CN114910483B - Device, method and system for detecting quality of super-crystal plate - Google Patents
Device, method and system for detecting quality of super-crystal plate Download PDFInfo
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- CN114910483B CN114910483B CN202210829120.7A CN202210829120A CN114910483B CN 114910483 B CN114910483 B CN 114910483B CN 202210829120 A CN202210829120 A CN 202210829120A CN 114910483 B CN114910483 B CN 114910483B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/04—Sorting according to size
- B07C5/10—Sorting according to size measured by light-responsive means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
Abstract
The invention relates to the technical field of machine vision, and provides a device, a method and a system for detecting the quality of a superlattice plate, wherein the device for detecting the quality of the superlattice plate comprises: the camera is used for shooting a primer image of the superlattice plate, and the lens of the camera faces the production line of the superlattice plate; the laser displacement sensor is used for measuring the thickness parameter of the superlattice plate; the removing device is used for removing the unqualified superlattice plates from the production line; and the controller is used for receiving the primer image, screening out unqualified superlattice plates based on the primer image and the thickness parameters, and controlling the removing device to remove the unqualified superlattice plates from the production line. According to the device, the method and the system for detecting the quality of the super-crystal board, the unqualified super-crystal board is screened out according to the primer image and the thickness parameter, and the unqualified super-crystal board is removed by controlling the removing device, so that the quality of the super-crystal board can be accurately detected in real time, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
Description
Technical Field
The invention relates to the technical field of machine vision, in particular to a device, a method and a system for detecting the quality of a super-crystal plate.
Background
The super-crystal board is the most commonly used wood board material in the design of cabinets, and is made by using a plane board or a medium density fiberboard as a base material, and performing surface coloring treatment and then priming paint on the surface of the board. The finished product of the superlattice plate should be coated with primer, and the effective adhesion of the primer can ensure the quality of the superlattice plate. Then, before the shipment of the super crystal board, a quality inspection for effective adhesion of the primer needs to be performed on the super crystal board.
At present, the quality of the superlattice plate is detected mainly manually, so that the superlattice plate is dependent on manual experience, the error is large, the efficiency is low, the consumed labor cost is large, and the quality of the superlattice plate is difficult to detect accurately in real time.
Disclosure of Invention
The invention provides a device, a method and a system for detecting the quality of a superlattice plate, which are used for solving the defects that the detection of the quality of the superlattice plate in the prior art is mainly finished manually, so that the quality of the superlattice plate depends on manual experience, the error is large, the efficiency is low, the consumed labor cost is high, the real-time accurate detection of the quality of the superlattice plate is difficult to realize, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
The invention provides a quality detection device of a super-crystal plate, comprising: the camera is used for shooting a primer image of the superlattice plate; the laser displacement sensor is used for measuring the thickness parameter of the superlattice plate; the removing device is used for removing the unqualified superlattice plates from the production line; and the controller is used for receiving the primer image, screening the unqualified superlattice plates based on the primer image and the thickness parameters, and controlling the removing device to remove the unqualified superlattice plates from the production line.
According to the quality detection device of the superlattice plate provided by the invention, the quality detection device of the superlattice plate further comprises: and the controller is further configured to determine the defect position based on the primer image and the thickness parameter before controlling the removing device to remove the unqualified superlattice plate from the production line, and attach the defect position label to the unqualified superlattice plate based on the defect position.
According to the quality detection device for the superlattice plate provided by the invention, the labeling device is used for attaching the self-adhesive label to the target position on the side surface of the unqualified superlattice plate, and the target position is determined based on the flaw position.
According to the quality detection device for the super-crystal plate, provided by the invention, the laser displacement sensors comprise a first laser sensor and a second laser sensor, the first laser sensor and the second laser sensor are respectively positioned at the upper side and the lower side of a production line, and at least two laser displacement sensors are arranged to measure the thickness parameters of the same super-crystal plate at different positions.
According to the quality detection device for the superlattice plate provided by the invention, the quality detection device for the superlattice plate further comprises: the ultraviolet light source faces the production line of the superlattice plate and faces the shooting area of the camera.
According to the quality detection device of the superlattice plate provided by the invention, the included angle between the light emission angle of the ultraviolet light source and the horizontal plane is 30-60 degrees.
According to the quality detection device for the super-crystalline boards, the removing device comprises a lifting mechanism, the controller is further arranged to control the lifting mechanism to lift the unqualified super-crystalline boards to leave the production line, and after a confirmation signal of a user is received, the removing device is controlled to remove the unqualified super-crystalline boards from the production line.
The invention also provides a quality detection method of a super-crystal plate, which is applied to any one of the quality detection devices of the super-crystal plate, and the quality detection method of the super-crystal plate comprises the following steps: acquiring a primer image and a thickness parameter of the superlattice plate; screening out unqualified superlattice plates based on the primer image, the template image, the thickness parameter and the thickness threshold; and outputting a rejection control instruction to the rejection device, and controlling the rejection device to reject the unqualified superlattice plates from the production line.
The invention also provides a system for detecting the quality of a superlattice plate, which is applied to any one of the devices for detecting the quality of the superlattice plate, and the system for detecting the quality of the superlattice plate comprises: the acquisition module is used for acquiring a primer image and a thickness parameter of the superlattice plate; the screening module is used for screening out unqualified superlattice plates based on the primer image, the template image, the thickness parameter and the thickness threshold; and the control module is used for outputting an eliminating control instruction to the eliminating device and controlling the eliminating device to eliminate the unqualified super-crystal boards from the production line.
The invention also provides an electronic device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the program to realize the quality detection method of the superlattice board.
The present invention also provides a non-transitory computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the method of quality inspection of a superlattice as in any one of the above.
According to the device, the method and the system for detecting the quality of the superlattice plate, provided by the invention, the primer image is shot through the camera, the thickness parameter of the superlattice plate is measured through the laser displacement sensor, the controller screens out the unqualified superlattice plate according to the primer image and the thickness parameter, and the rejection device is controlled to reject the unqualified superlattice plate, so that the real-time accurate detection on the quality of the superlattice plate can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic electrical connection diagram of a device for detecting the quality of a superlattice plate provided in the present invention;
FIG. 2 is a schematic structural diagram of a device for detecting the quality of a superlattice plate provided in the present invention;
FIG. 3 is a schematic flow chart of a method for inspecting the quality of a super-crystal plate according to the present invention;
FIG. 4 is a schematic structural diagram of a system for inspecting the quality of a super-crystal plate according to the present invention;
fig. 5 is a schematic structural diagram of an electronic device provided in the present invention.
Reference numerals:
10: a camera; 20: a labeling device; 30: a rejecting device; 40: a controller; 50: a laser displacement sensor; 60: an ultraviolet light source.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
The quality inspection apparatus for a superlattice plate according to the invention is described below with reference to fig. 1 to 5.
As shown in fig. 1 and 2, the present invention provides a quality inspection apparatus for a superlattice plate, which may include: camera 10, laser displacement sensor 50, removing devices 30 and controller 40.
The quality detection device for the super-crystal board can be arranged on a production line of the super-crystal board, and can also comprise a portal frame for fixing. The production line of the superlattice plate can be used for coating primer on the superlattice plate, the production line of the superlattice plate can be provided with a conveyor belt, the superlattice plate coated with the primer can be placed on the conveyor belt, and the conveyor belt can convey the superlattice plate coated with the primer forward in sequence.
Camera 10 can be the monocular camera, also can be the binocular camera, and camera 10's camera lens is towards the production line of super crystal board, and super crystal board quality testing device can also include the darkroom region, and the darkroom region can be the rectangle, and camera 10 can install in the darkroom region, and camera 10 is used for shooing the priming paint image of super crystal board, and the priming paint image indicates that the regional of super crystal board coating has the priming paint image of shooing the acquisition.
The number of the cameras 10 can include a plurality of cameras, a plurality of cameras 10 can be vertically erected above the production line of the superlattice board, and images of the superlattice board below the cameras 10 are collected.
The camera 10 can catch the image in enough big region, guarantees to cover the whole conveyer belt field of vision, and all super crystal plates in the clear snapshot conveyer belt guarantee can not produce the smear phenomenon, can realize that 0.3 mm's problem region detects the precision, utilize camera 10 can replace artifical visual inspection, can maintain staff's visual health, have higher degree of accuracy and production efficiency.
The laser displacement sensor 50 is used to measure the thickness parameter of the superlattice.
It can be understood that the laser displacement sensor 50 can measure the thickness parameter of the superlattice, and can determine whether the superlattice is deformed or not according to the thickness parameter of the superlattice, and the controller 40 can compare the thickness parameter with the thickness threshold value after receiving the thickness parameter, so as to determine whether the superlattice is an unqualified superlattice and screen the unqualified superlattice.
The production line can also be provided with a removing device 30, the removing device 30 can be an electric control element, and the removing device 30 is used for removing the unqualified superlattice plates from the production line, for example, when the controller 40 identifies that a certain superlattice plate is an unqualified superlattice plate, the unqualified superlattice plate can be directly pushed out of the production line, and the process of removing the unqualified superlattice plates from the production line is completed.
The controller 40 is configured to receive the primer image, screen out the unqualified superlattice plates based on the primer image, and control the rejecting device 30 to reject the unqualified superlattice plates from the production line.
It can be understood that the controller 40 is a logic processing center of the quality detection device for the super-crystal board, the controller 40 can perform logic operation, corresponding software algorithms can be stored in the controller 40, the controller 40 can shoot primer images of the super-crystal board through the camera 10, when the camera 10 collects the primer images of the super-crystal board, the primer images of the super-crystal board can be sent to the controller 40, the controller 40 can process the primer images, the primer images can be compared with the template images, and therefore whether the corresponding super-crystal board is an unqualified super-crystal board or not is judged according to the primer images.
In order to rapidly transmit the primer image from the camera 10 to the controller 40, a fiber optic data line may be used as a transmission medium, increasing the transmission speed of the primer image.
It should be noted that the thickness parameter of the super-crystal plate is measured here, and the process of screening the super-crystal plate according to the thickness parameter can be performed synchronously with the process of screening the primer image, that is, the primer image and the thickness parameter can be processed simultaneously, as long as the controller 40 judges that the super-crystal plate is an unqualified super-crystal plate according to any one of the thickness parameter of the super-crystal plate or the primer image, the controller 40 can control the rejecting device 30 to reject the unqualified super-crystal plate from the production line.
The primer image and the thickness parameter are combined, so that the superlattice plate can be comprehensively judged by the two indexes of whether the primer is coated and whether the thickness is deformed, the superlattice plate is considered to be a qualified product only under the condition that the superlattice plate meets the requirements of the two indexes, and the superlattice plate is considered to be an unqualified superlattice plate as long as one of the two indexes does not meet the requirements of the indexes.
The controller 40 can also control the removing device 30 to remove the unqualified superlattice plates from the production line, for example, the unqualified superlattice plates can be pushed out from the production line through the removing device 30, so that the unqualified superlattice plates can fall into the recovery device, and thus, qualified superlattice plate products can be output from the production line.
The controller 40 can adopt an STM32 single chip microcomputer as a core controller 40 and a PD algorithm as a core control algorithm, and the controller 40 can control the labeling device 20 and the removing device 30 according to the stored defective electronic identification. Meanwhile, in order to meet the reaction speed, the labeling device 20 and the removing device 30 can be driven by high-speed motors. The controller 40 can control the high-speed motor to rotate by using a PD algorithm according to the marking and prediction results, so that the unqualified super-crystal boards are removed from the production line by the removing device 30, and the purpose of removing defective products is achieved.
It is worth mentioning that, in the research and development process, with the rise of artificial intelligence and the high-speed development of intelligent technologies, the inventor finds that, at present, the visual identification and detection technology approaches or surpasses the capability of people on more and more tasks, and how to design a set of industrial flaw detection device by using the knowledge of machine vision and artificial intelligence so that the industrial flaw detection device has more excellent performance compared with an artificial quality inspector is a problem worthy of discussion. The following difficulties are encountered in implementing the quality inspection apparatus for the super-crystalline board.
On one hand, the production line has a high running speed, so the super-crystal board quality detection device needs a high-speed camera device to match with an efficient image processing algorithm, and on the other hand, the super-crystal board product has various colors or patterns in the ground color, is complex in type, and needs special light source equipment to supplement light, so that images with obvious discrimination and clear imaging can be obtained under the condition of as much as possible. Therefore, a set of high-performance super-crystal board quality detection device is simultaneously tested on hardware equipment and a software algorithm.
According to the quality detection device for the super-crystal boards, provided by the invention, the camera 10 is used for shooting the primer image, the thickness parameter of the super-crystal boards is measured through the laser displacement sensor, the controller 40 is used for screening out unqualified super-crystal boards according to the primer image and the thickness parameter, and the rejection device 30 is controlled to reject the unqualified super-crystal boards, so that the real-time accurate detection on the quality of the super-crystal boards can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
In some embodiments, the apparatus for inspecting the quality of the ultra-crystal plate further comprises a labeling device 20.
The controller is further configured to determine a flaw position based on the primer image and the thickness parameter before controlling the removing device to remove the unqualified superlattice plate from the production line, and attach a flaw position label to the unqualified superlattice plate based on the flaw position.
It can be understood that the defect position refers to a position area where a defect exists on an unqualified superlattice plate, the controller 40 can position the position where the defect exists on the unqualified superlattice plate according to a primer image after the unqualified superlattice plate is screened out according to the primer image, for example, the primer missing coating problem exists in the middle area of the unqualified superlattice plate, the defect position is the middle area of the unqualified superlattice plate, the primer image and the thickness parameter can be processed by using an image recognition technology, the defect position is positioned, the labeling device 20 can be controlled to attach a defect position label to the unqualified superlattice plate, the label can be made of a non-setting adhesive material, the label can be used for distinguishing the unqualified superlattice plate, a user can find the unqualified superlattice plate in time, and the defect position of the unqualified superlattice plate can be accurately positioned.
After the labeling device 20 attaches the labels at the defect positions to the unqualified superlattice plates, the rejecting device can be controlled to reject the unqualified superlattice plates from the production line, so that the labeling and rejecting processes of the unqualified superlattice plates can be completed quickly on the production line.
In some embodiments, the labeling device 20 is configured to apply a flaw location label to a target location on a side of a rejected superlattice plate, the target location being determined based on the flaw location.
Particularly, the side face of an unqualified superlattice board can be divided into multiple rows, the target position on the side face of the superlattice board, namely the corresponding row, can be determined according to the identified defect position, and the defect position label can be attached to the target position on the side face at the moment, so that a user can visually position the position where the defect is located, the same label paper can be used for the defect position label, marking on the label paper is not needed, cost can be saved, and efficiency is improved.
The labeling device 20 can be used for labeling on a single side, and for the position of the undercoating missing in the superlattice plate, the adhesive label is labeled on the row corresponding to the side of the superlattice plate, the labeling precision can be +/-1.0 mm, and the labeling speed can be more than 60 times/minute.
It is worth mentioning that the self-adhesive label is adopted for attaching, so that the self-adhesive label can be easily removed by a user in the process of maintaining and remanufacturing unqualified superlattice boards, and the marking and distinguishing functions can be completed while the efficiency of subsequent production and processing is improved; the adhesive label is attached to the side face of the superlattice plate, so that the primer area of the superlattice plate can not be covered, shielding or damage to the primer area of the superlattice plate is avoided, and the efficiency of subsequent production and processing can be further improved.
In some embodiments, the laser displacement sensors 50 include a first laser sensor and a second laser sensor, the first laser sensor and the second laser sensor are respectively located at the upper side and the lower side of the production line, and at least two laser displacement sensors 50 are configured to measure the thickness parameters of the same superlattice plate at different positions.
It can be understood that laser displacement sensor 50 can include two parts, be first laser sensor and second laser sensor respectively, it has first laser sensor and second laser sensor to distribute respectively to the upper and lower side at the production line, first laser sensor and second laser sensor can just be to setting up, first laser sensor and second laser sensor's position is relatively fixed, just so can be through to the super crystal board laser of launching, and receive the laser that super crystal board reflects back, measure the distance of a certain side of super crystal board to first laser sensor or second laser sensor, thereby can calculate the thickness of super crystal board.
The quality detection device for the superlattice plate can be provided with at least two laser displacement sensors 50, for example, three laser displacement sensors 50 can be provided, at least two laser displacement sensors 50 are set to measure thickness parameters of different positions of the same superlattice plate, in other words, the thicknesses of different positions on the same superlattice plate can be measured through at least two laser displacement sensors 50, based on comparison between the thicknesses of different positions, whether the superlattice plate is deformed or not can be judged, if the superlattice plate is deformed, the superlattice plate is considered to be an unqualified product, and the unqualified superlattice plate can be screened out quickly and accurately.
For example, the number of the laser displacement sensors 50 may be three, and the three laser displacement sensors 50 respectively detect the thicknesses of the two end surfaces and the central portion of the superlattice plate, wherein the single laser repeat positioning error may be less than 0.1 mm.
Specifically, three pairs of laser displacement sensors 50 may be provided above and below a certain position on the production line through which the super-crystalline board may pass. Aiming at the requirement of the base paint detection of the super-crystal board, a high-efficiency and accurate algorithm is designed, the base paint missing coating detection is carried out on the collected base paint image, the unqualified super-crystal board is screened out, the obtained identification information of the unqualified super-crystal board is transmitted to the labeling device 20 through the controller 40 to be labeled, and the identification information is transmitted to the removing device 30, so that the unqualified super-crystal board is removed on the premise that the production line does not stop. The device has full automatic characteristics, whether the automated inspection keeps watch on the interior unqualified super crystal board that exists of region, if have then mark and reject automatically unqualified super crystal board.
As shown in fig. 1, in some embodiments, the apparatus for quality inspection of a superlattice further comprises: an ultraviolet light source 60.
The ultraviolet light source 60 is directed toward the production line of the superlattice plate and toward the photographing region of the camera 10.
It can be understood that ultraviolet ray can be launched to ultraviolet light source 60, the ultraviolet ray that ultraviolet light source 60 launches is thrown to the shooting area of camera 10, can make the superlattice board reflect more light like this, camera 10 can gather clearer priming paint image, the wave band of ultraviolet light source 60 can adopt the UV385 wave band, the quantity of ultraviolet light source 60 can be two at least, two ultraviolet light source 60 can distribute in camera 10 both sides, place perpendicularly with the assembly line direction, thereby show the promotion image quality.
It is worth mentioning that experiments show that the primer of the super-crystal plate is sensitive to ultraviolet rays, and the ultraviolet light source is adopted to irradiate the super-crystal plate, so that light reflected by the primer of the super-crystal plate is clearer, the primer coating condition can be more completely shown, the quality of a primer image can be improved, and the accuracy of quality detection of the super-crystal plate is improved.
In some embodiments, the light emitting angle of the ultraviolet light source 60 is 30 degrees to 60 degrees, for example, 45 degrees, with respect to the horizontal plane, so as to further improve the imaging quality of the camera 10.
In some embodiments, the rejection device 30 includes a lift mechanism, and the controller 40 is further configured to: and controlling the lifting mechanism to lift the unqualified superlattice plates to leave the production line, and controlling the removing device 30 to remove the unqualified superlattice plates from the production line after receiving a confirmation signal of a user.
It can be understood that the rejecting device 30 can include a lifting mechanism, the lifting mechanism can be driven by a motor, the lifting mechanism can include a power pulley block for raising the unqualified superlattice plate, the controller 40 can lift the unqualified superlattice plate to leave the production line after the unqualified superlattice plate is screened out, so that the output and transmission of subsequent superlattice plate products on the production line cannot be influenced, the controller 40 can also receive a confirmation signal of a user, and after the confirmation signal is received, the controller 40 can control the rejecting device 30 to reject the unqualified superlattice plate from the production line.
Here, the receiving of the confirmation signal of the user may be receiving the confirmation signal through a key, for example, after the user triggers the confirmation key, the controller 40 receives the confirmation signal, or receiving the confirmation signal through a display screen, for example, the user triggers a confirmation control on the display screen, and at this time, the controller 40 receives the confirmation signal, that is, at this time, the user manually confirms the unqualified superlattice plate, and the accuracy of screening the defective products can be further ensured through the combination of machine inspection and human inspection.
As shown in fig. 3, the present invention further provides a method for detecting the quality of a super-crystalline board, which is applied to the device for detecting the quality of a super-crystalline board according to any of the above embodiments, and the method for detecting the quality of a super-crystalline board includes: steps 310 through 330 are as follows.
In step 310, a primer image and thickness parameters of the superlattice plate are obtained.
It is understood that the controller 40 may capture the primer image of the superlattice plate through the camera 10, and when the camera 10 captures the primer image of the superlattice plate, the primer image of the superlattice plate may be sent to the controller 40. The laser displacement sensor 50 can measure the thickness parameter of the superlattice plate, and whether the superlattice plate deforms or not can be judged according to the thickness parameter of the superlattice plate.
And 320, screening out unqualified superlattice plates based on the primer image, the template image, the thickness parameter and the thickness threshold.
It is understood that the controller 40 may pre-process the inputted primer image, then detect whether the primer image has a primer missing area, and record the position of the primer missing area and the defective number, thereby screening out the unqualified super-crystalline boards without affecting the production line.
Specifically, in order to simultaneously ensure the clarity and high-speed processing speed of the image, a YOLOv5 frame based on a template difference method can be adopted, the primer image and the template image can be scaled to 384 × 384, the two depth features are obtained through processing of a depth convolution neural network after data enhancement, self-adaptive anchor frame calculation and self-adaptive image scaling, the two depth features are subtracted to obtain a depth feature difference, finally, two convolution layers are used for detecting the depth feature difference to detect the primer missing coating area, so that whether the primer missing coating area exists in the image or not is determined, the missing coating area is recorded, and the unqualified superlattice plate is screened out.
The controller 40, upon receiving the thickness parameter, may compare the thickness parameter with a thickness threshold to determine whether the super-crystalline board is an unqualified super-crystalline board, and screen the unqualified super-crystalline board. The thickness parameter of the superlattice plate is measured, the superlattice plate is screened according to the thickness parameter, the screening process can be synchronous with the primer image screening process, namely, the primer image and the thickness parameter can be processed simultaneously, and the controller 40 can control the removing device 30 to remove the unqualified superlattice plate from the production line as long as the controller 40 judges that the superlattice plate is an unqualified superlattice plate according to any one of the thickness parameter of the superlattice plate or the primer image.
And 330, outputting a removing control instruction to the removing device 30, and controlling the removing device 30 to remove the unqualified superlattice plates from the production line.
It can be understood that, after the controller 40 screens out the unqualified superlattice plates according to the primer images, the controller 40 may control the rejecting device 30 to reject the unqualified superlattice plates from the production line, for example, the unqualified superlattice plates may be pushed out from the production line by the rejecting device 30, so that the unqualified superlattice plates may fall into the recycling device, and thus it can be ensured that the qualified superlattice plate products are output from the production line.
According to the quality detection method of the superlattice plate, the camera 10 is used for shooting the primer image, the thickness parameter of the superlattice plate is measured through the laser displacement sensor, the controller 40 is used for screening out the unqualified superlattice plate according to the primer image and the thickness parameter, and the rejection device 30 is controlled to reject the unqualified superlattice plate, so that the real-time accurate detection on the quality of the superlattice plate can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
The following describes the system for detecting the quality of the super-crystal board provided by the invention, and the system for detecting the quality of the super-crystal board described below and the method for detecting the quality of the super-crystal board described above can be referred to correspondingly.
As shown in fig. 4, the present invention further provides a system for detecting the quality of a super-crystal board, which is applied to the device for detecting the quality of a super-crystal board according to the above embodiment, and the system for detecting the quality of a super-crystal board comprises: an acquisition module 410, a screening module 420, and a control module 430.
An obtaining module 410 is used for obtaining a primer image of the superlattice plate.
And the screening module 420 is used for screening out unqualified superlattice plates based on the primer images and the template images.
And the control module 430 is used for outputting a rejection control instruction to the rejection device 30 and controlling the rejection device 30 to reject the unqualified superlattice plates from the production line.
According to the system for detecting the quality of the super-crystal board, provided by the invention, the camera 10 is used for shooting the primer image, the thickness parameter of the super-crystal board is measured through the laser displacement sensor, the controller 40 is used for screening out the unqualified super-crystal board according to the primer image and the thickness parameter, and the rejecting device 30 is controlled to reject the unqualified super-crystal board, so that the real-time accurate detection of the quality of the super-crystal board can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
Fig. 5 illustrates a physical structure diagram of an electronic device, which may include, as shown in fig. 5: a processor (processor) 510, a communication Interface (Communications Interface) 520, a memory (memory) 530 and a communication bus 540, wherein the processor 510, the communication Interface 520 and the memory 530 communicate with each other via the communication bus 540. The processor 510 may invoke logic instructions in the memory 530 to perform a method of quality inspection of a super-chip board, the method comprising: acquiring a primer image of the superlattice plate; screening the unqualified superlattice board based on the primer image and the template image; and outputting a rejection control instruction to the rejection device 30, and controlling the rejection device 30 to reject the unqualified super-crystalline boards from the production line.
According to the electronic equipment provided by the invention, the camera 10 is used for shooting the primer image, the thickness parameter of the superlattice is measured through the laser displacement sensor, the controller 40 is used for screening out the unqualified superlattice plates according to the primer image and the thickness parameter, and the rejecting device 30 is controlled to reject the unqualified superlattice plates, so that the real-time accurate detection on the quality of the superlattice plates can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
Furthermore, the logic instructions in the memory 530 may be implemented in the form of software functional units and stored in a computer readable storage medium when the software functional units are sold or used as independent products. Based on such understanding, the technical solution of the present invention or a part thereof which substantially contributes to the prior art may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, and various media capable of storing program codes.
In another aspect, the present invention also provides a computer program product, the computer program product comprising a computer program, the computer program being stored on a non-transitory computer-readable storage medium, wherein when the computer program is executed by a processor, the computer is capable of executing the method for detecting the quality of a super-crystal plate provided by the above methods, the method comprising: acquiring a primer image of the superlattice plate; screening the unqualified superlattice board based on the primer image and the template image; and outputting a rejection control instruction to the rejection device 30, and controlling the rejection device 30 to reject the unqualified super-crystalline boards from the production line.
According to the computer program product provided by the invention, the camera 10 is used for shooting the primer image, the thickness parameter of the superlattice is measured through the laser displacement sensor, the controller 40 is used for screening out the unqualified superlattice plates according to the primer image and the thickness parameter, and the rejecting device 30 is controlled to reject the unqualified superlattice plates, so that the real-time accurate detection on the quality of the superlattice plates can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
In yet another aspect, the present invention also provides a non-transitory computer-readable storage medium having stored thereon a computer program, which when executed by a processor, implements a method for quality inspection of a superlattice provided by the above methods, the method comprising: acquiring a primer image of the superlattice plate; screening the unqualified superlattice board based on the primer image and the template image; and outputting a rejection control instruction to the rejection device 30, and controlling the rejection device 30 to reject the unqualified super-crystalline boards from the production line.
According to the non-transitory computer readable storage medium provided by the invention, the camera 10 is used for shooting the primer image, the thickness parameter of the superlattice is measured through the laser displacement sensor, the controller 40 is used for screening out the unqualified superlattice plates according to the primer image and the thickness parameter, and the rejecting device 30 is controlled to reject the unqualified superlattice plates, so that the real-time accurate detection on the quality of the superlattice plates can be realized, the detection error can be reduced, the detection efficiency is improved, and the labor cost is reduced.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment may be implemented by software plus a necessary general hardware platform, and may also be implemented by hardware. Based on the understanding, the above technical solutions substantially or otherwise contributing to the prior art may be embodied in the form of a software product, which may be stored in a computer-readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method according to the various embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (7)
1. A quality detection device for a super-crystal plate is characterized by comprising:
the camera is used for shooting a primer image of the superlattice plate;
the laser displacement sensor is used for measuring the thickness parameter of the superlattice plate;
the rejecting device is used for rejecting unqualified superlattice plates from a production line;
the controller is used for receiving the primer image, screening the unqualified superlattice plates based on the primer image, the template image and the thickness parameter, and controlling the removing device to remove the unqualified superlattice plates from a production line;
the rejecting device comprises a lifting mechanism, the controller is further arranged to control the lifting mechanism to lift the unqualified superlattice plates to leave the production line, and after a confirmation signal of a user is received, the rejecting device is controlled to reject the unqualified superlattice plates from the production line;
further comprising: the controller is further configured to determine a defect position based on the primer image and the thickness parameter before the reject device is controlled to reject the unqualified superlattice plate from the production line, and attach a defect position label to the unqualified superlattice plate based on the defect position;
the labeling device is used for attaching a defective position label to a target position on the side face of the unqualified superlattice plate, the target position is determined based on the defective position, and the defective position label comprises a self-adhesive label.
2. The apparatus according to claim 1, wherein the laser displacement sensor comprises a first laser sensor and a second laser sensor, the first laser sensor and the second laser sensor are respectively located at upper and lower sides of the production line, and at least two of the laser displacement sensors are configured to measure thickness parameters of the same superlattice plate at different positions.
3. The apparatus according to claim 1, further comprising:
the ultraviolet light source faces the production line of the superlattice plate and faces the shooting area of the camera.
4. The apparatus according to claim 3, wherein the angle between the light emission angle of the UV light source and the horizontal plane is 30 to 60 degrees.
5. A method for detecting the quality of a superlattice plate, which is applied to the superlattice plate quality detection apparatus as claimed in any one of claims 1 to 4, and comprises:
acquiring a primer image and a thickness parameter of the superlattice plate;
screening out unqualified superlattice plates based on the primer image, the template image, the thickness parameter and the thickness threshold;
and outputting a rejection control instruction to a rejection device, and controlling the rejection device to reject the unqualified superlattice plates from the production line.
6. A quality inspection system for a super-crystal plate, which is applied to the quality inspection apparatus for a super-crystal plate according to any one of claims 1 to 4, the system comprising:
the acquisition module is used for acquiring a primer image and a thickness parameter of the superlattice plate;
the screening module is used for screening out unqualified superlattice plates based on the primer image, the template image, the thickness parameter and the thickness threshold;
and the control module is used for outputting an eliminating control instruction to an eliminating device and controlling the eliminating device to eliminate the unqualified superlattice plates from the production line.
7. A non-transitory computer-readable storage medium having stored thereon a computer program, wherein the computer program, when executed by a processor, implements the method of quality inspection of a superlattice according to claim 5.
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| CN203929667U (en) * | 2014-07-09 | 2014-11-05 | 广州中国科学院沈阳自动化研究所分所 | Ceramic Tiles non-destructive detecting device |
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