200949258 九、發明說明： 【發明所屬之技術領域】 本發明涉及一種阻抗測試裝置，尤其涉及一種可自 •動進行複數點阻抗測試之阻抗測試裝置。 -【先前技術】 於電子元器件製造領域中，各電子元器件於裝配使用 之别，為使其具備導電、遮罩等功能，一般都必須對所述 ，子兀器件進行阻抗測試，以確認該電子元器件之阻抗值 是否於客戶要求之規格内。通常，客戶會於電子元器件之 藍圖上標注出複數阻抗測量點之測試位置，並標示某個測 试點為公共點’要求檢測其餘阻抗測試點與公共點之間之 阻抗值。 於整個測試過程中，檢測人員需利用萬用表或阻抗儀 手動測試所述電子元件之公共點與其餘各阻抗測試點之 ❹ =之阻抗值’每測試完—次所述電子^件之公共點與其餘 阻抗測4點之間之阻抗值，就需要從所述萬用表或阻抗 =讀取並手動記錄該測得之阻抗資料。接下來，重複上 m 直至將所有資料測試完。最後，需要將記錄之測 2料導人到電㈣進行分析，以確定所述電子元件是否 目:客戶要求。整個測試過程繁靖、且測試誤差比較大， 測試效率低。 【發明内容】 有鑒於it匕有必要提供一種測試過程簡單、誤差小， 且可有效提冋測試效率之阻抗測試裝置。 7 200949258 一種阻抗測試裝置，用於對待測試工件進行阻抗測 試’所述阻抗測試包括一測試平台、一驅動裝置、複數測 試探針、一資訊處理裝置、一顯示器、一萬用表、一繼電 -器模組、複數控制按鈕；所述測試平台包括一底座及一探 -針女裝架，所述底座用於放置所述待測試工件，所述探針 安裝架可調節地裝設於該底座上方位置處；所述驅動裝置 裝設於所述底座上’並與所述探針安裝架固接以驅動所述 ❹探針安裝架相對放置於底座上之待測試工件移動；所述複 數測試探針裝設於所述探針安裝架上，並與所述繼電器模 組電性連接；所述資訊處理裝置裝設於所述底座内，其包 括一中央處理器，該中央處理器與所述複數控制按鈕、驅 動裝置、顯示器、繼電器模組及萬用表電性連接，用於接 收指令並驅動所述驅動裝置、萬用表及繼電器模組工作， 並對測得之結果進行比較分析；所述控制按鈕用於向阻抗 測試裝置輸入相關指令，所述顯示器用於顯示相關輸入指 ❹令及測試結果，所述繼電器模組用於控制所述測試探針並 驅動所述萬用表進行阻抗測試。 相較於習知技術，本發明所述阻抗測試裝置可一次性 自動對待測试工件上之複數個阻抗測試點進行阻抗測 試同時對測试結果進行分析，並將每次測得之阻抗值進 行存儲，從而有效提高了阻抗測試效率及測試品質。 【實施方式】 請參閱圖1，所示為本發明阻抗測試裝置1〇〇之硬體 架構不意圖。所述阻抗測試装置1〇〇用於對一待測試工件 200949258 200(見圖4)進行阻抗測試，以檢測其阻抗值是否於規定之 範圍内。所述阻抗測試裝置100包括一測試平台10、一 驅動裝置20、複數測試探針30、一資訊處理裝置40、一 -顯示器50、一萬用表60、一繼電器模組70、一存儲卡80 .及複數控制按鈕90。 請一併參閱圖2及圖3，所述測試平台10用於裝夾、 定位所述待測試工件200，該測試平台10包括一底座11、 二卡持塊13、一工件安裝治具15、一監測裝置17及一探 針安裝架19。所述底座11大致呈矩形箱體狀，其包括一 頂板113、一操作面板115及一防護板117。所述頂板113 大致呈矩形平板狀，其上大致中部位置處貫通開設有一大 致矩形之安裝孔1132及一連接通孔1135。所述頂板113 上靠近其一侧緣位置處沿垂直於頂板113方向相對固設有 二圓柱形導滑塊1137。所述操作面板115大致呈矩形板 狀，其沿垂直於所述頂板113方向裝設於所述底座11之 ❹一側面上。所述操作面板115上貫通開設有一條形存儲卡 安裝孔1151及裝設有所述複數控制按鈕90與所述顯示器 50。所述防護板117大致呈“U”形板狀，其固定裝設於 所述頂板113上靠近其一侧之周緣位置處，並與所述頂板 113共同圍成一容置空間118。所述二導滑塊1137容置於 所述容置空間118内。 所述卡持塊13橫截面大致呈L形，其一側緣位置處 貫通開設有一條形滑槽132。所述二卡持塊13沿垂直於 所述操作面板115方向相對間隔地固定裝設於所述底座 200949258 11之頂板113上，並位於所述安裝孔1132之二侧。所述 二卡持塊13與所述底座11之頂板113共同圍成一大致 “凸”形之裝設空間（圖未標示），以用於裝設所述工件 -安裝治具15。所述工件安裝治具15橫截面大致呈“凸” -形塊狀，其包括一主體部151、二由所述主體部151二側 相對延伸之滑塊153、一工件安裝部155及一推杆158。 所述二滑塊153之末端部分別設有一安裝孔1532，用於 將所述工件安裝治具153可滑動地裝設於所述卡持塊13 〇 上，以防止其與卡持塊13脫離。所述工件安裝部155大 致呈矩形凹腔狀，其凹設於所述主體部151上，用於裝設 待測試工件200。所述推杆158大致呈圓柱形杆狀，其固 接於所述主體部151上。所述工件安裝治具15藉由其二 侧之滑塊153對應可滑動地配合裝設於所述固定裝設於 所述頂板13上之二卡持塊之間。 所述監測裝置17為一光纖傳感器，其裝設於所述安 ◎裝孔1132上並電性連接於所述資訊處理裝置40上，以用 於阻抗測試過程中檢測所述待測試工件200是否準確定 位或監測所述待測試工件200上方是否被遮蔽、阻礙。所 述探針安裝架19大致呈“T”形板狀，其包括一連接端 191及一探針安裝端193。所述連接端191之二端對應於 所述二導滑塊1137各設有一導滑通孔1912，以使得所述 探針安裝架19可滑動地裝設於所述二導滑塊1137上。所 述連接端191之大致中部位置處凸設有一固定塊1915, 以將所述探針安裝架19固定裝設於所述驅動裝置20上。 200949258 所述探針安裝端193貫通開設有用於裝設所述複數探針 30之複數探針安裝通孔1932及一連接通孔1935。 所述驅動裝置20裝設於所述測試平台10之底座11 •之頂板113之上方，並容置於所述容置空間118内。所述 •驅動裝置20與所述探針安裝架19之連接端191固接，以 驅動所述探針安裝架19沿所述導滑塊1137上下滑移，從 而帶動所述探針30上下滑移。於本實施例中，所述驅動 裝置20包括一安裝板21、一汽缸23、一導接板25、一 〇 電磁閥26、一進氣管27及一出氣管28。所述安裝板21 大致呈矩形平板狀，其固定裝設於所述防護板117上，並 罩設於容置空間118及二導滑塊1137上方。所述安裝板 21上貫通開設有一通孔212。所述汽缸23大致呈圓柱體 狀，其包括一缸體231、一進氣管安裝端233、一出氣管 安裝端235及一可滑動地裝設於缸體231内之活塞237。 所述導接板25大致呈矩形板狀，其中部位置處貫通開設 ◎ 有一安裝通孔251，該導接板25固定裝設於所述汽缸23 之出氣管安裝端235上，並固定裝設於所述二導滑塊1137 上。所述電磁閥26固定裝設於所述測試平台10之底座11 之防護板117上，用以實現對所述汽缸23之控制。所述 電磁閥26包括一與外界氣源連接之氣源輸入端261、一 進氣管連接端263及一出氣管連接端265。所述進氣管27 及出氣管28之二端分別固定連接於所述電磁閥26之進氣 管連接端263、出氣管連接端265及汽缸23之進氣管安 裝端233、出氣管安裝端235上。 11 200949258 所述複數測試探針30對應地裝設於所述探針安裴架 19之複數探針安裝通孔1932内’並從該探針安裝架19 之另-側伸出，纟另-端藉由導、線33與所述繼電器模組 • 70電性連接。 、’ ❹ • 所述資訊處理裝置40為一積體電路板，其裝設於所 述底座11内。所述資訊處理裝置4〇包括一中央處理器 41、一驅動裝置連接端口 42、一顯示器接口牦、、一萬用 表連接端口 46、一繼電器控制端口 47、一存儲卡卡座佔 及一輸入控制端口 49。所述驅動裝置連接端口 C、顯示 器接口 45、萬用表連接端口 46、繼電器控制端口竹、存 儲卡卡座48及輸入控制端口 49均與所述中央處理器μ 電性連接，並分別對應地與驅動裝置20、顯示器5〇、萬 用表60、繼電器模組7〇、存儲卡8〇及輸入控制按紐細 電佳連接。使用時，可藉由所述輸入控制按紐90輸入相 關控制資訊，例如：開啟/關閉所述阻抗測試農置⑽、對 所述阻抗測試裝置1〇〇進行參數設置等。所述中央處理器 接收到藉由所述輸入控制按鈕9〇輸入之相關控制指令 後你可驅動所述驅動裝置2〇、萬用表6〇及繼電器模組 5^上及t將丨測得之結果進行比較分析，顯示於所述顯示器 將測试結果存儲於存儲卡80上。 张、述萬用表6〇裝設於所述底座11内，其電性連接於 所=喊縣置4Q之萬用表連接端口 46上，並與所述 繼電器模組7〇電性連接。 、 所述繼電器模組70裝設於所述測試平台1〇之底座u 12 200949258 内，其電性連接於所述資訊處理裝置40之繼電器控制端 口 47上，並與所述萬用表60及所述複數測試探針30電 性連接。 • 所述存儲卡80可拆卸地裝設於所述操作面板115之 .存儲卡安裝孔1151内，並容置、電性連接於所述資訊處 理裝置40之存儲卡卡座48内。 請參閱圖3，組裝所述阻抗測試裝置100時，先將所 述二卡持塊13相對固定裝設於所述底座11之頂板113 〇 上，並位於所述安裝通孔1132及連接通孔1135之二侧， 以使得所述二卡持塊13與頂板113共同圍成一橫截面大 致“凸”形之裝設空間。接下來，將所述工件安裝治具 15可滑動地裝設於所述底座11之頂板Π3與該二卡持塊 13圍成之“凸”形裝設空間内；同時，採用二螺釘或銷 釘分別穿過所述工件安裝治具15二侧之滑塊153上之安 裝孔1532，從而使得所述工件安裝治具15可沿所述卡持 ◎塊13上之條形滑槽132限定之路徑來回滑動。再接下來， 將所述監測裝置17固定裝設於所述頂板113之安裝孔 1132内並電性連接於所述資訊處理裝置40上。將所述探 針安裝架19之連接端191二端之導滑通孔1912對準所述 底座11之頂板113上之二導滑塊1137，以使得所述探針 安裝架19之探針安裝端193朝向工件安裝治具15方向可 滑動地裝設於該二導滑塊1137上。將所述複數測試探針 30對應地裝設於探針安裝架19之探針安裝端193之複數 探針安裝通孔1932，並從該探針安裝端193之另一侧伸 13 200949258 出；該測試探針30之導線33端穿過所述探針安裝架19 上之連接通孔1935及底座11之頂板113上之連接通孔 1135進入到底座11内。 再接下來，組裝所述驅動裝置20，將所述汽缸23之 出氣管235端之活塞237穿過所述導接板25之安裝通孔 151，並固定裝設於所述探針安裝架19之連接端191上之 固定塊1915上；同時，將所述導接板25之二端對應固接 於所述頂板113之二道滑塊1137之末端上。再接下來， 將所述汽缸23之進氣管231端穿過所述安裝板21之通孔 212，並將該安裝板21固定裝設於所述底座11之防護板 117上方。將所述電磁閥26裝設於所述防護板117之一側 板上，同時將進氣管27之二端分別裝設於所述電磁閥26 之進氣管連接端263及汽缸23之進氣管安裝端233上； 將所述出氣管28之二端分別裝設於所述電磁閥26之出氣 管連接端265及汽缸23之出氣管安裝端235。 最後，將所述資訊處理裝置40、萬用表60及繼電器 模組70裝設於所述底座11内，該資訊處理裝置40之驅 動裝置連接端口 42、顯示器接口 45、萬用表連接端口 46、 繼電器控制端口 47、存儲卡卡座48及輸入控制端口 49 分別對應地與所述驅動裝置20、顯示器50、萬用表60、 繼電器模組70、存儲卡80及輸入控制按鈕90電性連接。 將所述測試探針30之導線33端電性連接於所述繼電器模 組70上，即完成所述阻抗測試裝置100之組裝。 請一併參閱圖4及圖5，利用所述阻抗測試裝置100 14 200949258 '對待測試工件200進行阻抗測試時，先開啟所述阻抗測試 裝置100，並將所述存儲卡8〇插設於所述操作面板 之存儲卡安裝孔1151令。接下來，將所述待測試工件2〇〇 .放置於所述工件安裝治具15之工件安裝部155上，推動 •所述推杆158使所述工件安裝治具15沿所述二卡持塊13 之條形滑槽132朝向探針安裝架19方向滑移直至其剛好 位於所述探針安裝架19之正下方。所述監測裝置17檢測 所述待測試工件200是否準確定位或監測 0件上方是否被遮蔽、阻礙。再接下來，媒動所二 裝置20’使其帶動探針安裝架19向下移動，所述裝設於 探針安裝架19上之複數測試探針3〇分別對應地抿持於所 述待測試工件200之各阻抗測試點上。所述待測試工件 200之各阻抗測試點藉由各測試探針3〇與萬用表、繼 電器模組70及資訊處理裝置4〇共同形成複數測試回路。 所述資訊處理裝置40對所述萬用表6〇進行清零處理後， ❹對待測試工件200之各阻抗測試點進行阻抗測試，並對每 次測得之阻抗值進行分析，將分析結果顯示於所述顯示器 5 〇上。於測試過程中，所述繼電器模組7 〇自動依次切換、 通斷所述待測試工件200之各阻抗測試點與萬用表肋形 成之測試回路，從而實現對各阻抗測試點地阻抗測試。每 次測得之各阻抗值被自動存儲於所述存儲卡8〇中。測試 完成後’關閉所述阻抗測試裝置100,即完成所述待測試 工件200之阻抗測試工作，可將所述存儲於存儲卡⑽中 之測試資料導入到電腦中進行相關編輯分析。 15 200949258 、、可以理解，所述監測裝置亦可以為-光感應開關，當 所述待測試:L件2GG定位好後，自動驅動所述驅動裝置 2〇帶動所述探針安裝架19向下移動，以使裝設於其上之 測試探針30對應地㈣於待測試工件·之各阻抗測試 點上，以進行阻抗測試。 士可以理解，所述驅動裝置20亦不限於本實施例中之 ru缸驅動方式，其亦可以採用步進電機驅動或其他方式進 行驅動。 =上所述’本發明符合發明專利要件，爰依法提出專 J申〔淮以上所述者僅為本發明之較佳實施例，本發 明之範圍並不以上述實施例為限，舉凡熟悉本案技藝之人 士援依本發明之精神所作之等效修飾或變化，皆應涵蓋於 以下申請專利範圍内。 ' 【圖式簡單說明】 圖1為本發明阻抗測試裝置之硬體架構示意圖； 圖2為圖丨所示阻抗測試裝置一較佳實施例之立 解示意圖； 圖3為本發明所示阻抗測試裝置之立體組裝示意圓 置 圖4為本發明阻抗測試裝置工作時，待測試工件放 於其定位裝置上之立體示意圖； 工 圖5為本發明阻抗測試裝置工作時，探 件接觸時之立體示意圖。 寺貝 100 測試平台 【主要元件符號說明】 阻抗測試裝置 16 10 200949258 底座 連接通孔 操作面板 '防護板 ‘頂板 工件安裝治具 滑塊 ©推杆 探針安裝架 固定塊 探針安裝通孔 驅動裝置 通孔 缸體 ^ 出氣管安裝端 導接板 電磁閥 進氣管連接端 進氣管 測試探針 資訊處理裝置 驅動裝置連接端口 萬用表連接端口 安裝孔 1132 導滑塊 1137 卡安裝孔 1151 容置空間 118 條形滑槽 132 主體部 151 工件安裝部 155 監測裝置 17 連接端 191 探針安裝端 193 連接通孔 1935 安裝板 21 汽缸 23 進氣管安裝端 233 活塞 237 安裝通孔 251 氣源輸入端 261 出氣管連接端 265 出氣管 28 導線 33 中央處理器 41 顯示器接口 45 繼電器控制端口 47 17 200949258 存儲卡卡座 48 輸入控制端口 49 顯示器 50 萬用表 60 繼電器模組 70 存儲卡 80 •輸入控制按鈕 90 待測試工件 200 Ο ❹ 18200949258 IX. Description of the Invention: [Technical Field] The present invention relates to an impedance testing apparatus, and more particularly to an impedance testing apparatus capable of performing a complex point impedance test by itself. - [Prior Art] In the field of electronic component manufacturing, in order to make each electronic component suitable for assembly and use, it is necessary to perform impedance test on the sub-device to confirm the function of the conductive device. Whether the impedance value of the electronic component is within the specifications required by the customer. Usually, the customer will mark the test position of the complex impedance measurement point on the blueprint of the electronic component and indicate that the test probe is a common point' required to detect the impedance value between the remaining impedance test points and the common point. During the whole test process, the inspector needs to manually test the common point of the electronic component and the remaining impedance test points by using a multimeter or an impedance meter, and the impedance value of each of the electronic components is For the remaining impedance measurements between the four points, it is necessary to read from the multimeter or impedance = and manually record the measured impedance data. Next, repeat m until all the data has been tested. Finally, the recorded measurement needs to be directed to the electricity (4) for analysis to determine if the electronic component is the target: customer requirements. The whole test process is prosperous, and the test error is relatively large, and the test efficiency is low. SUMMARY OF THE INVENTION In view of the need to provide an impedance testing apparatus that is simple in testing process, small in error, and effective in improving test efficiency. 7 200949258 An impedance testing device for performing an impedance test on a workpiece to be tested. The impedance test includes a test platform, a driving device, a plurality of test probes, an information processing device, a display, a multimeter, and a relay device. a module, a plurality of control buttons; the test platform includes a base and a probe-needle rack, the base is for placing the workpiece to be tested, and the probe mount is adjustably mounted above the base Positioning; the driving device is mounted on the base ′ and fixed to the probe mounting bracket to drive the ❹ probe mounting frame to move relative to the workpiece to be tested placed on the base; the plurality of test probes a needle is mounted on the probe mounting frame and electrically connected to the relay module; the information processing device is mounted in the base, and includes a central processor, the central processor and the a plurality of control buttons, a driving device, a display, a relay module, and a multimeter electrical connection for receiving commands and driving the driving device, the multimeter, and the relay module, and The measured result is compared and analyzed; the control button is used to input relevant instructions to the impedance testing device, the display is used to display relevant input fingerprint commands and test results, and the relay module is used to control the test probe And driving the multimeter to perform impedance testing. Compared with the prior art, the impedance testing device of the present invention can automatically perform impedance testing on a plurality of impedance test points on a test workpiece at the same time, and analyze the test results, and perform the impedance values measured each time. Storage, which effectively improves the efficiency of impedance testing and test quality. [Embodiment] Referring to Fig. 1, there is shown a hardware architecture of the impedance testing apparatus of the present invention. The impedance testing device 1 is used to perform an impedance test on a workpiece to be tested 200949258 200 (see FIG. 4) to detect whether the impedance value is within a prescribed range. The impedance testing device 100 includes a test platform 10, a driving device 20, a plurality of test probes 30, an information processing device 40, a display 50, a multimeter 60, a relay module 70, and a memory card 80. A plurality of control buttons 90. Referring to FIG. 2 and FIG. 3 , the test platform 10 is used for clamping and positioning the workpiece 200 to be tested. The test platform 10 includes a base 11 , two clamping blocks 13 , and a workpiece mounting fixture 15 . A monitoring device 17 and a probe mount 19. The base 11 has a substantially rectangular box shape and includes a top plate 113, an operation panel 115 and a shield plate 117. The top plate 113 has a substantially rectangular flat shape, and a substantially rectangular mounting hole 1132 and a connecting through hole 1135 are formed in a substantially central portion thereof. Two cylindrical guide sliders 1137 are fixedly disposed on the top plate 113 near the one side edge thereof in a direction perpendicular to the top plate 113. The operation panel 115 has a substantially rectangular plate shape and is mounted on a side surface of the base 11 in a direction perpendicular to the top plate 113. A plurality of memory card mounting holes 1151 are defined in the operation panel 115, and the plurality of control buttons 90 and the display 50 are mounted. The protective plate 117 is substantially in the shape of a U-shaped plate, and is fixedly mounted on the top plate 113 at a peripheral position near one side thereof, and is enclosed with the top plate 113 to form an accommodation space 118. The two-lead slider 1137 is received in the accommodating space 118. The holding block 13 has a substantially L-shaped cross section, and a strip-shaped sliding groove 132 is formed at a position of one side edge. The two holding blocks 13 are fixedly mounted on the top plate 113 of the base 200949258 11 at a distance from the operation panel 115, and are located on two sides of the mounting hole 1132. The two holding blocks 13 and the top plate 113 of the base 11 together define a substantially "convex" shaped mounting space (not shown) for mounting the workpiece-mounting jig 15. The workpiece mounting jig 15 has a substantially "convex"-shaped block shape in cross section, and includes a main body portion 151, two sliders 153 extending from opposite sides of the main body portion 151, a workpiece mounting portion 155, and a push Rod 158. The end portions of the two sliding blocks 153 are respectively provided with a mounting hole 1532 for slidably mounting the workpiece mounting jig 153 on the holding block 13 , to prevent it from being separated from the holding block 13 . The workpiece mounting portion 155 is generally rectangular in shape and is recessed on the main body portion 151 for mounting the workpiece 200 to be tested. The push rod 158 has a substantially cylindrical rod shape and is fixed to the main body portion 151. The workpiece mounting jig 15 is slidably fitted between the two holding blocks fixedly mounted on the top plate 13 by the sliding 153 of the two sides. The monitoring device 17 is a fiber-optic sensor mounted on the mounting hole 1132 and electrically connected to the information processing device 40 for detecting whether the workpiece 200 to be tested is in the impedance testing process. Accurately locating or monitoring whether the top of the workpiece to be tested 200 is obscured or obstructed. The probe mount 19 has a substantially "T" shape and includes a connecting end 191 and a probe mounting end 193. The two ends of the connecting end 191 are respectively provided with a guiding through hole 1912 corresponding to the two guiding sliders 1137, so that the probe mounting bracket 19 is slidably mounted on the two guiding sliders 1137. A fixing block 1915 is protruded from a substantially central portion of the connecting end 191 to fix the probe mounting bracket 19 to the driving device 20. 200949258 The probe mounting end 193 is provided with a plurality of probe mounting through holes 1932 and a connecting through hole 1935 for mounting the plurality of probes 30. The driving device 20 is disposed above the top plate 113 of the base 11 of the test platform 10 and is received in the accommodating space 118. The driving device 20 is fixedly connected to the connecting end 191 of the probe mounting frame 19 to drive the probe mounting frame 19 to slide down along the guiding slider 1137, thereby driving the probe 30 to slide down. shift. In the embodiment, the driving device 20 includes a mounting plate 21, a cylinder 23, a guiding plate 25, a solenoid valve 26, an intake pipe 27 and an air outlet pipe 28. The mounting plate 21 is substantially in the shape of a rectangular plate, and is fixedly mounted on the protective plate 117 and disposed above the accommodating space 118 and the two-lead slider 1137. A through hole 212 is defined in the mounting plate 21 . The cylinder 23 is substantially cylindrical and includes a cylinder 231, an intake pipe mounting end 233, an air outlet mounting end 235, and a piston 237 slidably mounted in the cylinder 231. The guide plate 25 is substantially rectangular and has a mounting through hole 251. The guide plate 25 is fixedly mounted on the air outlet mounting end 235 of the cylinder 23, and is fixedly mounted. On the two guide slider 1137. The solenoid valve 26 is fixedly mounted on the shield plate 117 of the base 11 of the test platform 10 for controlling the cylinder 23. The solenoid valve 26 includes a gas source input end 261 connected to an external air source, an intake pipe connection end 263 and an air outlet pipe connection end 265. The two ends of the intake pipe 27 and the outlet pipe 28 are respectively fixedly connected to the intake pipe connection end 263 of the electromagnetic valve 26, the outlet pipe connection end 265, the intake pipe installation end 233 of the cylinder 23, and the outlet pipe installation end. 235. 11 200949258 The plurality of test probes 30 are correspondingly mounted in the plurality of probe mounting through holes 1932 of the probe ampoules 19 and protrude from the other side of the probe mounting frame 19, The terminal is electrically connected to the relay module 70 through a conductor 33. The information processing device 40 is an integrated circuit board that is mounted in the base 11. The information processing device 4A includes a central processing unit 41, a driving device connection port 42, a display interface port, a multimeter connection port 46, a relay control port 47, a memory card card holder and an input control port. 49. The driving device connection port C, the display interface 45, the multimeter connection port 46, the relay control port bamboo, the memory card holder 48 and the input control port 49 are all electrically connected to the central processing unit, and are respectively correspondingly driven The device 20, the display 5, the multimeter 60, the relay module 7A, the memory card 8A, and the input control button are connected. In use, the input control information can be input by the input control button 90, for example, turning on/off the impedance test farm (10), setting the impedance test device 1〇〇, and the like. After the central processor receives the relevant control command input by the input control button 9〇, you can drive the driving device 2, the multimeter 6 and the relay module 5^ and t will measure the result. A comparative analysis is performed, and the display is displayed on the display to store the test results on the memory card 80. The multimeter 6 is mounted in the base 11, and is electrically connected to the multimeter connection port 46 of the shouting county 4Q, and is electrically connected to the relay module 7〇. The relay module 70 is installed in the base u 12 200949258 of the test platform 1 , and is electrically connected to the relay control port 47 of the information processing device 40 , and is connected to the multimeter 60 and the The plurality of test probes 30 are electrically connected. The memory card 80 is detachably mounted in the memory card mounting hole 1151 of the operation panel 115, and is received and electrically connected to the memory card holder 48 of the information processing device 40. Referring to FIG. 3 , when the impedance testing device 100 is assembled, the two holding blocks 13 are relatively fixedly mounted on the top plate 113 所述 of the base 11 and located in the mounting through hole 1132 and the connecting through hole. The two sides of 1135 are such that the two holding blocks 13 and the top plate 113 together form a mounting space having a substantially "convex" cross section. Next, the workpiece mounting fixture 15 is slidably mounted in the "convex" mounting space surrounded by the top plate 3 of the base 11 and the two holding blocks 13; at the same time, two screws or pins are used. Mounting holes 1532 on the slider 153 on both sides of the fixture 15 are respectively passed through the workpiece, so that the workpiece mounting jig 15 can be defined along the path of the strip chute 132 on the holding block 13 Swipe back and forth. Then, the monitoring device 17 is fixedly mounted in the mounting hole 1132 of the top plate 113 and electrically connected to the information processing device 40. The guide sliding through holes 1912 at the two ends of the connecting end 191 of the probe mounting bracket 19 are aligned with the two guiding sliders 1137 on the top plate 113 of the base 11 to mount the probe mounting bracket 19 The end 193 is slidably mounted on the two-lead slider 1137 in the direction of the workpiece mounting jig 15 . The plurality of test probes 30 are correspondingly mounted on the plurality of probe mounting through holes 1932 of the probe mounting end 193 of the probe mounting bracket 19, and extend from the other side of the probe mounting end 193 13 200949258; The lead end 33 of the test probe 30 passes through the connecting through hole 1935 on the probe mounting bracket 19 and the connecting through hole 1135 on the top plate 113 of the base 11 into the base 11. Then, the driving device 20 is assembled, and the piston 237 of the outlet pipe 235 end of the cylinder 23 is passed through the mounting through hole 151 of the guiding plate 25, and is fixedly mounted on the probe mounting frame 19. The two ends of the guiding plate 25 are correspondingly fixed to the ends of the two sliders 1137 of the top plate 113. Next, the intake pipe 231 end of the cylinder 23 is passed through the through hole 212 of the mounting plate 21, and the mounting plate 21 is fixedly mounted above the shield plate 117 of the base 11. The solenoid valve 26 is mounted on one side plate of the shield plate 117, and the two ends of the intake pipe 27 are respectively installed at the intake pipe connection end 263 of the electromagnetic valve 26 and the intake port of the cylinder 23 The two ends of the air outlet pipe 28 are respectively installed at the air outlet pipe connection end 265 of the electromagnetic valve 26 and the air outlet pipe installation end 235 of the cylinder 23 . Finally, the information processing device 40, the multimeter 60 and the relay module 70 are installed in the base 11, the driving device connection port 42 of the information processing device 40, the display interface 45, the multimeter connection port 46, and the relay control port. 47. The memory card holder 48 and the input control port 49 are electrically connected to the driving device 20, the display 50, the multimeter 60, the relay module 70, the memory card 80, and the input control button 90, respectively. The wire 33 end of the test probe 30 is electrically connected to the relay module 70, that is, the assembly of the impedance testing device 100 is completed. Referring to FIG. 4 and FIG. 5 together, when the impedance testing device 100 14 200949258 is used to perform the impedance test on the workpiece 200 to be tested, the impedance testing device 100 is first turned on, and the memory card 8 is inserted into the device. The memory card mounting hole of the operation panel is 1151. Next, the workpiece to be tested is placed on the workpiece mounting portion 155 of the workpiece mounting jig 15 to push the push rod 158 to cause the workpiece mounting jig 15 along the second card. The strip chute 132 of the block 13 slides in the direction of the probe mount 19 until it is just below the probe mount 19. The monitoring device 17 detects whether the workpiece 200 to be tested is accurately positioned or monitored whether the upper portion of the workpiece is obscured or obstructed. Then, the second device 20' is driven to move the probe mounting frame 19 downward, and the plurality of test probes 3 装 mounted on the probe mounting frame 19 are respectively correspondingly held by the device Test each of the impedance test points of the workpiece 200. Each of the impedance test points of the workpiece to be tested 200 forms a plurality of test loops by using the test probes 3 and the multimeter, the relay module 70, and the information processing device 4A. After the information processing device 40 performs the clearing process on the multimeter 6〇, the impedance test points of the test workpieces 200 are subjected to an impedance test, and the impedance values measured each time are analyzed, and the analysis results are displayed in the The display 5 is on the display. During the test, the relay module 7 〇 automatically switches, turns on and off the test loops formed by the impedance test points of the workpiece 200 to be tested and the multimeter ribs, thereby implementing impedance test for each impedance test point. Each measured impedance value is automatically stored in the memory card 8A. After the test is completed, the impedance testing device 100 is turned off, that is, the impedance testing work of the workpiece 200 to be tested is completed, and the test data stored in the memory card (10) can be imported into a computer for related editing analysis. 15 200949258, it can be understood that the monitoring device can also be a light-sensing switch. When the L-part 2GG is positioned, the driving device 2 is automatically driven to drive the probe mounting frame 19 downward. Moving so that the test probes 30 mounted thereon are correspondingly (four) to the respective impedance test points of the workpiece to be tested for impedance testing. It can be understood that the driving device 20 is not limited to the ru cylinder driving method in the embodiment, and it can also be driven by a stepping motor or other means. = The above description is in accordance with the requirements of the invention patent, and the invention is based on the law. The above description is only a preferred embodiment of the present invention, and the scope of the present invention is not limited to the above embodiments. Equivalent modifications or variations made by those skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a hardware structure of an impedance testing apparatus according to the present invention; FIG. 2 is a schematic diagram of a preferred embodiment of the impedance testing apparatus shown in FIG. FIG. 4 is a perspective view showing the workpiece to be tested placed on the positioning device when the impedance testing device of the present invention is in operation; FIG. 5 is a schematic perspective view of the impedance testing device of the present invention when the probe is in contact . Temple Bay 100 Test Platform [Main Component Symbol Description] Impedance Tester 16 10 200949258 Base Connection Through Hole Operation Panel 'Protecting Plate' Top Plate Workpiece Mounting Fixture Slider © Pusher Probe Mounting Block Fixing Block Probe Mounting Through Hole Drive Through hole cylinder ^ Outlet pipe installation end guide plate solenoid valve intake pipe connection end intake pipe test probe information processing device drive device connection port multimeter connection port mounting hole 1132 guide slider 1137 card mounting hole 1151 accommodation space 118 Strip chute 132 body portion 151 workpiece mounting portion 155 monitoring device 17 connection end 191 probe mounting end 193 connection through hole 1935 mounting plate 21 cylinder 23 intake pipe mounting end 233 piston 237 mounting through hole 251 air source input end 261 Trachea connection 265 Outlet tube 28 Lead 33 Central processor 41 Display interface 45 Relay control port 47 17 200949258 Memory card holder 48 Input control port 49 Display 50 Multimeter 60 Relay module 70 Memory card 80 • Input control button 90 Workpiece to be tested 200 Ο ❹ 18