CN112444681B - Dielectric material testing system, method, device and platform - Google Patents
Dielectric material testing system, method, device and platform Download PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention provides a dielectric material testing system, a method, a device and a platform, wherein the system comprises a network analyzer, a dynamic cut-off frequency filter, a dynamic frequency reading device and a quasi-optical cavity; the electromagnetic wave output by the network analyzer is filtered by the dynamic cut-off frequency filter, and then resonance is formed in the quasi-optical cavity; the filter parameters of the dynamic cut-off frequency filter are determined based on the quasi-optical cavity resonant frequency in the quasi-optical cavity, and the quasi-optical cavity resonant frequency is acquired by the dynamic frequency reading device. The system, the method, the device and the platform provided by the invention filter out non-TEM in the quasi-optical cavity by additionally arranging the dynamic cut-off frequency filter and the dynamic frequency reading device00qModulo such that measurement of Q is not subject to non-TEM00qThe influence of the mode ensures the authenticity of the Q value obtained by measurement, further ensures the reliability of dielectric material measurement and improves the precision of dielectric material measurement.
Description
Technical Field
The invention relates to the technical field of microwaves, in particular to a system, a method, a device and a platform for testing a dielectric material.
Background
At present, the performance test of the dielectric material is usually realized by a network parameter method and a resonant cavity method, and compared with the network parameter method, the resonant cavity method is more suitable for the test of the low-loss material and has higher test precision.
The resonant cavity method comprises a cylindrical high Q method, a dielectric resonator method, a strip line resonant method, a rectangular cavity method, an open resonant cavity method and the like, wherein the open resonant cavity method is suitable for the dielectric property test of the dielectric material in the millimeter wave frequency band. Common open resonant cavity structures include a double-flat cavity structure, a flat cavity structure and a double-cavity structure, wherein the flat cavity structure has the advantages of simple structure, convenience in sample loading and the like.
The basic mode of the working mode of the resonant cavity with the flat concave cavity structure is TEM00qThe diffraction loss is small, and the electromagnetic wave beams can establish stable oscillation in the cavity, so that the resonant cavity of the flat concave cavity structure has a high Q value and can achieve high test precision.
In the article "A new open-responder technique at 60GHz for qualification and loss-probability measurement of low-loss materials" by Mohammed N, the characteristic equation for solving the quasi-optical cavity is introduced:
in the formula, tan δ is a loss tangent.
Wherein:
k＝2π/λ
as can be seen from the two characteristic equations solved by the quasi-optical cavity, namely the two characteristic equations of dielectric constant solution and loss solution, the loss of the sample is equal to the Q value (Q) before the sample is loaded0) And Q value (Q) after sample loadingL) In this regard, the accuracy of the Q value directly affects the authenticity of the loss value. Fundamental mode TEM at high frequencies00qWill parasitize nearbyMultiple non-TEM00qThe mode causes the Q value obtained by the test to deviate from the true value, and the test precision is influenced.
Disclosure of Invention
The invention provides a dielectric material testing system, a dielectric material testing method, a dielectric material testing device and a dielectric material testing platform, which are used for solving the problem that the testing precision is influenced by the existence of a non-TEM 00q mode in the existing quasi-optical cavity testing scheme.
The invention provides a dielectric material testing system, which comprises a network analyzer, a dynamic cut-off frequency filter, a dynamic frequency reading device and a quasi-optical cavity, wherein the network analyzer is used for analyzing a signal of a dielectric material;
the electromagnetic wave output by the network analyzer is filtered by the dynamic cut-off frequency filter, and then resonance is formed in the quasi-optical cavity;
the filter parameters of the dynamic cut-off frequency filter are determined based on the quasi-optical cavity resonant frequency in the quasi-optical cavity, and the quasi-optical cavity resonant frequency is acquired by the dynamic frequency reading device.
According to the dielectric material testing system provided by the invention, the dynamic frequency reading device is used for collecting the resonant frequency of the quasi-optical cavity and determining the resonant frequency of a fundamental mode based on the resonant frequency of the quasi-optical cavity;
the dynamic cut-off frequency filter is used for determining a higher-order mode resonant frequency of a non-fundamental mode based on the fundamental mode resonant frequency and filtering the electromagnetic wave based on the higher-order mode resonant frequency.
According to the invention, the dielectric material test system is provided, and the dynamic cut-off frequency filter comprises a filter analysis module and a filter module;
the filtering analysis module is used for determining the higher mode resonant frequency of a non-fundamental mode based on the fundamental mode resonant frequency and configuring a filtering cut-off frequency for the filtering module based on the higher mode resonant frequency;
the filtering module is used for filtering a resonance peak generated by a high-order mode in the electromagnetic wave.
According to the present invention there is provided a dielectric material testing system, the filter module comprising at least one of a low pass filter, a high pass filter and a band pass filter.
According to the present invention there is provided a dielectric material testing system, the filter cut-off frequency comprising at least one of a low-pass cut-off frequency, a high-pass cut-off frequency and a band-pass cut-off frequency.
According to the invention, the dielectric material testing system is provided, and the dynamic frequency reading device comprises a reading module, a reading analysis module and a storage module;
the reading module is used for collecting the resonant frequency of the quasi-optical cavity;
the reading analysis module is used for determining a fundamental mode resonance frequency based on the quasi-optical cavity resonance frequency;
the storage module is used for storing the resonance frequency of the basic mode.
The invention provides a dielectric material testing system, which also comprises a quasi-optical cavity control device;
the quasi-optical cavity control device is used for controlling the test position of the dielectric material to be tested in the quasi-optical cavity based on the resonant frequency of the quasi-optical cavity.
The invention also provides a test method based on the dielectric material test system, which comprises the following steps:
determining a cavity f value and a load f value of the quasi-optical cavity;
determining a cavity Q value and a load Q value of the quasi-optical cavity;
and determining the dielectric constant and/or the loss tangent value of the dielectric material based on the cavity f value, the load f value, the cavity Q value and the load Q value.
The invention also provides a testing device based on the dielectric material testing system, which comprises:
the f value determining unit is used for determining a cavity f value and a load f value of the quasi-optical cavity;
the Q value determining unit is used for determining a cavity Q value and a load Q value of the quasi-optical cavity;
and the test result determining unit is used for determining the dielectric constant and/or the loss tangent value of the dielectric material based on the cavity f value, the load f value, the cavity Q value and the load Q value.
The invention also provides a dielectric material testing platform which comprises the dielectric material testing system and the testing device.
The dielectric material testing system, method, device and platform provided by the invention filter out non-TEM in the quasi-optical cavity by adding the dynamic cut-off frequency filter and the dynamic frequency reading device00qModulo such that measurement of Q is not subject to non-TEM00qDue to the influence of the mold, the authenticity of the measured Q value is ensured, the reliability of the dielectric material measurement is further ensured, and the precision of the dielectric material measurement is improved.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a system for testing a dielectric material according to the present invention;
FIG. 2 is a second schematic diagram of a system for testing a dielectric material according to the present invention;
FIG. 3 is a schematic flow chart of a testing method provided by the present invention;
FIG. 4 is a schematic structural diagram of a dielectric material testing apparatus provided in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic structural diagram of a dielectric material testing system according to the present invention, and as shown in fig. 1, the dielectric material testing system includes a network analyzer 110, a dynamic cut-off frequency filter 120, a dynamic frequency reading device 130, and a quasi-optical cavity 140; wherein, the electromagnetic wave output by the network analyzer 110 is filtered by the dynamic cut-off frequency filter 120 and forms resonance in the quasi-optical cavity 140; the filter parameters of dynamic cut-off frequency filter 120 are determined based on the quasi-optical cavity resonant frequency within quasi-optical cavity 140, which is acquired by dynamic frequency reading device 130.
Specifically, in general, the dielectric material testing system includes a network analyzer 110 and a quasi-optical cavity 140, wherein the network analyzer 110 is configured to generate and output electromagnetic waves required for testing the dielectric material, the quasi-optical cavity 140 is connected to the network analyzer 110, and the electromagnetic waves output by the network analyzer 110 enter the quasi-optical cavity 140 to be propagated and distributed in the form of gaussian beams. Here, the quasi-optical cavity 140 of the flat concave cavity structure is a microwave resonator composed of a plane mirror and a spherical mirror, and can be used for broadband complex permittivity measurement of dielectric materials.
Mode TEM of operation of quasi-optical cavity 140 taking into account the flat-cavity structure00qMany non-TEMs will be parasitic in the vicinity00qMode, which causes the Q value obtained by the test to deviate from the true value, the embodiment of the present invention adds a dynamic cut-off frequency filter 120 and a dynamic frequency reading device 130 in the existing system, where the dynamic cut-off frequency filter 120 is disposed in the connection path between the network analyzer 110 and the collimating cavity 140; the dynamic frequency reading device 130 is connected to the quasi-optical cavity 140, the dynamic cut-off frequency filter 120, and the network analyzer 110.
During application of the dielectric material testing system, the network analyzer 110 outputs electromagnetic waves and transmits them into the quasi-optical cavity 140 through the dynamic cut-off frequency filter 120, establishing stable oscillation in the quasi-optical cavity 140. The dynamic frequency reading device 130 collects the quasi-optical cavity resonant frequency in the quasi-optical cavity 140 and transmits the quasi-optical cavity resonant frequency or the information determined by the quasi-optical cavity resonant frequency to the dynamic cut-off frequency filter 120, so that the dynamic cut-off frequency filter 120 can dynamically adjust its cut-off frequency based on the quasi-optical cavity resonant frequency or the information determined by the quasi-optical cavity resonant frequency, thereby filtering out the electromagnetic wave output by the network analyzer 110, which may be directed to the Q valueMeasuring non-TEM's contributing to influence00qMode, in particular non-TEM00qHigher order modes in the mode such that only the fundamental mode TEM remains in the electromagnetic wave passing through the dynamic cut-off frequency filter 120 into the interior of the excimer cavity 14000qThe single peak improves the accuracy of the Q value obtained by testing, and further ensures the accuracy of dielectric material measurement.
The test system provided by the embodiment of the invention filters the non-TEM in the quasi-optical cavity by additionally arranging the dynamic cut-off frequency filter and the dynamic frequency reading device00qModulo such that measurement of Q is not subject to non-TEM00qDue to the influence of the mold, the authenticity of the measured Q value is ensured, the reliability of the dielectric material measurement is further ensured, and the precision of the dielectric material measurement is improved.
Based on the embodiment, the dynamic frequency reading device is used for collecting the quasi-optical cavity resonant frequency and determining the fundamental mode resonant frequency based on the quasi-optical cavity resonant frequency; the dynamic cut-off frequency filter is used for determining the higher-order mode resonant frequency of the non-fundamental mode based on the fundamental mode resonant frequency and filtering the electromagnetic wave based on the higher-order mode resonant frequency.
In particular, the dynamic frequency reading device, in addition to being used to acquire the quasi-optical cavity resonant frequency, is also used to determine the fundamental mode resonant frequency, here the fundamental mode resonant frequency, i.e. TEM, based on the quasi-optical cavity resonant frequency00qThe resonant frequency of a mode is typically represented as the frequency at which a single peak is located at a more intermediate position in the resonant frequency of each of the quasi-optical cavities.
The dynamic frequency reading means may transmit the fundamental mode resonance frequency to the dynamic cut-off frequency filter after analyzing the fundamental mode resonance frequency. The dynamic cut-off frequency filter, upon receiving the fundamental mode resonant frequency, may determine a higher order mode resonant frequency of a non-fundamental mode, i.e., non-TEM, based on the fundamental mode resonant frequency00qMode, higher harmonic frequency of fundamental mode, i.e. non-TEM00qThe resonant frequency of the higher order mode of the mode is generally represented as the frequency at the two sides of the resonant frequency of the fundamental mode in the resonant frequency of each of the quasi-optical cavities.
After the dynamic frequency reading device determines the higher-order mode resonant frequency of the non-fundamental mode, the cut-off frequency of the filter can be configured based on the higher-order mode resonant frequency of the non-fundamental mode, so that the higher-order mode harmonic in the electromagnetic wave can be filtered.
Based on any of the above embodiments, the dynamic cut-off frequency filter includes a filtering analysis module and a filtering module; the filtering analysis module is used for determining the higher-order mode resonant frequency of the non-fundamental mode based on the fundamental mode resonant frequency and configuring filtering cut-off frequency for the filtering module based on the higher-order mode resonant frequency; the filtering module is used for filtering a resonance peak generated by a high-order mode in the electromagnetic wave.
Specifically, the filter analysis module may be a processing unit built in the dynamic cut-off frequency filter for implementing filter cut-off frequency-dependent calculation and configuration, so that the filter module in the dynamic cut-off frequency filter can perform a filtering operation on the input electromagnetic wave based on the configured filter cut-off frequency.
The filtering analysis module can determine the higher order mode resonant frequency of the non-fundamental mode based on the fundamental mode resonant frequency, namely, the frequency to be filtered is determined, and the filtering cut-off frequency is determined on the basis, wherein the filtering cut-off frequency is set in cooperation with the type of the filtering module, and after the filtering module is configured with the filtering cut-off frequency, the filtering module can filter a harmonic peak generated by the higher order mode of the non-fundamental mode in the input electromagnetic wave.
In any of the above embodiments, the filtering module includes at least one of a low-pass filter, a high-pass filter, and a band-pass filter. Accordingly, the filter cutoff frequency includes at least one of a low-pass cutoff frequency, a high-pass cutoff frequency, and a band-pass cutoff frequency.
The low-pass filter is an electronic filter device that allows a signal lower than a cutoff frequency to pass but does not allow a signal higher than the cutoff frequency to pass, and the low-pass filter may select a frequency lower than the high-order mode resonance frequency and higher than the fundamental mode resonance frequency as the low-pass cutoff frequency for filtering when the high-order mode resonance frequency of the non-fundamental mode is higher than the fundamental mode resonance frequency.
The high-pass filter is an electronic filter device that allows a signal higher than a cutoff frequency to pass but does not allow a signal lower than the cutoff frequency to pass, and the high-pass filter may select a frequency higher than a higher-order mode resonance frequency and lower than a fundamental mode resonance frequency as a high-pass cutoff frequency for filtering when a higher-order mode resonance frequency of a non-fundamental mode is lower than the fundamental mode resonance frequency.
The band-pass filter is an electronic filtering device which allows waves in a specific frequency band to pass through and shields other frequency bands, and two upper and lower limit cut-off frequencies corresponding to the band-pass filter are the band-pass cut-off frequencies. Under the condition that a higher-order mode resonant frequency higher than the fundamental mode resonant frequency and a higher-order mode resonant frequency lower than the fundamental mode resonant frequency exist, the frequency smaller than the higher-order mode resonant frequency and larger than the fundamental mode resonant frequency can be selected as an upper limit band-pass cut-off frequency, and the frequency larger than the higher-order mode resonant frequency and smaller than the fundamental mode resonant frequency can be selected as a lower limit band-pass cut-off frequency for filtering.
Based on any of the above embodiments, the dynamic frequency reading device includes a reading module, a reading analysis module, and a storage module; the reading module is used for collecting the resonant frequency of the quasi-optical cavity; the reading analysis module is used for determining the resonance frequency of the fundamental mode based on the resonance frequency of the quasi-optical cavity; the storage module is used for storing the resonance frequency of the fundamental mode.
Here, the reading module may be a frequency sensor built in the dynamic frequency reading device, the reading module is connected to the reading analysis module, and the reading module may transmit the quasi-optical cavity resonant frequency to the reading analysis module after acquiring the quasi-optical cavity resonant frequency. The reading analysis module may be a processing unit built in the dynamic frequency reading apparatus, and after receiving the quasi-optical cavity resonant frequency, the reading analysis module may analyze the fundamental mode TEM based on the quasi-optical cavity resonant frequency00qThe resonant frequency of (c). The reading and analyzing module is further connected with the storage module, and after the reading and analyzing module determines the fundamental mode resonant frequency, the reading and analyzing module can transmit the fundamental mode resonant frequency to the storage module for storage. Here, the storage module may be a memory built in the dynamic frequency reading apparatus.
In addition, the dynamic frequency reading device may further include a transmission module, and the transmission module may read the fundamental mode resonance frequency stored in the storage module and transmit the fundamental mode resonance frequency to the dynamic cut-off frequency filter.
Based on any of the above embodiments, fig. 2 is a second schematic structural diagram of the dielectric material testing system provided by the present invention, and as shown in fig. 2, the dielectric material testing system further includes a quasi-optical cavity control device 150; quasi-optical cavity control device 150 is used to control the test position of the dielectric material to be tested in quasi-optical cavity 140 based on the quasi-optical cavity resonant frequency.
Specifically, the quasi-optical cavity control device 150 is connected to the quasi-optical cavity 140, and the quasi-optical cavity control device 150 can control the test position of the sample, i.e. the dielectric material to be tested, according to the resonant frequency of the quasi-optical cavity. After the dielectric material to be tested is placed at the testing position determined based on the resonant frequency of the quasi-optical cavity, the dynamic frequency reading device 130 can acquire the resonant frequency of the quasi-optical cavity, so that the dynamic cut-off frequency filter 120 can filter the electromagnetic wave output by the network analyzer based on the filtering parameter determined by the resonant frequency of the quasi-optical cavity.
Based on any of the above embodiments, in the dielectric material testing system shown in fig. 2, the network analyzer 110 outputs electromagnetic waves, the electromagnetic waves enter the quasi-optical cavity 140 through the dynamic cut-off frequency filter 120, and gaussian beam distribution is formed in the quasi-optical cavity 140, that is, the light fluxes cut off by any plane inside the cavity are equal. The quasi-optical cavity control device 150 can control the testing position of the dielectric material to be tested according to the resonant frequency of the quasi-optical cavity, and after the dielectric material to be tested is placed at the testing position determined based on the resonant frequency of the quasi-optical cavity, the dynamic frequency reading device 130 can collect the resonant frequency of the quasi-optical cavity, so that the dynamic cut-off frequency filter 120 can filter the electromagnetic wave output by the network analyzer based on the filtering parameter determined by the resonant frequency of the quasi-optical cavity, thereby filtering the non-TEM which can influence the Q value measurement in the electromagnetic wave00qMould, in particular non-TEM00qHigher order modes in the modes such that only the fundamental mode TEM remains in the electromagnetic waves passing through the dynamic cut-off frequency filter 120 into the interior of the excimer cavity 14000qImproving the accuracy of the Q value obtained by testing.
Based on any of the above embodiments, fig. 3 is a schematic flowchart of a testing method provided by the present invention, and as shown in fig. 3, the method is implemented on the dielectric material testing system provided by the above embodiments, and the method includes:
and step 320, determining the dielectric constant and/or the loss tangent value of the dielectric material based on the cavity f value, the load f value, the cavity Q value and the load Q value.
Specifically, in step 310, the cavity f value and the cavity Q value of the quasi-optical cavity refer to that when a dielectric material to be tested is not placed in the quasi-optical cavity in the dielectric material testing system, a dynamic frequency reading device in the system acquires the resonant frequency of the quasi-optical cavity in the cavity, and after the dynamic cut-off frequency filter filters a resonant peak generated by a higher order mode in the electromagnetic wave based on a filtering parameter determined by the resonant frequency of the quasi-optical cavity in the cavity, the quasi-optical cavity is aligned to measure the f value and the Q value.
Correspondingly, the loaded f-value and the loaded Q-value of the quasi-optical cavity mean that when a dielectric material to be tested is placed in the quasi-optical cavity in the dielectric material testing system, a dynamic frequency reading device in the system acquires the resonant frequency of the quasi-optical cavity under the loaded condition, and the dynamic cut-off frequency filter filters a resonant peak generated by a higher order mode in electromagnetic waves based on a filter parameter determined by the resonant frequency of the quasi-optical cavity under the loaded condition, and then the loaded f-value and the loaded Q-value of the quasi-optical cavity are measured.
After the cavity f value, the load f value, the cavity Q value and the load Q value of the quasi-optical cavity are obtained, the dielectric constant and/or the loss tangent value of the dielectric material to be tested can be calculated based on a characteristic equation solved by the quasi-optical cavity, and therefore the dielectric material test is achieved.
The method provided by the embodiment of the invention is based on the dielectric material testing system to measure the real and reliable cavity Q value and loaded Q value, thereby realizing the high-precision dielectric material testing.
Based on any of the above embodiments, fig. 4 is a schematic structural diagram of a dielectric material testing apparatus provided by the present invention, the testing apparatus in fig. 4 is implemented based on a dielectric material testing system, and the testing apparatus includes an f-value determining unit 410, a Q-value determining unit 420, and a testing result determining unit 430;
the Q value determining unit 410 is configured to determine a cavity Q value and a loaded Q value of the quasi optical cavity; the f-number determination unit 420 is used for determining the cavity f-number and the load f-number of the collimating cavity.
The test result determining unit 430 is configured to determine the dielectric constant and/or the loss tangent of the dielectric material based on the cavity f value, the load f value, the cavity Q value, and the load Q value.
The device provided by the embodiment of the invention measures real and reliable cavity Q value and loaded Q value based on the dielectric material testing system, thereby realizing high-precision dielectric material testing.
Based on any one of the embodiments, the dielectric material testing platform comprises the dielectric material testing system provided by the embodiment and the dielectric material testing device of the dielectric material testing sample stage provided by each embodiment.
The dielectric material testing system provides a testing place and equipment for dielectric material testing, and the dielectric material testing device is used for realizing automatic testing of dielectric materials based on the system.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment may be implemented by software plus a necessary general hardware platform, and may also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (9)
1. A dielectric material testing system is characterized by comprising a network analyzer, a dynamic cut-off frequency filter, a dynamic frequency reading device and a quasi-optical cavity;
the electromagnetic wave output by the network analyzer is filtered by the dynamic cut-off frequency filter, and then resonance is formed in the quasi-optical cavity;
the filter parameters of the dynamic cut-off frequency filter are determined based on quasi-optical cavity resonant frequency in the quasi-optical cavity, and the quasi-optical cavity resonant frequency is acquired by the dynamic frequency reading device;
the dynamic frequency reading device is used for collecting the quasi-optical cavity resonant frequency and determining the fundamental mode resonant frequency based on the quasi-optical cavity resonant frequency;
the dynamic cut-off frequency filter is used for determining a higher-order mode resonant frequency of a non-fundamental mode based on the fundamental mode resonant frequency and filtering the electromagnetic wave based on the higher-order mode resonant frequency.
2. The dielectric material testing system of claim 1, wherein the dynamic cut-off frequency filter comprises a filter analysis module and a filter module;
the filter analysis module is used for determining the higher-order mode resonant frequency of the non-fundamental mode based on the fundamental mode resonant frequency and configuring a filter cut-off frequency for the filter module based on the higher-order mode resonant frequency;
the filtering module is used for filtering a harmonic peak generated by a high-order mode in the electromagnetic waves.
3. The dielectric material testing system of claim 2, wherein the filtering module comprises at least one of a low pass filter, a high pass filter, and a band pass filter.
4. The dielectric material testing system of claim 3, wherein the filter cutoff frequency comprises at least one of a low pass cutoff frequency, a high pass cutoff frequency, and a band pass cutoff frequency.
5. The dielectric material testing system of claim 1, wherein the dynamic frequency reading device comprises a reading module, a reading analysis module, and a storage module;
the reading module is used for acquiring the resonant frequency of the quasi-optical cavity;
the reading analysis module is used for determining a fundamental mode resonant frequency based on the quasi-optical cavity resonant frequency;
the storage module is used for storing the resonance frequency of the basic mode.
6. A dielectric material testing system according to any one of claims 1 to 5, further comprising a quasi-optical cavity control device;
the quasi-optical cavity control device is used for controlling the test position of the dielectric material to be tested in the quasi-optical cavity based on the resonant frequency of the quasi-optical cavity.
7. A method for testing a dielectric material testing system according to any one of claims 1 to 6, comprising:
determining a cavity f value and a load f value of the quasi-optical cavity;
determining a cavity Q value and a load Q value of the quasi-optical cavity;
and determining the dielectric constant and/or the loss tangent value of the dielectric material based on the cavity f value, the load f value, the cavity Q value and the load Q value.
8. A test apparatus based on the dielectric material test system of any one of claims 1 to 6, comprising:
the f value determining unit is used for determining a cavity f value and a load f value of the quasi-optical cavity;
the Q value determining unit is used for determining a cavity Q value and a load Q value of the quasi-optical cavity;
and the test result determining unit is used for determining the dielectric constant and/or the loss tangent value of the dielectric material based on the cavity f value, the load f value, the cavity Q value and the load Q value.
9. A dielectric material testing platform comprising a dielectric material testing system according to any one of claims 1 to 6 and a testing device according to claim 8.
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| CN113567750A (en) * | 2021-07-15 | 2021-10-29 | 中电科思仪科技股份有限公司 | System and method for automatically testing broadband of quasi-optical cavity |
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