TW200519374A - Inspection method and system for thin-film product, thin-film product, single piece material and image display device - Google Patents

Inspection method and system for thin-film product, thin-film product, single piece material and image display device

Info

Publication number
TW200519374A
TW200519374A TW093130597A TW93130597A TW200519374A TW 200519374 A TW200519374 A TW 200519374A TW 093130597 A TW093130597 A TW 093130597A TW 93130597 A TW93130597 A TW 93130597A TW 200519374 A TW200519374 A TW 200519374A
Authority
TW
Taiwan
Prior art keywords
thin
film product
inspection method
conveying direction
display device
Prior art date
Application number
TW093130597A
Other languages
Chinese (zh)
Other versions
TWI349771B (en
Inventor
Masaki Shikami
Hiroshi Aizawa
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Publication of TW200519374A publication Critical patent/TW200519374A/en
Application granted granted Critical
Publication of TWI349771B publication Critical patent/TWI349771B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1065—Multiple transfer devices
    • G01N35/1067—Multiple transfer devices for transfer to or from containers having different spacing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G01N2035/00742—Type of codes
    • G01N2035/00762—Type of codes magnetic code
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G01N2035/00792—Type of components bearing the codes, other than sample carriers
    • G01N2035/00801—Holders for sample carriers, e.g. trays, caroussel, racks

Abstract

The invention relates to an inspection method for thin-film product. The method includes steps of recording a recognition datum of position along a conveying direction once from a end portion in the width direction of the belt-like thin-film product every preset time interval along the conveying direction of the thin-film product; reading the recorded recognition data; detecting a movement of the thin-film product along the conveying direction; checking surface defect of the thin-film product; calculating position data of detected surface defects in accordance with the read recognition data and the measured movements; and memorizing the calculated data in a memory device..
TW093130597A 2003-10-09 2004-10-08 Inspection method and system for thin-film product, thin-film product, single piece material and image display device TW200519374A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003351122A JP2005114624A (en) 2003-10-09 2003-10-09 Method for inspecting sheet-like product, system for inspecting the sheet-like product, the sheet-like product, and sheet object

Publications (2)

Publication Number Publication Date
TW200519374A true TW200519374A (en) 2005-06-16
TWI349771B TWI349771B (en) 2011-10-01

Family

ID=34542486

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093130597A TW200519374A (en) 2003-10-09 2004-10-08 Inspection method and system for thin-film product, thin-film product, single piece material and image display device

Country Status (4)

Country Link
JP (1) JP2005114624A (en)
KR (1) KR20050034539A (en)
CN (1) CN100491983C (en)
TW (1) TW200519374A (en)

Cited By (2)

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TWI593959B (en) * 2012-10-01 2017-08-01 Dac Engineering Co Ltd Rewinding product inspection methods, rewinding product inspection devices and rewinding inspection system
TWI639367B (en) 2017-07-07 2018-10-21 迅得機械股份有限公司 Fpc marking system and method thereof

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US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
EP2437049A1 (en) 2006-10-17 2012-04-04 Nitto Denko Corporation Method and system for laminating optical elements
KR100899558B1 (en) * 2007-05-03 2009-05-27 에버테크노 주식회사 Method for controling marking of polarizing film inspection apparatus
JP4307510B1 (en) * 2007-12-27 2009-08-05 日東電工株式会社 Optical display device manufacturing system and method
US8366858B2 (en) 2007-12-27 2013-02-05 Nitto Denko Corporation Manufacturing system and manufacturing method for optical display device
JP2009244064A (en) * 2008-03-31 2009-10-22 Sumitomo Chemical Co Ltd Inspection method of polarization film
JP4913838B2 (en) 2008-04-14 2012-04-11 日東電工株式会社 Optical display device manufacturing system and optical display device manufacturing method
WO2009128115A1 (en) * 2008-04-15 2009-10-22 日東電工株式会社 Optical film layered roll and method and device for manufacturing the same
JP5415017B2 (en) * 2008-04-28 2014-02-12 日立ビークルエナジー株式会社 Secondary battery, secondary battery manufacturing method, and manufacturing system
KR101380204B1 (en) 2008-12-31 2014-04-01 동우 화인켐 주식회사 Method for removing defects of polarizing plate and system
KR101045852B1 (en) * 2009-03-05 2011-07-01 도판 인사츠 가부시키가이샤 Appearance inspection system
JP2010262265A (en) 2009-04-10 2010-11-18 Nitto Denko Corp Optical film raw roll and method for manufacturing image display apparatus by using the same
JP4628488B1 (en) * 2009-05-15 2011-02-09 日東電工株式会社 Optical display device manufacturing system and method
JP4503692B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Information storage / read operation system and method for manufacturing information storage / read operation system used in apparatus for continuously manufacturing liquid crystal display elements
JP4503693B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Continuous roll of cut-lined optical film laminate in the form of a continuous web, its manufacturing method and manufacturing apparatus
JP4503689B1 (en) * 2009-10-13 2010-07-14 日東電工株式会社 Method and apparatus for continuous production of liquid crystal display elements
JP4503691B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Method and apparatus for continuous production of liquid layer display element
JP4503690B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Information storage / reading system used in an apparatus for continuously manufacturing liquid crystal display elements, and method and apparatus for manufacturing the information storage / reading system
JP5519330B2 (en) * 2010-02-26 2014-06-11 日東電工株式会社 Cutting information determination method, manufacturing method of strip-shaped polarizing sheet using the same, manufacturing method of optical display unit, strip-shaped polarizing sheet, and polarizing sheet original fabric
JP5474869B2 (en) * 2010-09-03 2014-04-16 日東電工株式会社 Method for producing laminate strip roll having polarizing film
JP5668593B2 (en) * 2011-04-25 2015-02-12 コニカミノルタ株式会社 Polarizing plate, manufacturing method thereof, and vertical alignment type liquid crystal display device
CN104204785B (en) * 2012-03-23 2017-03-08 东丽株式会社 The inspection method and check device of tested long products
WO2015068599A1 (en) * 2013-11-05 2015-05-14 シャープ株式会社 Light-diffusing member, inspection device for light-diffusing member, manufacturing device and manufacturing method for light-diffusing member
CN104048973B (en) * 2014-05-28 2016-08-17 苏州科技学院 The light leakage detecting device of web-like shading material
JP2016057271A (en) * 2014-09-12 2016-04-21 昭和電工パッケージング株式会社 Inspection method of exterior film for electrochemical device
CN105784720A (en) * 2014-12-16 2016-07-20 徐帆 Cloth defect detection method and system thereof
JP6682259B2 (en) * 2015-09-29 2020-04-15 キヤノン株式会社 Rotating body for fixing and heating device
JP6604805B2 (en) * 2015-09-30 2019-11-13 日東電工株式会社 Polarizer inspection method and polarizing plate manufacturing method
JP2017075936A (en) * 2015-10-15 2017-04-20 住友化学株式会社 Apparatus for manufacturing optical film and method for manufacturing optical film
KR101748208B1 (en) * 2016-03-07 2017-06-19 동우 화인켐 주식회사 Polarizing and system and method for inspection of sheet-shaped product
AT518443B1 (en) * 2016-03-21 2017-12-15 Softsolution Gmbh Inspection system for optical inspection of a flat glass pane
CN109283243A (en) * 2017-07-19 2019-01-29 迅得机械股份有限公司 Soft board tagging system and method
CN111788066B (en) * 2018-07-08 2022-08-26 洛希亚有限公司 Apparatus and method for managing defects in web material on a converting line
CN110153020A (en) * 2019-05-17 2019-08-23 智翼博智能科技(苏州)有限公司 Polaroid full-automatic charging Mark detection device and detection method
CN110090808A (en) * 2019-05-17 2019-08-06 智翼博智能科技(苏州)有限公司 Polaroid full-automatic charging appearance detecting device and detection method
CN110522068B (en) * 2019-09-18 2022-04-19 湖北中烟工业有限责任公司 Tobacco sheet offset amount detection device and tobacco sheet processing system
JPWO2022107756A1 (en) * 2020-11-18 2022-05-27
CN112830309B (en) * 2020-12-30 2023-03-21 中国特种飞行器研究所 Semi-automatic data acquisition and recording system of rolling and inspecting machine
CN114910483B (en) * 2022-07-15 2022-11-04 中科视语(北京)科技有限公司 Device, method and system for detecting quality of super-crystal plate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI593959B (en) * 2012-10-01 2017-08-01 Dac Engineering Co Ltd Rewinding product inspection methods, rewinding product inspection devices and rewinding inspection system
TWI639367B (en) 2017-07-07 2018-10-21 迅得機械股份有限公司 Fpc marking system and method thereof

Also Published As

Publication number Publication date
CN100491983C (en) 2009-05-27
JP2005114624A (en) 2005-04-28
TWI349771B (en) 2011-10-01
KR20050034539A (en) 2005-04-14
CN1605859A (en) 2005-04-13

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