201120429 六、發明說明： 【發明所屬之技術領域】 100011本發明涉及一種儲存設備測試系統及方法， 種儲存設備旋轉振動測試系統及方法。 、/、闕； 【先前技術】 [0002] [0003] 在貧訊技術迅速發展的今天，資料儲 锉;fegg十為衣日益增加’ 儲存器（例如硬碟）向著高容量、古 „ k 呵得迷的趨墊發展。 為了儲存更多的資料，儲存設備中 夕3的錯存器越來越 夕。这種情況下，在對—個儲存201120429 VI. Description of the Invention: [Technical Field of the Invention] 100011 The present invention relates to a storage device test system and method, and a storage device rotational vibration test system and method. [previous technology] [0002] [0003] In today's rapid development of poor technology, data storage; fegg ten clothing is increasing 'storage (such as hard disk) toward high capacity, ancient „ k 呵The fascination of the development of the mat. In order to store more information, the storage device in the eve 3 of the stagnation device is getting more and more eve. In this case, in a pair of storage
在讯供免—壯α 兵馬貧料時，該# 存叹備内女裝的儲存器容易受到自 廊雄魅私w 牙的旋轉振動（例如 硬碟驅動Μ侧旋轉振動）或者軸存 旋轉振動的影響而出現不穩定的狀 、羽、 設備的性能。 影響該儲存 存設備造成 ’以便採取 為了正確評估儲存器及風扇的旋轉振動對错 的影響’需要對儲存設備增行旋轉振動測試 適當的措施降低旋轉振動帶來的影響。 [0004] 【發明内容】 繁於以上㈣，有必要提供—_存設備旋 系統及方法’絲快速有效地對儲存設備實In the case of the confession-free Zhuang-Yi-Yang-Yang, the storage of the women's clothing in the sighing sigh is easily subject to the rotational vibration of the fangs (such as the hard disk drive side rotation vibration) or the axial storage rotation vibration. The effects of instability, feathers, and equipment performance occur. Affecting the storage device in order to take the role of correcting the rotational vibration of the reservoir and the fan to correct the error. It is necessary to add a rotational vibration test to the storage device. Appropriate measures are taken to reduce the effects of the rotational vibration. [0004] [Summary of the Invention] In the above (4), it is necessary to provide - _ storage device system and method 'wire quickly and efficiently on the storage device
測試。 轉振動測試 施旋轉振動 [0005] 098142185 一種儲存設備_振_試“，運行於錢存設備通 =主機中，所述儲存設備包括至少-個儲存器以 V個風扇，該系統包括：設置模組1於設置儲 子设備的測試參數，所述測試參數包括待測的儲存器 待測的風扇轉速、待測的工作負载以及測試時間；選摆 表單編號Am ηι ** . ^^擇 第4頁/共18頁 _2〇72376-〇 201120429 模組，用於從待測㈣存器中卜 制模1且’用於從待測的風扇轉速中逐—存器’風扇控 並且控制風扇以該選摆 、 選擇風扇轉速， 於從待測的工作以巾、速運轉；_控制模組，用 設備產生該選擇的二選擇工作負戴，並且對儲存 的測試時間，在選擇用於根據汉置 擇的儲存器的讀寫性卜轉相及卫作負載下測試選 儲存器的讀寫性能的測試=編，用於儲存選擇的 [0006] Ο ❹ :二:=_動_方法，所述儲存設備包括至 置儲广子M及至少—個風扇’該方法包括步驟：設 =設備的測試參數，所述測試參數包括待測的麟存 二:’測的風㈣速'待測的卫作負栽以及測試時間； 從待測的儲存n巾選擇—健存器；從㈣的風扇轉速 L擇個風扇轉速，控制風扇以該選擇的轉轉； 從待测.作負射_—個工作㈣；對儲存設衫 生該選擇的工作負載,·根據設置的測試時間，在選择的 風扇轉速以及工作負栽下測試選'擇的儲存器的讀寫性能 ，儲存選擇的儲存器的讀寫性能的測試資料；若有其他 待測的工作負載，則返回選擇工作負載的步驟；若有其 他待測的風扇轉速，則返回選擇風扇轉速的步驟；及若 有其他待測的儲存器，則返回選擇儲存器的步驟。 [〇〇〇7]本發明設置儲存設備的測試參數，根據設置的測試參數 模擬各種工作環境，從而快速有效地實現對儲存設襟的 旋轉振動測試β 【實施方式】 098142185 表單編號Α0101 第5頁/共18頁 0982072376-0 201120429 _]參閱圖丨所示，係 實施例的運行環境示咅圖#:備旋倾_試系統較佳 系統10運行於主機U; β 儲存設備旋轉振動測試 理器16及顯亍卷17 〃主機η還包括儲存區15、處 振動測試系統η的存區15儲存該儲存設傷旋轉 試系統1。運行過程中產二:該儲存設備旋轉振動測 計， 的貧料。所述處理器16執杆兮 用=旋轉振動測試系統1〇。所述顯示器π提供二 顯㈣儲錢備㈣振動職系統 二:Γ機11與儲存設備12通訊連接。該儲』 備12讀Λ 3Α—13χ及風扇14。當主機11對儲存設 如館存ϋ‘13Γ時’料及聰4的運行（例 產=ΓΧ的驅動器的—扇14的旋轉） 光碟 [0009] 〇 運轉’以調節儲存設備12::控制命令以’轉速 參閱圖2所示，仫+找 〇 功㈣_ 、本發明儲存設備旋轉振動測試系統10的 置模=設備旋__ 制模竭it 風扇控制模組220、負載控 。 利試模組24〇、儲存模組250及輸出模組26〇 [0010] 098142185 = = 2200用於設置儲存設備12的測試參數。所述 ' ^括相的儲存設備12的儲存器、待測的風扇 、速、相的卫作負載以及測試時間。所述工作負載用 以触實際i作環境中儲存設備12收到料種讀/、寫資料 表單編號A0101 第6頁/共18頁 0982072376-0 201120429 [0011] 〇 [0012] 含主•杰 j. ^ °亥工作負載可以針對選定的儲存器，例如，對選 諸存器隨機寫入的資料塊。該工作負載還可以針 對包括選定的儲存器在⑽多個儲存器，例如，對所有 待測的儲存器隨機寫人64KB的資料塊。在本實施例中， 待測的儲存器包括儲存設備12的24個儲存器13a—丨3X ( 例如.24個硬碟待測的風扇轉速包括1 200轉/分、 2400轉/分及3_轉/分；待測的工作負載包括對選定的 儲存赠機寫人4KB的資料塊、對敎的儲存^隨機寫入 64KB的資料塊’對選定的儲存器隨機寫入25哪的資料 塊、對選定的儲存器連續寫入256〇的資料塊、對選定的 儲存器隨機讀取40的資料塊、對所有待測的儲存器隨機 寫入64KB的資料塊以及對所有待測的儲存器隨機寫入 256KB的資料塊；測試時間為在對每個待測的儲存器，在 每個確^條件下（即選定風扇轉速以及工作負載）測試6 次’每次測試一分鐘。 所述選擇模組210用於從待測的儲存器中逐一選擇儲存器 。例如選擇模組採鱗争器UA-UX中逐一選擇儲存器。 所述風扇控制模組220用於從待測的風扇轉速中逐一選擇 風扇轉速，對於每個選擇的風扇轉速，生成轉速控制命 令併4»送給風扇14，從而控制風扇14以該選擇的轉速運 轉。例如，風扇控制模組220從待測的風扇轉速中選擇 1200轉/分，並且控制風扇14以1200轉/分的轉速運轉。 [0013] 所述負載控制模組2 3 0用於從待測的工作負戴中逐—選擇 工作負載’對於每個選擇的工作負載，對儲存設備12產 生該選擇的工作負載。例如，負載控制模組23〇從待測的 098142185 表單编號A010丨 第7頁/共18頁 0982072376-0 201120429 工作負载中選擇對選定的儲存 並且對選擇的儲存器（例如： 4KB的資料塊的工作負載。 益隨機寫入4KB的資料塊， 儲存器13A)產生隨機寫入 [0014] [0015] 098142185 =7…υ用於根據設置的測試時間，在選擇的風 以及工作負載下測試選擇的儲存器的讀寫性能。 測試模_測試選擇的儲存器的每秒讀 寫呆作二人數，以表示該選擇的健存器的讀寫性能。例如 ，測试棋組240在風扇轉速為12_/分對儲存⑽ 隨機寫入4ΚΒ的資料塊的條件下 每秒讀/寫操作次數，每㈣試^ Μ6:人儲存器…的 ⑻細—主 每測试''分鐘，測得儲存器13Α 2的3=秒讀彻測组?Γ4.43、234.38與234.4卜在本實施例中， =^24G對測得的最後4個每秒讀 =為=的儲存器在選擇條件下的平均每秒讀/寫操 人數。例如’測試模組_對234.34、234 43、 :二：!4:41求平均值，得到儲存_在風扇轉速 資料塊條/ I作負載為對錯存器13_機寫入40的 件下的平均每秒讀/寫操作次數，即234. 39。 子模組250用於將選擇的儲存器的讀寫性能的測試 指定的區15。在本實施例中，儲存模組250按照 /存路徑儲存所述選擇的儲存器的讀寫性能的測 責科儲存至F:\mest\Result。 式 擇的_的讀寫性能的測 表單編號A_ ’輸出㈣260將選擇的儲存器的 第8頁/共18頁 〇 〇 0982072376-0 [0016] 201120429 讀寫性能的測試資料輸出到顯示器17上。例如，輸出模 組2 6 0顯示儲存器13 A的6個每秒讀/寫操作次數2 3 4. 6 7、 234. 05、234. 34、234. 43、234. 38與234. 41，以及平 均每秒讀/寫操作次數234. 39。 [0017] 參閱圖3所不，係本發明儲存設備旋轉振動測試方法較佳 實施例的流程圖。 [0018] 步驟S301，設置模組200設置儲存設備12的測試參數。 所述測試參數包括待測的儲存設備12的儲存器、待測的 Ο 風扇轉速、待測的工作負載以及測試時間 。所述工作負 載用以模擬實際工作環境中儲存設備丨2收到的各種讀/寫 資料請求。該工作負載可以針對選定的儲存器，例如， 對選定的儲存器隨機寫入4KB的資料塊。該工作負載還可 以針對包括選定的儲存器在内的多個儲存器，例如，對 所有待測的儲存器隨機寫入64KB的資料塊。在本實施例 中’待測的儲存器包括儲存設備12的24個儲存器 13A-13X (例如：24個硬碟）；待測的風扇轉速包括 〇 1 200轉/分、2_轉/分及3_轉/分；待測的工作負載 包括對選定的儲存器隨機寫入4KB的資料塊、對選定的儲 存器隨機寫入64KB的資料塊，對選定的儲存器隨機寫入 256KB的資料塊、對選定的儲存器連續寫入256kb的資料 塊、對選定的儲存器隨機讀取4KB的資料塊、對所有待測 的儲存器隨機寫入64KB的資料塊以及對所有待測的儲存 器隨機寫入256KB的資料塊；測試時間為在對每個待測的 肖存器’在每個確定條件下（即選定風扇轉速以及工作 負栽）測試6次，每次測試一分鐘。 098142185 表單蝙號A0101test. Rotating vibration test rotating vibration [0005] 098142185 A storage device_vibration_test", running in the money storage device pass=host, the storage device includes at least one storage with V fans, the system includes: setting mode Group 1 is used to set test parameters of the storage device, the test parameters include the fan speed to be tested, the workload to be tested, and the test time; the selection form number Am ηι ** . 4 pages / total 18 pages _2 〇 72376 - 〇 201120429 module, used to test modulo 1 from the (four) memory and 'for the fan speed from the fan to be tested' fan control and control fan Selecting the pendulum, selecting the fan speed, operating from the work to be tested to the towel, speed operation; _ control module, using the device to generate the selected two selection work negative wear, and the stored test time, in the selection for the basis The read/write performance of the memory of the Chinese-selected memory and the test of the read/write performance of the test storage under the load of the security test are used to store the selected [0006] ❹ ❹ : 2: =_动_方法, The storage device includes a storage device and at least one wind 'The method comprises the steps of: setting = test parameters of the device, the test parameters including the Lin Cun 2 to be tested: 'measured wind (four) speed' of the test to be tested and the test time; from the storage to be tested n towel Select - the loader; select the fan speed from the fan speed L of (4), control the fan to rotate with the selected; from the test to be negative. _ a work (four); to store the selected work load, · According to the set test time, test the read and write performance of the selected memory under the selected fan speed and the work load, and store the test data of the read and write performance of the selected memory; if there are other work to be tested The load returns to the step of selecting the workload; if there are other fan speeds to be tested, the step of selecting the fan speed is returned; and if there are other reservoirs to be tested, the step of selecting the storage is returned. [〇〇〇7 The invention sets the test parameters of the storage device, simulates various working environments according to the set test parameters, and realizes the rotational vibration test of the storage device quickly and effectively. [Embodiment] 098142185 Form No. Α0101 Page 5 / 18 pages 0982072376-0 201120429 _] Refer to the figure ,, the operating environment of the embodiment is shown in Figure #: The preparation of the rotation system - the better system 10 runs on the host U; The test processor 16 and the display roll 17 〃 the host η further includes a storage area 15 and a storage area 15 of the vibration test system η for storing the storage damage rotation test system 1. During operation, the second generation: the storage device rotational vibration test, The processor 16 is operated by a rotary vibration test system. The display π provides two display (four) money storage devices (four) vibration job system two: the machine 11 is connected to the storage device 12 for communication. 』 Read 12 Λ 3Α—13χ and fan 14. When the host 11 stores the storage device such as the library, the operation of the material and the operation of the Cong 4 (the rotation of the fan 14 of the driver of the product = ΓΧ) CD [0009] 〇 operation ' to adjust the storage device 12:: control command to 'Turning speed as shown in Figure 2, 仫 + find 〇 work (four) _, the storage device of the present invention, the rotational vibration test system 10 set the mold = equipment rotation __ mold exhausted it fan control module 220, load control. The test module 24, the storage module 250, and the output module 26 [0010] 098142185 = = 2200 are used to set the test parameters of the storage device 12. The storage of the storage device 12, the fan to be tested, the speed of the phase, the servo load, and the test time. The workload is used to be in the environment. The storage device 12 receives the data. The data is read/written. Form No. A0101 Page 6/18 pages 0982072376-0 201120429 [0011] 〇[0012] Included ^ °Hail workloads can be for selected memory, for example, blocks of data that are randomly written to the selected registers. The workload can also be used to write a 64KB block of data randomly to (10) multiple memories including the selected storage, for example, for all of the storages to be tested. In this embodiment, the storage to be tested includes 24 storages 13a-丨3X of the storage device 12 (for example, 24 hard disks to be tested include 12 200 rpm, 2400 rpm, and 3_ Transfer/min; the workload to be tested includes a 4 KB block of data for the selected saver, a store of the file, a 64 KB block of data, and a block of 25 randomly written to the selected memory. Write 256 资料 data blocks consecutively to the selected storage, randomly read 40 data blocks for the selected storage, randomly write 64 KB data blocks for all the tested storages, and randomly store all the tested storage blocks. Write a 256KB data block; the test time is 6 times per test for each memory to be tested (ie selected fan speed and workload). The selection mode The group 210 is configured to select the storage one by one from the storage to be tested. For example, the module is selected one by one by selecting the module scale arbitrator UA-UX. The fan control module 220 is used to select one by one from the fan speed to be tested. Select fan speed for each selected fan speed A speed control command is generated and 4» is sent to the fan 14, thereby controlling the fan 14 to operate at the selected speed. For example, the fan control module 220 selects 1200 rpm from the fan speed to be tested, and controls the fan 14 to 1200 rpm. The speed of the minute/minute operation is performed. [0013] The load control module 230 is configured to select a workload from the work-to-measurement to be tested, and generate the selection for the storage device 12 for each selected workload. For example, the load control module 23 selects the selected storage from the 098142185 to be tested form number A010丨 page 7/18 pages 0982072376-0 201120429 workload and selects the selected storage (eg: 4KB) The workload of the data block. The random write of the 4KB data block, the memory 13A) generates the random write [0014] [0015] 098142185 = 7... υ is used according to the set test time, in the selected wind and the workload The read and write performance of the selected storage is tested. The test mode _ test selects the memory to read and write twice per second to indicate the read and write performance of the selected health. For example, test chess set 240 The fan speed is 12_/min to store (10) The number of read/write operations per second under the condition of randomly writing 4 资料 data blocks, each (four) test ^ Μ 6: human storage ... (8) fine - the main test every '' minute, test The storage 13 Α 2 of 3 = seconds read the test group Γ 4.43, 234.38 and 234.4 卜 in this embodiment, = ^ 24G pairs of the measured last 4 readings per second = = in the selection condition The average number of read/write operations per second. For example, 'test module _ pair 234.34, 234 43, : 2: !4:41 average, get stored _ in the fan speed data block / I load is right or wrong The average number of read/write operations per second for the device 13_machine to write 40 is 234.39. The sub-module 250 is used to test the designated area 15 of the read and write performance of the selected memory. In this embodiment, the storage module 250 stores the read/write performance of the selected storage memory in accordance with the / storage path to F:\mest\Result. The read/write performance of the selected _ form number A_ 'output (four) 260 will be selected for the storage of the eighth page / a total of 18 pages 〇 〇 0982072376-0 [0016] 201120429 read and write performance test data output to the display 17. For example, the output module 206 displays the number of read/write operations per second of the memory 13 A 2 3 4. 6 7 , 234. 05, 234. 34, 234. 43 , 234. 38 and 234. 41, And the average number of read/write operations per second is 234.39. [0017] Referring to Figure 3, there is shown a flow chart of a preferred embodiment of the method for testing the rotational vibration of a storage device of the present invention. [0018] Step S301, the setting module 200 sets the test parameters of the storage device 12. The test parameters include the storage of the storage device 12 to be tested, the Ο fan speed to be tested, the workload to be tested, and the test time. The workload is used to simulate various read/write data requests received by the storage device 丨2 in the actual working environment. The workload can be for a selected storage device, for example, a 4 KB block of data is randomly written to the selected storage. The workload may also randomly write 64 KB of data blocks for a plurality of memories including the selected storage, for example, for all of the storages to be tested. In the present embodiment, the storage to be tested includes 24 storages 13A-13X (for example, 24 hard disks) of the storage device 12; the fan rotation speed to be tested includes 〇1 200 rpm, 2 rpm/min. And 3_rpm/min; the workload to be tested includes randomly writing 4 KB of data blocks to the selected storage, randomly writing 64 KB of data blocks to the selected storage, and randomly writing 256 KB of data to the selected storage. Block, continuously write a 256 kb data block to the selected memory, randomly read a 4 KB data block for the selected memory, randomly write a 64 KB data block for all the memory to be tested, and store all the memory to be tested. A data block of 256 KB is randomly written; the test time is tested 6 times for each of the detectors to be tested under each certain condition (ie, selected fan speed and working load), one minute for each test. 098142185 Form bat number A0101
第9頁/共18 I 0982072376-0 201120429 [0019] 步驟S302，選擇模組21〇從待測的儲存器中選擇—個儲存 器。例如，從待測的儲存器13Α_13χ中選擇儲存器13八。 [0020] 步驟S303，風扇控制模組220從待測的風扇轉速中選擇— 個風扇轉速。例如，風扇控制模組22〇從待測的風扇轉迷 1 200轉/分、2400轉/分及3600轉/分中選擇風扇轉迷 1 200轉/分。 [0021] 步驟S304，風扇控制模組220根據選擇的風扇轉速， 疋，生成 轉速控制命令併發送給風扇14，從而控制風扇14以該選 擇的轉速運轉。例如，風扇控制模組22〇控制風扇丨在以 1 20 0轉/分的轉速達轉。 [0022] 步驟S 3 0 5，負載控制模組2 3 0從待測的，工作,負裁中 、與* T選擇— 個工作負載。例如，負載控制模組230從待測的工作負栽 中選擇對選定的儲存器隨機寫入4KB的資料塊。 [0023]Page 9 / 18 I 0982072376-0 201120429 [0019] Step S302, the selection module 21 selects one of the storages to be tested. For example, the storage unit 13 is selected from the storages 13Α_13χ to be tested. [0020] Step S303, the fan control module 220 selects one of the fan speeds to be tested. For example, the fan control module 22 selects the fan to be 1 200 rpm from the fan to be tested, 1 200 rpm, 2400 rpm, and 3600 rpm. [0021] Step S304, the fan control module 220 generates a rotation speed control command according to the selected fan rotation speed, and sends the rotation speed control command to the fan 14, thereby controlling the fan 14 to operate at the selected rotation speed. For example, the fan control module 22 controls the fan to rotate at a speed of 1200 rpm. [0022] Step S305, the load control module 2300 selects a workload from the test, the work, the negative cut, and the *T. For example, the load control module 230 selects a data block that randomly writes 4 KB to the selected storage from the work load to be tested. [0023]
步驟S306，負載控制模組230對儲存設備12產生該選擇 的工作負載。例如，負載控制模組23〇對儲存器13A隨機 寫入4KB的資料塊。或者，負載控制模組23〇對儲存器 13A-13X隨機寫入64KB的資料塊》 [〇〇24]步驟S307，測試模組240根據設置的測試時間，在選擇的 風扇轉速以及工作負載下測試選擇的儲存器的讀寫性能 。在本實施例中，測試模組240測試選擇的儲存器的每秒 璜/寫操作次數，以表示該選擇的儲存器的讀寫性能。例 如，測試模組240在風扇轉速為12〇0轉/分，對儲存器 13A隨機寫入4KB的資料塊的條件下，測試6次儲存器“A 的每秒讀/寫操作次數，每次測試—分鐘’測得儲存器 098142185 表單編號A0101 第10頁/共18頁 0982072376-0 201120429 13Α的6個每秒讀/寫操作次數分別為234 67、234. 〇5 、234. 34、234. 43、234. 38及234· 41。在本實施例中 ’測試模組24Gf蝴得的最後4個每秒讀/寫操作次數求平 均值’作為的料ϋ在選擇條件下的平均每秒讀/寫 操作""人數。例如’測試模組240對234. 34、234. 43、 234. 38及234. 41求平均值’㈣贿器似在風扇轉速In step S306, the load control module 230 generates the selected workload for the storage device 12. For example, the load control module 23 随机 randomly writes a 4 KB data block to the memory 13A. Alternatively, the load control module 23 随机 randomly writes a 64 KB data block to the memory 13A-13X. [〇〇24] Step S307, the test module 240 tests at the selected fan speed and the workload according to the set test time. Read and write performance of the selected storage. In this embodiment, the test module 240 tests the number of write/write operations per second of the selected storage to indicate the read and write performance of the selected storage. For example, the test module 240 tests the number of read/write operations per second of the memory "A" for 6 times under the condition that the fan speed is 12〇0 rpm, and the memory 13A randomly writes a data block of 4 KB. Test - minutes 'measured memory 098142185 Form No. A0101 Page 10 / 18 pages 0982072376-0 201120429 The number of 6 read/write operations per second is 234 67, 234. 〇 5 , 234. 34, 234. 43, 234. 38 and 234· 41. In the present embodiment, the average of the number of read/write operations per second of the test module 24Gf is averaged as the average reading per second under the selection condition. /Write operation ""Number of people. For example, 'Test module 240 averages 234. 34, 234. 43, 234. 38, and 234. 41' (four) bribes like fan speed
〇轉/刀jl作負載為對錯存器13Α隨機寫入彻的 資料塊條件下的平均每秒讀/寫操作錄，㈣L〇/knife jl is the load for the random register 13Α Randomly written to the data block under the condition of the average read/write operation per second, (4)L
[0025] Ο [0026] ❹ 步驟S308，儲存模組25()將選擇的儲存器的讀寫性能的測 试資料儲存顺存區15。在本實_中，射模組250按 照指定的儲存路徑儲存所述選擇的儲存器的讀寫性能的 測試資料。例如’將所述選擇的儲存ϋ的讀寫性能的測 试資料儲存至F:\RVTest\Result。在本實施例中，儲 存模組250還將選擇_存器的讀寫性能的測試資料輸出 到顯示器17上。 步糊9，輪—選擇的儲存陶寫性能的 測試資料。在本實施例中，輸出模組咖將選擇的儲存器 的讀寫性能的測試資料輸出到顯示器1?上。例如，輸出 模組2嶋_存讓幌每秒讀/寫操作次細】 ' 234. 05 ^ 234. 34 ^ 234. 43 > 234. 38^234. 41.,^ 平均每秒讀/寫操作次數234. 39。 ，判斷是否有其他待測的工作負載。如果有其 他待測的工作負載，則返回步驟咖，輯控制模組23〇 從待測的工作負載中選擇下一個工作負載。 098142185 表單編號A0101 第11頁/共18頁 0982072376-0 [0027] 201120429 剛如果沒有其他待測的工作負載，則步驟S3u’判斷是否 有其他待測的風扇轉速。如果有其他待測的風扇轉速， 則返回步驟S304，風扇控制模組22()從待測的風扇轉速中 選擇下一個風扇轉速。 [0029] 如果沒有其他待_風騎速，則㈣如2，判斷是否 有其他待測的儲存器。如果有其他待測的健存器’則返 回步驟聊3’從待測的儲存器中選擇下-個儲存器。如 果所有待測的儲存器都已夠試完畢，則流程結束。 [0030] =所Γ本發㈣合發料财件，❹法提出專利 申mx上所料料本發明之較㈣施例 =圍並不以上述實施例為限，舉凡熟悉本案技蓺之 亡士援依本發明之精神所作之等效修飾或變化二 盍於以下申請專利範圍内。 應/函 【圖式簡單說明】 [0031] 一 運 [0032] 圖2係本發明儲存設偫播 振動測試系、统的功能模組圖。 [0033] 圖3係本發明儲存設傷旌 程圖。 疋轉振動測試方法較佳實施例的流 【主要元件符號說明】 [0034] 儲存設備旋轉振動測試系統.[0025] In step S308, the storage module 25() stores the test data of the read/write performance of the selected storage in the storage area 15. In the present embodiment, the firing module 250 stores the test data of the read and write performance of the selected storage in accordance with the specified storage path. For example, the test data of the read/write performance of the selected storage port is stored in F:\RVTest\Result. In the present embodiment, the storage module 250 also outputs test data for selecting the read/write performance of the memory to the display 17. Step paste 9, round - selected test data for storing pottery performance. In this embodiment, the output module outputs the test data of the read/write performance of the selected memory to the display 1. For example, the output module 2嶋_存幌幌 read/write operations per second] 234. 05 ^ 234. 34 ^ 234. 43 > 234. 38^234. 41.,^ Average read/write per second The number of operations is 234.39. To determine if there are other workloads to be tested. If there are other workloads to be tested, then return to the step, and the control module 23 selects the next workload from the workload to be tested. 098142185 Form No. A0101 Page 11 of 18 0982072376-0 [0027] 201120429 Just if there are no other workloads to be tested, then step S3u' determines if there are other fan speeds to be tested. If there are other fan speeds to be tested, then return to step S304, and the fan control module 22() selects the next fan speed from the fan speeds to be tested. [0029] If there is no other _ wind riding speed, then (4), such as 2, to determine whether there are other storage to be tested. If there are other sensors to be tested, then return to step 3' to select the next storage from the storage to be tested. If all of the reservoirs to be tested have been tested, the process ends. [0030] = Γ Γ Γ ( 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利 专利Equivalent modifications or variations made by Shishi in accordance with the spirit of the present invention are within the scope of the following claims. [0031] Figure 2 is a functional block diagram of the storage vibration testing system and system of the present invention. [0033] FIG. 3 is a diagram showing the storage of the present invention. Flow of the preferred embodiment of the twirling vibration test method [Description of main component symbols] [0034] Storage device rotary vibration test system.
[0035] 主機：11 [〇_ 儲存設備：12 098142185 表單編號 A0101 第 12 ΐ 貝/共18頁 0982072376-0 201120429 [0037] 儲存器：13A-13X [0038] 風扇：14 [0039] 儲存區.15 [0040] 處理器：16 [0041] 顯示器：17 [0042] 設置模組：200 [0043] 選擇模組：210 [0044] 風扇控制模組： 220 [0045] 負載控制模組： 230 [0046] 測試模組：240 [0047] 儲存模組：250 [0048] 輸出模組：260[0035] Host: 11 [〇_ Storage Device: 12 098142185 Form No. A0101 No. 12 ΐ / 18 pages 0982072376-0 201120429 [0037] Storage: 13A-13X [0038] Fan: 14 [0039] Storage area. 15 [0040] Processor: 16 [0041] Display: 17 [0042] Setting Module: 200 [0043] Selection Module: 210 [0044] Fan Control Module: 220 [0045] Load Control Module: 230 [0046] Test module: 240 [0047] Storage module: 250 [0048] Output module: 260
〇 098142185 表單編號Α0101 第13頁/共18頁 0982072376-0〇 098142185 Form No. Α0101 Page 13 of 18 0982072376-0