TW200718918A - Apparatus and method of measuring the structure changes of a heat spreader during variational temperature conditions - Google Patents

Apparatus and method of measuring the structure changes of a heat spreader during variational temperature conditions

Info

Publication number
TW200718918A
TW200718918A TW094138817A TW94138817A TW200718918A TW 200718918 A TW200718918 A TW 200718918A TW 094138817 A TW094138817 A TW 094138817A TW 94138817 A TW94138817 A TW 94138817A TW 200718918 A TW200718918 A TW 200718918A
Authority
TW
Taiwan
Prior art keywords
variational
measuring
heat spreader
structure changes
temperature conditions
Prior art date
Application number
TW094138817A
Other languages
Chinese (zh)
Other versions
TWI358526B (en
Inventor
Chun-Yi Chang
Bor-Yuan Hsiao
Tsai-Shih Tung
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW94138817A priority Critical patent/TWI358526B/en
Publication of TW200718918A publication Critical patent/TW200718918A/en
Application granted granted Critical
Publication of TWI358526B publication Critical patent/TWI358526B/en

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Die Bonding (AREA)

Abstract

An apparatus includes a base, a heating device, a heat sink, a control system and an atomic force microscope. The atomic force microscope has a detecting pin. The control system includes a temperature detecting part and a temperature controlling part. The temperature detecting part is connected with the base. The temperature controlling part is simultaneity connected with the heating device and the heat sink. The present invention also provides a method of measuring the structure changes of a heat spreader during variational temperature conditions.
TW94138817A 2005-11-04 2005-11-04 Apparatus and method of measuring the structure ch TWI358526B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94138817A TWI358526B (en) 2005-11-04 2005-11-04 Apparatus and method of measuring the structure ch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94138817A TWI358526B (en) 2005-11-04 2005-11-04 Apparatus and method of measuring the structure ch

Publications (2)

Publication Number Publication Date
TW200718918A true TW200718918A (en) 2007-05-16
TWI358526B TWI358526B (en) 2012-02-21

Family

ID=46728184

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94138817A TWI358526B (en) 2005-11-04 2005-11-04 Apparatus and method of measuring the structure ch

Country Status (1)

Country Link
TW (1) TWI358526B (en)

Also Published As

Publication number Publication date
TWI358526B (en) 2012-02-21

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees