TW200949265A - Ultrahigh frequency RFID planar testing system and method - Google Patents
Ultrahigh frequency RFID planar testing system and method Download PDFInfo
- Publication number
- TW200949265A TW200949265A TW97119652A TW97119652A TW200949265A TW 200949265 A TW200949265 A TW 200949265A TW 97119652 A TW97119652 A TW 97119652A TW 97119652 A TW97119652 A TW 97119652A TW 200949265 A TW200949265 A TW 200949265A
- Authority
- TW
- Taiwan
- Prior art keywords
- planar
- line
- substrate
- coupling
- tester
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 29
- 238000010168 coupling process Methods 0.000 claims description 37
- 238000005859 coupling reaction Methods 0.000 claims description 37
- 230000008878 coupling Effects 0.000 claims description 36
- 238000004458 analytical method Methods 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 15
- 239000011159 matrix material Substances 0.000 claims description 10
- 238000000691 measurement method Methods 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 3
- 230000002950 deficient Effects 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 16
- 230000005540 biological transmission Effects 0.000 description 15
- 238000004088 simulation Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 208000003251 Pruritus Diseases 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000011031 large-scale manufacturing process Methods 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000007803 itching Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000035755 proliferation Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000012916 structural analysis Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
- 238000009941 weaving Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97119652A TW200949265A (en) | 2008-05-28 | 2008-05-28 | Ultrahigh frequency RFID planar testing system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97119652A TW200949265A (en) | 2008-05-28 | 2008-05-28 | Ultrahigh frequency RFID planar testing system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200949265A true TW200949265A (en) | 2009-12-01 |
| TWI375042B TWI375042B (enExample) | 2012-10-21 |
Family
ID=44870880
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97119652A TW200949265A (en) | 2008-05-28 | 2008-05-28 | Ultrahigh frequency RFID planar testing system and method |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200949265A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI595242B (zh) * | 2012-03-28 | 2017-08-11 | Rosenberger Hochfrequenztechnik Gmbh & Co Kg | Time-distance measurement with bandwidth correction |
| WO2021009253A1 (en) * | 2019-07-15 | 2021-01-21 | Emblation Limited | Portable test apparatus and method of testing rf/microwave treatment system |
-
2008
- 2008-05-28 TW TW97119652A patent/TW200949265A/zh not_active IP Right Cessation
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI595242B (zh) * | 2012-03-28 | 2017-08-11 | Rosenberger Hochfrequenztechnik Gmbh & Co Kg | Time-distance measurement with bandwidth correction |
| WO2021009253A1 (en) * | 2019-07-15 | 2021-01-21 | Emblation Limited | Portable test apparatus and method of testing rf/microwave treatment system |
| EP3998979A1 (en) * | 2019-07-15 | 2022-05-25 | Emblation Limited | Portable test apparatus and method of testing rf/microwave treatment system |
| US12174242B2 (en) | 2019-07-15 | 2024-12-24 | Emblation Limited | Portable test apparatus and method of testing RF/microwave treatment system |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI375042B (enExample) | 2012-10-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9164159B2 (en) | Methods for validating radio-frequency test stations | |
| CN104297566B (zh) | 超高频射频识别电子标签上的天线阻抗测量方法 | |
| CN101750541B (zh) | 无线射频识别电子标签天线复阻抗测试装置及方法 | |
| CN101672874A (zh) | 微带传输线阻抗参数测试方法 | |
| CN103605102B (zh) | 用于电磁兼容试验的辐射发射测量天线的现场校准方法 | |
| CN106483384A (zh) | 电介质介电常数微波测量装置 | |
| CN103926547B (zh) | 射频识别测试仪校准方法 | |
| CN104297567A (zh) | 用于测量超高频射频识别电子标签上天线阻抗的夹具 | |
| CN102162824A (zh) | 超高频射频识别电子标签天线大规模生产在线测试方法 | |
| CN108833031B (zh) | 射频电路调试方法及相关产品 | |
| CN107026325B (zh) | 一种射频识别标签天线阻抗匹配连接装置 | |
| CN116165411A (zh) | 电场探头的校准方法、装置和系统 | |
| TW200949265A (en) | Ultrahigh frequency RFID planar testing system and method | |
| CN112255462B (zh) | 用于网络分析仪的方向性提高装置、方法和网络分析仪 | |
| KR100953119B1 (ko) | 등가포트회로 및 등가임피던스회로를 이용한 광대역능동다이폴안테나 설계 및 측정 방법 | |
| CN110018351A (zh) | 一种非接触式天线阻抗测量方法及其测量系统 | |
| CN114487611A (zh) | 一种电磁参数测试方法、装置、终端设备和存储介质 | |
| CN109001500A (zh) | 一种内嵌电感的射频器件测试探针 | |
| JP3912428B2 (ja) | 電子部品の高周波電気特性測定方法および装置、高周波電気特性測定装置の校正方法 | |
| CN206922015U (zh) | 一种射频识别标签天线阻抗匹配连接装置 | |
| CN103176056B (zh) | 基于矢量网络分析仪的贴片电容测试装置及方法 | |
| JP2018151211A (ja) | 高周波インピーダンス測定方法 | |
| CN209471158U (zh) | 一种内嵌电感的射频器件测试探针 | |
| TWI464421B (zh) | 近場通訊天線輔助設計系統及近場通訊天線輔助設計方法 | |
| CN108132450B (zh) | 基于数据融合机制的宽带电场传感器平坦度优化方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |