TW200605180A - Sensor and tester using the same - Google Patents

Sensor and tester using the same

Info

Publication number
TW200605180A
TW200605180A TW094110218A TW94110218A TW200605180A TW 200605180 A TW200605180 A TW 200605180A TW 094110218 A TW094110218 A TW 094110218A TW 94110218 A TW94110218 A TW 94110218A TW 200605180 A TW200605180 A TW 200605180A
Authority
TW
Taiwan
Prior art keywords
antenna
output
mos
state
mos1
Prior art date
Application number
TW094110218A
Other languages
English (en)
Chinese (zh)
Inventor
Masashi Yoshinaga
Takeshi Tanaka
Shuji Yamaoka
Shogo Ishioka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Publication of TW200605180A publication Critical patent/TW200605180A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829Testing of circuits in sensor or actuator systems

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW094110218A 2004-03-31 2005-03-31 Sensor and tester using the same TW200605180A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004106239A JP2005294466A (ja) 2004-03-31 2004-03-31 センサ及び該センサを用いた検査装置

Publications (1)

Publication Number Publication Date
TW200605180A true TW200605180A (en) 2006-02-01

Family

ID=35063919

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094110218A TW200605180A (en) 2004-03-31 2005-03-31 Sensor and tester using the same

Country Status (3)

Country Link
JP (1) JP2005294466A (ja)
TW (1) TW200605180A (ja)
WO (1) WO2005096006A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (zh) * 2017-11-30 2020-08-04 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3415035B2 (ja) * 1998-08-07 2003-06-09 オー・エイチ・ティー株式会社 基板検査用センサプローブおよびその製造方法
JP3858728B2 (ja) * 2002-03-04 2006-12-20 セイコーエプソン株式会社 静電容量検出装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (zh) * 2017-11-30 2020-08-04 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法
CN111492233B (zh) * 2017-11-30 2023-08-08 东丽株式会社 电路、检测器、无线通信设备、水分检测系统、尿布、报知系统及电路的制造方法

Also Published As

Publication number Publication date
JP2005294466A (ja) 2005-10-20
WO2005096006A1 (ja) 2005-10-13

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