TH151C3 - A device for testing single-chip I2C connectors. - Google Patents

Abstract

What was revealed was a single-zip I2C connector testing device for Electronic device I2C connector testing A single-zip I2C connector test device is electrically connected to the environment provision system. Tests that send a test signal out to an electronic device and send a second signal to A device for testing I2C connectors that are single-zip at the same time. Equipment for Tested a single solder I2C interface, consisting of one solder, second solder, and the first solder connector, which is also an I2C solder. Electrical connection to the I2C interface of the receiving electronic device. The first signal from the I2C connector of the electronic device, in response to the test signal, the second connector is electrically connected to the environment provisioning system. The test for the second reception Will use the zipper to complete the processing sequence for It helps the system to provide a test environment to test the I2C interface of an electronic device in response to the first and second signals.

Claims (9)

1. A device for testing single-zip I2C connectors that are connected via Power to the test environment provision system used to transmit the test signal out to the An electronic device with an I2C connector and a second transmission to the device for The single-chip I2C interface at the same time consists of a connector that is electrically connected to the I2C connector of the electronic device. For receiving the first signal from the I2C connector of the said electronic device in response to the test signal. First connector that is electrically connected to the environment provision system. Such a test for the aforementioned second signal reception and a zip for processing sequences to help the environment staging system. This test is used to test the I2C interface for such electronic devices. In response to the first signal and the second said signal. 2. A device for testing single-zip I2C connectors according to claim 1, where the chip consists of Memory for saving the corresponding rules between the first such signal. And the second signal is when the I2C interface of the said electronic device. That does its job well A control unit that is electrically connected to the said memory for simplification. The aforementioned processing sequence was completed in accordance with the aforementioned harmonized rules and the response unit was electrically connected to the control unit for Execute a response sequence after the control unit has performed a sequence of steps. The processing is finished. 3. A device for testing single-chip I2C connectors according to claim 2, where the control unit is a comparator and a microprocessor. 4. A device for testing single-chip I2C connectors according to claim 2, where the aforementioned processing sequence compares the relationship received between the signal received. One such and the second thereof, with the aforementioned harmonized statutes for sure. Is the inherited relationship between the first such signal and the said second correct? Send test results to the response unit. 5. A device for testing single-chip I2C connectors according to claim 4, where the response unit is a display device. And the sequence of the aforementioned response process is Display the results of the aforementioned test on the display device. 6. A device for testing single-chip I2C connectors according to claim 4, where the response unit is a response circuit. And sequence of the aforementioned response process as a result The test is issued to the staging system for the said test environment. 7. A device for testing a single-chip I2C interface according to claim 2, where the said memory is read-only memory (ROM). 8. Device for testing single-chip I2C connectors according to claim 1, where such electronic equipment is a power source. And the first such connector It is an I2C connector. 9. A device for testing single-chip I2C connectors that are connected via Power to the test environment provision system used to transmit the test signal out to the An electronic device with an I2C connector and a second transmission to the device for Test the I2C single-chip connector. At the same time, it consists of one solder that is electrically connected to the I2C connector of the said electronic device for receiving the first signal from the I2C connector as follows. Of the said electronic device in response to the test signal. A second binder that has been electrically connected to the environment provision system. Such a test is for the aforementioned second signal reception and the chip for the I2C interface test of such electronic devices. It is said by comparing the inherited relationship between the first and the second such signals. With the corresponding rules between the first such signal and the second said The I2C interface of the said electronic device does a good job of verifying that the inherent relationship between the first and the aforementioned signals is correct and that that Send test results 1 0. Device for testing single-chip I2C interfaces in accordance with claim 9, where the corresponding rules are recorded in the memory of the test device. Such a single-chip I2C connector.