TW200307139A - Apparatus and method for examining insulation of circuit board - Google Patents

Apparatus and method for examining insulation of circuit board Download PDF

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Publication number
TW200307139A
TW200307139A TW92106490A TW92106490A TW200307139A TW 200307139 A TW200307139 A TW 200307139A TW 92106490 A TW92106490 A TW 92106490A TW 92106490 A TW92106490 A TW 92106490A TW 200307139 A TW200307139 A TW 200307139A
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Taiwan
Prior art keywords
voltage
circuit board
spark
insulation
wiring
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TW92106490A
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Chinese (zh)
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TWI221925B (en
Inventor
Munehiro Yamashita
Tadashi Takahashi
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Nidec Read Corp
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Priority claimed from JP2002142608A external-priority patent/JP3546046B2/en
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Publication of TWI221925B publication Critical patent/TWI221925B/en

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Abstract

A kind of insulation examining apparatus is disclosed in the present invention, which adds DC voltage in between the wirings of circuit board to conduct the examination of insulation characteristic of the wirings, capable of truly preventing the circuit board having spark occurrence during insulation examination from being mixed into the circuit boards judged as the excellent products. The variable voltage source 2 of the insulation examining apparatus passes through the switch circuit 4; and a voltage meter 3 is used to measure the voltage added to the wirings Pi at the determined moment after adding a determined DC voltage to the determined wirings Pi (i=1, 2, 3, 4, 5). In addition, a current meter 5 is used to measure the current I flowing between the wirings. A control apparatus 6 calculates the insulation resistance value based on these two measured values so as to determine if the circuit board passes or fails according to the insulation resistance value. However, once there is spark generated in between the wirings caused by the added voltage, the spark detection circuit 7 can be used to check whether the spark is occurred or not. Thus, the circuit board having the occurrence of spark can be directly judged as the unqualified product by the control apparatus 6 without using the insulation resistance value to judge whether the circuit board is qualified or not.

Description

200307139200307139

發明所屬之技術領域 本發明係有關一種印刷雷敗且、 顯示哭的雷極杯莖士物甘 土 液晶以及等離子體 法。 、色緣檢查裝置和絕緣檢查方 先前技術 近年來’對於設有複數條配線的 用絕緣檢查裝i,對各配線與 通:疋利 将r县丕仅《目女+ \ 、/、他配線的絕緣情況是否良 好(疋否保迅具有充分的絕緣性)進行 板是否為優良品。 斷木檢置電路基 圖4是習知的絕緣檢查裝置的基本結構示意圖。 絕緣裝置1 〇 〇包括··用於在於杏 接點之間施加高壓電壓v(比如在象的配㈣、P2的 ιοί > ^„ Λ ,π ρ Τη ^ ^ m、連接在上述配線Ρ i ;的門關2丄間的田電壓的電壓表 P1 DO ^ ^ ^ 上的開關1 0 3、用於測量在配線 、之間 '机動的電流ί的電流計104、以及基於電壓表 和電流計1〇4輸出的計算出電阻值R(v/n、並根 其電阻值R來判斷絕緣狀況是否良好的控制裝置1〇5。 a ^此、巴緣檢查I置1 〇 〇中,一旦由控制裝置1 0 5接通了 開關103,可變電壓源101的輸出電壓則被施加在配線”、 P2之間,由電壓表102測出的配線ρι,之間的電壓值和 由電流計104測出的在配線P1、p2之間流動的電流值則被 輸入到控制裝置105。控制裝置1〇5,在配線ρι、p2之間施 加了可變電壓源101的輪出電壓之後,在既定的時間根據FIELD OF THE INVENTION The present invention relates to a liquid crystal and plasma method of a thunder pole cup, which is printed with thunder, and shows crying. In the past years, the color edge inspection device and the insulation inspection party have used the insulation inspection equipment with multiple wirings to connect to each wiring: "Li Mianxian County" only "Men + +, /, other wiring Whether the insulation is good (whether Baoxun has sufficient insulation), whether the board is good. Broken wood detection circuit base Fig. 4 is a schematic diagram of the basic structure of a conventional insulation inspection device. The insulation device 1 includes: a voltage for applying a high voltage v between the apricot contacts (e.g., the distribution of an elephant, ιοί of P2 > ^ „Λ, π ρ Τη ^ ^ m, connected to the above-mentioned wiring P i ; Gate 2 of the field voltage voltmeter P1 DO ^ ^ ^ on the switch 1 0 3, for measuring the wiring, between the 'motorized current' ammeter 104, and based on the voltmeter and ammeter The control device 10 which calculates the resistance value R (v / n and the resistance value R to determine whether the insulation is good or not) is outputted from the 104 output. A ^ Here, the edge check I is set to 1 and once The control device 105 turns on the switch 103, and the output voltage of the variable voltage source 101 is applied to the wiring ", P2, the wiring value measured by the voltmeter 102, and the voltage value between the wiring and the current meter 104 The measured current value flowing between the wirings P1 and p2 is input to the control device 105. The control device 105 applies a wheel-out voltage of the variable voltage source 101 between the wirings p1 and p2, and then determines Time basis

200307139 五、發明說明(2) 檢測出來的電壓值V和電流值】計算出配線ρι 阻值(絕緣電阻值)R= V/I, 之門的電 ^ 亚刊斷此絕緣雷阻僧R县否 在預先設定的既定臨界值Ref 值疋否 u ^ H ^ mKel以上,以此來判定電路基板 。也就疋,备絕緣電阻值R在臨界值Ref以上 =,控,裝置1〇5就判斷配線P1、P2之間的絕緣狀況為良 好,而當絕緣電阻值R未達到臨界值Ref時, 就判斷配線P1、P2之間的絕緣狀況為不良。…105 /在配線p 1、P2之間施加了可變電壓源丨〇 1的輸出電壓 之後’不立即對絕緣狀況是否良好進行判斷,這是因為, 如圖5胃所不,在配線p丨、P2之間剛剛施加了電壓v,配線間 的電壓還處在不穩定的狀態(圖5(a )中的電壓上升的區 ^ ) ’並且,在配線p丨、p 2之間一瞬間有較大的過渡電流 流動’所以,要在配線P丨、P2之間的電壓穩定在所施加的 電壓V上、且電流也處於穩定的既定時刻12後才對絕緣狀 況是否良好進行判斷。 發明内容 發明所要解決的課題 但是,因為在檢查對象的配線P 1、P2之間施加了高壓 的直流電壓,這樣從施加電壓之後到經過一個既定時刻12 為止’會在配線之間出現產生火花的現象,因此,會存在 配線P1、P2之間的絕緣電阻值發生變化的不良情況。 比如,在圖5中,如果在時刻11發生了火花’如虛線A 所示,配線之間的電壓就會在一剎那間急劇地下降’之後200307139 V. Description of the invention (2) The detected voltage value V and current value] Calculate the wiring resistance value (insulation resistance value) R = V / I, the electrical of the door If it is not more than the predetermined threshold value Ref set in advance? No u ^ H ^ mKel, to determine the circuit board. That is, if the prepared insulation resistance value R is above the threshold value Ref =, the device 105 judges that the insulation condition between the wirings P1 and P2 is good, and when the insulation resistance value R does not reach the threshold value Ref, It is determined that the insulation condition between the wirings P1 and P2 is defective. … 105 / After the output voltage of the variable voltage source 丨 〇1 is applied between wiring p1 and P2, it is not immediately judged whether the insulation is good or not, because, as shown in Figure 5, the wiring p 丨The voltage v has just been applied between P2 and P2, and the voltage between the wirings is still in an unstable state (the area where the voltage rises in FIG. 5 (a) ^). Also, there is an instant between wirings p 丨 and p2. A large transient current flows. Therefore, it is necessary to judge whether the insulation condition is good after the voltage between the wirings P1 and P2 is stabilized at the applied voltage V and the current is also stable at a predetermined time 12. SUMMARY OF THE INVENTION However, since a high-voltage DC voltage is applied between the wirings P 1 and P 2 to be inspected, a spark will occur between the wirings after the voltage is applied until a predetermined time 12 elapses. As a result, there is a problem that the insulation resistance value between the wirings P1 and P2 changes. For example, in FIG. 5, if a spark occurs at time 11 'as shown by the dotted line A, the voltage between the wirings will drop sharply in an instant'

2014-5547-PF(Nl).ptd 第6頁 200307139 五、發明說明(3) 再上升,與此同時,如虛線B所示,在一瞬間有較大的電 流流動,而絕緣電阻值R在火花發生的一瞬間幾乎成為〇 Q 之後,再逐漸增大° 火花發生後’由於配線之間的電壓在朝施加電壓v上 升的同時,在配線P1、P 2之間流動的電流在下降,所以, 配線PI、P2之間的絕緣電阻值R會增大。但是,由於因火 花而引起絕緣電限值R發生變化,如虛線C、D所示,其增 大的波形也就處於不穩定狀態。這樣,如虛線c所示,在 檢查時刻12 ’絕緣電阻值R為®品界值R e f以上的,就可以判 斷電路基板為優良品’如虛線D所示,絕緣電阻值r比臨界 值Ref小的,就判斷電路基板為不良品。 ^ 由於因火花而引起絕緣電阻值R比臨界值Re f小的,即 使是按習知的絕緣檢查方法,也可以在檢測時刻t2將電路 基板判斷為不良品,所以,對此種情況不存在什麼特別的 問題。然而,對於如虛線C所示的、上述絕緣電阻值R在臨 界值Re ί以上的情況來說,由於按習知的絕緣檢查方法, 會在上述檢測時刻12將電路基板判斷為優良品,所以, 被判斷為優良品的電路基板中,因絕緣檢查中火花的發 而引起絕緣電阻值R發生變化的電路基板、以及不是'、言x 情況的電路基板就都混在一起了。由於火花產生而% 緣電阻,R發生變化的電路基板會因火花的發生而多+為 到一些f傷,因此,與沒有產生火花的電路基板相比/又, 製品的信賴度就有所降低,之後就會出現在該 = 安裝電路零料、或者是在檢查安裝了零部件的;=2014-5547-PF (Nl) .ptd Page 6 200307139 V. Description of the invention (3) Rising again, meanwhile, as shown by the dotted line B, a large current flows at an instant, and the insulation resistance value R is The moment the spark occurs almost becomes 0Q, and then it gradually increases. ° After the spark occurs, 'because the voltage between the wirings increases toward the applied voltage v, the current flowing between the wirings P1 and P2 decreases, so , The insulation resistance value R between the wiring PI and P2 will increase. However, as the insulation electrical limit R changes due to sparks, as shown by the dotted lines C and D, the increased waveform is also in an unstable state. In this way, as shown by the dashed line c, at the inspection time 12 ', if the insulation resistance value R is equal to or higher than the product grade value R ef, the circuit board can be judged to be a good product. As shown by the dashed line D, the insulation resistance value r is greater than the critical value Ref If it is small, the circuit board is judged to be defective. ^ Because the insulation resistance value R due to sparks is smaller than the critical value Re f, the circuit board can be judged to be a defective product at the detection time t2 even with a conventional insulation inspection method, so this situation does not exist What a special question. However, in the case where the insulation resistance value R is above the critical value Re as shown by the dotted line C, the circuit board is judged as a good product at the detection time 12 according to a conventional insulation inspection method, so Among circuit boards judged to be excellent products, circuit boards whose insulation resistance value R changes due to sparks during the insulation inspection, and circuit boards which are not ', x' are mixed together. Because of the spark resistance and the edge resistance, the circuit board where R changes will be more + due to the occurrence of sparks, which will cause some f damage. Therefore, compared with the circuit board that does not generate sparks, the reliability of the product will be reduced. , Then it will appear on this = installing circuit parts or checking the installed components; =

2014-5547-PF(Nl) ptd2014-5547-PF (Nl) ptd

200307139 五、發明說明(4) ---- 時’由於熱、電氣、以及機械的疲勞而今丨起電路基 等問題。 〜 經絕緣檢查裝置被判斷為優良品的電路基板,之後, 又變成了不良品的發生’會使絕緣檢查裝置的信賴度明· 地被降低。因此,有必要設法不讓那些因絕緣檢查中火花 的發生而引起絕緣電阻值R發生變化的電路基板、斑不是 這種情況的電路基板都混在一起,可能被判斷為優良品的 電路基板的情況發生。 本發明的目的在於,提供一種電路基板之絕緣檢查裝 置以及絕緣檢查方法,可以確保將發生過火花的電路基^ 作為不良品而進行區別。 用以解決課題的手段 本發明的電路基板之絕緣檢查裝置,在配線之間施加 既定的直流電壓,在上述配線之間的電壓處於穩定時的既 定時刻,根據上述電壓值和由施加電壓所引起的在上述配 線之間流動的電流值,計算出上述配線之間的電阻值,再 根據此電阻值來判斷電路基板是否為良好,其特徵在於包 括··火花檢測裝置,用來檢測因施加上述電壓而引起在^ 述配線之間發生的火花;及判斷裝置,一旦由上述火花檢 測裝置檢測出有火花發生,則判斷該電路基板為不良品。 根據本發明的另一形態,本發明的電路基板之絕緣檢 查方法,在配線之間施加既定的直流電壓,在上述配線之 間的電壓處於穩定時的既定時刻,根據上述電壓值和由施 i^^ii im 2014-5547-PF(Nl) ptd ^ ' 楚 〇 百 ' -- 200307139 五、發明說明(5) =述:f之間流動的電流值,計算出上 ,其特徵在於包括:檢測因上述施加電壓而引起 述電壓處於穩定為止而發生在上述配線之間的火花 刺=砧带及一旦檢測出有火花發生,則不管基於電阻值而 的步驟路基板是否為良好,均判斷該電路基板為不良品 根據以上的發明,在配線之間施加了既定的直流電壓 ,在該配線之間的電壓處於穩定的既定時刻,檢測出 2之間的電壓值V和該配線之間流動的電流值!,再根據❿ k *固檢測值計算出此配線之間的絕緣電阻值R = v/ j,通 過將此絕緣電阻值R與預先設定的臨界值Ref進行比較,則 =對電路基板是否良好來進行判斷。也就是說,如果絕 丄緣電阻在臨界值Ref以上,則判斷電路基板為優良品, 如果絕緣電阻值R比臨界值Ref小,則判斷電路基板為不良 品0200307139 V. Description of the invention (4) ---- The problem of circuit-based problems arises due to thermal, electrical, and mechanical fatigue. ~ A circuit board judged to be a good product by an insulation inspection device, and then it becomes a defective product ', which will significantly reduce the reliability of the insulation inspection device. Therefore, it is necessary to try to prevent the circuit boards whose insulation resistance value R is changed due to the occurrence of sparks during the insulation inspection, and the circuit boards which are not in this case mixed together, which may be judged as a good circuit board. occur. An object of the present invention is to provide an insulation inspection device and an insulation inspection method for a circuit board, which can ensure that a circuit substrate on which a spark has occurred is distinguished as a defective product. Means for Solving the Problem The insulation inspection device for a circuit board of the present invention applies a predetermined DC voltage between wirings, and a predetermined time when the voltage between the wirings is stable, based on the voltage value and the voltage caused by the applied voltage. The current value flowing between the wirings is used to calculate the resistance value between the wirings, and then the circuit board is judged to be good based on the resistance value. It is characterized by including a spark detection device that detects The spark generated between the wirings caused by the voltage; and the judging device, once the spark detection is detected by the spark detecting device, judges that the circuit board is defective. According to another aspect of the present invention, in the method for inspecting the insulation of a circuit board of the present invention, a predetermined DC voltage is applied between wirings, and a predetermined time when the voltage between the wirings is stable, according to the voltage value and the voltage applied by ^^ ii im 2014-5547-PF (Nl) ptd ^ 'chu〇 百'-200307139 V. Description of the invention (5) = Description: The value of the current flowing between f is calculated. It is characterized by: Spark thorns that occur between the wires until the voltage is stable due to the applied voltage = anvil strips and once a spark is detected, the circuit is judged whether the step board is good based on the resistance value The substrate is defective. According to the above invention, a predetermined DC voltage is applied between the wirings, and when the voltage between the wirings is stable at a predetermined time, the voltage value V between 2 and the current flowing between the wirings is detected. value! , And then calculate the insulation resistance value R = v / j between this wiring based on the 检测 k * solid detection value. By comparing this insulation resistance value R with a preset threshold value Ref, then = whether the circuit board is good or not Make judgments. That is, if the insulation resistance is above the threshold value Ref, the circuit board is judged to be a good product, and if the insulation resistance value R is smaller than the threshold value Ref, the circuit board is judged to be a defective product.

而且,根據上述絕緣電阻值來對電路基板進行的絕 檢查過程中,自配線之間施加既定的直流電壓之後到該 線之間的電壓處於穩定的既定時刻為止的期間内,一旦 線之間發生了火花,其火花的發生就能被檢測出,而不 根據電阻值的判斷電路基板是否良好,發生了火花的電 基板直接被判斷為不良品。由此,就可以確實地防止通 絕緣檢查而被判斷為優良品的電路基板中有火花發生 電路基板混入的可能性。In addition, during the insulation inspection of the circuit board based on the above-mentioned insulation resistance value, once a predetermined DC voltage is applied between the wirings and the voltage between the lines is stable at a predetermined time, once it occurs between the lines After a spark is generated, the occurrence of the spark can be detected without judging whether the circuit board is good or not based on the resistance value, and the electric substrate on which the spark has occurred is directly judged as a defective product. Accordingly, it is possible to reliably prevent the occurrence of sparks in the circuit board which is judged to be a good product through the insulation inspection.

200307139 五、發明說明(6) 而且,本發明 線之間施加既定的 為面電位來施加上 加既定的直流電壓 加上述直流電壓的 小於將面積大的配 火花發生而引起的 並且,又因為 於穩定所需要的時 要短’所以,可以 良好的判斷時刻, 又因為由火花 比面積大的配線要 花的情況下,將面 測出火花。 而且,本發明 括操作裝置,用來 述既定時刻。並且 時刻,可以預先進 根據此特徵, 良好進行判斷的上 的時間來監视是否 的信賴度得以提高 情況下,因為縮短 的電路 直流電 述直流 時,是 ,所以 線作為 配線等 施加直 間比將 提前根 從而縮 發生所 大,所 積小的 基板之 壓時, 電壓。 將面積 ’火花 而電位 的損傷 流電壓 面積大 據上述 短檢查 引起的 以,在 配線作 絕緣檢查裝置,在上述配 還可以將面積小的配線作 這樣,由於在配線之間施 小的配線作為高電位來施 發生時流動的火花電流就 的情況,由此可以減小由 〇 後,到配線之間的電壓處 的配線作為高電位的情況 電阻值判斷電路基板是否 時間。 電壓變化,面積小的配線 基於電壓的變化來檢測火 為高電位還可以準確地檢 的電路基板之絕緣檢查裝置,還可以包 改變對電路基板是否良好進行判斷的上 丄上述的判斷電路基板是否良好的既定 仃任意地設定。 裝置來延遲對電路基板是否 有火花的發生,% 因為可以有較長 。而另一方 斤以,,製品(電路基板) 了檢查時間,戶斤以d ?定時刻的 破*可以知:咼檢查的效 2014.5547-PF(Nl).ptd 第10頁 200307139 五、發明說明(7) 率。因此,通 進行判斷的既 果的平衡,來 而且,本 檢測裝置,還 裝置、和當施 判斷裝置。具 既定的週期對 次的信號和這 路基板之絕緣 出火花的發生 進行準確而有 而且,本 括工序控制裝 控制不再進行 檢查。並且, 測出有火花, 根據此特 火花發生,則 對許多電路基 過設置操作 定時刻,則 自由地設定 發明的電路 可以包括用 加電壓突然 體地來說, 施加電壓進 次的信號進 檢查方法, 。根據這些 效地檢測。 發明的電路 置,一旦由 其後的檢查 上述電路基 就結束對該 徵,因為一 可以省去其 板進行檢查 裝置來 可以兼 上述既 基板之 於檢測 下降時 上述火 行抽樣 行比較 可以基 特徵, 基板之 火花檢 工序, 板之絕 電路基 旦檢測 後的檢 時具有 改變對 顧產品 定時刻 、絕緣檢 上述施 則判斷 花檢測 的抽樣 比較裝 於施加 則可以 電路基板 的信賴度 〇 查骏置的 加電壓的 有火花發 裝置,可 保持裝置 置。而且 電壓的下 達到對火 是否良好 和檢查效 上述火花 電壓檢測 生的火花 以包括按 和,將上 ,上述電 降來檢測 花的發生 絕緣檢查裝置,還可以包 测裝置檢測出有火花,則 而是結束對該電路基板的 緣檢查方法,也是一旦檢 板所進行的檢查工序。 出被檢查中的電路基板有 查工序,所以,特別是在 較好的檢查效率。 實施方式 一圖1係有關本發明的絕緣檢查裝置的一個實施例的結 構示意圖。200307139 V. Description of the invention (6) Moreover, the application of a predetermined surface potential between the lines of the present invention to apply a predetermined DC voltage plus the above-mentioned DC voltage which is smaller than a large-area spark that occurs and is also caused by The time required for stabilization is short. Therefore, the time can be judged well, and the spark is measured on the surface when the wiring with a large spark specific area is required. Moreover, the present invention includes an operating device for describing a predetermined time. And at any time, based on this feature, you can make a good judgment on the time to monitor whether the reliability has been improved. Because the shortened circuit is DC and DC, yes, so the wire is used as wiring, etc. The root causes the voltage to be reduced when the substrate pressure is large and the accumulated substrate is small. According to the above short inspection, the area of the spark and the potential of the damage current voltage is large. The wiring is used as an insulation inspection device. In the above configuration, the wiring with a small area can also be made as this. When the high potential is applied to the spark current flowing when it occurs, it is possible to reduce the resistance value of the wiring at the voltage between the wirings from zero to high to determine the circuit board time. Voltage change, wiring with a small area detects the fire based on the change in voltage. The circuit board's insulation inspection device can also accurately check the circuit board. It can also change the circuit board ’s goodness. Good established: set arbitrarily. The device is used to delay the occurrence of sparks on the circuit board, because it can be longer. And the other side, the product (circuit board) has been inspected, and the household is broken at a fixed time d. It can be known that the effect of the inspection is 2014.5547-PF (Nl) .ptd Page 10, 200307139 V. Description of the invention ( 7) rate. Therefore, it is necessary to perform a judgment on the balance of the results, and the present detection device, and the judgment device. With a predetermined cycle, the signal and the spark of the substrate insulation are accurately and accurately generated. Moreover, the process control device and control are no longer checked. In addition, a spark is detected. According to the occurrence of this special spark, many circuit bases are set to operate at fixed timings. The circuit of the invention can be freely set to include the application of a voltage to the signal. Method,. Based on these effective detection. The invented circuit set ends the sign as soon as the circuit base is inspected later, because the board can be omitted and the inspection device can be omitted, which can be combined with the above-mentioned sampling method when the substrate is lowered. The spark inspection process of the substrate, the inspection time of the board's insulation circuit can be changed after the inspection of the product, the insulation inspection, the above-mentioned rules to determine the sampling of flower detection, and the reliability of the circuit board can be installed when applied. The voltage-increasing spark generator can keep the device set. In addition, if the voltage is lowered, it is good to check the fire. The spark generated by the above-mentioned spark voltage test includes pressing the sum, the above, the above-mentioned electric drop to detect the occurrence of flowers. Instead, the edge inspection method for the circuit board is ended, and the inspection process is performed once the board is inspected. There is an inspection process for the circuit board being inspected, so in particular, it has a better inspection efficiency. Embodiment 1 FIG. 1 is a schematic structural view of an embodiment of an insulation inspection device according to the present invention.

200307139200307139

絕緣檢查m,對於在未圖示的 置的各酉己線P1~P5,用在習知技術中已 判斷與其他配線的絕緣狀態是否良好,當確認了所有的配 線P1〜P5與其他配線之間的絕緣狀況都為良好時,則可以 電:基板為優良A ’而當只要存在一個絕緣狀況不 良的部分日守’則將電路基板判斷為不良品。 而且,為瞭解決由上述火花發生而出現的問題,還配 置有一種在絕緣檢查中能夠檢測出配線之間發生過火花, 並且在檢測出有火花發生時,則判斷電路基板為不良品的 結構。 絕緣檢查裝置1,具有可變電壓源2、電壓表3、與設 置在未圖示的電路基板上的配線P1〜p5連接的開關電路4 、電流計5、控制裝置6、火花檢出電路7、D/A轉換器8、 A/D轉換器9和10。而且,D/A轉換器8將由控制裝置6向可 變電壓源2輸出的控制信號(控制輸出電壓的數值信號)轉 變成模擬信號。A/D轉換器9將從電壓表3輸入到控制裝置6 的電壓檢測信號(模擬信號)轉換成數值信號,A/D轉換器 1>〇是將從電流計5輸入到控制裝置6的電流檢測信號(模擬 5虎)轉換成數值信號。 、、邑 '、本檢查裝置1,基本上是在圖4所示的習知的絕緣檢 查裝置100上追加了火花檢出電路7而構成的。也就是,絕 緣檢查裝置1的可變電壓源2 1壓表3、開關電路4、電流 計5以及控制裝置6分別相當於絕緣檢查裝置1〇〇的可變電 壓源101、電壓表102、開關電路103、電流計1〇4以及控Insulation inspection m. For each of the self-contained wires P1 to P5, which is not shown, is used in conventional techniques to determine whether the insulation status with other wiring is good. When all wirings P1 to P5 and other wirings are confirmed, When the insulation conditions between the two are good, it is possible to electrify: the substrate is excellent A ', and when there is only one part of the watch that has a poor insulation condition, the circuit substrate is judged to be defective. In addition, in order to solve the problem caused by the occurrence of the above-mentioned sparks, a structure capable of detecting that a spark has occurred between the wirings during the insulation inspection and determining that the circuit board is a defective product when a spark is detected . The insulation inspection device 1 includes a variable voltage source 2, a voltmeter 3, a switch circuit 4 connected to wirings P1 to p5 provided on a circuit board (not shown), an ammeter 5, a control device 6, and a spark detection circuit 7. , D / A converter 8, A / D converter 9 and 10. Further, the D / A converter 8 converts a control signal (numerical signal for controlling the output voltage) output from the control device 6 to the variable voltage source 2 into an analog signal. The A / D converter 9 converts a voltage detection signal (analog signal) input from the voltmeter 3 to the control device 6 into a numerical signal, and the A / D converter 1 is a current input from the ammeter 5 to the control device 6 The detection signal (analog 5 tiger) is converted into a numerical signal. The inspection apparatus 1 is basically constituted by adding a spark detection circuit 7 to the conventional insulation inspection apparatus 100 shown in Fig. 4. That is, the variable voltage source 21, the voltmeter 3, the switch circuit 4, the ammeter 5, and the control device 6 of the insulation inspection device 1 correspond to the variable voltage source 101, the voltmeter 102, and the switch of the insulation inspection device 100, respectively. Circuit 103, ammeter 104 and control

2014-5547-PF(Nl) ptd 第12頁 200307139 &、發明說明(9) 制裝置1 0 5,夂却从1 儘管圖4所:的功能也基本上是相同的。 .+ 所不的習知的絕緣檢查裝置丨χ ^ 線為例來對檢測眉 1 0 〇,是以2根配 你列原理進行了說明,而實 電路基板上形成右^ 、不上,在被檢查的 ί各配線之間的絕緣狀丨兄,是該技術領ί :同的原理來檢 ^發明的實施例,t同樣是針對 巧眾所周知的其 定為5根,如以^下疋所’、/,了 "說明其檢查原王里,將I線的數目 行組合,來進行p ’L攸配線p 1〜P 5中選擇適當的配線進 也同樣可以詳述此檢查原理。… 次,對多數的配線 頂被:ί 2、P2為兩端有接點的直線配線W個 各自有接點的呈ϋ 配線,配_、Ρ 5為4個頂端 小為: 十子开7的配線。配線Ρ卜Ρ5的各面積的大 PI = Ρ2<Ρ3< Ρ4= Ρ5 有關此面積的内容將在後面詳細敘述。2014-5547-PF (Nl) ptd page 12 200307139 & Invention Description (9) Manufacturing device 1 0 5, but from 1 Although Figure 4: The function is basically the same. . + The conventional insulation inspection device 丨 χ ^ line is used as an example to detect the eyebrows 1 0 〇, and the principle of 2 pairs of columns is explained, and the right circuit board is formed on the real circuit board. The insulation between the wirings being inspected is the technical principle of this invention. The same principle is used to check the embodiments of the invention. T is also set to 5 for the well-known, as indicated by ^ 下 疋'、 / , 了 " Explain that the inspection of the original Wangli, combining the number of lines of the I line to carry out p' Lyou wiring p 1 ~ P 5 also select the appropriate wiring entry can also detail this inspection principle. … Times, for most of the wiring quilts: ί 2. P2 is a linear wiring with contacts at both ends. W is a ϋ wiring with contacts, and _ and P 5 are 4 tops. The small ones are: Ten sons open 7 Wiring. The large area of each area of the wiring Pb P5 PI = P2 < P3 < P4 = P5 The content of this area will be described in detail later.

而且’基於配線數目的I 關雷政不同,在檢查裝置100中的開 關電路103是由1個開關而構 ^ ^ ^ ^ ^ 同的是開關電路4的結構為轉成換的/而在本實施例中’所不 q,μ、+、认姑从 稱局轉換組開關SWi (i = i、2、··· 5),上述的轉換開關是由每根配 、 可變電壓源2連接的開關TiU 、 ( 、2、…5)的^ , 0 r關以1〜1、2、…5)和與電流計5連 接的Ml(1 = 1、2、…5)而構成的。 可變電壓源2,係用於向扒* ^ Φ /¾ r ,ν nr ^ ^ . 、门檢查對象的配線之間施加既 疋電壓(以下稱為試驗電壓),And 'I ’m different based on the number of wirings. The switching circuit 103 in the inspection device 100 is composed of 1 switch. ^ ^ ^ ^ ^ The structure of the switching circuit 4 is changed to / In the embodiment, “all, q, μ, +, and admittance are called the local switching group switch SWi (i = i, 2, ... 5), and the above-mentioned switching switches are connected by each matched, variable voltage source 2 ^, 0 r of the switches TiU, (, 2, ... 5) are composed of 1 ~ 1,2, ... 5) and Ml (1 = 1,2, ... 5) connected to the ammeter 5. Variable voltage source 2 is used to apply the existing voltage (hereinafter referred to as the test voltage) between the wire * ^ Φ / ¾ r, ν nr ^ ^. And the wiring of the door inspection object,

; 通過由D/A轉換器8進行D/A; D / A by D / A converter 8

200307139 五、發明說明(ίο) 轉換:5置的控制信號,其輸出電壓可以得到控制。 之門的i ΐ用於測量高電位的配線和低電位的配線 “ 壓表3測量㈣的電屡信息,、經過"D轉 換抑9進仃A/D轉換之後被輸入到控制裝置6中。 5)作為檢查對象的配線,將各配線 的西:〜電路4,根據預先設定的組合,可以將如上所述 的配線Pi ( 1 = 1、2、… P i與絕緣檢查裝置1邊^千彳查;/ i 阳_: 的正極開關T1、以及將 L Λ J流計5上的負極開關Μι。同樣,轉換開關 =^ 針2”5連接在可變電請上的正極憤 二〜、以及將配線P2〜P5連接在電流計5上的負極 開關M2〜M5。開關電路4的各開關n〜T5、M2~肠,a 控制裝置6來對其開關轉換進行控制的。 疋由 =流計5,係用於測量在施加了電壓的配線之間流 換’哭10 : ·1 ’由此電流计5測量出的電流值,通過A/D轉 換為10進行A/D轉換之後,被輸入到控制裝置6中。 “火化檢查電路一7 ’係用來檢測因施加電壓而發生的 :一如圖5 (a )所不’由於一旦因施加了直流電壓v而 火化,可變電壓源2的輸出電壓就會突然降低,所以^生 過檢測此電壓的變化,則可以檢測出火花是否 通 檢查電路7,比如可以由抽樣保持電路、比較火花 :結構為,可以按既定的週期對電壓 七; 進行抽樣’並將前次的電壓信號和這次的電壓信^ = 車父,一旦檢測出有電壓波形的下降(這次的電壓較前次丁電比200307139 V. Description of the Invention (ίο) Conversion: 5 sets of control signals whose output voltage can be controlled. I ΐ of the door is used to measure high-potential wiring and low-potential wiring. "The pressure gauge 3 measures the electrical repeat information. It is input to the control device 6 after" D conversion and 9 conversion "and" A / D conversion. " 5) As the wiring to be inspected, the wiring of each wiring: ~ circuit 4, according to a preset combination, can be the wiring Pi (1 = 1, 2, ... P i and the insulation inspection device 1 side) as described above ^千 彳 查; / i __: the positive switch T1, and the negative switch Μι on the L Λ J flow meter 5. Similarly, the transfer switch = ^ pin 2 "5 connected to the positive pole of the variable power supply ~ And the negative switches M2 to M5 that connect the wiring P2 to P5 to the ammeter 5. The switches n to T5, M2 to the intestine of the switching circuit 4, and the control device 6 control their switching. 疋 由 = The ammeter 5 is used to measure the exchange of 'crying 10: · 1' between the voltage-applied wiring. After the current value measured by the ammeter 5 is A / D converted to 10 and A / D conversion is performed, It is input into the control device 6. "The cremation inspection circuit 7 'is used to detect what happens due to the application of voltage: one is as shown in Fig. 5 (a). 'Once the cremation is caused by the application of the DC voltage v, the output voltage of the variable voltage source 2 will suddenly decrease, so if the voltage change is detected, it can be detected whether the spark passes the inspection circuit 7, for example, by sampling Hold the circuit and compare the sparks: the structure is that the voltage seven can be sampled at a predetermined cycle; sampling is performed and the previous voltage signal and the current voltage signal ^ = car parent, once a drop in the voltage waveform is detected (this time the voltage Compared with the last time

200307139 五、發明說明(π) 壓小的情況),則輸出火花發生的信號。此火花檢出信 號,被輸入到控制裝置6。 控制裝置6包括:對開關電路4的各開關T1〜T5、Μ卜 Μ5進行0N/0FF (開關)轉換的轉換控制裝置61、利用電壓 表3檢測出的電壓值和電流計5檢測出的電壓值計算絕緣電 阻值R的電阻值計算裝置62、根據電阻值計算裝置62計算 出的電阻值R以及火花檢出電路7輸出的信號來判斷絕緣狀 況是否良好的判斷裝置6 3。 在本實施例中,轉換控制裝置6 1,如表1所示,對各 開關Τ1〜Τ 5、Μ1〜Μ 5進行0 Ν / 0 F F的轉換控制。 表1200307139 V. Description of the invention (π) When the pressure is small), the signal of spark occurrence is output. This spark detection signal is input to the control device 6. The control device 6 includes a switching control device 61 that performs 0N / 0FF (switching) switching of each of the switches T1 to T5 and M5 of the switching circuit 4, a voltage value detected by the voltmeter 3 and a voltage detected by the ammeter 5. A value calculation device 62 for calculating the insulation resistance value R, and a determination device 63 for determining whether the insulation status is good or not based on the resistance value R calculated by the resistance value calculation device 62 and a signal output from the spark detection circuit 7. In this embodiment, as shown in Table 1, the switching control device 61 performs switching control of 0 N / 0 F F on each of the switches T1 to T5 and M1 to M5. Table 1

SW1 SW2 SW3 SW4 SW5 T1 Ml T2 M2 T3 M3 T4 M4 T5 M5 第1次 ON — — ON — ON — ON — ON 第2次 — — ON — — ON — ON — ON 第3次 — — _ — ON — 一 ON — ON 第4次 — — — — — — ON — — ON 也就是,為了檢查配線Ρ1和其他的配線Ρ2〜Ρ5的絕緣 狀況,在將開關M2〜Μ5全部接通(0Ν)、使配線Ρ2〜P5處於 低電位之後,接通開關T1使配線P1處於高電位(第1次檢 查)。這樣,在本實施例中,配線P1和P2、P1和P3、 P1 和P4、以及P1和P5之間的絕緣檢查就可以同時進行。這是SW1 SW2 SW3 SW4 SW5 T1 Ml T2 M2 T3 M3 T4 M4 T5 M5 1st ON — — ON — ON — ON 2nd — — ON — — ON — ON — ON 3rd — — — — — — — One ON — ON 4th — — — — — — ON — — ON That is, in order to check the insulation status of wiring P1 and other wirings P2 to P5, all switches M2 to M5 are turned on (0N) and the wiring is turned on. After P2 to P5 are at a low potential, turn on the switch T1 to make the wiring P1 at a high potential (the first inspection). Thus, in this embodiment, the insulation inspection between the wirings P1 and P2, P1 and P3, P1 and P4, and P1 and P5 can be performed simultaneously. this is

2014-5547-PF(Nl) ptd 第15頁 200307139 五、發明說明(12) ' -------- 因為,本實施例的絕緣檢查裝置丨,即使不能檢測出是在 哪條配線之間發生了火花,但只要檢測出有火花發生就可 以將其電路基板作為不良品來進行區別,所以,只要在任 何配線之間檢測出有火花發生就足夠了。如此,由於配線 P1和其他的配線P2〜P5之間的絕緣檢查可以同時進行,所 以’對於配線P1和其他的配線p2〜P5的絕緣檢查,用!次 檢查就可以完成在分別進行各配線之間的絕緣檢查時所需 要的5次的檢查,從而可以大大地縮短絕緣檢查所需要的 時間。以下,對於第2次以後的檢查也同樣適用。 其次’為了檢查配線P2和其他的配線p3〜p5的絕緣狀 況,在將開關M3〜M5全部接通(on),使配線p3〜P5處於低 電位之後,接通開關T 2使配線p 2處於高電位(第2次檢 查)。在這裏,沒有接通開關Ml是因為在第}次的檢查中已 經對配線PI、P2進行了絕緣檢查。 一 接下來,為了檢查配線P3和其他的配線P4、p5的絕緣 狀況’在將開關M4、M5接通,使配線P4、P5處於低電位的 同時’接通開關T 3使配線P 3處於高電位(第3次檢查)。、 然後,為了檢查配線P4和配線p5的絕緣狀況,在將開 關M5接通,使配線P5處於低電位的同時,接通開關以使^ 線P4處於高電位(第4次檢查)。 響 對上述各開關的0N/0FF (開與關)的控制,還考慮 以下的幾點。 w 由於配線P1〜P5各自都有靜電電容,在即將開始放火 花時’與火花開始時的電壓VSps(參照圖5)相對應的正電2014-5547-PF (Nl) ptd Page 15 200307139 V. Description of the invention (12) -------- Because the insulation inspection device of this embodiment cannot detect which wiring it is, even Sparks have occurred, but the circuit board can be distinguished as a defective product as long as a spark is detected, so it is sufficient if a spark is detected between any wiring. In this way, since the insulation inspection between the wiring P1 and the other wirings P2 to P5 can be performed at the same time, 'for the insulation inspection of the wiring P1 and the other wirings p2 to P5, use! This inspection can complete the five inspections required for the insulation inspection between the individual wirings, which can greatly reduce the time required for the insulation inspection. The same applies to the second and subsequent inspections. Secondly, in order to check the insulation of the wiring P2 and other wirings p3 to p5, after all the switches M3 to M5 are turned on and the wirings p3 to P5 are at a low potential, the switch T 2 is turned on to make the wiring p 2 at High potential (second check). Here, the switch M1 is not turned on because the wiring PI and P2 have been subjected to an insulation inspection during the} th inspection. Next, in order to check the insulation status of wiring P3 and other wirings P4 and p5, 'while switches M4 and M5 are turned on, and wirings P4 and P5 are at a low potential, while turning on switch T3, wiring P3 is at a high level. Potential (3rd check). Then, in order to check the insulation of the wiring P4 and wiring p5, while the switch M5 is turned on so that the wiring P5 is at a low potential, the switch is turned on so that the wire P4 is at a high potential (the fourth inspection). To control the 0N / 0FF (on and off) of each switch mentioned above, the following points are also considered. w Since the wirings P1 to P5 each have an electrostatic capacitance, at the time when the spark is about to start, the positive voltage corresponding to the voltage VSps (see Figure 5) at the start of the spark.

2014-5547-PF(Nl).ptd ' 第 頁 ' *--- 200307139 五、發明說明(13) :广充,電到高電位的配線(與電屢源2的正接點連接的配 :Γ,在將面積/電電容與配線的面積成比例關係,所 配線作為高電位的情況、以及將面積 的配線)。因^當積7大==者=面㈣大 i 的配線作為高電位時的火花電流 較大匕,彳 線等就要承受 而且,當將面積較大的 將面積較小的配線作為高電位的情況:相比::,兄、以及 位的情況來說,可以提前判斷時刻,J二配線作為高電 並且,因火花發生而引起G壓^細短檢查時間。 j差)’面積大的配線較面積小的配線、(:Vsps_寧 基於電壓的變化來檢測火花,-Λ j、s。因此,由於是 作為高電位,就難以進行火 M ’要是將面積大的配線 於是,在本實施例中,‘膚2測。 行如上所述的絕緣檢查時,將ς 1以上所述的情況,在進 而將面積大的配線作為低電位。積小的配線作為高電位, 比如,在表1的第1次檢查中,曰 的面積大的其他配線Ρ2〜ρ5 疋彳木用將具有比配線?1 面積小的配線Ρ 1接通正極開 ^極開關成為低電位,將 取為高電位。 第17頁 2014.5547-PF(Nl).ptd 200307139 五、發明說明(14) -- 電阻值汁算I置6 2 ’根據電壓表3所測量的電壓v和電 流計5所測量的電流I來計算出電阻值R(=v/I)。 判斷裝置63具有計時器63a,用此計時器63a計瞀從試 驗電壓被施加到配線之間時的時刻t〇開始所經過的^間, 通過對在配線的電壓處於穩定狀態時的既定時刻12 (參照 圖5)計算出的絕緣電阻值r和予先設定的臨界值訐以的^ 小進行比較,來判斷絕緣狀態是否良好。也就是,當計算 出來j電阻值R在臨界值訐以以上時,則判斷配線間的絕2014-5547-PF (Nl) .ptd 'Page' * --- 200307139 V. Description of the invention (13): Wide charge, wiring from electricity to high potential (distribution connected to the positive contact of electricity source 2: Γ In the case where the area / capacitance is proportional to the area of the wiring, the wiring is used in the case of high potential, and the wiring of the area). Because when the wiring of the product 7 is large, the wiring of the large i is used as the high spark current when the wiring is high, the wire and so on must be beared, and when the wiring with a larger area is used as the high potential Case: Compared with :, brother, and bit, you can judge the time in advance, J 2 wiring as high power, and G voltage due to sparks ^ short inspection time. j 差) 'A large-area wiring is smaller than a small-area wiring. (: Vsps_Ning detects sparks based on voltage changes, -Λ j, s. Therefore, since it is a high potential, it is difficult to fire M' If the area is Therefore, in this embodiment, “Skin 2” is tested. When performing the insulation inspection as described above, the above-mentioned conditions are used, and further, the wiring with a large area is regarded as a low potential. The wiring with a small area is used as High potential. For example, in the first inspection in Table 1, the other wirings P2 ~ ρ5 with a large area will have wiring P1 with a smaller area than wiring? 1. Turn on the positive pole switch to become low. The potential will be taken as the high potential. Page 17 2014.5547-PF (Nl) .ptd 200307139 V. Description of the invention (14)-The resistance value is set to 6 2 'The voltage v and ammeter measured according to voltmeter 3 5 Calculate the resistance value R (= v / I) by measuring the measured current I. The judging device 63 has a timer 63a, and the timer 63a is used to count from the time t0 when the test voltage is applied between the wirings. The time elapsed passes through the predetermined time when the voltage of the wiring is stable. (Refer to FIG. 5) The calculated insulation resistance value r is compared with a preset threshold value 讦 smaller to determine whether the insulation state is good. That is, when the calculated j resistance value R is above the threshold value 讦When the

緣狀態為良好’而在臨界值Rref以下日寺,則判斷配線間的 絕緣狀態為不良。 判斷裝置63,在基於上述絕緣電阻值!^對絕緣狀態是 否良好進行判斷中,一旦有來自火花檢出電路7的火^檢 號輸入,就不用再基於絕緣電阻值1^來判斷絕緣狀態 是否良好,而是直接判斷該電路基板為不良品。這是因 為,由於考慮到在絕緣檢查中發生了火花的電路基板會因 c务生而受到損傷,而使電路基板的絕緣特性的信賴 I降、L砭樣就可以確切地防止將這種信賴度不可靠的電 =土板混入到由絕緣檢查而被判斷為優良品的電路基板中The edge condition is good ', and if the temple is below the critical value Rref, it is judged that the insulation state between wirings is defective. The judging device 63 determines whether the insulation state is good based on the above-mentioned insulation resistance value! ^ Once a fire detection number from the spark detection circuit 7 is input, it is no longer necessary to determine whether the insulation state is based on the insulation resistance value 1 ^. Good, but the circuit board is directly judged as a defective product. This is because it is considered that the circuit board that has sparked during the insulation inspection may be damaged by the c-worker. Therefore, the reliability of the insulation characteristics of the circuit board is reduced, and the sample can prevent such trust. Unreliable electricity = soil board mixed into circuit board judged to be good by insulation inspection

从圃2所示的流程From the process shown in the nursery 2

及的絕緣檢查方法進行說明 如圖2所不,在檢查對象的配線接點之 加的試驗電壓(步驟#1),根據表!中的第i次檢查時的% SW卜SW5的設定條件,將開關電路3的負極開關MAs shown in Figure 2, the test voltage applied to the wiring contact of the inspection object (step # 1) is based on the table! The setting conditions of% SW and SW5 during the i-th inspection in the

200307139200307139

2、··· 5 )、正極開關 丁 i ( i = 1 、9 R λ #3),在檢杳對js μ π ^ 2、…5)順序接通(步驟#2、 由計時二線之間施加試驗電壓的同時,開始 田τ牙w bda的叶時(步驟#4)。 值)(ϊΐ#5ΓΛ數到既定的計數值(與時刻t2對應的計數 值步驟#5) ’則測量電壓值¥和 = 此電壓值V和電流丨_瞀+ ^ # ( v驟#6 ),再根據 判斷火亦I否路十开 電阻值R(步驟#7)。然後, YES),則判斷該電路美 有火化么生(步驟#8的 电路基扳為不良品(步驟#9)。 Φ 叶曾=果沒有發生火花(步驟#8的N〇),就判斷 ft f 阻值R是否在臨界值Rref以上(步驟 口 、、巴、味電阻值R在臨界值Rref以上(步驟#ι 〇的 YES),就判斷配線間的絕緣狀況為良好(步驟#ιι),如 在臨界值Rref以下(步驟#10的肌),則判 不良品(步驟#9)。 馬 並且,對表1的第4次(配線p 4和p 5之間)檢查,如果從 步驟#1到步驟#1 1其處理還沒有結束(步驟#12的⑽),則返 回步驟# 1 ’對剩下的檢查次數反復地執行上述的處理,如 果對表1所示的全部次數檢查完畢,則結束上述處理(步 驟#12的YES) ’並判斷電路基板為優良品(步驟#1 3),從"而 結束整個絕緣檢查。 如此,即可以在配線的電壓處於穩定狀態時的既定時 刻計算出電阻值R,通過比較此電阻值R和臨界值計以的大 小’來判斷配線的絕緣狀悲疋否良好,又可以在進行上述 判斷之前檢測出發生在配線之間的火花。由於在檢測出有2 .... 5), the positive switch D i (i = 1, 9 R λ # 3), turn on in order to check js μ π ^ 2, ... 5) in sequence (step # 2, by the timing second line) When the test voltage is applied at the same time, when the leaves of the field τ 牙 w bda are started (step # 4). (Ϊΐ # 5ΓΛ count to a predetermined count value (count value corresponding to time t2 step # 5) 'The voltage is measured Value ¥ sum = the voltage value V and the current 丨 _ 瞀 + ^ # (vstep # 6), and then according to the determination of the fire resistance I open the resistance value R (step # 7). Then, YES), then judge the Is there any cremation in the circuit beauty (the circuit board in step # 8 is defective (step # 9). Φ Ye Zeng = no spark has occurred (No in step # 8), then determine whether the resistance value R of ft f is critical If the value Rref is greater than (step, bar, and taste resistance value R is greater than the critical value Rref (YES in step # ι〇)), it is determined that the insulation status of the wiring is good (step # ιι), such as below the critical value Rref ( Step # 10 muscle), the defective product is judged (Step # 9). Then, the fourth time (between wiring p 4 and p 5) of Table 1 is checked, and if from step # 1 to step # 1 1 Processing is not over Step # 12 ⑽), then return to Step # 1 'The above-mentioned process is repeatedly performed for the remaining number of inspections, and if all the inspections shown in Table 1 are completed, the above-mentioned process is ended (YES in Step # 12)' The circuit board is judged to be a good product (step # 1 3), and the entire insulation inspection is terminated. In this way, the resistance value R can be calculated at a predetermined time when the voltage of the wiring is stable, and the resistance value R can be compared by The size of the threshold value is used to judge whether the insulation of the wiring is good, and the sparks occurring between the wirings can be detected before the above judgment is made.

200307139 五、發明說明(16) 火花時’就直接判斷電路美 由於在被判斷為優p σ :板為不良品,因此,可以防止 火花的發生而弓,電路基板中…因、絕緣檢查t 及不是這種情況的電 ^生甏化的電路基板、以 降。 电塔基板所引起的電路基板的信賴度下 值時而ΐ,採用的是在計數值達到既定 斷火花是否發生。“1;定狀態時的既定時刻,來判 以在„的時侯就判斷電路基板為不良品。 了 幻牛驟 1ΓΛ’如圖3所示’在完成與上述實施例的步驟 後,就判斷火花是否發生〜f_4的處理之 驟#25的N0),則_ $ t °果有火花發生(步 ,α斷4電路基板為不良品(步驟#33)。 备、卜,果沒有火花發生(步驟#25的YES),就在計數 "牛_7、 ),測量電壓值V和電流值 I(v驟#27) ’再根據此電壓值¥和電流1來計算電阻 驟#28),錢’判斷計算出來的電阻值1?是否在臨界值200307139 V. Description of the invention (16) When the spark is sparked, the circuit beauty is directly judged because the board is judged to be excellent p σ: the board is defective, so it can prevent the occurrence of sparks in the circuit board ... due to the insulation inspection t and This is not the case with an electrically-generated circuit board. The reliability of the circuit board caused by the tower substrate is sometimes reduced, and the counter value is used to determine whether the spark break occurs. "1; a predetermined time in a fixed state, to judge that the circuit board is defective at the time of„. After the imaginary step 1ΓΛ 'is shown in FIG. 3', after completing the steps with the above embodiment, it is determined whether a spark has occurred ~ f_4's processing step # 25 N0), then _ $ t ° If a spark occurs (step The circuit board of α break 4 is defective (step # 33). If no spark occurs (YES in step # 25), count " cattle_7,), and measure the voltage V and current I (v Step # 27) 'Calculate the resistance step # 28 according to this voltage value ¥ and current 1', and then judge whether the calculated resistance value 1 is at the critical value.

Rref以上(步驟#29),如果上述電阻值R在臨界值訂以以上 (步驟#29的YES),則判斷配線間的絕緣狀況為良好(步驟 #30),如果對所有次數的檢查其上述處理都結束了(步驟 #31的YES),則判斷電路基板為優良品(步驟#32),結束絕 緣檢查。另外,如果上述電阻值R比臨界值以以小(驟 #29的N0) ’則判斷s亥電路基板為不良品(步驟#33)。 然而,火花並不是只在剛施加電壓後的過渡期(電壓 2014-5547-PF(Nl).ptd 200307139 五、發明說明(17) 上升的時期)才發生,也又可能在電壓的穩定期發生。在 這種情況下,對於在達到時刻t2為止的穩定期内有火花發 生的電路基板來說,如上所述,會將其判斷為不良品,然 而在時刻12之後還繼續施加電壓的情況下,對於在上述時 刻12之後還有火花發生的電路基板來說,就會造成如果在 時刻t2判定為絕緣合格的話,也被判斷為優良品的情況的 發生。這樣,在被判斷為優良品的電路基板中又混入了, ^如,該電路基板的發貨目的地的檢查者在遲於時刻七2的 日守刻對該基片再重新做絕緣檢查時會被判斷為不良品的電 路基板,而一旦不良品的數量相對優良品的數量其比例較 大的話,就會有損於製品(電路基板)的信賴度。因此,只 要延遲該絕緣檢杳势署μ必丨幽士 内來-視是1=ί 斷時刻,就可以在較長的時間 ^ =否有火化的發生,這樣,能提高製品的信賴 二4仁ΐ =種情況下,因為1次絕緣檢查所需要的時間會 祐加,因此也就導致了檢查效率的降低。 借赛此正好相;5 西+、 , ^ 置一個,如圖]沾由&々要未,在上述貫施例的結構上再設 操作裝幻二及配置線在所二"檢查者用來變更判斷時刻的 的時刻設定裳置64 裝r::充用= 查精度(製品的信賴声4— f取好疋充分考慮所要求的檢 裝置11來變更判斷〇 ^查效率之間的平衡,利用操作 鈕構成,用來執行操作裝置11,例如可以由1組按 者延遲判斷時刻的八α,以上述時刻t2為基準,提前或 就能以-個既定“:日每按-次按鈕’判斷時刻 寸間k剞或延遲於時刻t 2的一種結Above Rref (step # 29), if the above-mentioned resistance value R is set above the critical value (YES in step # 29), it is judged that the insulation status of the wiring room is good (step # 30). When the processing is completed (YES in step # 31), the circuit board is judged to be a good product (step # 32), and the insulation inspection is ended. If the resistance value R is smaller than the critical value (N0 in step # 29) ', it is judged that the circuit board is defective (step # 33). However, the spark does not only occur during the transition period immediately after the voltage is applied (voltage 2014-5547-PF (Nl) .ptd 200307139 V. Description of the invention (17) rising period), it may also occur during the voltage stabilization period . In this case, as described above, a circuit board having a spark in the stable period up to time t2 is judged as a defective product. However, when a voltage is continuously applied after time 12, For the circuit board where sparks are generated after the time 12 described above, it may occur that if the insulation is determined to be qualified at time t2, it is also judged to be a good product. In this way, the circuit board judged to be a good product is mixed again. For example, when the inspector of the shipping destination of the circuit board performs a new insulation inspection on the substrate after the time mark of the time 7: 2. A circuit board that is judged to be a defective product, and if the number of defective products is relatively large compared to the number of good products, the reliability of the product (circuit board) will be impaired. Therefore, as long as the insulation inspection potential μ is delayed, it must be seen from the inside of the beast-it is regarded as 1 = til the break time, it can be in a long time ^ = whether cremation has occurred, so that the trust of the product can be improved. 2 4 Incheon = In this case, because the time required for one insulation inspection is increased, the inspection efficiency is reduced. Borrowing this is exactly the same; 5 West +,, ^ Set one, as shown in the figure] Zanyou & 々Wei Wei, on the structure of the above-mentioned embodiment, set the operation equipment magic two and the configuration line in the second "inspector The time setting for changing the judgment time is set to 64: r :: charge = check accuracy (the trust of the product 4 — f is good, and the judgment device 11 is taken into full consideration to change the judgment. The balance between the inspection efficiency It is composed of operation buttons for executing the operation device 11. For example, a group of people can delay the judgment of the time of eight α, and based on the above time t2, it can be advanced or can be set by a predetermined ": every time the button is pressed once 'Judge a time between k 寸 or a delay delayed at time t 2

2014-5547-PF(Nl) ptd 第21頁 200307139 五、發明說明(18) 構。 根據此結構,如圖5所示,當設定較時刻12延遲了一 個既定時間的時刻13為判斷時刻時,因為可以檢測出在上 述實施例中沒有檢測出的,在時刻t 2到時刻13之間發生的 火花(如虛線E所示),從而將電路基板判斷為不良品,這 樣就可以減少如上所述的在電路基板發貨目的地,檢查者 對該基片再重新做絕緣檢查時而被判斷為不良品的電路基 板’從而可以使製品的信賴度得到提高。 土 發明效果 根據本發明的電路基板之絕緣檢查裝置,由於在配線 之間施加既定的直流電壓,在檢測出由此施加電壓所引起 的,配線之間流動的電流的同時,又根據施加電壓和檢測 =來的電流來計算出此配線之間的絕緣電阻值,再根據此 、、、巴、、本電阻值來判斷電路基板是否為良好,而當因施加電壓 而I丨起配線之間有火花發生時,則直接判斷電路基板為不 ,⑽ 所以’可以確實地防止通過基於電阻值判斷而被判 斷為彳憂良品的電路基板中,混入有火花發生的電路基板。 “ ^且i根據本發明,由於在配線之間施加既定的直流 ^ ^ ^ 疋將面積小的配線作為高電位來施加上述直流電 【的所以丄火花發生時流動的火花電流則小於將面積大 的配線作為鬲電位的情ί兄,這樣可以減少因火花發生而引 ,的配線等的損傷。並且,χ因為施加直流電壓 線之間的雷懕接a ^ 4 i 疋所需要的時間比將面積大的配線作為高2014-5547-PF (Nl) ptd page 21 200307139 V. Description of the invention (18) structure. According to this structure, as shown in FIG. 5, when the time 13 that is a predetermined time delay from the time 12 is set as the judgment time, because it can be detected that it is not detected in the above embodiment, between time t 2 and time 13 Sparks (as shown by the dotted line E), so that the circuit board is judged to be defective, which can reduce the time when the circuit board is shipped as described above, and the inspector re-insulates the substrate. The circuit board 'judged to be a defective product can improve the reliability of the product. Effects of the Invention According to the insulation inspection device for a circuit board according to the present invention, since a predetermined DC voltage is applied between wirings, a current flowing between the wirings is detected at the same time as the current caused by the applied voltage is detected. Detect the current coming from to calculate the insulation resistance value between this wiring, and then judge whether the circuit board is good according to this resistance value, and when there is a gap between the wiring due to the applied voltage When a spark occurs, the circuit board is judged directly as “No”. Therefore, it is possible to surely prevent a circuit board where a spark is generated from being mixed into a circuit board judged to be a good product based on resistance value judgment. "^ And i According to the present invention, since a given direct current is applied between the wirings ^ ^ ^ 上述 The above-mentioned direct current is applied with a wiring having a small area as a high potential [so, the spark current flowing when a spark occurs is smaller than that of a large area. Wiring acts as a potential for 鬲 potential, which can reduce the damage caused by sparks, wiring, etc., and the time required for χ to connect a ^ 4 i 因为 due to the lightning between the applied DC voltage lines will be less than the area Large wiring as high

200307139 五、發明說明(19) 電位的情況要短,這樣可以提前根據上述電阻值判斷電路 基板是否良好的判斷時刻,從而縮短檢查時間。 而且,在基於電壓的變化來檢測火花的情況下,由於 因火花發生所引起的電壓變化,面積小的配線比面積大的 配線要大,所以,通過將面積小的配線作為高電位可以準 確地檢測出火花。 並且,本發明,因為還具備用來改變判斷電路基板是 否良好的上述既定時刻的操作裝置,這樣可以兼顧產品的 信賴度和檢查效果的平衡,自由地設定上述既定時刻。200307139 V. Description of the invention (19) The situation of the potential is shorter, so that it can be judged in advance whether the circuit substrate is good based on the above resistance value, thereby shortening the inspection time. Furthermore, in the case of detecting sparks based on a change in voltage, the wiring with a small area is larger than the wiring with a large area due to the voltage change due to the occurrence of the spark. Therefore, it is possible to accurately use the wiring with a small area as a high potential. Spark detected. In addition, the present invention is also provided with an operating device for changing the above-mentioned predetermined time for judging whether the circuit board is good or not, so that the reliability of the product and the balance of the inspection effect can be taken into consideration, and the above-mentioned predetermined time can be freely set.

2014-5547-PF(Nl) ptd 第23頁 200307139 圖式簡單說明 圖1係有關本發明的絕緣檢查裝置的一個實施例的結 構示意圖。 圖2係有關絕緣檢查方法的流程圖。 圖3係有關絕緣檢查方法的其他實施例的流程圖。 圖4係習知的絕緣檢查裝置的結構示意圖。 圖5係有關配線之間的電壓、在配線之間流動的電 流、以及電阻值變化的示意圖。 符號說明 2 電壓源 4開關電路 6控制裝置 8 D/A轉換器 1 0 A/D轉換器 61轉換控制裝置 6 3 判斷裝置 6 4 時刻設定裝置 1 0 1 電壓源 1 絕緣檢查裝置 3 電壓表 5 電流計 7 火花檢出電路 9 A/D轉換器 11操作裝置 62電阻值計算裝置 6 3 a 計時器 1 0 0 絕緣裝置 1 0 2 電壓表 1 0 3 開關 1 0 4 電流計 1 0 5 控制裝置2014-5547-PF (Nl) ptd page 23 200307139 Brief description of the drawings Fig. 1 is a schematic structural diagram of an embodiment of an insulation inspection device according to the present invention. Figure 2 is a flowchart of the insulation inspection method. FIG. 3 is a flowchart of another embodiment of the insulation inspection method. FIG. 4 is a schematic structural diagram of a conventional insulation inspection device. Fig. 5 is a diagram showing changes in voltage between wirings, current flowing between wirings, and resistance values. DESCRIPTION OF SYMBOLS 2 Voltage source 4 Switching circuit 6 Control device 8 D / A converter 1 0 A / D converter 61 Conversion control device 6 3 Judging device 6 4 Time setting device 1 0 1 Voltage source 1 Insulation inspection device 3 Voltmeter 5 Ammeter 7 Spark detection circuit 9 A / D converter 11 Operating device 62 Resistance value calculation device 6 3 a Timer 1 0 0 Insulation device 1 0 2 Voltmeter 1 0 3 Switch 1 0 4 Ammeter 1 0 5 Control device

2014-5547-PF(Nl).ptd 第24頁2014-5547-PF (Nl) .ptd Page 24

Claims (1)

200307139 六、申請專利範圍 1 · 一種 定的直流電 時刻,根據 之間流動的 據此電阻值 其特徵 火花檢 述配線之間 判斷裝 生,則判斷 2. 如申 置,其中, 面積小的配 3. 如申 置,其中, 既定時刻的 4 ·如申 置,其中, 電壓檢 火花判 發生。 5.如申 置,其中, 抽樣保 電路基板之 壓,在上述 上述電壓值 電流值,計 來判斷電路 在於包括: 測裝置,用 發生的火花 置,一旦由 該電路基板 請專利範圍 在向上述配 線作為高電 請專利範圍 還包括用來 操作裝置。 請專利範圍 上述火花檢 測裝置,用 斷裝置,在 請專利範圍 上述火花檢 持裝置,按200307139 VI. Application for patent scope 1 · A fixed DC moment, according to the characteristics of the resistance value and the characteristics of the spark flowing between the wires. If the wiring is judged, then judge 2. If it is applied, among them, the area with a small area is 3 If applied, among them, 4 at a predetermined time. If applied, where the voltage detection spark judgment occurs. 5. If applied, in which the voltage of the circuit board is sampled, and the above-mentioned voltage value and current value are used to determine the circuit. The test device includes: a test device, which is set with the generated spark. Once the circuit board is patented, the scope of the patent is to the above. Wiring as a high power patent also covers the use of the device to operate. The scope of the patent claims the above-mentioned spark detection device, the breaking device, the scope of the patent claims the above-mentioned spark detection device, according to 2014-5547-PF(Nl) ptd 第25頁 、巴、味檢查裝置,在配線之間施加既 配線之間的電壓處於穩定時的既定 施力口電壓所引起的在上述配線 ,出上述配線之間的電阻值 基板是否為良好, 再根 來:測因施加上述電壓而引起在上 檢測装置檢測出有火花發 =1項之電路基板之絕緣檢杳 t間施加既定的直流電壓—時將 來細1加上述直流電壓。 、 或2項之電路基板之絕 改變判斷電路基板是否良好::: 第1項之電路基板之絕緣檢 測裝置包括: —装 於檢測上述施加電壓;及 施加電壓突然下降時則判斷有火花 第4項之電路基板之絕緣檢杳壯 測裝置包括: ~衣 既定的週期對施加電壓進行抽樣· 2003071392014-5547-PF (Nl) ptd page 25, Pakistan, taste inspection device, between the wiring, the voltage between the existing wiring is stable when the voltage of the predetermined force application port voltage caused by the above wiring, out of the above wiring The resistance value between the substrates is good, and the root cause is: measure the spark voltage caused by the above detection device caused by the application of the above-mentioned detection device. The circuit board's insulation test has a predetermined DC voltage applied between time and time. 1 Apply the above DC voltage. The circuit board's absolute change to determine whether or not the circuit board is good: 2: The insulation test device for the circuit board of item 1 includes:-It is installed to detect the above-mentioned applied voltage; and it is judged that there is a spark when the applied voltage suddenly drops. The test device for the insulation inspection and testing of the circuit board includes: ~ Sampling the applied voltage at a predetermined cycle · 200307139 比較裝置 6.如申請專利範圍第丨項之電^&人的號進行比較。 置,其中,還包括工序控制裝置,板Λ絕緣檢查裝 測出有火花發生,%不再進行虽火化檢測裝置-旦檢 對電路基板的檢查。 灸的檢查工序,而是結束 7· —種電路基板之絕緣檢杳 定的直流電壓,在上述配線之間爺二配線之間施加既 時刻,根據上述電壓值和由施加= j時的既定 之間流動的電流值,計算出上述1所引起的在上述配線 據此電阻值來判斷電路基板是否為f間的電阻值,再根 其特徵在於包括下列步驟:、又好 檢測因上述施加電壓而引走已 , 止而發生在上述配線之間的火花;、及上述電壓處於穩定為 旦檢測出有火花發生,則 ^ 電路基板是否為良好,肖判斷兮管基於電阻值而判斷的 8.如申請專利範圍第7]:之V:/板為不良品。 法,其中,上述判斷電路基板路基板之絕緣檢查方 以預先任意地設定。 板疋否為良好的既定時刻,可 9 ·如申請專利範圍第7項 法,其中,基於檢測施加電壓的路基板之絕緣檢查方 10.如申請專利範圍第4::降來檢出火花的發生。 法,其中,當檢測出有火花、,路基板之絕緣檢查方 檢查工序。 有化毛生吩,則結束對電路基板的Comparison device 6. Compare the number of people with the number of persons applying for the patent application. In addition, it also includes a process control device. The board Λ insulation inspection device detects that a spark has occurred, and does not perform the inspection of the circuit board although the cremation detection device-once inspection. The inspection process of moxibustion ends with a DC voltage of 7 · — a kind of insulation inspection of the circuit board, and a given time is applied between the above wiring and the second wiring. According to the above voltage value and the predetermined value when applied = j Based on the current value flowing between the lines, the resistance value in the wiring caused by the above 1 is calculated to determine whether the circuit board is the resistance value between f, and it is further characterized by including the following steps: The spark has been drawn away, and the spark occurred between the above wirings; and the voltage is stable. Once a spark is detected, if the circuit board is good, Xiao judges whether the tube is judged based on the resistance value. Patent Application Scope 7]: V: / Board is defective. The method for determining the insulation of the circuit board and the circuit board may be arbitrarily set in advance. If the board is a good predetermined time, it can be 9 • As the seventh method of the scope of patent application, which is based on the insulation inspection of the circuit board to detect the applied voltage 10. If the scope of the patent application is 4 :: drop to detect the spark occur. In the method, when a spark is detected, the insulation inspection method of the circuit board is inspected. If there is a chemical compound, the end of the circuit board
TW92106490A 2002-05-17 2003-03-24 Apparatus and method for examining insulation of circuit board TWI221925B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103983906A (en) * 2014-06-11 2014-08-13 贵州贵航汽车零部件股份有限公司华阳电器公司 Detection method of insulation property of plastic part with metal insert
CN114740266A (en) * 2022-04-08 2022-07-12 东方电气集团东方电机有限公司 Insulation monitoring method, insulation monitoring device, electronic equipment and storage medium

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JP3953087B2 (en) * 2005-10-18 2007-08-01 日本電産リード株式会社 Insulation inspection device and insulation inspection method
TWI498571B (en) * 2013-03-29 2015-09-01 Nidec Read Corp Method and apparatus of inspecting insulation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103983906A (en) * 2014-06-11 2014-08-13 贵州贵航汽车零部件股份有限公司华阳电器公司 Detection method of insulation property of plastic part with metal insert
CN114740266A (en) * 2022-04-08 2022-07-12 东方电气集团东方电机有限公司 Insulation monitoring method, insulation monitoring device, electronic equipment and storage medium

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