TW200605180A - Sensor and tester using the same - Google Patents

Sensor and tester using the same

Info

Publication number
TW200605180A
TW200605180A TW094110218A TW94110218A TW200605180A TW 200605180 A TW200605180 A TW 200605180A TW 094110218 A TW094110218 A TW 094110218A TW 94110218 A TW94110218 A TW 94110218A TW 200605180 A TW200605180 A TW 200605180A
Authority
TW
Taiwan
Prior art keywords
antenna
output
mos
state
mos1
Prior art date
Application number
TW094110218A
Other languages
English (en)
Chinese (zh)
Inventor
Masashi Yoshinaga
Takeshi Tanaka
Shuji Yamaoka
Shogo Ishioka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Publication of TW200605180A publication Critical patent/TW200605180A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW094110218A 2004-03-31 2005-03-31 Sensor and tester using the same TW200605180A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004106239A JP2005294466A (ja) 2004-03-31 2004-03-31 センサ及び該センサを用いた検査装置

Publications (1)

Publication Number Publication Date
TW200605180A true TW200605180A (en) 2006-02-01

Family

ID=35063919

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094110218A TW200605180A (en) 2004-03-31 2005-03-31 Sensor and tester using the same

Country Status (3)

Country Link
JP (1) JP2005294466A (ja)
TW (1) TW200605180A (ja)
WO (1) WO2005096006A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (zh) * 2017-11-30 2020-08-04 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3415035B2 (ja) * 1998-08-07 2003-06-09 オー・エイチ・ティー株式会社 基板検査用センサプローブおよびその製造方法
JP3858728B2 (ja) * 2002-03-04 2006-12-20 セイコーエプソン株式会社 静電容量検出装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (zh) * 2017-11-30 2020-08-04 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法
CN111492233B (zh) * 2017-11-30 2023-08-08 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法

Also Published As

Publication number Publication date
JP2005294466A (ja) 2005-10-20
WO2005096006A1 (ja) 2005-10-13

Similar Documents

Publication Publication Date Title
US7245175B2 (en) Semiconductor switch
JP2008270964A (ja) 高周波スイッチ回路
WO2003081833B1 (en) Floating-gate analog circuit
ATE482453T1 (de) Abtast- und halteschaltung
US7990670B2 (en) Protective circuitry for electronic device
US8258851B2 (en) Switching circuit and method for testing the same
TWI508448B (zh) 低漏電之輸出入電路與相關裝置
US9245886B2 (en) Switch supporting voltages greater than supply
US6091277A (en) Input buffer circuit for semiconductor IC circuit
EP1039470A3 (en) Semiconductor memory device
EP2341626B1 (en) Communication cell for an integrated circuit, chip comprising the communication cell, electronic system including the chip, and test apparatus
TW200605180A (en) Sensor and tester using the same
NO20033051L (no) Testmoduskrets for inngangs-/utgangskontinuitet
Huang A 900-MHz T/R switch with a 0.8-dB insertion loss implemented in a 0.5-/spl mu/m CMOS process
JP2003249829A5 (ja)
EP0913942A3 (en) Integrated circuit assembly having output pads with application specific characteristics and method of operation
EP1024500A3 (en) Test circuit for boost circuit output node potential measurement of a semiconductor ic device
US20080258769A1 (en) Tri-State Circuit Element Plus Tri-State-Multiplexer Circuitry
EP0789398A3 (en) Semiconductor device having power MOS transistor including parasitic transistor
EP1508871A3 (en) Data communication device
US7221208B2 (en) Switching circuit
JP2008182388A (ja) 信号切替装置
RU2072590C1 (ru) Магнитоуправляемая логическая ячейка
KR100283870B1 (ko) 마이크로컴퓨터
US6459300B1 (en) Level-shifting circuitry having “high” output during disable mode