TW200503200A - Chip package structur - Google Patents

Chip package structur

Info

Publication number
TW200503200A
TW200503200A TW092118039A TW92118039A TW200503200A TW 200503200 A TW200503200 A TW 200503200A TW 092118039 A TW092118039 A TW 092118039A TW 92118039 A TW92118039 A TW 92118039A TW 200503200 A TW200503200 A TW 200503200A
Authority
TW
Taiwan
Prior art keywords
substrate
chip
heat sink
chip package
structur
Prior art date
Application number
TW092118039A
Other languages
English (en)
Other versions
TWI300261B (en
Inventor
Ming-Lun Ho
Yu-Wen Chen
Original Assignee
Advanced Semiconductor Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW092118039A priority Critical patent/TWI300261B/zh
Priority to US10/710,344 priority patent/US7002246B2/en
Publication of TW200503200A publication Critical patent/TW200503200A/zh
Application granted granted Critical
Publication of TWI300261B publication Critical patent/TWI300261B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73201—Location after the connecting process on the same surface
    • H01L2224/73203—Bump and layer connectors
    • H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73253—Bump and layer connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/153—Connection portion
    • H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161—Cap
    • H01L2924/1615—Shape
    • H01L2924/16195—Flat cap [not enclosing an internal cavity]

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
TW092118039A 2003-07-02 2003-07-02 Chip package structur TWI300261B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW092118039A TWI300261B (en) 2003-07-02 2003-07-02 Chip package structur
US10/710,344 US7002246B2 (en) 2003-07-02 2004-07-02 Chip package structure with dual heat sinks

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW092118039A TWI300261B (en) 2003-07-02 2003-07-02 Chip package structur

Publications (2)

Publication Number Publication Date
TW200503200A true TW200503200A (en) 2005-01-16
TWI300261B TWI300261B (en) 2008-08-21

Family

ID=33550735

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092118039A TWI300261B (en) 2003-07-02 2003-07-02 Chip package structur

Country Status (2)

Country Link
US (1) US7002246B2 (zh)
TW (1) TWI300261B (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006019636A (ja) * 2004-07-05 2006-01-19 Renesas Technology Corp 半導体装置
JP4014591B2 (ja) * 2004-10-05 2007-11-28 シャープ株式会社 半導体装置および電子機器
TWI252575B (en) * 2005-01-17 2006-04-01 Phoenix Prec Technology Corp Flip-chip package structure with direct electrical connection of semiconductor chip
JP4534062B2 (ja) * 2005-04-19 2010-09-01 ルネサスエレクトロニクス株式会社 半導体装置
US7504718B2 (en) * 2005-05-10 2009-03-17 International Business Machines Corporation Apparatus and methods for constructing balanced chip packages to reduce thermally induced mechanical strain
US8063482B2 (en) * 2006-06-30 2011-11-22 Intel Corporation Heat spreader as mechanical reinforcement for ultra-thin die
US7985621B2 (en) * 2006-08-31 2011-07-26 Ati Technologies Ulc Method and apparatus for making semiconductor packages
US7821141B2 (en) * 2008-02-22 2010-10-26 Infineon Technologies Ag Semiconductor device
US9721868B2 (en) 2009-07-30 2017-08-01 Taiwan Semiconductor Manufacturing Company, Ltd. Three dimensional integrated circuit (3DIC) having a thermally enhanced heat spreader embedded in a substrate
US8970029B2 (en) * 2009-07-30 2015-03-03 Taiwan Semiconductor Manufacturing Company, Ltd. Thermally enhanced heat spreader for flip chip packaging
GB2479174A (en) * 2010-03-31 2011-10-05 Ge Aviation Systems Limited Semiconductor apparatus with heat sink
US20120188721A1 (en) * 2011-01-21 2012-07-26 Nxp B.V. Non-metal stiffener ring for fcbga
US8937376B2 (en) 2012-04-16 2015-01-20 Advanced Semiconductor Engineering, Inc. Semiconductor packages with heat dissipation structures and related methods
US8704341B2 (en) 2012-05-15 2014-04-22 Advanced Semiconductor Engineering, Inc. Semiconductor packages with thermal dissipation structures and EMI shielding
US9425114B2 (en) 2014-03-28 2016-08-23 Oracle International Corporation Flip chip packages
US9899305B1 (en) * 2017-04-28 2018-02-20 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor package structure
US11545407B2 (en) * 2019-01-10 2023-01-03 Intel Corporation Thermal management solutions for integrated circuit packages

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5909056A (en) * 1997-06-03 1999-06-01 Lsi Logic Corporation High performance heat spreader for flip chip packages
US7259448B2 (en) * 2001-05-07 2007-08-21 Broadcom Corporation Die-up ball grid array package with a heat spreader and method for making the same
US6519154B1 (en) * 2001-08-17 2003-02-11 Intel Corporation Thermal bus design to cool a microelectronic die

Also Published As

Publication number Publication date
US7002246B2 (en) 2006-02-21
US20050001311A1 (en) 2005-01-06
TWI300261B (en) 2008-08-21

Similar Documents

Publication Publication Date Title
TW200503200A (en) Chip package structur
TW200627563A (en) Bump-less chip package
SG139753A1 (en) Semiconductor device
TW200603358A (en) Direct connection multi-chip semiconductor element structure
TW200620607A (en) Flip chip and wire bond semiconductor package
TW200717757A (en) Light emitting diode package structure
TW200707676A (en) Thin IC package for improving heat dissipation from chip backside
KR20040092364A (ko) 랜드 그리드 어레이 패키지내에서 실행되는 ｄｃ―ｄｃ컨버터
TW200503209A (en) Semiconductor package
TWI257157B (en) Flip chip ball grid array package assemblies
TW200512848A (en) Transparent packaging in wafer level
TW200620511A (en) Semiconductor device and method of assembling semiconductor device
TW200507212A (en) Semiconductor package with heat dissipating structure
TW200518267A (en) Integrated circuit chip
TW200507204A (en) Electrical package and process thereof
TW200623391A (en) Semiconductor device
TW200603364A (en) Bonding pad and chip structure
TW200507196A (en) Flip chip package structure
TW200711151A (en) Multi-chip package structure
TW200618222A (en) Heat dissipating package structure and fabrication method thereof
TW200614458A (en) Flip chip bga process and package with stiffener ring
TW200715586A (en) Universal chip package structure
DE60308682D1 (de) Tragbarer silizium chip
TW200725856A (en) Package structure and stiffener ring
TW200719487A (en) Flip chip package structure

Legal Events

Date Code Title Description
MK4A Expiration of patent term of an invention patent