TWI308233B - Method and collecting tool to inspect a liquid crystal panel - Google Patents

Method and collecting tool to inspect a liquid crystal panel Download PDF

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Publication number
TWI308233B
TWI308233B TW92115516A TW92115516A TWI308233B TW I308233 B TWI308233 B TW I308233B TW 92115516 A TW92115516 A TW 92115516A TW 92115516 A TW92115516 A TW 92115516A TW I308233 B TWI308233 B TW I308233B
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liquid crystal
cell panel
crystal cell
sampling tool
contamination
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TW92115516A
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Chinese (zh)
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TW200428064A (en
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Chiao Chong Huang
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Au Optronics Corp
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案號 92115516 1308233 修正 五、發明說明(1) 【發明所屬之技術領域】 本發明係有關於一種液晶污染檢挪 具,特別是一種利用取樣工且進行液法/…、取樣工 、退叮欣日日取樣的方法。 【先前技術】 目前液晶顯示技術被廣泛的用在 舉凡計算機、t子錶、手機螢幕、醫:的電子產-中, 數位相機上面的螢幕等等,液晶顯示使用的儀器或是 :本元件,由於液晶是介於固以=料=Case No. 92115516 1308233 Amendment 5, Description of the Invention (1) Technical Field of the Invention The present invention relates to a liquid crystal contamination detecting device, in particular to a liquid sampling method using a sampler and a sampler, Daily sampling method. [Prior Art] At present, liquid crystal display technology is widely used in computers, t-tables, mobile phone screens, medical products, electronic displays, screens on digital cameras, etc., instruments used in liquid crystal display or: this component, Because the liquid crystal is between the solid = material =

範圍内卻具有液體和結晶雙方性質的物質,: 的狀態,2 =它命名為「LiquidCrystai」,、就= Γ吉晶二此,液晶不但具有固態晶體光學特 性’又具有液k動特性,液晶分子會受到電壓的影響, 改變其分子的排列狀態’並且可以讓射入的光線產生 的現象。In the range of substances with both liquid and crystalline properties, the state of 2: it is named "LiquidCrystai", and = Γ 晶 晶 二 , , , , , , , 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶The molecules are affected by the voltage, changing the arrangement of their molecules' and allowing the incident light to produce a phenomenon.

液晶顯示器以其輕薄、無閃燦、無輻射等眾多優點一 直吸引著眾人的目光’主要是以一液晶面板(LCDLCD monitors attract many people's attention because of their slimness, no flash, no radiation, etc. ‘mainly a liquid crystal panel (LCD)

panel)進行顯示,一般較為常見的LCD可區分為扭轉向列 型液晶顯示器(TN-LCD)、超扭轉向列型液晶顯示器(STN一 LTD)與薄膜電晶體液晶顯示器(TFT_LCD)等三大類,其中 TtT-LCD面板為目前市場主流,TFT_lCD面板的製程主要可 分為二個階段:首先稱之為薄膜電晶體元件陣列基板製程 (Array或Panel製程),其過程為玻璃基板上形成薄膜電 晶體(TFT)陣列;其次為液晶胞面板組裝((:611製程),其Panel) display, generally more common LCD can be divided into twisted nematic liquid crystal display (TN-LCD), super twisted nematic liquid crystal display (STN-LTD) and thin film transistor liquid crystal display (TFT_LCD) and other three categories, The TtT-LCD panel is the mainstream in the current market. The process of the TFT_lCD panel can be mainly divided into two stages: firstly, it is called a thin film transistor array substrate process (Array or Panel process), and the process is to form a thin film transistor on a glass substrate. (TFT) array; followed by liquid crystal cell panel assembly ((: 611 process),

1308233 --- 案號 92115516__年月 η ^'發明說明(2) 過程為將上下玻璃(陣列面板與彩色濾光片, 内灌入液晶;最後稱之為液晶面板模組、〇 ^ '1308233 --- Case No. 92115516__年月 η ^'Invention Description (2) The process is to put the upper and lower glass (array panel and color filter, into the liquid crystal; finally called the LCD panel module, 〇 ^ '

製程),其過程為將貼合後的面板蛊 、〇 ule或LCM 制電路板等零組件組合,詳言之組、驅動與控 組前段完成外部料(例如驅動IC及::顯示器製程之模 後,再將液晶面板進二,二;K電路板)的構裝 送入背光模組纽裝區域,斑由光學2適當的大小之後’ 所構成的背光模組丄裝導光板、燈管等 θ τ二仃裝不過,液晶面板進行組裝之 及液曰而:t易克服的問題之—便是因液晶面板的環境 物::: 液晶胞工程等動作而產生的異物,污染 ==錫#等問題。另外’液晶面板在切割或輪送時, 里π磨擦:產生靜電問使其更容易吸附環境中的 者於液晶面板上的異物若未清除,而隨著液 口;r:裝r、則可能!造成液晶顯示裝置的組裝不 與 而這成作業人員產出效率降低,造成產品光 了,& ί1再者,當污染物經由原材或封裝過耩中進入液Process), the process is to combine the components such as panel 〇, 〇ule or LCM circuit board, etc., in detail, the group, drive and control group complete the external materials (such as driver IC and:: display process model) After that, the liquid crystal panel is inserted into the second and second; K circuit board) into the backlight module new installation area, and the spot is made up of the appropriate size of the optical 2 backlight module, the light guide plate, the lamp tube, etc. θ τ 仃 不过 , , 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶 液晶And other issues. In addition, when the liquid crystal panel is cut or rotated, π rubbing: generating static electricity makes it easier to adsorb the foreign matter on the liquid crystal panel if it is not removed, but with the liquid port; r: r, it is possible ! The assembly of the liquid crystal display device is not the same, and the output efficiency of the operator is lowered, causing the product to be light, & ί1, when the contaminant enters the liquid through the raw material or the package.

^.可疋液晶存在於液晶胞中的最後狀皞,因此,必須 精確=量這些污染物之濃度。’取後狀L^. The final state of the liquid crystal in the liquid crystal cell, therefore, the concentration of these contaminants must be accurately =. 'after taking L

、去,I:: ί液晶顯示器之檢測方法係藉由陣列電路檢查方 性方i。ΐ ΐ種方法,分別是光學方法、電忮方法或電光 反覆圖索郫t之方法為與鄰近的圖案之間作比軾,以便把 則是在LCD ^中圖案不良的區域抽出之方式。€性的方法 法,電路上利用半導體記憶元件測試的同樣方 I電路上形成蓄電器(c〇ndenser),炎把實際LCD, go, I:: ί The detection method of the liquid crystal display is to check the square side by the array circuit. ΐ The method is optical method, electric cymbal method or electro-optical method. The method is to compare with the adjacent pattern to extract the area with poor pattern in LCD ^. The method of the method of the sex, the same circuit is tested on the circuit using the semiconductor memory element. The circuit is formed on the circuit (c〇ndenser), and the actual LCD is used.

1308233 案號 92115516_年月日_修正 五、發明說明(3) 和同樣之TFT通以電流(荷)而產生寫入和讀出之電子信號 ’以便檢驗出其異常之不良品。電光學之方法則是界n 述兩種方法之間的一種檢測方式,電荷寫入之蓄電器和同 電位之氧化銦錫(Indium Tin Oxide, ΙΤ0)電極電位通以 電光學元件而產生光學影像的變換,以檢驗出不良品。上 述三種方法皆可求得不良位置之所在以及不良形狀種類等 資訊,而不良種類可由各種不良原因和電性特性之關係加 以分類。然而,無法清楚得知液晶之污染源之成分或濃 度。特別是,因為取樣之困難,目前並無適當測量方法用 以定量分析TFT的每一個光格(Cell),本發明欲解決之課 題係對污染物做更詳盡的定量分析,且需要一種污染測量 方法以及一取樣工具。 【發明内容】 一有鑑於此,本發明的目的在於提供一種液晶胞面板之 =染取樣工具’在面板上精择的萃取含有污染之液晶,分 =濃度與成分’ 不會被面板之邊緣影響其取染之 準確度。 本發明之另一目的在於提供—種液晶胞面板之污染檢 :方法,完全不同於習知之電性測量方法,可分區取樣液 :及測量液晶中的污染物之濃度,更精確的定 物之濃度。 為達成上述㈣,本發明提供_種液晶胞面板之污染 仏測方法包括以下步驟:(a)提供—液晶胞面板;(b)利用 第6頁 1 1308233 _案號92115516_年月日__ 五、發明說明(4) 一取樣工具從液晶胞面板表面取得一液晶樣品;(C )使用 一溶劑將液晶樣品由取樣工具上沖下來;(d )分析液晶樣 品之成分;以及(e )求出成分之濃度,以判斷液晶胞面板 是否被污染。 在一較佳實施例中,液晶胞面板之污染檢測方法更包 括提供一標準值之步驟,當成分之濃度超過標準值,液晶 胞面板即判定為被污染。 又,溶劑係一丙酮。1308233 Case No. 92115516_Yearly Month_Amendment V. Invention Description (3) The same TFT generates an electronic signal for writing and reading by current (charge) to check for an abnormal defect. The method of electro-optics is a detection method between the two methods. The charge-writing accumulator and the inpotential tin oxide (Indium Tin Oxide, ΙΤ0) electrode potential pass through the electro-optical element to produce an optical image. Transform to check for defective products. All of the above methods can obtain information such as the location of the bad position and the type of the bad shape, and the bad type can be classified by the relationship between various adverse causes and electrical characteristics. However, the composition or concentration of the source of the liquid crystal cannot be clearly known. In particular, because of the difficulty of sampling, there is currently no suitable measurement method for quantitatively analyzing each cell of the TFT. The problem to be solved by the present invention is to perform a more detailed quantitative analysis of the contaminant and a pollution measurement is required. Method and a sampling tool. SUMMARY OF THE INVENTION In view of the above, an object of the present invention is to provide a liquid crystal cell panel=staining sampling tool 'selectively extracting liquid crystals containing contamination on a panel, and the concentration=concentration and composition' are not affected by the edge of the panel. The accuracy of its dyeing. Another object of the present invention is to provide a liquid crystal cell panel contamination detection method, which is completely different from the conventional electrical measurement method, can partition the sampling liquid: and measure the concentration of the pollutant in the liquid crystal, and more accurately determine the concentration concentration. In order to achieve the above (4), the present invention provides a method for contamination detection of a liquid crystal cell panel comprising the steps of: (a) providing a liquid crystal cell panel; (b) utilizing page 6 1 1308233 _ case number 92115516_年月日日__ 5. Description of the invention (4) A sampling tool takes a liquid crystal sample from the surface of the liquid crystal cell panel; (C) uses a solvent to flush the liquid crystal sample from the sampling tool; (d) analyzes the composition of the liquid crystal sample; and (e) seeks The concentration of the ingredients is determined to determine whether the liquid crystal cell panel is contaminated. In a preferred embodiment, the method for detecting contamination of a liquid crystal cell panel further comprises the step of providing a standard value, and when the concentration of the component exceeds a standard value, the liquid crystal cell panel is judged to be contaminated. Further, the solvent is acetone.

又,取樣工具具有一第一表面以及一第二表面,第一 、第二表面均具有複數個顆粒,使液晶容易吸附在第一、 第二表面上。 又,取樣工具係由鐵氟龍所製成。 本發明另提供一種液晶胞面板之污染檢測方法包括以 下步驟:(a)提供一液晶胞面板;(b )利用一取樣工具從複 數區塊表面之不同處取得複數個液晶樣品;(c )使用溶劑 將複數液晶樣品由取樣工具上沖下來;(d )分析複數液晶 樣品之成分;以及(e)求出複數成分之濃度*以判斷液晶 胞面板是否被污染。Further, the sampling tool has a first surface and a second surface, and the first and second surfaces each have a plurality of particles, so that the liquid crystal is easily adsorbed on the first and second surfaces. Also, the sampling tool is made of Teflon. The invention further provides a liquid crystal cell panel pollution detecting method comprising the steps of: (a) providing a liquid crystal cell panel; (b) using a sampling tool to obtain a plurality of liquid crystal samples from different portions of the plurality of blocks; (c) using The solvent rushes the plurality of liquid crystal samples from the sampling tool; (d) analyzes the components of the plurality of liquid crystal samples; and (e) determines the concentration of the plurality of components* to determine whether the liquid crystal cell panel is contaminated.

在一較佳實施例中,液晶胞面板之污染檢測方法更包 括將液晶胞面板分為複數區塊之步驟,其中步驟(b)係於 母 ~~區塊内取液晶樣品。 又,將液晶胞面板分為九區塊。 又,複數區塊排成陣列。 又,陣列為3 X 3。In a preferred embodiment, the method for detecting contamination of the liquid crystal cell panel further comprises the step of dividing the liquid crystal cell panel into a plurality of blocks, wherein the step (b) is to take a liquid crystal sample in the mother cell. Also, the liquid crystal cell panel is divided into nine blocks. Also, the plurality of blocks are arranged in an array. Also, the array is 3 X 3 .

第7頁 1308233 _案號92115516_年月日__ 五、發明說明(5) 在一較佳實施例中,液晶胞面板之污染檢測方法更包 括提供一標準值之步驟,當複數成分之濃度超過標準值, 液晶胞面板即判定為被污染。 又,溶劑係一丙酮。 又,取樣工具具有一第一表面以及一第二表面,第一 、第二表面均具有複數個顆粒,使液晶容易'吸附在第一、 第二表面上。 又,取樣工具係由鐵氟龍所製成。 本發明更提供一種液晶胞面板之污染檢測之取樣工具 包括一主體以及複數個顆粒,其中,主體包括一頂端、一 中間部以及一底端,中間部連接頂端與底端,中間部則包 括一第一表面及一第二表面,第一表面與第二表面為相反 面,且底端包括一第三表面,其中第三表面與第一表面連 接,以及複數個顆粒係設置在第一表面、第二表面以及第 三表面上。 又,取樣工具係由鐵氟龍所製成。 又,取樣工具係可撓性材質所製成。 又,取樣工具更包括一把手,設置在主體之頂端。 為了讓本發明之上述和其他目的、特徵、和優點能更 明顯易懂,下文特舉一較佳實施例,並配合所附圖示,作 詳細說明如下: 【實施方式】 為了對液晶中的污染物做更詳盡的定量分析,本發明Page 7 1308233 _ Case No. 92115516_年月日日__ V. Description of the Invention (5) In a preferred embodiment, the method for detecting contamination of a liquid crystal cell panel further comprises the step of providing a standard value, when the concentration of the plurality of components When the standard value is exceeded, the liquid crystal cell panel is judged to be contaminated. Further, the solvent is acetone. Further, the sampling tool has a first surface and a second surface, and the first and second surfaces each have a plurality of particles, so that the liquid crystal is easily 'adsorbed on the first and second surfaces. Also, the sampling tool is made of Teflon. The present invention further provides a sampling tool for contamination detection of a liquid crystal cell panel comprising a main body and a plurality of particles, wherein the main body includes a top end, an intermediate portion and a bottom end, the middle portion connects the top end and the bottom end, and the middle portion includes a middle portion a first surface and a second surface, the first surface is opposite to the second surface, and the bottom end includes a third surface, wherein the third surface is coupled to the first surface, and the plurality of particles are disposed on the first surface, On the second surface and the third surface. Also, the sampling tool is made of Teflon. Also, the sampling tool is made of a flexible material. Moreover, the sampling tool further includes a handle disposed at the top of the body. The above and other objects, features and advantages of the present invention will become more apparent and understood. More detailed quantitative analysis of contaminants, the present invention

1308233 _案號9211551 fi_年月日 格JL·__ 五、發明說明(6) 提供一種液晶胞面板污染測量方法以及一取樣工具。如第 1、2a及2b圖所示,本發明經由一取樣工具10在面板200上 萃取含有污染物之液晶22,藉由本發明之液晶胞面板污染 測量方法,測量液晶22中的污染物之濃度與成分,而不會 被面板2 0 0之邊緣影響其取樣污染之準確度,尤其越靠近 面板邊緣之液晶22,其污染濃度就越高。通常液晶之污染 物包括金屬離子,例如N ,因此必須取樣來得知N a+之濃 度’以下詳細說明本發明之取樣工具。 如第2 a圖所示,液晶胞面板2 0 0之污染檢測之取樣工 具10包括一主體100以及複數個顆粒丨4,其中,主體1〇〇包 括一頂端11、—中間部1 2以及一底端1 3,中間部1 2連接頂 端11與底端1 2,中間部1 2則包括一第一表面! 2 1及一第二 表面122 ’第一表面121與第二表面122為相反面,且底端 13包括一第三表面131,其中第三表面13ι與第一表面 連接,而上述顆粒14係設置在第一表面121、第二表面122 以及第三表面1 31上。此實施例之取樣工具1〇之材質主要 以不溶出污染物之物質為主,例如鐵氟龍本身具有安定之 特性’不會容易與污染物產生化學變化,因此,取樣工具 通常是由鐵氟龍所製程,除此之外,材質必須是可挽性>、 的,能使取樣工具丨〇彎曲,如第2b圖所示,在刮取 品2 2時’鐵氟龍本身吸附力不強,所以在取樣工具之 上之複數顆粒14造成毛細現象,使液晶22容易附著在顆 14上。雖然圖上未顯示,取樣工具更可包括—把手, 在主體100之頂端n。 6又置1308233 _ Case No. 9211551 fi_年月日日 JL·__ V. Invention Description (6) A liquid crystal cell panel pollution measuring method and a sampling tool are provided. As shown in Figures 1, 2a and 2b, the present invention extracts a liquid crystal 22 containing contaminants on a panel 200 via a sampling tool 10, and measures the concentration of contaminants in the liquid crystal 22 by the liquid crystal cell panel contamination measuring method of the present invention. With the composition, the accuracy of the sample contamination is not affected by the edge of the panel 200, especially the closer to the liquid crystal 22 at the edge of the panel, the higher the contamination concentration. Usually, the liquid crystal contaminant includes a metal ion such as N, so it is necessary to sample to know the concentration of Na+. The sampling tool of the present invention will be described in detail below. As shown in FIG. 2a, the sampling tool 10 for contamination detection of the liquid crystal cell panel 200 includes a main body 100 and a plurality of particle crucibles 4, wherein the main body 1 includes a top end 11, an intermediate portion 12 and a The bottom end 13 is connected to the top end 11 and the bottom end 1 2, and the intermediate portion 1 2 includes a first surface! 2 1 and a second surface 122 'the first surface 121 and the second surface 122 are opposite sides, and the bottom end 13 includes a third surface 131, wherein the third surface 13 is connected to the first surface, and the particles 14 are arranged On the first surface 121, the second surface 122, and the third surface 1 31. The sampling tool of the embodiment 1 is mainly made of a substance which does not dissolve pollutants, for example, the Teflon itself has a stable property 'will not easily change chemically with the contaminant, therefore, the sampling tool is usually made of iron fluoride. In addition to the process of the dragon, the material must be manageable. It can bend the sampling tool. As shown in Figure 2b, the Teflon itself does not absorb when scraping 2 2 Strong, so the plurality of particles 14 on the sampling tool cause a capillary phenomenon, so that the liquid crystal 22 is easily attached to the particles 14. Although not shown in the drawings, the sampling tool may further include a handle, at the top end n of the body 100. 6 again

第9頁 1308233 修正 曰 x 〜 life 9211551 fi_年 五、發明說明 面,例可有一變化例,使取樣工具10具有粗糙之表 染物i &粒與粗糙表面均可使其產生毛細現象,使得泠 个初,易吸附在取樣工具上。 請參考1為本發明液晶胞面板之污染檢測方法流程圖。 S301),i圖及第4圖,首先,提供—液晶胞面板200(少驟 確度,’可脸了不被面板200之邊緣201影響其取樣污染之準 從複數區途ί晶胞面板2 0 0分隔取樣,利用一取樣工具10 7 、面之不同處取得複數個液晶樣品(S302),取 ^曰ς取得樣品後,使用溶劑(通常是使用丙酮)將複數 二抑由取樣工具1 〇上沖下來(S 3 0 3 重複上述步驟 λ ”S303直到取得每一區塊之液晶樣品(S304 ),接下 來,刀析複數液晶樣品之成分與濃度(S3〇5),以及求出每 一區塊之>5染物成分與濃度(83〇6),以判斷液晶胞面板 2 0 0是否被污染(S3〇7)。 —本發月_之步驟S302〜S304中更包括分區取樣之步驟, 如第4圖所示,將液晶胞面板2〇〇分為複數區塊my、 TFT-2 、TFT-3 、TFT一4 、TFT_5 、tft_6 、tft_7 、tft_8# 及TFT 9於母一區塊内取一液晶樣品,複數區塊係排成 陣列3x3,換言之,將液晶胞面板2 〇〇分隔成九區塊,每一 區塊具有固定面積’每一格距離玻璃邊緣2 〇 1大約1 cm為較 佳實施方式,在每一區塊上,利用上述取樣工具1〇取出需 測量之液晶’因此不會碰觸到面板之邊緣。 、 以下說明液晶之污染物濃度之分析與計算方式,且一 併參考第3圖之步驟33〇5〜83〇9。分析每一區塊之液晶樣品Page 9 1308233 Correction x~ life 9211551 fi_year 5, invention description, there may be a variation, so that the sampling tool 10 has a rough surface dye i & grain and rough surface can make it capillary phenomenon, so that At the beginning, it is easy to adsorb on the sampling tool. Please refer to FIG. 1 for a flow chart of a method for detecting contamination of a liquid crystal cell panel of the present invention. S301), i and Fig. 4, firstly, provide - liquid crystal cell panel 200 (small accuracy, 'face can not be affected by the edge 201 of the panel 200, the sampling contamination is from the complex area to the cell panel 2 0 0 separate sampling, use a sampling tool 10 7 , different parts of the surface to obtain a plurality of liquid crystal samples (S302), take the sample to obtain the sample, use the solvent (usually using acetone) to the plural two by the sampling tool 1 〇 The upper portion is washed down (S 3 0 3 repeats the above step λ ” S303 until the liquid crystal sample of each block is obtained (S304), and then the composition and concentration (S3〇5) of the plurality of liquid crystal samples are analyzed, and each is obtained. >5 stain component and concentration (83〇6) of the block to determine whether the liquid crystal cell panel 200 is contaminated (S3〇7). - Steps S302 to S304 of the month of the month further include the step of partition sampling As shown in FIG. 4, the liquid crystal cell panel 2 is divided into a plurality of blocks my, TFT-2, TFT-3, TFT-4, TFT_5, tft_6, tft_7, tft_8#, and TFT 9 in the parent block. Take a liquid crystal sample inside, and the multiple blocks are arranged in an array of 3x3, in other words, the liquid crystal cell panel 2 is divided In the nine blocks, each block has a fixed area 'each cell is 2 〇1 and about 1 cm away from the edge of the glass. In each block, the above-mentioned sampling tool 1 is used to take out the liquid crystal to be measured. Therefore, the edge of the panel will not be touched. The following describes the analysis and calculation method of the concentration of the liquid crystal pollutants, and refer to steps 33〇5 to 83〇9 of Fig. 3 to analyze the liquid crystal samples of each block.

第10頁 1308233 案號 92115516 修正 曰 五、發明說明(8) ^成刀與浪度之中,本發明利用定量計算污染物濃度, 述=樣工具10所刮取之液晶溶液收集,並定義在每—區 = 2之液晶樣品之體積為v,測量液晶樣品之濃度為 、),再計算每一區塊之液晶之體積,舉例來說,將面 为為九區塊時,如第5圖所示,第5圖為本發明之液 區塊㈣1之尺寸示意圖,每—區塊之液晶 V〇= (L * W * H/2) / 9 其中L =液晶區塊之長度; W=液晶區塊之寬度; H/2 =液晶區塊之高度(η)之;[/2; 輕由化學分析液晶樣品中的各污染物或成分濃度 (S3 0 5 ),取得每一液晶樣品之測試濃度(Cq),藉由以下公 式:C = Cfl*(V/VQ),而還原污染物之真正濃度c(步驟 S306)。 步驟S306之後’判定濃度是否高於標準值(S3〇7),成 之標準值通常是介於200_3〇〇ppb之間,當成分Na+之 〉辰度超過此標準值,液晶胞面板即判定為被污染(S 3 〇 8) ’ 如第6圖所示,顯示一實驗數據,靠近面板邊緣2〇1的區塊 TFT-1與TFT-2之濃度分別為559ppb與335ppb,明顯高於標 準值之上限3 0 0ppb ’因此經由本發明之測量方法可判定該 面板是被污染的’如果每一區塊之濃度C是小於標準值, 即此液晶胞面板通過測試(S3 0 9 )。 如以上所述之液晶胞面板之污染檢測方法可分區取樣 第11頁 1 1308233 _案號92115516_年月曰 修正_ 五、發明說明(9) 液晶及測量液晶中的污染物之濃度,更精確的定量分析污 染物之濃度。 雖然本發明已以較佳實施例揭露如上,然其並非用以 限定本發明,任何熟習此技藝者,在不脫離本發明之精神 和範圍内,當可作些許之更動與潤飾,因此本發明之保護 範圍當視後附之申請專利範圍所界定者為準。Page 10 1308233 Case No. 92115516 Revision 、 V. Invention Description (8) ^ Among the knives and the undulations, the present invention utilizes the quantitative calculation of the concentration of the pollutants, and the liquid crystal solution collected by the sample tool 10 is collected and defined in The volume of the liquid crystal sample per area = 2 is v, the concentration of the liquid crystal sample is measured, and the volume of the liquid crystal of each block is calculated. For example, when the surface is nine blocks, as shown in Fig. 5 5 is a schematic view showing the size of the liquid block (4) 1 of the present invention, and the liquid crystal V每 of each block is (L * W * H/2) / 9 where L = the length of the liquid crystal block; W = liquid crystal The width of the block; H/2 = the height of the liquid crystal block (η); [/2; lightly by chemical analysis of the concentration of each pollutant or component in the liquid crystal sample (S3 0 5), the test of each liquid crystal sample The concentration (Cq) is reduced by the following formula: C = Cfl*(V/VQ), and the true concentration c of the contaminant is reduced (step S306). After step S306, it is determined whether the concentration is higher than the standard value (S3〇7), and the standard value is usually between 200_3〇〇ppb. When the component Na+ is greater than the standard value, the liquid crystal panel is judged as Contaminated (S 3 〇8) ' As shown in Figure 6, an experimental data is displayed. The concentrations of the blocks TFT-1 and TFT-2 near the edge of the panel 2〇1 are 559ppb and 335ppb, respectively, which are significantly higher than the standard value. The upper limit of 3 0 ppb 'so the panel can be determined to be contaminated by the measuring method of the present invention 'if the concentration C of each block is less than the standard value, that is, the liquid crystal cell panel passes the test (S309). The liquid crystal cell panel pollution detection method as described above can be divided into sections. Page 11 1 1308233 _ Case No. 92115516_Yearly 曰 Revision _ V. Invention Description (9) Liquid crystal and measuring the concentration of pollutants in liquid crystal, more precise Quantitative analysis of the concentration of contaminants. While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the present invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.

第12頁 1308233 _案號92115516_年月曰 修正_ 圖式簡單說明 第1圖為本發明之液晶胞面板污染檢測取樣工具正面 示意圖; 第2a圖為本發明之液晶胞面板污染檢測取樣工具侧面 不意圖; 第2b圖為本發明之液晶胞面板污染檢測取樣工具之彎 曲狀態之側面示意圖; 弟3圖為本發明液晶胞面板之污染檢測方法流程圖; 第4圖為本發明之液晶胞面板分區示意圖;Page 12 1308233 _ Case No. 92115516_ Year Month 曰 Correction _ Brief Description of the Drawing FIG. 1 is a front view of the liquid crystal cell panel pollution detecting sampling tool of the present invention; FIG. 2a is a side view of the liquid crystal cell panel pollution detecting sampling tool of the present invention 2b is a side view of the bending state of the liquid crystal cell panel pollution detecting sampling tool of the present invention; FIG. 3 is a flow chart of the method for detecting contamination of the liquid crystal cell panel of the present invention; FIG. 4 is a liquid crystal cell panel of the present invention; Schematic diagram of the partition;

第5圖為本發明之液晶胞面板之其中一區塊TFT-1之尺 寸示意圖;以及 第6圖為本發明之液晶胞面板之各區塊之濃度示意 圖。 符號說明Fig. 5 is a schematic view showing the size of one of the blocks TFT-1 of the liquid crystal cell panel of the present invention; and Fig. 6 is a view showing the concentration of each block of the liquid crystal cell panel of the present invention. Symbol Description

10- 取樣工具; 1卜 頂端; 12〜 中間部; 13~ 底端; 14〜 顆粒; 22〜 液晶; 100 〜主體; 121 〜第一表 面 122 〜第二表 面 131 ~第三表 面10- Sampling tool; 1 Bu top; 12~ middle part; 13~ bottom end; 14~ pellet; 22~ liquid crystal; 100~ body; 121~ first surface 122~ second surface 131 ~ third surface

第13頁 1308233 _案號92115516_年月日_Hi_ 圖式簡單說明 2 0 0 ~液晶胞面板; 2 0 1〜邊緣; TFT-1 'TFT-2 'TFT-3 、 TFT-4 'TFT-5 'TFT-6 、TFT-7、TFT-8以及TFT-9〜區塊; L〜長度; W〜寬度; Η〜高度。Page 13 1308233 _ Case No. 92115516_年月日日_Hi_ Schematic description 2 0 0 ~ liquid crystal cell panel; 2 0 1~ edge; TFT-1 'TFT-2 'TFT-3, TFT-4 'TFT- 5 'TFT-6, TFT-7, TFT-8 and TFT-9~blocks; L~length; W~width; Η~height.

第14頁Page 14

Claims (1)

φ:Φ: 案 號 92115516 修正 六、申請專利範圍 1. 一種液晶胞面板之污染檢測方法,包括以下步驟: (a )提供一液晶胞面板; (b) 將該液晶胞面板分為複數區塊, (c) 利用一取樣工具從該等區塊表面之不同處取得複 數個液晶樣品,其中該取樣工具具有一第一表面以及一第 二表面,該第一、第二表面均具有複數個顆粒,使該液晶 容易吸附在該第一、第二表面上; (d) 使用溶劑將該等液晶樣品由該取樣工具上沖下來; (e )分析該等液晶樣品之污染物成分’及求出其測試 濃度;以及 (f )根據該測試濃度求出該等成分之真正濃度,且以 該真正濃度是否超過一標準值,以判斷該液晶胞面板是否 被污染。 2. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,更包括將該液晶胞面板分為複數區塊之步驟,其 中步驟(c)係於每一區塊内取一液晶樣品。 3. 如申請專利範圍第2項所述之液晶胞面板之污染檢 測方法,其中該液晶樣品之體積為V ’該每一區塊之液晶 體積為V。,該測試濃度為C〇,該真正濃度為C ’則C = C〇 X (v/v0)。 4. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,其中將該液晶胞面板分為九區塊。 5. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,其中該等區塊排成陣列。Case No. 92115516 Amendment VI. Patent Application Range 1. A method for detecting contamination of a liquid crystal cell panel, comprising the steps of: (a) providing a liquid crystal cell panel; (b) dividing the liquid crystal cell panel into a plurality of blocks, (c) Acquiring a plurality of liquid crystal samples from different portions of the surface of the blocks by using a sampling tool, wherein the sampling tool has a first surface and a second surface, the first and second surfaces each having a plurality of particles, such that the liquid crystal Easily adsorbed on the first and second surfaces; (d) using a solvent to flush the liquid crystal samples from the sampling tool; (e) analyzing the pollutant components of the liquid crystal samples and determining the test concentration thereof; And (f) determining the true concentration of the components based on the test concentration, and determining whether the liquid crystal cell panel is contaminated by whether the true concentration exceeds a standard value. 2. The method for detecting contamination of a liquid crystal cell panel according to claim 1, further comprising the step of dividing the liquid crystal cell panel into a plurality of blocks, wherein the step (c) is to take a liquid crystal in each block. sample. 3. The method for detecting a contamination of a liquid crystal cell panel according to claim 2, wherein the liquid crystal sample has a volume of V ′ and the liquid crystal volume of each of the blocks is V. The test concentration is C〇, and the true concentration is C ′ then C = C〇 X (v/v0). 4. The method for detecting contamination of a liquid crystal cell panel according to claim 1, wherein the liquid crystal cell panel is divided into nine blocks. 5. The method for detecting contamination of a liquid crystal cell panel according to claim 1, wherein the blocks are arranged in an array. 第15頁 1308233 案號 92115516 一卞 _魅-- 六、申請專利範圍 6. 如申請專利範圍第5項所述之液晶胞面板之污染檢 測方法,其中該陣列為3x3。 7. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,其中該溶劑係一丙酮。 8. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,其中該污染物為鈉離子。 9. 如申請專利範圍第1項所述之液晶胞面板之污染檢 測方法,其中該標準值為2〇〇〜3 0 0PPM。 I 0.如申請專利範圍第1項所述_之液晶胞面板之污染檢 測方法,其中該取樣工具係由鐵氟龍所製成。 II · 一種液晶胞面板之污染檢測之取樣工具,包括: 一主體(100)包括一頂端(11)、一中間部(12)以及一 底端(1 3 ),該中間部(1 2 )連接該頂端(11)與該底端(1 3 ), 該中間部(12)則包括一第一表面(121)及一第二表面 (122),該第一表面(121)與該第二表面(122)為相反面, 且該底端(13)包括一第三表面(131),其中該第三表面 (131)與該第一表面(121)連接,且該主體(100)為可繞性 材質所製成;以及 複數個顆粒(14),設置在該第一表面(121)、該第二 表面(122)以及該第三表面上(131),其中該等顆粒(14)具 有吸附性可吸附一液晶胞面板之液晶。 12.如申請專利範圍第i i項所述之液晶胞面板之污染 檢測之取樣工具,其令該取樣工具係由鐵氟龍所製成/ 1 3.如申請專利範圍第丨丨項所述之液晶胞面板之污染Page 15 1308233 Case No. 92115516 一卞 _魅-- VI. Patent Application Range 6. The method for detecting contamination of liquid crystal cell panels according to item 5 of the patent application scope, wherein the array is 3x3. 7. The method for detecting a contamination of a liquid crystal cell panel according to claim 1, wherein the solvent is acetone. 8. The method for detecting a pollution of a liquid crystal cell panel according to claim 1, wherein the contaminant is sodium ion. 9. The method for detecting contamination of a liquid crystal cell panel according to claim 1, wherein the standard value is 2 〇〇 to 300 PPM. I 0. The method for detecting contamination of a liquid crystal cell panel according to claim 1, wherein the sampling tool is made of Teflon. II. A sampling tool for contamination detection of a liquid crystal cell panel, comprising: a body (100) comprising a top end (11), an intermediate portion (12) and a bottom end (13), the intermediate portion (1 2 ) being connected The top end (11) and the bottom end (13), the intermediate portion (12) includes a first surface (121) and a second surface (122), the first surface (121) and the second surface (122) is the opposite side, and the bottom end (13) includes a third surface (131), wherein the third surface (131) is coupled to the first surface (121), and the body (100) is wrapable Made of a material; and a plurality of particles (14) disposed on the first surface (121), the second surface (122), and the third surface (131), wherein the particles (14) have adsorption It can adsorb the liquid crystal of a liquid crystal cell panel. 12. A sampling tool for contamination detection of a liquid crystal cell panel according to claim ii, wherein the sampling tool is made of Teflon / 1 3. As described in the scope of claim Liquid crystal cell panel pollution 第16頁 1308233 案號92115516 年月日 修正Page 16 1308233 Case No. 92115516 第17頁Page 17
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WO2015184666A1 (en) * 2014-06-04 2015-12-10 深圳市华星光电技术有限公司 Wash chamber discharging method and device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015184666A1 (en) * 2014-06-04 2015-12-10 深圳市华星光电技术有限公司 Wash chamber discharging method and device

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