TW201041185A - LED chip for increasing front light emitting rate and its fabricating method - Google Patents
LED chip for increasing front light emitting rate and its fabricating method Download PDFInfo
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201041185 六、發明說明: 【發明所屬之技術領域】 本發明係有關於一種光發射之半導體裝置,特別係有 關於一種發光二極體晶粒結構及其製造方法。 【先前技術】 Ο201041185 VI. Description of the Invention: [Technical Field] The present invention relates to a semiconductor device for light emission, and more particularly to a light-emitting diode structure and a method of fabricating the same. [Prior Art] Ο
隨著科技的不斷發展’現代的照明設備已逐漸由傳統 之燈泡及日光燈等,進步到以發光二極體作為發光裝 置。發光二極體(Light Emitting Diode, LED)係一種可發 光的半導體元件,其能夠高效率地直接將電能轉化為光 能’具有較長的使用壽命、耗電量較低、體積小、不易 破損等傳統光源無法與之比較的優點。隨著近年來高亮 度的發光二極體的開發成功,使得發光二極體從過去只 能用於指示燈和儀錶顯示器,進步到成為液晶顯示的背 光,再擴展到電子照明及公眾顯示,如車用燈、大型影 視牆’甚至是投影機内的照明等等。 傳統發光二極體晶粒中切割形成之側面與壁面設計 為一平坦表面,發射出光線會造成光逸散,而折返之光 線則會有折射損失,無法有效集中在正面出光。故習知 發光二極體晶粒之發光效率較為低落,無法達到較為集 中的出光強度。此外,傳統發光二極體晶粒通常以雷射 熱加工晶圓達到切割分離。然高能量之雷射光會在發光 二極體晶#的侧面留下黑焦之環狀雷射#,使得由發光 二極體晶粒發出之光線被阻擋或吸收,冑而影響發光效 率。 201041185 【發明内容】 為了解決上述之問題,本發明之 -種增加正㈣㈣ ㈣在於提供 法,能增加非正面體晶粒結構及其製造方 ,曼反射率,並將光線集 光面射出,達到光平隹♦^田 fr田鑲主發 太路- 達到較大的出光強度。 之次一目的係在於提供一 ^ ^ 種增加正面出光率 之發光二極體晶粒結構With the continuous development of technology, modern lighting equipment has gradually evolved from traditional light bulbs and fluorescent lamps to light-emitting diodes as light-emitting devices. Light Emitting Diode (LED) is a luminescent semiconductor component that can directly convert electrical energy into light energy with high efficiency. It has a long service life, low power consumption, small size, and is not easily damaged. The advantages that traditional light sources cannot compare with. With the successful development of high-intensity light-emitting diodes in recent years, light-emitting diodes have only been used in the past for indicator lights and instrument displays, and have evolved to become backlights for liquid crystal displays, and then extended to electronic lighting and public displays, such as Car lights, large video walls, and even the lighting inside the projector. The side surface and the wall surface formed by cutting in the conventional light-emitting diode crystal grain are designed as a flat surface, and the light emitted by the light-emitting diode causes the light to escape, and the light of the folded-back light has a refractive loss, which cannot be effectively concentrated on the front surface. Therefore, it is known that the luminous efficiency of the light-emitting diode grains is relatively low, and the relatively concentrated light output intensity cannot be achieved. In addition, conventional light-emitting diode dies are typically laser-processed to achieve separation by laser. However, the high-energy laser light leaves a black-focus ring laser # on the side of the light-emitting diode crystal #, so that the light emitted by the light-emitting diode crystal grains is blocked or absorbed, thereby affecting the luminous efficiency. 201041185 SUMMARY OF THE INVENTION In order to solve the above problems, the present invention increases the positive (four) (four) (four) in the provision method, can increase the non-positive body grain structure and its manufacturing side, the man's reflectivity, and the light collection surface is emitted, Light flat 隹 ♦ ^ field fr field set main hair road - to achieve greater light intensity. The second objective is to provide a light-emitting diode structure that increases the front light output rate.
強度。 苒及再製化方法,能增加表面黏著 本發明的目的及解冰 &解决其技術問題是採用以下技術2 案來實現的。本發明接+ 錄似 不發明揭不一種增加正面出光率之發光二 極體日日粒結構,其係具有一主發 六$ |尤面、一接合面、在索 主發光面與該接合面之間的複數個側面以及一發光為 構’其中該些侧面與該接合面係為粗糙化,以增加非j 面之漫反射率。 本發月的目的及解決其技術問題還可採用以下技術 措施進一步實現。 在前述的發光二極體晶粒結構中,該些侧面與該接合 面之粗糙度係可大於該主發光面。 在前述的發光二極體晶粒結構中,該發光二極體晶粒 結構係可為覆晶型態並包含一磊晶基底,而該發光結構 係為一半導體疊層’該主發光面係形成於該磊晶基底 上’該接合面係設有複數個電極。 在則述的發光二極體晶粒結構中,該發光二極體晶粒 4 201041185 結構係可為晶圓級封裝型態並包含一磊晶基底與一封裝 樹脂,該封裝樹脂係形成於該磊晶基底上,以密封該發 • 光結構,該主發光面係形成於該封裝樹脂上並設有複數 個電極。 在前述的發光二極體晶粒結構中,該些側面在接近該 接合面之周邊係可形成有一粗化環。 本發明還揭示上述增加正面出光率之發光二極體晶 〇 粒結構之製造方法’首先,提供一發光二極體晶圓係 具有一主發光面、一接合面以及複數個發光結構。接著, 貼附該發光二極體晶圓之該主發光面至一切割載膜。之 後,進行一背切步驟,其係由該接合面切穿該發光二極 體晶圓,以形成複數個具有對應發光結構之發光二極體 曰曰粒結構,其係具有在該主發光面與該接合面之間的複 數個側面。最後,進行一喷砂步驟,在該切割載膜保護 下,以使該些侧面與該接合面相對於該主發光面更為粗 縫化’以增加非正面之漫反射率。 由以上技術方案可以看出,本發明之增加正面出光率 之發光二極體晶粒結構及其製造方法,具有以下優點與 功效: 一、可藉由發光二極體晶粒結構之側面與接合面為粗糙 化作為其中一技術手段,以增加非正面之漫反射 率,而將光線集中由主發光面射出,達到光聚焦之 效果及達到較大的出光強度。 5 201041185strength.苒 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再 再The present invention does not disclose a light-emitting diode solar granule structure which increases the front light-emitting rate, and has a main hair ray, a joint surface, a light-emitting surface of the cable, and the joint surface. A plurality of sides and a illuminating structure are formed such that the sides and the bonding surface are roughened to increase the diffuse reflectance of the non-j surface. The purpose of this month and the resolution of its technical problems can be further realized by the following technical measures. In the foregoing light-emitting diode structure, the roughness of the sides and the bonding surface may be greater than the main light-emitting surface. In the foregoing light-emitting diode structure, the light-emitting diode structure may be a flip-chip type and include an epitaxial substrate, and the light-emitting structure is a semiconductor layer 'the main light-emitting surface system Formed on the epitaxial substrate, the bonding surface is provided with a plurality of electrodes. In the light-emitting diode structure of the light-emitting diode, the light-emitting diode die 4 201041185 may be in a wafer-level package and include an epitaxial substrate and an encapsulating resin. The epitaxial substrate is sealed to form the light-emitting structure, and the main light-emitting surface is formed on the encapsulating resin and provided with a plurality of electrodes. In the foregoing light-emitting diode structure, the side faces may be formed with a roughened ring near the periphery of the joint surface. The present invention also discloses a method for fabricating the above-described light-emitting diode crystal grain structure which increases the front light-emitting rate. First, a light-emitting diode wafer system has a main light-emitting surface, a joint surface, and a plurality of light-emitting structures. Next, the main light emitting surface of the light emitting diode wafer is attached to a cutting carrier film. Thereafter, performing a back-cutting step of cutting the light-emitting diode wafer from the bonding surface to form a plurality of light-emitting diodes having a corresponding light-emitting structure, the main light-emitting surface a plurality of sides between the joint surface and the joint surface. Finally, a sand blasting step is performed under the protection of the cutting carrier to cause the sides and the bonding surface to be roughened relative to the main light emitting surface to increase the non-frontal diffuse reflectance. It can be seen from the above technical solutions that the light-emitting diode structure and the manufacturing method thereof for increasing the front light-emitting rate of the present invention have the following advantages and effects: 1. The side and the bonding of the light-emitting diode structure can be The surface is roughened as one of the technical means to increase the non-frontal diffuse reflectance, and concentrate the light from the main light emitting surface to achieve the effect of light focusing and achieve a large light output intensity. 5 201041185
可藉由發光二極體晶私# 4致> & A 賤日日粒結構之接合面為粗糙化作為 其中技術手,可用以增加表面黏著強度。 可藉由發光二極體晶粒結構之粗化環之形成位置作 為其中1 一技術手段,推一 ,1- ±The bonding surface of the solar particle structure can be roughened as a technical hand by the light-emitting diode crystal, and can be used to increase the surface adhesion strength. The position of the roughening ring formed by the crystal structure of the light-emitting diode can be used as one of the technical means to push one, 1-±
TfX 進一步增加表面黏著強度,並 避免射出光線至側而址φ A & & & 土 J面被黑焦狀之雷射痕(位置對應 到粗化環)吸收,以掸、欲止t ή Λ 乂增加發光亮度與降低晶粒發熱。 【實施方式】 ' 〇 卩下將配合所附圖示詳細說明本發明之實施例,然應 注意的是,該些圖示均為簡化之示意圖,僅以示意方法 來說明本發明之基本架構或實施方法,故僅顯示與本案 有關之元件與組合關係’胃中所顯示之元件並非以實際 實施之數目、形狀、尺寸做等比例繪製,某些尺寸比例 與其他相關尺寸比例或已誇張或是簡化處理,以提供更 清楚的描述。實際實施之數目、形狀及尺寸比例為一種 選置性之設計,詳細之元件佈局可能更為複雜。 〇 依據本發明之第一具體實施例,一種增加正面出光率 之發光二極體晶粒結構舉例說明於第丨圖之截面示意 圖。該發光二極體晶粒結構100係具有一主發光面m、 一接合面112、在該主發光面ln與該接合面112之間 的複數個側面11 3以及一發光結構丨2〇,其中該些側面 U3與該接合面112係為粗糙化,以增加非正面之漫反 射率(diffuse reflection rate)。所謂漫反射(或稱漫射)係 指當一束平行的入射光線射到粗糙的表面時,因表面上 201041185 凹凸不平,所以入射線雖然互相平行,由於各點的反射 線方向不一致,造成反射光線向不同的方向無規則地反 射於該發光二極體晶粒結構100之内部。具體'而言,該 « 發光二極體晶粒結構1 〇〇係為一發光二極體晶圓1 〇(如 第3A圖所示)進行切割之後所形成之複數個發光二極體 晶粒結構100之其中之一,其製程於後另述。 在本實施例中,如第1圖所示,該發光二極體晶粒結 〇 構100係可為覆晶型態並包含一磊晶基底130,而該發 光結構120係為一半導體疊層。該磊晶基底13〇係可為 透明之藍寶石基板(sapphire substrate)或其它可晶圓製 程施作之載板。該磊晶基底130之材質係可為氧化鋁 (A12 03),如藍寶石基板。該發光結構ι2〇係為一半導體 疊層而可包含一第一 N型氮化鎵(n_GaN)、一第二N型 氮化鎵、一多重量子井結構(MQWs,multiple quantumTfX further increases the surface adhesion strength, and avoids emitting light to the side. The site φ A &&&&&&&&&&&&&&&&& ή Λ 乂 Increases the brightness of the light and reduces the heat of the grain. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The embodiments of the present invention will be described in detail with reference to the accompanying drawings. The method is implemented, so only the components and combinations related to the case are displayed. 'The components displayed in the stomach are not drawn in proportion to the actual number, shape and size of the actual implementation. Some ratios of scales are exaggerated or other Simplify the process to provide a clearer description. The actual number, shape and size ratio of the implementation is an optional design, and the detailed component layout may be more complicated. 〇 According to a first embodiment of the present invention, a light-emitting diode structure which increases the front light-emitting rate is illustrated by a cross-sectional view of the second embodiment. The light emitting diode structure 100 has a main light emitting surface m, a bonding surface 112, a plurality of side surfaces 11 3 between the main light emitting surface ln and the bonding surface 112, and a light emitting structure 〇2〇, wherein The side faces U3 and the joint faces 112 are roughened to increase the non-frontal diffuse reflection rate. The so-called diffuse reflection (or diffuse) means that when a pair of parallel incident light hits a rough surface, the surface of the 201041185 is uneven, so the incident rays are parallel to each other, and the reflection directions of the points are inconsistent, causing reflection. The light is randomly reflected in different directions inside the light-emitting diode structure 100. Specifically, the «light-emitting diode structure 1 〇〇 is a plurality of light-emitting diode dies formed by dicing a light-emitting diode wafer 1 如 (as shown in FIG. 3A ) One of the structures 100, the process of which is described later. In this embodiment, as shown in FIG. 1, the light-emitting diode structure 100 can be a flip-chip type and include an epitaxial substrate 130, and the light-emitting structure 120 is a semiconductor laminate. . The epitaxial substrate 13 can be a transparent sapphire substrate or other wafer-applied carrier. The material of the epitaxial substrate 130 may be alumina (A12 03), such as a sapphire substrate. The light emitting structure ι2 is a semiconductor stack and may include a first N-type gallium nitride (n_GaN), a second N-type gallium nitride, and a multiple quantum well structure (MQWs, multiple quantum)
WellS)以及一 P型氮化鎵(P-GaN),可利用晶圓製程之沉 積或/與顯影蝕刻技術形成。該磊晶基底13〇應具有高透 光性。WellS) and a P-type gallium nitride (P-GaN) can be formed using a wafer process deposition or/and a development etch technique. The epitaxial substrate 13 should have high light transmittance.
田作為覆晶型態,該主發光面lu係應形成於該磊晶 基底130上,作為光線發射的主要表面。該主發光面^ 之相反面即為該接合面112,以作為表面接合,以固著 於載體上,例如有反射鏡結構之導線架或是中介型電 路載板。該接合面112係設有複數個電極141、142。該 些電極141、142可分別為—N型電極141^ pM 7 201041185 極142。該N型電極141與該P型電極142之材質係可 為鉻金(Cr/Au)。當該N型電極141與該p型電極142之 間存在有一電壓差時,發光二極體中電流可以輕易地從 P極(正極)流向η極(負極),致使該發光結構12〇產生一 光源。該發光結構120產生之大部份光源係可穿透該磊 晶基底130,並引導至外部。與習知非覆晶型態之發光 二極體晶粒結構比較下,朝向該接合面112之該些電極 Ο I41、142不會遮蔽該主發光面111,發出光線不會被阻 擋而損失大部份的光量。 由於如第1圖所示,該些側面113與該接合面112係 為粗糙化,以增加漫反射率。當該發光二極體晶粒結構 100由該發光結構120發出光線時,光線會在該些粗糙 化之側面113與該接合面112產生漫反射效果,而將光 線更進一步集中由該主發光面U1發射出,達到光聚焦 之效果及達到較大的出光強度。 ❹ 較佳地,該些侧面113在接近該接合面112之周邊係 可形成有一粗化環151。在此所稱之粗化環151,其係為 透明狀之粗糙環面,其粗糙度更大於該接合面112與該 些側面113在該粗化環151之外其餘表面之粗糙度。此 外,當該發光二極體晶粒結構丨00安裝於諸如引線框架 或印刷電路板之載體上時,該粗糙化之接合面112可用 以增加表面黏著強度,並避免射出光線至該些側面ιΐ3 被黑焦狀之雷射痕(位置對應到該粗化環丨5丨)吸收,以增 8 201041185 加發光亮度與降低晶粒發熱。在本實施例中,該粗化環 1 5 1係形成於該發光結構120之側緣。 請參閱第2圖之製程流程圖與第3A至3E圖之截面 » 示意圖,本發明進一步說明該發光二極艘晶粒結構1〇〇 之製造方法’以說明本發明之發光二極體晶粒結構1〇〇 為具體可實施並彰顯其功效。 如第2圖所示,本發明之製造方法包含以下步驟:「提 〇 供發光二極體晶圓」之步驟1、「貼附發光二極體晶圓之 主發光面至切割載膜」之步驟2、「背切」之步驟3、「對 切割載膜進行擴膜」之步驟4以及「喷砂」之步驟5。 其中步驟4「對切割載膜進行擴膜」為非必要的選置性 步驟。 首先’執行步驟1。可參閱第3A圖所示,提供一發 光二極體晶圓10。該發光二極體晶圓1〇係為複數個上 述未切割之發光二極體晶粒結構100之組成。該發光二 極體晶圓10係具有複數個呈十字交錯之切割道n,以 定義出該些發光二極體晶粒結構100之形成位置。 接著’執行步驟2。可再參閱第3A圖所示,貼附該 光極體B曰圓1〇之該主發光面ill至一切割載膜 該切割載膜20係可具有可拉張伸展之特性,可選自於紫 外線膠帶taPe)、熱分離膠帶(thermal tape)或藍膜 (blue tape)之其中一種。 之後,執行步驟3。可參閱第3B圖所示,進行一背 9 201041185As a flip-chip type, the main light-emitting surface should be formed on the epitaxial substrate 130 as a main surface for light emission. The opposite surface of the main light-emitting surface is the joint surface 112 to be surface-bonded to be fixed to the carrier, such as a lead frame having a mirror structure or an intermediate type circuit carrier. The joint surface 112 is provided with a plurality of electrodes 141 and 142. The electrodes 141, 142 may be -N-type electrodes 141^pM 7 201041185 poles 142, respectively. The material of the N-type electrode 141 and the P-type electrode 142 may be chromium gold (Cr/Au). When there is a voltage difference between the N-type electrode 141 and the p-type electrode 142, the current in the light-emitting diode can easily flow from the P-pole (positive electrode) to the n-pole (negative electrode), so that the light-emitting structure 12 generates a light source. Most of the light source generated by the light emitting structure 120 can penetrate the epitaxial substrate 130 and be guided to the outside. Compared with the conventional non-clad-type light-emitting diode structure, the electrodes Ο I41 and 142 facing the bonding surface 112 do not block the main light-emitting surface 111, and the emitted light is not blocked and the loss is large. Part of the amount of light. As shown in Fig. 1, the side faces 113 and the joint faces 112 are roughened to increase the diffuse reflectance. When the light emitting diode structure 100 emits light from the light emitting structure 120, the light will have a diffuse reflection effect on the roughened side 113 and the bonding surface 112, and the light is further concentrated by the main light emitting surface. U1 is emitted to achieve the effect of light focusing and achieve a large light output intensity. Preferably, the side faces 113 are formed with a roughened ring 151 near the periphery of the joint surface 112. The roughened ring 151, referred to herein as a rough, toroidal surface, has a greater roughness than the roughness of the joint surface 112 and the remaining surfaces of the side surfaces 113 beyond the roughened ring 151. In addition, when the light emitting diode structure 00 is mounted on a carrier such as a lead frame or a printed circuit board, the roughened bonding surface 112 can be used to increase the surface adhesion strength and avoid emitting light to the sides ι3 It is absorbed by the black-focused laser marks (position corresponding to the roughened ring 丨5丨) to increase the brightness of the light and reduce the grain heat. In this embodiment, the roughening ring 151 is formed on a side edge of the light emitting structure 120. Referring to the process flow chart of FIG. 2 and the cross section of FIG. 3A to FIG. 3E, the present invention further describes the manufacturing method of the light-emitting diode structure 1 以 to illustrate the light-emitting diode crystal of the present invention. Structure 1 is concretely implementable and demonstrates its efficacy. As shown in FIG. 2, the manufacturing method of the present invention comprises the following steps: "Stepping up the light-emitting diode wafer", "attaching the main light-emitting surface of the light-emitting diode wafer to the cutting carrier film" Step 2, Step 3 of "Back Cutting", Step 4 of "Expanding the Cutting Carrier Film", and Step 5 of "Sandblasting". Step 4 "Expanding the cut carrier film" is an optional step. First, go to step 1. A light-emitting diode wafer 10 is provided as shown in Figure 3A. The light-emitting diode wafer 1 is composed of a plurality of the above-described uncut light-emitting diode crystal structures 100. The LED wafer 10 has a plurality of cross-interleaved scribe lines n to define the locations at which the LED structures 100 are formed. Then go to step 2. Referring to FIG. 3A, the main light-emitting surface ill of the photo-polar body B is attached to a cutting carrier film. The cutting carrier film 20 may have a stretchable stretch characteristic, and may be selected from One of UV tape taPe), thermal tape or blue tape. After that, go to step 3. See Figure 3B for a back 9 201041185
切步驟,其係可利用一雷射切割刀3〇由該接合面【η切 入並沿著切割道U之路徑以切穿該發光二極體晶圓 10,以形成該些具有對應發光結構之發光二極體晶粒結 構1〇〇。較佳地,雷射光係不切穿該切割載膜2g,可: 多顆單離之發光二極體晶粒結構1〇〇仍黏附於該切割栽 膜20,並且不會影響後續對該切割載膜2〇之擴膜步驟。 詳細而言,如第3C圖所示,在背切步驟3之後,該些 發光二極體晶粒結構100之該些侧面i 13係顯露出。在 本實施例中,同時在背切步驟3之後,每一發光二極體 晶粒結構1〇〇之該些側面113在接近該接合面112之周 邊係形成有一焦黑之環狀雷射痕152。詳細而言,該環 狀雷射痕152係以雷射光之高能量引起快速加熱來切 除、熔切該發光二極體晶圓1〇時,在該發光二極體晶圓 10之該些切割道u上所產生的損傷,並留下環狀雷射 痕°該環狀雷射痕152會使該些發光二極體晶粒結構1 〇〇 之發光光線被播,而影響發光效率。該環狀雷射痕152 之位置係對應於上述粗化環15丨之位置。由於上述之背 切步驟3係為雷射切割,能以該環狀雷射痕丨52作為該 粗化環151之輪廓。另在後續之喷砂步驟5中同時去除 該粗化環1 5 1之表面黑焦,以形成該粗化環1 5 i。 之後’較佳地可執行步驟4。可參閱第3D圖所示, 對該切割載膜20進行一擴膜步驟,以擴大該些發光二極 體晶粒結構1 〇〇之側面丨丨3之間的間隙,以便於對該些 10 201041185 侧面113進行噴砂處理。在此步驟4中, 爽具與-拉伸平台(圖中未繪出)拉伸該切割載膜20,使 該些發光二極體晶粒結構⑽之間的間隙加大。但該步 驟4係可為省略,w會影響本案之流程進行。 最後,執行步驟5。可參閱第3Ε圖所示,進行一嘴 〇 Ο 砂(鐵步驟,在該切割载膜20保護下,以使該 些側面U3與該接合面112相對於該主發光面"ι更為 粗縫化’以增加非正面之漫反射率。而在該喷砂步驟中 同時去除該粗化環151之表面黑焦,使其為透緑。在 此步驟中,可利用一或複數個喷砂頭4〇對該接合面US 與該些側® 113喷砂,即針對該接合面112與該些侧面 113進行一種破壞性的加工動作,利用加速的細小研磨 砂材顆粒對該接合面112與該些側面113表面衝擊讓 該接合面112與該些側面113產生像顆粒化般的凹陷, 使之形成霧面或侵蝕面,以使該接合面112與該些側面 11 3係為粗糙化,以增加非正面之漫反射率。故該些側 面Π3與該接合面112之粗糙度係可大於該主發光面 11卜該發光二極體晶粒結構1 〇〇由該發光結構〗2〇發出 光線時’射出之光線會在該些粗糙化之側面113、該接 口面112以及該粗化環151產生漫反射,而將光線集中 由該主發光面111射出,達到光聚焦之效果及達到較大 的出光強度。 在進行喷砂步驟之後’可另包含之較佳步驟為:喪失 201041185 或減少該切割載膜20對該主發光面1U之黏性,以便於 取出該些發光二極體晶粒結構100。具體而言,該喪失 或減少切割載膜20之黏性之方法係可包含紫外光照射 或加熱製程,使該切割載膜2〇之黏性降低,而能使切割 載膜10能被剝除而與該主發光面lu分離,得到單離之 該些發光二極體晶粒結構1 〇〇。 請再參閱第丨圖所示,單離後之發光二極體晶粒結構 〇 1〇〇之該些側面n3在接近該接合面112之周邊係形成 有以喷砂處理過之粗化環1 5 1,並且該些側面丨13與該 接合面112係為粗化。故原本黑焦狀之環狀雷射痕1 52 已被喷砂處理而不再黑焦,並且形成為更粗糙化之表面。 詳細而言,如第4A圖所示,未經過喷砂步驟之發光 二極體晶粒結構1 〇〇之該些侧面丨丨3係具有焦黑之環狀 雷射痕152。如第4B圖所示,在經過喷砂步驟之後,具 有焦黑之環狀雷射痕15 2係形成為具有透光性之該粗化 環1 5 1 ’並且該些發光二極體晶粒結構i 〇 〇之該些側面 113與該接合面112(包含電極141、142)係變為粗糙化, 而具有一預定之表面粗糙度。該發光二極體晶粒結構 100由該發光結構120發出光線時,射出之光線會在該 些粗糙化之侧面113與該接合面112產生漫反射,甚至 於該粗化環151亦具有增進漫反射之效果以及增加表面 黏著強度。因此,將光線可更集中由該主發光面111射 出’達到光聚焦之效果及達到較大的出光強度。 12 201041185 、:在本發明之第二具體實施例,揭示另一種增加正面出 光率之發光一極體晶粒結構舉例說明於第$圖之戴面示 思圖’其中與第一實施例相同的主要元件將以相同符號 標不,並具有相同或類似的作用與功效,在此不再予以 夤述。該發光二極體晶粒結構200係具有一主發光面 接《面112、在該主發光面U1與該接合面ιΐ2 之間的複數個侧面113以及—發光結構120,其中該些 Ο側面in與該接合面112係為粗糙化,以增加非正面之 漫反射率。 在本實施例中,該發光二極體晶粒結構2〇〇係可為晶 圓級封裝型態並包含一磊晶基底13〇與一封裝樹脂 260,該封裝樹脂26〇係形成於該磊晶基底13〇上以密 封該發光結構120’其主發光面"【係形成於該封裝樹 脂260上並設有複數個電極141、142’其接合面ιΐ2係 ❹形成於該磊晶基底130。該封裝樹脂260係可藉由模封 技術或印刷技術形成於該磊晶基底13〇上並密封該些發 光結構120與該些電極141與142,而發揮固定以及保 護效果,同時讓光熱向外傳遞。該封裝樹脂26〇係可為 透光材料,其材質可使用環氧樹脂或矽膠等。該封裝樹 脂260内並可進一步包含螢光材料、散光材料或顏料, 而與該些發光二極體晶粒結構1〇〇配合應用,使其可發 出不同顏色之光線。 如第5圖所示,由於該些側面113與該接合面112係 13 201041185 為可增加漫反射率之粗糙化表面,而該些粗糙化表面係 - 可經由一喷砂步驟來達成。如第6圖所示,在喷砂處理 過程中,將該些發光二極體晶粒結構200之該主發光面 ill貼附至該切割載膜20,再利用該些噴砂頭4〇對該接 合面112與該些側面113噴砂,使該接合面112與該些 側面11 3產生像顆粒化般的凹陷與粗化,故能增加非正 面之漫反射率。當該發光二極體晶粒結構2〇〇由該發光 〇 結構120發出光線時,光線會在該些粗糙化之侧面113 與該接合面112產生漫反射效果,而將光線更進一步集 中由該主發光面111射出,達到光聚焦之效果及達到較 大的出光強度。較佳地,該些侧面113在接近該接合面 112之周邊係形成有一粗化環15卜其係透光性並具有大 於該接合面112之粗糙度,用以增加表面黏著強度並增 進側面之漫反射效果,進而增加發光亮度與降低晶粒發 〇 熱。在本實施例中,該粗化環151係形成於該磊晶基底 1 3 0之側緣。 以上所述’僅是本發明的較佳實施例而已,並非對本 發明作任何形式上的限制,雖然本發明已以較佳實施例 揭露如上,然而並非用以限定本發明,任何熟悉本項技 者在不脫離本發明之技術範圍内,所作的任何簡單 修改、等效性變化與修飾,均仍屬於本發明的技術範圍 内。 【圖式簡單說明】 14 201041185 第1圖:為依據本發明之第一具體實施例的一種增加正 面出光率之發光二極體晶粒結構之截面示意 圖。 第2圖:為依據本發明之第一具體實施例的增加正面出 光率之發光二極體晶粒結構之製造方法之流程 圖。 第3 A至3E圖:為依據本發明之第一具體實施例的增加 正面出光率之發光二極體晶粒結構在製程中之 元件截面圖。 第4A至4B圖:為依據本發明之第一具體實施例的增加 正面出光率之發光二極體晶粒結構在噴砂前後 之局部截面放大圖。 第5圖:為依據本發明之第二具體實施例的一種增加正 面出光率之發光二極體晶粒結構之截面示意 圖。 第6圖:為經依據本發明之第二具體實施例的增加正面 出光率之發光二極體晶粒結構在喷砂步驟中之 元件截面圖。 【主要元件符號說明】 1 提供發光二極體晶圓 2 貼附發光二極體晶圓之主發光面至切割載膜 3 背切 4 對切割載膜進行擴膜 5 喷砂 15 201041185 切割道 喷砂頭 側面 10 發光二極體晶圓 11 20 切割載膜 30 雷射切割刀 40 1 00發光二極體晶粒結構 111主發光面 112接合面 113 120發光結構 130磊晶基底 141 電極 142 電極 151粗化環 152環狀雷射痕 200發光二極體晶粒結構 260封裝樹脂a cutting step of cutting the light-emitting diode wafer 10 by cutting the bonding surface [n] and cutting the light-emitting diode wafer 10 by using a laser cutting blade 3 to form the corresponding light-emitting structures The light-emitting diode has a grain structure of 1 Å. Preferably, the laser light does not cut through the cutting carrier film 2g, and: a plurality of isolated light-emitting diode grain structures 1 〇〇 still adhere to the cutting film 20, and the subsequent cutting is not affected. The film expansion step of the carrier film 2〇. In detail, as shown in Fig. 3C, after the back-cutting step 3, the side faces i 13 of the light-emitting diode structure 100 are exposed. In the present embodiment, after the back-cutting step 3, the side faces 113 of each of the light-emitting diode structure 1 are formed with a blackened annular laser mark 152 near the periphery of the bonding surface 112. . In detail, the annular laser mark 152 is formed by cutting the light-emitting diode wafer 10 when the high-energy laser light causes rapid heating to cut and melt the light-emitting diode wafer 1 . The damage generated on the track u leaves an annular laser mark. The annular laser mark 152 causes the light-emitting rays of the light-emitting diode structure to be broadcast, thereby affecting the luminous efficiency. The position of the annular laser mark 152 corresponds to the position of the above-described roughening ring 15丨. Since the above-described back-cutting step 3 is laser cutting, the annular laser trace 52 can be used as the outline of the roughened ring 151. Further, the surface black focus of the roughened ring 151 is simultaneously removed in the subsequent blasting step 5 to form the roughened ring 1 5 i. Thereafter, step 4 is preferably performed. Referring to FIG. 3D, a film expanding step is performed on the cutting carrier film 20 to expand a gap between the side faces 3 of the light emitting diode structure 1 以便 to facilitate the 201041185 Side 113 is sandblasted. In this step 4, the squeezing and stretching platform (not shown) stretches the cutting carrier film 20 to increase the gap between the luminescent diode structures (10). However, this step 4 can be omitted, and w will affect the process of the case. Finally, go to step 5. Referring to Figure 3, a beak sand (iron step under the protection of the cutting carrier 20 is applied to make the side faces U3 and the bonding face 112 thicker relative to the main light emitting face " Sewing 'to increase the non-frontal diffuse reflectance. In the blasting step, the surface black coke of the roughened ring 151 is simultaneously removed to make it transparent. In this step, one or more blastings may be utilized. The head 4 喷 blasting the joint surface US and the side surfaces 113, that is, performing a destructive processing operation on the joint surface 112 and the side surfaces 113, using the accelerated fine abrasive sand particles to the joint surface 112 The surface impact of the side surfaces 113 causes the joint surface 112 and the side surfaces 113 to have a granulation-like depression to form a matte surface or an erosive surface, so that the joint surface 112 and the side surfaces 11 3 are roughened. In order to increase the non-frontal diffuse reflectance, the roughness of the side faces 3 and the joint surface 112 may be greater than the main light emitting surface 11 and the light emitting diode grain structure 1 is emitted by the light emitting structure. When the light is shining, the light that is emitted will be on the roughened side 113, the The mouth surface 112 and the roughening ring 151 generate diffuse reflection, and concentrate the light from the main light-emitting surface 111 to achieve the effect of light focusing and achieve a large light-emitting intensity. The preferred step is: loss of 201041185 or reducing the viscosity of the cutting carrier film 20 to the main light-emitting surface 1U, so as to take out the light-emitting diode structure 100. Specifically, the loss or reduction of the cutting carrier film 20 The viscous method may include an ultraviolet light irradiation or a heating process to reduce the viscosity of the cutting carrier film 2, so that the cutting carrier film 10 can be stripped and separated from the main light-emitting surface lu, thereby obtaining a single separation. The light-emitting diodes have a grain structure of 1 〇〇. Please refer to the second figure, the side surfaces n3 of the light-emitting diode structure 单1 在 are close to the periphery of the joint surface 112. The roughened ring 15 1 is formed by sandblasting, and the side turns 13 and the joint surface 112 are roughened. Therefore, the original black focal ring-shaped laser mark 1 52 has been sandblasted. Instead of black focus, and formed into a rougher surface. As shown in FIG. 4A, the side faces 3 of the light-emitting diode structure 1 that have not been subjected to the sandblasting step have a blackened annular laser mark 152. As shown in FIG. 4B, After the blasting step, the annular black laser traces 15 2 having the blackening are formed into the light-transmissive roughening ring 15 1 ' and the side surfaces 113 of the light-emitting diode grain structures i 〇〇 The bonding surface 112 (including the electrodes 141, 142) is roughened to have a predetermined surface roughness. When the light emitting diode structure 100 emits light from the light emitting structure 120, the emitted light will be The roughened side surface 113 and the joint surface 112 generate diffuse reflection, and even the roughened ring 151 has the effect of enhancing diffuse reflection and increasing surface adhesion strength. Therefore, the light can be more concentrated from the main light-emitting surface 111 to achieve the effect of light focusing and to achieve a large light-emitting intensity. 12 201041185, in the second embodiment of the present invention, another light-emitting one-pole crystal structure for increasing the front light-emitting rate is disclosed in the wearing diagram of the first figure, which is the same as the first embodiment. The main components will be denoted by the same symbols and have the same or similar functions and effects, and will not be further described herein. The light emitting diode structure 200 has a main light emitting surface connected to the surface 112, a plurality of side surfaces 113 between the main light emitting surface U1 and the bonding surface ι 2, and a light emitting structure 120, wherein the side surfaces in and The joint surface 112 is roughened to increase the non-frontal diffuse reflectance. In this embodiment, the LED structure 2 can be a wafer level package and includes an epitaxial substrate 13A and a package resin 260. The encapsulation resin 26 is formed on the Lei The crystal substrate 13 is formed on the epitaxial substrate 130 to seal the light-emitting structure 120', and the main light-emitting surface is formed on the encapsulating resin 260 and is provided with a plurality of electrodes 141, 142'. . The encapsulating resin 260 can be formed on the epitaxial substrate 13 by a molding technique or a printing technique, and seals the light emitting structures 120 and the electrodes 141 and 142 to provide a fixing and protection effect, and at the same time, let the light heat outward. transfer. The encapsulating resin 26 may be a light transmissive material, and an epoxy resin or silicone rubber may be used as the material. The encapsulating resin 260 may further comprise a fluorescent material, a astigmatism material or a pigment, and is used in combination with the light-emitting diode structure to emit light of different colors. As shown in Fig. 5, since the side faces 113 and the joint faces 112 are 13 201041185, they are roughened surfaces which can increase the diffuse reflectance, and the roughened surface systems can be achieved through a sand blasting step. As shown in FIG. 6, during the blasting process, the main light-emitting surface ill of the light-emitting diode structure 200 is attached to the cutting carrier film 20, and the blasting heads 4 are used to The joint surface 112 and the side surfaces 113 are sandblasted to cause granulation-like depression and coarsening of the joint surface 112 and the side surfaces 113, so that the diffuse reflectance of the non-front surface can be increased. When the light emitting diode structure 2 发出 emits light from the luminescent structure 120, the light will have a diffuse reflection effect on the roughened side 113 and the bonding surface 112, and the light is further concentrated by the The main light-emitting surface 111 is emitted to achieve the effect of light focusing and to achieve a large light-emitting intensity. Preferably, the side surfaces 113 are formed near the periphery of the joint surface 112 to form a roughening ring 15 which is light transmissive and has a roughness greater than the joint surface 112 for increasing the surface adhesion strength and enhancing the side surface. Diffuse reflection effect, which in turn increases the brightness of the light and reduces the heat of the grain. In this embodiment, the roughening ring 151 is formed on a side edge of the epitaxial substrate 130. The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention. Any simple modifications, equivalent changes and modifications made by those skilled in the art without departing from the technical scope of the present invention are still within the technical scope of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS 14 201041185 FIG. 1 is a schematic cross-sectional view showing a crystal structure of a light-emitting diode which increases a front surface light transmittance according to a first embodiment of the present invention. Fig. 2 is a flow chart showing a method of manufacturing a light-emitting diode grain structure for increasing front side light transmittance according to a first embodiment of the present invention. 3A to 3E are cross-sectional views showing the elements of the light-emitting diode structure in which the front light-emitting rate is increased in accordance with the first embodiment of the present invention. 4A to 4B are partial cross-sectional enlarged views of the light-emitting diode structure of the front side light-emitting rate according to the first embodiment of the present invention before and after blasting. Fig. 5 is a schematic cross-sectional view showing a crystal structure of a light-emitting diode which increases the front surface light-emitting rate according to a second embodiment of the present invention. Fig. 6 is a cross-sectional view showing the element of the light-emitting diode structure in which the front side light-emitting rate is increased in the sand blasting step according to the second embodiment of the present invention. [Description of main component symbols] 1 Providing a light-emitting diode wafer 2 Attaching the main light-emitting surface of the light-emitting diode wafer to the cutting carrier film 3 Back-cutting 4 Spreading the cutting carrier film 5 Sandblasting 15 201041185 Cutting road spraying Sand head side 10 Light-emitting diode wafer 11 20 Cutting carrier film 30 Laser cutting blade 40 1 00 Light-emitting diode grain structure 111 Main light-emitting surface 112 Bonding surface 113 120 Light-emitting structure 130 Epitaxial substrate 141 Electrode 142 Electrode 151 Roughening ring 152 annular laser mark 200 light-emitting diode grain structure 260 encapsulation resin
1616
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TW98114763A TW201041185A (en) | 2009-05-04 | 2009-05-04 | LED chip for increasing front light emitting rate and its fabricating method |
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TW98114763A TW201041185A (en) | 2009-05-04 | 2009-05-04 | LED chip for increasing front light emitting rate and its fabricating method |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI514622B (en) * | 2013-02-19 | 2015-12-21 | Lextar Electronics Corp | Led chip and method for manufacturing the same |
TWI643267B (en) * | 2014-02-13 | 2018-12-01 | 日商艾普凌科有限公司 | Semiconductor device and method of manufacturing the same |
TWI706579B (en) * | 2013-11-18 | 2020-10-01 | 晶元光電股份有限公司 | Light emitting apparatus and manufacturing method thereof |
-
2009
- 2009-05-04 TW TW98114763A patent/TW201041185A/en unknown
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI514622B (en) * | 2013-02-19 | 2015-12-21 | Lextar Electronics Corp | Led chip and method for manufacturing the same |
TWI706579B (en) * | 2013-11-18 | 2020-10-01 | 晶元光電股份有限公司 | Light emitting apparatus and manufacturing method thereof |
TWI711190B (en) * | 2013-11-18 | 2020-11-21 | 晶元光電股份有限公司 | Light emitting apparatus and manufacturing method thereof |
TWI755825B (en) * | 2013-11-18 | 2022-02-21 | 晶元光電股份有限公司 | Light emitting apparatus |
TWI643267B (en) * | 2014-02-13 | 2018-12-01 | 日商艾普凌科有限公司 | Semiconductor device and method of manufacturing the same |
US10236269B2 (en) | 2014-02-13 | 2019-03-19 | Ablic Inc. | Semiconductor device having semiconductor chip with large and small irregularities on upper and lower side surface portions thereof |
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