200916784 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種測試卡，特別是有關於一種用來測 試插槽之寫入保護接腳之測試卡。 【先前技術】 隨著科技的進步，現在電子裝置的生產與使用的需求 量也日益增加。因此可測試電子裝置之作用的自動測試系 統也已經廣泛地被使用於生產線上。現在部份的電子裝置 配備了可讀取其他衍生之裝置的插槽，例如可讀取SD記 憶卡之插槽。因此，自動測試系統在自動化地測試電子裝 置之作用的同時，也必須測試其插槽之作用。 以SD記憶卡之插槽為例，其内部之訊號接腳除了可傳 輸資料之接腳外，還包括了可判斷SD記憶卡是在鎖定或 是解除（Lock/Unlock)的狀況之寫入保護接腳。由於寫入 保護接腳係位於插槽之侧邊，因此在先前技術當中，若要 測試插槽中的寫入保護接腳是否能作用正常，則必須要利 用一張SD記憶卡分別在鎖定或是解除的狀況下進行讀 寫，藉此確定寫入保護接腳是否能發揮作用。但是若進行 上述的測試方法，至少要執行兩次的插拔動作以調整SD 記憶卡是處於鎖定或是解除之狀況。如此一來就會花費超 過二十秒的時間，會大大的延長自動測試的時間及降低自 動測試的效率。 200916784 因此需要發明一種新的測試系統與方法以解決先前 術所產生的問題。 【發明内容】 /本發明之主要目的係在提供一種測試卡及其自動測試 糸統，以達到快速測試插槽内寫入保護接腳之效果。 +本發明之另-主要目的係在提供—種自動測試方法， 以藉由測試卡及其自動測試純達雜逮職插槽 保護接腳之效果。 ‘、.'達成上述之目的，本發明之自動測試系統包括測試 卡，、測试治具。測試治具具有自動測量電阻或電屢值等測 ，之:力能。測試卡係用以安裝於電子裝置之—插槽内，使 知·測4治具得以測試插槽内複數的接腳的作用。測試 括測試電㈣金屬^金屬片與賴電路電性連接D，並ί =;=:護接腳。金屬片係使得寫卿^ 本發明之自動測試方法為：輸人賴訊號於插槽内之 寫入保護接腳；判斷測試電路與寫人保護接腳是否形成迴 路，若沒有’即輸出不正常訊號；若形成迴路，測心且 即測量迴路之阻抗值；判_抗值與電阻 = =小於-定值；若小於該定值，即輸出正常訊號== 右大於該定值，即輸出不正常訊號。 【實施方式】 200916784 為讓本發明之上述和其他目的、特徵和優點能更明顯 易懂，下文特舉出本發明之具體實施例，並配合所附圖式， 作詳細說明如下。 接下來請同時參考圖1到圖3關於測試卡及自動測試 系統與插槽内複數之訊號接腳連接之電路圖。其中圖1係 本發明之測試卡之示意圖；圖2係本發明之測試卡與插槽 連接之示意圖；以及圖3係本發明之自動測試系統與插槽 内複數之訊號接腳連接之電路圖。 本發明之自動測試系統10包括測試卡11與測試治具 12。自動測試系統10用以自動測試電子裝置90之插槽91 的作用是否正常。在本實施例中，插槽91為一 SD記憶卡 插槽，並且測試卡11係與一 SD記憶卡之外觀規格相同， 以供將測試卡11插入於插槽91内以進行測試，但本發明 並不以此為限。電子裝置90可以一筆記型電腦，但本發明 並不以此為限。本發明之測試卡11包括測試電路20與金 屬片31。測試電路20可包括複數之電阻R1〜R8。測試卡 11所要測試之插槽91具有複數之訊號接腳P1〜P12以及地 端接腳GND。金屬片31係為一銅片，可以利用電鍍法來 電鍍於測試卡11上，但本發明並不以此為限。並且金屬片 31與測試電路20電性連接。測試卡11插入插槽91時， 測試電路20可與插槽91内之訊號接腳P1〜P12以及地端接 腳GND電性連接，以形成複數之迴路。 測試治具12具有自動測量電阻或電壓值等測試之功 能。自動測試系統10利用測試治具12以自動測試電子裝 置90之插槽91的作用是否正常，特別是有無空焊、冷焊 200916784 或短路的情形發生。由於測試治具12已普遍使用於一般之 測試系統，故在此不再贅述其功能。當自動測試系統10要 進行測試時，係將測試治具12與插槽91内複數之訊號接 腳P1〜P12電性連接，測試卡11則用以安裝於電子裝置90 之插槽91内。使得測試治具12可經由測試卡11測試插槽 91内複數之訊號接腳P1〜P12的作用。測試治具12測量迴 路之阻抗值並與電阻R1〜R8的電阻值做比較，即可得知插 槽91内複數之訊號接腳是否有空焊、冷焊或是短路的情 況。並且在測試卡11插入插槽91時，金屬片31可接觸位 於插槽91側邊的寫入保護接腳P12,使得寫入保護接腳P12 與測試電路20形成迴路。由於先前技術中的SD記憶卡不 具有金屬片31，因此無法讓寫入保護接腳P12直接與SD 記憶卡接觸以形成迴路，所以先前技術的測試治具即無法 利用上述的方法來判斷寫入保護接腳P12是否有空焊、冷 焊或是短路的情況。 接下來請參考圖4關於本發明之自動測試方法之步驟 流程圖。需注意的是，以下為了便於說明，係以圖1到圖 3所示之自動測試系統10與電子裝置90為例說明本發明 之自動測試方法，但本發明並不以此為限。此外，以下雖 以測試寫入保護接腳P12為例，但本發明自動測試系統10 所能測試的接腳並不以寫入保護接腳P12為限。 本發明首先進行步驟400 :將測試卡插入插槽内。 本發明首先將測試卡11插入插槽91内，以利用金屬 片31接觸插槽91内寫入保護接腳P12，使得測試電路20 與寫入保護接腳P12得以形成一迴路。 200916784 號予插槽内之寫 接著本發明進行步驟4〇1:輪 入保護接腳。 承戒 内之寫入 接著由測試治具Π輪入測 保護接腳P12。 K訊號到插槽91 步驟402 :判斷測試電路邀 路 /、寫入保護接腳是否形成迴 接者即判斷測試電路2 〇邀宜 ^ 迴路。在本實施例中係藉由m入保€接腳P12是否形成 列斷。在步驟401中，測試治^ Q具12輸入測試訊號進行 入測試訊號，測試訊號會經由全=由寫入保護接腳P12輸 剛試電路20,再傳回插槽91 ^屬片31流經測試卡11的 輪到地端接腳GND以形成趣的，號接腳P6，最後會傳 腳GND有偵測到測試訊號 右測试治具12在地端接 有，即代表插槽91有接腳接=正：：進行步驟彻。若沒 垃发t 深不正吊’即進行步驟406。 接者進行步驟403、量趣路之阻抗值。 i 測式治具12接著測量在弗 抗值。 步驟402中所形成的迴路的阻 小二:行步辑判斷該阻抗值與電阻值之差距是否 電1^8 I = 4〇3中所量得的阻抗值，再去與此迴路上的 St值做比較。其中電阻R8係為測試電路2。 電阻值為腳P12電性連接之電阻。由於電阻R8之 以之m 變’迴路的阻抗值應該等於或接近電阻 u <电阻值。因此春、 田 < 路的阻抗值與電阻R8之電阻值之 200916784 差距小於一定值，即可確定寫入保護接腳P12是作用正 常。若迴路的阻抗值接近無限大，即可確定寫入保護接腳 P12為空冷焊的情況。若迴路的阻抗值很小，則寫入保護 接腳P12可能有短路的情況發生。 若小於該定值，就進行步驟405 :輸出正常訊號。 此時自動測試系統10會輸出代表電子裝置90之插槽 91正常的訊號。自動測試系統10即可再進行其他的測試。 若大於該定值，就進行步驟406 :輸出不正常訊號。 此時自動測試系統10會輸出不正常的訊號，測試治具 12會停止測試的流程，以進行後續的處理。 自動測試系統10再重複上述的步驟即可測試完其他的 訊號接腳。由於測試其他接腳之方法與測試寫入保護接腳 P12之方法類似，且並非本發明之重點所在，故在此不再 贅述。 此處需注意的是，本發明之自動測試方法並不以上述 之步驟次序為限，只要能達成本發明之目的，上述之步驟 次序亦可加以改變。 如此一來，藉由本發明之自動測試系統10與自動測試 方法即可不需要將SD記憶卡重複插入插槽91來測試寫入 保護接腳P12的作用是否正常。就本實施例而言，自動測 試系統10只要利用測試卡11重複執行測試流程，即可以 測試完所有插槽91内的訊號接腳P1〜P12。並可立即得知 電子裝置90的插槽91是否能做用正常，所花費時間約在 1秒之内。相較於在先前技術中，自動測試系統10必須要 200916784 過2G #以上才可以測試完插槽91内的 = 12。因此由上述的說明可以得知則本發明之系統= 方法可以在測試時節省下許多人力與時間。 〃 综上所陳，本發明無論就目的、手段及功效，在 顯不其迴異於習知技術之特徵，懇請貴審查委員明察， 早日賜准專利’俾嘉惠社會’實感德便。惟應注意的是， 上述諸多實施㈣係為了便於說明而舉例而已，本發明所 主張之權利範圍自應以申請專利範圍所 於上述實施例。 【圖式簡單說明】 圖1係本發明之測試卡之示意圖。 圖2係本發明之測試卡與插槽連接之示意圖 動測忒系統與插槽内複數之訊號接腳連 圖3係本發明之自 接之電路圖。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test card, and more particularly to a test card for testing a write protection pin of a socket. [Prior Art] With the advancement of technology, the demand for the production and use of electronic devices is increasing. Therefore, an automatic test system capable of testing the function of an electronic device has also been widely used in production lines. Some electronic devices are now equipped with slots for reading other derived devices, such as slots for reading SD memory cards. Therefore, the automated test system must also test the role of its slots while automatically testing the role of the electronic device. Take the slot of the SD memory card as an example. In addition to the pin that can transmit data, the internal signal pin also includes write protection that can judge whether the SD memory card is locked or unlocked (Lock/Unlock). Pin. Since the write protection pin is located on the side of the slot, in the prior art, to test whether the write protection pin in the slot works properly, it is necessary to use an SD memory card to lock or It is read and written in the released state to determine whether the write protection pin can function. However, if the above test method is performed, at least two insertions and removals must be performed to adjust whether the SD memory card is locked or released. This will take more than twenty seconds and will greatly extend the time for automated testing and reduce the efficiency of automated testing. 200916784 Therefore, it is necessary to invent a new test system and method to solve the problems caused by the prior art. SUMMARY OF THE INVENTION / The main object of the present invention is to provide a test card and its automatic test system to achieve the effect of quickly testing the write protection pins in the slot. + The other object of the present invention is to provide an automatic test method for protecting the pins by means of a test card and its automatic test. ‘,.’ To achieve the above objectives, the automatic test system of the present invention includes a test card, and a test fixture. The test fixture has an automatic measurement resistance or electrical value, etc., which is: force energy. The test card is mounted in the slot of the electronic device, so that the test fixture can test the function of the plurality of pins in the slot. Tests include test electric (4) metal ^ metal piece and Lai circuit electrical connection D, and ί =; =: protection feet. The metal film system makes the automatic test method of the invention: the input protection pin of the input signal in the slot; whether the test circuit and the write protection pin form a loop, if not, the output is abnormal. Signal; if a loop is formed, the heart is measured and the impedance value of the loop is measured; the value of _ resistance and resistance = = less than - fixed value; if it is less than the fixed value, the output normal signal == right is greater than the fixed value, that is, the output is not Normal signal. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the invention. Next, please refer to Figure 1 to Figure 3 for the circuit diagram of the test card and the automatic test system and the signal pin connection in the slot. 1 is a schematic diagram of a test card of the present invention; FIG. 2 is a schematic diagram of a test card and a socket connection of the present invention; and FIG. 3 is a circuit diagram of the automatic test system of the present invention and a plurality of signal pins in the slot. The automatic test system 10 of the present invention includes a test card 11 and a test fixture 12. The automatic test system 10 is used to automatically test whether the function of the slot 91 of the electronic device 90 is normal. In this embodiment, the slot 91 is an SD memory card slot, and the test card 11 is identical in appearance to an SD memory card for inserting the test card 11 into the slot 91 for testing, but The invention is not limited to this. The electronic device 90 can be a notebook computer, but the invention is not limited thereto. The test card 11 of the present invention includes a test circuit 20 and a metal piece 31. Test circuit 20 can include a plurality of resistors R1 R R8. The slot 91 to be tested by the test card 11 has a plurality of signal pins P1 to P12 and a ground pin GND. The metal piece 31 is a copper piece which can be plated on the test card 11 by electroplating, but the invention is not limited thereto. And the metal piece 31 is electrically connected to the test circuit 20. When the test card 11 is inserted into the slot 91, the test circuit 20 can be electrically connected to the signal pins P1 P P12 and the ground pin GND in the slot 91 to form a plurality of loops. The test fixture 12 has a function of automatically measuring resistance or voltage values. The automated test system 10 utilizes the test fixture 12 to automatically test whether the function of the slot 91 of the electronic device 90 is normal, particularly if there is an empty weld, cold weld 200916784 or a short circuit condition. Since the test fixture 12 has been commonly used in a general test system, its function will not be described herein. When the automatic test system 10 is to be tested, the test fixture 12 is electrically connected to the plurality of signal pins P1 to P12 in the slot 91, and the test card 11 is mounted in the slot 91 of the electronic device 90. The test fixture 12 is enabled to test the function of the plurality of signal pins P1 to P12 in the slot 91 via the test card 11. The test fixture 12 measures the impedance value of the circuit and compares it with the resistance values of the resistors R1 to R8 to know whether the plurality of signal pins in the slot 91 are free-welded, cold-welded or short-circuited. And when the test card 11 is inserted into the slot 91, the metal piece 31 can contact the write protection pin P12 located on the side of the slot 91, so that the write protection pin P12 forms a loop with the test circuit 20. Since the SD memory card in the prior art does not have the metal piece 31, the write protection pin P12 cannot be directly contacted with the SD memory card to form a loop, so the prior art test fixture cannot use the above method to judge the writing. Whether the protection pin P12 has air welding, cold welding or short circuit. Next, please refer to FIG. 4 for a flow chart of the steps of the automatic test method of the present invention. It should be noted that, for convenience of description, the automatic test system 10 and the electronic device 90 shown in FIG. 1 to FIG. 3 are taken as an example to illustrate the automatic test method of the present invention, but the present invention is not limited thereto. In addition, although the test write protection pin P12 is taken as an example below, the pin that can be tested by the automatic test system 10 of the present invention is not limited to the write protection pin P12. The present invention first proceeds to step 400: inserting a test card into the slot. The present invention first inserts the test card 11 into the slot 91 to contact the write protection pin P12 in the slot 91 by the metal piece 31, so that the test circuit 20 and the write protection pin P12 form a loop. Writing to the slot in 200916784 Next, the present invention proceeds to step 4:1: the protection pin is inserted. The writing in the ring is followed by the test fixture 入 wheel into the protective pin P12. K signal to slot 91 Step 402: Determine whether the test circuit invites / writes the protection pin to form a return, that is, judges the test circuit 2 to invite the loop. In the present embodiment, whether or not the pin P12 is formed by the m insuring. In step 401, the test control signal input test signal is input into the test signal, and the test signal is transmitted to the test circuit 20 via the write protection pin P12, and then returned to the slot 91. The test card 11 has a turn-to-ground pin GND to form an interesting pin number P6. Finally, the test pin is detected by the pin GND. The right test fixture 12 is connected at the ground end, that is, the slot 91 has Pin connection = positive:: Carry out the steps. If there is no delay, then step 406 is performed. The receiver performs the step 403 and the impedance value of the measuring path. The i-test fixture 12 then measures the resistance value. The resistance of the loop formed in step 402 is small: the step size determines whether the difference between the impedance value and the resistance value is 1^8 I = 4〇3, and then goes to the St on the loop. Values are compared. The resistor R8 is the test circuit 2. The resistance value is the resistance of the foot P12 electrically connected. Since the resistance R8 is changed by m, the impedance value of the loop should be equal to or close to the resistance u < resistance value. Therefore, the gap between the impedance value of the spring, field < road and the resistance value of the resistor R8 is less than a certain value, and it can be determined that the write protection pin P12 is functioning normally. If the impedance value of the loop is close to infinity, it can be determined that the write protection pin P12 is air-cooled. If the impedance value of the loop is small, the write protection pin P12 may have a short circuit. If it is less than the fixed value, step 405 is performed: outputting a normal signal. At this time, the automatic test system 10 outputs a signal indicating that the slot 91 of the electronic device 90 is normal. The automatic test system 10 can perform other tests. If it is greater than the fixed value, step 406 is performed: an abnormal signal is output. At this time, the automatic test system 10 will output an abnormal signal, and the test fixture 12 will stop the test process for subsequent processing. The automatic test system 10 repeats the above steps to test other signal pins. Since the method of testing other pins is similar to the method of testing the write protection pin P12, and is not the focus of the present invention, it will not be described herein. It is to be noted that the automatic test method of the present invention is not limited to the above-described order of steps, and the order of the above steps may be changed as long as the object of the present invention can be attained. As a result, the automatic test system 10 and the automatic test method of the present invention eliminate the need to repeatedly insert the SD memory card into the slot 91 to test whether the write protection pin P12 functions normally. For the present embodiment, the automatic test system 10 can test the signal pins P1 to P12 in all the slots 91 by repeating the test flow using the test card 11. It can be immediately known whether the slot 91 of the electronic device 90 can be used normally, and it takes about 1 second. Compared to the prior art, the automatic test system 10 must have 200916784 over 2G # above to test = 12 in slot 91. Therefore, it can be known from the above description that the system of the present invention = method can save a lot of manpower and time during testing.综 In summary, the present invention, regardless of its purpose, means and efficacy, is no different from the characteristics of the prior art. You are requested to review the examination and express the patent “俾嘉惠社会” as soon as possible. It should be noted that the above-mentioned various embodiments (4) are exemplified for the convenience of the description, and the scope of the claims of the present invention is intended to be in the above-mentioned embodiments. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view of a test card of the present invention. 2 is a schematic diagram of the connection of the test card and the slot of the present invention. The dynamic test system and the signal pin connection in the slot are shown in FIG. 3 as a self-connected circuit diagram of the present invention.
圖4係本發明之自動職方法之步驟流程圖。 【主要元件符號說明】 自動測試系統10 測試卡11 測試治具12 測試電路20 金屬片31 200916784 電子裝置90 插槽91 訊號接腳P1〜P11 寫入保護接腳P12 地端接腳GND 電阻R1〜R84 is a flow chart showing the steps of the automated method of the present invention. [Main component symbol description] Automatic test system 10 Test card 11 Test fixture 12 Test circuit 20 Metal piece 31 200916784 Electronic device 90 Slot 91 Signal pin P1~P11 Write protection pin P12 Ground pin GND Resistor R1~ R8