TW200741939A - Substrate placing stand and substrate treatment apparatus - Google Patents
Substrate placing stand and substrate treatment apparatusInfo
- Publication number
- TW200741939A TW200741939A TW096108977A TW96108977A TW200741939A TW 200741939 A TW200741939 A TW 200741939A TW 096108977 A TW096108977 A TW 096108977A TW 96108977 A TW96108977 A TW 96108977A TW 200741939 A TW200741939 A TW 200741939A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- placing stand
- main body
- stand main
- pin
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
To provide a substrate placing stand hardly causing a damage to a placing stand main body due to up-and-down pins. The substrate placing stand 4 for placing a substrate in substrate treatment is provided with the placing stand main body 4a and the up-and-down pins 30 which are inserted vertically with respect to the placing stand main body 4a, are disposed freely vertically movably so as to project and withdraw with respect to the surface of the placing stand main body 4a and moves vertically the substrate while supporting the substrate with top ends of the pins. Each of the up-and-down pins 30 can take a withdrawal position into which the pin withdraws and a support position at which the pin supports the substrate G by being projected from the placing stand main body 4a and, in the support position, the pin has a breaking part 35 which breaks when a force in the lateral direction having a prescribed extent less than such a force as to deform the up-and-down pin 30 is applied on the surface position of the placing stand main body 4a or on the upper side position thereof.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006073288 | 2006-03-16 | ||
JP2007008862A JP5219377B2 (en) | 2006-03-16 | 2007-01-18 | Substrate mounting table and substrate processing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741939A true TW200741939A (en) | 2007-11-01 |
TWI434363B TWI434363B (en) | 2014-04-11 |
Family
ID=38679435
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096108977A TWI434363B (en) | 2006-03-16 | 2007-03-15 | A substrate stage and a substrate processing device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5219377B2 (en) |
KR (1) | KR100854802B1 (en) |
TW (1) | TWI434363B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI576956B (en) * | 2014-01-20 | 2017-04-01 | Asml荷蘭公司 | Substrate holder, support table for a lithographic apparatus, lithographic apparatus and device manufacturing method |
CN110473759A (en) * | 2018-05-10 | 2019-11-19 | 东京毅力科创株式会社 | Mounting table and plasma processing apparatus |
TWI800573B (en) * | 2017-12-21 | 2023-05-01 | 日商東京威力科創股份有限公司 | Substrate support member, substrate processing device, and substrate transfer device |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4482535B2 (en) * | 2006-03-24 | 2010-06-16 | 日本碍子株式会社 | Heating device |
KR102411747B1 (en) * | 2013-10-30 | 2022-06-22 | 가부시키가이샤 니콘 | Substrate-holding apparatus, exposure apparatus, and device manufacturing method |
CN103811332B (en) * | 2014-02-14 | 2016-05-25 | 北京京东方显示技术有限公司 | A kind of lower electrode base station and dry etching equipment of dry etching equipment |
KR101738986B1 (en) * | 2015-12-07 | 2017-05-24 | 주식회사 디엠에스 | Substrate Processing Apparatus including Lift pin assembly |
JP6592394B2 (en) * | 2016-04-21 | 2019-10-16 | 東京エレクトロン株式会社 | Maintenance method of plasma processing apparatus |
KR102030471B1 (en) | 2017-07-25 | 2019-10-14 | 세메스 주식회사 | Lift pin unit and Unit for supporting substrate |
US10784142B2 (en) | 2018-01-09 | 2020-09-22 | Varian Semiconductor Equipment Associates, Inc. | Lift pin system for wafer handling |
KR20210054112A (en) * | 2019-11-04 | 2021-05-13 | 삼성디스플레이 주식회사 | Deposition apparatus and method of processing substrate using the same |
JP2024014096A (en) | 2022-07-21 | 2024-02-01 | 東京エレクトロン株式会社 | Board support structure and substrate processing apparatus |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4490524B2 (en) * | 1999-08-10 | 2010-06-30 | キヤノンアネルバ株式会社 | Electrostatic adsorption stage and substrate processing apparatus |
JP2002093890A (en) * | 2000-09-19 | 2002-03-29 | Olympus Optical Co Ltd | Lift pin and stage device |
KR20040031289A (en) * | 2002-10-04 | 2004-04-13 | 삼성전자주식회사 | Wafer lifting device of semiconductor manufacturing equipment |
JP4594020B2 (en) * | 2004-07-29 | 2010-12-08 | 京セラ株式会社 | Pin elevator and plate chuck device using the same |
KR20060130966A (en) * | 2005-06-14 | 2006-12-20 | 삼성전자주식회사 | A lift pin |
-
2007
- 2007-01-18 JP JP2007008862A patent/JP5219377B2/en active Active
- 2007-03-15 TW TW096108977A patent/TWI434363B/en active
- 2007-03-15 KR KR1020070025455A patent/KR100854802B1/en active IP Right Grant
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI576956B (en) * | 2014-01-20 | 2017-04-01 | Asml荷蘭公司 | Substrate holder, support table for a lithographic apparatus, lithographic apparatus and device manufacturing method |
TWI800573B (en) * | 2017-12-21 | 2023-05-01 | 日商東京威力科創股份有限公司 | Substrate support member, substrate processing device, and substrate transfer device |
CN110473759A (en) * | 2018-05-10 | 2019-11-19 | 东京毅力科创株式会社 | Mounting table and plasma processing apparatus |
CN110473759B (en) * | 2018-05-10 | 2024-04-16 | 东京毅力科创株式会社 | Stage and plasma processing apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP5219377B2 (en) | 2013-06-26 |
JP2007277702A (en) | 2007-10-25 |
TWI434363B (en) | 2014-04-11 |
KR100854802B1 (en) | 2008-08-27 |
KR20070094503A (en) | 2007-09-20 |
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