TW200510718A - Pressure compensated chemical sensor for use in a vacuum environment - Google Patents
Pressure compensated chemical sensor for use in a vacuum environmentInfo
- Publication number
- TW200510718A TW200510718A TW093105900A TW93105900A TW200510718A TW 200510718 A TW200510718 A TW 200510718A TW 093105900 A TW093105900 A TW 093105900A TW 93105900 A TW93105900 A TW 93105900A TW 200510718 A TW200510718 A TW 200510718A
- Authority
- TW
- Taiwan
- Prior art keywords
- saw
- monitored
- measurement
- vacuum environment
- chemical sensor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
- G01N29/4436—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a reference signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2468—Probes with delay lines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/32—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise
- G01N29/323—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise compensating for pressure or tension variations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0253—Condensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0255—(Bio)chemical reactions, e.g. on biosensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
Landscapes
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Measuring Fluid Pressure (AREA)
Abstract
A chemical species sensor comprises a reference surface acoustic wave device (SAW) 2 and a measurement surface acoustic wave device 1 (SAW). The measurement SAW 1 has applied thereto a chemically selective coating which is specifically sensitive to chemical species to be monitored by the sensor. The reference SAW 2 has a chemically inert coating applied thereto. The sensor comprises means 4, 5 for providing a temperature differential between the reference SAW and the measurement SAW. In use the relative frequencies of waves produced by the reference and measurement SAWs are monitored and from this the proportion of the monitored species within the monitored environment can be detected.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0304895A GB2399170A (en) | 2003-03-05 | 2003-03-05 | Chemical sensor with temperature differential between measurement and reference SAWs |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200510718A true TW200510718A (en) | 2005-03-16 |
Family
ID=9954066
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093105900A TW200510718A (en) | 2003-03-05 | 2004-03-05 | Pressure compensated chemical sensor for use in a vacuum environment |
Country Status (3)
Country | Link |
---|---|
GB (1) | GB2399170A (en) |
TW (1) | TW200510718A (en) |
WO (1) | WO2004079360A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITMI20042017A1 (en) * | 2004-10-22 | 2005-01-22 | Getters Spa | GAS SURFACE SENSOR OF ACOUSTIC WAVES AND PROCEDURE FOR ITS MANUFACTURING |
US10600952B2 (en) | 2016-05-20 | 2020-03-24 | Pulmostics Limited | Surface acoustic wave sensor coating |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5012668A (en) * | 1989-08-22 | 1991-05-07 | The Boeing Company | Inclined electrode surface acoustic wave substance sensor |
US5465608A (en) * | 1993-06-30 | 1995-11-14 | Orbital Sciences Corporation | Saw vapor sensor apparatus and multicomponent signal processing |
US5795993A (en) * | 1995-11-29 | 1998-08-18 | Sandia Corporation | Acoustic-wave sensor for ambient monitoring of a photoresist-stripping agent |
US5918258A (en) * | 1996-07-11 | 1999-06-29 | Bowers; William D. | High-sensitivity instrument to measure NVR in fluids |
US5992215A (en) * | 1997-05-29 | 1999-11-30 | Sensor Research And Development Corp. | Surface acoustic wave mercury vapor sensors |
US6295861B1 (en) * | 1999-01-28 | 2001-10-02 | Advanced Technology Materials, Inc. | Quartz crystal microbalance sensors and semiconductor manufacturing process systems comprising same |
-
2003
- 2003-03-05 GB GB0304895A patent/GB2399170A/en not_active Withdrawn
-
2004
- 2004-02-24 WO PCT/GB2004/000732 patent/WO2004079360A1/en active Application Filing
- 2004-03-05 TW TW093105900A patent/TW200510718A/en unknown
Also Published As
Publication number | Publication date |
---|---|
GB0304895D0 (en) | 2003-04-09 |
WO2004079360A1 (en) | 2004-09-16 |
GB2399170A (en) | 2004-09-08 |
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