TW200819749A - Method to test electronic product - Google Patents

Method to test electronic product Download PDF

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Publication number
TW200819749A
TW200819749A TW95138916A TW95138916A TW200819749A TW 200819749 A TW200819749 A TW 200819749A TW 95138916 A TW95138916 A TW 95138916A TW 95138916 A TW95138916 A TW 95138916A TW 200819749 A TW200819749 A TW 200819749A
Authority
TW
Taiwan
Prior art keywords
test
carrier
tray
base
electronic product
Prior art date
Application number
TW95138916A
Other languages
English (en)
Chinese (zh)
Other versions
TWI310087B (enExample
Inventor
qing-shan Yang
Jin-Zheng Ceng
Original Assignee
Stack Devices Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stack Devices Corp filed Critical Stack Devices Corp
Priority to TW95138916A priority Critical patent/TW200819749A/zh
Publication of TW200819749A publication Critical patent/TW200819749A/zh
Application granted granted Critical
Publication of TWI310087B publication Critical patent/TWI310087B/zh

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  • Automatic Analysis And Handling Materials Therefor (AREA)
TW95138916A 2006-10-20 2006-10-20 Method to test electronic product TW200819749A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Publications (2)

Publication Number Publication Date
TW200819749A true TW200819749A (en) 2008-05-01
TWI310087B TWI310087B (enExample) 2009-05-21

Family

ID=44769918

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Country Status (1)

Country Link
TW (1) TW200819749A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013137286A (ja) * 2011-12-28 2013-07-11 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
TWI310087B (enExample) 2009-05-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees