TW200938858A - Testing jig structure for integrated circuits - Google Patents

Testing jig structure for integrated circuits Download PDF

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TW200938858A
TW200938858A TW97108164A TW97108164A TW200938858A TW 200938858 A TW200938858 A TW 200938858A TW 97108164 A TW97108164 A TW 97108164A TW 97108164 A TW97108164 A TW 97108164A TW 200938858 A TW200938858 A TW 200938858A
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grounding
probe
signal
holes
hole
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TW97108164A
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Chinese (zh)
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TWI357983B (en
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yu-dong Hu
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yu-dong Hu
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Abstract

Disclosed is a testing jig structure for integrated circuits, which comprises: a body set consisting of an upper body and a lower body. The upper and lower bodies are sandwiched between at set of retaining casing consisting of an upper retaining casing and a lower retaining casing, where the top face of the upper body and the bottom face of the lower body are exposed from the casings. The upper and lower bodies are provided with plural through holes, each mounted with power probes, signal probes and grounding probes therein. The through holes mounted with the signal probes and grounding probes are each electroplated with a metal conductive layer. As such, one side of the body set can be connected to a testing circuit board, so that one ends of the probes are connected to the testing circuits. The to-be-tested object is then mounted to another side of the body set so that the to-be-tested object is connected to another ends of the probes, so as to be electrically connected to the testing circuits, to allow testing of RF digital signals.

Description

200938858 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種積醴電路之檢測治具結構,尤指_ 種可用於檢測積體電路之射頻(RF )數位訊號之檢測治具 者0 【先前技術】200938858 IX. Description of the Invention: [Technical Field] The present invention relates to a structure for detecting a jig circuit, and more particularly to a test fixture for detecting a radio frequency (RF) digital signal of an integrated circuit. [Prior Art]

按’一般傳統之積體電路的檢測治具,例如:中華民 國發明專利公告第200612102號專利,其揭露有:導電構 件,具有適合安裝於設有檢驗電路之電路板上之第—表面 ’以及適合與欲檢驗之裝置相對之第二表面,該導電構件 係形成有具有第一直徑之第一貫穿孔,該第一貫穿孔係將 該第一表面與該第二表面連通;接觸式探針,包含:具有 第二直徑之管狀本體,該第二直徑係比第一直徑小以及 柱塞,其係可縮回地由該管狀本體之一端凸出;第一保持 件’形成有第二貫穿孔,且至少與該導電 相對’將該第-貫穿孔與第二貫穿孔連通,使得該2式 探針保持於該導電構件,同時只有柱塞從該第二貫穿孔之 一端凸m,第二保持件’適合保持該管狀本體之一 =與該第一貫穿孔同心;俾可用於檢測積體電路之射頻( 耵)數位信號之檢測’並執行高可靠度 雜訊影響。 个X又玉j 5 200938858 持件及導電構件構成主雜,導致主趙結構複雜 針不易安裝,而且其硬f金屬製之導電構件對於諸=式探 密佈之貫穿孔的鑽設極為不易,其整體製作 :: ,非常不便利。 两成本尚 【發明内容】 ^明人有鑑於前述先前技術t f知積體電路檢 具的缺點,而提供本發明積趙電路之檢測治具結構以^口 能摒除先前技術所產生的缺失。 本發明之一目的,係提供一種積體電路之檢測治具结 構,以用於檢測積體電路之射頻(RF)數位㈣,@ 造簡單、製作容易、成本低廉。 傅 根據上述之目的,本發明之檢測治具結構,包含有由 -上絕緣本體與-下絕緣本體所組成的—組絕緣本體,該 上、下本體受一由上固定蓋體與下固定蓋體所組成的一組 固定蓋體夾固於其間’並使上本體的頂面及下本體的底面 凸露出來;該上、下本體在對應待檢測物的位置上,設有 多數個貫穿孔,該等貫穿孔分別安裝電源探針、訊號探針 及接地探針’其中’女裝訊號探針與接地探針的貫穿孔各 锻設有金屬導電層。使用時’可將本體的一面與一檢測機 具的檢測電路板相接,使電源探針、訊號探針及接地探針 的一端與檢測電路板相對應的檢測電路電氣連接;再將待 檢測物安裝於本體的另一面,使待檢測物的電源插腳訊 號插腳及接地插腳分別與電源探針、訊號探針及接地探針 200938858 的另一 碼电氣遷接。如此,待檢測物 測治具與檢測電路電痛、奎& 17能藉由本發明之檢 电乳運接,而進科舢 的電氣檢測作業’並達成檢測治具構造簡 成本低廉之目的。 間单、製作谷易且According to the 'traditional conventional integrated circuit detection jig, for example, the Republic of China Invention Patent Publication No. 200612102, which discloses: a conductive member having a first surface adapted to be mounted on a circuit board provided with a verification circuit and a second surface opposite to the device to be inspected, the conductive member being formed with a first through hole having a first diameter, the first through hole communicating the first surface with the second surface; the contact probe Included: a tubular body having a second diameter, the second diameter being smaller than the first diameter and a plunger retractably projecting from one end of the tubular body; the first retaining member 'forming a second through a hole, and at least opposite to the conductive portion, communicating the first through hole with the second through hole such that the type 2 probe is held by the conductive member while only the plunger protrudes from one end of the second through hole, The second holder 'is adapted to hold one of the tubular bodies = concentric with the first through hole; 俾 can be used to detect the detection of radio frequency (耵) digital signals of the integrated circuit' and perform high reliability noise effects. X and j j 9 200938858 The holding parts and the conductive members constitute the main miscellaneous, which makes the complicated structure of the main Zhao structure difficult to install, and the conductive members made of hard f metal are extremely difficult for the drilling of the through holes of the type of fabric. Overall production:: Very inconvenient. The present invention has been made in view of the shortcomings of the foregoing prior art tf known integrated circuit tool, and the detection jig structure of the present invention is provided to eliminate the defects caused by the prior art. SUMMARY OF THE INVENTION One object of the present invention is to provide a detection fixture structure for an integrated circuit for detecting radio frequency (RF) digits (4) of an integrated circuit, which is simple to manufacture, easy to manufacture, and low in cost. According to the above purpose, the structure of the detecting fixture of the present invention comprises a group of insulating bodies composed of an upper insulating body and a lower insulating body, and the upper and lower bodies are supported by an upper fixed cover and a lower fixed cover. a set of fixed cover bodies formed by the body is sandwiched between the top surface of the upper body and the bottom surface of the lower body; the upper and lower bodies are provided with a plurality of through holes at positions corresponding to the object to be detected The through-holes are respectively provided with a power probe, a signal probe and a grounding probe. The through-holes of the 'women's signal probe and the grounding probe are forged with a metal conductive layer. When in use, one side of the main body can be connected to the detecting circuit board of the detecting device, and one end of the power probe, the signal probe and the grounding probe are electrically connected to the detecting circuit corresponding to the detecting circuit board; Installed on the other side of the main body, the power pin and ground pin of the object to be tested are electrically connected to another code of the power probe, the signal probe and the grounding probe 200938858. In this way, the test object to be detected and the detection circuit, the electric pain, the Kui & 17 can be transported by the electro-inspection of the present invention, and the electro-detection operation of the coke is carried out, and the purpose of detecting the jig structure is simple and low-cost. Between the single, making Gu Yi and

式 方 施 實 rL 有關本發明之前述及其 4久具他技術内容、特點與 在 以下配合參考圖式之二個 力敫 叫平又征I呢例禅細說明當中,將可 清楚的呈現。 第1圖至第5圖分別纷示本發明結構第一較佳實施例 之立體圖、分解圖、部份分解放大圖、剖面圖及部份剖面 放大圖。 如該等圖式所示,本發明之檢測治具,包含有一組絕 緣本體1、一組固定蓋體5、多數個電源探針2、多數個訊 號探針3、以及多數個接地探針4。 絕緣本體1包括一絕緣上本體1 a與一絕緣下本體丨b, 其相互組合在一起《該上、下本體la、lb在對應待檢測物 之積體電路(未圖示)的位置上,設有多數個電源貫穿孔Π 、多數個訊號貫穿孔12及多數個接地貫穿孔13;該等貫穿 孔11、12、13分別安裝電源探針2、訊號探針3及接地探針 4,且各貫穿孔的内徑分別大於各探針的外徑。 訊號貫穿孔12的内壁鍍設有一第二金屬導電層14,使 得訊號貫穿孔12形成天然的電磁波遮蔽體,避免對訊號探 針2訊號傳遞上的干擾《接地貫穿孔13的内壁及外表面則 200938858 設有一第三金屬導電層15,以與接地探針4相互電氣連接 ,形成可導電的接地迴路。 本體1以絕緣材質製成,再於必要的位置鍍上金屬導 電層;其非為一體的金屬材質。此種結構,除了可降低材 質成本之外’尤其’其本體1可選自例如塑膠的絕緣材料 ’此種材質在實施諸多貫穿孔11、12、13的設置上較為簡 易。因此,本發明之本體1,在施作上,具有材料成本低 及對於貫穿孔易於製作的優點。 又由於上述諸貫穿孔係呈矩陣密佈,且具有一定的長 度,該諸多密佈的貫穿孔由其上端至下端仍要維持精準的 轴向位置係極其不易。而本發明將本體1分成上本體1&與 下本體lb再予組合,此種結構,可將各貫穿孔的長度先予 減短再予接長成所要求的長度;其分別對於較短長度之貫 穿孔的設置,可以獲得較為精準的效果。因此依據本發明 此種結構,對於諸貫穿孔丨丨、12、13可以獲得較為精準的 轴向位置。 對於上、下本體la、lb的組合,其可行的方式之一係 ,於上本體la的底面形成有一 u形底凹口 16a,而下本體lb 的頂面則形成有一 U形頂凹口 16b,再將兩者上下疊置並交 錯銜合而組設在一起。亦即,可以相同模具形成上本體h 與下本體lb’再將其反置組合即可。 上述固定蓋體5包括一上固定蓋體53與一下固定蓋體 5b,其分別組設於上、下本鱧1&、lb的上下方而將上 、下本體夾固於該上、下固定蓋體之間,並使上本體h 8 200938858 的頂面及下本體lb的底面凸露出來。 對於固定蓋體5與本體1間的組合,其可行的方式之一 係’於上、下固定盖體5a、5b分別設有一第一框口 51a與 一第二框口 51b’而上、下本體la、lb的外周分別形成有 一第一擋緣17a與一第二擋緣17b;上、下固定蓋體以其第 一、第二框口 51a、51b分別套組於上、下本體,並分別擋 抵於該第一、第二標緣17a、17b,再以二個第一螺絲52 將上、下固疋蓋體5a、5b鎖固為一體。藉著固定蓋體1可 ® 將該固定蓋體連同本體1固定於下述的檢測電路板6。 上述電源探針2的上、下端分別設有可彈性向外凸出 或向内縮入之一電源上針頭21與一電源下針頭22;在實施 上,該電源上、針頭之間套設有一第一導電彈簧23,使得 該電源上、下針頭21、22的外端部可彈性凸出或縮入於電 源貫穿孔11。電源貫穿孔u的上、下端各設有口徑較小的 電源探針孔口 1 la,而電源上、下針頭21、22的外端部係 位於該電源探針孔口 11a。電源探針2乃與本體〗相互電氣 絕緣。 上述訊號探針3設有一金屬管35,在該金屬管35之管 内的上、下端分別設有可彈性向外凸出或向内縮入之一訊 號上針頭31與一訊號下針頭32;在實施上該訊號上、下 針頭之間套及有-第二導電彈簧33’使得該等訊號上、下 針頭31 32的外端部可彈性凸出或縮入於訊號貫穿孔 。訊號上、下針頭31、32各套設有一絕緣固定座“,該等 絕緣固定座34並分別固設於訊號貫穿孔12的上下端孔口 200938858 ,使訊號探針3與本體1相互電氣絕緣,而在訊號貫穿孔12 内的訊號探針3則以空氣與本體1保持絕緣。 接地探針4的上、下端分別設有可彈性向外凸出或向 内縮入之一接地上針頭41與一接地下針頭42;在實施上, 該接地上、下接頭之間套設有一第三導電彈簧43,使得該 接地上、下針頭41、42的外端部可彈性凸出或縮入於接地 貫穿孔13。接地貫穿孔13的上、下端各設有口徑較小的接 地探針孔口 13a,而接地上、下針頭41、42的外端部係位 於該接地探針孔口 13a,並與其電氣連接。依此,接地探 針4乃與接地貫穿孔13内的第三金屬導電層15接觸而電氣 連接,而形成可導電之接地迴路。 請參閱第3圖及第5圖所示,電源上、下針頭以、£2 各設有一外徑較大的第一擋止體26;訊號上、下針頭31 、32亦各設有一外徑較大的第二擋止體36 ;同樣地,接地 上、下針頭41、42亦各設有一外徑較大的第三擋止體46 〇 ;該等擋止體26、36、46可分別受第一導電彈簧23、第二 導電彈簧33及第三導電彈著43的端部所抵靠,並分別抵擔 於電源探針孔口 lla、絕緣固定座34及接地探針孔口心 。因此上述各針頭的外端部乃可藉由各導電彈簧的彈力, 彈性凸出於各貫穿孔外,並分別受電源探針孔口 ! b、絕 緣固定座34及接地探針孔口 13a所擋止;或被壓縮而彈性 縮入於各貫穿孔内》 請參閱第7圖至第9圖所示,上、下固定蓋體5&、5b 各設有至少二個定位孔53與至少二個螺絲穿孔54,本體ι 200938858 與檢測機具(未圖示)的檢測電路板6相接時,可利用一定 位梢61固疋於定位孔53並導入於檢測電路板6所設的安裝 孔62,使本體1定位於檢測電路板6的檢測電路63上嗣再 利用第一螺絲6 4穿入固定蓋體5的螺絲穿孔5 4 ,並螺合於 檢測電路板6所設的螺絲孔65,使本體1及其固定蓋體5被 鎖固於檢測電路板6上。 藉上述構件的組成,當進行檢測一待檢測的積體電路 (圖中未示,以下稱待檢測物)時,可將本體1的一面( 底面)與檢測電路板6相接,使電源探針2、訊號探針3及接 地探針4的一端與檢測電路板6相對應的檢測電路63電氣 連接;再將待檢測物安裝於本體丨的另一面,使待檢測物 的電源插腳、訊號插腳及接地插腳分別與電源探針2、訊 號探針3及接地探針4另一端電氣連接;如此,待檢測物即 能藉由本發明之檢測治具與檢測電路電氣連接,而進行射 頻(RF )數位訊號的電氣檢測作業。 ◎ 請參閲第5囷所示,其繪示本發明檢測治具第二實施 例的部份剖面示意圖。該第二實施例具有與上述第一實施 例相似的結構’不同者在於,在該第二實施例當中,其訊 號探針3之金屬管35的兩端各形成有一包口 37,該包口包 覆於第二擋止體36的外端部,以擋住該擋止體36。依此構 k ’可使整趙體訊號探針3自成一單體,而更便於裝配。 本發明雖已藉由上述較佳實施例加以詳細說明,惟以 上所述者’僅為本發明之較佳實施例而已,當不能以此限 定本發明實施之範圍,即大凡依本發明申請專利範圍及發 200938858 皆仍屬本發明專 明說明内容所作簡單的等效變化與修飾, 利涵蓋之範圍内。 【圖式簡單說明】 第1圖係繪示本發明檢測治具結構 示部份剖面示意圖。 體外觀圖並顯 第2圖係纷示本發明檢測治具結構第一實施 分解圖。 P份 第3圖係繪示第2圖所示分解圖的部份放大圖。 第4圖係繪示本發明檢測治具結構第一實施例的剖 第5圖係繪示第4圖所示剖面圖的部份放大圖。 第6圖係緣示本發明檢測治具結構第二實施例的部份 剖面示意圏。 第7圖係繪示本發明檢測治具結構與檢測電路板的魬 裝示意圖。 第8圖係繪示本發明檢測治具結構與檢測電路板之沿 定位梢方向的组裝剖面示意®。 第9圖係繪示本發明檢測治具結構與檢測電路板之沿 第一螺絲方向的組裝剖面示意圖。 【主要元件符號說明】 1.絕緣本體 la.絕緣上本體 12 200938858 lb.絕緣下本體 11. 電源貫穿孔 11a.電源探針孔口 12. 訊號貫穿孔 13. 接地貫穿孔 1 3a.接地探針孔口 14. 第二金屬導電層 15. 第三金屬導電層 1 6a. U形底凹口 1 6b. U形頂凹口 17a.第一擋緣 17b.第二擋緣 2. 電源探針 21. 電源上針頭 22. 電源下針頭 23. 第一導電彈簧 26.第一擋止體 3. 訊號探針 31. 訊號上接頭 32. 訊號下接頭 33. 第二導電彈簧 34. 絕緣固定座 35. 金屬管 36. 第二擋止體 13 200938858 37.包口 4. 接地探針 41. 接地上針頭 42. 接地下針頭 43. 第三導電彈簧 46.第三擋止體 5. 固定蓋體 5a.上固定蓋體 © 5b.下固定蓋體 51a.第一框口 51b.第二框口 52.第一螺絲 5 3.定位孔 54.螺絲穿孔 6. 檢測電路板 61.定位梢 v 62.安裝孔 63. 檢測電路 64. 第二螺絲 65. 螺絲孔 14The embodiment of the present invention will be clearly described in the following description of the present invention and its four technical contents, features, and the following two examples of the reference pattern. 1 to 5 are respectively a perspective view, an exploded view, a partially exploded enlarged view, a cross-sectional view and a partially enlarged cross-sectional view of a first preferred embodiment of the structure of the present invention. As shown in the drawings, the detecting fixture of the present invention comprises a set of insulating bodies 1, a fixed cover body 5, a plurality of power supply probes 2, a plurality of signal probes 3, and a plurality of grounding probes 4 . The insulative housing 1 includes an insulating upper body 1a and an insulating lower body 丨b which are combined with each other. The upper and lower bodies la, lb are at positions corresponding to an integrated circuit (not shown) of the object to be detected. a plurality of power supply through holes 多数, a plurality of signal through holes 12 and a plurality of ground through holes 13 are provided; the through holes 11, 12, and 13 are respectively mounted with the power probe 2, the signal probe 3, and the ground probe 4, and The inner diameter of each through hole is larger than the outer diameter of each probe. A second metal conductive layer 14 is formed on the inner wall of the signal through hole 12, so that the signal through hole 12 forms a natural electromagnetic wave shielding body to avoid interference on the signal transmission of the signal probe 2. "The inner wall and the outer surface of the ground through hole 13 are 200938858 A third metal conductive layer 15 is provided to electrically connect the ground probe 4 to form an electrically conductive ground loop. The body 1 is made of an insulating material and then plated with a metal conductive layer at a necessary position; it is not an integral metal material. Such a structure, in addition to lowering the material cost, is particularly 'equivalent' in that the body 1 can be selected from, for example, an insulating material of plastics. Such a material is relatively simple in implementing the arrangement of the plurality of through holes 11, 12, 13. Therefore, the body 1 of the present invention has an advantage in that it is low in material cost and easy to manufacture for the through hole. Moreover, since the through holes are densely arranged in a matrix and have a certain length, it is extremely difficult for the plurality of dense through holes to maintain a precise axial position from the upper end to the lower end. In the present invention, the body 1 is divided into an upper body 1 & and a lower body lb. This structure can shorten the length of each through hole and then lengthen it to a desired length; The setting of the through hole can obtain more accurate effects. Therefore, according to the structure of the present invention, a relatively accurate axial position can be obtained for the through holes 12, 12, 13. For the combination of the upper and lower bodies la, lb, one of the feasible ways is that a U-shaped bottom recess 16a is formed on the bottom surface of the upper body 1a, and a U-shaped top recess 16b is formed on the top surface of the lower body lb. Then, the two are stacked one on top of the other and are grouped together. That is, the upper body h and the lower body lb' may be formed in the same mold and then reversely combined. The fixed cover body 5 includes an upper fixing cover body 53 and a lower fixing cover body 5b, which are respectively disposed on the upper and lower sides of the upper and lower covers 1&, lb, and the upper and lower bodies are fixed to the upper and lower bodies. Between the covers, the top surface of the upper body h 8 200938858 and the bottom surface of the lower body lb are exposed. One of the possible ways for the combination of the fixed cover 5 and the body 1 is that the upper and lower fixed covers 5a, 5b are respectively provided with a first frame 51a and a second frame 51b', respectively, up and down. A first retaining edge 17a and a second retaining edge 17b are respectively formed on the outer circumferences of the bodies la and lb; the upper and lower fixed cover bodies are respectively set on the upper and lower bodies by the first and second frame openings 51a and 51b, and The first and second index edges 17a and 17b are respectively blocked, and the upper and lower fixed lid bodies 5a and 5b are locked integrally by the two first screws 52. The fixed cover body 1 and the body 1 can be fixed to the detection circuit board 6 described below by fixing the cover 1 . The upper and lower ends of the power supply probe 2 are respectively provided with a needle 21 for elastically protruding outward or inwardly retracting and a needle 22 for a power supply; in practice, a sleeve is disposed between the power source and the needle. The first conductive spring 23 allows the outer end portions of the upper and lower needles 21, 22 of the power source to be elastically protruded or retracted into the power supply through hole 11. The upper and lower ends of the power supply through hole u are each provided with a small power supply probe aperture 1 la, and the outer ends of the upper and lower power pins 21 and 22 are located at the power supply probe opening 11a. The power probe 2 is electrically insulated from the body. The signal probe 3 is provided with a metal tube 35, and the upper and lower ends of the tube of the metal tube 35 are respectively provided with a needle 310 and a signal down needle 32 which can be elastically outwardly protruded or inwardly retracted; The second upper conductive spring 33' is disposed between the upper and lower needles of the signal so that the outer end portions of the upper and lower needles 31 32 of the signal can be elastically protruded or retracted into the signal through hole. Each of the upper and lower needles 31 and 32 of the signal is provided with an insulating holder. The insulating holders 34 are respectively fixed to the upper and lower end openings 200938858 of the signal through hole 12 to electrically insulate the signal probe 3 from the body 1. The signal probe 3 in the signal through hole 12 is insulated from the body 1 by air. The upper and lower ends of the grounding probe 4 are respectively provided with an elastically outwardly projecting or inwardly retracting one of the needles 41. And a grounding needle 42; in practice, a third conductive spring 43 is disposed between the grounding upper and lower joints, so that the outer ends of the grounding upper and lower needles 41, 42 can be elastically protruded or retracted a grounding through hole 13. The grounding through hole 13 is provided with a grounding probe hole 13a having a small diameter, and the outer ends of the grounding upper and lower needles 41 and 42 are located at the grounding probe opening 13a. And electrically connected thereto. Accordingly, the grounding probe 4 is electrically connected to the third metal conductive layer 15 in the ground through hole 13 to form an electrically conductive ground loop. Please refer to FIGS. 3 and 5 , the power supply upper and lower needles, and £2 each have a larger outer diameter. The first blocking body 26; the upper and lower needles 31, 32 are also respectively provided with a second blocking body 36 having a larger outer diameter; likewise, the grounding upper and lower needles 41, 42 are also respectively provided with an outer diameter. a large third stop body 46 〇; the stop bodies 26, 36, 46 are respectively abutted by the ends of the first conductive spring 23, the second conductive spring 33 and the third conductive elastic 43 respectively The outer end of each of the needles can be elastically protruded from each of the through holes by the elastic force of each of the conductive springs, and the outer end portions of the needles can be elastically protruded from the through holes. They are respectively blocked by the power probe apertures b, the insulating holders 34 and the grounding probe holes 13a, or are compressed and elastically retracted into the respective through holes. Referring to Figures 7 to 9, The upper and lower fixed cover bodies 5&, 5b are each provided with at least two positioning holes 53 and at least two screw holes 54. When the main body ι 200938858 is connected to the detecting circuit board 6 of the detecting device (not shown), one can be utilized. The positioning tip 61 is fixed to the positioning hole 53 and is introduced into the mounting hole 62 provided in the detecting circuit board 6 to position the body 1 on the detecting circuit. The detecting circuit 63 of the 6 is further inserted into the screw hole 5 4 of the fixing cover 5 by the first screw 64, and screwed into the screw hole 65 provided in the detecting circuit board 6, so that the body 1 and the fixing cover 5 thereof are provided. It is locked on the detecting circuit board 6. By the composition of the above components, when detecting an integrated circuit to be detected (not shown in the drawing, hereinafter referred to as a detecting object), one side (bottom surface) of the body 1 can be The detecting circuit board 6 is connected, and one end of the power probe 2, the signal probe 3 and the grounding probe 4 is electrically connected to the detecting circuit 63 corresponding to the detecting circuit board 6; and the object to be detected is mounted on the other side of the body 丨The power pin, the signal pin and the ground pin of the object to be detected are electrically connected to the other end of the power probe 2, the signal probe 3 and the ground probe 4 respectively; thus, the object to be detected can be detected by the detecting tool of the present invention. The detection circuit is electrically connected to perform electrical detection of radio frequency (RF) digital signals. ◎ Referring to Figure 5, a partial cross-sectional view showing a second embodiment of the test fixture of the present invention is shown. The second embodiment has a structure similar to that of the first embodiment described above. In the second embodiment, the two ends of the metal tube 35 of the signal probe 3 are formed with a mouth 37, which is formed. The outer end portion of the second stopper body 36 is covered to block the stopper body 36. According to this configuration, k ' can make the whole body signal probe 3 self-contained, and is more convenient to assemble. The present invention has been described in detail by the above-described preferred embodiments, but the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. The scope and transmission of 200938858 are still within the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a partial cross-sectional view showing the structure of the test fixture of the present invention. The external appearance view and the second drawing show an exploded view of the first embodiment of the test fixture structure of the present invention. Part P Figure 3 is a partial enlarged view of the exploded view shown in Figure 2. 4 is a cross-sectional view showing a first embodiment of the structure of the detecting jig of the present invention. FIG. 5 is a partially enlarged view showing a cross-sectional view taken along line 4. Figure 6 is a cross-sectional view showing a portion of the second embodiment of the test fixture of the present invention. Fig. 7 is a schematic view showing the mounting structure of the detecting jig and the detecting circuit board of the present invention. Fig. 8 is a schematic cross-sectional view showing the structure of the detecting jig of the present invention and the direction of the positioning of the detecting circuit board along the positioning tip. Figure 9 is a schematic cross-sectional view showing the assembly of the test fixture structure and the detection circuit board in the first screw direction of the present invention. [Main component symbol description] 1. Insulation body la. Insulation upper body 12 200938858 lb. Insulation lower body 11. Power supply through hole 11a. Power supply probe hole 12. Signal through hole 13. Ground through hole 1 3a. Grounding probe Aperture 14. Second metal conductive layer 15. Third metal conductive layer 1 6a. U-shaped bottom recess 1 6b. U-shaped top recess 17a. First retaining edge 17b. Second retaining edge 2. Power probe 21 Power supply needle 22. Power supply needle 23. First conductive spring 26. First stop 3. Signal probe 31. Signal upper connector 32. Signal lower connector 33. Second conductive spring 34. Insulation holder 35. Metal tube 36. Second stop body 13 200938858 37. No. 4. Grounding probe 41. Grounding needle 42. Grounding down needle 43. Third conductive spring 46. Third blocking body 5. Fixing cover 5a. Upper fixing cover © 5b. Lower fixing cover 51a. First frame opening 51b. Second frame opening 52. First screw 5 3. Positioning hole 54. Screw perforation 6. Detection circuit board 61. Positioning tip v 62. Installation Hole 63. Detection circuit 64. Second screw 65. Screw hole 14

Claims (1)

200938858 十、申請專利範圍: 1、一種積體電路之檢測治具結構,裝設於一檢測機 具之檢測電路板與一待檢測之積體電路之間,該檢測治具 包括: 一組絕緣本體,其包括一絕緣上本體與一絕緣下本體 ’其相互組設在一起;該上、下本體在對應該待檢測之積 體電路的位置上,設有多數個電源貫穿孔、多數個訊號貫 穿孔及多數個接地貫穿孔;該等訊號貫穿孔的内壁锻設有 一第二金屬導電層,該等接地貫穿孔的内壁及外表面鍍設 有一第三金屬導電層; 一組固定蓋體,其包括一上固定蓋體與一下固定蓋體 ,其分別組設於該上、下本體的上、下方,而將該上、下 本體夾固於該上、下固定蓋體之間,並使該上本體的頂面 及該下本體的底面凸露出來.; 多數個電源探針’分別安裝於該等電源貫穿孔,該電 ❹ 源貫穿孔的内徑大於該電源探針的外徑,且該電源貫穿孔 的上、下端各設有口徑較小的電源探針孔口;該電源探針 的上、下端分別設有一電源上針頭與一電源下針頭,其彼 此間套設有一第一導電彈簧,該電源上、下針頭的外端部 位於該電源探針孔口,並彈性向外凸出或向内縮入於該電 源貫穿孔,該電源探針乃與該上、下本體相互電氣絕緣; 多數個訊號探針,分別安裝於該等訊號貫穿孔,該訊 號貫穿孔的内徑大於該訊號探針的外徑;該訊號探針設有 一金屬管’且於該金屬管之管内的上、下端分別設有一訊 15 200938858 號上針頭與一訊號下針頭,其彼此間套設有一第二導電彈 簧,該訊號上、下針頭的外端部彈性向外凸出或向内縮入 於該訊號貫穿孔;該訊號上、下針頭各套設有一絕緣固定 座,該等絕緣固定座並分別固設於該訊號貫穿孔的上、下 端孔口’該訊號探針乃與該上、下本體相互電氣絕緣;以 及 多數個接地探針,分別安裝於該等接地貫穿孔,該接 地貫穿孔的内徑大於該接地探針的外徑,且該接地貫穿孔 的上、下端各設有口徑較小的接地探針孔口;該接地探針 的上、下端分別設有一接地上針頭與一接地下針頭,其彼 此間套設有一第三導電彈簧,該接地上、下針頭的外端部 位於該接地探針孔口,並彈性向外凸出或向内縮入於該接 地貫穿孔,該接地探針乃與該第三金屬導電層相互電氣連 接’形成可導電之接地迴路。 ❾ 2、如申請專利範圍第i項所述積體電路之檢測治 具結構,其中該上本體的底面形成形底凹口而該下 本體的頂面形成一U形頂凹口,兩者上下疊置並交錯銜合 而組設在 '"-起。 3、如申請專利範圍第丨項所述積體電路之檢測治 具結構,其中該上、下固定蓋體分別設有一第一框口與— 第二框口,而該上、下本體的外周分別形成有一第一擋緣 與一第二擋緣,該上、下固定蓋體以該第一第二框口分 16 200938858 別套組於該上、下本體,並分別擋抵於該第一、第二撞緣 ’再以至少二個第一螺絲將該上、下固定蓋體鎖固為一體 、如申請專利範圍帛丨項所述積體電路之檢測治 具结構,其中該絕緣本體為一塑膠本體。 如申明專利範圍第1項所述積體電路之檢測治 二、‘構’彡中該電源上、下針頭各設有一外徑較大的第一 擋止體,其抵擋於該電源探針孔口與該第一導電彈簧的 部之間。 且、如申請專利範圍第1項所述積體電路之檢測治 二結構,其中該訊號上、下針頭各設有一外徑較大的第二 擋止體,其抵擋於該絕緣固定座與該第二導電彈簧的端部 之間。200938858 X. Patent application scope: 1. A detection fixture structure of an integrated circuit is installed between a detection circuit board of a detection tool and an integrated circuit to be detected, and the detection fixture comprises: a group of insulating bodies The utility model comprises an insulating upper body and an insulating lower body' which are arranged together with each other; the upper and lower bodies are provided with a plurality of power through holes and a plurality of signals throughout the position corresponding to the integrated circuit to be detected. a hole and a plurality of grounding through holes; a second metal conductive layer is forged on the inner wall of the signal through hole, and a third metal conductive layer is plated on the inner wall and the outer surface of the ground through hole; a set of fixed cover bodies The utility model comprises an upper fixing cover body and a lower fixing cover body respectively arranged on the upper and lower sides of the upper and lower bodies, and the upper and lower bodies are clamped between the upper and lower fixing cover bodies, and the a top surface of the upper body and a bottom surface of the lower body are exposed. A plurality of power supply probes are respectively mounted on the power supply through holes, and an inner diameter of the power supply through hole is larger than an outer diameter of the power supply probe, and The The upper and lower ends of the source through hole are respectively provided with a power supply probe aperture having a small diameter; the upper and lower ends of the power supply probe are respectively provided with a power supply upper needle and a power supply lower needle, and a first conductive spring is sleeved between each other. The outer end of the upper and lower needles of the power supply is located at the power probe aperture, and is elastically outwardly convex or inwardly retracted into the power supply through hole, and the power probe is electrically insulated from the upper and lower bodies a plurality of signal probes respectively mounted on the signal through holes, the inner diameter of the signal through holes being larger than the outer diameter of the signal probe; the signal probe is provided with a metal tube 'on the tube of the metal tube The lower end is respectively provided with a needle 15 and a signal down needle of 200938858, which are respectively sleeved with a second conductive spring, and the outer ends of the upper and lower needles of the signal are elastically outwardly convex or inwardly retracted therein. a signal through hole; the upper and lower needles of the signal are respectively provided with an insulating fixing seat, and the insulating fixing seats are respectively fixed on the upper and lower end holes of the signal through hole. The signal probe is connected to the upper and lower bodies mutual a plurality of grounding probes are respectively mounted on the grounding through holes, the inner diameter of the grounding through holes is larger than the outer diameter of the grounding probe, and the upper and lower ends of the grounding through holes are respectively provided with a smaller diameter a grounding probe aperture; the grounding probe has a grounding needle and a grounding needle respectively disposed on the upper and lower ends of the grounding probe, and a third conductive spring is disposed between the grounding probes, and the outer ends of the grounding upper and lower needles are located at the same The grounding probe aperture is elastically protruded outwardly or inwardly into the grounding through hole, and the grounding probe is electrically connected to the third metal conductive layer to form an electrically conductive ground loop. ❾ 2. The detection fixture structure of the integrated circuit according to the invention of claim i, wherein the bottom surface of the upper body forms a bottom recess and the top surface of the lower body forms a U-shaped top recess, both of which are Stacked and staggered and assembled in '"-. 3. The structure of the test fixture of the integrated circuit according to the invention of claim 2, wherein the upper and lower fixed covers are respectively provided with a first frame and a second frame, and the outer circumference of the upper and lower bodies Forming a first retaining edge and a second retaining edge respectively, the upper and lower fixed cover bodies are respectively set on the upper and lower bodies by the first and second framed corners 16 200938858, and are respectively blocked by the first And the second impact edge ′ is further configured to lock the upper and lower fixed cover bodies by at least two first screws, and the detection fixture structure of the integrated circuit according to the patent application clause, wherein the insulating body is A plastic body. For example, in the detection and treatment of the integrated circuit according to Item 1 of the patent scope, the upper and lower needles of the power supply are respectively provided with a first blocking body having a larger outer diameter, which is resisted by the power probe hole. Between the port and the portion of the first conductive spring. And the detecting and processing structure of the integrated circuit according to claim 1, wherein the upper and lower needles of the signal are respectively provided with a second blocking body having a larger outer diameter, which is resisted by the insulating fixing seat and the Between the ends of the second conductive spring. 7、如申請專利範圍第1項所述積體電路之檢測治 八結構,其中該接地上、下針頭各設有一外徑較大的第三 擋止體,其抵擋於該接地探針孔口與該第三導電彈簧的端 部之間。 8、如申請專利範圍第6項所述積體電路之檢測治 具、、》構’其中該金屬管的兩端各形成一包口,該包口包覆 17 200938858 於該第二擋止體的外端部。 9、如申請專利範圍第1項所述積體電路之檢測治 具結構,其中該上、下固定蓋設有至少二個定位孔與至少 二個螺絲穿孔。7. The method according to claim 1, wherein the grounding upper and lower needles are each provided with a third outer stop having a larger outer diameter, which is resisted by the grounding probe opening. Between the end of the third conductive spring. 8. The test fixture of the integrated circuit according to item 6 of the patent application scope, wherein the two ends of the metal tube form a bag mouth, and the bag mouth covers 17 200938858 in the second block body The outer end. 9. The test fixture structure of the integrated circuit according to claim 1, wherein the upper and lower fixed covers are provided with at least two positioning holes and at least two screw holes.
TW97108164A 2008-03-07 2008-03-07 Testing jig structure for integrated circuits TW200938858A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI814779B (en) * 2018-02-20 2023-09-11 義大利商探針科技公司 Apparatus and method for the automated assembly of a probe head

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI814779B (en) * 2018-02-20 2023-09-11 義大利商探針科技公司 Apparatus and method for the automated assembly of a probe head

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