TW201104270A - Automatic testing apparatus - Google Patents

Abstract

The present invention is related to an automatic testing apparatus, which includes a test-standby apparatus and a test module. The test-standby apparatus has a test program and includes a plurality of functional modules; the test module is connected by coupling with the test-standby apparatus, which executes the test program and links up to the test module, but test module carries out test towards those functional modules of the test-standby apparatus. Thus, the present invention takes advantage of the automatic test without necessary for the test staff to carry out test, thereby reducing the personnel cost and shortening the total test time.

Description

201104270 VI. Description of the Invention: [Technical Field to Be Invented by the Invention] [The present invention] relates to a test apparatus which is an automatic test apparatus. [Prior Art] [〇〇〇2] According to the rapid development of technology and industrial progress, the market led by the semiconductor industry and the information electronics industry continues to grow vigorously.

There have been quite a number of significant changes in the application level, bringing not only scientific and technological achievements, but also technological products that have improved the quality of human life and changed the way of life, such as: personal computers, mice, scanning Thousands of electronic consumer products, such as mobile phones, mobile phones, personal digital assistants, and so on, especially such products have moved from professional devices to consumer products in individuals, families, and tongues. In other words, people rely on these devices. Increasingly, 'all manufacturers are committed to producing more

098124768 related products, and therefore manufacturers, are committed to _ liter capacity. Furthermore, computer manufacturers are developing a computer platform product, such as a computer motherboard or a computer expansion card. It is often necessary to do a full test before the product goes on the market. Whether the product can work flawlessly. If any component or line is found during the test: If it is not working properly, the tester shall record the defect of the unreported department as a defect and submit the defect to the research. Make corrections. , ^ τ industry hardware such as servers, laptops, etc. In order to ensure the quality of the factory products, it is necessary to enter the peripheral material of the computer products. Grid - test. The general form of the production line bat number A〇1{)1wu' is the original test method to test the computer or the electric production line, the third page / a total of 35 pages 0982402308-0 201104270 know the surrounding 'that the factory needs the operator For example, manual movement of the test to toggle the switch, or the need for the operator to produce an eye or a test result, such as the test, the test is longer than the operation time of the operation, and the fatigue of the operator Will affect the test results. A Please-See also Figure-A and Figure-B for a schematic diagram of the cycle of testing the electronic board of the prior art and a schematic diagram of the period of testing the two computer main boards simultaneously. As shown in the figure, the tester is performing a test cycle of a computer motherboard, including - manual test cycle 10, - program automatic test cycle 12, and one-hand automatic interleaving test cycle. In order to increase the efficiency of testing, the average operator needs the tester to test several computer motherboards at the same time. This is only to test two computer motherboards at the same time, as shown in the first figure, because a computer motherboard is being tested. When you need to perform manual test, program automatic test or manual automatic interleaving test, 'When you run the program automatic test cycle on both computer motherboards', the manual cycle 20 will occur, when two computer motherboards When one of the manual tests is performed and another computer is automatically tested by hand, a program idle period of 22 occurs, which will increase the total test time, thereby reducing the test efficiency, and when the tester tries the same number of tests. When the electric board is boarded, the impact will be even greater. Therefore, how to solve the above problem is to propose a novel automatic test device, which can avoid the test time and the test time because of the manual test of the computer or the computer. A test error occurs and the personnel cost can be avoided to solve the above problem. 098124768 [Description of Contents] Form No. 1010101 Page 4 of 35 0982042308-0 201104270 [0003] The purpose of the month is to provide an automated test device that can be tested by automated testing without the need for testers. Thereby reducing personnel costs. One of the purposes of this month is to provide an automated test device that reduces test time by automated testing. The purpose of this month is to provide an automated test device that avoids human error by automatically testing a test module.

The automatic test device of the present invention comprises: a test device and a test module to be tested have a test program, and the device to be tested comprises a plurality of function modules; a test module _ receiving test device, and the test module is sequentially tested for service The private Wei module of the ,, the towel, the device performs a test program and is connected to the test module, and the test module tests the functional modules of the (4) device. In this way, the present invention eliminates the need for testing by automated testing, thereby reducing personnel costs, and can shorten the total testing time. Further, the present invention can be automatically detected by the measuring group to prevent the functional modules of the device to be tested. Human error ^

[Embodiment] Two F

[〇〇〇4] For a better understanding and understanding of the structural features and efficacies of the present invention, please refer to the preferred embodiment and the detailed description, as explained below: The second figure is a block diagram of a preferred embodiment of the present invention. As shown, the automated test apparatus of the present invention includes a device under test 10 and a test module 20. The device under test 10 has a test program, and the device under test 10 includes a plurality of function modules. The test module 2 is coupled to the receiver device 10, and the test module 20 tests the function modules of the device under test 10, wherein The test device 10 executes the test program and is connected to the test module 2 098124768 Form No. A0101 Page 5 / Total 35 Page 0982402308-0 201104270 Group 2 该 Test the functional modules of the device 10 according to the county Set 10 to execute the test program, and sequentially measure the Wei modules of 10, and then go to the pure test, without the need for testers to test 'and thus reduce personnel costs. In the middle of the present invention, the preferred embodiment is a motherboard of a computer system. Please - and refer to «Three A and Third (4), which is a schematic diagram of a preferred example of the invention - a schematic diagram of the cycle of a computer motherboard and a schematic diagram of the cycle of testing four computer motherboards simultaneously. As shown, the automated test apparatus of the present invention tests the cycle of a computer motherboard including a test test fixture, a program-automatic test cycle, and a disassembly test fixture cycle 34. As shown in Figure B, the tester can test different TV boards in sequence, and can test multiple computer motherboards. When testing multiple computer motherboards, there will be no program idle cycle or manual. Intervening time to achieve automated test and mixed test time, thereby increasing test efficiency. Referring to the second figure, the test module 20 of the present invention tests the functional modules of the device under test 10, and in the embodiment, the test module (4) tests the peripheral circuits of the computer, that is, the test module 2G includes _ audio test circuit 21, a screen test circuit 22, _ touch test circuit 23, a switch test circuit 24, - network route test circuit 25, - key (four) test circuit 26, - charge and discharge test circuit 27 and a multimedia test circuit 28, which is respectively connected to an audio circuit 1 , an image output module 12 , a touch module 13 , a switch module 14 , a network route 15 , a keyboard 16 , a charging switch 17 , and a multimedia circuit 18 . And test it. 098124768 In addition, the device under test 1 of the present invention uses one of the image signal form number surface 1 ... _ 201104270 as an indication signal, that is, the tester uses a red image signal, a green image signal and a video signal. A blue video signal is used as an indicator light, and through the information of the no-light, it is known that the current test module 2 is performing the test. The device under test 10 executes the test program and displays the indicators of the current test module 20 by the indicators of the red image signal, the green image signal and the blue image signal, and tests the module 1 to test the image signals. One of the functional modules of the device under test 10 . The following is a description of various test circuits. Ο

Please refer to the fourth figure, which is a block diagram of an audio test in accordance with a preferred embodiment of the present invention. As shown in the figure, the test module 20 of the present invention comprises a control unit 29 and an audio test circuit 24 «the control unit 29 receives a test signal generated by the device under test 10 to execute a test program, and generates a control signal, and the audio test circuit The receiving control signal generates an audio signal, that is, the buzzer 211 of the audio testing circuit 21 generates an audio signal, and a playing unit 11 of the audio circuit 11 of the power module b plays an audio signal, and the audio test is performed. The circuit 21 tests the audio signal played by the playback unit 110. That is, the device under test 10 receives the audio signal sent by the audio test circuit 21, and then the audio signal received by the device under test 10 is played by the playback unit 110 of the audio circuit 11, and the audio test circuit 21 receives the playback device 11(). And the audio signal played by the test audio test circuit 21 is the same as the audio signal played by the playback unit 110, and an output signal is generated. The audio test circuit 21 transmits the output signal to the device under test 1 for testing. The device 10 determines whether the playback unit 110 is normal. The playing unit 11 is a speaker. In addition, the audio circuit 11 of the device under test 10 further includes a microphone 112. The microphone 112 receives the audio signal played by the audio test circuit 21, and transmits the audible signal to the 092124768 form number A0101 page 7/35 pages 0982402308-0 201104270. The unit 110 is configured to play the audio signal to the audio test circuit 21 for the audio test. Please refer to FIG. 5, which is a circuit diagram of an audio test circuit according to a preferred embodiment of the present invention. As shown, the audio test circuit 21 of the present invention includes a comparison module 210. The comparison module 210 compares a threshold value with an audio signal played by the playback unit 110 for audio testing. In addition, since the audio signal is a waveform superimposed on a DC signal by an AC signal, wherein the AC signal is a true audio signal and the DC signal is a reference signal, the audio test circuit 21 of the present invention is an audio signal. The AC signal is tested separately from the DC signal to increase the accuracy of the test. Therefore, the comparison module 210 includes a first extraction circuit 212, a first comparison circuit 214, a second extraction circuit 216, and a second comparison circuit 218. The first capturing circuit 212 is configured to capture an alternating current signal of the audio signal; the first comparing circuit 214 receives the alternating current signal and compares the threshold value and the alternating current signal of the threshold value to generate a first comparison signal. The first capture circuit 212 includes a capacitor 2120 and a resistor 2122. One end of the capacitor 2120 receives the sound signal, one end of the resistor 2122 is coupled to the other end of the capacitor 2120, and the other end of the resistor 2122 is coupled to the ground. Thus, the first capture circuit 212 captures the sound by the capacitor 2120 and the resistor 2122. Signal exchange signal. The first comparison circuit 214 includes a capacitor 2140, 2142, a resistor 2144, 2146 and a comparison unit 2148. The capacitor 2140 is coupled between the first extraction circuit 212 and the ground terminal, and is coupled to the positive input terminal of the comparison unit 2148. The capacitor 2142 is coupled between the negative input terminal and the ground terminal of the comparison unit 2148. One end of the 2144 is coupled to the power supply, and the other end is connected to one end of the resistor 2146. The resistor 214124768 is formed by the resistor 214124768. Form No. A0101 Page 8 / Total 35 Page 0982402308-0 201104270 The other end is coupled to the ground, and the first comparison circuit 214 is The resistor 2144 and the resistor 2146 form an AC generating circuit 215, and the voltage dividing resistor 2144 and the resistor 2146 are used to generate an AC threshold value. The comparing unit 2148 compares the AC threshold value with the AC signal to generate a first comparison signal.

The second capture circuit 216 captures a DC signal of the audio signal, and the second comparison circuit 218 receives the DC signal and compares the DC threshold with the DC signal and the threshold value to generate a second comparison signal. The second extraction circuit 216 includes a resistor 2160 and a capacitor 2162. One end of the resistor 2160 receives the sound signal, and the other couples the capacitor 2162. The capacitor 2162 is coupled between the resistor 2160 and the ground. Thus, the second bare circuit 216 extracts the DC signal from the resistor 2160 and the capacitor 2162. Signal. The second comparison circuit 218 includes a comparison unit 2180, a capacitor 2182 and a resistor 2184, 2186, 2188. The positive input of one of the units 2180 receives a DC signal, and the capacitor 2182 is coupled to the negative wheel of the comparison unit 2180. Between the terminal and the ground, one end of the resistor 2184 is coupled to the power supply,

- I

The other end of the coupling resistor 2186 is coupled to the negative input terminal of the comparison unit 2180. The resistor 2186 is coupled between the negative input terminal of the comparison unit 2180 and the ground terminal. The resistor 2188 is coupled to the output terminal of the power supply and comparison unit 2180. The resistor 2184 and the resistor 2186 form a DC generating circuit 217' to generate a DC threshold value by dividing the resistor 2184 and the resistor 2186, and the comparing unit 2180 generates a second comparison signal according to the DC threshold value. As described above, the comparison module 210 generates an output signal according to the first comparison signal and the second comparison signal to determine whether the playback unit 110 and the microphone 112 of the audio circuit 11 are normal. The output end of the first comparison circuit 214 is coupled to the output end of the second comparison unit 218, that is, the input end of the AND gate is coupled to the output end of the first comparison circuit 214 and the second comparison is 098124768 0982042308-0. No. A0101 Page 9 / Total 35 pages 201104270 = 18 output to generate output signals. In addition, = more includes - rectifying circuit 2 (1) whole (four) wave circuit 2 214 wheel out and second comparison electric her output - 乂 positive = care output signal. The rectification wave circuit (1) includes a rectifier 2190, a capacitor 2192 and a resistor 2194. The positive terminal of the whole processor receives the comparison module 21. The output signal is between the negative terminal of the rectifier 219° and the ground, and the resistor 2194 is connected in parallel with the capacitor 2192. In addition, the audio test circuit 21 of the present invention can receive the audio signal generated by the buzzer 211 of the microphone 11 of the device 1 to be tested, and the comparison module 210 of the test circuit 21 can test the microphone. 112 received sound signal to test whether the microphone 1 Ϊ 2 is normal. 098124768 Please refer to the sixth figure, which is a schematic diagram of a screen test according to a preferred embodiment of the present invention. The difference between this embodiment and the embodiment of the fourth figure is that the control unit 29 receives the device under test 1 ( The test signal generated by the test program is executed, and the control-signal-driven test module 2G-screen test circuit 22 tests the screen. The screen test circuit 22 receives the control signal and tests the image output module 12 of the device under test 1{), and the image, 1 mode, and 12 generates an image signal for the screen test circuit ^ image output module 12 to perform imagery. The video output module 12 includes a digital video interface (dVI) or a high-definition digital multimedia interface. The screen test circuit 22 includes an image processing circuit ^ and a comparison module 222. The image processing circuit 22() receives the image signal and amplifies the image signal and outputs it, and the comparison module m receives the amplified image. The nickname, and the comparison - the door (4) and the image signal generate an output signal. Whether the image output module 12 is normal. Among them, the image signal bat number is fine 1st! Page/Common-Page 201104270 contains a red image signal, a green image signal and a blue image signal. Please refer to the seventh figure, which is a circuit diagram of a screen test circuit according to a preferred embodiment of the present invention. As shown in the figure, the comparison module 222 of the screen test circuit 2 2 includes a comparison unit 2220, a resistor 2222, a capacitor 2224 and a resistor 2226, 2228, 2229. One of the comparison units 2220 receives the image signal at the positive input end. The red image signal, the resistor 2222 is connected between the positive input terminal of the comparison unit 2220 and a ground terminal. The capacitor 2224 is connected between the negative input terminal of the comparison unit 2220 and the ground terminal. One end of the resistor 2226 is connected to a power supply. The other end is connected to one end of the resistor 2228, and the other end of the resistor 2228 is connected to the ground terminal to form a gate value generating circuit 224 through the resistor 2226 and the resistor 2228, and the voltage is divided to obtain a threshold value, and the resistor 2229 is connected to the supply. The output unit of the power supply and comparison unit 2220 compares the threshold value with the red image signal of the image signal to generate an output signal, and transmits the output signal to the device under test 10 for the device under test 10 to determine the image wheel. Group 12 is normal.

In addition, the screen test circuit 2$ further includes a rectification filter circuit 226. Rectifier · '::' Filter circuit 2 2 6 is used to rectify and filter the output signal. The rectifying and filtering circuit 226 includes a rectifier 2260, a capacitor 2262 and a resistor 2264. The positive terminal of the rectifier 2260 receives the output signal of the comparison unit 2220. The capacitor 2262 is coupled between the negative terminal of the rectifier 2260 and the ground terminal, and the resistor 2264 is connected in parallel with the capacitor 2262. Since the test circuit of the green image signal and the blue image signal is the same as the test circuit of the red image signal, it is not mentioned here. In addition, in the present invention, the red image signal, the green image signal and the color image signal are used as the control indicator lights, so it can be determined by the judgment 098124768 Form No. 1010101 Page 11/35 pages 0982042308-0 201104270 Whether the test items of the lamp number on the lamp are the same or not, it is known whether the image output module 12 is normal, and the screen test circuit 22 is not required to reduce the circuit area, thereby saving costs. Referring to the first embodiment of the present invention, the touch test of the present embodiment is shown in the figure. The difference between this embodiment and the above embodiment is that the control 7030 is executed by the receiving device 10 to execute the test program. The measurement signal is generated to drive the touch module 13 to test the touch module 13 of the test module 20. The touch test circuit 23 has a switch 230. The switch 230 is connected between the touch module 13 of the function module and a touch signal. The touch test circuit 23 turns on the switch according to the control signal generated by the control unit 29. 230, to output a touch signal to the touch module 13, and perform a touch test. That is, the touch test circuit 23 of the present invention outputs the touch signal to the touch module 13 by turning on the switch 230 to replace the manual test, thereby reducing the overhead of personnel costs and avoiding human error. The switch 230 is a relay or a transistor. "Monthly Referring to Figure 9, a block diagram of a switch module test in accordance with a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the above embodiment is that the control unit 29 receives the test signal generated by the device under test 1 to execute the test program, and generates a control signal to drive the switch test circuit 24 of the test set. The switch module 14 is tested. The switch test circuit 24 has a switch 240 coupled between the switch module 14 of the function module and a pilot communication number. The switch test circuit 24 switches the switch according to the control signal to perform the switch mode. Group 14 test. That is, the present invention transmits the communication number to the switch module 14 by turning on the switch 240, instead of manually testing, thereby reducing the overhead of personnel costs and avoiding human error. The switch module 14 is a 098124768 0982042308-0 form editor A0101 page 12 / a total of 35 pages 201104270 image output module switch, a total drink m ', Zhou Luguan switch or a wireless network switch. And the switch 240 is a relay or a transistor. Referring to the tenth figure, a block diagram of a network route test in accordance with a preferred embodiment of the present invention is shown. As shown in the figure, the difference between the embodiment and the above embodiment is that the control unit 29 receives the test signal generated by the device under test to execute the test program, and generates a control signal to drive the test module to be different. Ο The network route test circuit 25 And cut the route, do not test the network route. The network route test circuit 25 has a "switching switch module 25", and the network route test circuit 25 switches the switch module 250' according to the control signal to switch one of the function modules, the network route 252 or the function modules. One of the groups has a second network route 254' and 5 performs a network route test. Thus, the present invention performs the test by switching the first network "252 or the second network route 254 by switching the switch module 25G, instead of manually switching the network route for testing, thereby reducing the overhead of personnel costs and avoiding As a result, the network route test circuit 25 includes a first network port 255, a second network port 256, a third network port 257, and a switch module 250. The first network The 255 is coupled to the network route test circuit 25 through the first network route 252, and the second path 256 is coupled to the network route test circuit 25 through the second network route 254. The third network 埠 2 5 7 transmits a first The three-network route 258 is coupled to the receiving circuit 1 , and the switch module 250 is coupled to the first network 埠 2 5 5 , the second network 埠 2 5 6 and the third network 埠 2 5 7 , and the switch module 205 according to the control signal, and switch the first network route 2 5 2 or the second network route 254 ' to perform the network route test, wherein the first network route 252 or the second network route 254 is the network of the LAN 50M or the LAN LOOP The switch module 250 is a relay, a transistor or any combination thereof. In addition, the switch module 250 includes a relay 2500 and a switch 098124768, form number A0101, page 13 of 35 pages 0082402308-0 201104270 2502. The relay 2500 is connected to the first network 255, the second network i soap 256 and The third network 埠 257 'switch 2502 is coupled to the relay 2500, and the switch 2502 turns on the first network 255 and the third network bar according to the control signal or turns on the second network 256 and the third network 257. The first network route 252 is connected to the device under test 10 or the second network route 254 is connected to the device 10 to be switched to achieve the switching of the first network route 2 5 2 and the second network route 2 5 * for testing. In this embodiment, although the first mesh route 252 and the second mesh route 254 are switched by one relay 2500, the angle is limited to the use of one relay 2500, and a plurality of relays may be used to achieve the purpose of switching. ..:.,;. ^ : . Please refer to the eleventh figure, which is a block diagram of a keyboard test of a preferred embodiment of the present invention. As shown in the figure, the embodiment of the present embodiment is different from the above embodiment. Where the control unit 29 receives the device under test 1 The test signal generated by the test program generates a control signal to drive the test module 2 to the keyboard test circuit 26 to reset the device to be tested - the keyboard 16. The keyboard test circuit 26 has a switch 260 'the keyboard test circuit 26 according to the control The signal on switch 260' resets the keyboard 16 of the device under test 10 to replace the manual switch 16' to reduce the cost of personnel. The switch 26 is a relay or a transistor. Referring to Figure 12, there is shown a block diagram of a charging function test in accordance with a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device to be tested and executes a control signal to generate a control signal to drive one of the test modules 2 to charge and discharge. The test circuit 27 and the charging switch 丨7 of the device to be tested 1 are tested for the charging function. The charge and discharge test circuit 27 has a switch 27 〇, and the charge and discharge test circuit 27 turns on the switch 27 依据 according to the control signal to test the work 098124768 form number surface] The third page / a total of 35 pages 〇 〇 423 〇 8_ 201104270 can be charged by the wedge group The function, that is, the on/off switch 270, in place of the manual insertion and removal of a power converter in the device to be tested, thereby reducing the overhead of personnel costs and avoiding human error. Among them, the switch 27 is a relay or a transistor. Referring to Figure 12, a block diagram of a multimedia test in accordance with a preferred embodiment of the present invention is shown. As shown in the figure, the difference between the present embodiment and the above embodiment is that the control unit 29 receives the signal generated by the test device 1 () to execute the test program, and generates a control signal to drive the service module. The test circuit 28 performs a multimedia test on the multimedia circuit 18 of the functional group of the device 1 to be tested. The multimedia test and the debt-test component 280, the debt-measuring component 28 is based on the -light source' of the multimedia circuit 28 of the control signal debt test function module to perform a multi-media test, instead of the manual method, the finger touch field should be pressed. _ Lai, shouting less personnel costs and can be expected to be misjudged. The detecting component 280 is a photo-sensitive resistor. As described above, the automated test core of the present invention is coupled to the test device by the test module, and the test device executes the test program and is coupled to the test module to enable the test module to perform the functional modes of the device to be tested. The group conducts the test t (four) 'this hair „ by the automated test without the need for test personnel to test the H personnel costs, and can shorten the total test time. The present invention is a new, progressive and available for industrial users 'It should be in accordance with the special requirements specified in _ special (four), no doubt, 提出 提出 提出 提出 提出 提出 提出 提出 提出 提出 提出 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 A preferred embodiment of the scope of the present invention is defined, and the shapes, structures, features, and spirits described in the scope of the application form number A0101, page 15 / page 098 204 204 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 098 Variations and modifications are to be included in the scope of the patent application of the present invention. [Simplified Description of the Drawings] [0005] The first A diagram is a demonstration of the cycle of testing a computer motherboard by the prior art. In the meantime, the first B diagram is a schematic diagram of testing the period of two computer motherboards at the same time as the prior art, and the second diagram is a block diagram of a preferred embodiment of the present invention; A schematic diagram of a cycle of testing a computer motherboard in a preferred embodiment; FIG. 3B is a schematic diagram of a period of testing four computer motherboards simultaneously according to a preferred embodiment of the present invention; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 9 is a circuit diagram of an audio test circuit according to a preferred embodiment of the present invention, and FIG. 6 is a screen test of a preferred embodiment of the present invention. FIG. 9 is a circuit diagram of a screen test circuit of one of the embodiments of the present invention; FIG. 8 is a block diagram of a touch test of one of the more embodiments of the present invention. FIG. A block diagram of a switch module test in accordance with a preferred embodiment of the present invention; FIG. 10 is a block diagram of a network route test in accordance with a preferred embodiment of the present invention, Form No. A0101 098124768, page 16 of 35, 10882402308 -0 201104270 Real The eleventh figure of the keyboard test is an example of a preferred embodiment of the present invention; the tenth-picture is a block diagram of the charging function test of the preferred embodiment of the present invention; and the twelfth figure A block diagram of a multimedia test according to a preferred embodiment of the present invention. [Main component symbol description] [0006] Conventional technology: 〇 10' manual test cycle 12' program automatic test cycle 14 hand automatic delivery ▲ test cycle 2 〇 'Manual placement period 22' program idle period [0007] The present invention:

......... 10 device under test 11 audio circuit ζ) 110 playback unit 112 microphone 12 image output module 13 touch module 14 switch module 15 network route 16 keyboard 17 charging switch 18 multimedia circuit 098124768 form No. 1010101 Page 17/35 pages 0982042308-0 201104270 20 Test module 21 Audio test circuit 210 comparison module 211 Buzzer 212 First capture circuit 2120 Capacitance 212 2 Resistor 214 First comparison circuit 2140 Capacitance 2142 Capacitance

2144 resistance 214 6 resistance 2148 comparison unit 215 AC threshold value generation circuit 216 second extraction circuit 21 6 resistance 2162 capacitance 217 DC threshold value generation circuit 218 second comparison circuit 2180 comparison unit 2182 capacitance 2184 resistance 218 6 resistance 218 8 resistance 21 9 Rectifier Filter Circuit 2190 Rectifier 098124768 Form No. A0101 Page 18 / Total 35 Page 0982204308-0 201104270 2192 Capacitor 21 9 4 Resistor 22 Screen Test Circuit 220 Image Processing Circuit 222 Comparison Module 2220 Comparison Unit 2222 Resistor Ο 2224 Capacitor 2226 Resistor 2228 resistance 2 2 2 9 resistance 224 threshold value generation circuit 226 rectification filter circuit 2260 rectifier 2262 capacitance 2264 resistance

23 touch test circuit 230 switch 24 switch test circuit 240 switch 25 network route test circuit 250 switch switch module 2500 relay 2502 switch 2 5 2 first network route 2 5 4 second network route 098124768 form number Α 0101 page 19 / total 35 pages 0982402308-0 201104270 2 5 5 first network 埠 2 5 6 second network 埠 2 5 7 third network 埠 26 keyboard test circuit 260 switch 27 charge and discharge test circuit 270 charge switch 28 multimedia test circuit 280 detect Measuring element 29 Control unit 30 Mounting test fixture cycle 32 Program automatic test cycle 34 Disassembly test fixture cycle 098124768 Form number A0101 Page 20 of 35 page 20842204308-0

Claims (1)

201104270 VII. Patent application scope: 1 automatic test device, which includes: - the device under test 'has a sluice program, the device includes a plurality of function modules; and - the test module, the pure device, the test The functional modules of the device to be tested are connected to the test module, and the test module tests the functional modules of the device under test. The automatic test device of claim 1, wherein the test module comprises: a control unit that receives the test device to execute one of the test programs generated by the test program. And the audio test circuit receives the control signal to generate an audio signal, and the playback unit of the function module plays the audio signal, and the audio test circuit tests the sound number of the sound played by the playback unit. 3. The automated test apparatus of claim 2, wherein one of the Q function modules receives the sound signal and transmits the sound signal to the playback unit for the playback unit to play the sound to the audio test circuit. For audio testing. 4. The automated test apparatus of claim 2, wherein the audio test circuit comprises: - a comparison module that compares a threshold value with the sound signal played by the playback unit for audio testing. 5. The automated test apparatus of claim 4, wherein the comparison module comprises: 4 098124768 Form No. A0101 Page 21 of 35 0982042308-0 201104270 A first capture circuit that captures the sound One of the signals is an alternating current signal; a first comparing circuit receives the alternating current signal and compares the alternating current threshold value of the alternating current signal with the threshold value to generate a first comparison signal; and a second capturing circuit that captures the sound And a second comparison circuit that receives the DC signal and compares the DC signal with a DC threshold of the threshold to generate a second comparison signal; wherein the comparison module is based on the first The comparison signal and the second comparison signal 'generate an output signal' to determine whether the playback unit is normal. The automatic test device of claim 5, wherein the output signal is transmitted to the device under test for the tester to determine whether the play unit is normal. The automatic north test device of claim 5, wherein the comparison module further comprises: a rectification filter circuit that rectifies and filters the output signal. The automated test apparatus of claim 2, wherein the playback unit is a speaker. The automatic test device of claim 1, wherein the test module comprises: a control unit that receives a test signal generated by the test device to execute the test program to generate a control signal; and an audio signal The test circuit receives the control signal to generate an audio signal, and one of the function modules receives the sound signal, and the audio test circuit measures the sound signal received by the microphone. 10. The automated test apparatus of claim 1, wherein the test module comprises: 098124768 a control unit that receives the form number generated by the device under test to execute the test program. A0101 Page 22 of 35 0982042308 201104270 〇12 13 14 , Ο 15 . / then 4 signal, and generate - control signal; and the screen test circuit, receiving the control signal and testing the device under test - image wheel out module 'the image output module generates - Image signal for the screen test circuit to perform image testing. The automatic test device according to the first aspect of the invention, wherein the glory test circuit comprises: 匕 a module, receiving the image signal, and comparing a threshold value with the image number to generate an output signal, For determining whether the image output module is normal or not, the automatic test device of claim 11, wherein the output signal is transmitted to the device to be tested, and the device to be tested determines whether the image output module is normal. . For example, the automatic test device according to claim 11 of the patent scope, wherein the screen test module further comprises: a rectifying filter circuit for rectifying and filtering the output signal. For example, the automatic test described in claim 10, wherein the image signal comprises a red image signal, a green image signal or a blue image signal. The automatic test device of claim 1, wherein the test module comprises: a control unit that receives a test signal generated by the test device to execute the test program to generate a control signal; and a touch The control test circuit has a switch coupled between the touch module and the touch signal of the function module, and the touch test circuit turns on the switch according to the control signal to output the touch Touch test to the touch module'. 098124768 Form No. Α0101 Page 23 of 35 0982042308-0 201104270. The automatic test apparatus of claim 15 wherein the switch is a relay or a transistor. 17. The automated test apparatus of claim 1, wherein the test module comprises: a control unit 'receiving a test signal generated by the test device to execute the test program' to generate a control signal; And a switch test circuit having a switch coupled between the switch module of the function module and a test signal, the switch test circuit turning on the switch according to the control signal to output the test signal Perform a switch test. 18. The automated test apparatus of claim 17, wherein the switch is a relay or an electric crystal. The automatic test device of claim 17, wherein the switch module is A display screen switch, a network management switch or a wireless network switch. 20. The automated test apparatus of claim 1, wherein the test module comprises: a control unit that receives a test signal generated by the device under test to perform the test kill, and generates a selected signal And::;;':;. A network route test circuit has a switch module, the network route test circuit turns on/off the switch module according to the control signal, to switch one of the function modules The network route test is performed on a network route or a second network route of the function module. 21. The automated test apparatus of claim 2, wherein the network route test circuit comprises: a first network 辆 'connected to the test circuit; a first network 埠, the test circuit is connected a third network port coupled to the device under test; and 098124768 page 24 of 35 form number Α 0101 201104270 the switch module 'couples the first network 埠, the second network 槔In the third network, the switch module switches the first network port or the second network port according to the control signal to perform a network route test. 22. The automated test apparatus of claim 2, wherein the switch is a relay, a transistor, or any combination thereof. 23. The automated test apparatus of claim 2, wherein the test module comprises: a control unit that receives a test signal generated by the test device to execute the test program to generate a control signal; The keyboard test circuit has a switch, and the keyboard test circuit turns on the switch according to the control signal to reset a keyboard of the device to be tested. 24. The automated test apparatus of claim 23, wherein the switch is a relay or a transistor. 25. The automated test apparatus of claim </ RTI> wherein the test module comprises: L;: a control unit 'receiving a test signal generated by the test device to execute the test program' to generate a control signal g; and a charge and discharge test circuit 'having two to: off, the charge and discharge test circuit turns on the switch according to the control signal to test a charging function of the functional module. 26. As described in claim 25 An automated test device in which the switch is a relay or a transistor. 27. The automated test apparatus of claim 1, wherein the test module comprises: a control unit that receives a test signal generated by the test device to execute the test program to generate a control signal; 098124768 Form bat number A0101 Page 25 / Total 35 page 0982042308-0 201104270 A multimedia test circuit with components, the _ component is based on the control signal to measure the function of the multi- (four) circuit - the light source for multimedia test. An automated test apparatus as described in claim 23, wherein the detecting element is a photoresistor. An automatic test device comprising: a test device having a test program; a control unit receiving a test signal generated by the device under test to generate a control signal; and generating a control signal; The audio test circuit receives the control signal to generate an audio signal, and the playback unit of the function module plays the audio signal, and the Weng 33 test circuit tests the audio signal played by the playback unit. The automatic test device of claim 29, wherein one of the function modules receives the sound signal and transmits the sound signal to the playback unit for the playback unit to play the audio signal to the audio device. Test circuit 'for audio testing. 31. The automated test apparatus of claim 29, wherein the audio test circuit comprises: a comparison module that compares a threshold value with the sound signal played by the playback unit for audio testing. 32. The automated test apparatus of claim 31, wherein the comparison module comprises: a first capture circuit for extracting an alternating current signal of the audio signal; and a first comparison circuit 'receiving the alternating current signal And comparing the AC signal with one of the s Xuanmen plant values, the F1 Tan value "generates a first comparison signal; a first capture circuit that operates a DC signal of the audio signal; and 098124768 Form No. A0101 26 pages/total 35 pages 0982042308-0 201104270 A second comparison circuit 'receives the DC signal' and compares the DC signal with a DC threshold value of the threshold value to generate a second comparison signal; wherein the comparison module is based on The first comparison signal and the second comparison signal generate an output signal to determine whether the playback unit is normal. 33. The automated test apparatus of claim 32, wherein the output signal is transmitted to the device under test for the device under test to determine whether the playback unit is normal. 34. The automated test apparatus of claim 32, wherein the comparison module further comprises: a &quot;'rectification filter circuit that rectifies and filters the output signal. 35. The fishing dynamic test device of claim 29, wherein the playback unit is a speaker. The kinetic test device of claim 29, wherein the control unit is further coupled to a screen test circuit, the screen test circuit receiving the control signal and testing an image of the device under test Output module, the image The output module generates an image signal for the screen test circuit to perform the image test. 37. The automated test apparatus of claim 36, wherein the screen test circuit comprises: - a comparison circuit that receives the image signal and compares a threshold value with the shadow number to generate an output signal to Determining whether the image output module is normal or not. 38. The automatic test device of claim 37, wherein the wheeled number is transmitted to the device under test for the device to be tested to determine the image wheeling module Is it normal? 098124768 9. The automatic test device as described in claim 36, wherein 0982042308-0 Form No._1 % 27 I/* 35 I 201104270 The screen test module further comprises: a rectification filter circuit, rectification and filtering The output signal. 40. The automated test apparatus of claim 36, wherein the image signal comprises a red image signal, a green image signal or a blue image signal. The automatic test device of claim 29, wherein the control unit is further coupled to a network route test circuit, the network route test circuit has a switch module, and the network route test circuit is based on the control signal Turning on/carrying the switch module to switch one of the first network route of the function module or the second network route of the function loss group, and perform a network route test solution:::##··.遂' 42. The automated test apparatus of claim 41, wherein the network route test circuit comprises: ' &quot;: a first network port coupled to the test circuit; a second network port coupled The test circuit; the second network port is coupled to the device to be tested; and the switch module is coupled to the first network port, the second network path and the third network port, and the switch mode is changed. The group switches the first network route or the second network route according to the control signal to perform a network route test. 43. The automated test apparatus of claim 40, wherein the switch is a relay, a transistor, or any combination thereof. , 098124768 Form No. A0101 Page 28 of 35 0982042308-0