TW200638054A - Method and system for performing installation and configuration management of tester instrument modules - Google Patents

Method and system for performing installation and configuration management of tester instrument modules

Info

Publication number
TW200638054A
TW200638054A TW094142344A TW94142344A TW200638054A TW 200638054 A TW200638054 A TW 200638054A TW 094142344 A TW094142344 A TW 094142344A TW 94142344 A TW94142344 A TW 94142344A TW 200638054 A TW200638054 A TW 200638054A
Authority
TW
Taiwan
Prior art keywords
versions
tos
software components
test module
modular
Prior art date
Application number
TW094142344A
Other languages
English (en)
Other versions
TWI383166B (zh
Inventor
Ankan Pramanick
Jim Hanrahan
Mark Elston
Toshiaki Adachi
Leon Lee Chen
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200638054A publication Critical patent/TW200638054A/zh
Application granted granted Critical
Publication of TWI383166B publication Critical patent/TWI383166B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/61—Installation
TW094142344A 2004-12-09 2005-12-01 執行測試儀器模組安裝與組態管理的方法與系統 TWI383166B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US63509404P 2004-12-09 2004-12-09
US11/100,109 US8082541B2 (en) 2004-12-09 2005-04-05 Method and system for performing installation and configuration management of tester instrument modules

Publications (2)

Publication Number Publication Date
TW200638054A true TW200638054A (en) 2006-11-01
TWI383166B TWI383166B (zh) 2013-01-21

Family

ID=35911084

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094142344A TWI383166B (zh) 2004-12-09 2005-12-01 執行測試儀器模組安裝與組態管理的方法與系統

Country Status (7)

Country Link
US (1) US8082541B2 (zh)
EP (1) EP1820036A1 (zh)
JP (2) JP4302736B2 (zh)
KR (1) KR20070106692A (zh)
CN (1) CN101073016B (zh)
TW (1) TWI383166B (zh)
WO (1) WO2006062252A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI476586B (zh) * 2011-07-13 2015-03-11 Inst Information Industry 以雲端技術為基礎之測試系統、方法以及其電腦可讀取記錄媒體
TWI493465B (zh) * 2011-07-28 2015-07-21 Yahoo Inc 分配式應用程式堆疊與部署方法及系統

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8214800B2 (en) * 2005-03-02 2012-07-03 Advantest Corporation Compact representation of vendor hardware module revisions in an open architecture test system
US7930693B2 (en) * 2005-04-04 2011-04-19 Cisco Technology, Inc. Method and system for accessing and launching a java based applet as a locally installed application
US7877350B2 (en) 2005-06-27 2011-01-25 Ab Initio Technology Llc Managing metadata for graph-based computations
US20070074202A1 (en) * 2005-09-27 2007-03-29 International Business Machines Corporation Program product installation
US7730452B1 (en) * 2005-11-01 2010-06-01 Hewlett-Packard Development Company, L.P. Testing a component of a distributed system
US7849362B2 (en) * 2005-12-09 2010-12-07 International Business Machines Corporation Method and system of coherent design verification of inter-cluster interactions
US20070156641A1 (en) * 2005-12-30 2007-07-05 Thomas Mueller System and method to provide system independent configuration references
US7877680B2 (en) * 2007-03-20 2011-01-25 International Business Machines Corporation Auto-generation and auto-versioning of a multi-sourced dynamic document
US8423831B2 (en) * 2006-07-11 2013-04-16 Oracle America, Inc. System and method for performing auditing and correction
US20080172652A1 (en) * 2007-01-15 2008-07-17 Microsoft Corporation Identifying Redundant Test Cases
US20080172655A1 (en) * 2007-01-15 2008-07-17 Microsoft Corporation Saving Code Coverage Data for Analysis
US20080172651A1 (en) * 2007-01-15 2008-07-17 Microsoft Corporation Applying Function Level Ownership to Test Metrics
US20080172580A1 (en) * 2007-01-15 2008-07-17 Microsoft Corporation Collecting and Reporting Code Coverage Data
US7844602B2 (en) * 2007-01-19 2010-11-30 Healthline Networks, Inc. Method and system for establishing document relevance
CN101441595B (zh) * 2007-11-21 2010-11-03 英业达股份有限公司 负载监控装置及测试装置及负载监控方法及测试方法
US8219349B1 (en) * 2007-12-21 2012-07-10 Intermolecular, Inc. Test management system
US7680615B2 (en) * 2008-01-25 2010-03-16 Azurewave Technologies, Inc. Parallel testing system with shared golden calibration table and method thereof
CN105843684B (zh) 2009-02-13 2020-03-03 起元技术有限责任公司 管理任务执行
US9680964B2 (en) * 2009-03-11 2017-06-13 Microsoft Technology Licensing, Llc Programming model for installing and distributing occasionally connected applications
US8413139B2 (en) * 2009-03-11 2013-04-02 Microsoft Corporation Programming model for application and data access and synchronization within virtual environments
US8812451B2 (en) 2009-03-11 2014-08-19 Microsoft Corporation Programming model for synchronizing browser caches across devices and web services
EP2237125A1 (en) * 2009-03-31 2010-10-06 Siemens Aktiengesellschaft Method of monitoring an analyser connected to a communications network in an industrial automation system and industrial automation system
KR101231746B1 (ko) * 2009-12-18 2013-02-08 한국전자통신연구원 ＳａａＳ 환경에서의 소프트웨어 개발 시스템
WO2011159759A1 (en) 2010-06-15 2011-12-22 Ab Initio Technology Llc Dynamically loading graph-based computations
CN103165405A (zh) * 2011-01-27 2013-06-19 北京确安科技股份有限公司 一种通过gpib接口实时生成多维变量密码方法
US20120198436A1 (en) * 2011-01-27 2012-08-02 Preimesberger Lee A Compatible Operating System
US8839057B2 (en) * 2011-02-03 2014-09-16 Arm Limited Integrated circuit and method for testing memory on the integrated circuit
US9116725B1 (en) * 2011-03-15 2015-08-25 Symantec Corporation Systems and methods for using virtualization of operating-system-level components to facilitate software testing
KR101056682B1 (ko) 2011-04-08 2011-08-12 국방과학연구소 컴포넌트 기반의 무기체계 시뮬레이션 시스템 및 시뮬레이션 방법
US8745590B2 (en) * 2011-05-19 2014-06-03 Verizon Patent And Licensing Inc. Testing an application
TW201324354A (zh) * 2011-12-12 2013-06-16 Wistron Corp 自動化連續安裝作業系統的方法
JP5816144B2 (ja) * 2012-08-30 2015-11-18 株式会社アドバンテスト テストプログラムおよび試験システム
CN102866348A (zh) * 2012-09-23 2013-01-09 成都市中州半导体科技有限公司 集成电路测试数据查询系统及查询方法
US9507682B2 (en) 2012-11-16 2016-11-29 Ab Initio Technology Llc Dynamic graph performance monitoring
US10108521B2 (en) 2012-11-16 2018-10-23 Ab Initio Technology Llc Dynamic component performance monitoring
US9632764B2 (en) * 2012-12-31 2017-04-25 Oracle International Corporation Defining configurable characteristics of a product and associating configuration with enterprise resources
US9274926B2 (en) * 2013-01-03 2016-03-01 Ab Initio Technology Llc Configurable testing of computer programs
US9218273B2 (en) 2013-05-20 2015-12-22 International Business Machines Corporation Automatic generation of a resource reconfiguring test
EP3092557B1 (en) 2013-12-05 2024-03-27 AB Initio Technology LLC Managing interfaces for dataflow graphs composed of sub-graphs
CN105527940A (zh) * 2014-10-27 2016-04-27 北京确安科技股份有限公司 用ini文件实现测试管理系统流程控制
US9292423B1 (en) * 2015-03-11 2016-03-22 Amazon Technologies, Inc. Monitoring applications for compatibility issues
JP6561555B2 (ja) 2015-04-20 2019-08-21 富士通株式会社 情報処理装置、動作検証方法及び動作検証プログラム
US10657134B2 (en) 2015-08-05 2020-05-19 Ab Initio Technology Llc Selecting queries for execution on a stream of real-time data
WO2017112654A2 (en) 2015-12-21 2017-06-29 Ab Initio Technology Llc Sub-graph interface generation
CN105786562A (zh) * 2016-02-04 2016-07-20 百度在线网络技术（北京）有限公司 一种集成插件的方法和装置
CN107577570A (zh) * 2017-09-19 2018-01-12 郑州云海信息技术有限公司 一种应用设备的测试方法及装置
JP6960873B2 (ja) * 2018-03-16 2021-11-05 東京エレクトロン株式会社 半導体製造システム及びサーバ装置
US10430321B1 (en) * 2018-08-21 2019-10-01 International Business Machines Corporation White box code concurrency testing for transaction processing
US10320625B1 (en) 2018-08-21 2019-06-11 Capital One Services, Llc Managing service deployment in a cloud computing environment
CN109376048A (zh) * 2018-12-25 2019-02-22 上海创功通讯技术有限公司 一种触摸屏的测试方法及设备
CN111913869B (zh) * 2019-05-08 2024-02-13 立端科技股份有限公司 自动测试主机操作系统的测试方法及其测试系统
TWI760691B (zh) * 2020-02-12 2022-04-11 瑞昱半導體股份有限公司 自動測試軟體相容性的方法、測試裝置與系統
US11733290B2 (en) 2020-03-31 2023-08-22 Advantest Corporation Flexible sideband support systems and methods
US11650893B2 (en) 2020-03-31 2023-05-16 Advantest Corporation Multiple name space test systems and methods
US11899550B2 (en) * 2020-03-31 2024-02-13 Advantest Corporation Enhanced auxiliary memory mapped interface test systems and methods
US11493551B2 (en) 2020-06-22 2022-11-08 Advantest Test Solutions, Inc. Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
US11549981B2 (en) 2020-10-01 2023-01-10 Advantest Test Solutions, Inc. Thermal solution for massively parallel testing
US11808812B2 (en) 2020-11-02 2023-11-07 Advantest Test Solutions, Inc. Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US11821913B2 (en) 2020-11-02 2023-11-21 Advantest Test Solutions, Inc. Shielded socket and carrier for high-volume test of semiconductor devices
US20220155364A1 (en) 2020-11-19 2022-05-19 Advantest Test Solutions, Inc. Wafer scale active thermal interposer for device testing
US11609266B2 (en) 2020-12-04 2023-03-21 Advantest Test Solutions, Inc. Active thermal interposer device
US11573262B2 (en) 2020-12-31 2023-02-07 Advantest Test Solutions, Inc. Multi-input multi-zone thermal control for device testing
US11587640B2 (en) 2021-03-08 2023-02-21 Advantest Test Solutions, Inc. Carrier based high volume system level testing of devices with pop structures
US11656273B1 (en) 2021-11-05 2023-05-23 Advantest Test Solutions, Inc. High current device testing apparatus and systems
CN115033466B (zh) * 2022-05-23 2023-04-07 珠海视熙科技有限公司 批量刷机压力测试方法及装置、存储介质、计算机设备

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5450586A (en) * 1991-08-14 1995-09-12 Hewlett-Packard Company System for analyzing and debugging embedded software through dynamic and interactive use of code markers
US5903758A (en) * 1997-02-24 1999-05-11 Sun Microsystems, Inc. Method and apparatus for auditing dynamically linked procedure calls
US5960198A (en) * 1997-03-19 1999-09-28 International Business Machines Corporation Software profiler with runtime control to enable and disable instrumented executable
US6182275B1 (en) * 1998-01-26 2001-01-30 Dell Usa, L.P. Generation of a compatible order for a computer system
US6954922B2 (en) * 1998-04-29 2005-10-11 Sun Microsystems, Inc. Method apparatus and article of manufacture for time profiling multi-threaded programs
US6381735B1 (en) * 1998-10-02 2002-04-30 Microsoft Corporation Dynamic classification of sections of software
US6895578B1 (en) * 1999-01-06 2005-05-17 Parasoft Corporation Modularizing a computer program for testing and debugging
US6662357B1 (en) * 1999-08-31 2003-12-09 Accenture Llp Managing information in an integrated development architecture framework
US6331770B1 (en) * 2000-04-12 2001-12-18 Advantest Corp. Application specific event based semiconductor test system
CN1154045C (zh) * 2000-07-25 2004-06-16 华为技术有限公司 一种跨平台的联合仿真系统
JP2002123562A (ja) * 2000-07-31 2002-04-26 Hitachi Ltd テスタ構築データの生成方法およびテスタの構築方法並びにテスト回路
TW535082B (en) * 2001-06-01 2003-06-01 Chroma Ate Inc Processing method for control and access of data with devices of automatic testing system
US7111282B2 (en) * 2001-06-12 2006-09-19 Hewlett-Packard Development Company, L.P. Instrumenting a software program and collecting data from the instrumented software program by type
US7228326B2 (en) * 2002-01-18 2007-06-05 Bea Systems, Inc. Systems and methods for application deployment
US20040225459A1 (en) 2003-02-14 2004-11-11 Advantest Corporation Method and structure to develop a test program for semiconductor integrated circuits
US20040194064A1 (en) * 2003-03-31 2004-09-30 Ranjan Mungara Vijay Generic test harness
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
US7197416B2 (en) 2004-05-22 2007-03-27 Advantest America R&D Center, Inc. Supporting calibration and diagnostics in an open architecture test system
US7430486B2 (en) 2004-05-22 2008-09-30 Advantest America R&D Center, Inc. Datalog support in a modular test system
US20060130001A1 (en) * 2004-11-30 2006-06-15 International Business Machines Corporation Apparatus and method for call stack profiling for a software application

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI476586B (zh) * 2011-07-13 2015-03-11 Inst Information Industry 以雲端技術為基礎之測試系統、方法以及其電腦可讀取記錄媒體
TWI493465B (zh) * 2011-07-28 2015-07-21 Yahoo Inc 分配式應用程式堆疊與部署方法及系統

Also Published As

Publication number Publication date
US8082541B2 (en) 2011-12-20
KR20070106692A (ko) 2007-11-05
CN101073016A (zh) 2007-11-14
TWI383166B (zh) 2013-01-21
JP2008533542A (ja) 2008-08-21
US20060130041A1 (en) 2006-06-15
JP2009064425A (ja) 2009-03-26
EP1820036A1 (en) 2007-08-22
JP4302736B2 (ja) 2009-07-29
WO2006062252A1 (en) 2006-06-15
CN101073016B (zh) 2010-09-01

Similar Documents

Publication Publication Date Title
TW200638054A (en) Method and system for performing installation and configuration management of tester instrument modules
ATE438865T1 (de) Verfahren und system zur steuerung wechselbarer komponenten in einem modularen testsystem
TW200611177A (en) Method and structure to develop a test program for semiconductor integrated circuits
TW200608031A (en) Method and system for controlling interchangeable components in a modular test system
TW200643449A (en) Method and system for scheduling tests in a parallel test system
EP1783610A3 (en) Communication system hierarchical testing systems and methods -entity dependent automatic selection of tests
EP1577760A3 (en) Method and system for testing software development activity
WO2007120990A3 (en) Method and apparatus for automatic generation of system test libraries
CN107908507A (zh) 一种双cpu多通道ft量产测试系统及方法
TW200719140A (en) Automatic testing system and method
CN102262549B (zh) 补丁安装方法与系统
ATE439604T1 (de) Unterstützung von kalibration und diagnose in einem testsystem mit offener architektur
CN100451986C (zh) 网络芯片的自动化验证方法
CN103019732A (zh) 一种基于省市县一体化软件的安装部署方法及系统
MY130358A (en) Low leakage technique for determining power spectra of non-coherently sampled data
CN109831348A (zh) 自动化工装测试方法、设备及系统
EP1850230A3 (en) Feature-oriented test program development and execution
TW200624844A (en) Incremental generation of calibration factors for automated test equipment
CN107480061A (zh) 一种基于Jenkins CI构建变化模块的自动化回归测试方法
CN108875368A (zh) 一种安全检测方法、装置及系统
CN1308830C (zh) 计算机控制的易扩展的智能主板环境测试系统
WO2006012875A3 (de) Verfahren zur bewertung der güte eines testprogramms
Joe et al. Instruction‐Level Power Estimator for Sensor Networks
GB2400687B (en) Acquisition and control system
CN105204999A (zh) 一种实现CPU VR Static LL测试自动化测试的方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees