TW200709323A - A tool for stretching the foil of a foil carrier, a machine for removing dies from a wafer and a method for removing dies - Google Patents

A tool for stretching the foil of a foil carrier, a machine for removing dies from a wafer and a method for removing dies

Info

Publication number
TW200709323A
TW200709323A TW095121070A TW95121070A TW200709323A TW 200709323 A TW200709323 A TW 200709323A TW 095121070 A TW095121070 A TW 095121070A TW 95121070 A TW95121070 A TW 95121070A TW 200709323 A TW200709323 A TW 200709323A
Authority
TW
Taiwan
Prior art keywords
foil
stretching
tool
removing dies
machine
Prior art date
Application number
TW095121070A
Other languages
English (en)
Inventor
Beuningen Gerardus Wilhelmus Maria Van
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of TW200709323A publication Critical patent/TW200709323A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B28—WORKING CEMENT, CLAY, OR STONE
    • B28D—WORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
    • B28D5/0052—Means for supporting or holding work during breaking
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T225/00—Severing by tearing or breaking
    • Y10T225/30—Breaking or tearing apparatus
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T225/00—Severing by tearing or breaking
    • Y10T225/30—Breaking or tearing apparatus
    • Y10T225/371—Movable breaking tool
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T225/00—Severing by tearing or breaking
    • Y10T225/30—Breaking or tearing apparatus
    • Y10T225/371—Movable breaking tool
    • Y10T225/379—Breaking tool intermediate spaced work supports
    • Y10T225/386—Clamping supports
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/53683—Spreading parts apart or separating them from face to face engagement

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Shaping By String And By Release Of Stress In Plastics And The Like (AREA)
  • Die Bonding (AREA)
TW095121070A 2005-06-16 2006-06-13 A tool for stretching the foil of a foil carrier, a machine for removing dies from a wafer and a method for removing dies TW200709323A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05105326 2005-06-16

Publications (1)

Publication Number Publication Date
TW200709323A true TW200709323A (en) 2007-03-01

Family

ID=37307440

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095121070A TW200709323A (en) 2005-06-16 2006-06-13 A tool for stretching the foil of a foil carrier, a machine for removing dies from a wafer and a method for removing dies

Country Status (6)

Country Link
US (1) US20080196229A1 (zh)
EP (1) EP1893392A2 (zh)
JP (1) JP2008544516A (zh)
CN (1) CN101198450A (zh)
TW (1) TW200709323A (zh)
WO (1) WO2006134532A2 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8746669B2 (en) 2008-02-08 2014-06-10 Panasonic Corporation Chip supply pallet and chip supply apparatus
US20100252601A1 (en) * 2009-04-07 2010-10-07 Richard Thibault Drywall splitter
US20140151426A1 (en) * 2012-12-04 2014-06-05 Richard Thibeault Drywall splitter
TWI543833B (zh) 2013-01-28 2016-08-01 先進科技新加坡有限公司 將半導體基板輻射開槽之方法
TWI561327B (en) 2013-10-16 2016-12-11 Asm Tech Singapore Pte Ltd Laser scribing apparatus comprising adjustable spatial filter and method for etching semiconductor substrate
DE112014006024T5 (de) * 2013-12-27 2016-09-15 Asahi Glass Company, Limited Verfahren zur Verarbeitung einer zerbrechlichen Platte und Vorrichtung zur Verarbeitung einer zerbrechlichen Platte
US10008397B2 (en) * 2014-09-05 2018-06-26 Nexperia B.V. Pneumatic wafer expansion
US10192773B2 (en) 2016-06-20 2019-01-29 Nexperia B.V. Semiconductor device positioning system and method for semiconductor device positioning

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3562058A (en) * 1967-05-16 1971-02-09 Texas Instruments Inc Method for breaking and separating substrate material
GB1243346A (en) * 1968-11-29 1971-08-18 Associated Semiconductor Mft Improvements in and relating to methods of separating into pieces plates of material
US3727282A (en) * 1970-02-05 1973-04-17 Burroughs Corp Semiconductor handling apparatus
JPS60249346A (ja) * 1984-05-24 1985-12-10 Nec Kansai Ltd 半導体ウエ−ハ引き伸ばし方法
US4744550A (en) * 1986-04-24 1988-05-17 Asm America, Inc. Vacuum wafer expander apparatus
JPH03177051A (ja) * 1989-12-05 1991-08-01 Kawasaki Steel Corp 半導体ウエハの切断方法およびその装置
US5310104A (en) * 1991-12-16 1994-05-10 General Electric Company Method and apparatus for cleaving a semiconductor wafer into individual die and providing for low stress die removal
SG74007A1 (en) * 1994-07-20 2000-07-18 Loomis Ind Inc Apparatus and method for dicing semiconductor wafers
US5710065A (en) * 1995-01-03 1998-01-20 Texas Instruments Incorporated Method and apparatus for breaking and separating dies from a wafer
FR2749794B1 (fr) * 1996-06-13 1998-07-31 Charil Josette Dispositif de clivage d'une plaque de materiau semi-conducteur
US6184063B1 (en) * 1996-11-26 2001-02-06 Texas Instruments Incorporated Method and apparatus for breaking and separating a wafer into die using a multi-radii dome
US6246251B1 (en) * 1998-04-24 2001-06-12 International Rectifier Corp. Test process and apparatus for testing singulated semiconductor die
US6658073B1 (en) * 1999-12-03 2003-12-02 Koninklijke Philips Electronics N.V. Method and system for reducing jitter on constant rate data transfer between asynchronous systems
US6543513B1 (en) * 2000-11-27 2003-04-08 Asm Assembly Automation Ltd. Wafer table for die bonding apparatus
JP2004146727A (ja) * 2002-10-28 2004-05-20 Tokyo Seimitsu Co Ltd ウェーハの搬送方法
KR101151023B1 (ko) * 2002-10-28 2012-05-30 가부시키가이샤 토쿄 세이미쯔 익스팬드방법 및 익스팬드장치
JP4526561B2 (ja) * 2004-03-22 2010-08-18 ジングルス・テヒノロギース・アクチェンゲゼルシャフト ディスク型基板を分離するための方法および器具
US7736945B2 (en) * 2005-06-09 2010-06-15 Philips Lumileds Lighting Company, Llc LED assembly having maximum metal support for laser lift-off of growth substrate
US7198988B1 (en) * 2005-11-16 2007-04-03 Emcore Corporation Method for eliminating backside metal peeling during die separation

Also Published As

Publication number Publication date
WO2006134532A2 (en) 2006-12-21
CN101198450A (zh) 2008-06-11
WO2006134532A3 (en) 2007-03-08
US20080196229A1 (en) 2008-08-21
EP1893392A2 (en) 2008-03-05
JP2008544516A (ja) 2008-12-04

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