TW200706292A - Method for fine tuning circuit and controlling impedance with laser process - Google Patents

Method for fine tuning circuit and controlling impedance with laser process

Info

Publication number
TW200706292A
TW200706292A TW094127717A TW94127717A TW200706292A TW 200706292 A TW200706292 A TW 200706292A TW 094127717 A TW094127717 A TW 094127717A TW 94127717 A TW94127717 A TW 94127717A TW 200706292 A TW200706292 A TW 200706292A
Authority
TW
Taiwan
Prior art keywords
laser process
target
process equipment
laser
monitor device
Prior art date
Application number
TW094127717A
Other languages
Chinese (zh)
Other versions
TWI274618B (en
Inventor
Yi-Hsi Chen
Chih-Chuan Lin
Original Assignee
Apac Opto Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Apac Opto Electronics Inc filed Critical Apac Opto Electronics Inc
Priority to TW94127717A priority Critical patent/TWI274618B/en
Publication of TW200706292A publication Critical patent/TW200706292A/en
Application granted granted Critical
Publication of TWI274618B publication Critical patent/TWI274618B/en

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  • Laser Beam Processing (AREA)

Abstract

A method for actively controlling he fine-tuning and impedance matching using a laser process is provided, including the use of a laser process equipment, a monitor device, and a feedback controller. The laser process equipment is for performing laser soldering or laser etching. The monitor device is for monitoring the target metrics of the target circuits. The feedback controller is for receiving the feedback from the monitor device and issuing control signals to the laser process equipment. The method includes the following steps: (a) loading the target high frequency circuit to the laser process equipment for laser process; (b) monitoring the impedance of the circuit or the transmission/reflection signals and outputting a measured value; (c) determining whether the measured value equal to target value, computing an error signal as the difference between measured value and target value; if not, sending control signals to laser process equipment according to the error signal and proceeding to step (d), otherwise, proceeding to step (e); (d) performing the laser process on the target circuit according to the control signal, returning to step (c); and (e) unloading the target high frequency circuit from the laser process equipment.
TW94127717A 2005-08-15 2005-08-15 Method for fine tuning circuit and controlling impedance with laser process TWI274618B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94127717A TWI274618B (en) 2005-08-15 2005-08-15 Method for fine tuning circuit and controlling impedance with laser process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94127717A TWI274618B (en) 2005-08-15 2005-08-15 Method for fine tuning circuit and controlling impedance with laser process

Publications (2)

Publication Number Publication Date
TW200706292A true TW200706292A (en) 2007-02-16
TWI274618B TWI274618B (en) 2007-03-01

Family

ID=38624065

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94127717A TWI274618B (en) 2005-08-15 2005-08-15 Method for fine tuning circuit and controlling impedance with laser process

Country Status (1)

Country Link
TW (1) TWI274618B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI480115B (en) * 2013-03-08 2015-04-11 Univ Minghsin Sci & Tech Laser etching device and etching method thereof
TWI738558B (en) * 2020-11-03 2021-09-01 上儀股份有限公司 Laser system with reduced welding spatter and method of using the same

Also Published As

Publication number Publication date
TWI274618B (en) 2007-03-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees