TW200511188A - Display panel defect inspection system and method - Google Patents
Display panel defect inspection system and methodInfo
- Publication number
- TW200511188A TW200511188A TW093105531A TW93105531A TW200511188A TW 200511188 A TW200511188 A TW 200511188A TW 093105531 A TW093105531 A TW 093105531A TW 93105531 A TW93105531 A TW 93105531A TW 200511188 A TW200511188 A TW 200511188A
- Authority
- TW
- Taiwan
- Prior art keywords
- inspection
- display panel
- panel defect
- devices
- inspection system
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47C—CHAIRS; SOFAS; BEDS
- A47C17/00—Sofas; Couches; Beds
- A47C17/02—Sofas, couches, settees, or the like, without movable parts
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47C—CHAIRS; SOFAS; BEDS
- A47C20/00—Head -, foot -, or like rests for beds, sofas or the like
- A47C20/02—Head -, foot -, or like rests for beds, sofas or the like of detachable or loose type
- A47C20/027—Back supports, e.g. for sitting in bed
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nursing (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Liquid Crystal (AREA)
Abstract
The object of the present invention is to provide a display panel defect inspection system, which keeps a throughput of an inspection process even if the number of inspectors is reduced, and improves the throughput of the inspection process by allocating visual inspection tasks to a plurality of inspectors. The display panel defect inspection system of the present invention is constituted by including: a plurality of automatic inspection devices 12 including a mechanism for transmitting image data of an inspection object and a mechanism for receiving determination data which is a quality determination result of the inspection object; a plurality of terminal devices 14 including a mechanism for receiving image data transmitted from the plurality of automatic inspection devices 12 and a mechanism for transmitting the determination data; and a network device 16 for connecting the plural automatic inspection devices 12 to the plural terminal devices 14.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003066624A JP4243500B2 (en) | 2003-03-12 | 2003-03-12 | Display panel defect inspection system |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200511188A true TW200511188A (en) | 2005-03-16 |
TWI263192B TWI263192B (en) | 2006-10-01 |
Family
ID=33284466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093105531A TWI263192B (en) | 2003-03-12 | 2004-03-03 | Display panel defect inspection system and method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4243500B2 (en) |
KR (1) | KR101045921B1 (en) |
TW (1) | TWI263192B (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4645174B2 (en) * | 2004-11-29 | 2011-03-09 | 横河電機株式会社 | Solid-state image sensor inspection system |
KR100697042B1 (en) * | 2005-04-07 | 2007-03-20 | 세메스 주식회사 | Apparatus for inspection defects on substrate and method for inspecting substrate using the same |
KR100700668B1 (en) * | 2005-04-20 | 2007-03-27 | 구자회 | Apparatus For Examining A OLED Panel And Its Method |
KR100926117B1 (en) * | 2005-12-30 | 2009-11-11 | 엘지디스플레이 주식회사 | Test system using a virtual review and method thereof |
JP2008076248A (en) * | 2006-09-21 | 2008-04-03 | Micronics Japan Co Ltd | Inspection system |
JP5017605B2 (en) * | 2006-10-20 | 2012-09-05 | 株式会社 日立技研 | Visual inspection support device, visual inspection support system, and visual inspection support method |
JP4970901B2 (en) * | 2006-10-30 | 2012-07-11 | 株式会社メガトレード | Computer program for operating visual inspection device and review machine for visual inspection device |
JP4257374B2 (en) * | 2007-08-27 | 2009-04-22 | シャープ株式会社 | Display control apparatus, inspection system, display control method, program, and computer-readable recording medium recording the program |
JP2010199832A (en) * | 2009-02-24 | 2010-09-09 | Panasonic Electric Works Co Ltd | Remote controller |
KR101195632B1 (en) | 2012-08-29 | 2012-10-30 | 박종현 | System and method for x-ray automatic inspection using distributed network structure |
KR102028977B1 (en) * | 2013-01-31 | 2019-10-07 | 엘지디스플레이 주식회사 | System and method for testing image display device |
KR20150073370A (en) * | 2013-12-23 | 2015-07-01 | 주식회사 코윈디에스티 | Appratus for repairing curved panel display defect |
US10539509B2 (en) | 2015-08-21 | 2020-01-21 | Ns Solutions Corporation | Display system, display device, display method, and non-transitory computer readable recording medium |
KR102292053B1 (en) * | 2020-05-15 | 2021-08-23 | 엘지전자 주식회사 | display apparatus |
US12066388B2 (en) | 2020-10-21 | 2024-08-20 | Wit Co., Ltd. | Inspection system |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002277845A (en) * | 2001-03-16 | 2002-09-25 | Sharp Corp | System for displaying defective part of liquid crystal panel |
-
2003
- 2003-03-12 JP JP2003066624A patent/JP4243500B2/en not_active Expired - Fee Related
-
2004
- 2004-03-03 TW TW093105531A patent/TWI263192B/en not_active IP Right Cessation
- 2004-03-12 KR KR1020040017093A patent/KR101045921B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI263192B (en) | 2006-10-01 |
JP4243500B2 (en) | 2009-03-25 |
JP2004279037A (en) | 2004-10-07 |
KR101045921B1 (en) | 2011-07-01 |
KR20040081392A (en) | 2004-09-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |