ATE439604T1 - Unterstützung von kalibration und diagnose in einem testsystem mit offener architektur - Google Patents
Unterstützung von kalibration und diagnose in einem testsystem mit offener architekturInfo
- Publication number
- ATE439604T1 ATE439604T1 AT05743591T AT05743591T ATE439604T1 AT E439604 T1 ATE439604 T1 AT E439604T1 AT 05743591 T AT05743591 T AT 05743591T AT 05743591 T AT05743591 T AT 05743591T AT E439604 T1 ATE439604 T1 AT E439604T1
- Authority
- AT
- Austria
- Prior art keywords
- vendor
- supplied
- test system
- module
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Measuring Volume Flow (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57357704P | 2004-05-22 | 2004-05-22 | |
US10/917,724 US7197416B2 (en) | 2004-05-22 | 2004-08-13 | Supporting calibration and diagnostics in an open architecture test system |
PCT/JP2005/009811 WO2005114239A1 (en) | 2004-05-22 | 2005-05-23 | Supporting calibration and diagnostics in an open architecture test system |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE439604T1 true ATE439604T1 (de) | 2009-08-15 |
Family
ID=34968855
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05743591T ATE439604T1 (de) | 2004-05-22 | 2005-05-23 | Unterstützung von kalibration und diagnose in einem testsystem mit offener architektur |
Country Status (8)
Country | Link |
---|---|
US (1) | US7197416B2 (de) |
EP (1) | EP1756606B1 (de) |
JP (2) | JP2007518967A (de) |
KR (1) | KR20070020300A (de) |
AT (1) | ATE439604T1 (de) |
DE (1) | DE602005015964D1 (de) |
TW (1) | TWI350965B (de) |
WO (1) | WO2005114239A1 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040225459A1 (en) * | 2003-02-14 | 2004-11-11 | Advantest Corporation | Method and structure to develop a test program for semiconductor integrated circuits |
US8082541B2 (en) * | 2004-12-09 | 2011-12-20 | Advantest Corporation | Method and system for performing installation and configuration management of tester instrument modules |
US7483801B2 (en) * | 2005-01-20 | 2009-01-27 | International Business Machines Corporation | Performance collection compensation |
DE602007009134D1 (de) * | 2007-04-20 | 2010-10-21 | Verigy Pte Ltd Singapore | Vorrichtung, verfahren und computerprogramm zum erionen |
US7640132B2 (en) * | 2007-04-23 | 2009-12-29 | Advantest Corporation | Recording medium and test apparatus |
US8433953B1 (en) | 2007-08-13 | 2013-04-30 | The Mathworks, Inc. | Automatic configuration of a test environment |
US7680615B2 (en) * | 2008-01-25 | 2010-03-16 | Azurewave Technologies, Inc. | Parallel testing system with shared golden calibration table and method thereof |
US8689071B2 (en) * | 2010-08-30 | 2014-04-01 | Contec Holdings, Ltd. | Multimedia device test system |
US8839057B2 (en) * | 2011-02-03 | 2014-09-16 | Arm Limited | Integrated circuit and method for testing memory on the integrated circuit |
EP2575370A1 (de) * | 2011-09-28 | 2013-04-03 | ST-Ericsson SA | System zum Prüfen einer Vorrichtung mit HDMI-Sender/Empfänger |
KR101240633B1 (ko) * | 2012-08-13 | 2013-03-11 | 주식회사 유니테스트 | 솔리드 스테이트 드라이브 테스트장치 |
US9164159B2 (en) * | 2012-12-14 | 2015-10-20 | Apple Inc. | Methods for validating radio-frequency test stations |
US10592370B2 (en) * | 2017-04-28 | 2020-03-17 | Advantest Corporation | User control of automated test features with software application programming interface (API) |
US10241146B2 (en) * | 2017-05-01 | 2019-03-26 | Advantest Corporation | Test system and method |
KR102583174B1 (ko) | 2018-06-12 | 2023-09-26 | 삼성전자주식회사 | 테스트 인터페이스 보드, 이를 포함하는 테스트 시스템 및 이의 동작 방법 |
JP6602517B1 (ja) * | 2018-11-20 | 2019-11-06 | 三菱電機株式会社 | 通信システム、リスト配信局、通信方法、および通信プログラム |
CN109657360A (zh) * | 2018-12-21 | 2019-04-19 | 中国航空工业集团公司西安航空计算技术研究所 | 一种面向gpu芯片硬件架构的建模方法及视图系统 |
CN114264996B (zh) * | 2021-11-30 | 2024-05-03 | 上海御渡半导体科技有限公司 | 一种ate设备dc校准有效性的检测方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK557884A (da) | 1983-11-25 | 1985-05-26 | Mars Inc | Automatisk testudstyr |
US5025205A (en) * | 1989-06-22 | 1991-06-18 | Texas Instruments Incorporated | Reconfigurable architecture for logic test system |
US5262716A (en) * | 1992-04-21 | 1993-11-16 | Hewlett-Packard Company | Tester calibration procedure which includes fixturing |
US5488573A (en) | 1993-09-02 | 1996-01-30 | Matsushita Electric Industrial Co., Ltd. | Method for generating test programs |
US5892949A (en) | 1996-08-30 | 1999-04-06 | Schlumberger Technologies, Inc. | ATE test programming architecture |
US6182258B1 (en) | 1997-06-03 | 2001-01-30 | Verisity Ltd. | Method and apparatus for test generation during circuit design |
US6028439A (en) | 1997-10-31 | 2000-02-22 | Credence Systems Corporation | Modular integrated circuit tester with distributed synchronization and control |
US6195774B1 (en) | 1998-08-13 | 2001-02-27 | Xilinx, Inc. | Boundary-scan method using object-oriented programming language |
US6601018B1 (en) | 1999-02-04 | 2003-07-29 | International Business Machines Corporation | Automatic test framework system and method in software component testing |
US6427223B1 (en) | 1999-04-30 | 2002-07-30 | Synopsys, Inc. | Method and apparatus for adaptive verification of circuit designs |
US6678643B1 (en) | 1999-06-28 | 2004-01-13 | Advantest Corp. | Event based semiconductor test system |
US6405364B1 (en) | 1999-08-31 | 2002-06-11 | Accenture Llp | Building techniques in a development architecture framework |
US6629282B1 (en) * | 1999-11-05 | 2003-09-30 | Advantest Corp. | Module based flexible semiconductor test system |
US6651204B1 (en) * | 2000-06-01 | 2003-11-18 | Advantest Corp. | Modular architecture for memory testing on event based test system |
US6779140B2 (en) * | 2001-06-29 | 2004-08-17 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with test sites operating in a slave mode |
JP2003066123A (ja) * | 2001-08-22 | 2003-03-05 | Hitachi Ltd | テスト方法およびテスト装置並びにテスト装置の構築方法 |
DE10392497T5 (de) | 2002-04-11 | 2005-02-17 | Advantest Corp. | Herstellungsverfahren und Herstellungsvorrichtung zum Vermeiden eines Prototypen-Aufschubs bei der ASIC/SOC-Herstellung |
US7184917B2 (en) | 2003-02-14 | 2007-02-27 | Advantest America R&D Center, Inc. | Method and system for controlling interchangeable components in a modular test system |
US7197417B2 (en) | 2003-02-14 | 2007-03-27 | Advantest America R&D Center, Inc. | Method and structure to develop a test program for semiconductor integrated circuits |
US20040225459A1 (en) * | 2003-02-14 | 2004-11-11 | Advantest Corporation | Method and structure to develop a test program for semiconductor integrated circuits |
TWI344595B (en) | 2003-02-14 | 2011-07-01 | Advantest Corp | Method and structure to develop a test program for semiconductor integrated circuits |
-
2004
- 2004-08-13 US US10/917,724 patent/US7197416B2/en not_active Expired - Fee Related
-
2005
- 2005-05-18 TW TW094116146A patent/TWI350965B/zh not_active IP Right Cessation
- 2005-05-23 EP EP05743591A patent/EP1756606B1/de not_active Not-in-force
- 2005-05-23 AT AT05743591T patent/ATE439604T1/de not_active IP Right Cessation
- 2005-05-23 DE DE602005015964T patent/DE602005015964D1/de active Active
- 2005-05-23 WO PCT/JP2005/009811 patent/WO2005114239A1/en active Application Filing
- 2005-05-23 KR KR1020067026855A patent/KR20070020300A/ko not_active Application Discontinuation
- 2005-05-23 JP JP2006519570A patent/JP2007518967A/ja not_active Withdrawn
-
2007
- 2007-05-01 JP JP2007120881A patent/JP4608516B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI350965B (en) | 2011-10-21 |
JP2007279050A (ja) | 2007-10-25 |
US20050261855A1 (en) | 2005-11-24 |
JP2007518967A (ja) | 2007-07-12 |
DE602005015964D1 (de) | 2009-09-24 |
KR20070020300A (ko) | 2007-02-20 |
JP4608516B2 (ja) | 2011-01-12 |
WO2005114239A1 (en) | 2005-12-01 |
US7197416B2 (en) | 2007-03-27 |
TW200609719A (en) | 2006-03-16 |
EP1756606B1 (de) | 2009-08-12 |
EP1756606A1 (de) | 2007-02-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |