TW200802311A - Method of detecting scratch defect in circumferential direction and magnetic disk certifier - Google Patents

Method of detecting scratch defect in circumferential direction and magnetic disk certifier

Info

Publication number
TW200802311A
TW200802311A TW096115690A TW96115690A TW200802311A TW 200802311 A TW200802311 A TW 200802311A TW 096115690 A TW096115690 A TW 096115690A TW 96115690 A TW96115690 A TW 96115690A TW 200802311 A TW200802311 A TW 200802311A
Authority
TW
Taiwan
Prior art keywords
magnetic disk
circumferential direction
detecting
inspection
scratch defect
Prior art date
Application number
TW096115690A
Other languages
English (en)
Other versions
TWI401670B (zh
Inventor
Sumihiro Maeda
Yasuhiro Tokumaru
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of TW200802311A publication Critical patent/TW200802311A/zh
Application granted granted Critical
Publication of TWI401670B publication Critical patent/TWI401670B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B20/182—Testing using test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B2020/10916—Seeking data on the record carrier for preparing an access to a specific address
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B2020/1823—Testing wherein a flag is set when errors are detected or qualified
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00—Record carriers by type
    • G11B2220/20—Disc-shaped record carriers
    • G11B2220/25—Disc-shaped record carriers characterised in that the disc is based on a specific recording technology
    • G11B2220/2508—Magnetic discs
    • G11B2220/2516—Hard disks
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
    • G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
    • G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer
TW096115690A 2006-05-22 2007-05-03 檢測圓周方向之刮傷缺陷的方法、及磁碟驗證器 TWI401670B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006141376 2006-05-22

Publications (2)

Publication Number Publication Date
TW200802311A true TW200802311A (en) 2008-01-01
TWI401670B TWI401670B (zh) 2013-07-11

Family

ID=38713297

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096115690A TWI401670B (zh) 2006-05-22 2007-05-03 檢測圓周方向之刮傷缺陷的方法、及磁碟驗證器

Country Status (3)

Country Link
US (1) US7903361B2 (zh)
CN (1) CN101079303B (zh)
TW (1) TWI401670B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5170015B2 (ja) * 2009-06-29 2013-03-27 ティアック株式会社 ディスク検査装置
US8149528B1 (en) 2009-09-02 2012-04-03 Western Digital Technologies, Inc. Disk drive connecting defect shapes to preempt data loss
JP2013205340A (ja) * 2012-03-29 2013-10-07 Hitachi High-Technologies Corp ディスク表面検査方法及びその装置
JP2013210241A (ja) * 2012-03-30 2013-10-10 Hitachi High-Technologies Corp ディスク表面検査方法及びその装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3142852B2 (ja) * 1990-02-20 2001-03-07 株式会社日立製作所 表面欠陥検査装置
JP3042945B2 (ja) * 1993-07-07 2000-05-22 富士通株式会社 画像抽出装置
JP3562617B2 (ja) 1997-01-31 2004-09-08 日立ハイテク電子エンジニアリング株式会社 Ｍｒヘッドのオフセツト補正方法および磁気ディスクサーティファイア
JPH10221272A (ja) * 1997-02-03 1998-08-21 Mitsubishi Chem Corp 磁気ディスクの検査方法及び装置
KR100224752B1 (ko) * 1997-06-11 1999-10-15 윤종용 표적 추적 방법 및 장치
JP2000057501A (ja) 1998-08-11 2000-02-25 Hitachi Electron Eng Co Ltd 磁気ディスク欠陥検査方法および磁気ディスクサーテファイア
JP2000057502A (ja) 1998-08-11 2000-02-25 Hitachi Electron Eng Co Ltd 磁気ディスクサーテファイア
US6791778B2 (en) * 2000-09-14 2004-09-14 Samsung Electronics Co., Inc. Method and apparatus to detect and manage servo sectors with defect on servo pattern area in hard disk drives
US6599128B2 (en) * 2001-08-21 2003-07-29 Ronald J. Roberts Game for training of managers
US20030075867A1 (en) * 2001-10-23 2003-04-24 Roberts Ronald J. Board game
JP2004071045A (ja) * 2002-08-06 2004-03-04 Sony Corp デフェクト検出装置、デフェクト検出方法
CN1673991A (zh) * 2004-03-24 2005-09-28 力晶半导体股份有限公司 一种缺陷控制方法
JP2006085789A (ja) * 2004-09-15 2006-03-30 Hitachi Global Storage Technologies Netherlands Bv 磁気ディスクの欠陥登録の方法及び磁気ディスク装置
JP2006236519A (ja) * 2005-02-28 2006-09-07 Hitachi Global Storage Technologies Netherlands Bv 磁気ディスク装置

Also Published As

Publication number Publication date
CN101079303B (zh) 2012-03-21
US7903361B2 (en) 2011-03-08
TWI401670B (zh) 2013-07-11
CN101079303A (zh) 2007-11-28
US20070271487A1 (en) 2007-11-22

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees