TW200511188A - Display panel defect inspection system and method - Google Patents

Display panel defect inspection system and method

Info

Publication number
TW200511188A
TW200511188A TW093105531A TW93105531A TW200511188A TW 200511188 A TW200511188 A TW 200511188A TW 093105531 A TW093105531 A TW 093105531A TW 93105531 A TW93105531 A TW 93105531A TW 200511188 A TW200511188 A TW 200511188A
Authority
TW
Taiwan
Prior art keywords
inspection
display panel
panel defect
devices
inspection system
Prior art date
Application number
TW093105531A
Other languages
Chinese (zh)
Other versions
TWI263192B (en
Inventor
Masato Ikeda
Ryosuke Takeyoshi
Wen-Hsing Hsu
Original Assignee
Chi Mei Optoelectronics Corp
Internat Display Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chi Mei Optoelectronics Corp, Internat Display Technology Co Ltd filed Critical Chi Mei Optoelectronics Corp
Publication of TW200511188A publication Critical patent/TW200511188A/en
Application granted granted Critical
Publication of TWI263192B publication Critical patent/TWI263192B/en

Links

Classifications

    • A—HUMAN NECESSITIES
    • A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47C—CHAIRS; SOFAS; BEDS
    • A47C17/00—Sofas; Couches; Beds
    • A47C17/02—Sofas, couches, settees, or the like, without movable parts
    • A—HUMAN NECESSITIES
    • A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47C—CHAIRS; SOFAS; BEDS
    • A47C20/00—Head -, foot -, or like rests for beds, sofas or the like
    • A47C20/02—Head -, foot -, or like rests for beds, sofas or the like of detachable or loose type
    • A47C20/027—Back supports, e.g. for sitting in bed

Abstract

The object of the present invention is to provide a display panel defect inspection system, which keeps a throughput of an inspection process even if the number of inspectors is reduced, and improves the throughput of the inspection process by allocating visual inspection tasks to a plurality of inspectors. The display panel defect inspection system of the present invention is constituted by including: a plurality of automatic inspection devices 12 including a mechanism for transmitting image data of an inspection object and a mechanism for receiving determination data which is a quality determination result of the inspection object; a plurality of terminal devices 14 including a mechanism for receiving image data transmitted from the plurality of automatic inspection devices 12 and a mechanism for transmitting the determination data; and a network device 16 for connecting the plural automatic inspection devices 12 to the plural terminal devices 14.
TW093105531A 2003-03-12 2004-03-03 Display panel defect inspection system and method TWI263192B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003066624A JP4243500B2 (en) 2003-03-12 2003-03-12 Display panel defect inspection system

Publications (2)

Publication Number Publication Date
TW200511188A true TW200511188A (en) 2005-03-16
TWI263192B TWI263192B (en) 2006-10-01

Family

ID=33284466

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093105531A TWI263192B (en) 2003-03-12 2004-03-03 Display panel defect inspection system and method

Country Status (3)

Country Link
JP (1) JP4243500B2 (en)
KR (1) KR101045921B1 (en)
TW (1) TWI263192B (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4645174B2 (en) * 2004-11-29 2011-03-09 横河電機株式会社 Solid-state image sensor inspection system
KR100697042B1 (en) * 2005-04-07 2007-03-20 세메스 주식회사 Apparatus for inspection defects on substrate and method for inspecting substrate using the same
KR100700668B1 (en) * 2005-04-20 2007-03-27 구자회 Apparatus For Examining A OLED Panel And Its Method
KR100926117B1 (en) * 2005-12-30 2009-11-11 엘지디스플레이 주식회사 Test system using a virtual review and method thereof
JP2008076248A (en) * 2006-09-21 2008-04-03 Micronics Japan Co Ltd Inspection system
JP5017605B2 (en) * 2006-10-20 2012-09-05 株式会社 日立技研 Visual inspection support device, visual inspection support system, and visual inspection support method
JP4970901B2 (en) * 2006-10-30 2012-07-11 株式会社メガトレード Computer program for operating visual inspection device and review machine for visual inspection device
JP4257374B2 (en) * 2007-08-27 2009-04-22 シャープ株式会社 Display control apparatus, inspection system, display control method, program, and computer-readable recording medium recording the program
JP2010199832A (en) * 2009-02-24 2010-09-09 Panasonic Electric Works Co Ltd Remote controller
KR101195632B1 (en) 2012-08-29 2012-10-30 박종현 System and method for x-ray automatic inspection using distributed network structure
KR102028977B1 (en) * 2013-01-31 2019-10-07 엘지디스플레이 주식회사 System and method for testing image display device
KR20150073370A (en) * 2013-12-23 2015-07-01 주식회사 코윈디에스티 Appratus for repairing curved panel display defect
CN107850550B (en) 2015-08-21 2020-11-03 日铁系统集成株式会社 Display system, display device, display method, and storage medium
KR102292053B1 (en) * 2020-05-15 2021-08-23 엘지전자 주식회사 display apparatus
CN114667445A (en) * 2020-10-21 2022-06-24 Wit 株式会社 Inspection system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002277845A (en) * 2001-03-16 2002-09-25 Sharp Corp System for displaying defective part of liquid crystal panel

Also Published As

Publication number Publication date
KR101045921B1 (en) 2011-07-01
TWI263192B (en) 2006-10-01
JP2004279037A (en) 2004-10-07
JP4243500B2 (en) 2009-03-25
KR20040081392A (en) 2004-09-21

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MM4A Annulment or lapse of patent due to non-payment of fees