TW200644735A - Transient pulse, substrate-triggered bicmos rail clamp for ESD abatement - Google Patents

Transient pulse, substrate-triggered bicmos rail clamp for ESD abatement

Info

Publication number
TW200644735A
TW200644735A TW095115478A TW95115478A TW200644735A TW 200644735 A TW200644735 A TW 200644735A TW 095115478 A TW095115478 A TW 095115478A TW 95115478 A TW95115478 A TW 95115478A TW 200644735 A TW200644735 A TW 200644735A
Authority
TW
Taiwan
Prior art keywords
esd
bicmos
abatement
triggered
substrate
Prior art date
Application number
TW095115478A
Other languages
English (en)
Inventor
Nathaniel M Peachey
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of TW200644735A publication Critical patent/TW200644735A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0259—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using bipolar transistors as protective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
TW095115478A 2005-05-06 2006-05-01 Transient pulse, substrate-triggered bicmos rail clamp for ESD abatement TW200644735A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/123,305 US20060250732A1 (en) 2005-05-06 2005-05-06 Transient pulse, substrate-triggered biCMOS rail clamp for ESD abatement

Publications (1)

Publication Number Publication Date
TW200644735A true TW200644735A (en) 2006-12-16

Family

ID=37393807

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095115478A TW200644735A (en) 2005-05-06 2006-05-01 Transient pulse, substrate-triggered bicmos rail clamp for ESD abatement

Country Status (3)

Country Link
US (1) US20060250732A1 (zh)
TW (1) TW200644735A (zh)
WO (1) WO2006121565A1 (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI506908B (zh) * 2014-01-15 2015-11-01 Nanya Technology Corp 暫態電壓抑制器
CN105470250A (zh) * 2014-09-25 2016-04-06 亚德诺半导体集团 过电压保护设备及方法
US10043792B2 (en) 2009-11-04 2018-08-07 Analog Devices, Inc. Electrostatic protection device
US10181719B2 (en) 2015-03-16 2019-01-15 Analog Devices Global Overvoltage blocking protection device

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US8022498B1 (en) * 2007-03-26 2011-09-20 Synopsys, Inc. Electrostatic discharge management apparatus, systems, and methods
US20080285741A1 (en) * 2007-05-16 2008-11-20 Uniden Corporation Telephone interface circuit
US20080316659A1 (en) * 2007-06-19 2008-12-25 Ismail Hakki Oguzman High voltage esd protection featuring pnp bipolar junction transistor
US20090059451A1 (en) * 2007-09-04 2009-03-05 Hejian Technology (Suzhou) Co., Ltd. Esd protection circuit with improved coupling capacitor
US7876540B2 (en) * 2007-11-21 2011-01-25 Microchip Technology Incorporated Adaptive electrostatic discharge (ESD) protection of device interface for local interconnect network (LIN) bus and the like
AU2009268619B2 (en) * 2008-07-11 2013-08-22 William R. Benner Jr. Fault protector for opto-electronic devices and associated methods
US8040645B2 (en) * 2008-08-12 2011-10-18 Qualcomm Incorporated System and method for excess voltage protection in a multi-die package
US8411848B2 (en) * 2008-11-11 2013-04-02 Uniden Corporation Telephone interface circuit for providing over-current and over-voltage protection
DE102009015839B4 (de) * 2009-04-01 2019-07-11 Austriamicrosystems Ag Integrierte ESD-Schutzschaltung
DE102010006525B4 (de) * 2010-02-01 2012-02-09 Phoenix Contact Gmbh & Co. Kg Vorrichtung zum Ableiten von Stoßströmen oder transienten Überspannungen
CN102386620B (zh) * 2010-09-01 2015-07-15 旺宏电子股份有限公司 静电放电保护装置与方法
US8305721B2 (en) * 2010-09-08 2012-11-06 Macronix International Co., Ltd. Electrostatic discharge protection device and method thereof
US10199482B2 (en) 2010-11-29 2019-02-05 Analog Devices, Inc. Apparatus for electrostatic discharge protection
DE102011109596B4 (de) 2011-08-05 2018-05-09 Austriamicrosystems Ag Schaltungsanordnung zum Schutz gegen elektrostatische Entladungen
US8699189B2 (en) 2012-05-22 2014-04-15 Honeywell International Inc. High precision clipping regulator circuit
EP2690783A1 (en) * 2012-07-27 2014-01-29 Nxp B.V. BiCMOS electrostatic discharge protection circuit
US9466599B2 (en) * 2013-09-18 2016-10-11 Nxp B.V. Static current in IO for ultra-low power applications
US10256224B2 (en) * 2014-05-16 2019-04-09 Sharp Kabushiki Kaisha Multiple-unit semiconductor device

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DE69029271T2 (de) * 1990-12-21 1997-04-17 Sgs Thomson Microelectronics Schutzvorrichtung gegen elektrostatische Entladung für einen IC-Anschluss und deren integrierte Struktur
US5276582A (en) * 1992-08-12 1994-01-04 National Semiconductor Corporation ESD protection using npn bipolar transistor
US5528188A (en) * 1995-03-13 1996-06-18 International Business Machines Corporation Electrostatic discharge suppression circuit employing low-voltage triggering silicon-controlled rectifier
US5559659A (en) * 1995-03-23 1996-09-24 Lucent Technologies Inc. Enhanced RC coupled electrostatic discharge protection
US5631793A (en) * 1995-09-05 1997-05-20 Winbond Electronics Corporation Capacitor-couple electrostatic discharge protection circuit
US5777510A (en) * 1996-02-21 1998-07-07 Integrated Device Technology, Inc. High voltage tolerable pull-up driver and method for operating same
US5850095A (en) * 1996-09-24 1998-12-15 Texas Instruments Incorporated ESD protection circuit using zener diode and interdigitated NPN transistor
US5959488A (en) * 1998-01-24 1999-09-28 Winbond Electronics Corp. Dual-node capacitor coupled MOSFET for improving ESD performance
US5946177A (en) * 1998-08-17 1999-08-31 Motorola, Inc. Circuit for electrostatic discharge protection
US6501632B1 (en) * 1999-08-06 2002-12-31 Sarnoff Corporation Apparatus for providing high performance electrostatic discharge protection
US6442008B1 (en) * 1999-11-29 2002-08-27 Compaq Information Technologies Group, L.P. Low leakage clamp for E.S.D. protection
US6650165B1 (en) * 2002-05-02 2003-11-18 Micrel, Incorporated Localized electrostatic discharge protection for integrated circuit input/output pads
US7106568B2 (en) * 2004-08-27 2006-09-12 United Microelectronics Corp. Substrate-triggered ESD circuit by using triple-well

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10043792B2 (en) 2009-11-04 2018-08-07 Analog Devices, Inc. Electrostatic protection device
TWI506908B (zh) * 2014-01-15 2015-11-01 Nanya Technology Corp 暫態電壓抑制器
US9438034B2 (en) 2014-01-15 2016-09-06 Nanya Technology Corporation Transient voltage suppressor
CN105470250A (zh) * 2014-09-25 2016-04-06 亚德诺半导体集团 过电压保护设备及方法
CN105470250B (zh) * 2014-09-25 2022-10-28 亚德诺半导体国际无限责任公司 过电压保护设备及方法
US10181719B2 (en) 2015-03-16 2019-01-15 Analog Devices Global Overvoltage blocking protection device

Also Published As

Publication number Publication date
WO2006121565A1 (en) 2006-11-16
US20060250732A1 (en) 2006-11-09

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