201000852 九、發明說明： .【發明所屬之技術領域】 • 本發明涉及一種工件檢測裝置。 【先前技術】 工件在製造過程中都要經過檢測流程進對工 格進行=測，而工件之複雜形狀及對尺寸之高精度之心 在在使得工件在普通之檢測裝置中之定位變得十分困難 -般之檢測裝置需要一些卡扣等定位裂置對工件進行定 位，然而上述定&方式往往使得工件檢測過程中因定位裳 置之作用而發生不可預測之變形，使得工件在檢測之過輕 中產生不良，從而對工件之品質產生影響，進而影響工件 後續之加工使用。 【發明内容】 有雲於此’有必要提供一種可防止工件變形之工件檢 測裝置。 一種工件檢測装置，其包括一底座、一滑塊、一手柄、 複數定位磁體、複數檢測探針以及一測量塊。所述滑塊可 滑動地設置於所述底座上，所述手柄固設於所述滑塊上。 所述複數定位磁體分別設置於所述底座上用以吸附待檢測 工件’所述複數檢測探針分別設置於所述滑塊及所述底座 上，所述測量塊固設於所述滑塊上。 相較先前技術，本發明採用定位磁體藉由磁力固持待 檢測工件，從而防止待檢測工件檢測時變形。 【實施方式】 201000852 請參閱圖1及圖2,本發明較佳實施方式提供之工件檢 測裝置100，其包括一底座110、一滑塊120、一手柄130、 複數定位磁體140、複數檢測探針150以及一測量塊160。 所述滑塊120可滑動地設置於所述底座110上，所述手柄 130固設於所述滑塊120上，所述複數定位磁體140分別設 置於所述底座110上用以吸附待檢測工件，所述複數檢測 探針150分別設置於所述滑塊120及所述底座110上，所 述測量塊160設置於所述滑塊120上。 所述底座110為一方形之承載體，該底座110包括一 作為檢測基準面之上表面112、平行於所述上表面112之下 表面113以及兩組相互垂直且分別位於所述上表面112及 下表面113之間之兩個端面114及兩個側面115。在該底座 110之上表面112上開設有一方形且貫穿該底座110之兩端 面114之沉槽116。在所述沉槽116之槽底116a上開設有 一寬度小於所述沉槽116寬度之條狀開孔118，該開孔118 貫穿所述底座110之下表面113。在所述底座110之沉槽 116兩側之上表面112之一端開設有貫穿所述底座110之側 面115以及端面114之兩個開槽117。在所述底座110上與 所述開槽117相對之另一端沉槽116兩侧之上表面112上 分別開設有兩個凹槽119，所述凹槽119用以容置所述定位 磁體140。所述部分檢測探針150分別垂直設置於所述底座 110之上表面112上以及所述開槽117之底部用以穿過待檢 測工件上之穿孔（圖未標）。 所述滑塊120用以設置於所述底座110之沉槽116中， 7 201000852 並沿所述沉槽116滑動。該滑塊120包括一第一表面122、 與該第一表面122相對之第二表面124以及位於第一、二 表面122、124之間之兩組相互垂直之端壁126及側壁128。 於所述滑塊120之上表面122上開設有貫穿所述側壁128 之凹室123,該凹室123 —側形成一凸條125,於該凸條125 之内侧壁125a上並排開設有兩個貫穿所述内側壁125a及 鄰近端壁126之穿孔125b，所述穿孔125b内設置有兩個檢 測探針150用以對工件進行檢測。於所述凹室123與所述 凸條125相對之側壁123a上形成有多級臺階127。 所述手柄130為一桿狀物，其一端固設於所述滑塊120 與所述凸條125相對之另一端之第一表面122上。用以在 外力之作用下帶動所述滑塊120沿所述底座110之沉槽116 滑動。 所述定位磁體140為兩個可收容於所述底座110之凹 槽119内之磁鐵用以吸附待檢測工件，所述定位磁體140 之高度等於或者略小於所述凹槽119之深度，當所述定位 磁體140設置於所述凹槽119内時該定位磁體140之上表 面與所述底座110之上表面112平齊或者略低於所述底座 110之上表面112。 所述檢測探針150為設置於所述底座110及滑塊120 上之複數可具有不同高度及不同直徑之柱狀體，其用以於 檢測待檢測工件時穿過待檢測工件上之需要檢測之通孔， 以確定待檢測工件是否合格。 所述測量塊160用以藉由卡合方式對待檢測工件進行 8 201000852 檢測，其包括一基體162，該基體162包括一頂面164、一 ♦ 平行於所述頂面164之底面166以及兩個位於所述頂面164 . 及底面166之間且相互平行之外壁168。沿著所述基體162 之頂面164及底面166從所述基體162之一側外壁168上 分別延伸出兩個相互平行間隔之卡板163，其中，與所述基 體162之底面166相連接之卡板163延伸之長度大於所述 與基體162之頂面164相連接之卡板163之長度。所述測 量塊160藉由其基體162之底面166設置於所述滑塊120 與所述第一表面122鄰近之臺階127上。 可以理解，為了防止所述滑塊120從所述基座110之 沉槽116中滑落，可以於所述滑塊120之第二表面124對 應所述底座110之開孔118之位置處上設置一限位塊170， 用以限制該滑塊120於底座110之沉槽116中之滑動行程。 請參閱圖3，為本發明工件檢測裝置100之使用狀態 圖，一可導磁之待檢測工件200放置於所述工件檢測裝置 100上，所述待檢測工件200之一側抵靠於所述工件檢測裝 置100之底座110之上表面112上，並由所述磁體140吸 附使所述待檢測工件200可靠之定位於所述底座110上。 設置於所述檢測底座110上之檢測探針150穿過所述待檢 測工件200上之複數待檢測孔中用以確認待檢測工件200 上之通孔是否合格。藉由所述手柄130撥動所述滑動120 沿所述底座110之沉槽116向所述待檢測工件200移動， 所述設置於滑塊120之凸條125上之檢測探針150穿入所 述待檢測工件200中部之通孔，用以檢測其是否合格，設 9 201000852 置於所述滑塊120上之測量換 %仏&、+w+ μ 鬼160之兩個卡板163分別卡 寺檢測工件200之端部上下兩 測工件200端部之厚度尺寸是否合格。 "乂本么月中’知用定位磁體藉由磁力固持待檢測工件， 7防止待檢測工件制其他之卡扣等定位結構時可能產 土之躲測工件變形’此外，採用一可以滑動之滑塊帶動 ^量塊之方5¾對待檢測卫件進行測量其檢測速度快，精 ^高’同_述測量塊可根據不同之待檢測工件進行更換 攸而極大之提高了工件檢測裝置之適用性。 可以理解，所述滑塊12〇上之多層臺階127之交接處 可採用11弧形曲面過渡，從而使得具有相應之曲面形狀之 待檢測工件200之可抵靠於所述曲面上，從而提高待檢測 工件200之檢測精度。 綜上所述，本發明確已符合發明專利之要件，遂依法 提出專利申請。惟，以上所述者僅為本發明之較佳實施方 式，自不能以此限制本案之申請專利範圍。舉凡熟悉本案 技藝之人士援依本發明之精神所作之等效修飾或變化，皆 應涵蓋於以下申請專利範圍内。 【圖式簡單說明】 圖1係本發明工件檢測裝置較佳實施方式之立體分解 示意圖； 圖2係圖1中工件檢測裝置之組裝示意圖； 圖3係圖2中工件檢測裝置之使用狀態圖。 【主要元件符號說明】 201000852 工件檢測裝置 100 底座 110 上表面 112 下表面 113 端面 114 側面 115 沉槽 116 槽底 116a 開孔 118 開槽 117 凹槽 119 滑塊 120 第一表面 122 凹室 123 第二表面 124 凸條 125 内側壁 125a 穿孔 125b 端壁 126 側壁 128 臺階 127 手柄 130 定位磁體 140 探針 150 測量塊 160 基體 162 卡板 163 頂面 164 底面 166 外壁 168 限位塊 170 檢測工件 200 11201000852 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a workpiece detecting device. [Prior Art] During the manufacturing process, the workpiece is subjected to the inspection process to test the work, and the complex shape of the workpiece and the high precision of the dimensions are making the position of the workpiece in the ordinary detection device very Difficult-like detection devices require some positioning cracks such as snaps to position the workpiece. However, the above-mentioned setting & method often causes unpredictable deformation due to the positioning of the workpiece during the workpiece inspection process, so that the workpiece is in the process of detection. Bad in the light, which affects the quality of the workpiece, which in turn affects the subsequent processing of the workpiece. SUMMARY OF THE INVENTION There is a need for a workpiece detecting device that prevents deformation of a workpiece. A workpiece detecting device includes a base, a slider, a handle, a plurality of positioning magnets, a plurality of detecting probes, and a measuring block. The slider is slidably disposed on the base, and the handle is fixed on the slider. The plurality of positioning magnets are respectively disposed on the base for adsorbing the workpiece to be inspected. The plurality of detecting probes are respectively disposed on the slider and the base, and the measuring block is fixed on the slider. . Compared with the prior art, the present invention uses a positioning magnet to hold a workpiece to be inspected by magnetic force, thereby preventing deformation of the workpiece to be inspected when it is detected. [0086] Referring to FIG. 1 and FIG. 2, a workpiece detecting apparatus 100 according to a preferred embodiment of the present invention includes a base 110, a slider 120, a handle 130, a plurality of positioning magnets 140, and a plurality of detecting probes. 150 and a measurement block 160. The slider 120 is slidably disposed on the base 110, and the handle 130 is fixed on the slider 120. The plurality of positioning magnets 140 are respectively disposed on the base 110 for adsorbing workpieces to be detected. The plurality of detecting probes 150 are respectively disposed on the slider 120 and the base 110, and the measuring block 160 is disposed on the slider 120. The base 110 is a square carrier. The base 110 includes a top surface 112 as a detection reference surface, a lower surface 113 opposite to the upper surface 112, and two sets of mutually perpendicular and respectively located on the upper surface 112. Two end faces 114 and two side faces 115 between the lower surfaces 113. A sunken groove 116 is formed in the upper surface 112 of the base 110 and extends through the opposite ends 114 of the base 110. A strip opening 118 having a width smaller than a width of the sinking groove 116 is defined in the groove bottom 116a of the sinking groove 116, and the opening 118 extends through the lower surface 113 of the base 110. Two slots 117 extending through the side surface 115 of the base 110 and the end surface 114 are formed at one end of the upper surface 112 of the sinking groove 116 of the base 110. Two grooves 119 are defined in the upper surface 112 of the other end of the sinking groove 116 opposite to the slot 117, and the recess 119 is for receiving the positioning magnet 140. The partial detecting probes 150 are vertically disposed on the upper surface 112 of the base 110 and the bottom of the slot 117 for passing through the through holes (not labeled) on the workpiece to be inspected. The slider 120 is disposed in the sinking groove 116 of the base 110, 7 201000852 and slides along the sinking groove 116. The slider 120 includes a first surface 122, a second surface 124 opposite the first surface 122, and two sets of mutually perpendicular end walls 126 and sidewalls 128 between the first and second surfaces 122, 124. An alcove 123 is formed in the upper surface 122 of the slider 120, and a recess 125 is formed on the side of the recess 123. The recess 123 is formed on the inner side wall 125a of the rib 125. Through the inner side wall 125a and the through hole 125b adjacent to the end wall 126, two detecting probes 150 are disposed in the through hole 125b for detecting the workpiece. A plurality of steps 127 are formed on the side wall 123a of the recess 123 opposite to the ridge 125. The handle 130 is a rod, and one end thereof is fixed on the first surface 122 of the other end of the slider 120 opposite to the ridge 125. The slider 120 is slid along the sinking groove 116 of the base 110 by an external force. The positioning magnets 140 are two magnets that can be received in the grooves 119 of the base 110 for adsorbing the workpiece to be inspected. The height of the positioning magnets 140 is equal to or slightly smaller than the depth of the grooves 119. When the positioning magnet 140 is disposed in the groove 119, the upper surface of the positioning magnet 140 is flush with or slightly lower than the upper surface 112 of the base 110. The detecting probe 150 is a plurality of columnar bodies of different heights and different diameters disposed on the base 110 and the slider 120 for detecting the need to detect the workpiece to be inspected while detecting the workpiece to be inspected. Through holes to determine whether the workpiece to be inspected is qualified. The measuring block 160 is configured to perform 8 201000852 detection on the workpiece to be inspected by a snapping manner, and includes a base 162 including a top surface 164, a bottom surface 166 parallel to the top surface 164, and two An outer wall 168 is located between the top surface 164 and the bottom surface 166 and parallel to each other. Two mutually parallel spaced card plates 163 are respectively extended from the one side outer wall 168 of the base 162 along the top surface 164 and the bottom surface 166 of the base 162, and are connected to the bottom surface 166 of the base body 162. The length of the card 163 extends is greater than the length of the card 163 that is coupled to the top surface 164 of the base 162. The measuring block 160 is disposed on the step 127 of the slider 120 adjacent to the first surface 122 by the bottom surface 166 of the base 162 thereof. It can be understood that, in order to prevent the slider 120 from sliding down from the sinking groove 116 of the base 110, a second surface 124 of the slider 120 may be disposed at a position corresponding to the opening 118 of the base 110. The limiting block 170 is configured to limit the sliding stroke of the slider 120 in the sinking groove 116 of the base 110. 3 is a view showing a state of use of the workpiece detecting device 100 of the present invention, a magnetically permeable workpiece 200 to be inspected is placed on the workpiece detecting device 100, and one side of the workpiece to be inspected 200 abuts against the The upper surface 112 of the base 110 of the workpiece detecting device 100 is adsorbed by the magnet 140 to reliably position the workpiece 200 to be inspected on the base 110. A detecting probe 150 disposed on the detecting base 110 passes through a plurality of to-be-detected holes on the workpiece to be inspected 200 for confirming whether or not the through hole on the workpiece 200 to be inspected is acceptable. The slide 120 is moved by the handle 130 to the workpiece 200 to be detected along the sinking groove 116 of the base 110. The detecting probe 150 disposed on the rib 125 of the slider 120 penetrates into the workpiece The through hole in the middle of the workpiece 200 is detected to detect whether it is qualified. The setting is 9 201000852. The measurement placed on the slider 120 is changed to % 仏 &, + w + μ 鬼 160 two cards 163 respectively It is detected whether the thickness dimension of the end portion of the upper and lower workpieces 200 of the workpiece 200 is acceptable. "乂本月月中' knowing the positioning of the magnet by magnetically holding the workpiece to be inspected, 7 preventing the workpiece to be inspected from making other snaps and other positioning structures, and possibly producing the soil to avoid the deformation of the workpiece. In addition, a sliding can be used The slider drives the square of the measuring block. The measuring speed of the measuring piece is fast, and the precision of the measuring piece can be replaced according to different workpieces to be tested, which greatly improves the applicability of the workpiece detecting device. . It can be understood that the intersection of the multi-layered steps 127 on the slider 12 can adopt 11 curved curved surface transitions, so that the workpiece 200 to be inspected having the corresponding curved shape can abut against the curved surface, thereby improving the waiting The detection accuracy of the workpiece 200 is detected. In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the present invention are intended to be included within the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a perspective exploded view of a preferred embodiment of the workpiece detecting device of the present invention; Fig. 2 is a schematic view showing the assembly of the workpiece detecting device of Fig. 1; Fig. 3 is a view showing the state of use of the workpiece detecting device of Fig. 2. [Main component symbol description] 201000852 Workpiece inspection device 100 Base 110 Upper surface 112 Lower surface 113 End surface 114 Side 115 Sink 116 Slot bottom 116a Opening 118 Slot 117 Groove 119 Slider 120 First surface 122 Alcove 123 Second Surface 124 rib 125 inner side wall 125a perforation 125b end wall 126 side wall 128 step 127 handle 130 positioning magnet 140 probe 150 measuring block 160 base 162 card 163 top surface 164 bottom surface 166 outer wall 168 limit block 170 inspection workpiece 200 11