TW200624796A - Method and apparatus for detecting a parameter of a detected object - Google Patents

Method and apparatus for detecting a parameter of a detected object

Info

Publication number
TW200624796A
TW200624796A TW094129970A TW94129970A TW200624796A TW 200624796 A TW200624796 A TW 200624796A TW 094129970 A TW094129970 A TW 094129970A TW 94129970 A TW94129970 A TW 94129970A TW 200624796 A TW200624796 A TW 200624796A
Authority
TW
Taiwan
Prior art keywords
respect
axis direction
transmission axis
incidence plane
transmitted light
Prior art date
Application number
TW094129970A
Other languages
Chinese (zh)
Other versions
TWI288823B (en
Inventor
Tetsuyuki Kurata
Tetsuya Satake
Takahiro Nishioka
Toshiaki Maehara
Makoto Kaneko
Masaki Okabe
Yuuki Maeda
Original Assignee
Meiryo Technica Corp
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meiryo Technica Corp, Mitsubishi Electric Corp filed Critical Meiryo Technica Corp
Publication of TW200624796A publication Critical patent/TW200624796A/en
Application granted granted Critical
Publication of TWI288823B publication Critical patent/TWI288823B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Optimization (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Algebra (AREA)
  • Computational Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Analysis (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)

Abstract

A ratio r is calculated on the basis of the intensity of transmitted light, when the transmission axis direction of an analyzer 13 is inclined by an arbitrary angle ω0, with respect to the incidence plane and the transmission axis direction of a polarizer 11 is inclined by 0 DEG and 90 DEG, with respect to the incidence plane. Further, the intensity of the transmitted light, when the transmission axis direction of the analyzer 13 is inclined by an arbitrary angle ω, with respect to the incidence plane and the transmission axis direction of the polarizer 11 is inclined by an arbitrary angle α with respect to the incidence plane, is detected with respect to a combination of at least two different ω and α. Then, the retardation or the thickness of a detection object 12 is calculated, on the basis of a plurality of the detected intensities of transmitted light and the ratio r.
TW094129970A 2004-09-22 2005-08-31 Method and apparatus for detecting a parameter of a detected object TWI288823B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004276203A JP3936712B2 (en) 2004-09-22 2004-09-22 Parameter detection method and detection apparatus for detection object

Publications (2)

Publication Number Publication Date
TW200624796A true TW200624796A (en) 2006-07-16
TWI288823B TWI288823B (en) 2007-10-21

Family

ID=36231958

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094129970A TWI288823B (en) 2004-09-22 2005-08-31 Method and apparatus for detecting a parameter of a detected object

Country Status (4)

Country Link
JP (1) JP3936712B2 (en)
KR (1) KR100662323B1 (en)
CN (1) CN100381877C (en)
TW (1) TWI288823B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8279439B2 (en) 2006-08-29 2012-10-02 Tokyo Denki University Birefringence measuring device and birefringence measuring method
JP5140451B2 (en) * 2008-02-05 2013-02-06 富士フイルム株式会社 Birefringence measuring method, apparatus and program
JP5198980B2 (en) * 2008-09-02 2013-05-15 株式会社モリテックス Optical anisotropy parameter measuring method and measuring apparatus
TWI432715B (en) * 2010-12-16 2014-04-01 Ind Tech Res Inst Method and apparatus for measuring liquid crystal cell parameters
CN103018213B (en) * 2011-09-26 2015-04-15 同济大学 Method and device for measuring wide spectral transmittance in 0-70-degree incidence of optical film
JP6587599B2 (en) * 2016-12-02 2019-10-09 オムロンオートモーティブエレクトロニクス株式会社 Object detection device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2974564B2 (en) * 1993-12-20 1999-11-10 シャープ株式会社 Liquid crystal electronic device and driving method thereof
JPH09292208A (en) * 1996-04-25 1997-11-11 Toyo Commun Equip Co Ltd Optical plate thickness measuring method and device therefor
WO2001022029A1 (en) * 1999-09-20 2001-03-29 Otsuka Electronics Co., Ltd. Method and apparatus for measuring cell gap of va liquid crystal panel
JP2001290118A (en) * 2000-01-31 2001-10-19 Sharp Corp Thickness measuring method of liquid crystal layer and thickness measuring device thereof

Also Published As

Publication number Publication date
KR100662323B1 (en) 2006-12-28
JP2006090820A (en) 2006-04-06
KR20060051548A (en) 2006-05-19
JP3936712B2 (en) 2007-06-27
TWI288823B (en) 2007-10-21
CN100381877C (en) 2008-04-16
CN1752799A (en) 2006-03-29

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees