TW200846430A - Glass polishing compositions and methods - Google Patents

Glass polishing compositions and methods Download PDF

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TW200846430A
TW200846430A TW96139714A TW96139714A TW200846430A TW 200846430 A TW200846430 A TW 200846430A TW 96139714 A TW96139714 A TW 96139714A TW 96139714 A TW96139714 A TW 96139714A TW 200846430 A TW200846430 A TW 200846430A
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composition
glass
polishing
cerium oxide
weight
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TW96139714A
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TWI384042B (en
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Nevin Naguib
Kevin Moeggenborg
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Cabot Microelectronics Corp
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Abstract

The present invention provides glass polishing compositions and methods suitable for polishing a glass substrate at a down force of 110 g/cm2 or less. One preferred polishing composition comprises a particulate cerium oxide abrasive (e.g., 1 to 15 percent by weight) suspended in an aqueous carrier containing a polymeric stabilizer, e.g., 50 to 1500 ppm of the stabilizer, and optionally, a water soluble inorganic salt. Preferably, the particulate cerium oxide abrasive has a mean particle size in the range of 0.35 to 0.9 μm. Another preferred composition comprises 1 to 15 percent by weight of a particulate cerium oxide abrasive characterized by a mean particle size of at least 0.2 μm and a purity of at least 99.9% CeO2, on a weight basis, suspended in an aqueous carrier at a pH at least 1 unit higher or lower than the isoelectric point (IEP) of the cerium oxide abrasive.

Description

200846430 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種組合物及用於拋光一玻璃基板之方 法。更詳言之,本發明係關於氧化鈽拋光組合物用於拋光 、 玻璃表面的用途。 【先前技術】 液晶顯示器(LCD)及有機發光二極體(OLED)平板設備通 常在LCD或OLED單元結構之外顯示表面上包括一薄玻璃 馨面板。希望該面板薄且高度均一以使面板之重量最小化且 提供優良的光學性質。OLED及LCD級玻璃包括鹼石灰玻 璃及鹼土金屬氧化物-Al203-Si02玻璃,諸如EAGLE®2000 玻璃、EAGLEX®L玻璃及1737玻璃及其類似物,其可購自 Corning Inc·,Corning,New York。玻璃之驗土金屬氧化物 組份較佳包含一或多種選自MgO、CaO、SrO及BaO之氧化 物。 用於玻璃面板拋光之習知系統通常利用兩步法,該兩步 ® 法包括移除材料之主體之最初研光或蝕刻步驟(主體移除 步驟),接著為利用包含與水混合且與固定研磨劑墊或膠 * 帶組合使用之相對較大之氧化鈽粒子(例如,平均粒度為2 微米或更大)的抛光組合物的磨光或抛光步驟。磨光或抛 光步驟主要用於移除由主體移除步驟所造成的損壞(例 如,凹坑、劃痕及其類似損害)。由於用該等系統獲得相 對低之玻璃移除速率,例如,小於500奈米/分鐘 (nm/min ; 0·5 μπι/πήη)之移除速率,故該等習知拋光系統 125872.doc 200846430 並不完全符合拋光平板顯示器之玻璃表面 面之要求。該等低200846430 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a composition and a method for polishing a glass substrate. More particularly, the invention relates to the use of a cerium oxide polishing composition for polishing, glass surfaces. [Prior Art] Liquid crystal display (LCD) and organic light emitting diode (OLED) flat panel devices typically include a thin glass glazing panel on the display surface outside the LCD or OLED unit structure. It is desirable that the panel be thin and highly uniform to minimize the weight of the panel and provide excellent optical properties. OLED and LCD grade glasses include soda lime glass and alkaline earth metal oxide-Al203-SiO2 glass, such as EAGLE® 2000 glass, EAGLEX® L glass, and 1737 glass and the like, which are commercially available from Corning Inc., Corning, New York. . The soil metal oxide component of the glass preferably comprises one or more oxides selected from the group consisting of MgO, CaO, SrO and BaO. Conventional systems for glass panel polishing typically utilize a two-step process that involves removing the initial polishing or etching step of the body of the material (subject removal step), followed by mixing and fixing with water Abrasive pad or glue* A polishing or polishing step of a polishing composition of relatively large cerium oxide particles (e.g., having an average particle size of 2 microns or greater) used in combination. The buffing or polishing step is primarily used to remove damage caused by the body removal step (e. g., pits, scratches, and the like). Since such systems achieve relatively low glass removal rates, for example, removal rates of less than 500 nanometers per minute (nm/min; 0·5 μπι/πήη), such conventional polishing systems 125872.doc 200846430 It does not fully meet the requirements of the glass surface of polished flat panel displays. Such low

學性質降級。另外, 及凹坑。表面劃痕及凹坑使面板之光 大氧化鈽粒子在輸送線及研磨漿儲集 器中傾向於自水中沈降出來,從而導致製造困難。 在許夕^知拋光技術中,基板載體或拋光頭係安裝於載 體總成上且與拋光裝置中之拋光墊接觸置放 。載體總成向 基板提供可控壓力(下壓力)以迫使基板與拋光墊相抵。該 墊因外部驅動力而相對於基板移動。墊與基板之相對移動 起研磨基板表面之作用以自基板表面移除一部分材料,藉 此使表面拋光。拋光通常進一步由拋光組合物之化學活性 及/或懸浮於拋光組合物中之研磨劑之機械活性輔助。在 如上所述之典型玻璃抛光系統中,須使用大於丨丨〇公克/平 方公分(g/cm , 1.56碎/平方吋,psi)之相對較高之下壓力 來獲得適用之移除速率。該等較高之下壓力增加LCD及 OLED設備中所使用之相對較薄之玻璃面板的破損率。 正需要開發能夠利用11 〇 g/cm2或更小之下壓力來拋光玻 璃、尤其OLED及LCD級玻璃面板且相對於習知氧化鈽拋 光研磨漿具有改良之研磨漿加工性質的拋光組合物。相對 於習知拋光方法,較低的下壓力減少拋光期間玻璃破損之 量。亦需要相對於通常所使用之大粒子氧化鈽磨光系統提 供改良之玻璃移除速率(亦即,移除速率大於5〇〇 nm/min) 的拋光研磨漿。本發明提供該等組合物。自本文所提供之 125872.doc 200846430 發明說明將顯而易見本發明之該等及其他優點以及盆他發 明性特徵。 【發明内容】 1樣中本發明&供玻璃拋光組合物及適用於利用 110細2或更小之下壓力拋光玻璃、尤其OLED及LCD級 玻璃面板之方法。本發明之較佳水性玻璃拋光組合物包含 懸浮於含有穩定劑及視情況水溶性無機鹽(例如,齒化錄)The nature of the study is downgraded. In addition, and pits. Surface scratches and pits make the panel light Large cerium oxide particles tend to settle out of the water in the conveyor line and the slurry reservoir, resulting in manufacturing difficulties. In the polishing technique, the substrate carrier or polishing head is mounted on the carrier assembly and placed in contact with the polishing pad in the polishing apparatus. The carrier assembly provides a controlled pressure (downforce) to the substrate to force the substrate against the polishing pad. The pad moves relative to the substrate due to an external driving force. The relative movement of the pad to the substrate acts to abrade the surface of the substrate to remove a portion of the material from the surface of the substrate, thereby polishing the surface. Polishing is typically further aided by the chemical activity of the polishing composition and/or the mechanical activity of the abrasive suspended in the polishing composition. In a typical glass polishing system as described above, a relatively high pressure below 丨丨〇 gram/square centimeter (g/cm, 1.56 rpm/psi) must be used to achieve a suitable removal rate. These higher pressures increase the breakage rate of relatively thin glass panels used in LCD and OLED devices. There is a need to develop polishing compositions that are capable of polishing glass, particularly OLED and LCD grade glass panels, with pressures below 11 〇 g/cm2 or less and that have improved slurry processing properties relative to conventional cerium oxide polishing slurry. The lower downforce reduces the amount of glass breakage during polishing relative to conventional polishing methods. It is also desirable to provide a polishing slurry having an improved glass removal rate (i.e., a removal rate greater than 5 Å nm/min) relative to the large particle cerium oxide polishing system typically employed. The present invention provides such compositions. These and other advantages of the present invention, as well as the inventive features, are apparent from the description of the invention. SUMMARY OF THE INVENTION The present invention is directed to a glass polishing composition and a method suitable for polishing glass, particularly OLED and LCD grade glass panels, using 110 fine 2 or less pressure. The preferred aqueous glass polishing composition of the present invention comprises suspension in a stabilizer-containing and optionally water-soluble inorganic salt (e.g., tooth recording)

之水性載劑中之顆粒狀氧化鈽研磨劑。在—較佳實施例 中,組合物包含藉助於聚合穩定劑懸浮於水性載劑中之平 均,度在350⑽至900 nm(〇.35㈣至〇 9㈣範圍内之顆粒 狀氧化鈽研磨劑。較佳地,穩定劑包含至少一種選自由以 下各物組成之群之酸性聚合物:聚丙烯酸酯(例如,聚丙 烯酸)、聚曱基丙晞酸醋(例如,聚甲基丙烯酸)及聚(乙稀 磺酸酯)(例如,聚(乙烯磺酸)),其可以酸形式、鹽形式(例 如,鹼金屬鹽)或部分中和之形式存在於拋光組合物中。 在另-實施例中’組合物包含至少一種選自由以下各物組 成之群之極性非離子型或陰離子型聚合物:聚乙烯吡咯啶 酮(PVP)、聚(乙稀醇)、聚(2_乙基喔唾琳)、㈣乙基纖維 素及頁原膠。二氧化鈽研磨劑較佳包含以重量計至少 99.9% Ce02 〇 在另一態樣中,本發明之玻璃拋光組合物包含丨至^重 量%懸浮於水性載劑中之純度為以重量計至少99.9% Ce〇2 之顆粒狀氧化鈽研磨劑。氧化鈽研磨劑之平均粒度為至少 〇·2 μπι,較佳在〇·2 0111至11 圍内且pH值比氧化鈽研 125872.doc 200846430 磨劑之等電點(IEP)高或低至少1單位。通常氧化鈽之IEp之 pH值在6至7範圍内。在一較佳實施例中,組合物之?11值 在3至4範圍内,且可視情況包含1至2〇百萬分率;較 仏5至10 ppm)吡啶曱酸(亦即,吡啶-2·甲酸)作為穩定劑。 虽在1重1%濃度下利用研磨劑時,尤其較佳存在吡啶曱 商文。在另一較佳實施例中,組合物之值在8至9範圍内。 當用於拋光玻璃、尤其OLED及LCD級玻璃面板,諸如 鹼石灰玻璃及鹼土金屬氧化物-Al203-Si02玻璃面板時,本 發月之、、且a物及方法提供大於nm/min之相對較高之玻 璃移除速率。本發明之組合物及方法希望且易於適合於大 規模應用。本發明之穩定化玻璃拋光組合物之一優點為改 良之加工性質(亦即,氧化鈽粒子在傳送線及在研磨漿儲 集槽中沈降較少)及改良之再循環性。 一較佳方法實施例包含如下步驟:使基板之表面與拋光 墊及本發明之水性玻璃拋光組合物接觸;及使拋光墊與基 板之間相對移動,同時維持組合物之至少一部分與墊與基 板之間的表面接觸歷時一段足以自該表面研磨該玻璃之至 少一部分之時間。 【實施方式】 本發明提供玻璃拋光組合物及適用於尤其在11〇 g/cm2或 更】、之下壓力下拋光LCD及OLED顯示器中所使用之玻璃 面板之方法。在第一態樣中,該玻璃拋光組合物包含藉助 於聚合穩定劑懸浮於水性載劑中之氧化鈽粒子。在一些較 it實施例中,組合物亦包含水溶性無機鹽。 125872.doc •10· 200846430 聚合穩^劑可為任何提供氧㈣粒子穩定料之物質。 合適穩定劑之非限定性實例包括酸性聚合物(例如,丙烯 酉文聚合物、甲基丙烯酸聚合物及乙烯磺酸聚合物)、極性 非離子型聚合物(例如,乙稀啦洛咬嗣聚合物、乙稀醇聚 口物、2-乙基噁唑啉聚合物、羥基烷基纖維素)及陰離子型 多醣(黃原膠)。在一較佳實施例中,穩定劑包含至少一種 選自由以下各物組成之群之聚合物··聚丙烯酸、聚甲基丙 烯酸及聚(乙烯續酸),其可呈酸、鹽或部分中和之形式。 在另-較佳實施例中,穩定劑包含至少一種選自由以下各 物、、且成之群之聚合物:聚乙烯吡咯啶酮(pvp)、聚(乙烯 醇)、聚(2-乙基噁唑啉)、羥基乙基纖維素及黃原膠。 為方便起見,術語”丙烯酸酯"、,,聚丙烯酸酯"、"甲基丙 烯酸酯聚甲基丙烯酸酉旨”、"磺酸醋”及"聚(乙稀石备酸 酯)”係指其酸形式、鹽形式及部分中和之形式。較佳地, 穩定劑係以活性成份計5〇至15⑽百萬分率(ρ_、更佳⑽ 至lOOOppm範圍内之量存在於組合物中。 當在本發明之方法中使用聚丙烯酸_、聚甲基丙稀酸醋 及/或聚乙烯績酸S旨作為穩定劑時,穩定劑較佳具有3 _ 至4M00公克/莫耳(g/mol)範圍内之分子量。除非另有說 明,否則穩定劑之分子量為由諸如固有黏度及/或凝膠滲 透層析法(GPC)之溶液性質技術所測定之重量平均分子量 (Mw)。當制PVP作為㈣劑時,pvp較佳具有从刚至 1,000,〇〇〇 g/m〇l範圍内之公不旦 之刀子里,如所謂的K值所指示, 其較佳在25至90範圍内。當利用聚(乙稀醇)作為穩定劑 I25872.doc 11 - 200846430 卞聚(乙烯醇)較佳具有12〇〇〇至2〇〇〇〇〇咖〇1範圍内之 刀子里。當利用聚(2_乙基嗔0坐琳)作為穩定劑時,聚(2-乙 f °惡㈣)較佳具有50,_至5〇〇,_ g/mol範圍内之分子 置。咸信上逃聚合物藉由阻止氧化鈽粒子聚集在-起且在 研磨衆中絮凝而增加粒子在拋光組合物中之膠體穩定性。 水办!·生無機鹽(當存在時)較佳包含以組合物之總重量計 的樾光組合物之0.05至〇1重量%,更佳〇」重量%。較佳無 機鹽包括水溶性絶鹽,諸如虐化铯(例如,氯钱)。尤其 較佳之水溶性無機鹽為氯化鉋。 八 在不希望受理論限制的情況下,咸信諸如氯化錄之水溶 性無機鹽提供相對較高之離子強度,其增加氧化鈽粒子盥 玻璃表面之間的摩擦力,從而有利地增加玻璃移除速率。 如此項技術中熟知之雷射光散射技術所測定,本發明之 此第一態樣中所使用之氧化鈽研磨劑較佳具有350⑽至 _ mn、更佳45〇⑽至5〇〇 nm範圍内之平均粒度。氧 研磨劑較佳以基於組合物之總重量丨至15重量%、更佳5至 10重量%範圍内之量存在於拋光組合物中。 本發明之第-態樣之拋光組合物可具有與該組合物之紐 份相容且適用於玻龍光應用之任何阳值。在4實施例 中’諸如當利用PVP作為穩定劑時,pH值較佳為適度酸性 (例如’ 4至6)。在其他實施例中,組合物之PH值係在中性 至鹼性範圍内,例如7至11、更佳7至9範圍内。 在第二態樣中,本姻之玻義光組合物包含丨至^重 量%之懸浮於水性載劑中的純度為以重量計至少99.9% 125872.doc -12- 200846430A particulate cerium oxide abrasive in an aqueous carrier. In a preferred embodiment, the composition comprises a particulate cerium oxide abrasive having an average of from 350 (10) to 900 nm (〇.35 (4) to 〇9 (iv)) suspended in an aqueous carrier by means of a polymeric stabilizer. The stabilizer comprises at least one acidic polymer selected from the group consisting of polyacrylates (e.g., polyacrylic acid), polydecyl acrylate (e.g., polymethacrylic acid), and poly(ethylene). a sulfonate) (for example, poly(ethylenesulfonic acid)), which may be present in the polishing composition in acid form, in salt form (eg, an alkali metal salt) or in partially neutralized form. In another embodiment, 'combination The composition comprises at least one polar nonionic or anionic polymer selected from the group consisting of polyvinylpyrrolidone (PVP), poly(ethylene glycol), poly(2-ethylsulfonium), (4) Ethylcellulose and page gum. The cerium oxide abrasive preferably comprises at least 99.9% by weight of Ce02. In another aspect, the glass polishing composition of the present invention comprises cerium to 5% by weight suspended in waterborne loading. The purity in the agent is by weight At least 99.9% Ce〇2 granular cerium oxide abrasive. The average particle size of the cerium oxide abrasive is at least 〇·2 μπι, preferably in the range of 〇·2 0111 to 11 and the pH value is 872 125 125872.doc 200846430 The isoelectric point (IEP) of the abrasive is at least 1 unit high or low. Typically, the pH of the IEp of cerium oxide is in the range of 6 to 7. In a preferred embodiment, the value of the composition is in the range of 3 to 4. And, as the case may be, 1 to 2 parts per million; more than 5 to 10 ppm) of pyridinic acid (i.e., pyridine-2.carboxylic acid) as a stabilizer. Pyridinium is especially preferred when an abrasive is used at a concentration of 1% by weight. In another preferred embodiment, the value of the composition is in the range of 8 to 9. When used for polishing glass, especially OLED and LCD grade glass panels, such as soda lime glass and alkaline earth metal oxide-Al203-SiO2 glass panels, the present invention provides a relatively greater than nm/min ratio. High glass removal rate. The compositions and methods of the present invention are desirable and readily adaptable for large scale applications. One of the advantages of the stabilized glass polishing composition of the present invention is improved processing properties (i.e., less cerium oxide particles settle on the transfer line and in the slurry reservoir) and improved recyclability. A preferred method embodiment comprises the steps of: contacting a surface of a substrate with a polishing pad and an aqueous glass polishing composition of the present invention; and moving the polishing pad relative to the substrate while maintaining at least a portion of the composition and the substrate and substrate The surface contact therebetween lasts a period of time sufficient to grind at least a portion of the glass from the surface. [Embodiment] The present invention provides a glass polishing composition and a method for polishing a glass panel used in LCD and OLED displays, particularly under pressure of 11 〇 g/cm2 or more. In a first aspect, the glass polishing composition comprises cerium oxide particles suspended in an aqueous carrier by means of a polymeric stabilizer. In some of the more examples, the composition also comprises a water soluble inorganic salt. 125872.doc •10· 200846430 The polymerization stabilizer can be any substance that provides an oxygen (tetra) particle stabilizer. Non-limiting examples of suitable stabilizers include acidic polymers (e.g., propylene polymers, methacrylic polymers, and vinyl sulfonate polymers), polar nonionic polymers (e.g., ethylene chelating polymerization) , ethyl alcohol agglomerate, 2-ethyloxazoline polymer, hydroxyalkyl cellulose) and anionic polysaccharide (xanthan gum). In a preferred embodiment, the stabilizer comprises at least one polymer selected from the group consisting of polyacrylic acid, polymethacrylic acid, and poly(ethylene vinyl), which may be in the form of an acid, a salt or a portion. And the form. In another preferred embodiment, the stabilizer comprises at least one polymer selected from the group consisting of: polyvinylpyrrolidone (pvp), poly(vinyl alcohol), poly(2-ethyl Oxazoline), hydroxyethyl cellulose and xanthan gum. For convenience, the terms "acrylate", ",, polyacrylate", "methacrylic acid polymethacrylate", "quot; sulfonic acid vinegar" and "poly" "Ester)" refers to its acid form, salt form and partially neutralized form. Preferably, the stabilizer is present in the composition in an amount ranging from 5 Torr to 15 (10) parts per million (p_, more preferably (10) to 1000 ppm) of the active ingredient. When polyacrylic acid is used in the method of the present invention, When methyl acetoacetate and/or polyethylene acid S is intended as a stabilizer, the stabilizer preferably has a molecular weight in the range of from 3 Å to 4 M 00 g/mol (g/mol). Stable unless otherwise stated The molecular weight of the agent is a weight average molecular weight (Mw) determined by a solution property technique such as intrinsic viscosity and/or gel permeation chromatography (GPC). When PVP is used as the (four) agent, pvp preferably has from just up to 1,000. In the knives of the 〇〇〇g/m〇l range, as indicated by the so-called K value, it is preferably in the range of 25 to 90. When using poly(ethylene glycol) as a stabilizer I25872. Doc 11 - 200846430 卞 (vinyl alcohol) preferably has a knife in the range of 12 〇〇〇 to 2 〇〇〇〇〇 curry 1. When using poly(2_ethyl 嗔0 sitting lining) as a stabilizer , poly(2-ethylf ° (4)) preferably has a molecular range of 50, _ to 5 〇〇, _ g / mol. The colloidal stability of the particles in the polishing composition is increased by preventing the cerium oxide particles from accumulating and flocculation in the polishing population. Water! The raw inorganic salt (when present) preferably comprises the total composition The weight ratio of the calendering composition is from 0.05 to 〇1% by weight, more preferably 〇% by weight. Preferred inorganic salts include water-soluble salts such as mascara (for example, chlorohydrin). Particularly preferred water-soluble inorganic salts It is a chlorinating planer. VIII. Without wishing to be bound by theory, it is believed that a water-soluble inorganic salt such as chlorinated provides a relatively high ionic strength which increases the friction between the cerium oxide particles and the surface of the glass, thereby Advantageously, the glass removal rate is increased. The cerium oxide abrasive used in this first aspect of the invention preferably has from 350 (10) to _mn, more preferably 45 Å (10) as determined by laser light scattering techniques well known in the art. An average particle size in the range of up to 5 〇〇 nm. The oxygen abrasive is preferably present in the polishing composition in an amount ranging from 15% by weight, more preferably from 5 to 10% by weight, based on the total weight of the composition. Parallel The composition may have any positive value compatible with the core of the composition and suitable for use in a Bronze application. In 4 embodiments, such as when using PVP as a stabilizer, the pH is preferably moderately acidic (eg, '4' To 6). In other embodiments, the pH of the composition is in the range of neutral to alkaline, such as in the range of 7 to 11, more preferably 7 to 9. In the second aspect, the glass of the marriage is The composition comprises from 丨 to 重量% by weight suspended in an aqueous carrier at a purity of at least 99.9%. 125872.doc -12- 200846430

Ce〇2之顆粒狀氧化鈽研磨劑。在本發明之此第二態樣中, 氧化鈽研磨劑具有至少〇·2 μπι、較佳〇·2 0111至11 μπι範圍内 之平均粒度且pH值比氧化鈽研磨劑之等電點(ΙΕρ)高或低 至少1單位。通常氧化鈽之ΙΕΡ之pH值在6至7範圍内。Granular cerium oxide abrasive of Ce〇2. In this second aspect of the invention, the cerium oxide abrasive has an average particle size in the range of at least 〇 2 μπι, preferably 〇 2 0111 to 11 μπι and a pH value equal to the isoelectric point of the cerium oxide abrasive (ΙΕρ ) High or low at least 1 unit. Usually, the pH of the cerium oxide is in the range of 6 to 7.

通常’習知氧化鈽研磨劑在拋光玻璃之IEp處或接近IEp 處之pH值(PH 6-7)下使用。已令人驚訝地發現當在pH值比 IEP之pH值高或低至少丄單位下使用時,具有至少99·9重量 Ce〇2之純度(,,超純,,氧化鈽)及至少〇·2叫、較佳〇·2 _ 至11 μιη之平均粒度之氧化鈽提供顯著較高的拋光^〔^^級 玻璃之玻璃移除速率。 在一較佳實施例中,第二態樣之組合物具有3至4範圍内 之pH值’且可視情況包含丨至2〇百萬分率㈣瓜;較佳$至 10 ppm)之吡啶甲酸作為穩定劑。當在較低濃度(例如工重 量%濃度)下使用研磨劑時,尤其較佳存在_甲酸。在第 〜、樣之另較佳實施例中,組合物之pH值在8至9範圍 内。 本發月之組合4勿中之氧化飾研磨齊!理想地懸浮於抛光 乂物之水、、且伤巾’較佳處於膠體穩定狀態。術語”膠覺 係才曰研磨』粒+於液體載劑中之懸浮液。"膠體穩定性” 指隨時間料料較其具有最小的粒子麟。在本發 之情況下,若當將研磨劑置放於100 mL量筒中且在不攪 之^況下使其靜置2小時之時間,量筒之底部50 mL中之 /辰度([B]以g/mL表示)與量筒頂部5〇 mL中之粒子濃 ([T],以g/mL表元、夕i „人 ) 差除以組合物中粒子之初始濃 125872.doc -13- 200846430 ([C],以g/mL表示)小於或等於〇·5(亦即,([β] [T])/[C]S0.5),則認為顆粒狀研磨劑具有膠體穩定性。 ([B]-[T])/[C]之值理想地小於或等於〇·3且較佳小於或等於 0,1。 周於本發明之組合物之水性載劑可為任何適用於玻璃拋 光加工之水性液體。該等組合物包括水、酒精水溶液及其 類似物。水性載劑較佳包含去離子水。 本發明之組合物視情況可包含一或多種添加劑,諸如界 面活性劑、殺生物劑及其類似物。 本發明之拋光組合物可由任何合適技術製備,熟習此項 技術者已知許多該等技術。舉例而言,組合物可以分批法 或連續法製備。通常組合物可藉由將其組份按任何順序組 合來製備。如本文所使用之術語”組份”包括個別成份(例 如,研磨劑、穩定劑、水溶性無機鹽、酸、鹼及其類似 物)以及成份之任何組合。舉例而言,可將水溶性無機鹽 及穩定劑溶解於水中,可將研磨劑分散於所得溶液中,且 隨後可藉由任何能夠將組份均一地併入組合物中之方法添 加且混合任何其他組份。若需要,則可在任何合適時間調 節pH值。需要時,可用任何合適的酸、鹼或緩衝劑調節組 合物之PH值。合適的pH調節劑包括(但不限於)氫氧化鉀、 氫氧化銨及硝酸。 組合物亦可以在使用前意欲用適量水稀釋之濃縮物形式 提供。在該實施例中,組合物濃縮物可包含一定量之分散 及/或溶解於水性載劑中之氧化鈽研磨劑、穩定劑、水溶 125872.doc -14- 200846430 性無機鹽及任何其他組份,該等量使得在濃縮物經適量水 性溶劑稀釋後,拋光組合物之各組份將以適當使用範圍内Typically, conventional cerium oxide abrasives are used at or near the IEp of the polished glass (pH 6-7). It has been surprisingly found that when used at a pH higher or lower than the pH of the IEP, it has a purity of at least 99·9 by weight of Ce 2 (, ultrapure, yttrium oxide) and at least 〇· The cerium oxide having an average particle size of 2, preferably 22 _ to 11 μηη provides a significantly higher glass removal rate of the polished glass. In a preferred embodiment, the composition of the second aspect has a pH value in the range of 3 to 4 and optionally comprises from 2 to 4 parts per million (four) melon; preferably from $ to 10 ppm) of picolinic acid. As a stabilizer. When an abrasive is used at a lower concentration (e.g., a work weight % concentration), it is especially preferred to have - formic acid. In a further preferred embodiment of the invention, the pH of the composition is in the range of 8 to 9. The oxidized decoration of the combination of the present month 4 is ideally suspended in the water of the polishing sputum, and the wounded towel is preferably in a colloidally stable state. The term "gelling" is a suspension of particles + in a liquid carrier. "colloidal stability" means that the material has the smallest particle size over time. In the case of the present invention, if the abrasive is placed in a 100 mL graduated cylinder and allowed to stand for 2 hours without agitation, the bottom of the cylinder is 50 mL/min ([B] In g/mL, it is concentrated with the particles in the 5 〇mL at the top of the cylinder ([T], g/mL, i i „人). The difference is divided by the initial concentration of the particles in the composition. 125872.doc -13- 200846430 ([C], expressed in g/mL) is less than or equal to 〇·5 (ie, ([β] [T])/[C]S0.5), and the particulate abrasive is considered to have colloidal stability. The value of [B]-[T])/[C] is desirably less than or equal to 〇3 and preferably less than or equal to 0, 1. The aqueous carrier of the composition of the present invention may be any suitable for glass polishing. Processed aqueous liquids. The compositions include water, aqueous alcoholic solutions, and the like. The aqueous carrier preferably comprises deionized water. The compositions of the present invention may optionally comprise one or more additives, such as surfactants, biocidal agents. Agents and Analogs The polishing compositions of the present invention can be prepared by any suitable technique, and many such techniques are known to those skilled in the art. For example, the compositions can be batchwise Prepared by a continuous process. Typically the compositions can be prepared by combining the components in any order. The term "component" as used herein includes individual ingredients (eg, abrasives, stabilizers, water soluble inorganic salts, acids, a base and its analogs) and any combination of ingredients. For example, a water-soluble inorganic salt and a stabilizer may be dissolved in water, an abrasive may be dispersed in the resulting solution, and then the components may be uniformly dispersed by any means. The method of incorporating into the composition adds and mixes any other components. If desired, the pH can be adjusted at any suitable time. If desired, the pH of the composition can be adjusted with any suitable acid, base or buffer. The pH adjusting agent includes, but is not limited to, potassium hydroxide, ammonium hydroxide, and nitric acid. The composition may also be provided in the form of a concentrate intended to be diluted with an appropriate amount of water prior to use. In this embodiment, the composition concentrate may comprise a certain amount of cerium oxide abrasive, stabilizer, water-soluble 125872.doc -14- 200846430 inorganic salt and any other components dissolved in an aqueous carrier, such The concentrate was diluted so that the amount of water of the solvent, the components will be appropriately within the scope of the polishing composition

可將本發明之組合物併入單一預調配之組合物中,該單 一預調配之組合物包含分散於包括至少一種穩定劑化合 物、可選無機鹽及其他可選成份(必要時)在所要pH值下之 水性載劑中之氧化鈽研磨劑。或者,組合物可以兩部分形 式(亦即,兩部分製品)提供以避免研磨漿之活性隨時間之 潛在變化。該兩部分製品包括一第一容器,其包含至少穩 定劑以及可選無機鹽;及一第二容器,其包括呈乾燥形式 或較佳呈於水性載劑(例如,去離子水)中之研磨漿形式之 氧化鈽顆粒狀研磨劑。該第一容器及該第二容器較佳連同 用於混合容器中之内容物以形成本發明之組合物之說明書 封$在-起。可選擇各封裝巾水性_之阳值及各種組份 之濃度以使得在混合第一容器中之内容物與第二容器中之 内容物之後,提供(例如)具有適量懸浮於合適?11值(例 如,7至U)下且含有適量穩定劑(例如,5〇至15〇〇剛)及 可選組份之水性載劑中之氧化鈽(例如,di5重量%)的適 用於本發明之方法的拋光組合物。 包括至少一種溶解於第一水性載齊 第二容器封裝在一起,該第二容器 性载劑中之顆粒狀氧化鈽研 在於平均粒度在350 nm至900 nms 在一較佳實施例中,該兩部分製品包含一第一容器,其 水性載劑中之穩定劑,且其與一 第一谷益包括較佳懸浮於第二水The compositions of the present invention may be incorporated into a single pre-formulated composition comprising a dispersion comprising at least one stabilizer compound, an optional inorganic salt, and other optional ingredients (if necessary) at the desired pH. A cerium oxide abrasive in an aqueous carrier at a value. Alternatively, the composition can be provided in a two-part form (i.e., a two-part article) to avoid potential changes in the activity of the slurry over time. The two-part article comprises a first container comprising at least a stabilizer and optionally an inorganic salt; and a second container comprising a ground in dry form or preferably in an aqueous carrier (eg, deionized water) A cerium oxide particulate abrasive in the form of a slurry. Preferably, the first container and the second container together with the instructions for mixing the contents of the container to form a composition of the present invention. The solar value of each package can be selected and the concentration of the various components such that, after mixing the contents of the first container with the contents of the second container, for example, is it suitable to suspend it in an appropriate amount? Suitable for this type of cerium oxide (for example, di 5% by weight) in an aqueous carrier containing 11 (for example, 7 to U) and containing an appropriate amount of stabilizer (for example, 5 to 15 Å) and optional components A polishing composition of the inventive method. Including at least one dissolved in a first aqueous carrier, the second container is packaged together, and the particulate cerium oxide in the second container carrier is in an average particle size of from 350 nm to 900 nms. In a preferred embodiment, the two The partial product comprises a first container, a stabilizer in the aqueous carrier, and the first phase comprises a suspension preferably in the second water

nm<範圍内,且該穩定劑係 125872.doc -15- 200846430 選自由聚丙烯酸酯、聚甲基丙烯酸酯、聚(乙烯磺酸酯)及 任何上述者之鹽組成之群。在將第一容器之内容物與第二 容器、之内容物混合之後,形成本發明之拋光組合物,該組 合物包括1至15重量%之該氧化鈽研磨劑及5〇至15〇〇 ppm 之該至少一種穩定劑。 在另一較佳實施例中,該兩部分製品包含一第一容器, 其包括至少一種溶解於第一水性載劑中之穩定劑,且其與 一第二容器封裝在一起,該第二容器包括較佳懸浮於第二 水性載劑中之顆粒狀氧化鈽研磨劑。該氧化鈽研磨劑之特 欲在於平均粒度在350 nm至900 nm之範圍内,且該至少一 種穩疋劑係選自由聚乙烯吡咯啶酮、聚(乙烯醇)、聚(2•乙 基噁唑啉)、羥基乙基纖維素及黃原膠組成之群。在將第 一容器之内容物與第二容器之内容物混合之後,形成本發 明之拋光組合物,該組合物包括丨至15重量%之該氧化鈽 研磨劑及50至1500 ppmi該至少一種穩定劑。 視情況,該兩部分製品之第一封裝可包括一定濃度之水 溶性無機鹽(例如,铯鹽),以使該混合拋光組合物包括 〇·〇5至0.1重I %之鹽。第一及第二水性載劑兩者較佳均包 含去離子水。該兩種水性載劑之調配物及物理化學性質可 視而要而相同或不同(例如,各載劑之pH值可視需要或期 望而相同或不同,且各載劑可含有相同或不同量之多種可 選成伤’諸如溶劑、殺生物劑、缓衝液、界面活性劑及其 類似物)。 、 本毛明之較佳方法包含⑴使玻璃基板與拋光墊及如本文 125872.doc •16· 200846430 所述之本發明之拋光組合物接觸;及(π)使拋光墊相對於 基板移動且於兩者之間具有拋光組合物之至少一部分,藉 此自基板之表面研磨玻璃之至少一部分以拋光基板。玻璃 基板較佳為OLED或LCD級玻璃,諸如鹼石灰玻璃或鹼土 金屬氧化物-Al2〇rSi02玻璃,其中驗土金屬氧化物包含一 或多種選自此項技術中熟知之MgO、CaO、SrO及BaO之氧 化物。 本發明之拋光方法適用於與化學機械(CMP)拋光裝置結 合使用。CMP裝置通常包含一壓板,該壓板在使用中運動 且具有由軌道、線性或圓周運動產生之速度。一拋光墊安 裝於該壓板上且與壓板一起移動。一載體總成固持一待抛 光之基板。藉由使該基板與該墊接觸,同時維持本發明之 拋光組合物之一部分安置於墊與基板之間而實現拋光。隨 後’相對於撤光墊之表面移動基板,同時在所選擇之足以 貝現所要玻璃移除速率之下壓力(較佳1 1 〇 g/em2或更小)下 迫使基板與墊表面相抵。藉由研磨基板表面之拋光墊及拋 光組合物之組合化學及機械作用實現基板之拋光。 可使用任何合適的拋光墊(例如,拋光表面),用本發明 之拋光組合物使基板平面化或拋光。合適的撤光墊包括 (例如)固定研磨劑墊、編織墊及非編織墊。此外,合適之 拋光墊可包含任何具有不同密度、硬度、厚度、壓縮性、 壓縮後彈回之能力及壓縮模量之合適聚合物。合適的聚合 物包括(例如)聚氯乙烯、聚氟乙烯、耐綸、碳氟化合物、 碳酸酯、聚酯、聚丙烯酸酯、聚醚、聚乙烯、聚醯胺、 125872.doc -17- 200846430 聚胺基甲酸酯、聚苯乙烯、聚丙烯、其共形成產物及其混 合物。 下列實例進一步說明本發明,但當然無論如何不應理解 為限制本發明之範疇。 - 實例1 此實例說明利用包含氧化鈽以及PVP作為穩定劑之水性 拋光組合物拋光根據本發明之玻璃基板。製備本發明之兩 種拋光組合物(組合物1A及1B)。組合物1A含有於pH 5之水 •中的5重里/i>之氧化飾研磨劑、ppm之p vp(K9〇)及 1000 ppm之氯化鉋。組合物⑺含有於pH 5之水中之5重量 %之氧化飾研磨劑(平均粒度為5 0 0 nm,純度大於或等於 99.9% Ce〇2)及1000 ppm之聚乙烯吡咯啶酮(K9〇)。亦製備 比較組合物(組合物1C),其含有於未添加鹽或穩定劑之水 中的5%之氧化鈽研磨劑。 使用該3種組合物在下列拋光條件下拋光4 cmX4 cm LCD 0 級玻璃測試面板(鹼土金屬氧化物(Mg〇、Ca〇、Sr〇、Within the range of nm<, and the stabilizer is 125872.doc -15- 200846430 is selected from the group consisting of polyacrylates, polymethacrylates, poly(vinylsulfonate), and salts of any of the foregoing. After mixing the contents of the first container with the contents of the second container, the polishing composition of the present invention is formed, the composition comprising 1 to 15% by weight of the cerium oxide abrasive and 5 to 15 ppm The at least one stabilizer. In another preferred embodiment, the two-part article comprises a first container comprising at least one stabilizer dissolved in the first aqueous carrier and packaged with a second container, the second container A particulate cerium oxide abrasive preferably suspended in a second aqueous carrier is included. The cerium oxide abrasive is characterized in that the average particle size is in the range of 350 nm to 900 nm, and the at least one stabilizer is selected from the group consisting of polyvinylpyrrolidone, poly(vinyl alcohol), and poly(vinyl ether). A group consisting of oxazoline, hydroxyethyl cellulose and xanthan gum. After mixing the contents of the first container with the contents of the second container, the polishing composition of the present invention is formed, the composition comprising from 15% by weight of the cerium oxide abrasive and from 50 to 1500 ppmi of the at least one stable Agent. Optionally, the first package of the two-part article may comprise a concentration of a water-soluble inorganic salt (e.g., a cerium salt) such that the mixed polishing composition comprises from 5 to 0.1% by weight of a salt of cerium. Both the first and second aqueous carriers preferably comprise deionized water. The formulations and physicochemical properties of the two aqueous carriers may be the same or different (for example, the pH of each carrier may be the same or different as needed or desired, and each carrier may contain the same or different amounts Optional wounds such as solvents, biocides, buffers, surfactants and the like. The preferred method of the present invention comprises (1) contacting the glass substrate with a polishing pad and the polishing composition of the present invention as described in 125872.doc •16·200846430; and (π) moving the polishing pad relative to the substrate and There is at least a portion of the polishing composition therebetween, whereby at least a portion of the glass is ground from the surface of the substrate to polish the substrate. The glass substrate is preferably an OLED or LCD grade glass, such as soda lime glass or alkaline earth metal oxide-Al2〇rSiO2 glass, wherein the soil metal oxide comprises one or more selected from the group consisting of MgO, CaO, SrO and the well-known in the art. BaO oxide. The polishing method of the present invention is suitable for use in combination with a chemical mechanical (CMP) polishing apparatus. A CMP apparatus typically includes a platen that moves in use and has a velocity resulting from orbital, linear or circular motion. A polishing pad is mounted to the platen and moves with the platen. A carrier assembly holds a substrate to be polished. Polishing is achieved by contacting the substrate with the mat while maintaining a portion of the polishing composition of the present invention disposed between the mat and the substrate. The substrate is then moved relative to the surface of the wiper pad while the substrate is forced against the pad surface at a pressure (preferably 1 1 〇 g/em 2 or less) selected to be sufficient for the desired glass removal rate. The polishing of the substrate is achieved by a combination of chemical polishing and mechanical action of the polishing pad and the polishing composition on the surface of the substrate. The substrate can be planarized or polished with the polishing composition of the present invention using any suitable polishing pad (e.g., a polishing surface). Suitable evacuation pads include, for example, fixed abrasive pads, woven pads, and non-woven pads. In addition, suitable polishing pads can comprise any suitable polymer having different densities, hardnesses, thicknesses, compressibility, ability to rebound after compression, and compression modulus. Suitable polymers include, for example, polyvinyl chloride, polyvinyl fluoride, nylon, fluorocarbon, carbonate, polyester, polyacrylate, polyether, polyethylene, polyamine, 125872.doc -17- 200846430 Polyurethane, polystyrene, polypropylene, coformed products thereof, and mixtures thereof. The following examples are intended to further illustrate the invention, but should not be construed as limiting the scope of the invention in any way. - Example 1 This example illustrates the polishing of a glass substrate according to the present invention using an aqueous polishing composition comprising cerium oxide and PVP as a stabilizer. Two polishing compositions (Compositions 1A and 1B) of the present invention were prepared. Composition 1A contained an oxidized abrasive of 5 lbs/i in water of pH 5, p vp (K9 〇) in ppm, and a chlorinated planer of 1000 ppm. Composition (7) contains 5% by weight of oxidized abrasive in water at pH 5 (average particle size of 500 nm, purity greater than or equal to 99.9% Ce〇2) and 1000 ppm of polyvinylpyrrolidone (K9〇) . A comparative composition (Composition 1C) was also prepared which contained 5% of cerium oxide abrasive in water to which no salt or stabilizer was added. Using these three compositions, a 4 cm X 4 cm LCD 0 grade glass test panel (alkaline earth metal oxide (Mg〇, Ca〇, Sr〇,

Ba0)-Al203-Si02 ; Corning EAGLE ㊣ 2000) : no g/cm2(1.56 psi)之下壓力、100毫升/分鐘(mL/min)之研磨浆 ’ 流速、85轉/分鐘(rpm)之載體速度及1〇〇 rpm之壓板速度。 ’ 由各組合物所獲得之以微米/分鐘為單位(μπι/min)之玻璃移 除速率展示於圖1中。圖i中之結果指示,與使用組合物⑴ 所獲得之移除速率相比,組合物i A提供玻璃移除速率之 20/〇之改良。另外,與組合物1C相比,組合物以與ΐβ均提 供改良之加工性質(亦即,傳送線及研磨漿儲槽中沈降較 125872.doc -18 · 200846430 少)。在圖1中,左條形表示由對照組合物1C所獲得之移除 速率,中間條形表示由組合物1B所獲得之移除速率,且右 條形表示由組合物1A所獲得之移除速率。 實例2 此實例說明用根據本發明之拋光組合物拋光玻璃基板。 製備拋光組合物2A,其含有存於pH 8.5之水中的1〇重量% 之氧化鈽研磨劑(平均粒度為5〇〇 nm)及1〇〇〇 ppm之 DAXAD® 32(可獲自 Hampshire Chemical Corp·,LexingtonBa0)-Al203-Si02 ; Corning EAGLE 正 2000) : No g/cm2 (1.56 psi) pressure, 100 ml/min (mL/min) slurry 'flow rate, 85 rpm carrier speed And the platen speed of 1 rpm. The glass removal rate in micrometers per minute (μπι/min) obtained from each composition is shown in Fig. 1. The results in Figure i indicate that Composition i A provides a 20/〇 improvement in glass removal rate compared to the removal rate obtained using Composition (1). In addition, the composition provides improved processing properties as compared to composition 1C (i.e., less sedimentation in the transfer line and slurry reservoir than in 125872.doc -18 · 200846430). In Fig. 1, the left bar indicates the removal rate obtained from the control composition 1C, the middle bar indicates the removal rate obtained from the composition 1B, and the right bar indicates the removal obtained from the composition 1A. rate. Example 2 This example illustrates the polishing of a glass substrate with a polishing composition in accordance with the present invention. A polishing composition 2A comprising 1% by weight of cerium oxide abrasive (average particle size 5 〇〇 nm) and 1 〇〇〇 ppm of DAXAD® 32 in water at pH 8.5 (available from Hampshire Chemical Corp) was prepared. ·, Lexington

Massachusetts之聚甲基丙烯酸銨穩定劑)。亦製備對照組 合物(組合物2B),其含有存於pH 8.5之水中的1〇重量%之 乳化飾研磨劑。 使用組合物2A及2B在下列拋光條件下拋光4 cmX4 cm LCD級玻璃測試面板(c〇rning EAGLE® 2000): lio g/cm2 之下壓力、100 mL/min之研磨漿流速、85 rpm之載體速度 及100 ΠΗΠ之壓板速度。將新鮮製備的各組合物使用於兩 抛光試驗中。接著,收集(再循環)已用過之組合物2人之分 散液,且將其使用於三個額外的拋光試驗中。亦以相同方 式再循環先前所使用之對照組合物2]8之分散液。各拋光試 驗中由各組合物所獲得之玻璃移除速率展示於圖2中,其 中π研磨漿Γ’為對照組(組合物2B)且,,研磨漿2,,為組合物 2 Α。圖2中之結果表明,即使在拋光組合物重複使用3次 後,與使用組合物2B所獲得之結果相比,組合物2A亦始 終提供改良之移除速率。此表明與對照組相比,藉由穩定 劑之存在顯著改良本發明之組合物中之氧化鈽粒子之分散 125872.doc -19- 200846430 穩定性,當使用再循環之研磨漿時,該分散穩定性又防止 移除速率降低。 實例3 此實例說明用本發明之拋光組合物拋光玻璃基板,與習 - 知之具有小於99.9% Ce02之純度之以氧化鈽為主之拋光組Massachusetts Polyammonium Methacrylate Stabilizer). A control composition (Composition 2B) was also prepared, which contained 1% by weight of an emulsifying abrasive in water at pH 8.5. Polishing 4 cm X 4 cm LCD-grade glass test panels (c〇rning EAGLE® 2000) using compositions 2A and 2B under the following polishing conditions: pressure under lio g/cm2, slurry flow rate at 100 mL/min, carrier at 85 rpm Speed and platen speed of 100 。. Each freshly prepared composition was used in two polishing tests. Next, the dispersion of the used composition of 2 persons was collected (recycled) and used in three additional polishing tests. The dispersion of the previously used control composition 2]8 was also recycled in the same manner. The glass removal rate obtained from each composition in each polishing test is shown in Fig. 2, in which π abrasive pulp Γ was a control group (composition 2B), and slurry 2 was a composition 2 Α. The results in Figure 2 show that Composition 2A always provides an improved removal rate compared to the results obtained using Composition 2B, even after repeated use of the polishing composition three times. This indicates that the dispersion of the cerium oxide particles in the composition of the present invention is significantly improved by the presence of the stabilizer as compared with the control group, the stability of the dispersion is 125872.doc -19-200846430, and the dispersion is stable when the recycled slurry is used. Sexuality prevents the removal rate from decreasing. EXAMPLE 3 This example illustrates the polishing of a glass substrate with the polishing composition of the present invention, and a polishing group based on cerium oxide having a purity of less than 99.9% Ce02.

, 合物作比較。此實例中所評估之組合物均具有8至9之pH 值,且除利用1重量%之研磨劑之組合物3G及3H外,研磨 劑濃度為10%。使用組合物在下列拋光條件下拋光4 cmx4 _ cm LCD級玻璃測試面板(Corning EAGLE® 2000): 110 g/cm2之下壓力、100 mL/min之研磨漿流速、8 5 rpm之載體 速度及100 rpm之壓板速度。結果展示於表1中。組合物 3H、31及3J為本發明之實例,而組合物3A至3G為比較實 例。 表1 ·· 組合物 (pH 8-9) Ce02純度 (重量%〇6〇2) 平均粒度 (μιη) 玻璃移除速率 (μιη/min) 3A 79.9 1 0.5 3B 49.6 4.7 0.4 3C 50.6 3.3 0.38 3D 55.1 3.7 0.26 3E 75 0.6 、 1·5 、 3* 0.4 3F 85 1 0.5 3G >99.9 0.08 0.1(1%研磨劑) 3H >99.9 0.22 0.37(1%研磨劑) 31 >99.95 10 0.8 3J >99.95 0.5 0.8 125872.doc -20- 200846430 *此材料在粒度分布中展示三個峰值。 表1中之資料展示,與對照組合物3A至3G相比,使用高 度純氧化鈽之本發明之組合物31及3 J具有顯著較高之玻璃 移除速率。類似地,與具有0.2 μπι以下(例如,80 nm)之平 均粒度之組合物3G(研磨劑濃度為1%)相比,研磨劑濃度亦 為1 %之本發明之組合物3H具有顯著較高的移除速率。 在獨立評估中,利用與組合物31及3 J相同之氧化鈽材料 在不同研磨劑濃度及pH值下製備6種本發明之其他組合物 (參見表2)。使用組合物3K至3P如以上對於組合物3A至3J 所述拋光玻璃面板,與由pH值為5之相同氧化鈽材料(組合 物3S及3T)所獲得之結果比較。(本發明之)組合物30及3P 分別包括1 〇 ppm及5 ppm吼咬甲酸作為穩定劑。結果展示 於表2中。 表2 : 組合物(pH) Ce02濃度重 量❶/〇 平均粒度 μΐϋ 玻璃移除速率μιη/min 3K(8.5) 10 0.5 0.7 3L(8.5) 5 10 0.68 3M(8.5) 5 0.5 0.62 3N(3.5) 5 0.5 0.66 30(3.5) 1 0.5 0.52(10 曱酸) 3P(3.5) 1 0.5 0.55(5 ppm0比咬甲酸) 3R(3.5) 1 0.5 0.3 3S(5) 10 0.5 0.5 3T(5) 10 10 0.5 表2中之結果展示,pH 3.5及8.5下之本發明之組合物在5 125872.doc -21- 200846430 與10之氡化鈽濃度下均令人驚訝地優於pH 5下之使用〇·5 μιη氧化鈽之比較實例(3S及3Τ)。類似地,各具有於pH 3.5 下1。/。氧化錦濃度且包括添加之0比淀甲酸之本發明之組合 物30及3P均令人驚訝地優於亦包括於pH 3.5下1%氧化鈽 ^ 但未添加°比σ定甲酸之比較組合物3 R。 、 【圖式簡單說明】 圖1展示根據本發明之方法利用具有或未添加氯化鉋之 包含氧化鈽及PVP之拋光組合物藉由拋光玻璃面板所獲得 _ 的玻璃移除速率(RRU pm/min為單位)與使用僅含有氧化鈽 之組合物所得到之結果相比的條形圖。 圖2展示根據本發明之方法利用包含氧化鈽及聚甲基丙 稀酸酉曰之拋光組合物藉由拋光玻璃面板所獲得的玻璃移除 速率(RR以μΓη/min為單位)與使用僅含有氧化鈽之組合物所 獲得之結果相比的曲線圖。 125872.doc -22-, the compound is compared. The compositions evaluated in this example all had a pH of 8 to 9, and the abrasive concentration was 10% except for the compositions 3G and 3H using 1% by weight of the abrasive. The composition was polished using a composition of 4 cm x 4 _ cm LCD grade glass test panel (Corning EAGLE® 2000) under the following polishing conditions: pressure below 110 g/cm2, slurry flow rate of 100 mL/min, carrier speed of 85 rpm and 100 Platen speed of rpm. The results are shown in Table 1. Compositions 3H, 31 and 3J are examples of the invention, while compositions 3A to 3G are comparative examples. Table 1 ·· Composition (pH 8-9) Ce02 purity (% by weight 〇6〇2) Average particle size (μιη) Glass removal rate (μιη/min) 3A 79.9 1 0.5 3B 49.6 4.7 0.4 3C 50.6 3.3 0.38 3D 55.1 3.7 0.26 3E 75 0.6 , 1·5 , 3* 0.4 3F 85 1 0.5 3G > 99.9 0.08 0.1 (1% abrasive) 3H >99.9 0.22 0.37 (1% abrasive) 31 >99.95 10 0.8 3J > 99.95 0.5 0.8 125872.doc -20- 200846430 *This material exhibits three peaks in the particle size distribution. The data in Table 1 shows that compositions 31 and 3 J of the present invention using highly pure cerium oxide have significantly higher glass removal rates than the comparative compositions 3A to 3G. Similarly, the composition 3H of the present invention having a polishing agent concentration of 1% is significantly higher than the composition 3G (abrasive concentration of 1%) having an average particle size of 0.2 μm or less (for example, 80 nm). The rate of removal. In an independent evaluation, six other compositions of the present invention were prepared using the same cerium oxide materials as compositions 31 and 3 J at different abrasive concentrations and pH values (see Table 2). Compositions 3K to 3P were used as compared to the results obtained for the polished glass panels described above for compositions 3A to 3J, as compared to the same cerium oxide materials (compositions 3S and 3T) having a pH of 5. Compositions 30 and 3P of the present invention comprise 1 〇 ppm and 5 ppm bite formic acid as stabilizers, respectively. The results are shown in Table 2. Table 2: Composition (pH) Ce02 concentration Weight ❶ / 〇 Average particle size μ ΐϋ Glass removal rate μιη / min 3K (8.5) 10 0.5 0.7 3L (8.5) 5 10 0.68 3M (8.5) 5 0.5 0.62 3N (3.5) 5 0.5 0.66 30(3.5) 1 0.5 0.52(10 decanoic acid) 3P(3.5) 1 0.5 0.55(5 ppm0 ratio biting formic acid) 3R(3.5) 1 0.5 0.3 3S(5) 10 0.5 0.5 3T(5) 10 10 0.5 The results in 2 show that the composition of the present invention at pH 3.5 and 8.5 is surprisingly superior to the use of pH 5 under the concentration of 5 125872.doc -21 - 200846430 and 10 bismuth bismuth 〇 5 μιη Comparative examples of cerium oxide (3S and 3Τ). Similarly, each has a pH of 3.5. /. Compositions 30 and 3P of the present invention having a concentration of oxidized quinone and including added 0 compared to o-formic acid are surprisingly superior to comparative compositions also included in 1% cerium oxide at pH 3.5 but not added to sigma formic acid. 3 R. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 shows the glass removal rate (RRU pm/ obtained by polishing a glass panel using a polishing composition comprising cerium oxide and PVP with or without chlorination planing according to the method of the present invention. Min is a bar graph compared to the results obtained using a composition containing only cerium oxide. 2 shows the glass removal rate (RR in μΓη/min) obtained by polishing a glass panel using a polishing composition comprising cerium oxide and polymethyl methacrylate according to the method of the present invention, and the use only contains A graph comparing the results obtained for the composition of cerium oxide. 125872.doc -22-

Claims (1)

200846430 十、申請專利範圍: 1 ·種玻璃拋光方法,其包含用水性玻璃抛光組合物研磨 一玻璃基板之一表面歷時一段足以自該表面移除該玻璃 之至)一部分之時間;其中該拋光組合物包含1至i 5重 里之芯浮於包含50至1500百萬分率(ppm)聚合穩定劑之 水性載劑中的特徵為〇·35叫^至〇 9 pm範圍内之平均粒度 之顆粒狀氧化鈽研磨劑。 2·如清求項1之方法,其中該聚合穩定劑包含至少一種選 自由以下各物組成之群之聚合物··聚丙烯酸、聚曱基丙 烯酸、聚(乙烯磺酸),其鹽及其部分中和形式。 3.如清求項1之方法,其中該聚合穩定劑包含至少一種選 自由以下各物組成之群之聚合物:聚乙烯吡咯啶酮、聚 (乙稀醇)、聚(2·乙基噁唑啉)、羥基乙基纖維素及黃原 膠。 4 ·如凊求項1之方法,其中拋光組合物進一步包含水溶性 無機鹽。 5.如請求項4之方法,其中該水溶性無機鹽包含〇.5至〇1重 量%之铯鹽。 6·如請求項1之方法,其中該玻璃基板包含鹼土金屬氧化 物-Al2〇3-Si〇2玻璃,其中該鹼土金屬氧化物包含一或多 種選自由MgO、CaO、SrO及BaO組成之群之氧化物。 7· —種玻璃拋光方法,其包含下列步驟: Ο)在11〇 g/cm2或更小之下壓力下使一玻璃基板之一表 面與一拋光墊及水性玻璃撤光組合物接觸;及 125872.doc 200846430 (b)使該拋光墊與該基板之間產生相對運動,同時維持 該組合物之一部分與該墊與該基板之間的表面接觸歷時 一段足以自該基板之表面研磨該玻璃之至少一部分之時 間; 其中該撤光組合物包含1至15重量%之懸浮於包含5〇至 15〇〇百萬分率(ppm)聚合穩定劑之水性載劑中的特徵為 〇·35 μπι至0.9 μπι範圍内之平均粒度之顆粒狀氧化鈽研磨 劑0200846430 X. Patent application scope: 1 . A method for polishing a glass comprising: polishing a surface of a glass substrate with an aqueous glass polishing composition for a period of time sufficient to remove a portion of the glass from the surface; wherein the polishing composition The granules containing an average particle size in the range of from 〇35 to 〇9 pm in an aqueous carrier containing from 1 to 5 mils of core in a polymerization agent containing 50 to 1500 parts per million (ppm) of a polymeric stabilizer. Cerium oxide abrasive. 2. The method of claim 1, wherein the polymerization stabilizer comprises at least one polymer selected from the group consisting of polyacrylic acid, polyacrylic acid, poly(ethylenesulfonic acid), a salt thereof Partially neutralized form. 3. The method of claim 1, wherein the polymeric stabilizer comprises at least one polymer selected from the group consisting of polyvinylpyrrolidone, poly(ethylene glycol), poly(2·ethyl oxalate) Oxazoline), hydroxyethyl cellulose and xanthan gum. 4. The method of claim 1, wherein the polishing composition further comprises a water-soluble inorganic salt. 5. The method of claim 4, wherein the water-soluble inorganic salt comprises 铯.5 to 〇1 by weight of the cerium salt. 6. The method of claim 1, wherein the glass substrate comprises an alkaline earth metal oxide-Al2〇3-Si〇2 glass, wherein the alkaline earth metal oxide comprises one or more groups selected from the group consisting of MgO, CaO, SrO, and BaO. Oxide. a glass polishing method comprising the steps of: Ο) contacting a surface of a glass substrate with a polishing pad and an aqueous glass light-removing composition under a pressure of 11 〇g/cm 2 or less; and 125872 .doc 200846430 (b) causing relative movement between the polishing pad and the substrate while maintaining a portion of the composition in contact with the surface between the pad and the substrate for at least a period of time sufficient to polish the glass from the surface of the substrate. a portion of the time; wherein the light-removing composition comprises from 1 to 15% by weight of the aqueous carrier comprising 5 to 15 parts per million (ppm) of a polymeric stabilizer characterized by 〇·35 μπι to 0.9 Granular cerium oxide abrasive with average particle size in the range of μπι0 8·如請求項7之方法,其中該聚合穩定劑包含至少一種選 自由以下各物組成之群之聚合物:聚丙烯酸、聚甲基丙 浠k、聚(乙烯磺酸),其鹽及其部分中和形式。 9·如清求項7之方法,其中該聚合穩定劑包含至少一種選 自由以下各物組成之群之聚合物:聚乙烯吡咯啶酮 ()I (乙稀醇)、聚(2-乙基噁嗤琳)、經基乙基纖維 素及黃原膠。 10.如睛求項7之方法 其中組合物進一步包含0.05至〇1重 量%之水溶性無機鹽。 11.如凊求項7之方法,#中該玻璃基板包含鹼土金屬氧化 物2〇3 Sl〇2玻填,其中該驗土金屬氧化物包含一或多 種選自由Mg〇、Ca〇、Sr〇及祕組成之群之氧化物。 12· 組合物’ #包含1至15重量%之懸浮於包含5〇至 1500 PPm聚合穩定劑之水性載劑中的特徵為0.35 μηι至 〇.”m乾圍内之平均粒度之顆粒狀氧化鈽研磨劑。 13.如凊未項12之組合物,其進—步包含水溶性無機鹽。 125872.doc 200846430 14.如咕求項13之組合物,其中該水溶性無機鹽包含鉋鹽。 1 5.如响求項13之組合物,其中該水溶性無機鹽係以〇 至 0.1重量%範圍内之量存在於該組合物中。 16. 如請求項12之組合物,其中該聚合穩定劑包含至少一種 _ 選自由以下各物組成之群之聚合物:聚丙烯酸、聚甲基 . 丙浠馱、聚(乙烯磺酸)’其鹽及其部分中和形式。 17. 如請求項12之組合物,其中該聚合穩定劑包含至少一種 φ t自由以下各物組成之群之聚合物:聚乙烯°比洛唆_、 聚(乙烯醇)、聚(2-乙基噁唑啉)、羥基乙基纖維素及黃原 膠。 18. -種兩部分製品,其包含一第一容器,其含有溶解於第 一水性載劑中之聚合穩定劑,該第一容器與一第二容器 封裝在一起,該第二容器含有懸浮於第二水性載劑中之 顆粒狀氧化鈽研磨劑;其中該氧化鈽研磨劑之特徵在於 0.35 _至0.9 μιη範圍内之平均粒度;且其中在將該第一 • 容器中之内容物與該第二容器中之内容物混合後,形成 拋光組合物,該拋光組合物包括丨至15重量%之該氧化鈽 研磨劑及50至1500 ppm之該聚合穩定劑。 * 19·如請求項U之製品,其中該聚合穩定劑包含至少一種選 • 自由以下各物組成之群之聚合物:聚丙烯酸、聚甲基丙 稀酸、聚(乙烯磺酸)’其鹽及其部分中和形式。 20.如請求項18之製品,其中該聚合敎劑包含至少一種選 自由以下各物組成之群之聚合物:聚乙烯咄咯啶酮、聚 (乙稀醇)、聚(2_乙基㈣琳)、經基乙基纖維素及黃原 125872.doc 200846430 膠。 21· —種玻璃拋光組合物,其包含1至15重量。/c之懸浮於水性 載劑中的特徵為至少〇·2 pm之平均粒度及以重量計至少 99·9% Ce〇2之純度之顆粒狀氧化飾研磨劑,該水性載劑 之pH值比該氧化鈽研磨劑之等電點(IEp)高或低至少1單 位。 22·如請求項21之組合物,其中該氧化鈽研磨劑具有〇.2 μιη 至11 μπι範圍内之平均粒度。 23·如請求項21之組合物,其中該1>11值係在3至4之範圍内。 24·如請求項23之組合物,其進一步包含1至2〇 ppm之吡啶 曱酸。 25·如請求項21之組合物,其中該pH值係在8至9之範圍内。 26. —種玻璃拋光方法,其包含用水性玻璃拋光組合物研磨 一玻璃基板之一表面歷時一段足以自該表面移除該玻璃 之至少一部分之時間;其中該拋光組合物包含1至i 5重 量%之懸浮於水性載劑中的特徵為至少〇·2 μιη之平均粒 度及以重ϊ計至少99.9% Ce〇2之純度之顆粒狀氧化鈽研 磨劑,該水性載劑之pH值比該氧化鈽研磨劑之等電點 (IEP)高或低至少1單位。 27. 如請求項26之方法,其中該氧化鈽研磨劑具有〇·2 至 11 μπι範圍内之平均粒度。 28·如請求項26之方法,其中該pH值係在3至4之範圍内。 29.如請求項28之方法,其中該組合物進一步包含1至2〇 ppm之吼唆曱酸。 125872.doc 200846430 3 0·如請求項26之方法,其_該pH值係在8至9之範圍内。 31·如請求項26之方法,其中該玻璃基板包含鹼土金屬氧化 物-AUCb-SiO2玻璃,其中該鹼土金屬氧化物包含一或多 種選自由Mg〇、CaO、SrO及BaO組成之群之氧化物。 3 2. —種玻璃拋光方法,其包含下列步驟: (a) 在110 g/cm2或更小之下壓力下使一玻璃基板之一表 面與一拋光墊及水性玻璃拋光組合物接觸;及 (b) 使该拋光墊與該基板之間產生相對運動,同時維持 該組合物之一部分與該墊與該基板之間的表面接觸歷時 一段足以自該基板之表面研磨該玻璃之至少一部分之時 間; 其中該拋光組合物包含1至1 5重量%懸浮於水性載劑中 的特徵為至少0·2 μηι之平均粒度及以重量計至少99.9% Ce〇2之純度之顆粒狀氧化鈽研磨劑,該水性載劑之pH值 比該氧化鈽研磨劑之等電點(IEP)高或低至少1單位。 33.如請求項32之方法,其中該氧化鈽研磨劑具有〇·2 0瓜至 11 μηι範圍内之平均粒度。 34·如請求項32之方法,其中該ΡΗ值係在3至4之範圍内。 35.如請求項34之方法,其中該組合物進一步包含1至2〇 ppm之η比咬甲酸。 36·如請求項32之方法,其中該ΡΗ值係在8至9之範圍内。 37·如請求項32之方法,其中該玻璃基板包含鹼土金屬氧化 物-Al2〇3_Si〇2玻璃,其中該驗土金屬氧化物包含一或多 種選自由MgO、CaO、SrO及BaO組成之群之氧化物。 125872.doc8. The method of claim 7, wherein the polymeric stabilizer comprises at least one polymer selected from the group consisting of polyacrylic acid, polymethyl propyl ketone, poly(ethylene sulfonic acid), salts thereof Partially neutralized form. 9. The method of claim 7, wherein the polymeric stabilizer comprises at least one polymer selected from the group consisting of polyvinylpyrrolidone (I) (ethylene glycol), poly(2-ethyl) Ethyl acetate, trans-ethyl cellulose and xanthan gum. 10. The method of claim 7 wherein the composition further comprises from 0.05 to 1% by weight of a water-soluble inorganic salt. 11. The method of claim 7, wherein the glass substrate comprises an alkaline earth metal oxide 2〇3 Sl〇2 glass filler, wherein the soil metal oxide comprises one or more selected from the group consisting of Mg〇, Ca〇, and Sr〇. An oxide of the group consisting of secrets. 12. Composition #' contains 1 to 15% by weight of particulate cerium oxide having an average particle size of 0.35 μηιη to 〇."m dry circumference suspended in an aqueous carrier comprising 5 to 1500 ppm of a polymeric stabilizer. 13. The composition of claim 12, which further comprises a water-soluble inorganic salt. 125872.doc 200846430 14. The composition of claim 13, wherein the water-soluble inorganic salt comprises a planing salt. 5. The composition of claim 13, wherein the water-soluble inorganic salt is present in the composition in an amount ranging from 〇 to 0.1% by weight. 16. The composition of claim 12, wherein the polymeric stabilizer A polymer comprising at least one group selected from the group consisting of polyacrylic acid, polymethyl. propyl hydrazine, poly(ethylene sulfonic acid)' salts thereof and partially neutralized forms thereof. a composition, wherein the polymeric stabilizer comprises at least one polymer of a group consisting of φ t free of: polyethylene 比 唆 唆, poly (vinyl alcohol), poly (2-ethyl oxazoline), hydroxyl Ethyl cellulose and xanthan gum. 18. - Two-part product, A first container comprising a polymeric stabilizer dissolved in a first aqueous carrier, the first container being packaged with a second container, the second container comprising particles suspended in a second aqueous carrier a cerium oxide abrasive; wherein the cerium oxide abrasive is characterized by an average particle size ranging from 0.35 to 0.9 μm; and wherein after mixing the contents of the first container with the contents of the second container, Forming a polishing composition comprising from 15% by weight of the cerium oxide abrasive and from 50 to 1500 ppm of the polymeric stabilizer. * 19. The article of claim U, wherein the polymeric stabilizer comprises at least one Selectively: a polymer of a group consisting of polyacrylic acid, polymethyl methic acid, poly(vinyl sulfonic acid) 'salt thereof and a partially neutralized form thereof. 20. The article of claim 18, wherein The polymeric tanning agent comprises at least one polymer selected from the group consisting of polyvinylpyrrolidone, poly(ethylene glycol), poly(2-ethyl(tetra)lin), phenylethylcellulose, and yellow Original 125872.doc 200846 430 Glue. A glass polishing composition comprising from 1 to 15% by weight. /c suspended in an aqueous carrier characterized by an average particle size of at least 〇2 pm and at least 99.9% by weight of Ce〇 a granular oxidized abrasive having a purity of at least 1 unit higher than an isoelectric point (IEp) of the cerium oxide abrasive, wherein the aqueous carrier has a composition of the composition of claim 21, wherein The cerium oxide abrasive has an average particle size ranging from μ2 μιη to 11 μπι. 23. The composition of claim 21, wherein the 1 > 11 value is in the range of 3 to 4. 24. The composition of claim 23, further comprising from 1 to 2 ppm of pyridinium. 25. The composition of claim 21, wherein the pH is in the range of 8 to 9. 26. A method of glass polishing comprising polishing a surface of a glass substrate with an aqueous glass polishing composition for a period of time sufficient to remove at least a portion of the glass from the surface; wherein the polishing composition comprises from 1 to 5 weights % suspended in an aqueous carrier characterized by an average particle size of at least 2 μmηη and a particulate cerium oxide abrasive having a purity of at least 99.9% Ce〇2 by weight, the pH of the aqueous carrier being greater than the oxidation The isoelectric point (IEP) of the 钸 abrasive is at least 1 unit high or low. 27. The method of claim 26, wherein the cerium oxide abrasive has an average particle size in the range of from 〇2 to 11 μπι. 28. The method of claim 26, wherein the pH is in the range of 3 to 4. 29. The method of claim 28, wherein the composition further comprises from 1 to 2 ppm of decanoic acid. 125872.doc 200846430 3 0. The method of claim 26, wherein the pH is in the range of 8 to 9. The method of claim 26, wherein the glass substrate comprises an alkaline earth metal oxide-AUCb-SiO2 glass, wherein the alkaline earth metal oxide comprises one or more oxides selected from the group consisting of Mg〇, CaO, SrO, and BaO. . 3 2. A method of polishing a glass comprising the steps of: (a) contacting a surface of a glass substrate with a polishing pad and an aqueous glass polishing composition under a pressure of 110 g/cm 2 or less; b) causing relative movement between the polishing pad and the substrate while maintaining a portion of the composition in contact with the surface between the pad and the substrate for a period of time sufficient to polish at least a portion of the glass from the surface of the substrate; Wherein the polishing composition comprises from 1 to 15% by weight of a particulate cerium oxide abrasive characterized by an average particle size of at least 0. 2 μηη suspended in an aqueous carrier and a purity of at least 99.9% Ce〇2 by weight. The pH of the aqueous carrier is at least 1 unit higher or lower than the isoelectric point (IEP) of the cerium oxide abrasive. 33. The method of claim 32, wherein the cerium oxide abrasive has an average particle size in the range of from 20 to 11 μm. 34. The method of claim 32, wherein the threshold is in the range of 3 to 4. 35. The method of claim 34, wherein the composition further comprises a ratio of n to 1 to 2 ppm of n. 36. The method of claim 32, wherein the threshold is in the range of 8 to 9. The method of claim 32, wherein the glass substrate comprises an alkaline earth metal oxide-Al2〇3_Si〇2 glass, wherein the soil metal oxide comprises one or more selected from the group consisting of MgO, CaO, SrO, and BaO. Oxide. 125872.doc
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CN114479676A (en) * 2022-03-08 2022-05-13 机械科学研究总院海西(福建)分院有限公司 Low-abrasive-content and weakly acidic polishing solution for ultraprecise processing of optical glass and preparation method thereof

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