TW200624776A - Apparatus and method for sequentially measuring multiple optical parameters of birefringence material - Google Patents

Apparatus and method for sequentially measuring multiple optical parameters of birefringence material

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Publication number
TW200624776A
TW200624776A TW094100413A TW94100413A TW200624776A TW 200624776 A TW200624776 A TW 200624776A TW 094100413 A TW094100413 A TW 094100413A TW 94100413 A TW94100413 A TW 94100413A TW 200624776 A TW200624776 A TW 200624776A
Authority
TW
Taiwan
Prior art keywords
optical
quarter
wave plate
optical parameters
measurement
Prior art date
Application number
TW094100413A
Other languages
Chinese (zh)
Other versions
TWI274142B (en
Inventor
Yu-Lung Lo
Jing-Fung Lin
Yu-Tsan Jeng
Hung-Wei Chih
Original Assignee
Univ Nat Cheng Kung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nat Cheng Kung filed Critical Univ Nat Cheng Kung
Priority to TW94100413A priority Critical patent/TWI274142B/en
Publication of TW200624776A publication Critical patent/TW200624776A/en
Application granted granted Critical
Publication of TWI274142B publication Critical patent/TWI274142B/en

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Apparatus and method for sequentially measuring multiple optical parameters of birefringence material and two-dimensional full field measurement are provided. The apparatus consists of an incident light source and an optical frame. The measurement method includes the following steps. Let the incident light sequentially pass the polarizer, electro-optical modulator, a first quarter-wave plate, an object under measurement, a second quarter-wave plate and an analyzer of, and then an optical detector receives the optical signal. Remove the first quarter-wave plate and pass the optical signal through a band pass filter and phase lock amplifier for signal processing. Then, obtain optical parameters such as main axis angle, phase delay, rank, thickness, refraction index of ordinary light and unordinary light respectively by employing an arithmetic unit to do calculation. When combined with CCD and electronic control device, the invention can act as a two-dimensional full field measurement apparatus and method.
TW94100413A 2005-01-07 2005-01-07 Apparatus and method for sequentially measuring multiple optical parameters of birefringence material TWI274142B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94100413A TWI274142B (en) 2005-01-07 2005-01-07 Apparatus and method for sequentially measuring multiple optical parameters of birefringence material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94100413A TWI274142B (en) 2005-01-07 2005-01-07 Apparatus and method for sequentially measuring multiple optical parameters of birefringence material

Publications (2)

Publication Number Publication Date
TW200624776A true TW200624776A (en) 2006-07-16
TWI274142B TWI274142B (en) 2007-02-21

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW94100413A TWI274142B (en) 2005-01-07 2005-01-07 Apparatus and method for sequentially measuring multiple optical parameters of birefringence material

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TW (1) TWI274142B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI405959B (en) * 2008-12-31 2013-08-21 Hannstar Display Corp Method and apparatus for measuring physical parameters of an anisotropic material by phase-sensitive heterodyne interferometry
CN108562547B (en) * 2018-03-13 2021-02-19 中国科学院福建物质结构研究所 Laser crystal thermal stress birefringence coefficient measuring device and method thereof

Also Published As

Publication number Publication date
TWI274142B (en) 2007-02-21

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