TW200624776A - Apparatus and method for sequentially measuring multiple optical parameters of birefringence material - Google Patents
Apparatus and method for sequentially measuring multiple optical parameters of birefringence materialInfo
- Publication number
- TW200624776A TW200624776A TW094100413A TW94100413A TW200624776A TW 200624776 A TW200624776 A TW 200624776A TW 094100413 A TW094100413 A TW 094100413A TW 94100413 A TW94100413 A TW 94100413A TW 200624776 A TW200624776 A TW 200624776A
- Authority
- TW
- Taiwan
- Prior art keywords
- optical
- quarter
- wave plate
- optical parameters
- measurement
- Prior art date
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Apparatus and method for sequentially measuring multiple optical parameters of birefringence material and two-dimensional full field measurement are provided. The apparatus consists of an incident light source and an optical frame. The measurement method includes the following steps. Let the incident light sequentially pass the polarizer, electro-optical modulator, a first quarter-wave plate, an object under measurement, a second quarter-wave plate and an analyzer of, and then an optical detector receives the optical signal. Remove the first quarter-wave plate and pass the optical signal through a band pass filter and phase lock amplifier for signal processing. Then, obtain optical parameters such as main axis angle, phase delay, rank, thickness, refraction index of ordinary light and unordinary light respectively by employing an arithmetic unit to do calculation. When combined with CCD and electronic control device, the invention can act as a two-dimensional full field measurement apparatus and method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94100413A TWI274142B (en) | 2005-01-07 | 2005-01-07 | Apparatus and method for sequentially measuring multiple optical parameters of birefringence material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94100413A TWI274142B (en) | 2005-01-07 | 2005-01-07 | Apparatus and method for sequentially measuring multiple optical parameters of birefringence material |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200624776A true TW200624776A (en) | 2006-07-16 |
TWI274142B TWI274142B (en) | 2007-02-21 |
Family
ID=38623059
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94100413A TWI274142B (en) | 2005-01-07 | 2005-01-07 | Apparatus and method for sequentially measuring multiple optical parameters of birefringence material |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI274142B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI405959B (en) * | 2008-12-31 | 2013-08-21 | Hannstar Display Corp | Method and apparatus for measuring physical parameters of an anisotropic material by phase-sensitive heterodyne interferometry |
CN108562547B (en) * | 2018-03-13 | 2021-02-19 | 中国科学院福建物质结构研究所 | Laser crystal thermal stress birefringence coefficient measuring device and method thereof |
-
2005
- 2005-01-07 TW TW94100413A patent/TWI274142B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI274142B (en) | 2007-02-21 |
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MM4A | Annulment or lapse of patent due to non-payment of fees |