201013165 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種發光組件檢測機台及其檢測方法，特別是 具有複數發光元件之發光組件檢測機台及其檢測方法。 【先前技術】 如圖1所示，積分球丨是一個中空的球腔，球腔内壁—般為 具有反射性質的塗層，當積分球丨於實際應用時，待测發光元件 7〇所散發光束，由積分球丨下方輸入孔射入，經過球腔内壁複雜 地反射漫射後，按其塗層材質決定被腔壁所吸收的光能量，計算 收集所得上述待測發光元件7〇向四面八方散發的光，供光譜能量 分析儀14由積分球1上方輸出孔取樣光功率、波形和能量，計算 待測發光元件70原來之入射光束。 依上述積分球1之量測結構，需將待測光源置入積分球1中， 且量測完畢需將測畢光源由積分球丨取出，都會造成量測速度的 門檻；此外，積分球1内，不僅需要額外設置遮板收光，以避免 直射光束直接進入感測裝置；加以，球腔内壁塗層材質受光照射 後之老化變質程度’又會干擾光譜能量分析儀14分析原入射光參 數之準破度；再者’部份由積分球丨下方輸人孔反射回發光元件 70的光束，又有部分再反射回到積分球丨内，且視發光元件兀 的表面狀況不同而更有所差異，即使僅假設其變異量為1〇%，都 將造成量測及後續計算精度的重大難點。 最嚴重地，一旦待測光源體積稍大，積分球不僅造價暴增而 造成選用的障礙，更因佔用體積龐大而造成設置上之困擾，迫使 此種架構-般只能在實驗室中量測使用，不剌於—般生產線； 5 201013165 甚且，積分球的尺寸有其限制，當欲量測對象為例如數十公分之 狹長形狀光棒(light bar)，則對應之積分球直徑需達約—公其 • 造價之高昂、待測物進出之緩慢、度量隨上述各種因素而不易正 確，種種情況均充分證明其不利社廠量產之快速_，更不用 說未來液晶顯示器之尺寸曰趨增大，順應此趨勢潮流，光棒本身 勢必逐漸增長，更遠非目前習見的積分球所能擔負之責。 本案申請人所申請之我國第972购7號新型專利如圖2所 馨 *，揭露一種檢測機自2 ’其感測裝置23包括至少一片一太陽能 電池(solar cell Ph〇t〇voltaic)，—方面利用太陽能電池結構簡單、匕 價格合宜之躲，讓此檢測機台2成本更低廉、更具有市場競爭 力；另方面以其低反射、高吸收之特性，有效避免人射光反射所 造成之誤差’並提高量麻感度；因太陽能電池光驗收率良好 之特性，無須顧慮待測物反射係數之變化；更可利用一光譜能量 分析儀24得到待測發光組件7之的光譜能量分佈，令其量測精度 提升。尤其可藉由W太陽能之組合，有效增域測範圍^ p 順應待測光源之不斷增大。 然而，該習知技術僅論及待測光源就感測定位後之靜態感 測’每次制檢驗之對㈣整個待測絲，並未細部論究當一組 待測光源内擁有眾多發光元件時，料發光元件中何者有誤的問 題；亦即’-旦發現某發光組件出現問題，必須額外經由一個步 驟確認發光有誤之元件何在，才能進一步處理修正。 換吕之’若可正確分辨酬發級件之所有發光元件是否均 為符合檢測標準之良品，迅速確認出非良品之受測元件，將可加 速後續修正處理速度’就此提升產丨良率；尤其#此種分辨係經 6 201013165 由相同之自動化作業流程，更能迅速在檢測過程中，大量檢驗待 測發光組件*㈣實用價值，解決生產發光組件與_發光組件 ' 廠商之困境，實為最佳的解決方案。 【發明内容】 本發明之-目的，在提供—種可迅速且明轉知發光組件中 的眾多發光元件何者不合格之發光組件檢測機台。 本發明另-目的，在提供—種進—步保有原先簡單架構、具 0 有高度相容性之發光組件檢測機台。 、 本發明再-目的’在提供—種穌低廉、並可充分自動化而 降低發光組件職縣之發級件檢測機台。 本發明又-目的，在提供—種無需繁複裝置及動作，即可快 - 紐膽光_巾料乡發光科何者不合格之發練件檢測方 法。 本购係-種具有複數發光元件之發級件檢_台，供量 1具有複數發光％件之發光組件發光狀態其中各該發光組件之 Φ 該等發光70件係沿一個長度方向配置，該檢測機台包含：-個基 座 '組設置於該基座、用財載並致能該等發光組件之一作為 一個侧發光組件而發光的承餘能裝置；m於該基座、 具有-個可涵蓋該細發触件之複數個發光元件的感測範圍、 .、感測該相發光組件發光並轉換為L峨輸出之感測裝 . & ’轉動該承载致能裝置與該感職置沿-個㈣該被致 =發光組件長度方向之預定㈣方向相對移動、使_測裝置感 •潘㈣巾之料測發光轉的該等發光树賴時㈣化之 奘罟。 201013165 利用上述料讀射料為—種具魏數發仏件之 組件檢财法，射料發光畴巾域特光元件係沿著一個 長度方向配置，並由-具檢測機台檢測該等發光組件 φ 元件發光狀態，其中該檢測細包含—個基座…組設於該基座 用以承載並致能該等發光組件發光之承載致能裝置卜組設於該 基座n财涵蓋複數發光元件之_朗、心感測該等 發光70件發光並轉換為感測訊號輸出之感測裝置；及—組將該 載致能裝置與該翻裝置沿__定移動方向相對移動之移動裝 置，該方法包含下列步驟：a)將該等發光組件之__以該長度方向 勿。於該預々移動方向方式置放於該承載致能裝置作為—個待測 發光組件·’並以該承載致能裝置致能該制發光組件之該等發光 70件發光，b)M該移動裝置將該承載致能裝置與該感測裝置沿該 預定移動方向移動’使得該待測發光組件之該等發光元件循序進 入及/或脫離該感測裝置之該_範圍；及e)由概職置感測依 照該等發光元件進人及/或脫_感職驗態，輸鱗感測發光 量隨該感·_料發光元件«及_變化之該制訊號。 承上所故’本發明提出—種具有複數發光元件之魏組件檢 測機台及其檢測方法’藉由讓發光組件中之複數發光元件循序進 入/脫離感測範圍’使感測所得之發光亮度，循序簡單遞增或遞 減’旦增減狀態與預财符’則依照進人/麟之速度，立即推 算得=發生問題之發光元件在發光組件巾位置；不僅與中請人所 擁有則案全相容而相互呼應，並進_步達成在自動化檢測作業 中’立即分辨錯誤之單—元件，加速後續修誠處理流程，提升 產出速率，尤其不受待測發光組件之長度關，更能切合需求。 8 201013165 【實施方式】 有關本發明之技術内容、特點與功效，在以下配合參考圖式 ' 之較佳實施例的詳細說明中，將可清楚的呈現；且為方便說明， 文内所提之發光組件，其所具複數發光元件係沿—個長度方向配 置，並省略必備於機台基座之支架線路，以免圖面紊亂。 如圖3所示，此為本發明第一實施例，發光組件檢測機台$ 係供量财有複紐光元件7G之發光組件7的發絲態，並包 〇 3 個基座30、一組用以承載、致能發光組件7之承載致能裝 置3卜一組可同時感測複數發光元件7〇之感測裝置”及一組驅 動承載致能裝置31移動之移動裝置32。 如圖3及圖4所* ’此為本發明第—實施狀制機台及其 • 檢測流程’並以太陽能電池域測裝置33之-例，及以具有複數 發光二極體之光棒作為具有複數發光it件7G之例證4檢測機台 3開始進行檢測時，如步驟61，㈣待測發光組件7置放於承載 致能裝置31處固定，使待測發光組件7發光面朝上並坐落於遠 ® _職置33感職_職位置G;績於_ 62，由承載致能 装置31致能待測發光組件7，使複數發光元件％發光。 在此需強調’若以一條光棒上具有60顆LED晶粒，並被區 分為彼關隔交錯的六組，朗謂_複數發光元件發光並非 限制所有LED日日粒都必朗時發光’亦可聊例如—組十顆晶粒 •同夺被致纟b發光，其餘五組則暫時不點亮，其依照時序循序檢測， 並無不可。 。為便於說明起見，定義步驟63中，移動裝置Μ如圖$所示 驅動承載致能裝置31移動之方向，稱為預定移動方向，此預定移 9 201013165 動方向必麟應於上«纽件之長度方向，使得柄之待測發 植件7中，被點亮之第-個發歧件％由上述預備位置進入感 測裝置33之感測顧。且被點亮之發光元件7Q係關如一怪定 速度依序加人感峨圍巾。麵如圖6所示，所有受測發光元件 70完全進人感測裝置33感職圍，並稱此位置為完全感測位置 8卜假設所有被制之發光元件亮度均正常，彼此發光亮度差異 甚低’則量得之亮度將如圖9所示，由預備位置〇之全無亮度， φ 遞增至標示為對應完全感測位置81之極大值。 當然，如熟悉本技術領域者所能輕易理解，上述量測發光遞 增之程序，亦可被反向操作為遞減量測程序。為便於說明，將圖 7所示被點亮之各發光元件中的第一顆即將脫離感測裝置33之感 - 測範圍時，稱為預備脫離位置82 ;並逐步量測直到如圖8所示， 受測發光元件70到達全數脫離感測裝置33感測範圍的完測位置 E·’從而取得如圖9後半程所示，量得亮度輯應預備脫離位置 82之極大值，逐步遞減至對應完測位置E之原始基準亮度。 〇 如圖8所示，隨後遵照步驟64,將前述兩種度量感測過程中 任選一者（或兩者皆處理）’由處理裝置35依照彼此對應之感測訊 號與時間順序，於步驟65中，由感測訊號推算感測裝置33(太陽 能電池)對應受測物發光狀態反應之電性狀態變化，檢知發光組件 是否為良品。一旦有任何發光元件70未達預定標準，則如圖1〇 所示，原先之遞增上升趨勢（或遞減之下降曲線)將產生一處非理 想之折曲，即可依時間順序⑴計算出此未達良品標準之發光元件 : 位置在何處。 由於例如光棒之長度有日漸增長之趨勢，故如本發明第二實 201013165 施例圖11所示，當檢測機台4受到空間限制，感測裝置43之感 測範圍無法同時涵蓋發光組件7，内所有發光元件；則感測結果將 如圖12或圖13所示’仍可由上述預備位置0至所有被點亮發光 一牛中之最末*進人感測位置之完全感測位置’或由預備脫離 位置至完測位置E的狀態，清楚分析出不合格發光元件位置。 尤其，由於機械移動之速度遠遜於電訊號峨速度，故當圖 11所示左右兩側之發光元件分別屬於不同發光組別，或者是將例 Φ 如兩條(甚至更多條)光棒如圖11的左右排列接受檢測，亦可輪流 點亮左右兩排之晶粒、或輪流點亮兩（或更多）條光棒，藉以進一 步加速感測之產出效率。 由此可見，本發明可在各款式發光組件檢測中，循元件順序 - 所反應之發光狀態，迅速檢測其所具未符合標準之發光元件發光 狀態’並保持檢測機台檢驗結果的正確性，卻無須付出過多的成 本’立即出分辨不良品元件。 惟以上所述者，僅為本發明之較佳實施例而已，當不能以此 • 限定本發明實施之範圍，即大凡依本發明申請專利範圍及發明說 明内容所作簡單的等效變化與修飾，皆仍屬本發明專利涵蓋之範 圍内。 【圖式簡單說明】 圖1為一習知發光元件檢測機台之側視示意圖； 圖2為一習知具太陽能電池光接收裝置之檢測系統的立體示 1 意圖； 圖3為本發明第一實施例’發光組件位於感測範圍外之預備 位置的作動情形剖面示意圖； 11 201013165 - —圖4為本發明第一實施例’發光組件檢測機台檢測方法的流 程不意圖； 圖5為本發明第〜實施例，初位發光元件初始進入感測裝置 感測範圍之作動情形剖面示意圖； ® 6為本發明第—實施例’發光組件位於感測裝置感測範圍 内之完全感測位置的作動情形剖面示意圖； 圖7為本發明第—實施例’末位發光元件位於感測裝置感測 φ 範圍内之預備脫離位置之作動情形剖面示意圖； 圖8為本發明第一實施例，發光組件位於脫離感測裝置之感 測範圍的完測位置之作動情形剖面示意圖； 圖9為本發明第一實施例，感測裝置感測良品之發光組件檢 測流程的電性狀態示意圖； 圖10為本發明第一實施例，感測裝置感測具有未達良品標準 之發光元件的發光組件檢測流程之電性狀態示意圖； 圖11為本發明第二實施例’發光組件檢測機台之俯視示意 魏圖，[Technical Field] The present invention relates to a light-emitting component detecting machine and a detecting method thereof, and more particularly to a light-emitting component detecting machine having a plurality of light-emitting elements and a detecting method thereof. [Prior Art] As shown in Fig. 1, the integrating sphere is a hollow spherical cavity, and the inner wall of the spherical cavity is generally a reflective coating. When the integrating sphere is applied in practice, the light-emitting element 7 is emitted. The light beam is injected from the input hole below the integrating sphere, and after being diffused and reflected by the inner wall of the spherical cavity, the light energy absorbed by the cavity wall is determined according to the material of the coating, and the light-emitting elements to be tested are collected and collected in all directions. The emitted light is used by the spectral energy analyzer 14 to sample the optical power, waveform and energy from the output aperture above the integrating sphere 1 to calculate the original incident beam of the light-emitting element 70 to be tested. According to the above measuring structure of the integrating sphere 1, the light source to be tested needs to be placed in the integrating sphere 1, and the measuring light source needs to be taken out from the integrating sphere by the measuring sphere, which will cause the threshold of the measuring speed; in addition, the integrating sphere 1 In addition, it is not only necessary to additionally set the shutter to receive light, so as to prevent the direct beam from directly entering the sensing device; and the aging deterioration degree of the coating material of the inner wall of the ball cavity is interfered with by the spectral energy analyzer 14 to analyze the original incident light parameter. The quasi-breakage; in addition, the portion of the beam reflected from the input hole below the integrating sphere to the light-emitting element 70 is partially reflected back into the integrating sphere, and the surface condition of the light-emitting element is different. The difference, even if only the variation of 1% is assumed, will cause significant difficulties in measurement and subsequent calculation accuracy. Most seriously, once the volume of the light source to be tested is slightly larger, the integrating sphere not only causes an increase in the cost of the installation, but also causes troubles in the installation due to the large volume, forcing the architecture to be measured only in the laboratory. Use, do not deviate from the general production line; 5 201013165 Moreover, the size of the integrating sphere has its limit, when the object to be measured is, for example, a tens of centimeters long and narrow shape light bar, the corresponding integrating sphere diameter needs to reach The high cost, the slowness of the test object entering and exiting, the measurement is not easy to be correct with the above various factors, all of which proves that it is not good for the mass production of the factory. Not to mention the future size of the liquid crystal display. Increase, in line with this trend, the light bar itself is bound to grow gradually, farther than the current score of the integral ball can bear the responsibility. The new patent No. 7 purchased by the applicant in this case is shown in Fig. 2, and discloses a detecting machine from 2' whose sensing device 23 includes at least one solar cell (solar cell Ph〇t〇voltaic), In terms of the simple structure of the solar cell and the reasonable price, the detection machine 2 is cheaper and more competitive in the market; on the other hand, it has the characteristics of low reflection and high absorption, effectively avoiding the error caused by the reflection of human light. 'And increase the amount of hemp sensitivity; due to the good solar cell photo-detection characteristics, there is no need to worry about the change of the reflection coefficient of the test object; moreover, a spectral energy analyzer 24 can be used to obtain the spectral energy distribution of the light-emitting component 7 to be tested, so that The measurement accuracy is improved. In particular, by the combination of W solar energy, the effective range of the measurement range ^ p conforms to the continuous increase of the light source to be tested. However, this prior art only refers to the static sensing after the position of the light source to be measured. The pair of tests is performed. (4) The entire wire to be tested is not detailed. When a plurality of light-emitting elements are present in a group of light sources to be tested. What is wrong with the material of the light-emitting element; that is, if a problem occurs in a certain light-emitting component, it is necessary to further confirm the component of the light-emitting component through a step to further correct the correction. If you change the Lue's correctly, all the light-emitting components of the paid-up grades are all good products that meet the test standards, and quickly confirm the non-good test components, which will speed up the subsequent correction processing speed to improve the yield. In particular, this type of resolution is based on the same automated workflow of 6 201013165, and it is possible to quickly inspect the light-emitting components to be tested* (4) in the detection process, and solve the dilemma of manufacturers of light-emitting components and _light-emitting components. The best solution. SUMMARY OF THE INVENTION An object of the present invention is to provide a light-emitting component detecting machine which can quickly and clearly indicate which of a plurality of light-emitting elements in a light-emitting component is unqualified. Another object of the present invention is to provide a light-emitting component inspection machine having a highly simple compatibility with the original simple structure. Further, the present invention provides a low-level, low-cost, and fully automated, low-level component inspection machine for a light-emitting component. The present invention is also a purpose of providing a method for detecting a hair training component that does not require complicated devices and actions, and can be quickly-refined. The present invention relates to a light-emitting component having a plurality of light-emitting elements, a light-emitting component having a plurality of light-emitting components, and a light-emitting state of each of the light-emitting components, wherein the light-emitting components are arranged along a length direction. The detecting machine comprises: a set of bases disposed on the base, and a peripheral energy device capable of emitting light by using one of the light-emitting components as a side light-emitting component; a sensing range that can cover a plurality of light-emitting elements of the thin hair contact member, a sensing device that senses the light-emitting component of the phase light-emitting component and converts to an L峨 output. & 'Rotate the load-carrying device and the sense The position along the (4) is caused by the relative movement of the predetermined (four) direction of the length direction of the light-emitting component, and the illuminating tree of the sensation of the sensation of the sensation of the sensation of the illuminating device (four). 201013165 The above-mentioned material reading material is a component inspection method with a Wei number hairpin, and the light-emitting domain of the projecting material is arranged along a length direction, and the light is detected by the detection machine. Component φ component illuminating state, wherein the detecting splicing comprises a pedestal, a susceptor disposed on the pedestal for carrying and enabling the illuminating component to emit light, and the accommodating device is disposed on the pedestal a sensing device that emits 70 pieces of light and converts it into a sense signal output; and a set of moving devices that move the load enabling device and the turning device relative to each other in a moving direction The method comprises the steps of: a) arranging the illuminating components in the length direction. And placing the load-carrying device as the light-emitting component to be tested and transmitting the light-emitting components of the light-emitting component by the load-carrying device, b) Transmitting, by the device, the load enabling device and the sensing device in the predetermined moving direction such that the light emitting elements of the light emitting component to be tested sequentially enter and/or leave the range of the sensing device; and e) The job sensing is performed according to the light-emitting elements entering and/or taking off the sensory state, and the scale sensing illuminating amount is changed according to the sensing signal of the illuminating element «and _. According to the above, the present invention proposes a Wei component detecting machine having a plurality of light-emitting elements and a detecting method thereof for making the sensed light-emitting brightness by allowing a plurality of light-emitting elements in the light-emitting component to sequentially enter/detach the sensing range Step by step, simple increment or decrement, 'deny increase and decrease state and pre-deposit symbol', according to the speed of entering / Lin, immediately calculate = the problem of the light-emitting component in the position of the light-emitting component towel; not only with the middle of the person who owns the case Compatible and echo each other, and _step to achieve the 'instantly identify the wrong single-components in the automated inspection operation, accelerate the follow-up process, improve the output rate, especially the length of the light-emitting components to be tested, more suitable demand. 8 201013165 [Embodiment] The technical content, features and effects of the present invention will be clearly described in the following detailed description of the preferred embodiments with reference to the drawings, and for convenience of description, The illuminating component has a plurality of illuminating components arranged along a length direction, and omits a bracket circuit which is necessary for the base of the machine to avoid turbulence of the drawing. As shown in FIG. 3, this is the first embodiment of the present invention. The light-emitting component detecting machine is configured to supply the hair-emitting state of the light-emitting component 7 of the complex light-emitting element 7G, and includes three bases 30 and one. A set of load-carrying devices 3 for carrying and enabling the light-emitting assembly 7 is provided with a set of sensing devices capable of simultaneously sensing the plurality of light-emitting elements 7 and a set of mobile devices 32 for driving the load-carrying device 31. 3 and FIG. 4' 'This is the first embodiment of the present invention and its detection flow' and is taken as an example of a solar cell domain measuring device 33, and a light bar having a plurality of light emitting diodes as a plurality Illustrator of the illuminating unit 7G. When the detecting machine 3 starts to perform the detecting, as in step 61, (4) the illuminating unit 7 to be tested is placed at the load-carrying device 31, so that the illuminating unit 7 of the illuminating unit 7 to be tested faces upwards and is located at Far® _ position 33 Senses _ position G; performance _ 62, the illuminating component 7 is enabled by the load-carrying device 31, so that the plurality of illuminating elements are illuminated at %. It has 60 LED dies and is divided into six groups that are interlaced and interlaced. Light does not limit all LEDs when the day and the grain are all light. You can also talk about, for example, a group of ten crystal grains. The same five are not lit. The other five groups are not lit for the time being. For convenience of explanation, in the definition step 63, the moving device 驱动 drives the direction in which the load-carrying device 31 moves as shown in FIG. $, which is called a predetermined moving direction, and the predetermined shift is 9 201013165. «The length direction of the new member, so that the first of the illuminating member 7 to be tested, the illuminating first framing member % enters the sensing device 33 from the above-mentioned preparatory position, and the illuminated illuminating element The 7Q system is like a strange speed, and the scarf is added in sequence. As shown in Fig. 6, all the light-emitting elements 70 under test completely enter the sensing device 33, and the position is called the full sensing position. Assuming that all of the manufactured illuminating elements have normal brightness and low difference in illuminance between the two, the measured brightness will be as shown in Fig. 9. From the preliminary position 〇, there is no brightness, φ is incremented to the corresponding full sensing position 81. The maximum value. Of course, if you are familiar with the technology It can be easily understood by the domain that the above-mentioned procedure for measuring the incremental illumination can also be reversely operated as a decreasing measurement procedure. For convenience of explanation, the first of the illuminated light-emitting elements shown in FIG. 7 is about to be separated. When the sensing range of the sensing device 33 is measured, it is referred to as the preliminary disengagement position 82; and is gradually measured until the measured light-emitting element 70 reaches the measurement position of the sensing range of the full number of the sensing devices 33 as shown in FIG. 'According to the second half of Fig. 9, the measured brightness is prepared to be off the maximum value of the position 82, and gradually decreases to the original reference brightness corresponding to the measured position E. 〇 As shown in Fig. 8, then follow step 64, Optionally, one of the two metric sensing processes (or both) is processed by the processing device 35 in accordance with the sensing signals and time sequences corresponding to each other. In step 65, the sensing device 33 is estimated by the sensing signal ( The solar cell is associated with a change in the electrical state of the light-emitting state of the test object, and it is detected whether the light-emitting component is a good product. Once any of the illuminating elements 70 have not reached the predetermined standard, as shown in FIG. 1A, the original incremental upward trend (or the decreasing decreasing curve) will produce a non-ideal flex, which can be calculated in chronological order (1). Light-emitting components that do not meet the standard of good quality: Where is the location. Since the length of the light bar is increasing, for example, as shown in FIG. 11 of the second embodiment of the present invention 201013165, when the detecting machine 4 is limited by space, the sensing range of the sensing device 43 cannot cover the light-emitting component 7 at the same time. All the light-emitting elements in the same; the sensing result will be as shown in FIG. 12 or FIG. 13 'still from the above-mentioned preparatory position 0 to the fully-sensing position of the last* entering the sensing position of all the lighted ones. Or the position of the defective light-emitting element is clearly analyzed from the state of the preliminary disengagement position to the completion position E. In particular, since the speed of mechanical movement is much lower than the speed of the electric signal, the light-emitting elements on the left and right sides shown in FIG. 11 belong to different illumination groups, respectively, or the example Φ such as two (or even more) light rods. As shown in the left and right arrangement of FIG. 11, the pixels of the left and right rows or the two (or more) light bars are alternately illuminated to further accelerate the output efficiency of the sensing. It can be seen that the invention can quickly detect the illuminating state of the illuminating component that does not meet the standard by the component sequence-reacted illuminating state in the detection of each type of illuminating component, and maintain the correctness of the inspection result of the testing machine. But there is no need to pay too much cost 'to immediately identify defective components. However, the above is only a preferred embodiment of the present invention, and it is not intended to limit the scope of the invention, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention, All remain within the scope of the invention patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side view of a conventional light-emitting device detecting machine; FIG. 2 is a perspective view of a conventional detecting system for a solar cell light receiving device; FIG. Embodiment FIG. 4 is a cross-sectional view showing an operation situation of a light-emitting component at a preliminary position outside a sensing range; 11 201013165 - FIG. 4 is a flow chart of a method for detecting a light-emitting component detecting machine according to a first embodiment of the present invention; FIG. In the first embodiment, a cross-sectional view of the initial situation of the initial light-emitting element entering the sensing range of the sensing device; ® 6 is the actuation of the fully-sensing position of the light-emitting component within the sensing range of the sensing device according to the first embodiment of the present invention FIG. 7 is a schematic cross-sectional view showing the operation of the preliminary light-emitting element in the range of the sensing device φ within the range of sensing φ according to the first embodiment of the present invention; FIG. 8 is a first embodiment of the present invention, the light-emitting component is located FIG. 9 is a schematic diagram of an actuation situation of a measurement position of a sensing range of the sensing device; FIG. 9 is a first embodiment of the present invention, and the sensing device senses a good product. FIG. 10 is a schematic diagram showing an electrical state of a light-emitting component detecting process of a light-emitting component having a substandard standard according to a first embodiment of the present invention; FIG. The second embodiment of the 'light-emitting component detection machine is a top view of the Wei map,
W 圖12為本發明第二實施例，感測裝置感測良品之發光組件檢 測流程的電性狀態示意圖； 圖13為本發明第二實施例’感測裝置感測具有未達良品標準 之發光元件的發光組件檢測流程之電性狀態示意圖。 12FIG. 12 is a schematic diagram showing the electrical state of the detection process of the illumination component of the sensing device according to the second embodiment of the present invention; FIG. 13 is a second embodiment of the present invention, the sensing device senses the illumination with the unsatisfactory standard. A schematic diagram of the electrical state of the component's illumination component detection process. 12
201013165 【主要元件符號說明】 1.. .積分球 70.. .發光元件 14、24...光譜能量分析儀 31.. .承載致能裝置 23、33、43...感測裝置 61〜65...步驟 0...預備位置 E...完測位置 81.. .完全感測位置 82…預備脫離位置 2、3、4...檢測機台 7、7’…發光組件 30.. .基座 32.. .移動裝置 35.. .處理裝置201013165 [Explanation of main component symbols] 1.. Integrating sphere 70.. Light-emitting elements 14, 24... Spectral energy analyzer 31.. Load-carrying device 23, 33, 43... Sensing device 61~ 65...Step 0...Preparation position E...Completion position 81.. Full sensing position 82...Preparation disengagement position 2, 3, 4...Detection machine 7, 7'...Lighting assembly 30 .. . base 32.. mobile device 35.. processing device
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