CN210863099U - Device for measuring performance of broadband wave plate by using AOTF monochromatic light - Google Patents
Device for measuring performance of broadband wave plate by using AOTF monochromatic light Download PDFInfo
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- CN210863099U CN210863099U CN201921494783.8U CN201921494783U CN210863099U CN 210863099 U CN210863099 U CN 210863099U CN 201921494783 U CN201921494783 U CN 201921494783U CN 210863099 U CN210863099 U CN 210863099U
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Abstract
The patent discloses an utilize device of AOTF monochromatic light measurement broadband wave plate performance, the device by tunable monochromatic light source module of wavelength, polarizer, wait to examine the wave plate, examine the polarization ware, energy detection subassembly constitutes, wait to examine the wave plate and lie in the middle of polarizer and the polarization ware, the rotation is waited to examine the wave plate and is leaded to the emergent light energy to change, comes accurate calibration wave plate phase delay volume through the change of testing the emergent light energy. This patent advantage lies in: the measuring method is simple, the phase delay angles of the wave plates at different wavelengths can be measured, and the measuring precision is high.
Description
Technical Field
The patent relates to the detection and calibration of wave plate parameters, in particular to a device for measuring the performance of a broadband wave plate by utilizing AOTF monochromatic light. The method is suitable for the fields of polarization-related measurement and detection such as a polarization optical system, elliptical polarization measurement, laser technology and the like.
Background
Light is a transverse wave and has a polarization characteristic. Depending on the nature of the polarization state change of light as it propagates through the polarizer, one can change its polarization state as desired. With the deepening research on the polarization of light, polarization is found to have a wide application prospect, so that the polarization technology starts to enter a practical stage. The polarization information can be used for detecting targets and plays an important role in the fields of meteorological detection, ground object remote sensing detection, underwater space detection, astronomical detection, medical diagnosis, image processing, military application and the like; particularly in the field of quantum communication, the polarization state of photons is utilized to replace a classical binary code (bit) to carry and encode different information, and the quantum key distribution can be realized by combining a quantum entanglement effect, so that the aim of quantum secret communication is fulfilled, for example, a transmitted ink quantum communication satellite is successfully developed before China. Therefore, how to better apply the polarization information of light is an intense research and development direction, and researchers are required to continuously research and develop improvements, and the obtained research results have a wide application field.
The wave plate is an optical element commonly used in the field of polarization optics, and is a polarization optical device made based on the birefringence characteristics of crystals, which is also called a phase retarder. It can change the polarization state of light by generating an additional optical path difference (or phase difference) which is coupled to two perpendicular components of the polarized light to change the polarization state of light, and the optical path difference is called the phase retardation of the wave plate. Commonly used wave plates are the 1/4 wave plate and the 1/2 wave plate. The phase delay characteristic of the wave plate can change the polarization state of light, and can be applied to the fields of optical fiber communication, photoelastic mechanics, polarization state detection of light wave, various polarized light technologies and the like, and the application prospect is very wide. At present, there are widely used a block-shaped wave plate and an optical fiber wave plate, in which the block-shaped wave plate is a parallel sheet having a uniform thickness formed by cutting a uniaxial crystal along an optical axis direction. The block-shaped wave plate is divided into a true zero-order wave plate, a multi-order wave plate, a glued zero-order wave plate and an achromatic wave plate according to the manufacturing process. The optical fiber wave plate is made of birefringent optical fiber, and is divided into stress birefringent optical fiber and geometric birefringent optical fiber.
In order to detect the retardation accuracy and effect of the wave plate, the phase retardation of the wave plate needs to be measured. At present, the detection of the wave plate phase delay includes an optical compensation method, a phase shift method, an electro-optical crystal modulation method, a laser frequency splitting method and the like. The patent number CN201810536990 provides a method and a device for detecting the plane phase retardation of a wave plate, wherein a ZYGO interferometer is used for measuring the plane phase retardation of the wave plate, and the phase retardation of the wave plate is inverted through the thickness, the method is used for indirectly measuring the phase retardation, and the test precision is limited; patent CN201710229703 provides a wave plate fast and slow axis detection method, which only provides a detection method of an optical axis, and does not involve measurement of phase delay; CN201610029435 provides a wave plate detection apparatus and method, which can measure parameters including phase retardation, fast axis azimuth angle, optical rotation angle, fast and slow axis transmittance amplitude ratio angle, depolarization index, etc., and the testing process is too complicated.
This patent sets out from the angle convenient to detect and operation, has proposed a muller matrix and stokes vector representation method based on polarized light propagates in the device, will wait to examine the wave plate and place in the middle of two polaroids that the transmission axis direction is the same, only tests the maximum value and the minimum of light energy through rotatory wave plate, can deduce and obtain the corresponding relation of waiting to examine wave plate phase delay angle and emergent energy maximum value, minimum to accurate quick calibration awaits measuring the phase delay volume of wave plate. The method can meet the detection requirements of convenience and easy operability in the actual production, processing and detection processes.
Disclosure of Invention
The purpose of this patent is to provide an utilize AOTF monochromatic light measurement broadband wave plate performance's device, mainly in order to satisfy the large-scale production course of working of reality, to the convenient and easy operational detection requirement of wave plate detection mode.
The method of the patent is shown in figure 1, and comprises a wavelength tunable monochromatic light source module 1, a to-be-detected wave plate 2 with a rotating structure, an analyzer 3 and an energy detection component 4. The wavelength-tunable monochromatic light source module 1 is composed of a wide-spectrum light source 1-1 output by optical fibers, a collimating lens 1-2, an acousto-optic adjustable filter 1-3 and a light shielding plate 1-4. When in test, light emitted by a broad spectrum light source 1-1 output by an optical fiber passes through a collimating lens 1-2 to become parallel light, the parallel light is incident on a radio frequency adjustable acousto-optic tunable filter 1-3, emergent light can generate diffracted light with corresponding wavelength, a shading plate 1-4 is utilized to shield negative 1-order diffracted light and zero-order light, the generated positive 1-order diffracted light passes through a wave plate 2 to be tested of an analyzer and the analyzer 3 and is detected by an energy detection assembly 4, the polarization state of the emergent light is changed by rotating the wave plate 2 to be tested with a rotating structure, so that the energy detection assembly 4 detects the energy change of the light, and the phase delay amount of the wave plate 2 to be tested with the rotating structure is accurately and rapidly calibrated through the energy change condition; the wavelength of the emergent light is changed through the wavelength-tunable monochromatic light source module 1, so that the phase delay amount of the broadband wave plate is obtained.
The wavelength ranges of the wavelength tunable monochromatic light source module 1 and the analyzer 3 are required to be adapted to a wave plate 2 to be measured with a rotating structure; the analyzer 3 is a polarizer with a rotating structure, the wavelength range of the polarizer needs to cover the wavelength of the to-be-measured wave plate 2 with the rotating structure, and the polarization extinction ratio of the wave band is superior to 5000: 1; the wavelength range measured by the energy detection assembly 4 covers the wavelength range tested by the wave plate 2 to be tested with the rotating structure.
The patent provides a device and a method for measuring broadband wave plate performance by using AOTF monochromatic light, which comprises the following specific implementation steps:
1) the light emitted by a wide-spectrum light source 1-1 output by an optical fiber passes through a collimating lens 1-2 to become parallel light, and then enters a radio frequency adjustable acousto-optic filter 1-3, and the output wavelength is lambda after the radio frequency is startediThe light shading plate 1-4 is used for shading the negative 1 st order diffraction light and the zero order light, the generated positive 1 st order diffraction light is received by the energy detection component 4, and the output positive 1 st order diffraction light is linearly polarized light in the horizontal direction, and the output wavelength is lambda at the momentiThe polarization state of the diffracted light of (1)
Expressed as stokes vectors;
2) the analyzer 3 is placed between the wavelength tunable monochromatic light source module 1 and the energy detection component 4, the detected energy is minimum by rotating the analyzer 3, the transmission axis angle of the analyzer 3 is orthogonal to the polarization direction of emergent light, then the analyzer 3 is rotated by 90 degrees, and the transmission axis angle of the polarizer 3 is 0 and is in the horizontal direction. Mueller matrix M of analyzer 33Can be expressed as:
3) placing the wave plate 2 to be detected with the rotating structure between the wavelength-tunable monochromatic light source module 1 and the analyzer 3, and adjusting the position and the angle of the wave plate 3 to be detected with the rotating structure to make emergent light of the wavelength-tunable monochromatic light source module 1 vertically incident through the center of the wave plate 2 to be detected with the rotating structure, assuming that the wave plate 2 to be detected with the rotating structure corresponds to the wave with the wavelength of lambdaiIs delayed by a phase of
At this time, the fast axis of the wave plate 2 to be measured with the rotating structure is at an angle theta, wherein theta is an included angle between the fast axis of the wave plate 2 to be measured with the rotating structure and the horizontal direction. At the moment, the Mueller matrix M of the to-be-measured wave plate 2 with the rotating structure2Can be expressed as:
4) the wavelength generated by the wavelength-tunable monochromatic light source module 1 is lambdaiThe light passes through a wave plate 2 to be detected with a rotating structure and an analyzer 3 in sequence, and is detected by an energy detection assembly 4, and finally emergent light polarization state
Can be expressed as:
by calculation, it can be known that:
5) from the final emergent light polarization state
It can be seen that the energy E of the outgoing light can be expressed as:
by rotating the wave plate 2 to be detected with a rotating structure, the maximum energy value E detected by the energy detection component 4 in the rotating processmaxAnd minimum value EminThe output value satisfies:
then:
6) the radio frequency drive of the acousto-optic tunable filters 1-3 is changed, so that the wavelength tunable monochromatic light source module 1 sequentially outputs different wavelengths lambdaiAnd repeating the step 5 to finally obtain the corresponding phase delay amount of the wave plate to be measured 2 with the rotating structure under different wavelengths, so that the wave plate to be measured 2 with the rotating structure obtains the phase delay delta (lambda) within the wide spectrum range, wherein the phase delay delta is a function of the wavelength lambda, and the wavelength lambda is an independent variable of the wavelength lambda.
The specific principle of the method is as follows:
in optical theory, polarized light is divided into linearly polarized light, circularly polarized light, and elliptically polarized light. Any polarized light can be represented by Stokes vector, as shown in figure 1, the wavelength tunable monochromatic light source module 1 utilizes AOTF crystal to generate positive 1-level output light with lambda as wavelengthiIs ideally horizontally linearly polarized light with its stokes vector
Can be expressed as:
the polarized light passes through the wave plate 2 to be measured with a rotating structure, and the wave plate 2 to be measured with the rotating structure is supposed to correspond to the light wavelength of lambdaiIs delayed by a phase of
The fast axis is at an angle theta, wherein theta is an included angle between the fast axis of the to-be-measured wave plate 2 with the rotating structure and the horizontal direction. At the moment, the Mueller matrix M of the to-be-measured wave plate 2 with the rotating structure2Can be expressed as:
the state of the horizontal line polarized light generated by the wavelength-tunable monochromatic light source module 1 after passing through the to-be-measured wave plate 2 with the rotating structure is as follows:
finally, the polarization is detected by a polarization detector 3, the polarization detection angle is horizontal, and the Mueller matrix M is3Can be expressed as a number of times,
the polarization state after polarization analysis is as follows:
from the final emergent light polarization state
It can be seen that the energy E of the outgoing light can be expressed as:
in the process of rotating the wave plate 2 to be detected with the rotating structure, the energy maximum value E detected by the energy detection component 4maxAnd EminDue to the polarization state of the incident light
To determine the status, then
Then:
changing the wavelength lambda output by the wavelength-tunable monochromatic light source module 1iThe phase retardation of the wave plate 2 to be measured with the rotating structure under different wavelengths can be obtained, so that the phase retardation delta (lambda) in a wide spectrum range can be obtained, wherein the phase retardation delta is a function of the wavelength lambda, and the wavelength lambda is an independent variable of the wavelength lambda.
The patent provides a device and a method for measuring broadband wave plate performance by using AOTF monochromatic light, and the method has the advantages that: 1. after the simple optical path is built, the measuring method only needs to rotate the wave plate 3 to be measured with the rotating structure, and the phase delay angle of the wave plate can be obtained by outputting the maximum value and the minimum value of energy; 2. the phase retardation angle of the wave plate at different wavelengths can be measured; 3. and the phase delay is calibrated by adopting a direct measurement method, and compared with a thickness measurement method, the method can eliminate the material characteristic difference and has higher measurement precision.
Drawings
FIG. 1 is a device for rapidly measuring the phase retardation of a broadband wave plate.
Detailed Description
An example of the method of the present patent will be described in detail below with reference to fig. 1.
The main components employed in this patent are described below:
1) the wide-spectrum light source 1-1. the wide-spectrum light source 1-1 outputted by the optical fiber in the embodiment adopts a stable infrared tungsten lamp light source of Thorlabs company, and an optical fiber output light source with the model number of SLS202L, and the spectral range is 450-5500 nm;
2) collimator lens 1-2: in the embodiment, the collimating lens 1-2 is a self-designed component, and the wavelength range of the collimating lens is 900-2500nm, so that the wide-spectrum light source 1-1 output by the optical fiber is collimated into parallel beams to be incident on the acousto-optic tunable filter 1-3;
3) acousto-optic tunable filter 1-3: the acousto-optic tunable filter 1-3 used in this embodiment is a product customized by research institute 26 of the china electronic technology group, and its main technical indexes are:
a) the working wavelength is as follows: 850nm-2400nm
b) Spectral resolution: 2nm-12nm
c) First-order deflection angle: 2.6 degree
d) Separation angle: 6.1 ° >
e) Diffraction efficiency: 60% >, a
f) Size: 560mm 400mm 315mm
g) Driving power: 2W
h) Driving frequency range: 37MHz-112 MHz;
4) the wave plate 2 to be measured with the rotating structure: the wave plate 3 to be measured is a wave plate with a rotating structure. In which the wave plate 3 needs to measure a phase retardation of 600 to 900nmMeasurement of
The rotary structure adopts a large constant photoelectric product, and the model is WPA-30. The rotating angle is 0 to 360 degrees, and the clamping caliber is 30 mm. Minimum reading is 0.5 degrees;
5) the analyzer 3: the analyzer 3 is a polaroid with a rotary structure, wherein the polaroid is made of Thorlabs and has the model of LPVIS100, and the main performance parameters are as follows: the working band is 600-1200 nm; the polarization extinction ratio is 10000: 1; the caliber size is 25mm, and the effective caliber is 90% of the caliber; the polarization analysis angle is +/-20 degrees. The rotary structure is made of Thorlabs, and is of the type RSP1D, and the main performance parameters are as follows: the rotation angle is 0 to 360 degrees, and the clamping caliber is1 inch. Minimum reading is 0.5 degrees;
6) the energy detection assembly 4: the product from Thorlabs, model No. PM120D, was used, the main performance parameters of which are: the working band is 400-1100 nm; the power test range is 50nw-50 mw; the probe is a Si detector;
the main light path of the patented method is schematically shown in the attached figure 1, and the specific situation is described as follows:
1) according to the attached figure 1, a wavelength tunable monochromatic light source module 1 and an energy detection component 4 are fixed, light emitted by a wide-spectrum light source 1-1 output by an optical fiber is converted into parallel light after passing through a collimating lens 1-2, the parallel light is incident on a radio frequency adjustable acousto-optic filter 1-3, and the output wavelength is lambda after the radio frequency is startediThe light shading plates 1-4 are used for shading the negative 1-order diffraction light and the zero-order light, the generated positive 1-order diffraction light is received by the energy detection assembly 4, the wavelength range of the to-be-measured wave plate 3 with the rotating structure is required to be 600-900 nm in the embodiment, and the to-be-measured wavelength range is divided into one optical wavelength lambda according to the fact that every 10nm is a measuring pointiThe sequence is as follows:
λi＝600+10i(i＝0,1，···30)
and measuring the broadband phase delay amount of the wave plate 2 to be measured with the band rotating structure. Where i is a natural number from 0 to 30. Sequentially emitting light with the wavelength of lambda according to the step of 1 for each time of iiBecause the output positive 1 st order diffraction light is linearly polarized in the horizontal direction, itPolarization state
Expressed by the stokes vector as:
2) the analyzer 3 is placed between the wavelength tunable monochromatic light source module 1 and the energy detection component 4, the detected energy is minimum by rotating the analyzer 3, the transmission axis angle of the analyzer 3 is orthogonal to the polarization direction of emergent light, then the analyzer 3 is rotated by 90 degrees, the transmission axis direction of the polarizer 3 is horizontal, and the Mueller matrix M of the analyzer 33Can be expressed as:
3) placing the wave plate 2 to be detected with the rotating structure between the wavelength-tunable monochromatic light source module 1 and the analyzer 3, and adjusting the position and the angle of the wave plate 3 to be detected with the rotating structure to make emergent light of the wavelength-tunable monochromatic light source module 1 vertically incident through the center of the wave plate 2 to be detected with the rotating structure, assuming that the wavelength corresponding to the wave plate 2 to be detected with the rotating structure is lambdaiIs delayed by a phase of
At this time, the fast axis of the wave plate 2 to be measured with the rotating structure is at an angle theta, wherein theta is an included angle between the fast axis of the wave plate 2 to be measured with the rotating structure and the horizontal direction. At the moment, the Mueller matrix M of the to-be-measured wave plate 2 with the rotating structure2Can be expressed as:
4) the wavelength generated by the wavelength-tunable monochromatic light source module 1 is lambdaiThe light passes through a wave plate 2 to be detected with a rotating structure and an analyzer 3 in sequence, and is detected by an energy detection assembly 4, and finally emergent light polarization state
Can be expressed as:
by calculation, it can be known that:
5) final emergent light polarization state
It can be seen that the energy E of the outgoing light can be expressed as:
by rotating the wave plate 2 to be detected with a rotating structure, the maximum energy value E detected by the energy detection component 4 in the rotating processmaxAnd minimum value EminThe output value satisfies:
then:
6) the radio frequency drive of the acousto-optic tunable filters 1-3 is changed, so that the wavelength tunable monochromatic light source module 1 sequentially outputs different wavelengths lambdaiAnd repeating the step 5 to finally obtain the phase delay amount of the to-be-detected wave plate 2 with the rotating structure under different wavelengths, so that the to-be-detected wave plate 2 with the rotating structure obtains the phase delay amount within the wide spectrum rangeIs determined, wherein the amount of phase retardation δ is a function of the wavelength λ, which is its argument.
Claims (4)
1. The utility model provides an utilize AOTF monochromatic light to measure broadband wave plate performance's device, includes wavelength tunable monochromatic light source module (1), takes the awaiting measuring wave plate (2) of revolution mechanic, analyzer (3) and energy detection subassembly (4), its characterized in that:
the wavelength-tunable monochromatic light source module (1) consists of a wide-spectrum light source (1-1) output by an optical fiber, a collimating lens (1-2), an acousto-optic tunable filter (1-3) and a light shielding plate (1-4), wherein light emitted by the wide-spectrum light source (1-1) output by the optical fiber during testing is parallel after passing through the collimating lens (1-2) and then enters the acousto-optic tunable filter (1-3) with a radio frequency tunable, diffracted light with corresponding wavelength is generated by the emitted light, negative 1-order diffracted light and zero-order light are shielded by the light shielding plate (1-4), the generated positive 1-order diffracted light passes through a wave plate (2) to be tested with a rotating structure and an analyzer (3) and then is detected by an energy detection assembly (4), and the polarization state of the emitted light is changed by rotating the wave plate (2) to be tested with the rotating structure, therefore, the energy detection component (4) detects the energy change of light, and the phase delay amount of the wave plate (2) to be detected with the rotating structure is accurately and quickly calibrated according to the energy change condition; the wavelength of emergent light is changed through the wavelength tunable monochromatic light source module (1), so that the phase delay amount of the broadband wave plate is obtained.
2. The apparatus according to claim 1, wherein the apparatus for measuring the performance of the broadband wave plate by using AOTF monochromatic light comprises: the wavelength ranges of the wavelength tunable monochromatic light source module (1) and the analyzer (3) are required to be adapted to the wave plate (2) to be measured with a rotating structure.
3. The apparatus according to claim 1, wherein the apparatus for measuring the performance of the broadband wave plate by using AOTF monochromatic light comprises: the analyzer (3) is a polaroid with a rotating structure, the use wavelength range of the polaroid needs to cover the wavelength of the wave plate (2) to be measured with the rotating structure, and the polarization extinction ratio of the wave band is superior to 5000: 1.
4. the apparatus according to claim 1, wherein the apparatus for measuring the performance of the broadband wave plate by using AOTF monochromatic light comprises: the wavelength range measured by the energy detection assembly (4) covers the test wavelength range of the wave plate (2) to be tested with the rotating structure.
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