TW200728746A - IC probe card (2) - Google Patents
IC probe card (2)Info
- Publication number
- TW200728746A TW200728746A TW095103553A TW95103553A TW200728746A TW 200728746 A TW200728746 A TW 200728746A TW 095103553 A TW095103553 A TW 095103553A TW 95103553 A TW95103553 A TW 95103553A TW 200728746 A TW200728746 A TW 200728746A
- Authority
- TW
- Taiwan
- Prior art keywords
- electrical signal
- plane
- adapting
- signal transfer
- slanting
- Prior art date
Links
Abstract
An IC probe card consists of several contact soldering points and a probe set that has an electrical signal transfer board and plural probes. The electrical signal transfer board defines electrically conducted first electrical signal plane and the opposite second electrical signal plane. Each probe is electrically conducted with the first electrical signal plane, and the second electrical signal plane is electrically conducted with the contact soldering points. At least a fix turn direction component has a adapting unit and a operation unit. The adapting unit is composed by a propping part and a fix connection part. One end of the propping part connects the second electrical signal plane and the other end connects the circuit board. The fix connection part clips and fastens the propping part on the circuit board. The operation unit that is composed by a first strain block and a second strain block attached the first strain block is put between the adapting unit and circuit board. When slanting happens due to the planes of the electrical signal transfer board unparallel with the substrate plane, mutual shift of the first and second strain blocks can compensate the gap resulted from angle slanting error of two planes, and then the adapting part can be stably fastened on the substrate without be influenced by the plane slanting. The adapting part is exactly fastened on the substrate, so the electrical signal transfer board can be propped at preset horizontal position without changing position or distorting by external force.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95103553A TWI282429B (en) | 2006-01-27 | 2006-01-27 | An integrated circuit test card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95103553A TWI282429B (en) | 2006-01-27 | 2006-01-27 | An integrated circuit test card |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI282429B TWI282429B (en) | 2007-06-11 |
TW200728746A true TW200728746A (en) | 2007-08-01 |
Family
ID=38823723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95103553A TWI282429B (en) | 2006-01-27 | 2006-01-27 | An integrated circuit test card |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI282429B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI409463B (en) * | 2009-10-23 | 2013-09-21 | King Yuan Electronics Co Ltd | Probe card and structure reinforced test scoket therein |
CN103369812B (en) * | 2012-04-02 | 2016-06-29 | 汕头凯星印制板有限公司 | Printed circuit board (PCB) |
CN105004888B (en) * | 2014-11-10 | 2017-11-24 | 成都振芯科技股份有限公司 | A kind of adjustable integrated circuit measurement jig |
-
2006
- 2006-01-27 TW TW95103553A patent/TWI282429B/en active
Also Published As
Publication number | Publication date |
---|---|
TWI282429B (en) | 2007-06-11 |
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