TW200618918A - Substrate working device and substrate working method - Google Patents
Substrate working device and substrate working methodInfo
- Publication number
- TW200618918A TW200618918A TW094126443A TW94126443A TW200618918A TW 200618918 A TW200618918 A TW 200618918A TW 094126443 A TW094126443 A TW 094126443A TW 94126443 A TW94126443 A TW 94126443A TW 200618918 A TW200618918 A TW 200618918A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- laser beams
- substrate working
- laser
- sublimed
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/10—Devices involving relative movement between laser beam and workpiece using a fixed support, i.e. involving moving the laser beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K37/00—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups
- B23K37/04—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups for holding or positioning work
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Laser Beam Processing (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Liquid Crystal (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
Abstract
To provide a substrate working device and a substrate working method for forming a scribe line to stably divide a substrate. Laser beams emitted from a laser beam source 2 are parallelized by a beam shaping optical system 3, and the power of the laser beams is regulated. The deflection direction is regulated by a 1/2 wavelength plate 4, and the laser beams are condensed on a substrate 7 by a condensing optical system 5. By condensing the laser beams on the substrate 7, multiple photon absorption occurs inside the substrate 7, and glass in the ionized zone formed by the multiple photon absorption is sublimed. Since the substrate 7 is relatively moved to the laser beams by an XY-stage 8, a sublimed portion forming a groove forms a scribe line. The rotation of the 1/2 wavelength plate 4 is controlled so that the deflection direction of the laser beams becomes constant in the laser beam moving direction with respect to the substrate 7.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004248432A JP2006061954A (en) | 2004-08-27 | 2004-08-27 | Substrate working device and substrate working method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200618918A true TW200618918A (en) | 2006-06-16 |
TWI282295B TWI282295B (en) | 2007-06-11 |
Family
ID=36092513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094126443A TWI282295B (en) | 2004-08-27 | 2005-08-03 | Substrate working device and substrate working method |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2006061954A (en) |
KR (1) | KR20060050283A (en) |
CN (1) | CN1739903A (en) |
TW (1) | TWI282295B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9138913B2 (en) | 2005-09-08 | 2015-09-22 | Imra America, Inc. | Transparent material processing with an ultrashort pulse laser |
KR100746340B1 (en) * | 2006-03-17 | 2007-08-03 | 한국광기술원 | Real-time and high-precision measurement apparatus by analyzing the fabry-perot interference pattern |
JP5154838B2 (en) * | 2007-05-31 | 2013-02-27 | 株式会社ディスコ | Laser processing equipment |
CN101515096B (en) * | 2008-02-22 | 2011-02-09 | 中华映管股份有限公司 | Method for manufacturing substrate |
JP2011218398A (en) * | 2010-04-08 | 2011-11-04 | Fujikura Ltd | Method for forming microstructure, laser irradiation device, and substrate |
CN102405426B (en) * | 2010-05-28 | 2014-07-09 | Lg化学株式会社 | Method for manufacturing polarizing plate |
JP2012040573A (en) * | 2010-08-16 | 2012-03-01 | Fuji Electric Co Ltd | Microprocessing method of sample |
JP6034097B2 (en) * | 2012-08-28 | 2016-11-30 | 株式会社ディスコ | Laser processing equipment |
CN103785947B (en) * | 2014-01-27 | 2018-01-23 | 英诺激光科技股份有限公司 | A kind of laser cutting machine that can improve LED chip splitting yield |
KR101581787B1 (en) | 2014-06-02 | 2015-12-31 | 주식회사 크린? | Lift goods case and pull out method using lift goods case |
DE112017003592T5 (en) * | 2016-07-15 | 2019-03-28 | TeraDiode, Inc. | Material processing using a laser with variable beam shape |
CN108581182A (en) * | 2018-04-28 | 2018-09-28 | 大族激光科技产业集团股份有限公司 | Laser processing device and method |
-
2004
- 2004-08-27 JP JP2004248432A patent/JP2006061954A/en active Pending
-
2005
- 2005-08-03 TW TW094126443A patent/TWI282295B/en not_active IP Right Cessation
- 2005-08-05 KR KR1020050071903A patent/KR20060050283A/en not_active Application Discontinuation
- 2005-08-26 CN CNA2005100994588A patent/CN1739903A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2006061954A (en) | 2006-03-09 |
TWI282295B (en) | 2007-06-11 |
KR20060050283A (en) | 2006-05-19 |
CN1739903A (en) | 2006-03-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |