TW200516262A - Method of measuring relative dielectric constant of dielectric substance of powders, cavity resonator used in the same, and application apparatus - Google Patents
Method of measuring relative dielectric constant of dielectric substance of powders, cavity resonator used in the same, and application apparatusInfo
- Publication number
- TW200516262A TW200516262A TW093129355A TW93129355A TW200516262A TW 200516262 A TW200516262 A TW 200516262A TW 093129355 A TW093129355 A TW 093129355A TW 93129355 A TW93129355 A TW 93129355A TW 200516262 A TW200516262 A TW 200516262A
- Authority
- TW
- Taiwan
- Prior art keywords
- dielectric constant
- relative dielectric
- powders
- same
- application apparatus
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P7/00—Resonators of the waveguide type
- H01P7/06—Cavity resonators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
A relative dielectric constant of a mixed substance consisting of powders and a liquid medium is calculated, and then the relative dielectric constant of the mixed substance or a relative dielectric constant of the liquid medium is calculated as a relative dielectric constant of the powders when the relative dielectric constant of the mixed substance 18 becomes equal to a relative dielectric constant of the liquid medium. Therefore, the relative dielectric constant of the powders can be measured with high precision even in a high-frequency band in excess of several GHz.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003372581 | 2003-10-31 | ||
JP2003375478 | 2003-11-05 | ||
JP2004078519A JP4729856B2 (en) | 2003-10-31 | 2004-03-18 | Method for measuring relative permittivity of dielectric material of powder |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200516262A true TW200516262A (en) | 2005-05-16 |
TWI244552B TWI244552B (en) | 2005-12-01 |
Family
ID=34426701
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093129355A TWI244552B (en) | 2003-10-31 | 2004-09-29 | Method of measuring relative dielectric constant of dielectric substance of powders, cavity resonator used in the same, and application apparatus |
Country Status (7)
Country | Link |
---|---|
US (2) | US7199591B2 (en) |
EP (1) | EP1528618B1 (en) |
JP (1) | JP4729856B2 (en) |
KR (1) | KR100703241B1 (en) |
CN (1) | CN1641370B (en) |
DE (1) | DE602004030529D1 (en) |
TW (1) | TWI244552B (en) |
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ES2255388B1 (en) * | 2004-05-14 | 2008-02-01 | Universidad Politecnica De Valencia | MICROWAVE SENSOR AND METHOD TO MEASURE THE DEGRADATION OF FLUID COMPONENTS OF FOOTWEAR FLOORS. |
JP2007047072A (en) * | 2005-08-11 | 2007-02-22 | Murata Mfg Co Ltd | Dielectric constant measuring device and dielectric constant measuring method |
JP2007263625A (en) * | 2006-03-27 | 2007-10-11 | Hokkaido Univ | Device and method for measuring complex dielectric constant |
JP5132145B2 (en) * | 2006-12-26 | 2013-01-30 | 京セラ株式会社 | Measuring method of dielectric constant of powder |
US7821269B2 (en) * | 2007-06-08 | 2010-10-26 | Vladimir Petrovsky | Method for determining the dielectric constant of particles |
JP2009222673A (en) * | 2008-03-18 | 2009-10-01 | Panasonic Corp | Powder physical property measurement method and powder physical property measurement device |
CN101957404B (en) * | 2009-07-20 | 2013-08-14 | 中国科学院遥感应用研究所 | Microwave measurement method of dielectric constant of grain pile |
GB2492144B (en) | 2011-06-23 | 2013-10-30 | Schlumberger Holdings | Matrix permittivity determination |
RU2474830C1 (en) * | 2011-08-12 | 2013-02-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Омский государственный педагогический университет" (ОмГПУ) | Method to measure comprehensive dielectric permeability of liquid and loose substances in wide range of frequencies |
RU2509315C2 (en) * | 2012-05-11 | 2014-03-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Омский государственный педагогический университет" ОмГПУ | Method to measure complex dielectric permeability of liquid and loose substances |
CN102818937A (en) * | 2012-09-08 | 2012-12-12 | 苏州大学 | Method for measuring dielectric constant of solid matter |
CN103323678B (en) * | 2013-06-07 | 2015-08-12 | 中国水电顾问集团贵阳勘测设计研究院 | A kind of method of on-the-spot test Rock And Soil relative dielectric constant |
US9234925B2 (en) * | 2013-06-10 | 2016-01-12 | Korea Advanced Institute Of Science And Technology | Apparatus and method for measuring dielectric constant |
EP3155441A4 (en) | 2014-06-06 | 2017-12-20 | CTS Corporation | Radio frequency state variable measurement system and method |
WO2016003445A1 (en) * | 2014-07-01 | 2016-01-07 | Hewlett-Packard Development Company, L.P. | Estimating circuit board characteristics |
KR101461227B1 (en) * | 2014-07-11 | 2014-11-18 | 김광연 | Apparatus and method for use in measuring powder thickness deposited on the inner surface of pipe |
CN104950184B (en) * | 2015-06-04 | 2017-08-11 | 电子科技大学 | The broadband alternating temperature dielectric constant test system of solid and dusty material |
JP6178946B1 (en) * | 2015-10-15 | 2017-08-09 | 白石工業株式会社 | Method for calculating dielectric constant of particle-dispersed composite material and method for evaluating dispersibility |
CN105629078A (en) * | 2015-12-24 | 2016-06-01 | 河南师范大学 | Micro-quantity liquid dielectric constant test sensor |
CN105929240B (en) * | 2016-05-04 | 2018-11-23 | 南京大学 | Measure the Resonator device and measurement method of the impedance of high-temperature superconducting thin film Surface Intrinsic |
EP3492911A1 (en) * | 2017-11-29 | 2019-06-05 | Heraeus Quarzglas GmbH & Co. KG | Method for determining the concentration of an additional component in a body made from ceramic or glassy material |
US10542906B2 (en) | 2018-04-25 | 2020-01-28 | Spectrohm, Inc. | Tomographic systems and methods for determining characteristics of inhomogenous specimens using guided electromagnetic fields |
KR102164927B1 (en) | 2019-06-17 | 2020-10-13 | 동의대학교 산학협력단 | A Q measurement method of a lossy coupled cavity resonator |
JP7471587B2 (en) | 2020-05-20 | 2024-04-22 | Emラボ株式会社 | Split rectangular parallelepiped resonator and method for measuring dielectric constant using the same |
CN112526218B (en) * | 2020-11-19 | 2021-10-15 | 华中科技大学 | Method and system for measuring relative dielectric constant of liquid |
CN112444681B (en) * | 2020-11-30 | 2022-07-15 | 山东国瓷功能材料股份有限公司 | Dielectric material testing system, method, device and platform |
CN113655287A (en) * | 2021-08-05 | 2021-11-16 | 华南理工大学 | Planar dielectric constant broadband test structure and test method thereof |
TWI783719B (en) * | 2021-10-07 | 2022-11-11 | 南亞塑膠工業股份有限公司 | Method for calculating the dielectric constant and dielectric loss of a polymer material |
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-
2004
- 2004-03-18 JP JP2004078519A patent/JP4729856B2/en not_active Expired - Fee Related
- 2004-09-17 US US10/942,900 patent/US7199591B2/en not_active Expired - Fee Related
- 2004-09-29 TW TW093129355A patent/TWI244552B/en not_active IP Right Cessation
- 2004-10-01 EP EP04023517A patent/EP1528618B1/en not_active Expired - Fee Related
- 2004-10-01 DE DE602004030529T patent/DE602004030529D1/en active Active
- 2004-10-29 KR KR1020040087368A patent/KR100703241B1/en not_active IP Right Cessation
- 2004-10-29 CN CN2004100877679A patent/CN1641370B/en not_active Expired - Fee Related
-
2006
- 2006-12-15 US US11/611,209 patent/US20070085552A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
TWI244552B (en) | 2005-12-01 |
US20050093555A1 (en) | 2005-05-05 |
CN1641370A (en) | 2005-07-20 |
EP1528618B1 (en) | 2010-12-15 |
KR20050041978A (en) | 2005-05-04 |
KR100703241B1 (en) | 2007-04-03 |
US7199591B2 (en) | 2007-04-03 |
EP1528618A1 (en) | 2005-05-04 |
US20070085552A1 (en) | 2007-04-19 |
JP2005156523A (en) | 2005-06-16 |
JP4729856B2 (en) | 2011-07-20 |
CN1641370B (en) | 2010-12-08 |
DE602004030529D1 (en) | 2011-01-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |