TW201031009A - Manufacturing method of solar cell - Google Patents

Manufacturing method of solar cell Download PDF

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TW201031009A
TW201031009A TW098104015A TW98104015A TW201031009A TW 201031009 A TW201031009 A TW 201031009A TW 098104015 A TW098104015 A TW 098104015A TW 98104015 A TW98104015 A TW 98104015A TW 201031009 A TW201031009 A TW 201031009A
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Taiwan
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solar cell
wafer
acid
manufacturing
substrate
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TW098104015A
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Chinese (zh)
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TWI385813B (en
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Yoichiro Nishimoto
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Mitsubishi Electric Corp
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

This invention is a manufacturing method of a high efficiency solar cell using a simple manufacturing process. This manufacturing method is applicable in producing solar cell of textured silicon substrate surface. This manufacturing method comprises the following steps: step 1, submerging a silicon substrate into an aqueous solution which is a mixture of oxidant metal ion and hydrofluoric acid, and forming a porous layer on the surface of the aforementioned silicon substrate; step 2, submerging the surface of the aforementioned silicon substrate after processed in step 1 into a mixture of mainly hydrofluoric acid and nitric acid and etching to form texture.

Description

201031009 Η 六、發明說明: :【發明所屬之技術領域】 本發明是關於矽太陽能電池的製造方法.,特別是關於 用於在梦基板的表面形成微小的凹凸(織構)的方法。 【先前技術】 習知,為了抑制表面反射’而在太陽能電池的表面形 成微小的凹凸。由於此微小的凹凸,入射光受到多重反射, 而有效地為太陽能電池内部所吸收。此微小的凹凸稱為織 構(texture)。 一般在單晶矽太陽能電池中,是藉由使用NaOH、KOfi 等的鹼性水溶液與異丙醇(is〇pr〇pyl alc〇h〇1 ; ιρΑ)的溼 蝕刻來形成織構。由於此技術是利用結晶面的蝕刻速度的 差,對於如單晶矽的狀態的晶圓是由單一結晶面所構呈的 情況是有效’但是對於如多晶矽的狀態是在平面内存在各 _ 種結晶面的情況’則無法充分地降低反射率。 因此,正在研究機械性加工法(例如專利文獻1)或反 應性離子_法(例如專敎獻2)等的對結晶面方位無依 存性的織構形成方法。使用機械性加工法的情況為了作薄 片加工(sheet processing)、而使用反應性離子蝕刻法的 情況為了使用可以將一定程度的片數—起加工的真空裝 置’其問題在於會耗費相當的加工成本。 在此處,一種形成織構的方法(專利文獻3),已被提 *專利申請’其是將矽基板浸溃於含金屬離子的氧化劑與201031009 Η 发明 发明 发明 发明 发明 发明 发明 发明 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 [Prior Art] Conventionally, in order to suppress surface reflection ', minute irregularities are formed on the surface of a solar cell. Due to this minute unevenness, the incident light is subjected to multiple reflections and is effectively absorbed inside the solar cell. This tiny bump is called a texture. Generally, in a single crystal germanium solar cell, the texture is formed by wet etching using an alkaline aqueous solution of NaOH, KOfi or the like and isopropyl alcohol (is〇pr〇pyl alc〇h〇1; ιρΑ). Since this technique utilizes the difference in etching speed of the crystal face, it is effective for a case where a wafer such as a single crystal germanium is constituted by a single crystal face, but for a state such as polysilicon, there are various types in the plane. In the case of the crystal face, the reflectance cannot be sufficiently reduced. Therefore, a texture forming method which does not depend on the crystal plane orientation, such as a mechanical processing method (for example, Patent Document 1) or a reactive ion method (for example, 2), is being studied. In the case of using a mechanical processing method, in order to perform sheet processing and a reactive ion etching method, in order to use a vacuum apparatus capable of processing a certain number of sheets, the problem is that considerable processing cost is required. . Here, a method of forming a texture (Patent Document 3) has been proposed. * Patent application' is a method of immersing a ruthenium substrate with a metal ion-containing oxidant and

2111-10310-PF 3 201031009 風氟酸的混合水溶液’而在基板表面形成一多孔質石夕層, 之後再浸潰於鹼性液體而形成織構。與其關連者,在已有 金屬附著的矽完成孔洞(pit )的原理則揭示於專利文獻4。 專利文獻1 :曰本專利第3189201號公報 專利文獻2 :日本專利公開特開平〇 9 -1 〇 2 6 2 5號公報 專利文獻3 :日本專利第3925867號公報 專利文獻4 :日本專利公開特開2 0 〇 4 - 71 6 2 6號公報 【發明内容】 I發明所欲解決的問題】 然而,具有根據專利文獻3所提出的方法所製作的多 孔質碎層妁矽基板’雖然顯示出低反射率的值,但是晶圓 表面發生變色’且未顯示矽的清淨面的特性之疏水性。一 般認為其理由在於此方法不僅僅在矽表面形成孔洞,還使 梦表面變質。 還有’為了徐去附著的銀’將此晶圓浸漬於6〇%硝酸 一小時之後,使用此晶圓製成太陽能電池單元,並作特性 的評判,而瞭解到與使用以鹼性水溶液與異丙醇所形成的 織構(以下簡稱為「驗蝕刻織構」)的太陽能電池比較,其 特性大幅地劣化。其原因在於,一般認為即使經過浸潰於 60%硝酸一小時的製程,仍無法完全除去金屬,而此金屬會 在太陽能電池製作製程中擴散而降低結晶品質,因此太陽 能電池的特性會大幅劣化。 ♦- 因此’為了使用含金屬離子的氧化劑與氫氟酸來製成 211M0310-PF 4 201031009 多孔質石夕層的手法來有效地完成太陽能電池,面臨的問題 是需要一製程,其在形成多孔質矽層之後,暴露矽的清淨 面並除去殘留的金屬。 有鑑於此’本發明的.目的在於達成高特性的太陽能電 池的製造方法’其是使用含金屬離子的氧化劑與氫氟酸來 製成多孔質矽層之後,暴露矽的清淨面並除去殘留的金屬。 【用以解決問題的手段】2111-10310-PF 3 201031009 A mixed aqueous solution of fluorofluoric acid' forms a porous layer on the surface of the substrate, and then is immersed in an alkaline liquid to form a texture. The principle of completing the hole (pit) in the metal-attached crucible is disclosed in Patent Document 4. Patent Document 1: Japanese Patent Laid-Open No. 3189201 Patent Document 2: Japanese Patent Laid-Open Publication No. Hei No. Hei 9 - 1 No. 2 6 2 5 Patent Document 3: Japanese Patent No. 3925867 Patent Document 4: Japanese Patent Publication No. 2 0 〇 4 - 71 6 2 6 SUMMARY OF THE INVENTION PROBLEMS TO BE SOLVED BY THE INVENTION 1. However, the porous fracture layer ruthenium substrate produced by the method proposed in Patent Document 3 exhibits low reflection. The value of the rate, but the surface of the wafer is discolored, and the hydrophobicity of the characteristics of the clean surface of the crucible is not shown. The reason is generally considered to be that this method not only forms holes in the surface of the crucible, but also degrades the surface of the dream. In addition, the wafer was immersed in 6〇% nitric acid for one hour after the silver was attached, and the wafer was fabricated into a solar cell unit, and the characteristics were judged, and it was learned and used with an alkaline aqueous solution. The solar cell of the texture formed by isopropyl alcohol (hereinafter simply referred to as "etching texture") is greatly deteriorated in characteristics. The reason for this is that it is generally considered that even after the process of immersing in 60% nitric acid for one hour, the metal cannot be completely removed, and the metal diffuses in the solar cell fabrication process to lower the crystal quality, so that the characteristics of the solar cell are greatly deteriorated. ♦- Therefore, in order to use the oxidant containing metal ions and hydrofluoric acid to make 211M0310-PF 4 201031009 porous stone layer to effectively complete the solar cell, the problem is that a process is required, which is in the formation of porous After the enamel layer, the cleaned surface of the crucible is exposed and the residual metal is removed. In view of the present invention, a method for manufacturing a solar cell having high characteristics is to use a metal ion-containing oxidizing agent and hydrofluoric acid to form a porous layer, and to expose the clean surface of the crucible and remove the residual layer. metal. [Means to solve problems]

為了解決上述的問題雨達成上述目的,本發明是在石夕 基板的表面具有織構(texture)的太陽能電池的製造方 法,其特徵在於包含下列步驟:第一步驟,將一矽基板浸 潰於含金屬雜子的氧化劑與氫氟酸的混合水溶液,而在上 述矽基板的表面形成一多孔質層;以及第二步驟,將已經 過生述第一步驟的上述矽基板的表面浸潰於以氯:氟酸及硝 酸為主的混合酸而進行蝕刻,而形成識構。 I發明的效果】 若是藉由本發明,以氲氟酸及硝酸為主體的混合酸, 將使用金屬離子的多孔質層㈣為不致失去減低反射率的 效果的程度,藉此可保留反射率的減低效果並得到清淨的 梦表面,還可㈣去孔職料金屬,因此達成可製造高 Γ的太陽能電池的效果。另外’由”時實韻刻與金 屬的除去,而達成製程簡單化的效果。 【實施方式】 和優點能更明 為讓本發明之上述和其他目的、特徵In order to solve the above problems, the present invention achieves the above object, and is a method for manufacturing a solar cell having a texture on the surface of a stone substrate, which comprises the following steps: a first step of immersing a substrate in a substrate a mixed aqueous solution of a metal-containing hetero oxidant and hydrofluoric acid to form a porous layer on the surface of the ruthenium substrate; and a second step of immersing the surface of the ruthenium substrate having undergone the first step of the process Etching is carried out by etching a mixed acid mainly composed of chlorine: fluoric acid and nitric acid to form an identifiable structure. According to the present invention, the porous layer (tetrazed) using metal ions is a mixed acid mainly composed of fluoric acid and nitric acid, so that the effect of reducing the reflectance is not lost, whereby the decrease in reflectance can be retained. The effect is to get a clean dream surface, and (4) to remove the metal from the hole, thus achieving the effect of manufacturing a solar cell with high sorghum. In addition, the effect of simplification of the process is achieved by the removal of the true rhyme and the metal. [Embodiment] and advantages can be made clear for the above and other objects and features of the present invention.

2111-10310-PF 5 201031009 顯易懂,下文特舉出較佳眚 平又佳貫施例,並配合所附圖式,作 細說明如下: 在本說明書中,在數值相關敘述後接「以上」、「以 下」之騎敘述數值範圍的情況中,除非另有加註,相關 的數值範圍是包含上述「以上」、「以下」之詞前接的教 值。 【用以實施發明的最佳形態】 本案諸位發明人是根據專利文獻3所記載的實施例來 製成織構’並對其特性進行評判,而找出專利文獻3的手 法的問題點。首先敘述根據專利文獻3的實施例所實施的 詳細步驟與問題點。 首先,本案諸位發明人是準備多晶石夕基板,其已除去 從塊材切割出來時所產生的揚傷I,然後以含(1E-4)m (M’l/L)的銀離子妁過氧化氫與氫氟酸的混合水溶液進 行钮刻。第5圖蚤#+ S Η! ΛΑ ^ , 固疋對曰曰圓的下半部已受到蝕刻的試片所拍 攝的照片。’另外,笙β .面β β 第6圖疋顯示反射率的測定結果的曲線 圖如第6圖所不,藉由上述姓刻而形成多孔質層的部分 的反射率的值,低於驗㈣織構處理m的反射率;但 是如第5圖所不,晶圓表面變色,而未顯示碎的清淨面的 特性之疏水性D其从2111-10310-PF 5 201031009 It is easy to understand, the following is a better example of the best and better, and with the accompanying drawings, the following is a detailed description: In this specification, after the numerical description, the above In the case of the range of the following descriptions of the "following", unless otherwise noted, the relevant numerical range is the value of the preceding words including the above "above" and "below". [Best Mode for Carrying Out the Invention] The inventors of the present invention have made a texture according to the embodiment described in Patent Document 3 and judged the characteristics thereof, and found the problem of the technique of Patent Document 3. First, detailed steps and problems to be implemented according to the embodiment of Patent Document 3 will be described. First, the inventors of the present invention prepared a polycrystalline substrate which removed the damage I generated when cutting out from the bulk, and then contained silver ions containing (1E-4) m (M'l/L). A mixed aqueous solution of hydrogen peroxide and hydrofluoric acid is used for button etching. Figure 5 蚤#+ S Η! ΛΑ ^ , a photograph taken of a test piece that has been etched on the lower half of the circle. 'In addition, 笙β. Surface ββ Fig. 6 shows a graph showing the measurement result of the reflectance as shown in Fig. 6, and the value of the reflectance of the portion where the porous layer is formed by the above-mentioned surname is lower than the test. (4) The reflectivity of the texture processing m; but as shown in Fig. 5, the surface of the wafer is discolored, and the hydrophobicity D of the characteristic of the broken clean surface is not shown.

另外’之後以1 %的氫氧'化納水溶液進行1 〇 刀鐘的钱刻,但是晶圓表面即使經過除去自然氧化膜的HF :淨步驟’仍未顯示疏水性。根據形成多孔質層後無法在 曰曰圓表面传到疏水面的情況,可認為是不僅值在矽晶圓形 成孔洞#使表面的梦變質而即使施以驗姓刻仍無法除Further, after that, a 1% hydrogen hydroxide aqueous solution was used to carry out a 1 knives clock, but the surface of the wafer did not show hydrophobicity even after passing through the HF:net step of removing the natural oxide film. According to the case where the porous layer cannot be transported to the hydrophobic surface after the formation of the porous layer, it can be considered that not only the value of the twin crystal is formed into a hole, but the surface of the dream is deteriorated, and even if the surname is applied, it cannot be removed.

2111-10310-PF 201031009 去變質的矽。 還有’本案諸位發明人為了除去附著的銀,將此晶圓 浸潰於60%硝骏1小時之後,實施第7圖所示的步驟,而 從此晶圓製作出太陽能電池(單元尺寸:2x2cm)。在第7圖 中’,為了形成PN接合而進行熱擴散處理(步驟。接下 來使用電衆成長裝置,在晶圓表面蒸鍍作為抗反射膜的氮 化矽膜(步驟S12)。接下來進行電極印刷(步驟si3)、燒結 而使電極附著(步驟S14),而製成太陽能電池。 第8圖為一曲線圖,用以說明以上所製成的太陽能電 池的短路光電流密度Jsc。另外,在第8圓中亦顧示作為 比較對象的應用鹼蝕刻織構處理的太陽能電池的特性。其 結果瞭解到,由本案諸位發明人如上所製成的太陽能電池 的·性’比鹼蝕刻織構電池單元的特性大幅地务化,而以 引也3所揭露的原本技術所製的太陽電池則在使用方面會 有問題。 在半導體裝製的製造中,芸盔 T 右“、、法付到至少顯示出梦的 请淨面的特性之疏水性的%择 茳的程度的π淨面,就無法製造高品 質的太陽能電池。專利令啦q 寻利文獻3所揭露的手法中,即使施以 專利'文獻3的請求項3μ 項所扣出的鹼蝕刻,仍無法使晶圓得 到疏水性。例如,芸耕曰圓认 若對阳圓的1 β m的多孔質層以鹼液蝕刻 當然可以得到疏水面,但是會完全除去多孔質層, 而僅能得到與檢㈣織構相同等級的反射率,而失去了減 低反射率的效果。 「金屬在梦基板表面析 另外,在專利文獻3中僅揭露2111-10310-PF 201031009 Deterioration of deterioration. In addition, in order to remove the adhered silver, the inventors of the present invention immersed the wafer in 60% of the niobium for 1 hour, and then performed the steps shown in Fig. 7, and fabricated a solar cell from the wafer (unit size: 2x2 cm). ). In Fig. 7, 'the thermal diffusion treatment is performed in order to form the PN junction (step. Next, a tantalum nitride film as an antireflection film is deposited on the surface of the wafer using a battery growth device (step S12). Electrode printing (step si3), sintering to adhere the electrode (step S14), and forming a solar cell. Fig. 8 is a graph for explaining the short-circuit photocurrent density Jsc of the solar cell fabricated above. In the eighth circle, the characteristics of the solar cell to which the alkali etching texture treatment is applied are also considered. As a result, it is understood that the solar cell of the above-mentioned inventors of the present invention has a 'skin' ratio than the alkali etching texture. The characteristics of the battery unit have been greatly improved, and the solar battery manufactured by the original technology disclosed in Japanese Patent Application No. 3 has problems in use. In the manufacture of the semiconductor package, the helmet T is right, and the method is paid. It is impossible to produce a high-quality solar cell by showing at least the π clean surface of the degree of hydrophobicity of the characteristics of the dream. The patent is the method disclosed in the literature. The alkali etching etched by the 3μ item of the patent 'Document 3' still fails to make the wafer hydrophobic. For example, the 芸 曰 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认 认Etching can of course obtain a hydrophobic surface, but the porous layer can be completely removed, and only the same level of reflectivity as that of the (four) texture can be obtained, and the effect of reducing the reflectance is lost. "The metal is deposited on the surface of the dream substrate. Only disclosed in Document 3

2111-10310-PF 201031009 出」「欲移除殘留在表面的銀」。然而,揭露以氣酸钱 刻已附著金屬的矽的專利文獻4中,是揭露附著金屬的部 分及其周邊受到蝕刻’也就是藉由金屬就宛如鑽孔一般地 在矽基板開孔的機制而受到蝕刻。因此,可以說是如果使 用專利文獻3的手法,會殘留在孔洞底部析出的金屬由 於此金屬會在製作太陽能電池的製程中擴散而使結晶品質 降低,而大幅地劣化太陽能電池的特性。第8圖所示的内 部量子效率中,感度降低為8〇〇~12〇〇nffi而反應結晶品質 亦說明了此一情況。 如此一來,使用專利文獻3的實施例所記載的方法, 金.屬會析出而存在於晶面的孔洞底部。為了使上述晶圓不 致失艾·降低反射率的效果的程度,而以鹼液除去多孔質, 儘管如此,以酸除去孔洞底部的金屬是極困難的—件事。 其原因在於,若是.驗蝕刻:的程度不夠,藥液(酸)就難以觸 及孔洞的底部’而因此難以除去金屬;或者若是為了容易 除去金屬而增加鹼蝕刻的量,蝕刻速度因結晶面而不同之 餘蝕刻的特性就變得顯著,而與鹼蝕刻織構處理比較時, 就失去降低反射率的效果。還有,假.如以檢液除去多孔質 而不致失去降低反射率的效果的叙度、且以其後的酸處理 可以除去孔洞底部的金屬,即便如此,除去多孔質層與除 去金屬為二個必要的步驟,而使製造的製程複雜化。 在此處,提出以一個步驟進行除去多孔質舆除去金屬 而可以.得到低反射率且清淨的晶圓表面的太陽能電池的製 造方法,作為本發明的實施形態。以下,具體地說明本發2111-10310-PF 201031009 " "To remove silver remaining on the surface". However, in Patent Document 4, which discloses a ruthenium which has been adhered to a metal, it is revealed that the metal-attached portion and its periphery are etched, that is, a mechanism for opening a hole in the ruthenium substrate by a metal as a hole. Etched. Therefore, it can be said that if the method of Patent Document 3 is used, the metal which remains in the bottom of the hole is diffused in the process of producing the solar cell, and the crystal quality is lowered, and the characteristics of the solar cell are largely deteriorated. In the internal quantum efficiency shown in Fig. 8, the sensitivity is lowered to 8 〇〇 to 12 〇〇 nffi and the reaction crystallization quality also illustrates this. As a result, in the method described in the examples of Patent Document 3, the genus of gold is precipitated and exists at the bottom of the pore of the crystal face. In order to prevent the above-mentioned wafer from being dissipated and to reduce the effect of the reflectance, the porous body is removed by the alkali solution. However, it is extremely difficult to remove the metal at the bottom of the hole by acid. The reason is that if the degree of etching is insufficient, the chemical liquid (acid) hardly touches the bottom of the hole 'and thus it is difficult to remove the metal; or if the amount of alkali etching is increased for easy removal of the metal, the etching speed is due to the crystal face The characteristics of the etching are remarkable when they are different, and the effect of lowering the reflectance is lost when compared with the alkali etching texture processing. Further, if the porous material is removed by the test liquid without losing the effect of lowering the reflectance, and the metal at the bottom of the hole can be removed by the subsequent acid treatment, even if the porous layer is removed and the metal is removed, A necessary step to complicate the manufacturing process. Here, a method for producing a solar cell having a low reflectance and a clean wafer surface by removing the porous ruthenium removing metal in one step is proposed as an embodiment of the present invention. The following is a detailed description of the hair

2111-10310-PF 8 201031009 明之太陽能電池的製造方法的實施形態。然而,本發明並 不受限於這些實施形態。 實施形態1 接下來說明本發明相關實施形態1的太暢能電池的製 造方法。第1圖為一流程圖,用以說明本實施形態的製造 方法。以下’根據第1圖的流程圖來說明本實施形態的太 陽能電池的製造方法。 ❿準備P型多晶石夕晶圓(摻雜、1〜3 Ω cm、15 X15 cm角、 厚度280# m)。由於多晶矽晶圓的製造是由熔融的矽冷卻 固化而元成的鎢錠(ing〇t)經由線鋸(wire saw)而切片 (slice),其表面殘留切片時的損傷。首先,以鹼液除去此 損傷層。之後,在氟酸、過氧化氫、水的混合藥液中添加 硝纖銀水溶液,而得到具有既定銀離子濃度(以吓以[蜍+] 來敘述)的藥液。將晶圓浸潰於上述藥液中,而在其表面形 成多孔質層(步驟S1) »實際上,是將HF (50%):H2〇2 籲(60%):H2〇:AgN〇3(〇. lM)=400ml : 200ml: 1 600 ml : 4. 4ml '(U g + Μ 2E - 4) Μ)的藥液置入槽内,晶圓是以直'立在槽内的 狀態,進行3分鐘的钮刻。此時所形成的多孔質層示於第 2圖。 、本次是將晶圓收納於晶圓匣(cassette)而以直立的; 〜、形成^孔質層’但是將晶圓水平地置於墊狀的扁平容 而進行姓刻,亦可以形成多孔質層。减,如上述一般― 成多孔質層的情、节 尽町匱况,蝕刻時所產生的氫會受阻而聚隼 圓下而使下矣;* 的蝕刻均一性較差,因此較好為以蝕刻t2111-10310-PF 8 201031009 An embodiment of a method for producing a solar cell. However, the present invention is not limited to these embodiments. (Embodiment 1) Next, a method of manufacturing a Taichung battery according to Embodiment 1 of the present invention will be described. Fig. 1 is a flow chart for explaining the manufacturing method of the embodiment. Hereinafter, a method of manufacturing a solar battery according to the present embodiment will be described based on the flowchart of Fig. 1. ❿ Prepare P-type polycrystalline wafers (doping, 1~3 Ω cm, 15 X15 cm angle, thickness 280# m). Since the polycrystalline germanium wafer is manufactured by cooling and solidifying a molten tungsten crucible, a tungsten ingot is sliced through a wire saw, and the surface thereof is damaged during slicing. First, the damaged layer is removed with an alkali solution. Thereafter, a silver nitrate aqueous solution is added to a mixed chemical solution of hydrofluoric acid, hydrogen peroxide, and water to obtain a chemical solution having a predetermined silver ion concentration (described by scarring [蜍+]). The wafer is immersed in the above liquid solution to form a porous layer on the surface thereof (step S1) » Actually, HF (50%): H2 〇 2 (60%): H2 〇: AgN 〇 3 (〇. lM)=400ml : 200ml: 1 600 ml : 4. 4ml '(U g + Μ 2E - 4) Μ) The liquid is placed in the tank, and the wafer is straight in the tank. Make a 3-minute button. The porous layer formed at this time is shown in Fig. 2. In this case, the wafer is stored in a cassette and is erected. The layer is formed by placing the wafer horizontally in a mat-like flat shape. Quality layer. Subtraction, as described above - in the case of a porous layer, the conditions of the end of the layer, the hydrogen generated during the etching will be blocked and the sputum will be rounded down to make the squat; * the etching uniformity is poor, so it is better to etch t

2111-10310-PF 201031009 朝上的表面作為受光面來製作太陽能電池。 實施步驟si之後,經過上述晶圓的水洗、乾燥(步驟 S2)’在不致失去降低反射率的效果的程度,使用以氫氟酸 及硝酸為主體的混合酸進行晶圓表面的蝕刻(步驟S3)。實 際上疋使用容量比為HF(5〇%):HN〇3(69%):H2〇 = 1 :9 :15的混 合酸進行3分鐘的蝕刻。 本-人疋將藥液置入墊狀的扁平容器而水平 -- — 〜处曰曰 圓,但是要在藥液中搖動晶圓,使得在餘刻過程中不會發 生藥液痕度不均。在此處也會因钮刻時所產生的氯受阻而 聚集在晶圓下而使下表面的银刻均一性較差,因此較好為 蝕刻時朝上的表面作為受光面來製作太陽能電池。當 然’亦可將晶圓置入晶圓匿,而以直立的狀態進行钱刻。 =近在藥液中水平運送晶圓的蝕刻裝置已在販賣, =重要的疋.使用此類的裝置實施本技術的情況中以蝕刻 的上表面作為太陽能電池的受光面;還有以藥液的撲 韻等均—地進行㈣,⑽㈣的樣式( 行㈣、或晶圓不置,入晶_而在藥液中水平運 送來進行蝕刻)為何。 氧化之後,進行水洗(步驟⑷,接下來以胸氨 酸㈣石^10秒㈣刻(步驟S5)°以氨氣酸及硝 他ΓΓ因為所使用的氯氣酸及確酸的藥液比例與其 膜則稱為ΓΓ晶圓表面變色的情況。成為變色原因的薄 確酸兔 )料。如步驟S3之藉由Μ氟酸及 为酸為主體的混合酸來蝕刻多 買層的情況,會有在晶圓 2111-1〇3 j〇.pp 201031009 表面形成此染色膜的情形。在步驟55中,是以除去此染色 膜為目的,進行使用1%的氫氧化鈉水溶液的蝕刻。在此處 是在室温使用1%的氫氧化鈉水溶液,但只要是鹼性的水溶 液則不拘泥藥液的種類。鹼性水溶液的濃度最大為5%左 右、藥液溫度在室溫左右即可。 步驟S5之後,若是水洗晶圓(步驟S6)、再以氟酸除 去晶圓表面的自然氧化膜(步驟S7),就在晶圓表面出現疏 φ 水面。最後經由水洗(步驟S8),以所完成的晶圓作為適用 於本實施形態的晶圓。 藉由以上的製程而形成的織構是示於第3圖。與第2 圖比較可以瞭解,帛3圖所示之應用本實施形態的晶圓表 面具有大孔徑’而為有利於除去底部金屬的狀態。第4圖 '為丨線圖,其是顯示應用本實施形態的晶圓與應用驗# 刻織構處理的晶圓的反射率的比較。為了進行比較,此驗 ㈣織構是從舆應用本實施形態的晶圓相同的鎮鍵切片、 籲除去損傷層後,以在氫氧化納水溶液(6. 3%、80 °C )加入 600ml的異@醇所成的溶液,進行9分鐘的㈣來製作而 成。從第2圖可以瞭解所得到的是:應用本實施形態的晶 圓的表面的反射率是低於比較對象的鹼蝕刻織構的反射 率。 接下來刀別使用應用本實施形態的晶圓與應用鹼蝕 刻織構處理的晶圓,實施第7圖所示的製程來製作太陽能 =池(單元β尺寸:15xl5cm),上述太陽能電池的短路光電流 * 是示於第20圖。如第20圖所示可以瞭解,應用2111-10310-PF 201031009 The upward facing surface is used as a light receiving surface to make a solar cell. After the step si is performed, the surface of the wafer is etched by washing and drying (step S2) of the wafer to the extent that the effect of reducing the reflectance is not lost, and the surface of the wafer is etched using a mixed acid mainly composed of hydrofluoric acid and nitric acid (step S3). ). Actually, a mixed acid having a capacity ratio of HF (5〇%): HN〇3 (69%): H2〇 = 1:9:15 was used for etching for 3 minutes. The person-in-law puts the liquid into a flat container with a cushion-like shape, and the level is rounded, but the wafer is shaken in the liquid medicine so that the unevenness of the liquid medicine does not occur during the remaining process. . Here, the chlorine generated by the button is also trapped under the wafer and the silver engraving uniformity of the lower surface is poor. Therefore, it is preferable to form the solar cell as the light-receiving surface at the time of etching. Of course, the wafer can be placed in the wafer and the money can be engraved in an upright state. = An etching device for transporting wafers horizontally in the liquid medicine is already being sold, = important. In the case of using the device of this type, the upper surface of the etching is used as the light receiving surface of the solar cell; The rhythm of the rhyme is uniformly performed in the form of (4), (10) and (4) (row (4), or the wafer is not placed, and the crystal is transported horizontally in the chemical solution for etching). After oxidation, water washing (step (4), followed by thymidine (tetra) stone ^ 10 seconds (four) engraved (step S5) ° with ammonia acid and nitric acid because of the ratio of chlorine acid and acid solution used and its membrane It is called the case where the surface of the wafer is discolored. It is a thin acid rabbit material that causes discoloration. When the multi-layer is etched by the hydrofluoric acid and the acid-based mixed acid in the step S3, the dye film is formed on the surface of the wafer 2111-1〇3 j〇.pp 201031009. In the step 55, etching using a 1% aqueous sodium hydroxide solution was carried out for the purpose of removing the dye film. Here, a 1% aqueous sodium hydroxide solution is used at room temperature, but the type of the chemical liquid is not limited as long as it is an alkaline aqueous solution. The concentration of the alkaline aqueous solution is at most 5%, and the temperature of the chemical solution is around room temperature. After the step S5, if the wafer is washed (step S6) and the natural oxide film on the surface of the wafer is removed by hydrofluoric acid (step S7), a water surface is formed on the surface of the wafer. Finally, the water is washed (step S8), and the completed wafer is used as the wafer to which the embodiment is applied. The texture formed by the above process is shown in Fig. 3. As can be seen from comparison with Fig. 2, the wafer surface to which the present embodiment is applied as shown in Fig. 3 has a large aperture ', which is advantageous for removing the bottom metal. Fig. 4 is a sinogram showing a comparison of the reflectance of the wafer to which the wafer of the present embodiment is applied and the texture of the application. For comparison, the texture of the test (4) was obtained by applying the same town bond slice of the wafer of the present embodiment, and removing the damage layer, and adding 600 ml to the aqueous sodium hydroxide solution (6.3%, 80 ° C). A solution of iso-alcohol was prepared by performing (four) for 9 minutes. As is understood from Fig. 2, the reflectance of the surface of the crystal to which the present embodiment is applied is lower than the reflectance of the alkali etching texture of the object to be compared. Next, the wafer to which the present embodiment is applied and the wafer subjected to the alkali etching texture treatment are applied, and the process shown in FIG. 7 is performed to produce a solar energy=cell (unit β size: 15×15 cm), and the short-circuit light of the solar cell is used. The current * is shown in Figure 20. As shown in Figure 20, you can understand the application.

211M0310-PF 11 201031009 本實施形態的晶圓的太陽能電池的短路光電流密度是較應 用鹼蝕刻織構處理的晶圓有所提升。 在此處,是說明步驟S1中使用銀作為金屬離子,在其 他的例子亦可使用銅及錄來取代銀。在專利文獻3所列舉 的金屬離子(銀、銅、鎳、翻、纪、金)之中,上述以外的 金屬鉑與金’無法在步驟S3的.製程中除去。 步驟S3中的㈣’是以石肖酸㈣氧化、再以氟酸除去 矽的機制所造成。因此,若硝酸的容量多,則矽的氧化速 度大於除去速度,而使矽的蝕刻速度變慢,因此氟酸、玢 酸的藥液比是決定蝕刻的速度.。還有,可以加水來調整蝕 刻速度。 在此處是使用 HF(50%):HN〇3(69%):.H2(M:9:15 的容量 比的藥液,但由於可以調整添加水的量、或蝕刻時間,若 是相對於氟酸的容量為1而硝酸的容量為6以上的情況, 即使相關藥液中的硝酸的比例改變亦無妨。若相對於氟酸 為1而硝酸的容量比不滿6,則情況有所不同。第1 〇、丨工、 1 3及14圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已分別經過以 HF (50%):H2〇2(6〇%):H2〇:AgN〇3(〇 iM) = 40〇ml:20〇ml:1600inl:4,4inl ([Ag+] = (2E_4)M)的藥液蝕刻 3 分鐘而形成多孔質層的晶圓,再將上述晶圓分別以肝(5〇%): ΗΝ〇3(69%):Η2〇=:ι :x: 15 之硝酸量 X 變化為 4、5、6、9 的藥 液,進行3分鐘的蝕刻β(同樣為了除去染色膜,而實施以 1%的NaOH進行10秒的蝕刻作為比較對象,第9圖是顯 示以 HF (50%):H2〇2 (60%):H2〇:AgN〇3(〇1M) = 4〇〇nii:2〇〇mi: 2111-10310-PF 12 201031009 多孔質層的晶圓的外觀攝影照片。 相對於氟酸為1而硝酸為4的情況,由於硝酸過少, 多,質層的钱刻逮度極慢。硝酸若增加到5,雖然可以除 去夕孔質層’但疋所形成的染色膜無法以鹼液除去,而會 第12圖所示,在晶圓端部殘留染色膜。第Μ圖是顯示 、HF(5(U).HN〇3(69%):H2〇=l :5:15的容量比的混合酸姓刻 第9圖所示的多孔賓層3分鐘後之生成於晶片端部的染色 鲁膜的攝影照片。相對於此,硝酸若為6以上,則可完全除 不殘留染色膜。因此’所使用的混合酸在以氟酸(5〇%) 的容量為1的情況’以硝酸⑽%)的容量為6以上所混合的 混合酸為佳。 另外’在第7圖所示的製程中,是以多晶石夕晶圓作為 基板’以熱擴散法形成PN接合來製作太陽能電池,但是當 然亦可使用單晶石夕基板,而亦可以CVD等沈㈣Μ來形 成ΡΝ接合而製作太陽能電池。 • 如此,若是藉由本發明的實施形‘態1,在不致失去降 低反射率的效果的程度,以氫氟酸及硝酸為主體的混合酸 來触刻用金屬離子形成的多孔質層,藉此由於可保留減低 反射率的效果並得到清淨的石夕表面,同時亦可以除去孔洞 底部的金屬,而達成可以製造高效率的太陽能電池的效 果。另外’由於同時實施餘刻與金屬的除去,而達成可以 簡化製造製程的效[另外’關於氫氟酸及确酸為主體的 混合酸,使用以50%的览氟酸的容量為]的情況、而_ 的硝酸的容量為6以上而混合的混合酸,藉此達成可以進 211M0310-PF 13 201031009 行兼顧迅速的蝕刻速度與容易進行蝕刻後的表面處理之蝕 刻步驟的效果。另外,使用蝕刻專用的裝置而以氫氟酸及 硝酸為主體的混合酸進行蝕刻的情況,一面攪拌混合酸一 面進行蝕刻,因此達成可以防止蝕刻的進行所造成位於晶 圓表面的混合酸溶液的濃度不均的效果。另外在用金屬 離子形成多孔質層的製程及以氫氟酸及硝酸為主體的混合 酸進行蝕刻的製程中,水平設置矽基板、或一面水平運送 一面浸漬石夕基板的情%,由⑨以朝上的面作為太陽能電池 的受光面’而達成防止受到受光面產生的氫的影響所造成 的飯刻不均的效果。 實施形態.2 接下來,本案諸位發明人,改變金屬離子濃度而在矽 基板形成多孔質層’並❹上輕基板來進行太陽能電池 的製作,而研究金屬離子漠度對太陽能電池的特性所造成 的影響’將其作為實施形態2,而在以下作詳細的說明。 本實施形態中的製造方法r與實施形態i相同而根據 第1圖所示而實施。 , 在第1圖的步驟S1中,對於從一個鑄錠裁切出來並已 除去損傷層的二片晶圓,以在HF (50%):H2〇2 ⑽: : 2〇〇ml:} 6_的藥液分別添加2.㈤ ([Ag+] = (1E-4)M)、1· lnil([Ag+] = (5E_5)M)的 〇. im 的确酸銀 水溶液而成的藥液’進行3分鐘的叙刻。在步驟s3中以 HF(50%):HN〇3(69%):H2〇=1:9:15的容量比的混合酸,進行3 分鐘的姓刻。實施至步驟58為±的製程之後,根據第7圖211M0310-PF 11 201031009 The short-circuit photocurrent density of the solar cell of the wafer of the present embodiment is improved compared to the wafer subjected to the alkali etching texture treatment. Here, it is explained that silver is used as the metal ion in the step S1, and in other examples, the copper may be used instead of the silver. Among the metal ions (silver, copper, nickel, ruthenium, gold, and gold) exemplified in Patent Document 3, the metal platinum and gold other than the above cannot be removed in the process of step S3. The (four) in step S3 is caused by the mechanism of oxidation of tartaric acid (tetra) and removal of hydrazine by hydrofluoric acid. Therefore, if the capacity of nitric acid is large, the oxidation rate of niobium is greater than the removal rate, and the etching rate of niobium is slowed. Therefore, the ratio of the chemical solution of hydrofluoric acid or tannic acid determines the rate of etching. Also, water can be added to adjust the etch rate. Here, it is a liquid solution using HF (50%): HN〇3 (69%): .H2 (M: 9:15), but since the amount of added water or etching time can be adjusted, if it is relative to When the capacity of the hydrofluoric acid is 1 and the capacity of the nitric acid is 6 or more, the ratio of nitric acid in the relevant chemical solution may be changed. If the volume ratio of nitric acid to 1 is less than 6 with respect to the hydrofluoric acid, the case may be different. The first, the completion, the first and third are pictures of the appearance of the wafer, which have been passed through HF (50%): H2〇2 (6〇%): H2〇: AgN 〇3(〇iM) = 40〇ml: 20〇ml: 1600inl: 4,4inl ([Ag+] = (2E_4)M) is etched for 3 minutes to form a porous layer of wafer, and then the above wafer The solution of liver (5〇%): ΗΝ〇3 (69%): Η2〇=:ι:x: 15 with a change in the amount of nitric acid X to 4, 5, 6, and 9 was performed for 3 minutes of etching β ( Similarly, in order to remove the dyed film, etching with 1% NaOH for 10 seconds was performed as a comparison object, and Fig. 9 shows HF (50%): H2〇2 (60%): H2〇: AgN〇3 (〇 1M) = 4〇〇nii: 2〇〇mi: 2111-10310-PF 12 201031009 Appearance of the porous layer wafer Photographs: Compared to the case where the hydrofluoric acid is 1 and the nitric acid is 4, since the nitric acid is too small, the mass of the layer is extremely slow. If the nitric acid is increased to 5, the niobium layer can be removed, but the niobium is formed. The dyed film cannot be removed by the alkali solution, and as shown in Fig. 12, the dyed film remains at the end of the wafer. The figure is shown, HF (5(U).HN〇3(69%): H2〇= l : a mixed photograph of a capacity ratio of 5:15 is a photograph of a dyed film formed at the end of the wafer 3 minutes after the porous guest layer shown in Fig. 9. In contrast, if the nitric acid is 6 or more, The dyed film may be completely removed. Therefore, the mixed acid to be used is preferably a mixed acid having a capacity of 6 or more in a case where the capacity of the hydrofluoric acid (5 % by mass) is 1 or more. 'In the process shown in Fig. 7, a solar cell is fabricated by forming a PN junction by a thermal diffusion method using a polycrystalline wafer as a substrate. However, it is of course possible to use a single crystal substrate, but also a CVD method. Sink (4) ΡΝ to form a 太阳能 joint to make a solar cell. • So, if the implementation of the present invention, the state 1 The degree of the effect of lowering the reflectance is lost, and the porous layer mainly composed of hydrofluoric acid and nitric acid is used to contact the porous layer formed of the metal ions, whereby the effect of reducing the reflectance can be retained and the cleaned stone surface is obtained. At the same time, the metal at the bottom of the hole can be removed, and the effect of manufacturing a highly efficient solar cell can be achieved. In addition, the effect of simplifying the manufacturing process can be simplified by the simultaneous implementation of the removal of the metal and the removal of the metal [others on the hydrofluoric acid and indeed In the case of a mixed acid having a main acid as the main component, a mixed acid having a capacity of 50% of the hydrofluoric acid and a capacity of 6 or more of nitric acid is used, thereby achieving a rapid progress in the 211M0310-PF 13 201031009. The etching rate and the effect of the etching step which is easy to perform surface treatment after etching. In addition, when etching is performed using a mixed acid mainly composed of hydrofluoric acid and nitric acid, the etching is performed while stirring the mixed acid, thereby achieving a mixed acid solution on the surface of the wafer which prevents the etching from proceeding. The effect of uneven concentration. In addition, in the process of forming a porous layer using metal ions and etching a mixed acid mainly composed of hydrofluoric acid and nitric acid, the substrate is horizontally disposed, or the surface of the substrate is horizontally transported while impregnating the substrate. The upward facing surface serves as a light-receiving surface of the solar cell to achieve an effect of preventing unevenness of the rice caused by the influence of hydrogen generated on the light-receiving surface. Embodiment 2 Next, the inventors of the present invention changed the metal ion concentration to form a porous layer on the tantalum substrate and mounted a light substrate to fabricate the solar cell, and studied the metal ion infiltration caused by the characteristics of the solar cell. The influence "is taken as the second embodiment, and will be described in detail below. The manufacturing method r in the present embodiment is carried out in the same manner as in the first embodiment, as shown in Fig. 1. In step S1 of Fig. 1, for two wafers cut out from one ingot and having the damaged layer removed, in HF (50%): H2〇2 (10): : 2〇〇ml:} 6 _ The liquid solution of the _ solution is added to 2. (5) ([Ag+] = (1E-4)M), 1· lnil ([Ag+] = (5E_5)M) 〇. 3 minutes of narration. In step s3, a mixed acid having a capacity ratio of HF (50%):HN〇3 (69%):H2〇=1:9:15 was subjected to a 3-minute surname. After the process of step 58 is ±, according to the seventh figure

2111-10310-PF 14 201031009 所示的製程來製作太陽能電池(單元尺寸:2x2cm)。 第21圖是共同顯示上述二個太陽能電池的短路光電 流密度Jsc、與從相同的鑄錠所切出而製作的鹼蝕刻織構 的短路光電流密度JSC。[Ag+] = (1E_4)M的情況,則是與鹼 蝕刻織構相同程度的Jsc,但是一旦成g[Ag+] = (5E_5)M, 則可見到明顯的jsc的下降’即::使是相同的蝕刻時間,[絲+] 較低者’其結果是太陽能電池的特性較低。 φ 第15圖疋顯示以[Ag+] = (1E-4)M、(5E-5)M所製作的電 池單元與鹼蝕刻織構處理的電池單元的内部量子效率的比 較圖。根據第1 5圖,與鹼蝕刻、織構處理的電池單元比較, 以[Ag+] = (1E-4)M、(5E-5)M所製作的電池單元在8〇〇nm以 上的波長區的感度較低。其揭露了形成多孔質層之時所析 出的金屬未凡全除去為其原因,而金屬濃度愈低則在8 以上的波長區的感度降低的傾向愈高。 第16阖則合併了在步驟S1中以[Ag+M2E_4)M的混合 • 溶液而以同樣手法所製作的太陽電池,來比較短路光電流 密度。但是,此一用[Ag+M2E — 4)M的混合溶液所製作的太 陽能電池,其晶圓切出來源的鎊鍵,是不同於舆實施形態 1的說明所使用者及本實施例的上述二片晶κ的鎮鍵。在 第16圖中,為了比較用從不同的鑄錠切出的晶圓所製作的 太陽能電池的特性,則從與各自的太陽能電池的晶圓相同 的鑄錠來分別製作鹼蝕刻織構處理的電池單元,而使用以 .上述鹼蝕刻織構處理的電池單元的短路光電流密度的值來 作規格化的值而緣圖。在篦1 R El ^ ^ ^ .2111-10310-PF 14 201031009 The process shown is to make a solar cell (unit size: 2 x 2 cm). Fig. 21 is a diagram showing the short-circuit photocurrent density Jsc of the above two solar cells and the short-circuit photocurrent density JSC of the alkali-etched texture produced by cutting out from the same ingot. In the case of [Ag+] = (1E_4)M, Jsc is the same degree as the alkali etching texture, but once g[Ag+] = (5E_5)M, a significant drop in jsc is seen. The same etching time, [wire +] is lower, the result is that the characteristics of the solar cell are lower. φ Fig. 15 shows a comparison of the internal quantum efficiencies of the battery cells fabricated by [Ag+] = (1E-4)M, (5E-5)M and the alkali-etched textured cells. According to Fig. 15, compared with the battery unit treated with alkali etching or texture, the battery cells fabricated with [Ag+] = (1E-4)M and (5E-5)M are in the wavelength region of 8 〇〇 nm or more. The sensitivity is lower. It is revealed that the metal precipitated at the time of forming the porous layer is completely removed, and the lower the metal concentration, the higher the sensitivity in the wavelength region of 8 or more is lowered. The 16th step combines the solar cells fabricated by the same method in the mixed solution of [Ag+M2E_4)M in the step S1 to compare the short-circuit photocurrent density. However, in the solar cell produced by using the mixed solution of [Ag+M2E-4)M, the pound key of the wafer is cut out from the source, and the user of the embodiment 1 and the above-described embodiment are different from the above. The town bond of two-plate crystal κ. In Fig. 16, in order to compare the characteristics of solar cells fabricated using wafers cut from different ingots, alkali etching texture processing is separately performed from the same ingots as the wafers of the respective solar cells. For the battery cell, the value of the short-circuit photocurrent density of the battery cell treated by the above-described alkali etching texture is used as a normalized value. In 篦 1 R El ^ ^ ^ .

211M0310-PF 15 201031009 (1E-4)M以上’太陽能電池的特性是提升至與鹼蝕刻織構 處理的電池單元的相同尊級以上。因此瞭解到,為了獲得 尚效率的太陽能電池,步驟S1中使用的混合溶液的金屬離 子濃度有必要至少在(1E-4)M以上。 另外,右金屬離子濃度變低則金屬的析出速度變慢, 而容易發生析出金屬大小的變異。另一方面,根據專利文 獻4 ’因為籍由金屬的觸嫖作用而開孔,孔洞的深度會大 大受到析出金屬大小的影響。因此,先析出的金屬粒會先 達成足以在矽形成孔洞的大小,而所形成的孔洞亦較深, 但是晚析出的金屬粒會晚達成足以在矽形成孔洞的大小, 因此所形成的孔洞亦較淺,其結果是形成孔洞深度變異大 的夕孔質層。之後在不致失去降低反射率的效果的程度, 吏用ス氨氟^酸及确酸為主體的混合酸進行多孔質層的除 去仁是在此處,因為希望盡量在較大比例的區域都分佈 著凹凸’而進行留下較淺孔洞的程度的姓刻。此時若還有 深孔,則因為無法完全除去形成深孔的金屬,而會對太陽 能電池的特性造成不良影響。因此,析出金屬$大小的變 度是愈小愈好。也就是,比起以低金屬離子濃度的混 合液進行長時間的蝕刻以高金屬離子濃度的混合溶液 進仃鈕時間的蝕刻的情況’較容易製作高效率的太陽能電 池。 ,、'、,若金屬離子濃度過高,在晶圓析出的金屬就過 多’而晶圓會帶有所使用的金屬的顏色。第17、18圖是以 虹(5〇%):H2〇2(6〇%):H2〇 = 4〇〇ml:2〇〇ml:16〇〇mi 的藥液 213 l-103]〇*pp 201031009 分別添加 8.8ml ([Ag+M4E-4)M)、l7.6miaAg+] = (8E_4)M) 的0· 1M的硝酸銀水溶液而成的藥液來進行3分鐘的蝕刻所 得的晶圓的外觀攝影照片。比較這些照片則瞭解到,若使 用[Ag+] = (8Έ-4)Μ的藥液,因為析出的銀會使晶圓帶有銀的 顏色(白色)。 若是在此類的晶圓以,氫氟酸及硝酸為主體的混合酸進 行蝕刻,在太陽能電池的特性上仍無任何問題,但是會發 參生在形成多孔質層時需要大量的金屬離子、另外為了除去 大量的金屬會縮短混合酸的藥液壽命等等的成本方面的缺 點(demerit)。 藉由以上所述很明顯地,含金屬的混合溶液中的金屬 濃度較好為(1E-4)M以上、且不滿(h4)m。 如此一來,若是根據本發明相關的實施形態2之太陽 能電池的製造方法’關於在矽基板形成多孔質層之時所使 用之含金屬離子的混合溶液,藉由使用金屬濃度為(ie_4)m •以上、且不滿(8E-4)M的混合溶液,是達成可以製造高效 率的太陽電池、並可以減低藥液成本的效果。 【產業上的可利用性】 如上所述,本發明相關的太陽能電池的製造方法,是 對矽太陽能電池的製造方法有用,特別是適用於在矽基板 的表面形成微小的凹凸(織構)。 雖然本發明已以較佳實施例揭露如上,然其並非用以 限定本•發明,任何本發明所屬技術領域中具有通常知識 者,在不脫離本發明之精神和範圍内,當可作些許之更動211M0310-PF 15 201031009 (1E-4) M or more The characteristics of the solar cell are raised to the same level as the battery unit treated with the alkali etching texture. Therefore, it is understood that in order to obtain a solar cell which is still efficient, the metal ion concentration of the mixed solution used in the step S1 is necessary to be at least (1E-4) M or more. Further, when the concentration of the right metal ion is lowered, the precipitation rate of the metal is slow, and variation in the size of the precipitated metal is likely to occur. On the other hand, according to Patent Document 4', since the hole is opened by the contact action of the metal, the depth of the hole is greatly affected by the size of the precipitated metal. Therefore, the first precipitated metal particles will first reach a size sufficient to form pores in the crucible, and the pores formed will be deeper, but the late-precipitated metal particles will reach a size sufficient to form pores in the crucible, so the pores formed are also The result is shallow, and the result is a crater layer with a large variation in the depth of the hole. After that, the effect of the effect of lowering the reflectance is not lost, and the removal of the porous layer by the mixed acid mainly composed of sulphuric acid and acid is here, because it is desirable to distribute as much as possible in a large proportion of regions. The embossing is carried out while the surname of the shallower hole is left. If there are deep holes at this time, the metal forming the deep holes cannot be completely removed, which adversely affects the characteristics of the solar cell. Therefore, the smaller the size of the precipitated metal $ is, the better. That is, it is easier to produce a highly efficient solar cell than the case where etching with a low metal ion concentration is carried out for a long time to etch with a mixed solution of a high metal ion concentration. ,, ',, if the metal ion concentration is too high, the amount of metal deposited on the wafer is too large' and the wafer will have the color of the metal used. Figures 17 and 18 are rainbow (5〇%): H2〇2 (6〇%): H2〇= 4〇〇ml: 2〇〇ml: 16〇〇mi liquid 213 l-103]〇* Pp 201031009 Adding a solution of 8.8 ml ([Ag+M4E-4)M), l7.6miaAg+] = (8E_4)M) of 0. 1M silver nitrate aqueous solution to the wafer obtained by etching for 3 minutes Appearance photography photos. Comparing these photos, we know that if you use [Ag+] = (8Έ-4)Μ, the deposited silver will give the wafer a silver color (white). If such a wafer is etched with a mixed acid mainly composed of hydrofluoric acid and nitric acid, there is still no problem in the characteristics of the solar cell, but a large amount of metal ions are required to form a porous layer. In addition, in order to remove a large amount of metal, the cost disadvantage of the mixed acid solution life and the like is shortened. As apparent from the above, the metal concentration in the metal-containing mixed solution is preferably (1E-4) M or more and less than (h4) m. According to the method for producing a solar cell according to the second embodiment of the present invention, the metal ion-containing mixed solution used for forming the porous layer on the tantalum substrate is used by using a metal concentration of (ie_4)m. • The mixed solution of the above and less than (8E-4) M is effective in producing a solar cell with high efficiency and reducing the cost of the chemical solution. [Industrial Applicability] As described above, the method for producing a solar cell according to the present invention is useful for a method for producing a solar cell, and is particularly suitable for forming minute irregularities (texture) on the surface of a tantalum substrate. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art to which the present invention pertains may be made without departing from the spirit and scope of the invention. Change

211M0310-PF 17 201031009211M0310-PF 17 201031009

與潤飾, 所界定者為準。 '【圖式簡單說明】 用以說明本發明的實施形態1及 第1圖為一流程圖,用以說 其為對以含銀離子.的雙 .2相關的太陽能電池的製造方法。 第2圖為一電子顯微鏡照片 氧水(t氧化氫水;谷液)與氫氟酸的混合溶液進行餘刻後的 多孔質層進行拍攝所得照片。 第3圖為對矽基板表面所形成的織構進行拍攝的電子 顯微鏡照片’其為本發明的實施形態!相關的太陽能電池 的製造方法中,以氫氟酸及硝酸為主體的混合酸來蝕刻多 孔肖質層而在矽基板表面所形成的織構。 4 第4 .圖為一曲線圖,其是繪製本發明的實施形態i相 關的太陽能電池的製造方法所製成的織構及鹼蝕刻織構的 反射率。 第5圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已經過根據專利文獻3的實施例而以含銀離子的雙氧水 與氫氟酸的混合溶液所進行的蝕刻。 第6圖為一曲線圖’其是繪製根據專利文獻3的實施 例而形成多孔質層的晶圓、與驗姓刻織構處理的晶圓的反 射率的測定結果。 第7圖為一流程圖’是說明從晶圓製作太陽能電池單 元的流程。 2111-10310-PF =18 201031009 第8圖為一曲線圖’其是緣製使用由專利文獻3的實 施例所製成的晶圓、與應用驗#刻識構處理的晶圓所製成 的太陽能電池.的内部量子效率。 第9圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已經過以含αΕ_4)Μ的銀離子的雙氧水與氫氟酸的混合 溶液所進行的敍刻。And retouched, as defined. BRIEF DESCRIPTION OF THE DRAWINGS The first and first drawings for explaining the present invention are a flow chart for explaining a method of manufacturing a solar cell related to a silver-containing ion. Fig. 2 is a photograph of a porous layer obtained by carrying out a mixture of oxygen water (t hydrogen peroxide water; valley liquid) and hydrofluoric acid. Fig. 3 is an electron micrograph showing the texture formed on the surface of the crucible substrate. 'This is an embodiment of the present invention! In the method for producing a solar cell, a mixed acid mainly composed of hydrofluoric acid and nitric acid is used to etch a porous oxide layer to form a texture on the surface of the tantalum substrate. 4 is a graph which shows the reflectance of the texture and the alkali etching texture produced by the method for producing a solar cell according to Embodiment i of the present invention. Fig. 5 is a photograph obtained by photographing the appearance of a wafer which has been subjected to etching with a mixed solution of hydrogen peroxide-containing hydrogen peroxide and hydrofluoric acid according to the embodiment of Patent Document 3. Fig. 6 is a graph showing the results of measurement of the reflectance of the wafer on which the porous layer is formed according to the embodiment of Patent Document 3 and the wafer subjected to the texture processing. Fig. 7 is a flow chart' showing the flow of fabricating a solar cell unit from a wafer. 2111-10310-PF =18 201031009 Fig. 8 is a graph of a wafer manufactured by using the wafer of the embodiment of Patent Document 3 and the wafer processed by the application inspection. The internal quantum efficiency of solar cells. Fig. 9 is a photograph obtained by photographing the appearance of a wafer which is a mixture of hydrogen peroxide and hydrofluoric acid having a silver ion containing αΕ_4).

第10圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已經過以HF(509〇:HN(M69%):H2〇=1 :4:15的混合骏對第 9圖所示的多孔質層進行三分鐘的蝕刻。 第11圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已經過以HF(50%):HN〇3(69%) :H2〇=1:5:15的混合酸對第 9圖所示的多孔質層進行三分鐘的蝕刻。 第U圖為對生成於第u圖所示的晶圓端部的毕色 (stain)膜進行攝影所得照片。 八 第13圖為對晶圓的外觀進行攝影所得照片 是已經過㈣⑽):_3则:修1:6:混= 9圖所示的多孔質層進行三分鐘的㈣。,酸對第 第14圖為對晶圓的外觀進行 + 是已經過以HF(5〇9〇 , 叮件…、片’上述晶圓 〔5〇%):刪3(69%) :Η2〇=1:9:15 的、、早人 9圖所示的多孔皙居祕 酸對第 孔質層達行三分鐘的姓刻。 第15圖為-曲線圖,用以說 與氫氟酸的混合溶液“ 變含銀離子的雙氧水 率的比較。液中的銀離子濃度的情況之内部量子效 ·* - 第16圖為一曲綠願Figure 10 is a photograph of the appearance of the wafer, which has been shown in Figure 9 with HF (509〇:HN(M69%):H2〇=1:4:15). The porous layer was etched for three minutes. Figure 11 is a photograph of the appearance of the wafer, which has been subjected to HF (50%): HN〇3 (69%): H2〇=1:5 The mixed acid of 15 was etched for three minutes in the porous layer shown in Fig. 9. Fig. U is a photograph obtained by photographing a stain film formed at the end of the wafer shown in Fig. u. Fig. 13 is a photograph of the appearance of the wafer. It has been (4) (10)): _3: repair 1:6: mixed = 9 shown in the porous layer for three minutes (four). The acid on the 14th picture shows the appearance of the wafer + is already HF (5〇9〇, ......, the film 'the above wafer [5〇%): delete 3 (69%): Η 2〇 =1:9:15, the pattern of the porous scorpion acid shown in the early 9th figure on the first pore layer for three minutes. Figure 15 is a graph showing the comparison of the hydrogen peroxide-containing hydrogen peroxide solution. The internal quantum effect of the silver ion concentration in the liquid. * - Figure 16 is a graph. Green wish

2111-10310-PF 線圏,其是針對銀離子濃度變化的情況 19 201031009 之規格化短路光電流密度所繪製。 是 溶 第17圖為對晶圓的外觀進行攝影所得照片,上述晶圓2111-10310-PF 圏, which is plotted against the change in silver ion concentration. 19 201031009 Normalized short-circuit photocurrent density is plotted. Is dissolved. Figure 17 is a photograph of the appearance of the wafer, the wafer

已經過以含(4E-4)M 的银離子的雙氧水 與氫氟酸的混合 液所進行的三分鐘的蝕刻。 第18圖為對晶圓的外觀進行攝影所得照片,上述晶圓 是已經過以含(8E-4)M的銀離子的雙氧水輿氫氣酸的混合 溶液所進行的;三分鐘的蝕刻。Three minutes of etching with a mixture of hydrogen peroxide and hydrofluoric acid containing (4E-4)M of silver ions has been carried out. Fig. 18 is a photograph obtained by photographing the appearance of a wafer which has been subjected to a three-minute etching with a mixed solution of hydrogen peroxide containing (8E-4)M of silver ions;

第19圖為一說明圖,用以比較使用應用專利文獻3的 實施例所製成的識構而製成的太陽電池單元、與鹼蝕刻織 構處理的電池單元之短路光電流密度。 第2 0圖為一說明圖’用以比較使用應用本發明之實施 形態1相關的製造方法所製成的織構而製成的太暢電池單 元、與鹼蝕刻織構處理的電池單元之短路光電流密度。Fig. 19 is an explanatory view for comparing the short-circuit photocurrent density of the solar cell unit and the alkali-etched textured battery cell fabricated by the characterization of the embodiment of the patent document 3. FIG. 20 is a diagram for explaining a short circuit of a battery unit which is formed by comparing a texture produced by using the manufacturing method according to the first embodiment of the present invention, and an alkali-etched textured battery unit. Photocurrent density.

第.21圖為一說明圖,用以比較使用含不同濃度的銀離 子的雙氧水的混合溶液所形成的多孔質層而製成的太陽電 池單兀、與檢蝕刻織構處理的電池單元之短路光電流密度。 【主要元件符號說明】 S1〜S18、S1卜S14〜步驟Fig. 21 is an explanatory diagram for comparing a solar cell monolayer formed by using a porous layer formed by a mixed solution of hydrogen peroxide containing different concentrations of silver ions, and short-circuiting with the etch-treated cell unit. Photocurrent density. [Main component symbol description] S1~S18, S1 Bu S14~Step

2111-10310-PF 202111-10310-PF 20

Claims (1)

201031009 七、申請專利範圍: 1. 一種太陽能電池的製造方法,通 迥用於在矽基板的表 面具有織構(texture)的太陽能電池的制.生 方法,其特徵在 於包含下列步驟: 第一步驟,將一矽基板浸潰於含金眉 笼屬離子的氧化劑與 氫氟酸的混合表溶液’而在該石夕基板的表面 ; 117艰成一多孔質 層;以及 :201031009 VII. Patent application scope: 1. A method for manufacturing a solar cell, which is a method for producing a solar cell having a texture on a surface of a ruthenium substrate, which comprises the following steps: a substrate is immersed in a mixed surface solution of an oxidizing agent and a hydrofluoric acid containing a gold eyebrow ion, and is on the surface of the substrate; 117 is a porous layer; and: 第二步驟!’將已經過該第一步驟的該矽基板的表面浸 潰於以氫氟酸及硝酸為主的混合酸而進行蝕刻,而形成織 構0 2 ·如申請專利範圍第1項所述的太陽能電池的製造方 法,其特徵在於: 在該第二章驟中所使用的該混合駿,是以:5 0%.的.氫氟 酸的容量為1的情況、60%的硝酸的容量為6以上的方式所 混合的混合酸。 3. 如申請專利範圍第1項所述之太陽能電池的製造方 法’其特徵杳於:更包含第三步驟’以驗性藥液姓刻已經 過該第二步驟的該矽基板。 4. 如申請專利範圍第丨項所述之太陽能電池的製造方 法’其特徵在於.:該第二步驟是,面使該混合酸循環或攪 拌該混合酸,一面進行已經過該笫一步驟的該矽基板的蝕 刻。 5·如申請專利範圍第1項所述之太陽此電池的製造方 法’其特徵在於: ' 2111-10310-PF 21 201031009 在該第一步驟及/或該第二步驟中,將該矽基板水平設 置、或是水平傳送並浸潰的情況,其成為上表㈣那—面, 是作為太陽能電池的受光面。 6.如申請專利範圍第 法 其其特徵在於: Mm難 _ i第㈣所使用的含金屬離子的氧化劑與氨象酿 的該混合水溶液中的金屬 的金屬離子濃度是(1E-4)M以上、真不 Φ 滿(8E-4)M 〇 2111-10310-PF Θ 22The second step! 'The surface of the ruthenium substrate which has passed through the first step is immersed in a mixed acid mainly composed of hydrofluoric acid and nitric acid to form a texture 0 2 · The solar energy as described in claim 1 A method of manufacturing a battery, characterized in that: the mixing element used in the second chapter is: a capacity of 50% of hydrofluoric acid is 1 and a capacity of 60% of nitric acid is 6 The mixed acid mixed in the above manner. 3. The method of manufacturing a solar cell according to claim 1, wherein the method further comprises: the third step of: wherein the substrate is pasted by the first step. 4. The method of manufacturing a solar cell according to claim 2, wherein the second step is: circulating the mixed acid or stirring the mixed acid while performing the step of The etching of the germanium substrate. 5. The method for manufacturing a solar cell according to claim 1, wherein: 2111-10310-PF 21 201031009 in the first step and/or the second step, the substrate is horizontally When it is set or horizontally conveyed and immersed, it becomes the surface of the above table (4) and is used as the light receiving surface of the solar cell. 6. The method according to the scope of the patent application is characterized in that: the metal ion concentration of the metal in the mixed aqueous solution of the metal ion-containing oxidizing agent and the ammonia-like aqueous solution used in the (m) is (1E-4) M or more. , really not Φ full (8E-4) M 〇2111-10310-PF Θ 22
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US8883543B2 (en) 2011-05-17 2014-11-11 Sumco Corporation Method of producing wafer for solar cell, method of producing solar cell, and method of producing solar cell module
TWI494971B (en) * 2011-01-26 2015-08-01 Sumco Corp Solar cell wafer and manufacturing method thereof

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US20050126619A1 (en) * 2002-02-28 2005-06-16 Shin-Etsu Handotai Co., Ltd Solar cell module and manufacturing method thereof
TWI244135B (en) * 2004-12-31 2005-11-21 Ind Tech Res Inst Method of making solar cell

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TWI494971B (en) * 2011-01-26 2015-08-01 Sumco Corp Solar cell wafer and manufacturing method thereof
US9276153B2 (en) 2011-01-26 2016-03-01 Sumco Corporation Solar cell wafer and method of producing the same
DE112012000576B4 (en) 2011-01-26 2023-06-07 Sumco Corp. Method of manufacturing a solar cell wafer, a solar cell, and a solar cell module
US8883543B2 (en) 2011-05-17 2014-11-11 Sumco Corporation Method of producing wafer for solar cell, method of producing solar cell, and method of producing solar cell module
TWI475712B (en) * 2011-05-17 2015-03-01 Sumco Corp Method for fabricating wafer for photovoltaic cell, method for fabricating photovoltaic cell unit, and method for fabricating photovoltaic cell module

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