TW200428064A - Contamination detecting method of liquid crystal cell panel and its sampling tool - Google Patents
Contamination detecting method of liquid crystal cell panel and its sampling tool Download PDFInfo
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200428064200428064
五、發明說明(1) 【發明所屬之技術領域】 取樣工 法。 本發明係有關於一種液晶污染檢測方法盥豆 具,特別是一種利用取樣工具進行液晶取樣的^ 【先前技術】 目^液晶顯示技術被廣泛的用* —般的電子產., :二:十算機、,子錶、手機螢幕、醫院所使用:: m面:榮幕等,’液晶_示器是以液晶 範圍内卻具有液體和結晶雙方性^ j匕在某一溫度 態結晶物質的意思。因此,液晶不匕」曰贼就是液 性,又具有液態流動特性,⑨曰d口 曰體光學特 改變其分子的排列狀態’並且可:二叉到電壓的影響’ 的現象。 』从讓射入的光線產生偏轉 液晶顯示器以其輕薄、無閃 直吸引著眾人的目光,主要a ”.、輻射寺伞夕優點一 )5 ^^^^t^^LCDVV'AVliLrr1 晶顯示器(TN-LCD)、护如絲A M j &刀為扭轉向列型液V. Description of the invention (1) [Technical field to which the invention belongs] Sampling method. The present invention relates to a kind of liquid crystal contamination detection method, particularly a kind of liquid crystal sampling method using a sampling tool. [Previous technology] A liquid crystal display technology is widely used. Used by computers, sub-tables, mobile phone screens, and hospitals: m-plane: Rong curtain, etc., 'Liquid crystal_display is a liquid crystal range with both liquid and crystalline properties. meaning. Therefore, "liquid crystals are not irrelevant." The thief is liquid and has the characteristics of liquid flow. The phenomenon that the optical characteristics of the body change the arrangement of the molecules' and can be: the effect of the binary to the voltage. 』From the deflection of the incoming light, the liquid crystal display attracts everyone ’s attention with its thinness and flicker-free, mainly a"., The advantages of the radiation temple umbrella Xi 1) 5 ^^^^ t ^^ LCDVV'AVliLrr1 crystal display ( TN-LCD), AMJ & knife is twisted nematic liquid
-LCD面板為目前市場主^T TL等二大類,其中W 為三個階段:首先稱面板的製程主要可分 %之為溥膜電晶體元件陣列基板製程 晶』程?,其過程為玻璃基板上形成薄膜電 日日 車’,、次為液晶胞面板組裝(Ce 11製程),其-LCD panels are currently two major categories in the market, including T TL, among which W is in three stages: First, the process of the panel is mainly divided into 溥 film transistor element array substrate manufacturing process. The process is to form a thin film electric vehicle on a glass substrate, and then the LCD cell panel assembly (Ce 11 process).
200428064200428064
過耘為將上下破璃(陣列面板盥,彡 弁^ ^ ^ ^ ^ ^ 内灌入液晶;最後稱之袁凉曰/色扃先片〕貼5 ,並於其 製程),其過程為將貼人為//a面板杈組組裝(Module或lcm 組前段完成外部之,在液晶顯示器製程之模 裝後,再將、、夜曰$ 4 (]驅動κ及訊號電路路板)的構 後送面板進行切割,使其成為適當的大小之 官專所構成的背光模組進 、浪:光板、煜To do this is to break the glass up and down (the panel panel is filled with liquid crystal; 凉 ^ ^ ^ ^ ^ ^ is filled with liquid crystal; the last name is Yuan Liangyue / color 扃 first film] and paste 5 and the process is as follows: Adhere to the assembly of a panel panel (the front part of the Module or lcm group is completed externally, and after the LCD display process is assembled, then the $ 4 (] drive κ and signal circuit board) is sent back. The panel is cut to make it a backlight module of appropriate size.
環境及液日面無士 t易克的問題之一便是因液晶面板的 污染物例:焊錫等等=晶胞工程等動作而產生的異物’ 時’也可能因磨擦而產生靜卜:液=在切割或輸送 著液晶面板帶;面板上的異物若未清除,而隨 裝不良率增加,進而二成::能會造成液晶顯示裝置的組 品光學之瑕疵。再者…”人貝產出效率降低’造成產 入液晶,&時是液曰存::染物經由原材或封裝過程中進 必須,測量這中的最後狀'態’因此, 八+,=液日日頌不盎之撿測方法係藉由陣列電路檢杳方One of the problems of the environment and the liquid surface is that the problem is caused by the contamination of the LCD panel: soldering, etc. = foreign objects generated by operations such as unit cell engineering, etc. may also generate static noise due to friction: liquid = Liquid crystal panel tape is being cut or conveyed; if the foreign matter on the panel is not removed, the defective rate increases with installation, and then it is 20%: it can cause optical defects of the components of the liquid crystal display device. Moreover ... "The production efficiency of human shellfish is lowered ', which causes the production of liquid crystals, which is called liquid storage :: dyes must pass through the original material or the packaging process. It is necessary to measure the final state of this. Therefore, eight +, = The method of picking up and testing the day and night is based on the array circuit inspection method
:方:類=工::是光學Γ、電性方 =案部分中圖案不為良: Square: class = 工 :: is optical Γ, electrical square = pattern in the case is not good
:疋陣列電路上利用半導體記憶元件測試的同樣方 在陣列電路上形成蓄電器(condenser),並把實際LCD: 疋 The same method is used for array memory circuits to test semiconductor memory elements. A condenser is formed on the array circuit, and the actual LCD
第5頁 200428064 五、發明說明(3) 和同樣之TFT通以電流(荷)而產生寫入和讀出之 ,以便檢驗出其異常之不良品。電光學之方法貝^ 述兩種方法之間的一種檢測方式,電荷寫入之苦 電位之氧化銦錫(Indium Tin Oxide, ΙΤ0)電指 電光學元件而產生光學影像的變換,以檢驗出不 述二種方法皆可求得不良位置之所在以及不良开^ 資訊,而不良種類可由各種不良原因和電性特性 以分類。然而,無法清楚得知液晶之污染源之成 度。特別疋’因為取樣之困難,目前並無適當測 以定量分析TFT的每一個光袼(CeU),本發明欲) 題係對污染物做更詳盡的定量分析,且需要一種 方法以及一取樣工具。 【發明内容】 有鏗於此,本發明的 污染取樣工具,在面板上 析其濃度與成分,而不會 準確度。 ^㉙明之另_目的在於提供—種液晶胞面板 測方法,完全不同於習知之電性測量方法,可分 晶及測量液晶中的污染物之濃度,更精確的定量 物之濃度。 檢測ϊίΐΐ述目的’本發明提供一種液晶胞面 電子信號 是界於上 電器和同 [電位通以 良品。上 狀種類等 之關係加 分或濃 量方法用 痒決之課 污染測量 目的在於提供一種液晶 精確的萃取含有污染之 被面板之邊緣影響其取 胞面板之 液晶,分 樣污染之 之污染檢 區取樣液 分析污染 板之污染 (b)利用 仏測方法包括卩下步驟:(a)提供一液晶胞面板; 200428064 五、發明說明(4) 一取樣工具從液晶胞面板表面取得一液晶樣品;(c )使甩 一溶劑將液晶樣品由取樣工具上沖下來;(d )分析液晶樣 品之成分;以及(e )求出成分之濃度,以判斷液晶胞面板 是否被污染。 在一較佳實施例中,液晶胞面板之污染檢測方法更包 括提供一標準值之步驟,當成分之濃度超過標準值,液晶 胞面板即判定為被污染。 又,溶劑係一丙S同。 又,取樣工具具有一第一表面以及一第二表面,第一 、第二表面均具有複數個顆粒,使液晶容易吸附在第一、 第二表面上。 又,取樣工具係由鐵氟龍所製成。 本發明另提供一種液晶胞面板之污染檢測方法包括以 下步驟:(a)提供一液晶胞面板;(b)利用一取樣工具從複 數區塊表面之不同處取得複數個液晶樣品;(c )使用溶劑 將複數液晶樣品由取樣工具上沖下來;(d)分析複數液晶 樣品之成分;以及(e )求出複數成分之濃度,以判斷液晶 胞面板是否被污染。 在一較佳實施例中,液晶胞面板之污染檢測方法更包 括將液晶胞面板分為複數區塊之步驟’其中步驟(b )係於 母--區塊内取一液晶樣品。 又,將液晶胞面板分為九區塊。 又,複數區塊排成陣列。 又,陣列為3x3。Page 5 200428064 V. Description of the Invention (3) The same TFT is written and read with current (charge) in order to check its abnormal defective products. The electro-optical method is described as a detection method between the two methods. Indium tin oxide (ITO), which is a bitter potential written by electric charges, refers to an electro-optical element and generates an optical image transformation to check whether Both methods can be used to find the location of the fault and the information about the fault, and the types of faults can be classified by various fault causes and electrical characteristics. However, it is impossible to know clearly the degree of the pollution source of the liquid crystal. In particular, because of the difficulty of sampling, there is currently no appropriate measurement to quantitatively analyze each photoluminescence (CeU) of the TFT. The present invention intends to do a more detailed quantitative analysis of pollutants, and requires a method and a sampling tool . [Summary of the Invention] With this in mind, the pollution sampling tool of the present invention analyzes its concentration and composition on the panel without accuracy. ^ The other purpose of Mingming is to provide a kind of liquid crystal cell panel measurement method, which is completely different from the conventional electrical measurement method. It can crystallize and measure the concentration of pollutants in the liquid crystal, and more accurately quantify the concentration of the substance. Detecting the stated purpose of the invention is to provide a liquid crystal cell surface electronic signal which is bounded by an electric appliance and the same electric potential. The relationship between the above types and other points is added or concentrated. The purpose of contamination measurement is to provide a liquid crystal that accurately extracts liquid crystals containing contaminated panels that affect the cell panel of the panel. Sampling solution to analyze the contamination of the contaminated panel (b) The following methods are used for the detection method: (a) providing a liquid crystal cell panel; 200428064 V. Description of the invention (4) A sampling tool obtains a liquid crystal sample from the surface of the liquid crystal cell panel; c) the liquid crystal sample is washed down from the sampling tool by shaking a solvent; (d) analyzing the components of the liquid crystal sample; and (e) determining the concentration of the components to determine whether the liquid crystal cell panel is contaminated. In a preferred embodiment, the liquid crystal cell panel contamination detection method further includes a step of providing a standard value. When the concentration of the component exceeds the standard value, the liquid crystal cell panel is determined to be contaminated. In addition, the solvent is the same as that of propylene. In addition, the sampling tool has a first surface and a second surface, and the first and second surfaces each have a plurality of particles, so that the liquid crystal is easily adsorbed on the first and second surfaces. The sampling tool is made of Teflon. The invention further provides a liquid crystal cell panel contamination detection method including the following steps: (a) providing a liquid crystal cell panel; (b) using a sampling tool to obtain a plurality of liquid crystal samples from different places on the surface of the plurality of blocks; (c) using The solvent flushes the plurality of liquid crystal samples from the sampling tool; (d) analyzes the components of the plurality of liquid crystal samples; and (e) determines the concentration of the plurality of components to determine whether the liquid crystal cell panel is contaminated. In a preferred embodiment, the liquid crystal cell panel contamination detection method further includes a step of dividing the liquid crystal cell panel into a plurality of blocks, wherein step (b) is to take a liquid crystal sample in the mother-block. In addition, the liquid crystal cell panel is divided into nine blocks. Also, plural blocks are arranged in an array. The array is 3x3.
0632-9840twf(nl) ; AU030101S ; Yuchia.ptd 第7頁 200428064 五、發明說明(5) 在一較佳實施例中,液晶胞面板之污染檢測方法更包 括提供一標準值之步驟,當複數成分之濃度超過標準值, 液晶胞面板即判定為被污染。 又,溶劑係一丙酮。 又,取樣工具具有一第一表面以及一第二表面,第一 、第二表面均具有複數個顆粒,使液晶容易吸附在第一、 第二表面上。 又,取樣工具係由鐵氟龍所製成。 本發明更提供一種液晶胞面板之污染檢測之取樣工具 包括一主體以及複數個顆粒,其中,主體包括一頂端、一 中間部以及一底端,中間部連接頂端與底端,中間部則包 括一第一表面及一第二表面,第一表面與第二表面為相反 面,且底端包括一第三表面,其中第三表面與第一表面連 接,以及複數個顆粒係設置在第一表面、第二表面以及第 三表面上。 又,取樣工具係由鐵氟龍所製成。 又,取樣工具係可撓性材質所製成。 又,取樣工具更包括一把手,設置在主體之頂端。 為了讓本發明之上述和其他目的、特徵、和優點能更 明顯易懂,下文特舉一較佳實施例,並配合所附圖示,作 詳細說明如下: 【實施方式】 為了對液晶中的污染物做更詳盡的定量分析,本發明0632-9840twf (nl); AU030101S; Yuchia.ptd page 7 200428064 V. Description of the invention (5) In a preferred embodiment, the method for detecting the contamination of a liquid crystal cell panel further includes a step of providing a standard value, when the plural components If the concentration exceeds the standard value, the LCD panel is judged to be contaminated. The solvent is monoacetone. In addition, the sampling tool has a first surface and a second surface, and the first and second surfaces each have a plurality of particles, so that the liquid crystal is easily adsorbed on the first and second surfaces. The sampling tool is made of Teflon. The invention further provides a sampling tool for detecting the contamination of a liquid crystal cell panel, which includes a main body and a plurality of particles, wherein the main body includes a top end, a middle part, and a bottom end, the middle part connects the top end and the bottom end, and the middle part includes a A first surface and a second surface, the first surface and the second surface being opposite surfaces, and the bottom end including a third surface, wherein the third surface is connected to the first surface, and a plurality of particles are disposed on the first surface, On the second surface and the third surface. The sampling tool is made of Teflon. The sampling tool is made of a flexible material. The sampling tool further includes a handle disposed on the top of the main body. In order to make the above and other objects, features, and advantages of the present invention more comprehensible, a preferred embodiment is described below in conjunction with the accompanying drawings, and described in detail as follows: [Embodiment] In order to More detailed quantitative analysis of pollutants, the present invention
0632-9840twf(nl) ; AU0301018 ; Yuchia.ptd 第8頁 200428064 五、發明說明(6) 提供一種液晶胞面板污染測量方法以及一取樣工具。如第 1、2 a及2 b圖所示,本發明經由一取樣工具1 〇在面板2 0 0上 萃取含有污染物之液晶2 2,藉由本發明之液晶胞面板污染 測量方法,測量液晶2 2中的污染物之濃度與成分,而不會 被面板2 0 0之邊緣影響其取樣污染之準確度,尤其越靠近 面板邊緣之液晶2 2,其污染濃度就越高。通常液晶之污染 物包括金屬離子,例如N ,因此必須取樣來得知N 3*+之濃 度,以下詳細說明本發明之取樣工具。0632-9840twf (nl); AU0301018; Yuchia.ptd page 8 200428064 V. Description of the invention (6) Provide a liquid crystal cell panel contamination measurement method and a sampling tool. As shown in Figs. 1, 2a, and 2b, the present invention extracts liquid crystals 2 containing contaminants on a panel 200 through a sampling tool 10, and measures the liquid crystal 2 by the liquid crystal cell panel contamination measurement method of the present invention. The concentration and composition of the pollutants in 2 will not affect the accuracy of sampling pollution by the edge of the panel 200, especially the closer the liquid crystal 22 is near the edge of the panel, the higher the pollution concentration. Generally, the contamination of liquid crystals includes metal ions, such as N. Therefore, sampling must be performed to know the concentration of N 3 * +. The sampling tool of the present invention will be described in detail below.
如第2a圖所示,液晶胞面板2〇〇之污染檢測之取樣工 具1 0包括一主體1 〇 〇以及複數個顆粒1 4,其中,主體1 〇 〇包 括一頂端11、一中間部1 2以及一底端1 3,中間部1 2連接頂 端11與底端12,中間部12則包括一第一表面121及一第二 表面122 ’第一表面121與第二表面122為相反面,且底端 13包括一第三表面131,其中第三表面131與第一表面121 連接,而上述顆粒1 4係設置在第一表面1 2 1、第二表面1 2 2 以及弟二表面131上。此實施例之取樣工具之材質主要 以不溶出污染物之物質為主,例如鐵氟龍本身具有安定之 特性,不會容易與污染物產生化學變化,因此,取樣工具 通常是由鐵氟龍所製程,除此之外,材質必須是可撓性 的,能使取樣工具1 〇彎曲,如第2b圖所示,在刮取液晶樣 品2 2時,鐵氟龍本身吸附力不強,所以在取樣工具之表面 上之複數顆粒1 4造成毛細現象’使液晶2 2容易附著在顆粒 1 4上。雖然圖上未顯示,取樣工具更可包括一把手,設置 在主體100之頂端11。As shown in Figure 2a, the sampling tool 10 for the pollution detection of the liquid crystal cell panel 200 includes a main body 100 and a plurality of particles 14, wherein the main body 100 includes a top end 11 and a middle part 1 2 And a bottom end 1 3, a middle part 12 connecting the top end 11 and the bottom end 12, the middle part 12 includes a first surface 121 and a second surface 122, the first surface 121 and the second surface 122 are opposite surfaces, and The bottom end 13 includes a third surface 131, wherein the third surface 131 is connected to the first surface 121, and the particles 14 are disposed on the first surface 1 2 1, the second surface 1 2 2, and the second surface 131. The material of the sampling tool in this embodiment is mainly the material that does not dissolve the pollutants. For example, Teflon itself has stable properties and will not easily cause chemical changes with the pollutants. Therefore, the sampling tools are usually made by Teflon. In addition to the manufacturing process, the material must be flexible, which can bend the sampling tool 10, as shown in Figure 2b. When the liquid crystal sample 22 is scraped, Teflon itself does not have a strong adsorption force, so in The plurality of particles 14 on the surface of the sampling tool cause capillary phenomena 'to make the liquid crystal 22 easily adhere to the particles 14'. Although not shown in the figure, the sampling tool may further include a handle disposed on the top end 11 of the main body 100.
0632-9840twf(nl) ; AU0301018 ; Yuchia.ptd 第9頁 五、發明說明(7) 此實施例可有— 面,複數顆粒與粒彳造 例’使取樣工具1 0具有粗糙之表 染物容易吸附在取^ ^面均可使其產生毛細現象,使得污 第3圖為本發明液曰〃上^ 請參考第3圖及第4固 _紀面板之污染檢測方法流程圖。 S301) ’為了不被面β板20^、真提供—液晶胞面板200(步驟 確度,可將液晶胞 之邊緣2 0 1影響其取樣污染之準 從複數區塊表面二=〇 0分隔取樣,利用一取樣工具1 0 樣工具10取得樣品同處取得複數個液晶樣品(S3 0 2 ),取 液晶樣品由取樣工^ ’使用溶劑(通常是使用丙酮)將複數 33 0 2與33 0 3直到取二々〇上沖下來(33 03 );重複上述步驟 來,分析複數液晶;:T:】塊之液晶樣品(S3〇4),接下 一區饱之今九‘枚w之成分與濃度(S3 0 5 ),以及求出每 200曰否#、-木、九物成分舆濃度(S3〇6),以判斷液晶胞面板 200疋否被巧染(S3〇7) 〇 如第所明-之步驟S3 02〜S30 4中更包括分區取樣之步驟’ ° θ不,將液晶胞面板2 0 0分為複數區塊:TFT-1、 TFT-2、TFT-3、TFT-4、TFT-5、TFT-6、TFT-7、TFT-8 以 GL9 ’ 區塊内取一液晶樣品’複數區魏係排成 陣列3x3,換Β之,將液晶胞面板2 0 0分隔成九區塊,每一 區塊具有固定面積,每一格距離玻璃邊緣2〇1大約“η 仏K施方式’在每一區塊上,利用上述取樣工具1 〇取^恭 測量之液晶,因此不會碰觸到面板之邊緣。 茜 以下說明液晶之污染物濃度之分析與計算方式,且一 併參考第3圖之步驟S3 05〜S3 0 9。分析每一區塊之液晶费二 0632-9840twf(nl) ; AU0301018 ; Yuchia.ptd 第10頁 2004280640632-9840twf (nl); AU0301018; Yuchia.ptd Page 9 V. Description of the invention (7) This embodiment may have a surface, a plurality of particles and granules. Examples of making the sampling tool 10 have rough surface dyes easily adsorbed Capillary phenomenon can be generated on the surface, so that the staining is shown in Figure 3, which is the liquid of the present invention. Please refer to Figure 3 and the flow chart of the pollution detection method of the solid-state panel. S301) 'In order not to be provided by the surface β plate 20 ^, the LCD cell panel 200 (step accuracy, the edge of the liquid crystal cell 2 0 1 can affect its sampling pollution standards from the plural block surface two = 0 0 separated sampling, Use a sampling tool 10 sampling tool 10 to obtain a sample to obtain a plurality of liquid crystal samples (S3 0 2), take the liquid crystal sample by the sampler ^ 'use a solvent (usually using acetone) will be a plurality of 33 0 2 and 33 0 3 until Take 2 × 30 and wash it down (33 03); repeat the above steps to analyze the multiple liquid crystals;: T:] block of liquid crystal samples (S304), then the next area is filled with the components and concentrations (S3 0 5), and determine the concentration of #, -wood, and nine components every 200 days (S3 06) to determine whether the liquid crystal cell panel 200 疋 is cleverly dyed (S 3 07). -The steps S3 02 ~ S30 4 include the step of partition sampling. ° θ No, the LCD panel 2 0 is divided into plural blocks: TFT-1, TFT-2, TFT-3, TFT-4, TFT -5, TFT-6, TFT-7, and TFT-8 use GL9 to take a liquid crystal sample in the block. The Wei area is arranged in an array of 3x3. In other words, the LCD panel is separated by 2 0 0. Block, each block has a fixed area, and each grid is about η from the edge of the glass. "Η 仏 K application method" On each block, the above-mentioned sampling tool 10 is used to take the liquid crystal measured by ^, so it is not It will touch the edge of the panel. The following describes the analysis and calculation method of the liquid crystal concentration of pollutants, and refer to steps S3 05 ~ S3 0 9 in Fig. 3. Analyze the liquid crystal fee of each block. 0632-9840twf (nl); AU0301018; Yuchia.ptd Page 10 200428064
之成分與濃度之中,本發明利用定量計算污染物濃度, 上述取樣工具1 〇所刮取之液晶溶液收集,並定義在每—: 塊取得之液晶樣品之體積為v,測量液晶樣品之濃度為C區 (S3 0 5 ),再計算每一區塊之液晶之體積,舉例來說,將0 板分為九區塊時,如第5圖所示,第5圖為本發明之液晶^ 面板之其中一區塊TFT-1之尺寸示意圖,每一區塊之液曰曰晶胞 V (L * W * H/2) / 9 其中L=液晶區塊之長度; W=液晶區塊之寬度; H/2 =液晶區塊之高度(η)之1/2 ; 經由化學分析液晶樣品中的各污染物或成分濃度 (S3 0 5 ),取得每一液晶樣品之測試濃度(Cq),藉由以下公 式·· c = cG*( V/vQ),而還原污染物之真正濃度c(步驟 S3 0 6 ) 〇 步驟S 3 0 6之後,判定濃度是否高於標準值(s 3 〇 7 ),成 分^+之標準值通常是介於2〇〇-3 0 0??1)之間,當成分“+之 濃度超過此標準值,液晶胞面板即判定為被污染(S 3 〇 8 ), 如第6圖所示,顯示一實驗數據,靠近面板邊緣2 〇 1的區塊 TFT-1與TFT-2之濃度分別為559ppb與335ppb,明顯高於標 準值之上限3 0 0 p p b,因此經由本發明之測量方法可判定該 面板是被污染的,如果每一區塊之濃度C是小於標準值, 即此液晶胞面板通過測試(S 3 0 9 )。 如以上所述之液晶胞面板之污染檢測方法可分區取樣Among the components and concentrations, the present invention uses a quantitative calculation of the concentration of the pollutants. The liquid crystal solution scraped by the sampling tool 10 is collected, and the volume of the liquid crystal sample obtained in each of the blocks is v, and the concentration of the liquid crystal sample is measured. For area C (S3 0 5), calculate the volume of the liquid crystal in each block. For example, when the 0 plate is divided into nine blocks, as shown in Figure 5, Figure 5 is the liquid crystal of the present invention ^ Schematic diagram of the size of TFT-1 in one block of the panel. The liquid in each block is the unit cell V (L * W * H / 2) / 9 where L = the length of the liquid crystal block; W = the length of the liquid crystal block. Width; H / 2 = 1/2 of the height (η) of the liquid crystal block; through the chemical analysis of the concentration of each pollutant or component in the liquid crystal sample (S3 0 5), obtain the test concentration (Cq) of each liquid crystal sample, With the following formula: c = cG * (V / vQ), the true concentration c of the reduced pollutant is reduced (step S3 0 6) 〇 After step S 3 0 6, it is determined whether the concentration is higher than the standard value (s 3 〇7 ), The standard value of the component ^ + is usually between 2000 and 3 0 0 1). When the concentration of the component "+ exceeds this standard value, the liquid crystal cell panel is judged as Contamination (S 3 0 8), as shown in Fig. 6, shows an experimental data. The concentration of TFT-1 and TFT-2 in the block 001 near the edge of the panel is 559ppb and 335ppb, which are significantly higher than the standard value. The upper limit is 3 0 0 ppb, so the panel can be determined to be contaminated by the measurement method of the present invention. If the concentration C of each block is less than the standard value, the liquid crystal cell panel passes the test (S 3 0 9). The above-mentioned liquid crystal cell panel contamination detection method can be partitioned sampling
200428064 五、發明說明(9) 液晶及測量液晶中的污染物之濃度,更精確的定量分析污 染物之濃度。 雖然本發明已以較佳實施例揭露如上,然其並非用以 限定本發明,任何熟習此技藝者,在不脫離本發明之精神 和範圍内,當可作些許之更動與潤飾,因此本發明之保護 範圍當視後附之申請專利範圍所界定者為準。200428064 V. Description of the invention (9) Liquid crystal and measurement of the concentration of pollutants in liquid crystal, more accurate quantitative analysis of the concentration of pollutants. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications and retouching without departing from the spirit and scope of the present invention. The scope of protection shall be determined by the scope of the attached patent application.
0632-9840twf(nl) ; AU0301018 ; Yuchia.ptd 第12頁 200428064 圖式簡單說明 第1圖為本發明之液晶胞面板污染檢測取樣工具正面 示意圖; 第2a圖為本發明之液晶胞面板污染檢測取樣工具側面 示意圖; 第2b圖為本發明之液晶胞面板污染檢測取樣工具之彎 曲狀態之側面示意圖; 第3圖為本發明液晶胞面板之污染檢測方法流程圖; 第4圖為本發明之液晶胞面板分區不意圖; 第5圖為本發明之液晶胞面板之其中一區塊TFT-1之尺 寸示意圖;以及 第6圖為本發明之液晶胞面板之各區塊之濃度示意 圖。 符號說明 1 0〜取樣工具; 11〜頂端; 1 2〜中間部; 1 3〜底端; 1 4〜顆粒; 2 2〜液晶; 100〜主體; 121〜第一表面; 1 2 2〜第二表面; 131〜第三表面;0632-9840twf (nl); AU0301018; Yuchia.ptd Page 12 200428064 Brief description of the drawing Figure 1 is a schematic front view of the liquid crystal cell panel pollution detection sampling tool of the present invention; Figure 2a is the liquid crystal cell panel pollution detection sampling of the present invention Tool side schematic diagram; Figure 2b is a side schematic diagram of the bending state of the liquid crystal cell panel contamination detection sampling tool of the present invention; Figure 3 is a flowchart of the liquid crystal cell panel contamination detection method of the present invention; Figure 4 is a liquid crystal cell of the present invention Panel partitioning is not intended; FIG. 5 is a schematic diagram of the size of one block TFT-1 of the liquid crystal cell panel of the present invention; and FIG. 6 is a schematic diagram of the concentration of each block of the liquid crystal cell panel of the present invention. Explanation of symbols 1 0 ~ sampling tool; 11 ~ top; 1 2 ~ middle part; 1 3 ~ bottom end; 1 4 ~ particles; 2 2 ~ liquid crystal; 100 ~ main body; 121 ~ first surface; 1 2 2 ~ second Surface; 131 ~ third surface;
0632-9840twf(nl) ; AU0301018 ; Yucliia.ptd 第13頁 200428064 圖式簡單說明 2 0 0〜液晶胞面板; 2 0 1〜邊緣; TFT—1 、 TFT—2 、 TFT—3 、 TFT—4 、 TF丁一5 、TFT—6 、 TFT-7、TFT-8以及TFT-9〜區塊; L·〜長度; W〜寬度; II〜高度。0632-9840twf (nl); AU0301018; Yucliia.ptd page 13 200428064 The diagram briefly explains 2 0 0 ~ LCD panel; 2 0 1 ~ Edge; TFT-1, TFT-2, TFT-3, TFT-4, TF Ding Yi 5, TFT-6, TFT-7, TFT-8, and TFT-9 ~ blocks; L · ~ length; W ~ width; II ~ height.
0632-9840twf(nl) ; AU0301018 ; Yuchia.ptd 第14頁0632-9840twf (nl); AU0301018; Yuchia.ptd page 14
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