TW200605180A - Sensor and tester using the same - Google Patents

Sensor and tester using the same

Info

Publication number
TW200605180A
TW200605180A TW094110218A TW94110218A TW200605180A TW 200605180 A TW200605180 A TW 200605180A TW 094110218 A TW094110218 A TW 094110218A TW 94110218 A TW94110218 A TW 94110218A TW 200605180 A TW200605180 A TW 200605180A
Authority
TW
Taiwan
Prior art keywords
antenna
output
mos
state
mos1
Prior art date
Application number
TW094110218A
Other languages
Chinese (zh)
Inventor
Masashi Yoshinaga
Takeshi Tanaka
Shuji Yamaoka
Shogo Ishioka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Publication of TW200605180A publication Critical patent/TW200605180A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The technical subject of the invention is to provide a sensor and a tester in which a test signal at a good reliability and good efficiency can be detected upon testing a substrate. Since an antenna MOS1 (Metal Oxide Semiconductor) is used as an antenna, a gate is electrically connected to a source and a drain to reduce influences of impedance involved in a MOS type transistor. Reference numerals 2, 3, 4 denote MOSs constituting a switch circuit as to whether or not a detected result of the antenna MOS1 is output as an output signal, and when an address signal is not input, the MOS 4 is in an operating state and the output signal is maintained in a non-output state. If the address signal is input, the gate input of the MOS 4 is at "0" level, and the MOS 4 is controlled to be in a non-operating state (OFF-state). The gates of the MOSs 2, 3 are at "1" level, each being in an operating state (ON-state). For this reason, a detected result of the antenna MOS1 is also output as an output signal.
TW094110218A 2004-03-31 2005-03-31 Sensor and tester using the same TW200605180A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004106239A JP2005294466A (en) 2004-03-31 2004-03-31 Sensor and tester using the same

Publications (1)

Publication Number Publication Date
TW200605180A true TW200605180A (en) 2006-02-01

Family

ID=35063919

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094110218A TW200605180A (en) 2004-03-31 2005-03-31 Sensor and tester using the same

Country Status (3)

Country Link
JP (1) JP2005294466A (en)
TW (1) TW200605180A (en)
WO (1) WO2005096006A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (en) * 2017-11-30 2020-08-04 东丽株式会社 Circuit, detector, wireless communication device, moisture detection system, diaper, notification system, and circuit manufacturing method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3415035B2 (en) * 1998-08-07 2003-06-09 オー・エイチ・ティー株式会社 Sensor probe for board inspection and method of manufacturing the same
JP3858728B2 (en) * 2002-03-04 2006-12-20 セイコーエプソン株式会社 Capacitance detection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111492233A (en) * 2017-11-30 2020-08-04 东丽株式会社 Circuit, detector, wireless communication device, moisture detection system, diaper, notification system, and circuit manufacturing method
CN111492233B (en) * 2017-11-30 2023-08-08 东丽株式会社 Circuit, detector, wireless communication device, moisture detection system, diaper, notification system, and method for manufacturing circuit

Also Published As

Publication number Publication date
WO2005096006A1 (en) 2005-10-13
JP2005294466A (en) 2005-10-20

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