TW201032110A - Ghost image detection method of capacitive touch panel - Google Patents

Ghost image detection method of capacitive touch panel Download PDF

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Publication number
TW201032110A
TW201032110A TW98105214A TW98105214A TW201032110A TW 201032110 A TW201032110 A TW 201032110A TW 98105214 A TW98105214 A TW 98105214A TW 98105214 A TW98105214 A TW 98105214A TW 201032110 A TW201032110 A TW 201032110A
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TW
Taiwan
Prior art keywords
trace
capacitance value
signal
ghost
direction trace
Prior art date
Application number
TW98105214A
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English (en)
Chinese (zh)
Other versions
TWI377499B (enExample
Inventor
Po-Hao Kuo
Hsin-Shieh Tsai
Min-Jhih Lin
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Elan Microelectronics Corp
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Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Priority to TW98105214A priority Critical patent/TW201032110A/zh
Priority to US12/649,779 priority patent/US8619056B2/en
Publication of TW201032110A publication Critical patent/TW201032110A/zh
Application granted granted Critical
Publication of TWI377499B publication Critical patent/TWI377499B/zh

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TW98105214A 2009-01-07 2009-02-19 Ghost image detection method of capacitive touch panel TW201032110A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW98105214A TW201032110A (en) 2009-02-19 2009-02-19 Ghost image detection method of capacitive touch panel
US12/649,779 US8619056B2 (en) 2009-01-07 2009-12-30 Ghost resolution for a capacitive touch panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98105214A TW201032110A (en) 2009-02-19 2009-02-19 Ghost image detection method of capacitive touch panel

Publications (2)

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TW201032110A true TW201032110A (en) 2010-09-01
TWI377499B TWI377499B (enExample) 2012-11-21

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TW98105214A TW201032110A (en) 2009-01-07 2009-02-19 Ghost image detection method of capacitive touch panel

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TW (1) TW201032110A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI454995B (zh) * 2011-08-11 2014-10-01 Wistron Corp 光學式觸控裝置及其偵測觸控點座標之方法
TWI463358B (zh) * 2010-05-07 2014-12-01 Silicon Integrated Sys Corp 用於多點觸控感測裝置之鬼點去除方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI463358B (zh) * 2010-05-07 2014-12-01 Silicon Integrated Sys Corp 用於多點觸控感測裝置之鬼點去除方法
TWI454995B (zh) * 2011-08-11 2014-10-01 Wistron Corp 光學式觸控裝置及其偵測觸控點座標之方法

Also Published As

Publication number Publication date
TWI377499B (enExample) 2012-11-21

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