapered portion 48 of the positioning block 48A, the filter case 38 is moved to the set position Q1 of the case 28, the filter The end face 50a of the case 38 (frame 50) is in close contact with the partition plate "A" via the spacer 54. In the next step 112, the operator grips the handle portion 70B of the second filter case 4, and the filter case 40 is placed. The installation surface 55d of the (frame 55) is placed on the bottom plate 28h in the second space 28d of the casing 28. Next, the operator presses the filter case 4 into the second of the casing 28 as indicated by the Z arrow B7. In the space 28d, the second-step 114 towel' operator inserts (contacts) the i-th tapered portion 55b of the buffer box 4〇 with the taper portion/8Ba of the positioning block 48B as shown in Fig. 6(B). The moving rod 58B is pressed against the second tapered portion 5 of the filter case 4〇. One of the handle portions of the filter box 4 is manually received in the recessed portion 48Bb of the positioning block: - Person - in step 116, the operator Arrow B8 Rotating the moving rod (10) in a stepwise manner as shown by an arrow B9, in a state where the first tapered portion 55b of the frame 55 of the filter case 4 is in contact with the tapered portion 48Ba of the positioning block 48B, the filter is made The box 40 is moved to the set position in the casing 28. Thereby, the end face of the filter box 40 (frame 55) is in close contact with the partition 42B via the spacer 54. In the next step 118, as indicated by the arrow B1〇 As shown in the figure, the third filter case 38 is moved in the first space 28c of the casing 28, and the moving rod 58C is rotated to set the passing box 38 to the installation position in the first space 28c. In a step 120, the door 29 of the casing 28 is closed and locked, whereby the setting of the filter boxes 38, 40 is completed. At this time, the third taper portion 5b of the filter box 38 (40) (55b) Pressing against the tapered portion 48Aa (48Ba) of the positioning block 48A (48B) and only pressing the filter case 38 (40), (4) 1 | box 38 (4G) is set in front of the partition plate 42a (42b) for a short time. Position Q1 (Q2) Therefore, the position of the target position of the filter case 38 (4〇) and the internal chemical filter 5 1 (56) can be performed efficiently and easily. ,,people at When the filter case 38, 4〇 in the benefit body 28 is replaced, first, in step 122 of FIG. 7(B), Φ, /Mr / the operator releases the lock of the case 28 to open the door 29'. The figure opens the moving lever 58C in the forbidden country (β) as indicated by the arrow D1. In the next step 124, the purple is used to grasp the filtering in the first space 28c. 1 Female moves out of the filter box 38 as indicated by the arrow D2. In the next step 126, the circle is 1 Α), as shown by the arrow D3, the movement is used + the dry 5 8 Β, then the operator grasps the 2nd door 9 . 把手 the handle portion 70B of the filter box 40 in the 28d And filter box

^ 〇之第1錐部55b沿定位塊48B 之錐邛48Ba往前方移動。次一 步驟128中,作業者如以箭 頭D4所不將過濾器箱 u „ 皿體28之第2空間28d拔出。^ The first tapered portion 55b of the crucible moves forward along the taper 48Ba of the positioning block 48B. In the next step 128, the operator does not pull out the filter box u „ the second space 28d of the dish 28 by the arrow D4.

二人一步驟130中,如圖5(B 桿58A後,作業者抓拄楚 前碩D5所示開啟移動用 Ψ ^ 70 A 、第3空間28e内之過遽器箱38之把 手。P 70A,並將把手部 从前碩D6所示方向。藉此, 27 201206548 如以箭頭D7所示,過濾器箱38之第1錐部50b沿定位塊 48A之錐部48Aa往前方移動。次一步驟132中,作業者如 圖5(A)以箭頭D8所示將過濾器箱38從盒體28之第3空間 拔出。 次一步驟134中,藉由與步驟1〇6〜118相同之步驟, 作業者將新的過濾器箱38, 4〇設置於盒體28内之作為目標 之位置。次一步驟〗36中,藉由關閉盒體28之門29而鎖 固’結束過滤器箱3 8,4 0之更換。 此時’過濾器箱38, 40由於能從設置位置容易地拔出, 因此能容易且有效率地進行盒體28中之過濾器箱38, 4〇之 更換。 ’ 本實施形態之效果等如下所述。 (1)本實施形態之曝光裝置ΕΧ具備包含過濾器裝置26 及空調裝置30之整體空調系統,過濾器裝置26係收容化 學過濾器51等之裝置。又,過濾器裝置26,具備:第^過 濾器箱38 ’具備保持化學過濾器51(第i過濾器)之箱狀(筒 狀)之框架50(第1框架)、以及形成於框架5〇之—χ方向側 面(第1側面)之至少一部分且從框架50之第2端面5〇g側 往第1端面50a側逐漸傾斜至框架5〇外側之第t錐部 (作為S i形狀變化部之第i傾斜部);以及收容過濾器箱 38之盒體28(收容部)。進而,於框架5〇之兩個端面中之第 1端面50a設有墊片54(第1密封構件)。 又’盒體28具備支撐與框架5〇之·χ方向側面相異之 側面即設置面50d之底板28h(第1底座構件)、具有卡合於 28 201206548 框架50之第!錐部5〇b之錐部48Aa(第i導引面)以定位框 架50之定位塊48A(第i定位構件)、以及藉由定位塊 與第1錐部50b卡合而按壓框架5〇之第i端面5〇a之分隔 板42A(第1分隔構件)。 又將使用過濾器裝置26之過濾器收容於盒體28(收 容部)之方法,包含:準備第1過濾器箱38之步驟102,該 第1過渡器箱38具備保持化學過濾器5 i且形成有第丨錐 部50b之框架50、以及設於框架5〇之第i端面5以之墊片; 將框架50之與形成有第i錐部5〇b之側面相鄰之側面(設置 面50d)載置於盒體28之底板28h表面之步驟;使框架 5〇之第1錐部5〇b卡合於盒體28之錐部48Aa,以使框架 5〇移動於盒體28之分隔板42A方向之步驟刚;以及將框 架50之端面50a透過墊片54按壓於分隔板42八之步驟"ο。 根據本實施形態,係藉由彈壓(移動)框架50以使框架 Μ之第1錐部50b沿盒體28之定位塊48A移動,而能以有 效率、及容易定位之方式進行框架5()(過濾器箱⑹對盒體 Μ内之目標位置(接觸分隔板42八之位置)之設置。換言之, 框架50之第i錐部5〇b能發揮移動及定位之兩個功能。 ⑺又,過滤ϋ箱38具備第2錐部5Ge(作為形狀變化部 之第2傾斜部)’肖第2錐部5〇c(作為形狀變化部之第2傾 斜。卩)形成於框架50之與形成有第!錐部5〇b之側面隔著化 學過濾器為相反側之側面(第2側面)之至少一部分,從 端面50g側往端面50a側逐漸傾斜至框架%外側,盒體μ 具有於盒體28設置成可移動,且卡合於框架5〇之第2錐 29 201206548 =,:框架5°透過抵接構件58A2(第3導引面)麗抵於In the two-person step 130, as shown in Fig. 5 (B-bar 58A, the operator grasps the movement Ψ ^ 70 A , the handle of the damper box 38 in the third space 28e as shown by the operator D5. P 70A And the handle portion is in the direction indicated by the front D6. Thereby, 27 201206548, as indicated by an arrow D7, the first tapered portion 50b of the filter case 38 moves forward along the tapered portion 48Aa of the positioning block 48A. In Fig. 5, the operator pulls the filter case 38 from the third space of the casing 28 as indicated by an arrow D8 in Fig. 5(A). In the next step 134, the same steps as steps 1〇6 to 118 are performed. The operator places the new filter boxes 38, 4 作为 in the target position in the casing 28. In the next step 136, the filter box 3 is locked by closing the door 29 of the casing 28. Replacement of 8, 4 0. At this time, since the filter boxes 38, 40 can be easily pulled out from the installation position, the filter boxes 38 and 4 in the casing 28 can be easily and efficiently replaced. The effects and the like of the present embodiment are as follows: (1) The exposure apparatus of the present embodiment includes an entire air conditioning system including the filter device 26 and the air conditioner 30. The filter device 26 is a device that accommodates the chemical filter 51. The filter device 26 includes a box-shaped (cylindrical) that holds the chemical filter 51 (i-th filter). The frame 50 (first frame) and at least a part of the side surface (first side surface) formed in the frame 5〇 are gradually inclined from the second end face 5〇g side of the frame 50 toward the first end face 50a side to the frame 5 a t-th tapered portion on the outer side (the i-th inclined portion as the S i shape changing portion); and a case 28 (accommodating portion) in which the filter case 38 is housed. Further, the first of the two end faces of the frame 5 The end surface 50a is provided with a gasket 54 (first sealing member). The casing 28 has a bottom plate 28h (first base member) that supports the side surface of the frame 5, which is different from the side surface of the frame 5, and has a card. In conjunction with 28 201206548 frame 50, the tapered portion 48Aa (i-th guiding surface) of the tapered portion 5〇b is positioned to position the positioning block 48A of the frame 50 (the i-th positioning member), and by the positioning block and the first tapered portion 50b is engaged and presses the partition plate 42A (first partition member) of the i-th end face 5〇a of the frame 5〇. The filter is used again. The method of accommodating the filter of the filter 26 in the casing 28 (accommodating portion) includes a step 102 of preparing the first filter case 38, and the first transition box 38 is provided with the chemical filter 5 i and the third cone is formed. a frame 50 of the portion 50b and a spacer provided on the i-th end surface 5 of the frame 5〇; the side surface (the installation surface 50d) of the frame 50 adjacent to the side on which the i-th tapered portion 5〇b is formed is placed a step of the bottom surface 28h of the casing 28; the first tapered portion 5〇b of the frame 5 is engaged with the tapered portion 48Aa of the casing 28 to move the frame 5〇 in the direction of the partition 42A of the casing 28. The step is just as follows; and the step 50a of pressing the end face 50a of the frame 50 through the spacer 54 to the partition plate 42 is < According to the present embodiment, by moving (moving) the frame 50 so that the first tapered portion 50b of the frame is moved along the positioning block 48A of the casing 28, the frame 5 can be efficiently and easily positioned. (The filter box (6) is provided for the target position in the cassette body (contacting the position of the partition plate 42). In other words, the i-th taper portion 5〇b of the frame 50 can perform two functions of movement and positioning. (7) The filter box 38 includes the second tapered portion 5Ge (the second inclined portion as the shape changing portion), and the second tapered portion 5〇c (the second inclined portion as the shape changing portion) is formed in the frame 50 and formed. At least a part of the side surface (second side surface) on the opposite side of the side surface of the tapered portion 5〇b is gradually inclined from the end surface 50g side toward the end surface 50a side to the outer side of the frame %, and the casing μ has a box. The body 28 is provided to be movable and is engaged with the second cone 29 of the frame 5〇 201206548 =,: the frame 5° is transmitted through the abutting member 58A2 (third guiding surface)

In t之移動用桿58A(第2定位構件)。因此,能順暢 地進仃框架50之移動。 此外,移動用桿58A〜58(:不一定要設置。 (3)又’過濾器裝置26具備:第2過濾器箱4〇,具備 保持與化學過濾器5"目異之化學過濾器%之框狀框架 55(第2框架),以及設於框架55之第^端面“a之塾片第 2密封構件)、形成於框架”之^方向側面(第3側面)之至 > 一部分、從框架55之第2端面55g側往第1端面55a側 傾斜至框架55外側之第丨錐部州(第3傾斜部)。又,盒 體28’具備支撑框架55之與形成有第1錐部55b之側面: 異之側面(設置面55d)之底板28h(第2底座構件)、具有卡合 於框架55之第i錐部55b之錐部(第2導引面)以定位 框架55之疋位塊48B(第3定位構件)、以及藉由定位塊彻 與第1錐部50b卡合而按壓框架55之端面55a之分隔板 42B(第2分隔構件)。 因此,係藉由彈壓(移動)框架55以使框架55之第1錐 部55b沿盒體28之定位塊48B移動,而能以有效率、及容 易定位之方式進行框架55(化學過濾器56)對盒體28内之目 標位置(接觸分隔板42B之位置)之設置。 又’盒體28内之分隔板42A〜42C,雖係與包含鉛直 線之面大致平行(大致垂直於水平面),但本實施形態中,由 於有定位塊48A〜48C,因此能順暢地進行過濾器箱38 之移動及定位。此外,定位塊48A〜48C,例如亦可相對包 ⑧ 30 201206548 含鉛直線之面傾斜。 ⑷又,過滤器箱38具備第4錐部心(第4傾斜部), 該第4錐部50c形成於框架55之與形成有帛i錐部价之 側面隔著化學過濾器56為相反側之側面(第4側面)之至少 一部分,從端面55g側往端面55a側逐漸傾斜至框架乃外 側,盒體28具有於盒體28設置成可移動,且卡合於框架 55之第2錐部55c,將框架55透過抵接構件5882(第4導 引面)壓抵於分隔板42A之移動用桿58B(第4定位構件)。 因此’能順暢地進行框架55之移動。 (5) 又,框架50之第i錐部5〇b及第2錐部5〇c形成於 框架50之兩個側面全面,框架55之第i錐部55b及第2 錐部55c形成於框架55之兩個側面全面。因此,錐部5〇b, 5〇c等之加工係容易。 此外,錐部50b,50c亦可僅形成於框架5〇之對應側面 之一部分。此情形下,亦可在盒體28側之對應定位塊48A, 48C,僅於與錐部50b對應之部分形成錐部(第i導引面)。 此點錐部55b,55c(第3導引面)亦相同。 (6) 又,由於過濾器箱38(框架50)之錐部5〇b,50c及過 濾器箱40(框架55)之錐部55b,5九分別形成為平面、亦即 直線狀’與此等對應之定位塊48A,48B之錐部48Aa,48Ba 亦形成為平面’因此錐部50b,50c等之形成係容易。 然而’亦可將錐部50b,50c及錐部55b,55c形成為凸 或凹之球面狀 '亦即曲線狀。此情形下,藉由與此等對應 之定位塊48 A,48B之錐部48 Aa,48Ba形成為凹或凸之球面 31 201206548 狀,而能與上述實施形態同樣地使用定位塊似,彻進行 過遽器箱3 8,4 0之移動及定位。 (7) 又,設於圖4(A)之過濾器箱38之框架5〇之·χ方向 側面之凸把手部70Α(第!把手部)係設於第1錐部5仳,二 與此對應之盒體28内之定位塊48A之錐部48入3設有把手 部70A能通過之凹部48Abe因此,即使有把手部7〇a亦能 使框架50之第】錐部50b緊貼於定位塊48八之錐部48八^ 而移動。此點關於過濾器箱40之第1錐部55b之把手部 70B(第2把手部)亦相同。 (8) 又,設於圖4(A)之過濾器箱38之框架50之+χ方向 側面之凸把手部70Α(第3把手部)係設於第2錐部5〇Ce此 情形下,由於有兩個把手部70A ’因此過濾器箱38之搬送 係容易,且即使使過濾器箱38旋轉丨8〇。,亦能使框架5〇 之第2錐部50c緊貼於定位塊48A之錐部48Aa而移動。此 點關於過濾器箱40之第2錐部55c之把手部70B(第4把手 部)亦相同。 此外’於框架50亦可取代凸把手部70A而形成凹把手 部。同樣地’於框架55亦可取代凸把手部70B而形成凹把 手部。 此外,把手部70A, 70B不一定要設置。 (9) 又’圖4(A)中,亦可在第1過濾器箱38之框架50 之第2錐部50c中央附近,於接近端面50a之位置F2設置 把手部70A,於與第1錐部50b之位置F2對稱之位置設置 把手部70A。此情形下,先於圖2之定位塊48A之錐部48Aa ⑧ 201206548 之對應位置形成凹部48 Ab。又,圖4(B)中,在第2過濾器 箱40之框架55之第2錐部55c中央附近,於遠離端面5 〇a 之位置F4設置把手部70B,於與第1錐部55b之位置F4 對稱之位置设置把手部7 0 B。進而,於圖2之定位塊4 8 B 之錐部48Ba之對應位置形成凹部48Bb。此情形下,把手部 70A,70B對框架50,55之位置關係與端面55a,55a之距離 相異。因此,作業者能從把手部7〇a,70B對框架50,55之 位置識別過濾器箱38, 40。 (10) 又,過濾器箱38(框架50内)之化學過濾器51(濾材) 係除去通過其中之氣體中之有機系氣體(有機物),過濾器箱 40(框架55内)之化學過濾器56(濾材)係除去通過其中之氣 體中之鹼性氣體及酸性氣體,因此能將已高度除去不純物 之空氣供給至收納曝光本體部4之腔室1〇内。 此外’框架5 5内之過渡器亦可係例如除去通過其中之 氣體中之鹼性物質及酸性物質之至少一方。又,化學過渡 器除去之不純物亦可係任意’例如藉由一個化學過減器吸 收有機系氣體與鹼性氣體及酸性氣體。 再者,框架50,55内之過濾器能使用化學過渡器以外 之任意過濾器(濾材)。例如,作為框架5〇, 55内之過滤器, 亦能使用如HEPA過濾器或ULPA過濾器之用以除去微小粒 子(微粒)之濾塵器。 (11) 再者,於本實施形態之過濾器裝置26雖設置有兩 個過濾器箱38(框架50)及一個過濾器箱40(框架55),但過 渡器裝置26所具備之框架50, 55之數目係任意。又,於過 33 201206548 濾器裝置26亦可僅設置一個或複數個框架5〇、或一個或複 數個框架55。 (12)又,本實施形態之曝光裝置Εχ,係以曝光用光el 經由標線片R之圖案及投影光學系統?1使晶圓w(基板)曝 光,其具備:腔室10,收納使晶圓W曝光之曝光本體部4; 本實施形態之過濾器裝置26;以及空調裝置3〇,將從腔室 之外部擷取之空氣經由過濾器裝置26送至腔室1〇内。 根據本實施形態,由於能以有效率之方式進行過濾器 裝置26之過濾器箱38,40(框架5〇,55)之更換,能高精度地 進行框架50,55之定位,因此能有效率地進行曝光裝置之 維護,且能高精度地除去腔室10内之空氣之不純物。 此外,本實施形態中,作為裝載室1〇b内之局部空調 裝置60之過濾器箱63, 64之框架,亦可使用與過濾器箱38 4〇之框架50, 55相同之形成有錐部之框架,將過濾器箱〇 64收納於具備形成有與定位塊48A〜48C相似形狀之錐部 之定位塊之盒體。 此外,上述實施形態亦可如下變形。以下變形例中, 係對與圖3 '圖4(A)及圖5(B)對應之部分賦予相同符號, 省略其詳細說明。 (1)圖8(A)係顯示上述實施形態之第1變形例之第i過 慮器箱38A及與此對應之定位塊48A之立體圖,圖8(b)係 顯示該第1變形例之第2過濾器箱40A及與此對應之定位 塊48B之立體圖。藉由將圖8(A)之定位塊48a及圖8(b)之 疋位塊48A分別取代圖2之定位塊48A,48C及48B而設置 ⑧ 34 201206548 於盒體28内,而能將此第1變形例之過濾器箱38A,4〇A 設置於盒體28内。 圖8(A)中,第i過濾器箱38A具有保持化學過濾器η 之大致環狀框架50、設於框架5〇之第丄端面池之塾片 54A(切除墊片54之一部分後之形狀)、由設於框架5〇之] 方向側面(第1側面)之凹部構成之把手部5〇μ(第i把手 部)、以及於㈣5G之_χ方向側面形成為於z方向狹持把 手部50bl且從框架50之第2端面5〇g往第i端面術側逐 漸傾斜至框架50外側之兩個第i錐部5〇1)2及5〇b3(第1傾 斜部之兩個部分)。再者,過濾器箱38A具有由設於框架% 之+X方向側面(第3側面)之凹部構成之把手部5〇(:1(第3把 手部)、以及於框架50之+x方向側面形成為於2方向挾持 把手部50cl且與第丨錐部5〇b2,5〇b3對稱地傾斜之兩個第 2錐部50c2及5〇c3(第2傾斜部之兩個部分)。又,於把手 部50bl,50cl為使作業者更容易抓持而設有抓持部49a。 又,把手部50bl對框架50之設置面之z方向位置, 較把手部50c 1之Z方向位置低,把手部5〇b丨,5〇c丨係相對 框架50中心以旋轉對稱之位置關係設置。換言之,一把手 部50bl之從框架50下方之設置面起在z方向之距離與另 一把手部50cl之從框架50上方之設置面起在乙方向之距 離相等。進而,於定位塊48A之錐部48Aa之與把手部 50bl(及50cl)對應之位置設有凸部49C。凸部49C之高度設 定成較從錐部50b2, 50b3至抓持部49A之深度低。因此, 框架50之錐部50b2, 5〇b3(或50c2,.50c3)能緊貼於定位塊 35 201206548 48A之錐部48Aa。 此外’於定位塊48A亦可以於z方向挾持凸部49c之 方式形成與錐部50b2, 50b3對應之兩處之錐部FA1,fA2。 亦可取代圖2之移動用桿58A,而設置將錐部 個別彈壓之兩個移動用桿58AU,58AD。 。又,圓8(B)中,第2過濾器箱4〇A具有保持化學過濾 窃56之大致環狀框架55、設於框架55之第上端面之 塾片54B(切除墊片54之一部分後之形狀)' 由設於框架μ 之_X方向側面(第2側面)及對向於此之側面(第4側面)之凹 部構成之-對把手部55bl,55el(第2把手部及第4把手 部)、以及於框架55之X方向兩個側面分別形成為於z方 向挾持把手部55bl,55cl之第i錐部55b2及55b3(第2傾 斜部之兩個部分)及第2錐部55c2及55c3(第4傾斜部之兩 個口P刀)。又,於把手部55b!,5 5c j設有抓持部。 又,把手部55bl,55cl對框架55之Z方向位置關係, 與把手部50bl,50cl對框架50之2方向位置關係為相反。 換言之,一把手部55bl之從框架55下方之設置面起在z 方向之距離與另一把手部55(^之從框架55上方之設置面起 在Z方向之距離相等。進而,過濾器箱4〇A之一把手部乃匕1 之從框架55下方之設置面起在z方向之距離與過濾器箱 38A之一把手部50bl之從框架5〇下方之設置面起在z方 向之距離互異。再者,於定位塊48B之錐部48Ba之與把手 部55b 1 (及5 5c 1)對應之位置設有凸部49D。因此,若誤使 第1過濾器箱38A之框架50接觸於定位塊48B時,凸部 36 201206548 49D與框架50之第i錐部5〇b2(或會機械干涉。相對 於此,框架55之錐部55b2,55b3(或55c2,55c3)能緊貼於定 位塊48B之錐部48Ba。相反地,誤使第2過滤器箱4〇A 之框架55接觸於圖8(A)之定位塊48a時,凸部與框架 55之第1錐部55b2(或55c2)會機械干涉。因此,在此第工 變形例亦同樣地’能防止誤將第2過渡器肖椒設置於定 位塊48A之某空間,防止誤將第i過遽器肖38a設置於定 位塊48B之某空間。 此外,此第1變形例中’過濾器箱38A之抓持部49A 及過濾器箱40A之抓持部49B亦可不一定要設置。又,於 定位塊48B亦可以在Z方向挾持凸部49D之方式形成與錐 部5 5b2, 5 5b3對應之兩處之錐部FB1,FB2。又’亦可取代 圖2之移動用桿58B,而設置將錐部55c2,55c3個別彈壓之 兩個移動用桿58BU,58BD。 此外,圖2中,亦可僅將例如過濾器箱4〇以圖8(B)之 過濾器箱40A置換,將對應之圖2之定位塊48B以圖8(B) 之定位塊4 8 B置換。 (2)其次,圖9(A)係顯示上述實施形態之第2變形例之 第1過濾器箱38B及與此對應之定位塊48A1i立體圖,圖 9(B)係顯示該第1變形例之第2過濾器箱4〇B及與此對應 之定位塊48A2之立體圖。藉由將圖9(A)之定位塊48A1及 圖9(B)之定位塊48A1分別取代圖2之定位塊48A,48C及 48B而設置於盒體28内,而能將此第2變形例之過濾器箱 3 8B,40B(框架50A,5 5A)設置於盒體28内。 37 201206548 圖9(A)中,第1過濾器箱38B具有保持化學過據器5 1 之大致環狀框架50A(第1框架)、設於框架5〇a之-Y方向 第1端面之墊片54、由設於框架50之+Z方向側面之凸部 構成之把手部70C(第1把手部)、以及形成於框架5〇A之·χ 方向側面50Ab之+Ζ方向側且朝向墊片54側以錐角0傾斜 至框架50A外側之第1錐部5〇Abt(第1傾斜部)。框架5〇A 之+X方向側面50Ac係與ZY平面平行地傾斜。 再者’定位塊48A1之錐角0之錐部48Ala僅形成於框 架50A之與第1錐部5〇Abt對應之部分。因此,框架5〇A 之第1錐部50Abt能緊貼於定位塊48A1之錐部48Ala。 又圖9(B)中,第2過;慮器箱40B具有保持化學過遽 器56之大致環狀框架μα(第2框架)、設於框架55八之第 1端面之墊片54、由設於框架55之+2方向側面之凸部構成 之把手部70D(第2把手部)' 以及形成於框架55A之_χ方 向側面55Ab之-Z方向側且朝向墊片54側以錐角必傾斜至 框架55A外側之第!錐部55Abt(第2傾斜部)。框架55八之 +X方向側面55Ac係與ZY平面平行地傾斜。再者,定位塊 48A2之錐角0之錐部48A2a僅形成於框架55八之與第上錐 部55Abt對應之部分。 又,第1錐部55Abt對框架55A之Z方向位置關係, 與第1錐部50Abt對框架5〇A之z方向位置關係為相反。 再者,於定位塊48A1之錐部48Ala與定位塊48A2之錐部 48^在Z方向之位置相異。因此框架嫩,Μ能從外 觀容易地識別。進而’能防止誤將第1過濾器帛38B設置 38 201206548 於疋位塊48A2之某空間,相反地,能防止誤將第2過遽器 箱40B設置於圖9(A)之定位塊48A1之某空間。 此外,此變形例中,例如,亦可使在第j過濾器箱MB 之框架50A上面之把手部7〇c之與第2側面5〇Ac之距離與 在第2過濾器箱40B之框架55A上面之把手部7〇D之與第 2側面50Ac之距離相異。又,亦可使把手部7〇c之與端面 50Aa之距離與把手部7〇D之與端面5〇Ac之距離相異。 (3)其次,圖1〇係顯示上述實施形態之第3變形例之過 濾器裝置26A之俯視剖面圖。圖1〇中,透過固定於門 内面之支點構件59D,59E,59F(保持構件)能旋轉地設有彼 此相同構成之移動用桿58D,58E,58F。代表性地,移動用 桿58E具有能旋轉地連結於支點構件59E之桿58Ει、固定 於門29之台座58E3、以及從台座58E3將桿58E1往框架 55之+X方向側面(錐部)側彈壓之壓縮線圈彈簧58E2。於桿 58E1設有使逆時針旋轉之旋轉角成為既定之上限值以下之 擋件(未圖示)。其他構成與圖3相同。 過濾器裝置26A中,在開啟門29之狀態下,使兩個過 渡器箱38之帛i錐部通之一部分分別卡合於定位塊似, 48C之錐部48Aa,48Ca,使過渡器箱4〇之第^雖部州之 一部分卡合於定位塊48B之錐部48B以接著,如以箭頭B2〇 所不,藉由關閉門29,藉由移動用桿58D〜58F如以箭頭 B21,B22, B23所示地彈壓過濾器箱38, 4〇, 38之框架5〇, 55, 5〇之第2錐部50c,55c,5〇c。接著,過濾器箱38, 4〇, 分 、箭頭B24,B25,B26所示地沿定位塊μα〜we移動, 39 201206548 而設置於分隔板42A〜42C之前面之設置位置qi〜q3。因 此’能將過濾器箱3 8,40之設置有效率地進行。 (4)其次,圖11 (A)係顯示上述實施形態之第4變形例之 第1過濾器箱38C及與此對應之定位塊48A之俯視圖。過 濾器箱38C係將化學過濾器51收納於環狀之框架5〇c内, 於框架50C端面固定有墊片54者。又,框架5〇c之對向之 第1侧面50Cb及第2側面50Cc係平均對稱地傾斜,且分 別形成階梯狀之段差部,於側面5〇Cb,5〇Cc安裝有把手部 70A » 藉由使第1側面50Cb或第2側面50Cc接觸於定位塊 48A之錐部而移動過濾器箱38(:,能容易地在盒體28内將 過遽器箱38C定位成接觸分隔板42A。 又,圖11(B)係顯示第5變形例之第i過濾器箱38β及 與此對應之定位塊48A之俯視圖。過;慮器箱38D係將化學 過濾器5 1收納於環狀之框架5〇D内,於框架端面固定 有墊片54者。又,框架5〇D之對向之第i側面5嶋及第 2側面5GDe係平均對稱地傾斜,且分別於外側形成凸之複 數個圓弧部,於側面觸,50Dc安裝有把手部7〇A。 似藉由使第i側面5_或第2側面職接觸於定位塊 一 錐°P而移動過濾器箱38D,能容易地將過攄器箱38D 疋位成接觸分隔板42A。 又11(C)係顯示第6變形例之第1過濾器箱38 與势I* ife 〜之疋位塊48A之俯視圖。過濾器箱38E係將化學 〜盗”收納於環狀之框架5〇Εβ,於框架則端面固定 ⑧ 40 201206548 有墊片54者。又,框架50E之對向之第i側面5〇Eb及第2 側面5〇Ec係平均對稱地傾斜,且分別於外側形成凸之圓弧 部’於側面50Eb,50Ec安裝有把手部7〇A。 藉由使第1側面50Eb或第2側面5〇Ec接觸於定位塊 48A之錐部而移動過濾器箱38E,能容易地將過濾器箱38E 定位成接觸分隔板42A。 此外,亦可將圖11(B)之複數個圓弧部或圖u(c)之凸 之圓弧部以旋轉滾子構成。 (5)其次,圖12(A)係顯示上述實施形態之第7變形例之 過渡器裝置26B ’圖12(B)係顯示圖12(A)中之第1過滤器 箱38F»圖12(A)之過濾器裝置26B中,於盒體μ内之分 隔板42A之與過濾器箱38F,40F對向之面,覆裝有能從塾 片54容易地分離且易滑動且於中央部形成有使氣體通過之 開口之平板狀罩構件TF5❶罩構件TF5由例如合成樹脂形 成’具體而言’係由例如鐵氟龍(杜邦公司之註冊商標)形成。 又’以緊貼覆裝於分隔板42A之罩構件TF5之方式定 位有第1過濾器箱38F ’以緊貼此過濾器箱38F之方式依序 定位有第2過濾器箱40F、第1過濾器箱38F、以及第2過 濾器箱40F。一列之過濾器箱38F,4〇F,38F,4〇f,分別被固 定於盒體28内面之定位塊48A3, 48B3, 48A4, 48B4定位。 定位塊48A3, 48B3等之Y方向之長度,設定成較過濾器箱 3 8F,40F之Y方向高度小。 過濾器箱38F, 40F係將化學過濾器51,56分別收納於 環狀之框架50F, 55F内,於框架50F,55F端面固定有墊片 41 201206548 54者。再者,框架5〇F,55F之對向之第i側面及第2側面 係對稱地傾斜之錐面,沿框架5叩,55ρ之第(側面、第2 側面卩及與固^有墊片54之端面對向之端面,覆裝有能 從墊片54容易地分離且易滑動之罩構件tfi,tf2。於框架 50F’ 5 5F之對向之第丨側面及第2側面,透過罩構件 TF4心有把手部爾,廳。固^有把手部7qa,繼之位 置之高度係互異。於定位塊48幻,48八4及48B3,48B4之錐 部,亦分別固定有為平板狀且於—部分形成有槽之罩構件 TF3及TF4。罩構件TF1,TF2,TF3,TF4之材料與例如罩構 件TF5之材料相同。 如圖12(B)所示,於過濾器箱38F2罩構件τρι之與化 學過濾器51對向之部分形成有使氣體通過之矩形之開口 TFlc。覆蓋框架5〇F之第i側面及第2側面之罩構件τη 之部分作成對稱傾斜之錐部TFla,TFlbe雖過濾器箱4〇f 之構成亦相同,但把手部70B之位置與把手部7〇A之位置 相異。 圖12(A)中,於關閉盒體28之門29之内側設有移動用 桿58G。移動用桿58G具備台座部58(}3、沿γ方向延伸之 導引部58G4、具有能沿導引部58G4移動於γ方向之傾斜 面之桿部58G卜以及從台座部58G3將桿部58G1往接觸定 位塊48B4之過濾器箱40F之罩構件TF2之錐部彈壓之壓縮 線圈彈簧58G2。 ' 此例之過濾器裝置26B中,在將過濾器箱38F,4〇F收 納於盒體28内時’係分別使過濾器箱38F,4〇F之罩構件τρι ⑧ 42 201206548 TF2之錐部接觸於覆蓋定位塊48A3, 48B3, 48A4, 48B4之之 罩構件TF3, TF4,使過濾器箱38F, 40F依序往大致-Y方向 移動。此時,由於罩構件TF 1〜TF4容易滑動,因此能容易 地移動過濾器箱38F,40F。 進而,在已定位過濾器箱38F, 40F, 38F, 40F之狀態下, -Y方向端部之過濾器箱38F之墊片接觸覆蓋分隔板42A之 罩構件TF5,與過濾器箱38F(40F)之罩構件TF1(TF2)相鄰 之過濾器箱40F(38F)之墊片54接觸於其。若在此狀態下關 閉門29,由於藉由移動用桿58G將+Y方向端部之過濾器箱 40F往-Y方向彈壓,因此分隔板42A(罩構件TF5)與過濾器 箱38F, 40F能保持氣密性地緊貼。因此,能通過四段過濾 器箱38F,40F將清淨之氣體供應至空調裝置之送風部(不圖 示)。 又,在更換過濾器箱38F,40F時,係開啟門29,依序 將過濾器箱38F, 40F從盒體28搬出。此時,由於例如過濾 器箱40F之墊片54能從過濾器箱38F之罩構件TF1容易地 分離,過濾器箱38F之墊片54亦能從罩構件TF5容易地分 離,因此能容易地進行過濾器箱38F,40F之更換。 此外,過濾器裝置26B中,過濾器箱38F, 40F之段數 為任意。又,定位塊48A3, 48B3等之罩構件TF3, TF4係能 省略。進而,在設有定位塊48A3, 48B3等之罩構件TF3, TF4 時,亦能省略過濾器箱38F,40F之罩構件TF1,TF2之錐部。 再者,亦能取代罩構件TF 1〜TF4,貼附例如易滑動之 樹脂製黏附帶。 43 201206548 (6)上述實施形態及變形例中,過濾器箱38, “A〜 40’ 40A〜40之框架5〇, 5〇A〜5〇F及% 55a〜55F之外形 係大致正方形(大致正方形之環狀(框狀))。然而框架5〇, 55A等及55, 55A等之外形亦可係例如長方形等大致矩形 (大致矩形之環狀(框狀))或大致正方形或矩形且於角部施有 去角等。 又,在使用上述實施形態之曝光裝置Εχ製造半導體元 件等電子元件(或微型元件)時,電子元件如圖13所示,係 經進行電子元件之功能]生能設計之步驟221,根據此設計 步驟製作光罩(標線片)之步驟222,製造元件基材即基板(晶 圓)並塗布光阻之步驟223,包含藉由前述實施形態之曝光 裝置將光罩之圖案曝光於基板(感應基板)之步驟、使已曝光 之基板顯影之步驟、已顯影基板之加熱(cure)以及顯影步 驟之基板処理步驟224,元件組裝步驟(包含切割步驟、接 。步驟封裝步驟等加工製程)225,以及檢査步驟226等而 製造。 一疋以,此元件製造方法,包含使用上述實施形態之曝 光裝置於基板上形成感光層之圖案之動作與處理形成有該 圖案之基板之動作(步驟224)。藉由該#光裝i,由於能減 低維遵成本,提升曝光精度,因此能廉價且高精度地製造 電子元件》 此外’上述實施形態中’雖使用空氣作為空調用之氣 體但亦可取代其而使用氮II或稀有氣體(氣、魚^等)、或此 等氣體之混合氣體等。 201206548 又本發明不僅可適用於使用掃描曝光型之投影曝光 置進订曝光之情形,亦能適用於使用一次曝光型(步進機 型)之投影曝光裝置進行曝光之情形。 又,本發明亦能適用於以不使用投影光學系統之近接 方式或接觸方式之曝光裝置等進行曝光時。 又,本發明並不限定適用於半導體元件之製程,亦能 廣泛適用於例如形成於角型玻璃板之液晶顯示元件、或電 漿顯示器等顯示器裝置之製程、或攝影元件(CCD等)、微型 機械、MMS(Microelectr〇mechanical :微小電氣機 械系統)、薄膜磁頭及DNA晶片等各種元件之製程。進而, 本發明亦能適用於使用微影製程製造形成有各種元件之遮 罩圖案之遮罩(光罩、標線片等)時之製造步驟。 如上述,本發明並不限定於上述實施形態,當然可在 不脫離本發明要旨之範圍内採取各種構成。 又,援用本案所記載之上述公報、各國際公開小冊子、 美國發明專利、或美國發明專利申請 :為本說明書記載之-部分。又,包含說明書 範圍、圖式、以及摘要之2010年4月5曰提出之美國發明 專利申請第咖,914號之所有揭示内容,均直接引用而 加入本案中。 【圖式簡單說明】 之構成之一部分 圖1係顯示實施形態一例之曝光裝置 已切除之圖。 45 201206548 圖2係顯示圖1之過滤器裝置26之立體圖。 圖3係顯示圖2之過渡器裝置2 6之剖面圖。 圖4(A)係顯示圖3中之過濾器箱38之立體圖,(B)係 顯示圖3中之過濾器箱40之立體圖。 圖5(A)及(B)係分別顯示過濾器箱38與盒體28之相對 位置之變化之一部分已切除之俯視圖。 圖6(A)及(B)係分別顯示過濾器箱38,4〇與盒體28之 相對位置之變化之一部分已切除之俯視圖。 圖7(A)係顯示過濾器箱之設置動作一例之流程圖,(B) 係顯示過濾器箱之更換動作一例之流程圖。 圖8(A)係顯示第1變形例之過濾器箱38A之立體圖, (B)係顯示第1變形例之過濾器箱4〇A之立體圖。 圖9(A)係顯示第2變形例之過濾器箱38B之立體圖, (B)係顯示第2變形例之過濾器箱4〇B之立體圖。 圖1〇係顯示第3變形例之過濾器裝置之剖面圖。 圖1 1(A)、(B)、(〇係分別顯示第4變形例、第5變形 例及第6變形例之過濾器箱之俯視圖。 圖12(A)係顯示第7變形例之過濾器裝置之剖面圖, 係顯示圖12(A)中之過濾器箱之立體圖。 圖1 3係顯示電子元件之製程一例之流程圖。 【主要元件符號說明】 EX :曝光裝置 R :標線片 46 201206548 PL :投影光學系統 λν .晶圓 4 :曝光本體部 10 :腔室 26 :過濾器裝置 28 :盒體 30 :空調裝置 38,40 :過濾器箱 42Α〜42C :分隔板 48Α〜48C :定位塊 50, 55 :框架 50b, 55b :第1錐部 51,56 :化學過濾器 60 :局部空調裝置 70A, 70B :把手部In t's movement lever 58A (second positioning member). Therefore, the movement of the frame 50 can be smoothly performed. Further, the movement levers 58A to 58 (not necessarily provided.) (3) Further, the filter device 26 is provided with a second filter case 4, which is provided with a chemical filter 5" The frame-shaped frame 55 (second frame) and the second sealing member provided on the end surface "a of the frame 55" are formed on the side surface (the third side surface) of the frame" to > The second end surface 55g side of the frame 55 is inclined toward the first end surface 55a side to the second taper state (third inclined portion) outside the frame 55. Further, the casing 28' includes a bottom plate 28h (second base member) of the support frame 55 and a side surface on which the first tapered portion 55b is formed: a different side surface (the installation surface 55d), and an i-th tap that is engaged with the frame 55 The tapered portion (second guiding surface) of the portion 55b presses the clamping block 48B (third positioning member) of the positioning frame 55 and the end surface 55a of the frame 55 by engaging the positioning block with the first tapered portion 50b. Partition plate 42B (second partition member). Therefore, by biasing (moving) the frame 55 to move the first tapered portion 55b of the frame 55 along the positioning block 48B of the casing 28, the frame 55 can be carried out in an efficient and easy manner (chemical filter 56). The setting of the target position in the casing 28 (contacting the position of the partition plate 42B). Further, the partition plates 42A to 42C in the casing 28 are substantially parallel to the surface including the straight line (substantially perpendicular to the horizontal plane). However, in the present embodiment, since the positioning blocks 48A to 48C are provided, the smoothing can be smoothly performed. Movement and positioning of the filter box 38. Further, the positioning blocks 48A to 48C may be inclined, for example, with respect to the surface of the lead-containing straight line of the package 8 30 201206548. (4) Further, the filter case 38 is provided with a fourth tapered core portion (fourth inclined portion) formed on the side opposite to the chemical filter 56 on the side surface of the frame 55 on which the 帛i taper portion is formed. At least a portion of the side surface (fourth side surface) is gradually inclined from the end surface 55g side toward the end surface 55a side to the outer side of the frame, and the casing 28 is provided to be movable in the casing 28 and engaged with the second tapered portion of the frame 55. 55c, the frame 55 is pressed against the movement lever 58B (fourth positioning member) of the partition plate 42A through the abutting member 5882 (fourth guide surface). Therefore, the movement of the frame 55 can be smoothly performed. (5) Further, the i-th tapered portion 5〇b and the second tapered portion 5〇c of the frame 50 are formed on both side faces of the frame 50, and the i-th tapered portion 55b and the second tapered portion 55c of the frame 55 are formed in the frame. The two sides of the 55 are comprehensive. Therefore, the processing of the tapered portions 5〇b, 5〇c, and the like is easy. Further, the tapered portions 50b, 50c may be formed only on a part of the corresponding side faces of the frame 5''. In this case, the corresponding positioning blocks 48A, 48C on the side of the casing 28 may be formed with a tapered portion (i-th guiding surface) only in a portion corresponding to the tapered portion 50b. The taper portions 55b and 55c (the third guide faces) are also the same. (6) Further, since the tapered portions 5〇b, 50c of the filter case 38 (frame 50) and the tapered portions 55b of the filter case 40 (frame 55) are formed into a flat surface, that is, a linear shape, The tapered portions 48Aa, 48Ba of the corresponding positioning blocks 48A, 48B are also formed in a plane "so that the formation of the tapered portions 50b, 50c, etc. is easy. However, the tapered portions 50b, 50c and the tapered portions 55b, 55c may be formed in a convex or concave spherical shape, that is, a curved shape. In this case, the tapered portions 48 Aa, 48Ba of the positioning blocks 48 A, 48B corresponding thereto are formed into a concave or convex spherical surface 31 201206548, and can be similarly used in the same manner as in the above embodiment. Movement and positioning of the buffer box 3 8, 4 0. (7) Further, the convex handle portion 70Α (the first handle portion) provided on the side surface of the frame 5 of the filter case 38 of Fig. 4(A) is attached to the first tapered portion 5仳, and The tapered portion 48 of the positioning block 48A in the corresponding casing 28 is provided with a recess 48Abe through which the handle portion 70A can pass. Therefore, even if the handle portion 7〇a is used, the first tapered portion 50b of the frame 50 can be closely attached to the positioning. Block 48 eight of the cone 48 48 ^ and move. This point is also the same for the handle portion 70B (second handle portion) of the first tapered portion 55b of the filter case 40. (8) Further, the convex handle portion 70A (the third handle portion) provided on the side surface of the frame 50 of the filter case 38 of Fig. 4(A) in the +χ direction is provided in the second tapered portion 5〇Ce, Since there are two handle portions 70A', the transfer of the filter case 38 is easy, and even if the filter case 38 is rotated by 8 inches. Further, the second tapered portion 50c of the frame 5A can be moved in close contact with the tapered portion 48Aa of the positioning block 48A. This point is also the same for the handle portion 70B (fourth handle portion) of the second tapered portion 55c of the filter case 40. Further, the frame 50 can also form a concave handle portion instead of the convex handle portion 70A. Similarly, the frame 55 can also form a concave handle portion instead of the convex handle portion 70B. Further, the handle portions 70A, 70B are not necessarily provided. (9) Further, in FIG. 4(A), the handle portion 70A may be provided at a position F2 near the end surface 50a in the vicinity of the center of the second tapered portion 50c of the frame 50 of the first filter case 38, and the first cone may be provided. The handle portion 70A is provided at a position where the position F2 of the portion 50b is symmetrical. In this case, the recess 48 Ab is formed at a position corresponding to the tapered portion 48Aa 8 201206548 of the positioning block 48A of Fig. 2 . Further, in Fig. 4(B), the handle portion 70B is provided at a position F4 away from the end surface 5 〇a in the vicinity of the center of the second tapered portion 55c of the frame 55 of the second filter case 40, and is formed in the first tapered portion 55b. The handle portion 7 0 B is disposed at a position where the position F4 is symmetrical. Further, a concave portion 48Bb is formed at a corresponding position of the tapered portion 48Ba of the positioning block 48B of Fig. 2 . In this case, the positional relationship of the handle portions 70A, 70B to the frames 50, 55 is different from the distance between the end faces 55a, 55a. Therefore, the operator can recognize the filter boxes 38, 40 from the positions of the frames 50, 55 from the grip portions 7a, 70B. (10) Further, the chemical filter 51 (filter material) of the filter case 38 (in the frame 50) is a chemical filter for removing the organic gas (organic matter) in the gas passing therethrough, and the filter case 40 (in the frame 55). Since the 56 (filter material) removes the alkaline gas and the acid gas in the gas passing therethrough, the air in which the impurities have been highly removed can be supplied into the chamber 1 of the storage main body portion 4. Further, the transition means in the frame 55 may be, for example, at least one of an alkaline substance and an acidic substance in the gas passing therethrough. Further, the impurities removed by the chemical converter may be arbitrarily absorbing, for example, an organic gas with an alkaline gas and an acid gas by a chemical reducer. Further, the filter in the frames 50, 55 can use any filter (filter material) other than the chemical transition device. For example, as the filter in the frame 5, 55, a dust filter such as a HEPA filter or a ULPA filter for removing minute particles (fine particles) can also be used. (11) Further, in the filter device 26 of the present embodiment, two filter cases 38 (frame 50) and one filter case 40 (frame 55) are provided, but the frame 50 of the transition device 26 is provided. The number of 55 is arbitrary. Further, the filter unit 26 may be provided with only one or a plurality of frames 5, or one or a plurality of frames 55. (12) Further, in the exposure apparatus of the present embodiment, the exposure light el is transmitted through the pattern of the reticle R and the projection optical system. (1) exposing a wafer w (substrate), comprising: a chamber 10, accommodating the exposure main body portion 4 for exposing the wafer W; the filter device 26 of the present embodiment; and the air conditioner 3, from the outside of the chamber The extracted air is sent to the chamber 1 via the filter device 26. According to the present embodiment, since the filter boxes 38, 40 (frames 5, 55) of the filter device 26 can be replaced efficiently, the positioning of the frames 50, 55 can be performed with high precision, so that it is efficient The maintenance of the exposure apparatus is performed, and the impurities of the air in the chamber 10 can be removed with high precision. Further, in the present embodiment, as the frame of the filter boxes 63, 64 of the partial air conditioner 60 in the loading chamber 1b, the same shape as the frames 50, 55 of the filter case 38 can be used to form the tapered portion. In the frame, the filter case 64 is housed in a case having a positioning block formed with a tapered portion similar in shape to the positioning blocks 48A to 48C. Further, the above embodiment may be modified as follows. In the following modifications, the same reference numerals are given to the portions corresponding to those in Fig. 3 (A) and Fig. 5 (B), and the detailed description thereof will be omitted. (1) Fig. 8(A) is a perspective view showing the i-th filter case 38A according to the first modification of the first embodiment and the positioning block 48A corresponding thereto, and Fig. 8(b) shows the first modification. 2 is a perspective view of the filter box 40A and the positioning block 48B corresponding thereto. By placing the positioning block 48a of FIG. 8(A) and the clamping block 48A of FIG. 8(b) in place of the positioning blocks 48A, 48C and 48B of FIG. 2, respectively, 8 34 201206548 is provided in the casing 28, and this can be The filter cases 38A, 4A of the first modification are provided in the casing 28. In Fig. 8(A), the i-th filter case 38A has a substantially annular frame 50 holding the chemical filter η, and a crotch piece 54A provided in the second end surface of the frame 5's (the shape after cutting off a part of the spacer 54) The handle portion 5〇μ (the i-th handle portion) formed by the concave portion provided on the side surface (the first side surface) of the frame 5, and the side surface of the (4) 5G direction are formed to narrow the grip portion 50bl in the z direction. Further, from the second end face 5〇g of the frame 50 to the i-th end side, the two i-th tapered portions 5〇1)2 and 5〇b3 (two portions of the first inclined portion) are gradually inclined to the outside of the frame 50. Further, the filter case 38A has a handle portion 5〇 (:1 (third handle portion) formed of a concave portion provided on the side surface (third side surface) in the +X direction of the frame %, and a side surface of the frame 50 in the +x direction The two tapered portions 50c2 and 5〇c3 (two portions of the second inclined portion) that are gripped by the grip portion 50cl in the two directions and are inclined symmetrically with the second taper portions 5〇b2 and 5〇b3 are formed. The handle portions 50b1, 50c1 are provided with grip portions 49a for making it easier for the operator to grip. Further, the position of the grip portion 50b1 in the z-direction of the mounting surface of the frame 50 is lower than the position of the grip portion 50c1 in the Z direction, and the handle is low. The portion 5〇b丨, 5〇c丨 is disposed in a rotationally symmetrical positional relationship with respect to the center of the frame 50. In other words, the distance from the setting surface of the lower portion of the frame 50 from the setting surface below the frame 50 to the frame of the other handle portion 50cl is 50. The setting surface above the 50 is equal to the distance in the direction B. Further, the convex portion 49C is provided at a position corresponding to the handle portion 50b1 (and 50cl) of the tapered portion 48Aa of the positioning block 48A. The height of the convex portion 49C is set to be larger. The depth of the tapered portion 50b2, 50b3 to the grip portion 49A is low. Therefore, the tapered portion 50b2, 5〇b3 (or 50c) of the frame 50 2, .50c3) can be closely attached to the taper portion 48Aa of the positioning block 35 201206548 48A. Further, the tapping portion of the two portions corresponding to the tapered portions 50b2, 50b3 can be formed in the positioning block 48A so as to hold the convex portion 49c in the z direction. FA1, fA2. Instead of the moving rod 58A of Fig. 2, two moving rods 58AU, 58AD for individually pressing the taper portion may be provided. Further, in the circle 8 (B), the second filter box 4A The substantially annular frame 55 having the chemical filter clogging 56 and the cymbal 54B (the shape after cutting a portion of the spacer 54) provided on the upper end surface of the frame 55 are provided on the side of the frame μ in the X direction (2nd) The side surface) and the concave portion facing the side surface (fourth side surface) are formed by the pair of handle portions 55b1, 55el (the second handle portion and the fourth handle portion) and the side surfaces of the frame 55 in the X direction. The handle portions 55b1, 55cl, the i-th tapered portions 55b2 and 55b3 (two portions of the second inclined portion), and the second tapered portions 55c2 and 55c3 (the two-ported P-knife of the fourth inclined portion) are held in the z direction. The handle portions 55b!, 5 5c j are provided with grip portions. Further, the positional relationship between the grip portions 55b1, 55cl in the Z direction of the frame 55, and the handle portions 50bl, 50cl The positional relationship of the two directions of the frame 50 is reversed. In other words, the distance of the handle portion 55b1 from the setting surface below the frame 55 is in the z direction and the other handle portion 55 (from the setting surface above the frame 55 in the Z direction) Further, the distance between the handle portion of the filter case 4A is 1 in the z direction from the setting surface below the frame 55 and the setting of the handle portion 50b1 of the filter case 38A from below the frame 5〇 The distances in the z direction are different. Further, a convex portion 49D is provided at a position corresponding to the handle portion 55b 1 (and 5 5c 1) of the tapered portion 48Ba of the positioning block 48B. Therefore, when the frame 50 of the first filter case 38A is mistakenly brought into contact with the positioning block 48B, the convex portion 36 201206548 49D and the i-th tapered portion 5 〇 b2 of the frame 50 (or mechanical interference. In contrast, the frame 55 The tapered portions 55b2, 55b3 (or 55c2, 55c3) can be brought into close contact with the tapered portion 48Ba of the positioning block 48B. Conversely, the frame 55 of the second filter case 4A is accidentally brought into contact with the positioning block 48a of Fig. 8(A). In this case, the convex portion and the first tapered portion 55b2 (or 55c2) of the frame 55 mechanically interfere with each other. Therefore, in the same modification, it is also possible to prevent the second transitional device from being erroneously placed on the positioning block 48A. The space prevents the erroneous yoke 38a from being disposed in a certain space of the positioning block 48B. Further, in the first modification, the grip portion 49A of the filter case 38A and the grip portion 49B of the filter case 40A are also Further, the positioning block 48B may form the tapered portions FB1 and FB2 corresponding to the tapered portions 5 5b2 and 5 5b3 so as to hold the convex portions 49D in the Z direction. The movement lever 58B is provided with two movement levers 58BU, 58BD that individually bias the tapered portions 55c2, 55c3. In addition, in Fig. 2, for example, only filtration may be applied. The tank 4〇 is replaced by the filter box 40A of Fig. 8(B), and the corresponding positioning block 48B of Fig. 2 is replaced by the positioning block 4 8 B of Fig. 8(B). (2) Next, Fig. 9(A) The first filter case 38B according to the second modification of the above-described embodiment and the positioning block 48A1i corresponding thereto are shown, and FIG. 9(B) shows the second filter case 4B of the first modification and the like. Corresponding to the positioning block 48A2, the positioning block 48A1 of FIG. 9(A) and the positioning block 48A1 of FIG. 9(B) are respectively disposed in the casing 28 instead of the positioning blocks 48A, 48C and 48B of FIG. Further, the filter case 38B, 40B (frame 50A, 5 5A) of the second modification can be placed in the casing 28. 37 201206548 In Fig. 9(A), the first filter case 38B has a chemical retention The substantially annular frame 50A (first frame) of the device 5 1 , the spacer 54 provided on the first end surface of the frame 5 〇 a in the Y direction, and the handle portion formed by the convex portion provided on the side surface of the frame 50 in the +Z direction 70C (the first handle portion) and the first tapered portion 5〇Abt which is formed on the +Ζ direction side of the frame 5A and the 方向 direction side surface 50Ab and is inclined toward the spacer 54 side at the taper angle 0 to the outside of the frame 50A. First inclined portion). Frame 5〇A The +X direction side surface 50Ac is inclined parallel to the ZY plane. Further, the taper portion 48A1a of the taper angle 0 of the positioning block 48A1 is formed only in the portion of the frame 50A corresponding to the first taper portion 5A, Abt. Therefore, the frame 5〇 The first tapered portion 50Abt of A can be in close contact with the tapered portion 48A1a of the positioning block 48A1. Further, in Fig. 9(B), the second over-the-box 40B has a substantially annular frame μα (second frame) for holding the chemical filter 56, and a spacer 54 provided on the first end surface of the frame 55, The handle portion 70D (second handle portion)' formed by the convex portion provided on the side surface of the frame 55 in the +2 direction and the -Z direction side formed on the side surface 55Ab of the frame 55A are tapered at the side toward the spacer 54 Tilt to the outside of the frame 55A! Cone portion 55Abt (second inclined portion). The frame 55 VIII + X direction side surface 55Ac is inclined parallel to the ZY plane. Further, the taper portion 48A2a of the taper angle 0 of the positioning block 48A2 is formed only in a portion of the frame 55 which corresponds to the upper taper portion 55Abt. Further, the positional relationship between the first tapered portion 55Abt and the frame 55A in the Z direction is opposite to the positional relationship between the first tapered portion 50Abt and the frame 5A in the z direction. Further, the position of the tapered portion 48A1a of the positioning block 48A1 and the tapered portion 48 of the positioning block 48A2 are different in the Z direction. Therefore, the frame is tender and can be easily identified from the outside. Further, it is possible to prevent the first filter cartridge 38B from being erroneously disposed in a certain space of the clamp block 48A2. Conversely, it is possible to prevent the second buffer chamber 40B from being erroneously disposed in the positioning block 48A1 of Fig. 9(A). Some space. Further, in this modification, for example, the distance between the handle portion 7〇c on the frame 50A of the j-th filter case MB and the second side face 5〇Ac may be the frame 55A of the second filter case 40B. The distance between the upper handle portion 7〇D and the second side surface 50Ac is different. Further, the distance between the grip portion 7c and the end surface 50Aa may be different from the distance between the grip portion 7D and the end surface 5?Ac. (3) Next, Fig. 1 is a plan cross-sectional view showing a filter device 26A according to a third modification of the above embodiment. In Fig. 1A, the movement levers 58D, 58E, 58F having the same configuration are rotatably provided through the fulcrum members 59D, 59E, 59F (holding members) fixed to the inner surface of the door. Typically, the movement lever 58E has a rod 58 that is rotatably coupled to the fulcrum member 59E, a pedestal 58E3 that is fixed to the door 29, and a lever 58E1 that presses the rod 58E1 toward the +X direction side (taper) side of the frame 55 from the pedestal 58E3. The compression coil spring 58E2. The lever 58E1 is provided with a stopper (not shown) that rotates the counterclockwise rotation to be equal to or lower than a predetermined upper limit. The other configuration is the same as that of Fig. 3. In the filter device 26A, in a state where the door 29 is opened, one of the two taper portions of the two transition box 38 is respectively engaged with the positioning block, the tapered portion 48Aa, 48Ca of the 48C, so that the transition box 4 is made. One of the parts of the state is engaged with the taper 48B of the positioning block 48B to be followed by, for example, by the arrow B2, by closing the door 29, by moving the levers 58D to 58F such as by arrows B21, B22 B23, the second tapered portion 50c, 55c, 5〇c of the frame 5〇, 55, 5〇 of the filter box 38, 4〇, 38 is shown. Next, the filter boxes 38, 4, and B, B25, B26 move along the positioning blocks μα to we, 39 201206548, and are disposed at the positions qi to q3 in front of the partition plates 42A to 42C. Therefore, the setting of the filter boxes 3 8, 40 can be efficiently performed. (4) Next, Fig. 11(A) is a plan view showing the first filter case 38C and the positioning block 48A corresponding thereto in the fourth modification of the above embodiment. In the filter case 38C, the chemical filter 51 is housed in the annular frame 5〇c, and the spacer 54 is fixed to the end surface of the frame 50C. Further, the first side surface 50Cb and the second side surface 50Cc of the frame 5〇c are inclined symmetrically on average, and each step portion is formed in a stepped manner, and the handle portion 70A is attached to the side surface 5〇Cb, 5〇Cc. The filter case 38 is moved by bringing the first side face 50Cb or the second side face 50Cc into contact with the tapered portion of the positioning block 48A (: the damper box 38C can be easily positioned in the case 28 to contact the partition plate 42A. Further, Fig. 11(B) is a plan view showing the i-th filter case 38β of the fifth modification and the positioning block 48A corresponding thereto. The filter box 38D houses the chemical filter 51 in a ring-shaped frame. In the case of 5 〇D, the spacer 54 is fixed to the end surface of the frame. Further, the ith side surface 5嶋 and the second side surface 5GDe of the frame 5〇D are inclined symmetrically on average, and a plurality of convex portions are respectively formed on the outer side. The arc portion is touched on the side surface, and the handle portion 7A is attached to the 50Dc. It is possible to easily move the filter case 38D by causing the i-side surface 5_ or the second side surface to contact the positioning block one cone °P. The filter box 38D is clamped into the contact partition plate 42A. Further, 11 (C) shows the first filter case 38 of the sixth modification and the clamp block 4 of the potential I* ife A plan view of 8A. The filter box 38E is housed in a ring-shaped frame 5〇Εβ, and is fixed to the end surface of the frame 8 40 201206548. There is a spacer 54. Further, the i-side 5 of the frame 50E is opposite 〇Eb and the second side 5〇Ec are inclined symmetrically on average, and the convex arc portion ' is formed on the outer side, respectively, and the handle portion 7A is attached to the side surface 50Eb, 50Ec. By the first side 50Eb or the second side 5〇Ec contacts the taper of the positioning block 48A to move the filter case 38E, and the filter case 38E can be easily positioned to contact the partition plate 42A. Further, a plurality of circular arc portions of Fig. 11(B) can also be used. Or the convex arc portion of the figure u(c) is constituted by a rotating roller. (5) Next, Fig. 12(A) shows a transition device 26B of the seventh modification of the above-described embodiment. Fig. 12(B) In the filter device 26B of Fig. 12(A) shown in Fig. 12(A), the partition plate 42A in the casing μ faces the filter boxes 38F, 40F. The cover member TF5 covering the opening TF5 which can be easily separated from the crotch panel 54 and which is easy to slide and has a gas passage therethrough is formed of, for example, a synthetic resin. The formation of 'specifically' is formed, for example, by Teflon (registered trademark of DuPont). Further, the first filter case 38F' is positioned so as to be closely attached to the cover member TF5 of the partition plate 42A. The second filter tank 40F, the first filter tank 38F, and the second filter tank 40F are sequentially positioned in the manner of the filter tank 38F. The filter tanks 38F, 4〇F, 38F, 4〇f in one row They are respectively positioned by positioning blocks 48A3, 48B3, 48A4, 48B4 fixed to the inner surface of the casing 28. The lengths of the positioning blocks 48A3, 48B3 and the like in the Y direction are set to be smaller than the heights of the filter boxes 38F, 40F in the Y direction. In the filter boxes 38F and 40F, the chemical filters 51 and 56 are housed in the annular frames 50F and 55F, respectively, and the spacers 41 201206548 54 are fixed to the end faces of the frames 50F and 55F. Furthermore, the y-side and the second side of the frame 5〇F, 55F are symmetrically inclined to the tapered surface, along the frame 5叩, 55ρ (the side surface, the second side surface and the fixed surface gasket) The end faces of the end faces of 54 are covered with cover members tfi, tf2 which can be easily separated from the spacers 54 and are slidable. The second side and the second side of the frame 50F' 5 5F are opposed to each other. The TF4 of the member has a handle, and the hall has a handle portion 7qa, and the height of the position is different from each other. The positioning block 48 is imaginary, and the taper portions of the 48, 8 and 48B3, 48B4 are also fixed in a flat shape. The groove members TF3 and TF4 are formed in a portion. The materials of the cover members TF1, TF2, TF3, and TF4 are the same as those of the cover member TF5. As shown in Fig. 12(B), the cover member is disposed in the filter case 38F2. Τρι is formed with a rectangular opening TFlc through which the gas passes, and a portion of the cover member τη covering the i-th side and the second side of the frame 5〇F is formed as a symmetrically inclined tapered portion TFla, TFlbe Although the configuration of the filter case 4〇f is also the same, the position of the grip portion 70B is different from the position of the grip portion 7A. In Fig. 12(A), a movement lever 58G is provided inside the door 29 closing the casing 28. The movement lever 58G is provided with a pedestal portion 58 (}3, a guide portion 58G4 extending in the γ direction, and having a guide along the guide The portion 58G4 is moved by the rod portion 58Gb of the inclined surface in the γ direction, and the compression coil spring 58G2 that biases the rod portion 58G1 from the pedestal portion 58G3 to the taper portion of the cover member TF2 of the filter case 40F of the positioning block 48B4. In the filter device 26B, when the filter boxes 38F, 4F are housed in the casing 28, the taper portions of the cover members τρι 8 42 201206548 TF2 of the filter boxes 38F, 4F are respectively brought into contact with each other. The cover members TF3, TF4 of the positioning blocks 48A3, 48B3, 48A4, 48B4 move the filter boxes 38F, 40F in the substantially -Y direction. At this time, since the cover members TF1 to TF4 are easily slid, the cover members TF1 to TF4 can be easily slid. The filter boxes 38F, 40F are moved. Further, in the state in which the filter boxes 38F, 40F, 38F, 40F have been positioned, the gasket of the filter case 38F at the end in the -Y direction contacts the cover member TF5 covering the partition plate 42A. The gasket 54 of the filter box 40F (38F) adjacent to the cover member TF1 (TF2) of the filter box 38F (40F) is in contact with the gasket 54 When the door 29 is closed in this state, since the filter case 40F at the end in the +Y direction is biased in the -Y direction by the movement lever 58G, the partition plate 42A (cover member TF5) and the filter case 38F, The 40F can be kept in close contact with the airtightness. Therefore, the cleaned gas can be supplied to the air blowing portion (not shown) of the air conditioner through the four-stage filter boxes 38F, 40F. Further, when the filter boxes 38F and 40F are replaced, the door 29 is opened, and the filter boxes 38F and 40F are sequentially carried out from the casing 28. At this time, since the spacer 54 of the filter case 40F can be easily separated from the cover member TF1 of the filter case 38F, the spacer 54 of the filter case 38F can be easily separated from the cover member TF5, and thus can be easily performed. Replacement of filter boxes 38F, 40F. Further, in the filter device 26B, the number of the filter boxes 38F, 40F is arbitrary. Further, the cover members TF3, TF4 of the positioning blocks 48A3, 48B3 and the like can be omitted. Further, when the cover members TF3 and TF4 such as the positioning blocks 48A3 and 48B3 are provided, the tapered portions of the cover members TF1 and TF2 of the filter cases 38F and 40F can be omitted. Further, in place of the cover members TF 1 to TF4, it is also possible to attach, for example, a resin which is easy to slide. 43 201206548 (6) In the above embodiment and modification, the filter case 38, the frame of the "A to 40' 40A to 40, 5", 5"A to 5"F, and %55a to 55F are substantially square (substantially The ring shape of the square (frame shape). However, the frame 5〇, 55A, etc., and 55, 55A, etc. may be, for example, a rectangular shape such as a rectangle (a substantially rectangular ring shape (frame shape)) or a substantially square or rectangular shape. When the electronic component (or micro component) such as a semiconductor element is manufactured by using the exposure apparatus of the above-described embodiment, the electronic component is subjected to the function of the electronic component as shown in FIG. Step 221 of design, step 222 of fabricating a reticle (reticle) according to the design step, step 223 of manufacturing a component substrate, ie, a substrate (wafer), and applying a photoresist, comprising light passing through the exposure apparatus of the foregoing embodiment The step of exposing the pattern of the cover to the substrate (inductive substrate), the step of developing the exposed substrate, the curing of the developed substrate, and the substrate processing step 224 of the developing step, the component assembly step (including the cutting step, the connection) The manufacturing process of the step of packaging step 225, and the inspection step 226, etc. are manufactured. The method for manufacturing the device includes the operation of forming a pattern of the photosensitive layer on the substrate by using the exposure apparatus of the above embodiment, and forming the pattern. The operation of the substrate (step 224). By using the #光装i, since the cost can be reduced and the exposure accuracy can be improved, the electronic component can be manufactured inexpensively and with high precision. A gas for air conditioning may be used instead of nitrogen II or a rare gas (gas, fish, etc.), or a mixed gas of such gases, etc. 201206548 The present invention is also applicable not only to projection exposure using a scanning exposure type. The case of the exposure can also be applied to the exposure using the one-exposure type (stepper type) projection exposure device. Moreover, the present invention can also be applied to the exposure of the proximity or contact mode without using the projection optical system. When the device or the like is exposed, the present invention is not limited to the process suitable for the semiconductor device, and can be widely applied to the case. A process for forming a liquid crystal display device such as a prismatic glass plate or a display device such as a plasma display, or a photographic element (CCD, etc.), a micromachine, an MMS (Microelectr 〇mechanical), a thin film magnetic head, a DNA wafer, or the like. Further, the present invention is also applicable to a manufacturing process in which a mask (a mask, a reticle, etc.) having a mask pattern of various elements is formed by using a lithography process. It is needless to say that various modifications can be made without departing from the spirit and scope of the invention. The above-mentioned publications, international publications, US invention patents, or US invention patent applications are hereby incorporated by reference. - part. In addition, all disclosures of U.S. Patent Application Serial No. 914, filed on Apr BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a view showing an exposure apparatus in an example of an embodiment. 45 201206548 FIG. 2 is a perspective view showing the filter device 26 of FIG. 1. Figure 3 is a cross-sectional view showing the transitioner device 26 of Figure 2. Fig. 4(A) is a perspective view showing the filter case 38 of Fig. 3, and Fig. 4(B) is a perspective view showing the filter case 40 of Fig. 3. Fig. 5 (A) and (B) are plan views showing, respectively, a part of the change in the relative position of the filter case 38 and the case 28. Fig. 6 (A) and (B) are plan views showing that a part of the change in the relative position of the filter case 38, 4 〇 and the case 28, respectively, has been cut away. Fig. 7(A) is a flow chart showing an example of the installation operation of the filter case, and Fig. 7(B) is a flow chart showing an example of the replacement operation of the filter case. Fig. 8(A) is a perspective view showing the filter case 38A of the first modification, and Fig. 8(B) is a perspective view showing the filter case 4A of the first modification. Fig. 9(A) is a perspective view showing a filter case 38B according to a second modification, and Fig. 9(B) is a perspective view showing a filter case 4B of a second modification. Fig. 1 is a cross-sectional view showing a filter device according to a third modification. Fig. 1 (A), (B), and Fig. 1 are plan views of the filter case of the fourth modification, the fifth modification, and the sixth modification, respectively. Fig. 12(A) shows the filtration of the seventh modification. The cross-sectional view of the device shows a perspective view of the filter case in Fig. 12(A). Fig. 1 is a flow chart showing an example of the process of electronic components. [Description of main component symbols] EX: Exposure device R: reticle 46 201206548 PL : Projection optical system λν . Wafer 4 : Exposure main body section 10 : Chamber 26 : Filter device 28 : Case 30 : Air conditioner 38 , 40 : Filter case 42 Α ~ 42C : Separator 48 Α 48 48 C : positioning block 50, 55: frame 50b, 55b: first taper portion 51, 56: chemical filter 60: local air conditioner 70A, 70B: handle portion

Claims (1)

201206548 七 、申請專利範圍: J.一種過濾器裝置,係收容過濾器,其特徵在於,具備: >第1過滤器箱,具備保持第】過遽器之第】框架,以 j :又於則述第】框架之侧面中第〗側面之至少—部分、從 則述第I框架之兩個端面令—端面側往另一端面侧且 至前述f1框架外側之第1形狀變化部;以及 收容部,係收容前述第1過減器箱. 面相2ΓΓ’具備支標前述第1框架之與前述第1側 述第1形狀變化部以定位前述第1框架之第1定位 =藉由前述第1定位構件與前述第1形狀變化部卡合而 按壓前述第1框架之前述-端面之第丨分隔構件。 .、2.如申請專利範圍第1項之過遽器裝置,其中,前述第 1過/慮器相具備第2形狀變化邮,兮货1 狀變化口P s亥第2形狀變化部設於前 述第1框架之側面中盥前诚 八〗边第1側面隔著前述第1過濾器 為相反側之第2侧面之至少一邻八 、+, σ ^ 邠刀,從前述一端面側往前 述另面側且變化至前述第"匡架外側; 月_J述收容部,Θ古M ^ 具有於則述收容部設置成可移動,且卡 合於刖述第1框牟$益诂@ Λ广 y、 这第2形狀變化部,將前述第1框 架壓抵於前述第1定位構件之第2定位構件。 3.士申4專利&圍第2項之過據_ 1形狀變化部具有第1^ ^ 、°P,该第1傾斜部形成於前述第 架之刖述第1側面之至少-部分,從前述-端面側往前 述另-端面側逐漸傾斜至前述第ι框架外側; 48 201206548 前述第2形狀變化部具有第2 形成於前述第1框架之前述第2側面第2傾斜部 述-端面側往前述另一端面側逐 二部分’從前 側。 叫述第1框架外 4. "請專利範圍第2或3項之過 述收容部且備奸λ义、+,妨, 〜 裝置,其中,前 、備插入則述帛1過濾器箱之開口邱 開口部之門、以&执y、f Μ y 邛、關閉前述 从及叹於刖述門内側且‘ 構件之保持構件。 、則述第2定位 5. 如申請專利範圍第4項之過據器裝置,直中, 持構件與前述門分別設置。 刖述保 6. 如申請專利範圍第2至5 其中,前Μ Μ , $ Τ任-項之過;慮器裝置, 則攻第1形狀變化部及前述 ^ ^ ^ ,, ^ ⑴延第2形狀變化部分別形 ;1述第1側面、前述第2側面之全面。 請專利範圍第1至6項中任—項之過遽器裝置, .引述第1形狀變化部在前述第i側面分離成至少兩 個; j述第1定位構件具有與分離之前述帛i形狀變化部 對應之至少兩個第1導引面。 兑申叫專利範圍第2至6項中任一項之過濾器裝置, 、引述第2形狀變化部在前述第2側面分離成至少兩 個; 'J述第2疋位構件具有與分離之前述第2形狀變化部 對應之至少兩個第2導引面。 9·如申咕專利範圍第1至8項中任一項之過濾器裝置, 49 201206548 其具備:第2過濾器箱,具備 之第2過喷。。一… 與前述第1過濾器相異 之第2過濾益之第2框架,以 中第3側面之至少一部分、從::於“第2框架之側面 一端面側往另-端面側且變化至前述帛 =中 形狀變化部; 1永外側之第·3 ^述收容部,具備支樓前述第2框架之與前述第^ =側面之第2底座構件、卡合於前述第2㈣之前 述第3形狀變化部以定位前述第2框架之 以及藉由前述第3定位構件與前述' &位構4、 掩m n 前这第3形狀變化部卡合而 按壓刖述第2框架之前述另一端面之第2分隔構件。 笛1〇.如申請專㈣㈣9項之M'H裝置,其中,前述 第3形狀變化部具有第3傾斜部,該 ,^ 述第2框架之前述第3側面之至少一部分,從二形成於則 架之前述一端面側往前述另一端 則述第2框 框架外側。 知面側逐漸傾斜至前述第2 "•如申請專利範圍第9項之過遽器裝置 =1框架之前述第i側面中之前述第i形狀變化部之:置 與-述第2框架之前述帛3側面 之位置彼此相異。 # 3形狀變化部 I2.如申請專利範圍第9項之過濾器裝置,i 此、 第1形狀變化部在前述第1側面分離成至少兩個;引述 前述第3形狀變化部形成於前述第3側面全面。 丨3.如中請專利脑第9項之過;;m置 第1形狀變化部形成於前述第1側面全面;、 月】’L 50 201206548 前述第3形狀變化部在前述第3侧面分離成至少兩個。 M.如申請專利_第9項之過濾器裝置,其中,前述 第1形狀變化部在前述第1側面分離成至少兩個; 前述第3形狀變化部在前述第3側面分離成至少兩個; 前述第1形狀變化部之分離位置與前述第3形狀變化 部之分離位置彼此相異。 15.如申請專利範圍第9 s ^ ㈣9至14項巾任—項之過濾器裝 置,其中’前述第1定位構件具有與前述第i形狀變化部 之位置對應之第1導引面; 前述第3定位構件具有與前述第3形狀變化部之位置 對應之第3導引面。 晉,專利範圍第91 15項中任―項之過滤器裝 月']述第2過濾器箱具備第4形狀變化部,該第4 形狀變化部設於前述第2椏 $ &、& 杧架之側面中與前述第3側面隔 二卜L 2過滤器為相反側之第4側面之至少一部分、從 2述-端面側往前述另_端面側且變化至前述第2框架外 合於Π'容部’具有於前述收容部設置成可移動,且卡 加壓1L 2框架之前述第4形狀變化部,將前述第2框 木塵抵於前述第3定位構件之第4定位構件。 第4形專利範圍第16項之過遽11裝置,其中,前述 有第4傾斜部,該第4傾斜部形成於前 另前述第4側面之至少-部分,從前述-端面 “另-端面側逐漸傾斜至前述第2框架外側。 51 S 201206548 18. 如申請專利範圍帛16項之過濾器裳置,纟中 第2形狀變化部及前述第4隸變化部分_成於前述第2 側面及前述第4側面之全面。 19. 如申請專利範圍第16項之過濾器裝置,其中,前述 第1框架之前述第2側面中之前述第2形狀變化部之位置 與前述第2框架之前述第4側面中之前述第*形狀變 之位置彼此相異。 前述 2〇·如申請專利範圍第16項之過濾器裝置,其中 第2形狀變化部在前述第2側面分離成至少兩個; 前述 前述第4形狀變化部形成於前述第4側面全面 2 1.如申凊專利範圍第i 6項之過濾器裝置,其十 第2形狀變化部形成於前述第2側面全面; 前述第4形狀變化部係在前述第4側面分離成至少兩 個0 ,·如申請專利範圍第16項之過遽器裝置,其中,前述 第形狀變化部在前述第2側面分離成至少兩個; !述第4形狀變化部在前述第4側面分離成至少兩個’· 則述第2形狀變化部之分離 部之分離位置彼此相異。 與别述第4形狀變化 23.如申請專利範圍第16至 番#項中任一項之過濾器裝 置,其中,前述第2定位構件具t 之位置對應之第巧引面;形狀變化部 前述第4定位構件具有與前 對應之第4導引面。 第4形狀變化部之位置 52 201206548 中:專利1E•圍第16至21項中任—項之過滤器裝 , ⑴述第1形狀變化部及前述第3形狀變化部分 別形成於前述第彳Y目丨丨;R义1 疋第1側面及前述第3側面之全面。 25_如申請專利範圍第 番甘目士 乐^至24項中任一項之過濾器裝 ’其:設於前述第!框架之第㈠巴手部;以及 设於則述第2框架之第2把手部; 前述第1把手部對前诚笛 手邱斜W梦 于則这第1框架之位置與前述第2把 手#對别述第2框架之位置彼此相異。 26. 如申請專利範圍第乃 ^ t . . Αι? 項又過應态裝置,其中,前述 第1把手邛設於前述第1形狀變化部; 前述第2把手部設於前述第3形狀變化部。 27. 如申請專利範圍第“項之過遽器裝置 第1把手部及前述第2把手 " 刖迷 杷手邛係分別設於前述第i 化部及前述第3形狀變化部之凸部。 、 28·如申清專利範圍第26适 祀固第26項之過滤器裳置 第1形狀變化部中之前述m i 4 χ Τ刖述 月J迤第1把手部之位置盥 狀變化部中之前述第2把手部之位置相異.、之第3形 於前述第1定位構件及前述物’ 第1把手部及前述第2把手邱夕 之對應前述 杷乎。卩之位置分別設有凹 29.如申請專利範圍第2 乐Z5至28項中任一項 置,其具備:設於前述第丨框 過濾器裝 剛述第2形此偷, 第3把手部;以及 狀變化部之 設於前述第2框架之前 之則述第4形狀變化部之 部。 、第4把手 53 201206548 3〇·如申請專利範圍第&項之 第1把手部及前述第2 /慮益裝置,其中,前述 化部及前述第3形狀變“糸分別設於前述第1形狀變 〜狀變化部之凹部。 31.如申請專利範圍第30項之過滤器裝 第!形狀變化部中之前述第1把手部 、中第^述 狀變化部中之前述第2把手部之位置相異.迷第3形 第 於前述第1定位構件及前述第位構 1把丰部jg a疋位構件之對應前述 =及刖述第2把手部之位置分別設有凸部。 第 :申清專利範圍帛29項之過滤 =手部係設於前述第2形狀變化部之凸部;、中則述 刖述第4把手部俗机於a、+. & 33.如由往亩第4形狀變化部之凸部。 第 °月利範圍第29項之過濾器裝置,其中, 2手部係設於前述第2形狀變化部之凹部;、… 則述第4把手部係設於前述第4形狀變化部之凹部。 .+.楚 '申明專利範圍第32或33項之過濾器裝置,其中, 前述第2形狀變化部中 '、 ㈣鐡“ I +之刖述第3把手部之位置與前述第4 形"中之前述第4把手部之位置相異。 35·如申請專利範圍第9至34項中任一項之過㈣裝 匕其中’前述收容部之前述第i分隔構件及前述第;分 隔才件”別相對水平面大致垂直或傾斜地配置。 36.如申請專利範圍第9至35項巾任—項之過滤器裝 置,其中,俞、十,@ 、 现第1過濾器係除去通過前述第丨過濾器之 氣體中之有機物; “ J述第2過濾器係除去通過前述第2過濾器之氣體中 54 201206548 之鹼性物質及酸性物質之至少一方。 一項之過濾器裝 端面之第1密封 37.如申請專利範圍第1至30項中任 置,其具有設於前述第、框架之前述另一 構件;以及 〇又於則述第2樞年之前流另一 Α. Λ* 化朱之刖迷另鳊面之第2密封構件。 38.種曝光裝置,係以曝光用光經由 光,其特徵在於,具備: 茶使基板曝 腔室,收納使前述基板曝光之曝光本體部; 申請專利範圍第i至37項中任一項之過濾器裝置 =置,將從前述腔室之外部擷取之氣體經由前述 過濾益裝置送至前述腔室内。 a 39.種過濾器之收容方法,係將過濾器收容於收容 部,其特徵在於,包含: 準備第1過遽器箱之步驟,該第!過遽器箱具備保 第:第1拖架,以及設於前述第1框架之側面中 *… 〉—部分、從前述第"匡架之兩個端面中_ 柒面貝’往另—端面側且變化至前述第1框架外側之第i形 狀變化部; $ 1 Φ 前述1框架之與前述第1側面相鄰之側面載置於 月’L谷邛之第1底座構件表面之步驟; =第」框架之前述,i形狀變化部卡合於前述收 移:,1框架往前述收容部之 千之方向移動之步驟;以及 55 201206548 將刖述第1框架之前述-端面透過第1密封構件按壓 於前述收容部之前述第1分隔構件之步驟。 1〇·如申請專利範圍第39項之過濾器之收容方法,其 】达第1過濾器箱具備第2形狀變化部,該第2形狀 复化部δ又於前述第1框架之側面中與前述第1側面隔著前 述第1過濾器為相反側之第2側面之至少一部>,從前述 鳊面:在前述另端面側且變化至前述第1框架外側; 使則述第1框架往前述收容部之前述第1分隔構件之 步驟,包含使前述收容部之第2定位構件卡合 框架之前述第2形狀變化部,以透過前述第2 疋位構件彈壓前述第1框架之步驟。 !!·如申請專利範圍第40項之過濾器之收容方法1 中,前述第1形狀轡仆1女# ' ^於一… 斜部,該第1傾斜部 成』述第1框架之前述帛1側面之至少一部分,從^ 端面側往前述另-端面側逐漸傾斜至前…框架:: 形成二二2 了!^化部具有第2傾斜部,該第2傾斜部 形成於則述第丨框架之前述第2側 加、, 述一端面側往前述另一端面夕一口 P /刀,從前 側。 另k面側逐漸傾斜至前述第1框架外 42·如申請專利範圍第39 收容方法,其包含··準備第2過二:任-項之過遽器之 濾器箱具備保持與前述第!過濾 目之步驟’該第2過 框架,以及設於前述第2框架 中? 2過濾器之第2 面中第3側面之至少— 201206548 :::變第2框架之兩個端面中一端面侧往另-端面 側且變化至前述箆?杻鈕 弟2框条外側之第3形狀變化部; 將前述第2框架之與前述第3側面相鄰 前述收^之第2底座構件表面之步驟; 載置於 -邮使:述第2框架之前述第3形狀變化部卡合於前述收 谷部之第3定位構件,以使前述第2框 第2分:構件之方向移動之步驟;以& 收… 壓』:二2框架之前述另一端面透過第2密封構件按 屋於則述收谷部之前述第2分隔構件之步驟。 43.如申請專利範圍第42項之過遽器之收容方法,其 中’則述第2過據器箱具備第4形狀 狀 變化部設於前述坌? 4「加, /弟4形狀 述第2過η 側面中與前述第3側面隔著前 二反側之第4側面之至少-部分,從前述 使述另一端面側且變化至前述第2框架外側; 月J ^第2框架往前述收容部之第2分隔 述第2”之收谷部之第4定位構件卡合於前 心 則述第4形狀變化部,以透過前述第4定位 構件彈壓前述第2框架之步驟。 …疋位 中,4前IS請專利範圍第43項之過遽器之收容方法,其 "3形狀變化部具有第3傾斜部,該第3 # #Μβ 形成於前述坌7 Λ 成弟3傾斜部 述第2框,二’之/述第3側面之至少-部分,從前 第2框架外^則述一端面側往前述另一端面側傾斜至前述 則述第4形狀變化部具有第4傾斜部,該第4傾斜部 57 201206548 形成於則述第2框架之前Μ 4 ^ _ 述第2框架之前述一端面側往二。:, 第2框架外側。 $ 4面側傾斜至前述 45·如申請專利範圍第42至44 收玄t、:±· 中任一項之過遽器之 部或前述第··使前述帛1框架之前述第1形狀變化 $ ] I 2 述第3㈣變化部分別卡合於前述 件或前述第3定位構件’將前述第"匡架或前 n 匡架分別從前述收容部之前述第(分隔構件或前述 2分隔構件分離之步驟;以及 將則述第1框架或前述第2框架從前述收容部搬出之 少驟。 46.種元件製造方法,其特徵在於,包含: 使用申請專利範圍第38項之曝光裝置使感光性基板曝 光之動作;以及 處理前述曝光後感光性基板之動作。 八、圖式: (如次頁) 58201206548 VII. Patent application scope: J. A filter device for accommodating a filter, comprising: > a first filter case having a frame for holding a 遽 遽 , , , , , , , , , , , , The at least one portion of the side surface of the side surface of the frame, the first shape change portion from the end surface side of the first frame to the other end surface side and to the outer side of the f1 frame; The first position of the first reducer is provided in the first phase of the first frame and the first shape changer of the first side to locate the first frame of the first frame. The positioning member is engaged with the first shape changing portion to press the second partition member of the end surface of the first frame. 2. The apparatus according to claim 1, wherein the first over/under device phase includes a second shape change post, and the first shape change port P shai second shape change portion is provided in In the side surface of the first frame, the first side surface of the first frame is at least one adjacent to the second side of the first filter, and the + σ ^ 邠 is formed from the one end surface side. On the other side, it changes to the outer side of the truss; the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The second shape changing unit presses the first frame against the second positioning member of the first positioning member. 3. The patent of the Shishen 4 patent & 2, the shape change portion has a first ^^, °P, and the first inclined portion is formed in at least a portion of the first side surface of the first frame. The second shape changing portion is formed on the second side surface of the first frame, the second inclined portion, and the end surface side, from the front end surface side toward the other end surface side. To the other end side of the other side, two parts 'from the front side. Called outside the first frame 4. "Please refer to the accommodating section of the second or third patent range and prepare the λ 义, +, ,, ~ device, where the front and the front are inserted into the filter box Open the door of the opening of the Qiu, hold the y, f Μ y 邛, close the above and sigh the inside of the door and the 'member holding member. Next, the second positioning is as follows. 5. For the instrument device of claim 4, the straight-line holding member is separately provided from the aforementioned door.刖述保6. If the scope of patent application is 2 to 5, the former Μ Μ , $ Τ - —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— —— The shape change portions are respectively formed; and the first side surface and the second side surface are integrated. The apparatus of any one of the first to sixth aspects of the invention, wherein the first shape changing portion is separated into at least two on the i-th side surface; wherein the first positioning member has the aforementioned shape of the 帛i The changing portion corresponds to at least two first guiding faces. The filter device according to any one of claims 2 to 6, wherein the second shape changing portion is separated into at least two on the second side surface; the second clamping member has the aforementioned separation The second shape changing portion corresponds to at least two second guiding faces. The filter device according to any one of claims 1 to 8, wherein the second filter case is provided with a second overspray. . The second frame of the second filter, which is different from the first filter, is changed from at least a part of the third side surface to the other end surface side of the second frame. The 帛=middle shape changing unit; the 1-3 housing portion of the permanent outer side includes the second base member of the second frame and the second side surface of the second frame, and the third portion of the second (fourth) The shape changing portion is configured to position the second frame, and the third positioning member is engaged with the third shape changing portion before the mask mn and the third shape changing portion, and presses the other end surface of the second frame The second partition member of the present invention, wherein the third shape changing unit has a third inclined portion, and at least a part of the third side surface of the second frame is provided. The second frame frame is formed on the other end from the side of the one end surface of the frame to the other end. The face side is gradually inclined to the second portion of the second " The aforementioned i-th shape change portion in the aforementioned i-th side of the frame: The position of the side surface of the 帛3 of the second frame is different from that of the second side frame. #3 Shape changing portion I2. The filter device of the ninth aspect of the invention, wherein the first shape changing portion is separated from the first side surface At least two; the third shape changing portion is formed on the third side surface in total; 丨 3. The patent head 9 is passed; wherein the first shape changing portion is formed on the first side surface; In the filter device of the ninth aspect, the first shape changing unit is the first one. The side surface is separated into at least two; the third shape changing portion is separated into at least two on the third side surface; and the separation position between the separation position of the first shape changing portion and the third shape changing portion is different from each other. The filter device of the ninth aspect of the invention, wherein the first positioning member has a first guiding surface corresponding to a position of the i-th shape changing portion; and the third positioning member Has the same shape as the foregoing The third guide surface corresponding to the position of the change portion. Jin, Patent No. 91-15, the filter filter month of the item - the second filter case includes a fourth shape change portion, and the fourth shape change portion The side surface of the second 桠$ &, & truss is separated from the third side by at least a part of the fourth side opposite to the third side, and the second side is from the side of the second side to the other side. The end surface side is changed to the second frame, and the outer portion of the second frame is provided so as to be movable in the accommodating portion, and the fourth shape changing portion of the frame is pressurized by 1 L 2 , and the second frame dust is applied to the second frame. The fourth positioning member of the third positioning member. The device of the fourth aspect of the present invention, wherein the fourth inclined portion is formed on at least a portion of the front side of the fourth side surface, and the other end surface side Gradually inclined to the outside of the second frame. 51 S 201206548 18. The filter according to claim 16 is disposed, and the second shape changing portion and the fourth member changing portion are formed on the second side and the aforementioned The filter device according to claim 16, wherein the position of the second shape changing portion in the second side surface of the first frame and the fourth portion of the second frame The filter device according to the sixteenth aspect of the invention, wherein the second shape change portion is separated into at least two on the second side surface; The shape change portion is formed on the fourth side surface of the fourth aspect. The filter device according to the sixth aspect of the invention, wherein the tenth shape change portion is formed on the second side surface; the fourth shape change portion is In the aforementioned fourth The apparatus according to claim 16, wherein the first shape changing portion is separated into at least two on the second side surface; and the fourth shape changing unit is in the 4, the side surface is separated into at least two '· The separation positions of the separation portions of the second shape change portion are different from each other. The fourth shape change is not described. 23. Any one of the claims 16th to ## In the filter device, the second positioning member has a position corresponding to the first guiding surface; the shape changing portion has the fourth guiding surface corresponding to the front. The position of the fourth shape changing portion 52 201206548 In the filter device of the first aspect of the invention, the first shape changing portion and the third shape changing portion are respectively formed in the first y Y directory; R yi 1 疋1 omnidirectional and the above-mentioned third side of the full range. 25_ As in the patent application, the filter of any of the items of the squadrons to the 24th item, which is provided in the first hand of the first frame; And a second handle portion provided in the second frame; The position of the first frame and the position of the second handle # are different from those of the second frame, respectively, as described in the first hand grip portion. Further, the first handle is disposed in the first shape changing portion, and the second handle portion is provided in the third shape changing portion. 27. The first handle portion of the filter device and the second handle are provided in the convex portions of the i-th portion and the third shape changing portion, respectively. 28) As for the filter of the 26th item of the stipulation of the patent scope, the filter is placed in the first shape change portion, and the mi 4 χ is described in the position of the first handle portion. The position of the second handle portion is different. The third shape corresponds to the first positioning member, the first handle portion, and the second handle portion. Each of the positions of the cymbal is provided with a concave portion 29. As set forth in any one of the claims of the second aspect of the present invention, it is provided in the above-mentioned third frame filter, which is described as the second shape, the third handle portion. And the portion of the fourth shape changing portion that is provided before the second frame. The fourth handle portion 53 201206548 3 〇 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第31. The recessed portion of the shape-changing portion of the shape change portion of the first and second handle portions of the filter portion of the shape change portion of the third aspect of the present invention. In the third position, the first positioning member and the first position member are respectively provided with convex portions at positions corresponding to the above-mentioned = and the second handle portions. The clearing of the patent scope 帛 29 items = the hand is attached to the convex portion of the second shape change portion; and the fourth handle portion is used to refer to the a, +. & 33. The filter device of the second shape change portion, wherein the second hand is attached to the concave portion of the second shape change portion; wherein the fourth handle portion is attached to a recessed portion of the fourth shape changing portion. The filter device of claim 32, wherein In the second shape changing portion, the position of the third handle portion in the fourth shape change portion is different from the position of the fourth handle portion in the fourth shape " 35. The method according to any one of claims 9 to 34, wherein the "the i-th partition member and the first partition member of the accommodating portion" are disposed substantially perpendicularly or obliquely with respect to a horizontal plane. For example, in the filter device of claim 9 to 35, wherein the Yu, the ten, the @1 filter are the organic substances in the gas passing through the second filter; The filter removes at least one of an alkaline substance and an acidic substance in the gas passing through the second filter 54 201206548. a first seal of the filter end face 37. As claimed in the first to third aspects of the patent application, which has the other member provided in the foregoing first frame, and the second pivot year Before flowing another Λ. Λ* The second sealing member of the 刖 刖 刖 。 。 。 。. 38. An exposure apparatus for transmitting light by exposure light, comprising: a tea exposure substrate, and an exposure main body portion for exposing the substrate; and any one of claims 1-5 to 37 The filter device = set, and the gas extracted from the outside of the chamber is sent to the chamber through the filter device. a 39. A method of accommodating a filter, wherein the filter is housed in a housing portion, comprising: a step of preparing a first filter box, the first! The filter box is provided with a first carriage, a first carriage, and a side surface of the first frame, which is disposed on the side surface of the first frame, and a portion, from the two end faces of the first "truss, _ 柒面贝' to the other end face a side change to an i-th shape change portion outside the first frame; $ 1 Φ a step of placing a side surface of the first frame adjacent to the first side surface on a surface of the first base member of the month 'L valley; In the first frame, the i-shaped change portion is engaged with the transfer: a step of moving the frame toward the direction of the accommodating portion; and 55,065, 065, the first end member of the first frame is transmitted through the first sealing member a step of pressing the first partition member of the accommodating portion. The method of accommodating a filter according to claim 39, wherein the first filter case includes a second shape changing portion, and the second shape reconstituting portion δ is further in a side surface of the first frame The first side surface is at least one portion of the second side surface opposite to the first filter, and the first side surface is changed to the outer side of the first frame from the other end surface side; The step of moving the first partition member to the accommodating portion includes a step of engaging the second shape changing member of the accommodating portion with the second shape changing portion of the frame to bias the first frame through the second boring member. In the case of the method of accommodating the filter of claim 40, the first shape is a slanting portion, and the first inclined portion is the aforementioned one of the first frame. At least a part of the side surface is gradually inclined from the end surface side toward the other end surface side to the front side of the frame... The frame is formed to have a second inclined portion, and the second inclined portion is formed in the second side. The second side of the frame is added, and the one end face side is turned to the other end face, and the P/knife is from the front side. The k-side is gradually inclined to the outside of the first frame. 42. The method of accommodating the ninth aspect of the patent application includes the preparation of the second and second: the filter box of the --item device is maintained and the aforementioned! The filtering step ‘the second passing frame and the second frame are set in the second frame? 2 At least the third side of the second side of the filter - 201206548 ::: Change the one end side of the two end faces of the second frame to the other end face side and change to the aforementioned 箆? a third shape changing portion on the outer side of the frame 2; a step of positioning the second base member adjacent to the third side surface of the second frame; and placing the second frame on the second frame The third shape changing unit is engaged with the third positioning member of the valley receiving portion, and the second frame is moved in the direction of the member; the second frame is moved in the direction of the member; The other end surface passes through the second sealing member and is placed in the second partition member of the receiving portion. 43. The method of accommodating a damper of claim 42, wherein the second ejector box has a fourth shape change portion provided in the 坌? 4 "Adding, /, 4, the second η side surface and at least the fourth side surface of the front side opposite to the third side surface, and changing from the other end surface side to the second frame The fourth positioning member of the second frame to the second portion of the accommodating portion is engaged with the fourth shape changing portion of the front center, and is biased by the fourth positioning member. The steps of the second frame described above. In the squatting position, the 4th pre-IS patent application method of the 43rd item of the patent range, the "3 shape change part has the 3rd inclination part, and the 3rd ##Μβ is formed in the aforementioned 坌7 Λ Chengdi 3 In the second frame, the at least one portion of the third side surface of the slanting portion is inclined from the one end surface side to the other end surface side from the front side of the second frame, and the fourth shape changing portion has the fourth portion. In the inclined portion, the fourth inclined portion 57 201206548 is formed before the second frame, and the one end surface side of the second frame is two. :, outside the 2nd frame. The 4th side is inclined to the aforementioned 45. The part of the above-mentioned first shape of the 帛1 frame is changed according to any of the above-mentioned 帛1 frame of the above-mentioned 帛1 frame. $ ] I 2 The third (fourth) change portion is respectively engaged with the aforementioned member or the third positioning member 'the aforementioned first " truss or front n truss from the aforementioned portion of the accommodating portion (the partition member or the aforementioned two partition members) And a step of separating the first frame or the second frame from the accommodating portion. 46. A method for manufacturing a device, comprising: sensitizing using an exposure device of claim 38 The action of exposing the substrate; and the operation of the photosensitive substrate after the exposure. 8. Pattern: (e.g., page) 58
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