TW200828982A - Real-time detection method for bad pixel of image - Google Patents

Real-time detection method for bad pixel of image Download PDF

Info

Publication number
TW200828982A
TW200828982A TW095148659A TW95148659A TW200828982A TW 200828982 A TW200828982 A TW 200828982A TW 095148659 A TW095148659 A TW 095148659A TW 95148659 A TW95148659 A TW 95148659A TW 200828982 A TW200828982 A TW 200828982A
Authority
TW
Taiwan
Prior art keywords
pixel
image
grayscale
pixels
value
Prior art date
Application number
TW095148659A
Other languages
English (en)
Chinese (zh)
Other versions
TWI328962B (enExample
Inventor
Chen-Hung Chan
Original Assignee
Altek Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Altek Corp filed Critical Altek Corp
Priority to TW095148659A priority Critical patent/TW200828982A/zh
Priority to US11/750,490 priority patent/US7589770B2/en
Publication of TW200828982A publication Critical patent/TW200828982A/zh
Application granted granted Critical
Publication of TWI328962B publication Critical patent/TWI328962B/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Image Processing (AREA)
TW095148659A 2006-12-22 2006-12-22 Real-time detection method for bad pixel of image TW200828982A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW095148659A TW200828982A (en) 2006-12-22 2006-12-22 Real-time detection method for bad pixel of image
US11/750,490 US7589770B2 (en) 2006-12-22 2007-05-18 Dead pixel real-time detection method for image

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095148659A TW200828982A (en) 2006-12-22 2006-12-22 Real-time detection method for bad pixel of image

Publications (2)

Publication Number Publication Date
TW200828982A true TW200828982A (en) 2008-07-01
TWI328962B TWI328962B (enExample) 2010-08-11

Family

ID=39542206

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095148659A TW200828982A (en) 2006-12-22 2006-12-22 Real-time detection method for bad pixel of image

Country Status (2)

Country Link
US (1) US7589770B2 (enExample)
TW (1) TW200828982A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8643751B2 (en) 2011-12-02 2014-02-04 Industrial Technology Research Institute Method for detecting dead pixels and computer program product thereof
TWI448154B (zh) * 2011-01-03 2014-08-01 Himax Imaging Inc 影像感測壞像素點的檢測方法

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8562770B2 (en) 2008-05-21 2013-10-22 Manufacturing Resources International, Inc. Frame seal methods for LCD
US8125163B2 (en) 2008-05-21 2012-02-28 Manufacturing Resources International, Inc. Backlight adjustment system
US9573346B2 (en) 2008-05-21 2017-02-21 Manufacturing Resources International, Inc. Photoinitiated optical adhesive and method for using same
US8154632B2 (en) * 2009-08-24 2012-04-10 Lifesize Communications, Inc. Detection of defective pixels in an image sensor
US8547456B1 (en) * 2009-09-30 2013-10-01 Rockwell Collins, Inc. System and method for monitoring inactive pixels in a scene imaging system
JP2011097542A (ja) * 2009-11-02 2011-05-12 Sony Corp 画素欠陥検出補正装置、撮像装置、画像欠陥検出補正方法、およびプログラム
WO2011143630A1 (en) * 2010-05-14 2011-11-17 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Analyte detection with infrared light
KR101931733B1 (ko) 2011-09-23 2018-12-24 매뉴팩처링 리소시스 인터내셔널 인코포레이티드 디스플레이 특성들의 환경 적응을 위한 시스템 및 방법
TWI492621B (zh) 2012-02-10 2015-07-11 Novatek Microelectronics Corp 適應性影像處理方法及其相關裝置
TW201419853A (zh) * 2012-11-09 2014-05-16 Ind Tech Res Inst 影像處理器及其影像壞點偵測方法
US10607520B2 (en) 2015-05-14 2020-03-31 Manufacturing Resources International, Inc. Method for environmental adaptation of display characteristics based on location
US10593255B2 (en) 2015-05-14 2020-03-17 Manufacturing Resources International, Inc. Electronic display with environmental adaptation of display characteristics based on location
US10321549B2 (en) 2015-05-14 2019-06-11 Manufacturing Resources International, Inc. Display brightness control based on location data
WO2018009917A1 (en) 2016-07-08 2018-01-11 Manufacturing Resources International, Inc. Controlling display brightness based on image capture device data
CN106210712B (zh) * 2016-08-11 2018-07-10 上海大学 一种图像坏点检测及处理方法
CN110463199A (zh) * 2018-04-10 2019-11-15 深圳市大疆创新科技有限公司 图像传感器坏点检测方法、拍摄装置、无人机及存储介质
US10578658B2 (en) 2018-05-07 2020-03-03 Manufacturing Resources International, Inc. System and method for measuring power consumption of an electronic display assembly
US10782276B2 (en) 2018-06-14 2020-09-22 Manufacturing Resources International, Inc. System and method for detecting gas recirculation or airway occlusion
CN109472078B (zh) * 2018-10-31 2023-05-09 天津大学 一种基于2×2像素子阵列的3d图像传感器缺陷检测修复方法
US11526044B2 (en) 2020-03-27 2022-12-13 Manufacturing Resources International, Inc. Display unit with orientation based operation
WO2022174006A1 (en) 2021-02-12 2022-08-18 Manufacturing Resourcesinternational, Inc Display assembly using structural adhesive
US12105370B2 (en) 2021-03-15 2024-10-01 Manufacturing Resources International, Inc. Fan control for electronic display assemblies
US12022635B2 (en) 2021-03-15 2024-06-25 Manufacturing Resources International, Inc. Fan control for electronic display assemblies
US12027132B1 (en) 2023-06-27 2024-07-02 Manufacturing Resources International, Inc. Display units with automated power governing
US12350730B1 (en) 2023-12-27 2025-07-08 Manufacturing Resources International, Inc. Bending mandril comprising ultra high molecular weight material, related bending machines, systems, and methods

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI448154B (zh) * 2011-01-03 2014-08-01 Himax Imaging Inc 影像感測壞像素點的檢測方法
US8643751B2 (en) 2011-12-02 2014-02-04 Industrial Technology Research Institute Method for detecting dead pixels and computer program product thereof

Also Published As

Publication number Publication date
TWI328962B (enExample) 2010-08-11
US20080151082A1 (en) 2008-06-26
US7589770B2 (en) 2009-09-15

Similar Documents

Publication Publication Date Title
TW200828982A (en) Real-time detection method for bad pixel of image
JP4675949B2 (ja) 映像処理技法を利用した構造物及び製品のクラック幅測定方法および装置
TWI262357B (en) Method and system of defect image classification
CN1981514B (zh) 动态识别和修正不良像素的方法
US20030123726A1 (en) Scene change detection apparatus
CN103093458B (zh) 关键帧的检测方法及装置
JP2004112802A (ja) 欠陥ピクセルの検出可能なディジタル・イメージ・センサおよび方法
TW544841B (en) Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same
JPWO2007105359A1 (ja) 倍率色収差を画像解析する画像処理装置、画像処理プログラム、電子カメラ、および画像処理方法
CN111724335A (zh) 检测方法及检测系统
TWI456991B (zh) 壞點偵測方法與電腦程式產品
KR101056978B1 (ko) 결함 화소 프로세싱 디바이스 및 결함 화소 프로세싱 방법
TW201026079A (en) Apparatus for demosaicing colors and method thereof
TWI376648B (en) Method and device for keeping image background by multiple gauss models
JP2760250B2 (ja) ピンホール検査装置
CN101807297B (zh) 医学超声图像直线检测方法
JP3924796B2 (ja) パターン位置の計測方法および計測装置
JP2012070319A (ja) 画像処理方法、画像処理装置及び画像処理プログラム
JP2004134861A (ja) 解像度評価方法、解像度評価プログラム、および光学機器
CN119541377A (zh) 一种关于显示屏平场校正的方法、装置、系统及存储介质
JP2006047077A (ja) 画面の線欠陥の検出方法及び検出装置
JP2010093471A (ja) 撮像装置、撮像装置用半導体集積回路、および欠陥画素判定方法
JP4910412B2 (ja) 外観検査方法
CN109510936A (zh) 连续自动对焦方法及系统
JP2004170109A (ja) 色むら検査装置および検査方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees