TW200707523A - Integrated circuit device testing carrier - Google Patents

Integrated circuit device testing carrier

Info

Publication number
TW200707523A
TW200707523A TW094126517A TW94126517A TW200707523A TW 200707523 A TW200707523 A TW 200707523A TW 094126517 A TW094126517 A TW 094126517A TW 94126517 A TW94126517 A TW 94126517A TW 200707523 A TW200707523 A TW 200707523A
Authority
TW
Taiwan
Prior art keywords
circuit board
base
integrated circuit
holder body
base plates
Prior art date
Application number
TW094126517A
Other languages
Chinese (zh)
Other versions
TWI258179B (en
Inventor
Ming-Lang Tsai
ji-zheng Lin
Original Assignee
Taiwan Ic Packaging Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Ic Packaging Corp filed Critical Taiwan Ic Packaging Corp
Priority to TW94126517A priority Critical patent/TWI258179B/en
Application granted granted Critical
Publication of TWI258179B publication Critical patent/TWI258179B/en
Publication of TW200707523A publication Critical patent/TW200707523A/en

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention relates to an integrated circuit (IC) device testing carrier, which includes a base, a circuit board and an assembly holder. The circuit board is disposed on the base and is electrically connected with a periphery of the base and an electrical connection element; the assembly holder contains a holder body and two base plates, the holder body is disposed on the circuit board, and a plurality of test probes are distributed over its testing area and are electrically connected with the circuit board; the two base plates are mounted on the holder body symmetrically by screws, and a channel formed between the base plates pass through the test area and a device placement slot is jointly formed to correspond to the testing area for positioning the placed device to be tested. Accordingly, a detachable assembly holder design is employed so as to target at achieving replacement of worn-out part, easy clean and maintenance and easy ventilation while a device to be tested is placed.
TW94126517A 2005-08-04 2005-08-04 Integrated circuit device testing carrier TWI258179B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94126517A TWI258179B (en) 2005-08-04 2005-08-04 Integrated circuit device testing carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94126517A TWI258179B (en) 2005-08-04 2005-08-04 Integrated circuit device testing carrier

Publications (2)

Publication Number Publication Date
TWI258179B TWI258179B (en) 2006-07-11
TW200707523A true TW200707523A (en) 2007-02-16

Family

ID=37765186

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94126517A TWI258179B (en) 2005-08-04 2005-08-04 Integrated circuit device testing carrier

Country Status (1)

Country Link
TW (1) TWI258179B (en)

Also Published As

Publication number Publication date
TWI258179B (en) 2006-07-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees