TW200844425A - Method and device for detecting defects in a transparent solid article - Google Patents

Method and device for detecting defects in a transparent solid article Download PDF

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Publication number
TW200844425A
TW200844425A TW96140666A TW96140666A TW200844425A TW 200844425 A TW200844425 A TW 200844425A TW 96140666 A TW96140666 A TW 96140666A TW 96140666 A TW96140666 A TW 96140666A TW 200844425 A TW200844425 A TW 200844425A
Authority
TW
Taiwan
Prior art keywords
light
fluorescent
defect
emitted
defects
Prior art date
Application number
TW96140666A
Other languages
Chinese (zh)
Inventor
Bahman Sarabi
Jens Stange
Klaus Salewski
Christof Halas
Alexander Karbach
Original Assignee
Bayer Materialscience Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE102006051309A external-priority patent/DE102006051309A1/en
Priority claimed from DE102006051305A external-priority patent/DE102006051305A1/en
Priority claimed from DE102006051308A external-priority patent/DE102006051308A1/en
Priority claimed from DE102006051306A external-priority patent/DE102006051306A1/en
Priority claimed from DE102006059320.0A external-priority patent/DE102006059320B4/en
Application filed by Bayer Materialscience Ag filed Critical Bayer Materialscience Ag
Publication of TW200844425A publication Critical patent/TW200844425A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/76Measuring, controlling or regulating
    • B29C45/768Detecting defective moulding conditions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2945/00Indexing scheme relating to injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould
    • B29C2945/76Measuring, controlling or regulating
    • B29C2945/76003Measured parameter
    • B29C2945/76153Optical properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2945/00Indexing scheme relating to injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould
    • B29C2945/76Measuring, controlling or regulating
    • B29C2945/76177Location of measurement
    • B29C2945/76287Moulding material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2945/00Indexing scheme relating to injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould
    • B29C2945/76Measuring, controlling or regulating
    • B29C2945/76451Measurement means
    • B29C2945/76461Optical, e.g. laser
    • B29C2945/76464Optical, e.g. laser cameras
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • G01N15/0227Investigating particle size or size distribution by optical means using imaging; using holography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/151Gas blown
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6491Measuring fluorescence and transmission; Correcting inner filter effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8858Flaw counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8874Taking dimensions of defect into account
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506Optical discs
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

A method and a device for detecting defects in a transparent solid article are disclosed. According to the method, the solid article is exposed to light from a first light source and the fluorescent light produced on exposure is detected. Image processing of the fluorescent light is then carried out. Dust particles deposited on the article are differentiated from the fluorescing defects on the basis of the shape and/or size and/or the color of the emitted fluorescent light. A device suitable for carrying out the method comprise (i) means for exposing said article to light from a first light source, (ii) means for detecting the emitted fluorescent light from said defects, and (iii) means for image processing of the fluorescent light.

Description

200844425 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種用於積測於一透明固態物件中缺陷的裝 置及方法。 【先前技術】 透明固態物件中,諸如透明塑膠材料,乃日常生活之用品, 且以眾多不同形式與用法呈現。舉例言之,光學資料儲存媒體(如 CD DVD荨)大致乃由塑膠材料所組成;這些材料,作為光學 資料儲存媒體中之載體材料,對用以讀取資料之光線而言乃屬 透明。無數塑膠材料亦被用於汽車之製造上。在這一方面可能 &及之例子,即是汽車頭燈之來令(lining),由外部亦可見到。 此等來令對於頭燈中所產生之一光線而言乃屬透明。 15 20 口心物件中缺陷,尤指巨視(macr〇sc〇pic)缺陷,表示固態物 件在某些情況下可能不再供作其原定⑽使用。舉射之,汽 其ΐίΐ之ΐ視缺陷如果過大,對於整個汽車外觀有不 此:i致*:ΐ而言’頭燈所產生之光線可能於缺陷處散射, 首先正碟性之降低。一般言之,此種來令之廠商 測此種缺來令給汽車廠商’因而在生產之時想要偵200844425 IX. Description of the Invention: [Technical Field] The present invention relates to an apparatus and method for integrating defects in a transparent solid object. [Prior Art] Transparent solid materials, such as transparent plastic materials, are daily necessities and are presented in many different forms and usages. For example, optical data storage media (such as CD DVD cartridges) are generally composed of plastic materials; these materials, as carrier materials in optical data storage media, are transparent to the light used to read the data. Numerous plastic materials are also used in the manufacture of automobiles. In this respect, it is possible, and the example, is the lining of the headlights of the car, which can also be seen from the outside. This is to be transparent to one of the lights produced in the headlights. 15 20 Defects in the mouthpiece, especially macros (macr〇sc〇pic) defects, indicating that solid objects may no longer be used for their original (10) use under certain circumstances. If the defect is too large, it will be different for the appearance of the whole car: i to *: ΐ ’ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ ─ In general, this kind of order allows manufacturers to test such shortages and give them to automakers.

DVD等其载體材料之 7 上述CDDVD and other carrier materials 7

^ 1曰¥致貝枓§貝取日寸發生錯誤。CD、DVD 、… 希望在生產上採用有缺陷的塑料物件。 、本《月之目的即在於提供—種制於—透明固態物 5 200844425 件中缺陷的改良方法。本發明之進一牛 測於-透明固態物件中缺陷的改良裝^。、則在於提供一種债 要目藉由獨立專利請求項之特徵,以達成-主 要目的。至於本發明之實施例,則於附屬專利請求項中之。 【發明内容】 本發明揭露一種用於佶、、目丨丨认 _ 盘方法。雜此H 翻111祕件巾缺陷的裝置 固態物件曝光於來自第-光源之光缚 下,亚偵測其於曝光中所盡 乐尤源之先、、泉 理;基於所射出勞光之开,。從而進行勞光之影像處 埃粒子乃與螢光缺陷作區人^小或顏^沉積於物件上之塵 光的手段;™於進= 15 20 【實施方式】 壯依據本發明’已提供一種用於偵測透明固態物件中缺陷的 =置Μ方法。依據此_方法,固態物件曝光於來自第一光源之 =線下’ k而進行曝光中之固態物件所產生螢光之债測。在此 方法之次—步驟中,進行螢光之影像處理。在此-步驟,基 於射出金光之形狀、大小或顏色,沉積於物件上之塵埃粒子乃 與螢光缺陷作區分。 線 依據本發明’藉由固態物件曝光於來自第-光源之光 6 200844425 :與::二個:ίΐ缺陷所射出之螢光’即可偵出固態物件中 光,且此等塵埃粒子可“:f件表面之塵埃粒子亦予螢 射出分,其影像處理乃基於所 來自ΐϋ/ ^或大小,或者基於其不同顏色。在顏色上, 來自純粒子之㈣可與螢光缺 度、強度、飽和度等方面。 从,、色知之色 τ = 粒子得與缺陷作區分,依據本發明則此一方法亦 外部進行;亦即,可於廠房中進行。如此則本方: ,上使用。此類場所中’如果固態物件含有 以二 特別多的螢光缺陷,即可視為不合格而予 件上實,:咖件!之螢光缺陷及固態物 , I" σ以疋位(決疋其於固態物件中之位置)。螢光 15 20 夂:埃位之數目’可進一步決定。此外,各螢光缺陷及 t狀之心,純粒子可輕易自螢光缺陷中 子-般而言形狀甚長且模糊(fuzzy),而 更: ::明);二形:r狀。藉由找_物件中= 勿件間缺陷之分饰情況進咖 且了此找出固悲物件於生產期間出現缺陷之可能原因。 依據本發明之一實施例,榮光之債测乃於 過濾後,或者經過第二濾、光器過濾後,始告ς‘ 之兩透射比可達25%至⑽% (就缺陷所^之發光而^,: 7 200844425 8〇/°t 95/°為佳);而其低透射比為0%至20% (就塵埃粒子所射 、k光而口以〇%至ίο%為佳)。相對之下,第二濾光器之 低,射比為〇/〇至2〇〇/。(就缺陷所射出之螢光而言,以〇%至1〇% 為佳而其高透射比可達25%至100% (就塵埃粒子所射出之螢 5光而σ,以80%至95。/。為佳)。此一實施例之優勢在於塵埃粒子 甚易與缺陷作區分—僅就塵埃粒子所射出之螢光,其波長範圍 乃有別於缺陷所射出者此一事實而言。此種情況下,因而亦有 :進步優勢·在影像處理上,基於形狀、大小或顏色,僅塵埃 粒子所射出螢光之波長範圍可使第一濾光器具有高透射比者, 10必須與缺陷作區分。 依據本發明之一實施例,第一光源所射出之光線乃於藍光 波長範圍内,或於紫外光波長範圍内。例如,水銀蒸氣燈、藍 光雷射或藍光LED(發光二極體)皆可供作第一光源使用。 依據本發明之一實施例,第一光源所射出之光線其波長範 15 圍為 440 奈米至 510 奈米(440nmresp. 500nm to 10nm)。 v 依據本發明之又一實施例,固態物件乃依據本方法曝光於 來自第二光源之光線下,並偵測其經由曝光固態物件所發射之 光線及經由固態物件所反射之光線。從而對所發射偵測之光線 進行影像處理,其中亦偵測固態物件中之非螢光缺陷。基於所 20發射光線之偵測或所發射光線之強度分佈以及固態物件所反射 光線之對應偵測或所反射光線之強度分佈之缺陷偵測方法細說 明於 DE 101 44 909 A1 及 DE 10 2004 054 102 A1,其所揭露之 内容亦因而併入本說明之中。依據該等方法,固態物件中缺陷(諸 8 200844425 口 CD、DVD等塑料物件中缺陷)可藉由對反射與發射光線之強 空間分辨措施而予以偵測。如此即可能偵測出光學巨視 n寸達轩毫米者(如喊恤eak)和小孔)、以及不透明散 或线摻雜物)。藉由使用上述勞光缺 f;單及依據本實施例所述之方法,因而即可能以特別 間早方式找出固態物件中之螢光缺陷及非鸯光缺陷。 :據本:明之一實施例’固態物件中各非螢光缺陷之位 : 大小、數目及/或形狀,乃藉影像處理予以偵測。一 f非蛋光缺陷之位置,即可能得以對所偵出螢光缺陷之:置= 10 -比#父’而獲得有關缺陷種類與成因方面 」 言之,如凝膠粒子等螢光缺陷,可能例 在有關固態物件生產過程對光學缺陷nn她。 因而獲得更佳了解。此種了解可用以改盖制;:曰方,,,可能 中之螢光或非螢光缺陷之數目得以降至最,亚使固悲物件 15 依據本發明之一實施例,固離物株π戸 塑料薄膜。 〜件乃屬一塑料物件或為一 % 依據本發明之-實施例,螢光缺陷 粒子。再者,其非螢光缺陷則是斑痕、小子、^物件中之凝膠 璃纖維或空氣摻雜物。凝膠粒子為 *紋(striae)、玻 犯塑料物件生產前之塑料顆粒中即已出現—中缺陷,其通常於 塑料物件典型上乃藉由射出成 產業規模而言, 粒t出現之凝膠粒子可導致射出塑料顆粒製成。顆 擾(flow disturbance)(亦稱斑痕)。 =(即塑料物件)中之流 ⑴斑痕於塑料物件中尤其不受歡 9 200844425 迎’因為此種斑痕乃屬細長、相對較大之缺陷。小關為球狀、 ^視=賴’其形成原因可如塑膠材料過熱(如於顆粒生產期 間)。因此,小孔亦已出現於塑料顆粒之中。 乃因射出成型過程而逐漸造成,但相較於上述缺: 則無關緊要。 依據-實施例,固態物件之區域乃片段(segment)曝光(即分 =),或者線條式曝光於第-光源之光線或於第二光源之光 依據此-實施例,固態物件並未被整個照明,而是由第一 古=之光線或由第一光源之光線予以片段掃描(分區式)。此即具 k勢.因為在區域片段照明’故可以使用顯著地少量的強 ^源S]悲物件或營光缺陷之整個影像從而可藉影像處理予 =生。諸之大小麻絲功率及必要之解析度岐。通常, 奴大小為10毫米xl0毫米的數量級(〇rder)。 15 據本發明之另一實施例,進一步在一批次塑料顆粒中取 樣品。此批次塑料顆粒為已在一個程序中產生的塑料顆 因此為使用相同的製程參數。固態物件係由該樣品產生, =別是藉由射出成型製程。螢光及/或非螢光缺陷亦被決定,且 :於所2定之螢光或非螢光缺陷,決定固態物件是否符合至少 個給定的品質準則。此批次塑料顆粒僅於固態物件符合至少 —個品質準則之情況下,才能放行。 樣口依據本發明,此批次塑料顆粒之品質管制乃藉由取自顆粒 以產生一塑料物件而進行。顆粒係基於塑料物件中缺陷(塑 只勿件疋否滿足預疋之品質接受準則)而被放行(僅當其已被決 20 5 15 20 200844425 ,後,始予核准繼續生產)。塑料物件因而充當試製樣品,其係 藉由顆粒之試細產生。糊來說,如果顆粒準制以生產cd 基材,所需之CD基材品質準則即應用於此試製樣品。唯有當試 製樣品符合那些品質接受準㈣,始認為該等難乃適合於⑶ 土 產才目對之下’如果汽車頭燈蓋擬以對應批的顆粒來 生產’則試製樣品應用不同的品質接受準則,因為此種情況下 可=不嚴格的品質接受準則。就此而言,重要的是塑料顆^ 1曰¥致贝枓§Be taken out of the day. CD, DVD,... I hope to use defective plastic parts in production. The purpose of this month is to provide an improved method for the defects in the transparent solids 5 200844425. The invention of the present invention measures the improvement of defects in transparent solid articles. It is to provide a bond with the characteristics of an independent patent claim to achieve the main purpose. As regards the embodiments of the present invention, it is in the dependent patent claims. SUMMARY OF THE INVENTION The present invention discloses a method for 佶, 丨丨 _ 盘. The solid object of the H-111 flip-chip towel defect is exposed to the light from the first-light source, and the sub-detection is in the first place of the exposure, and the spring is based on the exposure of the work light. ,. Therefore, the image of the light of the work light and the fluorescent defect are used as a means for the dust or light deposited on the object; TM Yujin = 15 20 [Embodiment] According to the present invention, a kind has been provided A method for detecting defects in transparent solid objects. According to this method, the solid object is exposed to the under-threshold k from the first source to perform a fingerprint measurement of the fluorescence generated by the solid object in the exposure. In the second step of this method, the image processing of the fluorescence is performed. In this step, the dust particles deposited on the object are distinguished from the fluorescent defects based on the shape, size or color of the emitted gold light. According to the invention, the light emitted from the first light source is transmitted by the solid object 6 200844425: and: two: the fluorescent light emitted by the defect can detect the light in the solid object, and the dust particles can be " : The dust particles on the surface of the f-piece are also fired out. The image processing is based on the size of the ΐϋ/^ or the color, or based on its different color. In color, the pure particles (4) can be associated with the lack of fluorescence, intensity, Saturation, etc. From, color, color τ = particle can be distinguished from defects, according to the invention, this method is also external; that is, it can be carried out in the factory. So the party: , use. In a type of place, 'If a solid object contains a particularly large number of fluorescent defects, it can be regarded as unqualified and the piece is genuine.: The fluorescent defect and solid matter of the coffee piece! I" In the position of the solid object). Fluorescence 15 20 夂: the number of erections can be further determined. In addition, each fluorescent defect and t-shaped heart, pure particles can easily be self-fluorescent neutron-like shape Very long and fuzzy, and more: :: Ming); :r-like. By finding the _object = the case of the defect between the parts, and finding out the possible reasons for the defects of the solid object during the production. According to an embodiment of the present invention, the glory of the debt test After filtering, or after filtering through the second filter and the optical filter, the two transmittances of the ς' can be as high as 25% to (10)% (in terms of the luminescence of the defect), : 7 200844425 8〇/°t 95 /° is better; and its low transmittance is 0% to 20% (in the case of dust particles, k light and mouth is preferably 〇% to ίο%). In contrast, the second filter is low, The shot ratio is 〇/〇 to 2〇〇/. (In terms of the fluorescence emitted by the defect, 〇% to 1〇% is preferred and its high transmittance is 25% to 100% (as far as dust particles are emitted) Fluorescent 5 light and σ, preferably 80% to 95%. The advantage of this embodiment is that the dust particles are easily distinguished from the defects - only the fluorescent particles emitted by the dust particles have a wavelength range Regardless of the fact that the defect is shot. In this case, there is also: advancement advantage. In image processing, only dust particles are emitted based on shape, size or color. The wavelength range of the fluorescent light can make the first filter have a high transmittance, and 10 must be distinguished from the defect. According to an embodiment of the invention, the light emitted by the first light source is in the blue wavelength range or in the ultraviolet In the wavelength range of light, for example, a mercury vapor lamp, a blue laser or a blue LED (light emitting diode) can be used as the first light source. According to an embodiment of the invention, the light emitted by the first light source has a wavelength range. 15 is from 440 nm to 510 nm (440 nm repp. 500 nm to 10 nm). v According to still another embodiment of the present invention, the solid object is exposed to light from the second source according to the method, and is detected by exposure. The light emitted by the solid object and the light reflected by the solid object. Thereby, the detected light is image processed, and non-fluorescent defects in the solid object are also detected. A defect detection method based on the detection of the emitted light of 20 or the intensity distribution of the emitted light and the corresponding detection of the reflected light of the solid object or the intensity distribution of the reflected light is described in detail in DE 101 44 909 A1 and DE 10 2004 054 102 A1, the disclosure of which is hereby incorporated by reference. According to these methods, defects in solid objects (defects in plastic objects such as CD, DVD, etc.) can be detected by strong spatial resolution of reflection and emission. This makes it possible to detect optical giants n-inch (eg, eak) and small holes, as well as opaque or line dopants. By using the above-mentioned method, the method according to the present embodiment, it is possible to find the fluorescent defects and non-calender defects in the solid object in a particularly early manner. According to the present embodiment, the position of each non-fluorescent defect in the solid object: size, number and/or shape is detected by image processing. The position of a non-egg light defect, that is, it may be possible to detect the fluorescent defect: set = 10 - than #父' to obtain the type and cause of the defect, such as fluorescent defects such as gel particles, Probably in the case of the solid object production process for optical defects nn her. So get a better understanding. Such knowledge can be used to modify the cover system; the number of possible fluorescent or non-fluorescent defects can be reduced to the maximum, and the sub-solid object 15 is an immobilized strain according to an embodiment of the present invention. π戸 plastic film. The member is a plastic article or a % fluorescent-defective particle according to the embodiment of the present invention. Furthermore, the non-fluorescent defects are glass fibers or air dopants in the stains, small objects, and objects. Gel particles are *striae, plastic defects in the plastic particles before the production of plastic objects have appeared - medium defects, which are usually on the plastic object by injection into the industrial scale, the appearance of the particle t Particles can be made by ejecting plastic particles. Flow disturbance (also known as a spot). = (ie plastic objects) flow (1) smudges in plastic objects are particularly unwelcome because of the slender, relatively large defects. The small level is spherical, and the reason for the formation is that the plastic material is overheated (as during the production of the pellet). Therefore, small holes have also appeared in the plastic particles. It is gradually caused by the injection molding process, but it does not matter compared to the above: According to an embodiment, the area of the solid object is a segment exposure (ie, sub =), or a line exposure to the light of the first source or the light of the second source. According to this embodiment, the solid object is not Illumination, but by the first ancient = light or by the light of the first source, the segment is scanned (partitioned). This is the k-potential. Because the area segment illumination is used, it is possible to use a significant amount of strong source S] the entire image of the sorrow object or the camping light defect so that it can be processed by image processing. The size and power of the various sizes and the necessary resolution. Usually, the slave size is on the order of 10 mm x 10 mm (〇rder). According to another embodiment of the invention, a sample is further taken from a batch of plastic particles. This batch of plastic pellets is a plastic pellet that has been produced in one process and therefore uses the same process parameters. The solid object is produced from the sample, = not by the injection molding process. Fluorescent and/or non-fluorescent defects are also determined, and: the fluorescent or non-fluorescent defects specified in the 2 determines whether the solid object meets at least a given quality criterion. This batch of plastic pellets can only be released if the solid object meets at least one quality criterion. Sample According to the present invention, the quality control of the batch of plastic granules is carried out by taking particles from the granules to produce a plastic article. The granules are released based on defects in the plastics (plastics only meet the pre-existing quality acceptance criteria) (only if they have been rejected 20 5 15 20 200844425, after which they are approved for continued production). The plastic article thus acts as a prototype sample which is produced by trialing the particles. For paste, if the pellets are made to produce a cd substrate, the required CD substrate quality criteria are applied to the prototype. Only when the trial sample meets the quality acceptance criteria (4), it is considered that the difficulty is suitable for (3) the local product is the right one. If the automobile headlight cover is intended to be produced with the corresponding batch of particles, the prototype sample is applied with different quality acceptance. Guidelines, because in this case = can not be strict quality acceptance criteria. In this regard, the important thing is plastic

物:之2之缺陷,一方面可能降低由該塑料顆粒所生產塑料 =、Γ二另一方面亦可能進一步造成塑料物件之缺陷。如 上所Κ辣子及小孔已出現於㈣雛之巾。凝膠 其會導致流擾,肇因於塑料物件藉 夕广L ?朝流動方向拉…離。此種她 凝膠粒子,且其方向與㈣方向__致。 _而〜、疋含有 此一方法有其優點··藉由生產一塑料 試件),用以生產塑料物件之顆粒的品質乃針則充當測 因而有可能決定顆粒是否完全適合作為所要塑料::以:驗。 料-即使在顆粒送交客戶之前,或者在 〃 2之原始材 物件之前。不合適之顆粒則完全不用於生產塑產塑料 戶。因而,不人枚夕Tim¥ 、 王座塑枓物件或送交客 成本降低。此外,客戶抱』!減少’其導致生產 質顆粒’結果自錢善齡廠商料之^^供應高品 依據本發明之—實施例, 且屬片狀或板狀。於射出成型機中生產=2機中生產, 為塑料物件一般乃以產業規模 ==優點:因 1塑抖物件因而亦以同 11 200844425 了方式生=。試製件亦因而生產;由於使用與大量生產情況相 同之生產机程,故亦含有生產所造成的類似缺陷。如此生產之 塱料=件因而特別適合用以決定其生產所使用之顆粒是否滿 足-^品質準則。一方面,板狀或片狀之塑料物件在射出成 型機裔上生產特·單;另—方面,藉由光學測試製程,板狀 ,片狀之_物件其輯可能特別成功 。再者,塑料物件中缺 主要源自射出成型機器之鑄造製程,尤其亦指其經由接觸射 =成3L /、私1之成开>工具表面。成形工具表面之幾何形狀乃屬 15 20 要利用塑料板材作為射出成型工具幾何形狀之特殊實施 例丄以决疋顆粒是否滿足_定的品質準則,因之完全充分。從 /寻;射出成型機中顆粒之前的螺旋塑化後,藉由薄膜洗注 (mmga⑹以產生塑料物件。顆粒之螺旋塑化,乃以射出成型螺 =切=進仃’而促進流動。射出成型職及㈣成型滾筒含有 =表㈣層,且亦可能由高鉻合金所組成。在-特殊的實 他因而=熱分解及/或交連(Cr〇SSHnking)製程,亦可避免。並 他因而適用之製程參數爲 兄 ^ 間、壓力反作用可&〜\ 4传糸統所控制者包括週期時 且機二^ 現象(cavitation)、w態樣本射入工 出成型乃經由一含有薄::注==的最終剪應力。射 (〇ff崩一η_進行。離中心料;=避^^堯注 以及其所促成之材料沉積於流動偏差區内。 差 12 200844425 有利之處,在於產生及移㈣道之後,簡物件通過 卻線,而使試製件得以均勾冷卻。在射出成型板材冷卻之後: 可利用合適的夾具系統予以移除,而不觸及板材表面。失 統之較佳實施例為一種僅觸及板材邊緣之側向夾具。/…、 5、依據本發明之-實施例,在固態物件曝光於第一或第 源之光線以前,將去離子化氣體喷至固態物件之至少一表面 侧。此至少-表面側乃由去離子化氣體予以放電。塵埃好係 r從該表面移除。此外,放電表面對應塵埃粒子之吸力亦告降低。 $即有-好處:當㈣物件藉由上述光學賴方法檢查其缺陷 10時,其表面所出現之塵埃粒子乃大為減少。 依據本發明之-實_,婦物件之—表面係曝露於光, 赏光或非勞光缺陷之投影區亦告決定。就此一目的而言,由夠 料物件所射出、發射及反射之光線,乃由照相機予以偵測。二 藉由影像處理軟體’所债測之光線係被分析,則所有榮光或非 螢光缺陷之整個投影區亦可予以決定。從而,品質接受準則可 、軚示所查1^塑料物件表面之大小有關之所有螢光或非螢光 ,陷之最大容許總投影區(例如:所錢光或㈣光缺陷之最大 容許總投影區乃等於所查驗塑料物件表面之跳),减於所有 ,光或非螢級陷之總投影區小於最大料總投影區時,始接 又。亥批顆粒。其好處在於:只有所有榮光或非榮光缺陷之整個 投影區(而非各個別缺陷之投影區)係被用以決定塑料物件是否 滿足品質準則。若相較於各個別缺陷之投影區,缺陷 影區則簡單甚多。 13 200844425 依據本發明之-實施例,品質準則標示二缺_ ,或者各觸㈣憾之最大料尺寸,或者㈣之最大數 依據本發明之-實施例,一批次塑料顆粒可 品質種類中之—;至少有—品料則被標 、:= 類,且該批顆粒經核准為若干品質 = 準則)中之最高品質種類。 满件付。對應σ σ質 舉例言之,-品質麵可能關乎用於cd《謂 ===質而言’對此—由顆粒樣本所生產之塑^物件, ,必要求甚南。如果_物件不符合財之品質接受準則牛 應之雜顆粒則不予放行以供生產CD或DVD基材。 以汽車頭燈蓋而論,此一塑料物株人 土 ;''' ° 況下,基材則可予放行以==合其品質準則。此種情 有其好處:所擬賴之齡射先==批齡之分類因而 15 而供應給需要特定品質種類之7戶先(^分為若干品質種類,從 <各戶(對應於顆粒品質而言)。 件中ΐ:的:關ί 一種用於偵測於-透明固態物 手段,及偵測固態物;曝光曝光於第-光源之光線的 20 離 目 進-步具有針對該螢光進行影像處沉 螢光缺陷作區分。 射出-先之形狀、大小或顏色’可與 明 至於本發明較佳之實施例,以下將參照 圖式作一更詳盡說 14 200844425 圖1顯示用於制於-透明固態物件中缺陷之裝置ι〇〇之 方塊圖。裝f⑽含有光學測試單元1〇2及電腦系統1〇4。光學 測试早兀1G2含有第-光源1G6及照相機⑽。光學測試單元 1〇2進步含有透鏡110及遽光器m。電腦系、统刚含有微處 5理器114、記憶體116、照相機介面118及顯示幕12〇。 照相機108經由接線122連接照相機介面118,因而照相機 108所記錄之影像可轉送至電腦1〇4。 、…固恶物件124經引入光學測試單元1〇2,以檢查缺陷。第一 光源106所產生之光線則經由透鏡11〇投影至固態物件I%之 川投影區Π6。第-光源106所產生光線之波長係被選定以激發發 光缺陷(諸如㈣i30、m、m)而使其放光發出榮光。舉例言 之’固悲物件124可屬一塑料物件。缺陷13〇、132、134從而 可屬凝膠粒子,而於受到紫外光或藍光激發時放光。為了測試 塑料物件之螢光缺陷,因此有可能使用如水銀蒸氣燈或藍光雷 15射作為第一光源1 〇6。 照相機108因與第一光源1〇6有關,而如圖1所示位於固 〜物件124之後。濾光裔112從而對所射出之螢光(螢光乃缺陷 132於第一投影區126受到照射而放出)具有高透通性。濾光器 n2亦對第一光源106所產生之光線具有低透通性。缺陷132之 20影像因而可由照相機108予以充分記錄,不受第一光源1〇6所 射出光線之干擾。 固態物件124可沿著y轴移置(參照座標系統128)。光源/ 照相機系統(包含第一光源106、透鏡11〇、濾光器112及照相機 15 200844425 108)可在x軸移置(參照座標系統128),因而投影區126於整個 固態物件124上遷移,且缺陷130與134所發出之螢光亦可予 以記錄。 沉積於固態物件124上之塵埃粒子(諸如塵埃粒子136與 5 138)亦發出螢光。螢光塵埃粒子亦可由照相機1〇8予以偵測。濾 光器112之放置形式可使來自塵埃粒子之螢光得以通過其中。 照相機108於投影區126所記錄之影像可經由接線122及 71面118予以饋送至電腦。微處理器I〗#執行電腦程式產品 140,以進打影像處理。電腦程式產品14〇係永久儲存於記憶體 1〇 116之中’且於執行之前已被載入微處理器114。 電腦程式產品140結合其由投影區126於固態物件124上 遷移所產生之影像,以形成固態物件124之影像142,且顯示於 顯示幕120上。 、 電腦程式產品140亦進行影像142之影像處理。塵埃粒子 15 I36與138因而可基於其形狀,與缺陷130、132、134作區分。 、唯如固態物件124為塑料物件’而螢光缺陷13〇、132、134為 凝膠粒子,則形狀上此即為典型之球狀。因此,這些缺陷於影 像142中以圓圈出現,因為照相機記錄固態物件124於巧平面 上之投影。另一方面,塵埃粒子如塵埃粒子136和138乃趨於 2〇模糊,且亦大過缺陷。塵埃粒子136和138 一般亦以不同於缺 1½ 130 132和134之顏色發出螢光。來自塵埃粒子之螢光盘來 自缺陷之螢光可能有所不同〜如在色彩之色度(c〇1〇r让“^及/ 或色彩強度(intensity)及/或色彩飽和度(satumti〇n)方面。 200844425 塵埃粒子與螢光缺陷亦美1 圖2顯不一流程圖,扣 件中缺陷的方法之步驟。二^=t明用!^貞測於—固態物 第一光源之光線。步驟2G2 7 ’固態物件曝光於來自 曝光於第-光源光線下之二二疋偵測固態物件中缺陷及/或 出之螢光。步驟204進行^物件上所沉積之塵埃粒子其所射 塵埃粒子基於所射㈣光^使沉積於物件上之 作區分。 V 小或顏色,而與螢光缺陷 圖3以圖式顯示第二朵 於摘測光學測試單元1G21’ Μ進一步用 =之配置方式。固態物件對光源⑷所射出之光線來說乃屬i 15 固態物件124之第二投影區152係由光源m予以照明。 先=照相機系統(包含光源144及照相機146、148和15〇)亦 可化著X軸移置(簽照座標系統128)。塑料物件可沿著y轴移置, 因而投影區I52於整_態物件m上遷移,且後者可整體顯 不〇 Λ 固恶物件124所反射之光線由照相機146予以偵測,而其 由固態物件124所發射且由塑料物件124十之缺陷所散射之光 線,則由照相機148和150予以偵測。照相機148位於光源144 之焭視場,而照相機150則位於光源144之暗視場。利用照相 17 200844425 機146與150(亦可使用照相機148)之局部解析偵測訊號,即有 可能偵測塑料物件中之非螢光缺陷,尤其亦包括位置、形狀及 大小(詳如 DE 10 2004 054 102 A1 所述)。 圖4顯示用於管制一批顆粒之品質的裝置4〇〇之方塊圖。 5裝置400含有射出成型機402、鑄模(die)404及冷卻拉伸器4〇6。 用於品質管制之裝置400亦含有用以產生去離子化氣體之手段 408。裝置400亦含有光學測試單元102 (如圖i或圖4所示 以及電腦系統104 (如圖1所示)。 ’、 樣本416取自一批正施予品管之顆粒,並予饋送至射 ίο型機術,以便產生由樣本仙所製成之塑料物件(ksk)似。 射出成型機4〇2含有薄膜洗注系統41〇及連線 (舰)412。資料取得系統412確健體與工具溫度在材 =溫度祀圍内’且以熱分解或交連製程而於 丨 ,壓力反作用可能氣穴現 料取得系統412亦控制洗鎮 于糸、、先所保通)。_貝 具之速率。塑膠之射出成型乃'以 ^洗注系統410射入模 而進行,俾避免流動偏差 肖、焭注方式經由直冷流道 積。工具模穴由至少兩個側模:::動!差區所促成之材料沉 由〇·5至1〇毫米(以丨至4之、、…7成,錯此得以生產管壁厚度 毫米⑷。。至3。0毫米為佳==流動長度由-至· 塑料物件422可由射出成型機^予以移除(例如以裝卸 200844425 工具移除)’而不傷及塑料物件422之表面。藉由鑄模4〇4,炫 渣乃與塑料物件422分離。塑料物件422從而通過冷卻 406。 口° 在塑料物件422輸送至光學測試單元1〇2之前,去離 氣體喷至塑料物件422至少—側之表面。為此—目的,用於 生去離子化氣體之手段撕具有一風扇414。塑料物件422中 體擬喷射之表面侧驗輸送通過風扇414;而塵埃 二 =中之表面上移除。表面放電之後,其結果即是二 埃粒子被吸附至塑料物件422,唯遠不及之前的程度。 15 塑料物件422從而被輸送至光學測試單元1G 似曝光於來自第-光源、106之光線時,塑料物件中缺 光(只要此等缺陷出現且能發出榮光)。塑料物件似中之二 陷尤其可能是凝膠粒子,因為此等粒子—般而言皆已出 粒中。凝膠粒子成為塑料物件中缺陷本屬必然,唯彼等亦、 =擾(稱為斑痕)。斑痕之擴張方向恆與射出成型機術中之^ =動方向約略機(相差15。以内)。於塑料物件鑄造期間,告 動方向拉_巨離時,即形成斑痕。斑痕: 、、心疋匕3旋膠粒子。塵埃粒子亦因曝光於第一光源 2::發出螢光。然而’由於使用去離子化氣體,塵埃粒子2 、目應已減至最小。目此可決定塑料物件巾之所有缺 測’因為實質上可確保已無塵埃粒子所隱藏之缺陷。、 、 =機⑽㈣_含㈣祕陷及s光塵她子之 物件116之影像。照相機訊號乃經由照相機介面(未顯示)供應= 20 200844425 電腦系統104。 電腦程式產品140具有一影像處理組件42〇。藉由影像處理 組件420,於塑料物件422或以照相機108所取得塑料物件之影 像之螢光缺陷及塵埃粒子可被偵測,並彼此作區分。再者,各 5螢光缺陷之大小和形狀亦可以影像處理組件42〇予以決定。& 像處理組件420亦可決定塑料物件422中螢光缺陷之數目。〜 10 15 20 預定之品質準則418亦被整合於電腦程式產品14〇之中。 電腦程式產品140乃基於經由影像處理組件42〇所找出之螢光 ,陷,以決定塑料物件42是否符合—定之品質準則418。舉例 δ之’品質準則418可標示’並無大小(投影區)大於1〇〇平方微 米之螢光缺陷可能出現於塑料物件之中。如為藉由影像處理組 件420予則貞出其缺陷大於⑽平方微米之情況,該批顆粒則 不予放订。此可利用電腦程式產品14G經由顯示幕W參照圖 1)發出對應訊f奸裝置之作㈣仁㈣效。如果並未找出大 於100平方微米之缺陷,則該批顆粒可予放行;例如,利用電 腦程式產品140發出對應訊號至作業同仁。 再者’塑料物件422中之非螢光缺陷,如斑痕、小孔及玻 =維’亦可予以制。為達此—目的,如圖3所述之光學測 4爭兀102亦含有第二光源144,以及照相機146、148和15〇。 =光源U4射出可見錢長範圍内之光線,而所反射或發射 域之強度則以-局部解析(lGeally咖㈣方式,由照相機 146、148和150予以债測。所價測的各非營光缺陷之大小、位 置和形狀從而可由反射光或發射光之強度分布予以決定(如de 20 200844425 10 2004 054102 A1和DE 101 44 909 A1)。如此取得之資訊從而 可匹配一個或一個以上經界定之品質準則(亦關乎非螢光缺 陷),其結果即是在該批顆粒放行方面有所決定。 5 10 15 20 圖5為一流程圖,顯示依據本發明之方法之步驟。在步驟 500中,由一批顆粒中取得一樣品。在步驟502中,由該樣品產 生透明塑料物件。在步驟504中,透明塑料物件經測試有無榮 光缺陷,亦可選擇是否測試其有無螢光缺陷。在步驟5〇6中, 基於缺陷來決定塑料物件是否符合給定之品質準則。若情況如 此,則該批顆粒於步驟508中放行。如於步驟506中決定塑料 物件並未滿足品質準則,則顆粒之品質則於步驟51〇中予以分 類’視為未充分符合品質準則,因而該批顆粒不予放行。 圖6列出一表格,其中塑料物件中所發生之缺陷乃經分類。 所述,斑痕乃屬流擾,於射出成型物件中其塑料板材^进 i斑流動方向拉良一些許距離時,即形成: H而總疋包含凝膠粒子且其方向與流動方向一致。斑 艮之見度為10至200微米不等。 〇·2至10毫米不等。 +斑痕於動方向之長度-般為 凝膠粒子乃凝膠類似材料之人 料物件。有螢光與非螢光凝膠粒d”質不同於塑 或藍光波長範n㈣發時,=物粒子於受紫外光 長度約為10至200微米。非與 X茧光。萁光旋膠粒子之 或圓形。非螢光凝勝粒子之直*徑^膠粒子有一橫截面,呈印形 30至3〇〇微米之間)。 ' 丨0至500微米之間(主要為 21 200844425 所球形、巨視光學(非透明)缺陷,各由外物 所、、且成(如4、麵#狀聚合物),或相歸材料過敎而 引起(例如於顆粒生產期間)。小孔之直徑為2至500微米(;;要 為5至300微米)。小孔團塊(aggl〇memti〇ns)可造成朦朦 缺陷(條紋),其長度約為5至削毫米(主要為1〇至3毫米= 寬度約為1至30毫米(主要為2至15毫米)。 毛'、 玻璃纖維及氣泡在塑料物件中亦可能發生。唯彼等相對於 上述缺陷較少關聯。玻璃纖維呈圓柱形及氣泡,長度為1〇至8㈨ 微米(主要為30至500微米),而直徑則為1〇至5〇微米(主要為 10至20微米)。氣泡呈卵形,而直徑則為1至1〇〇微 ^ 2至30微米)。 ^要馬 圖式簡單說明】 圖1為用以偵測於一固態物件中缺陷之裝置的方塊圖。 15 驟 圖2為一流程圖,指出本發明方法用於缺陷偵測之必要牛 圖3為一示意圖,顯示第二光源之配置圖及用以偵測由固 態物件中所傳送或反射之光線的手段。 、“ 圖4為一方塊圖,頒示用以進行一批顆粒之品質管制的妒 圖5為一順序流程圖,用以決定一批塑膠顆粒是否,人 設之品質接受準則。 、 、 22 200844425 圖6為一範例表格,詳細列出一塑料物件中其缺陷之類型、 大小及形狀。 【主要元件符號說明】 5 100 裝置 102 光學測試單元 104 電腦糸統 106 第一^光源 108 照相機 10 110 透鏡 112 濾光器 114 微處理器 116 記憶體 118 照相機介面 15 120 顯不幕 122 接線 124 固態物件 126 投影區 128 座標系統 20 130 缺陷 132 缺陷 134 缺陷 136 塵埃粒子 138 塵埃粒子 23 200844425 15 140 電腦程式產品 142 影像 144 第二光源 146 照相機 148 照相機 150 照相機 152 第二投影區 400 裝置 402 射出成型機 404 鑄模 406 冷卻拉伸器 408 用以產生去離子化氣體之手段 410 澆注系統 412 貧料取得糸統 414 風扇 416 樣本 418 品質準則 420 影像處理組件 422 塑料物件 20 24The defect of 2: on the one hand, it may reduce the plastic produced by the plastic granules, and on the other hand, it may further cause defects in plastic objects. For example, the hot peppers and small holes have appeared in the (4) young children's towel. The gel causes flow disturbances, which are caused by the fact that the plastic objects are pulled away in the direction of flow. This kind of her gel particles, and its direction and (four) direction __. _ and ~, 疋 contains this method has its advantages · By producing a plastic test piece, the quality of the granules used to produce the plastic object is used as a test and thus it is possible to determine whether the granule is completely suitable as the desired plastic: To: test. Material - even before the pellet is delivered to the customer, or before the original item of 〃 2. Unsuitable granules are not used at all for the production of plastic plastics. Therefore, the cost of the Tim¥, the throne, or the delivery of the customer is reduced. In addition, the customer embraces the "reduction of the quality of the product". The result is from the high-quality product of the Qianshanling manufacturer. According to the embodiment of the present invention, it is in the form of a sheet or a plate. Produced in the injection molding machine = 2 machines, the plastic parts are generally based on the industrial scale == Advantages: Because of the plastic object, it is also produced in the same way as 11 200844425. Trial parts are also produced; they also contain similar defects caused by production because they use the same production process as mass production. The material so produced is thus particularly suitable for determining whether the particles used in its production meet the -^ quality criteria. On the one hand, plate-shaped or sheet-like plastic objects produce special sheets on the injection molding machine; on the other hand, the optical test process, plate-like, and sheet-like objects may be particularly successful. Furthermore, the lack of plastic objects is mainly due to the casting process of the injection molding machine, especially the contact surface = 3L /, the private 1 opening > tool surface. The geometry of the surface of the forming tool is a special embodiment of the use of plastic sheets as the geometry of the injection molding tool to determine whether the particles meet the _ set quality criteria and are therefore fully adequate. From/seeking; after injection of the spiral plasticization before the particles in the molding machine, the film is washed by a film (mmga (6) to produce a plastic object. The spiral plasticization of the particles is to promote the flow by injection molding snail = cut = enter 仃. Molding and (4) Forming drums contain = Table (4) layers, and may also consist of high-chromium alloys. In the case of -special real = thermal decomposition and / or cross-linking (Cr〇SSHnking) process can also be avoided. The applicable process parameters are the brothers, the pressure reaction can be controlled, and the control system includes the cycle time and the machine phenomenon (cavitation), and the w state sample injection molding is formed by a thin film: Note == The final shear stress. The shot (〇ff collapses a η_. The off-center material; = avoids the ^^ note and the material it promotes is deposited in the flow deviation region. Poor 12 200844425 The advantage is that After moving (4), the simple object passes through the wire, so that the prototype can be cooled by the hook. After the injection molding plate is cooled: it can be removed by using a suitable fixture system without touching the surface of the plate. For example, one that only touches the edge of the sheet Lateral jig. /..., 5. According to an embodiment of the invention, the deionized gas is sprayed onto at least one surface side of the solid object before the solid object is exposed to the first or first source of light. The side is discharged by a deionized gas. The dust is preferably removed from the surface. In addition, the suction surface corresponds to the suction of the dust particles. $有有- Benefits: When (4) the object is inspected by the above optical method At the time of defect 10, the dust particles appearing on the surface thereof are greatly reduced. According to the present invention, the projection surface of the surface of the maternity object exposed to light, light or non-light failure is also determined. In other words, the light emitted, emitted, and reflected by the object is detected by the camera. 2. The light spectrum of the image processing software is analyzed, and the entire projection of all glory or non-fluorescent defects is detected. The district can also be determined. Therefore, the quality acceptance criteria can indicate all the fluorescent or non-fluorescent light related to the size of the surface of the plastic object, and the maximum allowable total projection area (for example: Qian Qianguang or (4) The maximum allowable total projection area of the defect is equal to the jump of the surface of the plastic object being inspected. If all, the total projection area of the light or non-fluorescent level is smaller than the total projection area of the largest material, the first batch is again. It is: only the entire projection area of all glory or non-glory defects (not the projection area of each defect) is used to determine whether the plastic object meets the quality criterion. If compared to the projection area of each defect, the defect shadow area is 13 200844425 According to the embodiment of the present invention, the quality criterion indicates the absence of _, or the maximum material size of each touch (4), or the maximum number of (4) according to the embodiment of the present invention, a batch of plastic particles can be Among the quality categories - at least - the material is marked, : = class, and the batch of particles is approved as the highest quality category among several quality = criteria). Pay for it. Corresponding to σ σ For example, the -quality surface may be related to cd "say === qualitatively." - the plastic object produced by the particle sample, must be very south. If the _ object does not meet the quality acceptance criteria, the vines should not be released for the production of CD or DVD substrates. In the case of a car headlight cover, this plastic material is human soil; '''°, the substrate can be released to == its quality criteria. This kind of situation has its advantages: it is based on the age of the first == the age of the classification and thus 15 and is supplied to 7 households requiring a certain quality category (^ is divided into several quality categories, from < each household (corresponding to the quality of the particles) )): ί 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种The image is distinguished by a fluorescent defect. The injection-first shape, size or color can be compared with the preferred embodiment of the present invention, and will be described in more detail below with reference to the drawings. Block diagram of the device in the transparent solid object. The device f(10) contains the optical test unit 1〇2 and the computer system 1〇4. The optical test 1G2 contains the first light source 1G6 and the camera (10). Optical test unit 1〇 2 The improvement includes a lens 110 and a chopper m. The computer system includes a micro-processor 125, a memory 116, a camera interface 118, and a display screen 12. The camera 108 is connected to the camera interface 118 via a wire 122, and thus the camera 108 The recorded image can be Transfer to the computer 1〇4, ... the solid object 124 is introduced into the optical test unit 1〇2 to check the defect. The light generated by the first light source 106 is projected through the lens 11〇 to the solid object I% of the Sichuan projection area Π6 The wavelength of the light generated by the first-light source 106 is selected to excite a luminescent defect (such as (4) i30, m, m) to cause it to emit light and glory. For example, the solid object 124 may belong to a plastic object. 132, 134 may be gel particles, and emit light when excited by ultraviolet light or blue light. In order to test the fluorescent defects of the plastic object, it is possible to use a mercury vapor lamp or a blue light ray as the first light source 1 〇 6. The camera 108 is associated with the first light source 〇6, and is located behind the solid object 124 as shown in Fig. 1. The filter 112 is applied to the emitted fluorescent light (the fluorescent light is the defect 132 in the first projection area). 126 is exposed to light and has high transparency. Filter n2 also has low transparency to the light generated by first light source 106. The image of defect 132 is thus fully recordable by camera 108, independent of the first source 1 〇 6 shots of light The solid object 124 can be displaced along the y-axis (refer to the coordinate system 128). The light source/camera system (including the first light source 106, the lens 11 〇, the filter 112, and the camera 15 200844425 108) can be displaced on the x-axis (Refer to the coordinate system 128) such that the projection area 126 migrates over the entire solid object 124, and the fluorescent light emitted by the defects 130 and 134 can also be recorded. Dust particles deposited on the solid object 124 (such as dust particles 136 and 5) 138) Fluorescence is also emitted. Fluorescent dust particles can also be detected by the camera 1〇8. The filter 112 is placed in such a manner that fluorescent light from the dust particles can pass therethrough. Images recorded by camera 108 in projection area 126 can be fed to the computer via wires 122 and 71. The microprocessor I 〗 # executes the computer program product 140 to process the image. The computer program product 14 is permanently stored in the memory 1 〇 116 and has been loaded into the microprocessor 114 prior to execution. The computer program product 140 combines the image produced by the projection area 126 on the solid object 124 to form an image 142 of the solid object 124 and is displayed on the display screen 120. The computer program product 140 also performs image processing of the image 142. The dust particles 15 I36 and 138 can thus be distinguished from the defects 130, 132, 134 based on their shape. For example, if the solid object 124 is a plastic object and the fluorescent defects 13〇, 132, and 134 are gel particles, the shape is a typical spherical shape. Therefore, these defects appear as circles in the image 142 because the camera records the projection of the solid object 124 on the coincident plane. On the other hand, dust particles such as dust particles 136 and 138 tend to be blurred and larger than defects. Dust particles 136 and 138 also generally emit fluorescence in a different color than the absence of 130 130 and 134. Fluorescent discs from dust particles may have different fluorescence from defects ~ such as in color chromaticity (c〇1〇r let "^ and / or color intensity (intensity) and / or color saturation (satumti〇n) 200844425 Dust particles and fluorescent defects are also beautiful 1 Figure 2 shows the flow chart, the steps of the method of defects in the fasteners. Two ^ = t clearly used ^ ^ measured in the solid light of the first source of light. The 2G2 7 'solid object is exposed to the defect detected by the second light source exposed to the first source light and/or the fluorescent light emitted from the solid object. Step 204 is performed on the dust particles deposited on the object based on the dust particles emitted by the object. The shot is printed on the object. V is small or color, and the fluorescent defect is shown in Figure 3. The second image is taken in the optical test unit 1G21'. The second projection area 152 of the solid object 124 is illuminated by the light source m. The camera system (including the light source 144 and the cameras 146, 148 and 15) can also be turned on. X-axis displacement (signature coordinate system 128). Plastics It can be displaced along the y-axis, so that the projection area I52 migrates over the entire object m, and the latter can be displayed as a whole. The light reflected by the solid object 124 is detected by the camera 146, and it is detected by the solid object 124. The light emitted and scattered by the defects of the plastic object 124 is detected by cameras 148 and 150. Camera 148 is located in the field of view of light source 144, while camera 150 is located in the dark field of light source 144. 200844425 The partial resolution detection signals of the machines 146 and 150 (which can also use the camera 148) make it possible to detect non-fluorescent defects in plastic objects, in particular including position, shape and size (for example, DE 10 2004 054 102 A1). Figure 4 shows a block diagram of a device for controlling the quality of a batch of particles. 5 Apparatus 400 comprises an injection molding machine 402, a die 404 and a cooling stretcher 4〇6. The controlled device 400 also includes means 408 for generating a deionized gas. The device 400 also includes an optical test unit 102 (shown in Figure i or Figure 4 and computer system 104 (shown in Figure 1). ', Sample 416 Taken from a batch of positive The granules of the tube are fed to the injection type machine to produce a plastic object (ksk) made of the sample. The injection molding machine 4〇2 contains a film washing system 41〇 and a connection (ship) 412 The data acquisition system 412 ensures that the temperature of the body and the tool is within the material=temperature range and is in the thermal decomposition or cross-linking process, and the pressure reaction may be the cavitation acquisition system 412 also controls the washing of the town, the first Baotong). _ The rate of the shell. The injection molding of the plastic is carried out by the injection system 410 into the mold, so as to avoid the flow deviation and the injection method through the direct cooling flow channel. Tool cavity is made up of at least two side modes::: move! The material contributed by the difference zone is from 5 to 1 mm (from 丨 to 4, ..., 70%, the wrong way is to produce a wall thickness of mm (4). It is better to 3. 0 mm == flow length by The plastic article 422 can be removed by the injection molding machine (for example, by loading and unloading the 200844425 tool) without damaging the surface of the plastic article 422. The mold residue is separated from the plastic article 422 by the mold 4〇4. The plastic article 422 is thereby cooled 406. Before the plastic article 422 is transported to the optical test unit 1〇2, the gas is sprayed onto at least the side surface of the plastic article 422. For this purpose, for the purpose of deionizing the gas The means tears a fan 414. The surface of the plastic object 422 is sprayed through the fan 414; and the dust is removed from the surface. After the surface discharge, the result is that the second ale particles are adsorbed to the plastic. The object 422 is far less than the previous level. 15 The plastic object 422 is thus transported to the optical test unit 1G and appears to be exposed to light from the first source, 106, and the plastic object is lacking light (as long as such defects occur and can emit glory ). The two objects in the material are especially likely to be gel particles, because these particles are generally granulated. It is inevitable that the gel particles become defects in plastic objects, but they are also Scars. The direction of expansion of the marks is constant and the machine in the injection molding machine is about the direction of the machine (with a difference of 15.). During the casting of plastic objects, when the direction of the slap is pulled, the smear is formed. The palpitations are 3 spin particles. The dust particles are also exposed to the first light source 2:: fluorescing. However, due to the use of deionized gas, the dust particles 2 should be minimized. All the flaws in the towel 'because it essentially ensures that there are no defects hidden by dust particles., , = (10) (4) _ contains (4) secret traps and s light dust her image of the object 116. The camera signal is via the camera interface (not Display) Supply = 20 200844425 Computer System 104. The computer program product 140 has an image processing component 42. By the image processing component 420, the fluorescent defects of the image of the plastic object are obtained from the plastic object 422 or the camera 108 and The particles can be detected and distinguished from one another. Furthermore, the size and shape of each of the five fluorescent defects can also be determined by the image processing component 42. & the image processing component 420 can also determine the fluorescent defects in the plastic object 422. The number of products is 418. The predetermined quality criteria 418 is also integrated into the computer program product. The computer program product 140 is based on the fluorescent light found by the image processing component 42 to determine the plastic object 42. Compliance with the quality criteria 418. For example, the 'Quality Criterion 418' of δ can indicate that a fluorescent defect having a size (projection area) greater than 1 〇〇 square micron may be present in a plastic object. If the defect is greater than (10) square micrometers by the image processing component 420, the batch of particles will not be dispensed. This can be used by the computer program product 14G via the display screen W to refer to FIG. 1) to issue the corresponding information (4) Ren (four) effect. If no defects larger than 100 square microns are found, the batch of particles can be released; for example, the computer program product 140 sends a corresponding signal to the homework operator. Furthermore, non-fluorescent defects such as smudges, small holes and glass = dimensional in plastic articles 422 can also be made. To this end, the optical test 102 of FIG. 3 also includes a second source 144, and cameras 146, 148, and 15A. = Light source U4 emits light in the visible range of money, and the intensity of the reflected or transmitted domain is measured by the local resolution (lGeally coffee (four)), which is measured by cameras 146, 148, and 150. The size, position and shape of the defect can thus be determined by the intensity distribution of the reflected or emitted light (eg, de 20 200844425 10 2004 054102 A1 and DE 101 44 909 A1). The information thus obtained can be matched to one or more defined The quality criterion (also related to non-fluorescent defects) results in a decision on the release of the batch of particles. 5 10 15 20 Figure 5 is a flow chart showing the steps of the method according to the invention. A sample is taken from a batch of particles. A transparent plastic article is produced from the sample in step 502. In step 504, the transparent plastic article is tested for presence or absence of a glare defect, and may also be selected for testing for presence or absence of a fluorescent defect. In 〇6, it is determined whether the plastic article meets the given quality criterion based on the defect. If this is the case, the batch of particles is released in step 508. As determined in step 506 If the object does not meet the quality criteria, then the quality of the granules is classified in step 51. 'The quality criteria are not fully met, so the batch of granules is not released. Figure 6 shows a table in which the plastic object occurs. The defects are classified as follows. The plaque is a flow disturbance, and when the plastic sheet in the injection molded article is pulled in a certain distance, the H: and the total enthalpy contains the gel particles and their direction and flow. The direction is the same. The visibility of the spot is from 10 to 200 microns. 〇·2 to 10 mm. + The length of the spot in the moving direction - the gel particles are the material of the gel-like material. When the light and non-fluorescent gel particles are different from the plastic or blue wavelength range n (four), the object particles are exposed to ultraviolet light for a length of about 10 to 200 microns. Non-X-rays. Round. Non-fluorescent condensed particles of straight diameter ^ 胶 particles have a cross section, printed between 30 and 3 〇〇 micron). 丨 0 to 500 microns (mainly 21 200844425 spherical, giant Optical (non-transparent) defects, each made up of foreign objects 4. Face-like polymer), or caused by the relative material being over-ruled (for example during particle production). The diameter of the small holes is 2 to 500 microns (;; to be 5 to 300 microns). Aggl〇memti〇ns) can cause defects (stripes) with a length of about 5 to a millimeter (mainly 1 to 3 mm = width of about 1 to 30 mm (mainly 2 to 15 mm). Glass fibers and air bubbles may also occur in plastic objects. They are less related to the above defects. Glass fibers are cylindrical and bubble, and the length is 1〇 to 8 (9) microns (mainly 30 to 500 microns), while the diameter It is from 1 〇 to 5 〇 microns (mainly 10 to 20 microns). The bubbles are oval in shape and have a diameter of 1 to 1 〇〇 micro ^ 2 to 30 μm). ^要马图 Simple description] Figure 1 is a block diagram of a device for detecting defects in a solid object. Figure 2 is a flow chart showing the necessity of the method of the present invention for defect detection. Figure 3 is a schematic diagram showing a configuration diagram of the second light source and detecting light transmitted or reflected by the solid object. means. Figure 4 is a block diagram showing the quality control of a batch of particles. Figure 5 is a sequence flow chart for determining whether a batch of plastic particles is subject to quality acceptance criteria. , , 22 200844425 Figure 6 is an example table detailing the type, size and shape of defects in a plastic object. [Main component symbol description] 5 100 device 102 optical test unit 104 computer system 106 first light source 108 camera 10 110 lens 112 Filter 114 Microprocessor 116 Memory 118 Camera Interface 15 120 Obvious 122 Connection 124 Solid Object 126 Projection Area 128 Coordinate System 20 130 Defect 132 Defect 134 Defect 136 Dust Particles 138 Dust Particles 23 200844425 15 140 Computer Program Products 142 image 144 second light source 146 camera 148 camera 150 camera 152 second projection area 400 device 402 injection molding machine 404 mold 406 cooling stretcher 408 means for generating deionized gas 410 pouring system 412 poor material acquisition system 414 Fan 416 sample 418 quality standard The image processing component 422 420 20 24 plastic article

Claims (1)

200844425 申請專利範圍: ι· 一種用於_於—透日·態物件中缺關方法,包含: (1)將该物件曝光於來自一第一光源之光線; (ii) 偵測該固態物件所射出之螢光· (iii) 藉由螢光之影像處理,對$缺 予以過;慮’ μ-縣③之特徵為就$光缺陷所射出之^光而 言射比可達25%至100%’而就塵埃粒子所射出之螢光而 言其低透射比為0%至2〇%;或者藉由_第二濾、光Μ以過滅, 該弟之特徵域㈣缺陷所射出之螢光而言其低透射 比為0。/。至2G%,而就塵埃粒子所射出之榮光而言其 達 25%至 100%。 3.如請求項Λ之方法,其中所射H㈣藉由―第-遽光器 予以過慮,3亥第-遽光|g之特徵為就營光缺陷所射出之榮光而 15言其高透射比可達80%至95%,而就塵埃粒子所射出之榮光而 .Γ ΐ低透射ΐ為G%至1G% ·’或者藉由-第二濾光器予以過渡, 忒第一濾光為之4寸彳玫為就螢光缺陷所射出之螢光而言其低透射 比為0%至1G%’而就塵埃粒子所射出之螢光而言其高透射比可 達 80%至 95%。 2〇 4·如凊求項1之方法,進一步包含:決定螢光缺陷之數目及/ 或塵埃粒子之數目。 5·,請求項1之方法,其中於該固態物件上之螢光缺陷及螢光 塵埃粒子係被定位(位置的決定),各螢光缺陷及/或各螢光塵埃 粒子之大小及/或形狀及/或顏色係被決定。 25 200844425 法’其㈣第—光賴產生之練乃於藍光 波長辄圍内及/或於紫外光波長範圍内。 尤 7·如請求項1之方法,進一步包含: (1V\將該物件曝絲來自-第二総之光線; 5錄影ί處理,以區分其經由該物件所發射之光線及 ,、曝先㈣弟二光源之光線之該物件所反射之光線;以及 (vi)偵測非螢光缺陷。 f =。如請求項1之方法,其中該固態物件乃屬塑料板材或塑料薄 in 求項1之方法’其中該螢光缺陷乃屬凝膠粒子。 種缺之方法,其中該物件進一步含有非螢光缺陷,此 群二條紋、玻璃纖維、空咖 15 項1之方法,其中該物件之表面鱗光於成段或線條 、12.-種用於偵測於一透明固態物件中缺陷的裝置 ⑴祕將簡件曝紐來自-第—光狀光線的手段; ⑻用於偵測從該固態物件所射出之螢光的手段; Ζ用於進行該螢光之影像處理的手段,而使沉積於 心物件上之塵埃粒子可與螢光缺陷作區分。 13·如請求項12之裝置,進一步包含: 段;(V)用於將該榮光缺陷及物件上之塵埃粒子予以定位的手 (Vi)用於決定該缺陷及/或塵埃粒子之大小、形狀、顏色之 26 200844425 其中至少一者的手段;以及 (vii)用於決定該物件之數目的手段。 14.„如請求項12之裝£,其中用糾貞測之手段包括於由一第一濾 光益與一第二濾光器所組成之群組的其中至少一構件;而該第 「遽光11之特徵為料級陷所射出之榮光而言其高透射比可 達25%至100%’而就塵埃粒子所射出之螢光而言其低透射比為 至、20/°,或者藉由一第二濾光器予以過濾,該第二濾光器之 特,為就螢級陷所射出之$光而言其低透射比為G%至观, 而就塵¥粒子所射出之榮光而言其高透射比可達至⑽%。 1^如請求項12之裝置’其中用於侧之手段包括由—第一遽光 弟H器所組成之群組的其中至少—構件;而該第-渡光器之舰域料缺陷所射Α之螢光*言其高透射比可達 至。95/。'就塵&粒子所射出之榮光而言其低透射比為〇% 15 20 1炎 1〇% ’或者藉由—第二濾、光器予以過濾、,該第二濾、光器之特 j為就螢光缺陷所射出之螢光而言其低透射比為⑽至1〇%,而 就塵粒子所射出之螢光而言其高透射比可達⑽%至Μ%。 項12之裝置’其中該第-光源所產生之光線乃於藍光 /長軏圍内及/或於紫外光波長範圍内。 如請求項12之裝置,進一步包含: ㈣用於將該物件曝光於來自―第—光源之光線的手段; 00用於偵測經由該物件所發射之光線及其曝光於該第二 Λ、之光線之物件所反射之光線的手段;以及 (xij㈣對所發射及/或所反射之光線崎影像處理的手 又,以在該物件中偵測非螢光缺陷。 27 200844425 12之裝置’其中該影像處理包括用以侧該榮光缺 =之位置及/或大小及域形㈣手段,以㈣計數該缺陷的手 I9·如明求項I2之裝置,其中該 5 光缺陷為該塑料物件、口;件為-塑料物件,該非榮 柄雜ί。 賴纖維或空氣 紋、玻璃纖維、空^捭^/、中該非螢光缺陷為由斑痕、小孔、條 21.如請求項12 雒物所組成之群組的其中至少一者。 方式將該物件之表 進一步包含:(xii)用成段或線條式之 曝光於光源的手段。 28200844425 Patent application scope: ι· A method for missing a _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Fluorescent shots (iii) The use of fluorescent image processing has been used to treat $deficient; consider that 'μ-County 3 is characterized by a ratio of 25% to 100 for the light emitted by the $-light defect. %' and the low transmittance of the fluorescent particles emitted by the dust particles is 0% to 2%; or by the second filter, the light is extinguished, and the characteristic field (four) defect is fired. In terms of light, its low transmittance is zero. /. It is 2G%, and it is 25% to 100% in terms of glory emitted by dust particles. 3. The method of claim ,, wherein the shot H(4) is considered by the “cluster”, and the 3 haid-dun|g is characterized by a high transmittance of the glory emitted by the camping defect. Up to 80% to 95%, and the glory emitted by the dust particles. ΐ ΐ low transmission ΐ G% to 1G% · ' or by the second filter to transition, 忒 first filter for The 4-inch enamel has a low transmittance of 0% to 1G% for the fluorescence emitted by the fluorescent defect and a high transmittance of 80% to 95% with respect to the fluorescent light emitted by the dust particles. 2. The method of claim 1, further comprising: determining the number of fluorescent defects and/or the number of dust particles. 5. The method of claim 1, wherein the fluorescent defects and the fluorescent dust particles on the solid object are positioned (determination of position), the size of each fluorescent defect and/or each fluorescent dust particle and/or The shape and/or color is determined. 25 200844425 The law “the fourth” is produced in the blue wavelength range and/or in the ultraviolet wavelength range. The method of claim 1, further comprising: (1V\the object is exposed to the light of the second ray; 5 video ί is processed to distinguish the light emitted by the object, and exposure (4) The light reflected by the object of the light source of the second light source; and (vi) detecting the non-fluorescent defect. f = The method of claim 1, wherein the solid object is a plastic sheet or a plastic sheet. The method wherein the fluorescent defect is a gel particle, wherein the object further comprises a non-fluorescent defect, the group of two stripes, the glass fiber, and the empty coffee 15 item 1 method, wherein the surface scale of the object Light means or segments, 12.-type means for detecting defects in a transparent solid object (1) means to expose the light from the -to-light light; (8) for detecting from the solid object The means for emitting the fluorescent light; the means for performing the image processing of the fluorescent light, so that the dust particles deposited on the heart object can be distinguished from the fluorescent defects. 13. The device of claim 12, further comprising : paragraph; (V) for the glory The hand (Vi) to which the defect and the dust particles on the object are positioned is used to determine the size, shape, and color of the defect and/or dust particles. 26 200844425 means for at least one of them; and (vii) for determining the object a means of numbering. 14. As claimed in claim 12, wherein the means for correcting is included in at least one of the group consisting of a first filter and a second filter; The "Twilight 11 is characterized by a high transmittance of 25% to 100% for the glare emitted by the material level depression" and a low transmittance of 20% for the fluorescence emitted by the dust particles. °, or filtered by a second filter, the second filter is characterized by a low transmittance of G% to the light emitted by the fluorescent level trap, and the dust is as follows. The high transmittance of the glory emitted can reach (10)%. 1 ^ The device of claim 12, wherein the means for the side includes at least one of the group consisting of - the first The component; and the fluorescent light emitted by the ship's material defect of the first-diffuse is said to have a high transmittance of up to 95/.' In terms of the glory emitted by the dust & particles, the low transmittance is 〇% 15 20 1 inflammation 1〇% ' or filtered by the second filter, the optical filter, and the second filter The low transmittance is (10) to 1% in terms of the fluorescence emitted by the fluorescent defect, and the high transmittance is up to (10)% to Μ% in terms of the fluorescent light emitted by the dust particles. The light generated by the first light source is in the blue light/long light circle and/or in the ultraviolet light wavelength range. The device of claim 12, further comprising: (4) exposing the object to the light source from the first light source Means for detecting light 00 for detecting light reflected by the object and light reflected by the object exposed to the second ray; and (ii) pairs of light emitted and/or reflected The image processing hand is again used to detect non-fluorescent defects in the object. 27 200844425 12 device 'where the image processing includes means for locating the location and/or size and domain shape of the glory = (4) means, (4) counting the hand of the defect I9 · the device of the item I2, wherein the image The light defect is the plastic object, the mouth; the piece is a plastic object, and the non-rong handle is mixed. The non-fluorescent defect is at least one of a group consisting of a smear, a small hole, and a strip 21. The smear of a smear, a smear, or a smear. The form of the object further comprises: (xii) means for exposing the light source to a segment or line. 28
TW96140666A 2006-10-31 2007-10-30 Method and device for detecting defects in a transparent solid article TW200844425A (en)

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DE102006051309A DE102006051309A1 (en) 2006-10-31 2006-10-31 Substrate materials for transparent injection molded bodies
DE102006051305A DE102006051305A1 (en) 2006-10-31 2006-10-31 Process for the filtration of substrate materials
DE102006051308A DE102006051308A1 (en) 2006-10-31 2006-10-31 Process for the treatment of metal surfaces
DE102006051306A DE102006051306A1 (en) 2006-10-31 2006-10-31 Substrate materials for extrusion foils with low surface defects
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102128816A (en) * 2010-01-19 2011-07-20 晶元光电股份有限公司 Defect detection method and system for light-emitting component
US10830700B2 (en) 2017-01-07 2020-11-10 Illumina, Inc. Solid inspection apparatus and method of use
CN113916854A (en) * 2021-09-29 2022-01-11 深圳市壹倍科技有限公司 Equipment and method for distinguishing surface defects and dust of precision component

Families Citing this family (1)

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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6080745A (en) * 1983-10-11 1985-05-08 Hitachi Ltd Automated detector for foreign matter
JPH0293346A (en) * 1988-09-29 1990-04-04 Toshiba Corp Foreign matter analyser
JPH03221848A (en) * 1990-01-26 1991-09-30 Canon Inc Device for inspecting foreign substance
US5383776A (en) * 1992-12-31 1995-01-24 Hoechst Celanese Corporation Apparatus for analyzing polymer defects
JP2001343330A (en) * 2000-05-31 2001-12-14 Shimadzu Corp Appearance inspection device

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CN102128816A (en) * 2010-01-19 2011-07-20 晶元光电股份有限公司 Defect detection method and system for light-emitting component
US10830700B2 (en) 2017-01-07 2020-11-10 Illumina, Inc. Solid inspection apparatus and method of use
TWI772752B (en) * 2017-01-07 2022-08-01 美商伊路米納有限公司 An optical detection device and method
US11442017B2 (en) 2017-01-07 2022-09-13 Illumina, Inc. Solid inspection apparatus and method of use
CN113916854A (en) * 2021-09-29 2022-01-11 深圳市壹倍科技有限公司 Equipment and method for distinguishing surface defects and dust of precision component

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