SU980028A1 - Device for sted-up fidality testing of units and components of radioelectric apparatus - Google Patents

Description

The invention relates to electrical engineering and can be used to create devices for testing the reliability of electronic components and their elements both at the design stage and in their mass production.

A device is known for automatic quantitative and qualitative control of electrical and time parameters ₁₀ , operating according to a shift program and consisting of parameter control and data processing units containing measuring and control circuits, block stimulating signals, program input switching block, decoder, control unit and output devices £ 1] ·

The disadvantage of this device is the inability to conduct accelerated tests in conditions as close as possible to real ones.

Closest to the proposed technical essence is a device containing a control unit, the outputs of which are connected respectively to the first inputs of the memory unit, analyzer, display unit and program unit, as well as to the input of the test generation units, the output of which is connected to one of the inputs of the test object the output of which is connected to the second input of the analyzer, the outputs of which are connected respectively to the third inputs of the memory block, control unit, and program block, the first output of which is connected to vy: the input of the control unit, and the multichannel output with a multichannel input of the switching unit, the other inputs of which are connected respectively to the outputs of the power supply and the equivalent load, and the outputs are connected to the corresponding inputs of the test object, while the output of the memory unit is connected to the second input of the display unit G 2].

980028 4

The disadvantages of the known device load, electromagnetic pulses are low accuracy and. lack of, accurate performance.

The purpose of the invention is improving accuracy and speed. ⁵

This goal is achieved by the fact that a device for accelerated testing of the reliability of components and components of electronic equipment, containing a control unit, the outputs of which are connected to the first inputs of the memory unit,. analyzer, display unit, and program unit as well as with the input of the test generation unit, the output of which is connected to one of the inputs of the test object, the output of which is connected to the second input of the analyzer, the outputs of which are connected to the third inputs of the memory unit, control unit, and program unit, the first output of which is connected to the first input of the control unit, and the multi-channel output is connected to the multi-channel input of the switching unit, the other inputs of which are connected respectively to the output of the memory unit and the equivalent load, and you moves - with the corresponding inputs of the test object, while the output of the memory unit is connected to the second input of the display unit, equipped with an additional program unit, a random pulse generator, units of increased electrical loads, vibration loads, increased heat load, electromagnetic pulses and infrared radiation, ³⁵ a also a counter of cycles and total operating hours, with the first input of the counter of cycles and total operating hours connected to the corresponding output of the control unit, the second input to the first ⁴⁰ output of the gene random pulse generator, the third input with one of the analyzer outputs, and the output with the second input. the storage unit, the first random pulse generator input connected to the output conductive zadayu- ⁴⁵ of the control unit, the second input - to the first output block of additional software, its first output - to multiple-input switching unit and the second output - to one of the inputs ⁵⁰ additional software block , the other input of which is connected to the second output of the program unit, the second output - with the second input of the control unit, and the other outputs - respectively, with the inputs of the units of increased, pf electric loads, vibration loads, increased th thermal and infrared radiation, the outputs of which are connected to the corresponding inputs of the equivalent load and the test object.

The drawing shows a structural diagram of a device.

The circuit contains a control unit 1, a random pulse generator 2, a memory unit, a counter of 4 cycles and total operating hours, a program unit 5, an additional program unit 6, a test generation unit 7, a switching unit '8, a unit 9 of increased electrical loads, a unit of 10 vibration loads , block 11 of increased thermal load, block 12 of electromagnetic pulses, block 13 of infrared radiation, analyzer 14, test object 15, equivalent load 16, power block 17 and display unit 18.

The device operates as follows.

At a command from the control unit 1, the registers in the memory unit 3 and the counter of 4 cycles and total operating time are reset. At the same time, the control unit 1 issues a permission signal to the first program unit 5, which, in accordance with the codes laid down in the program, issues a command to the switching unit 8 to connect 15 elements forming the test node in the test object, and to the additional program unit 6 to configure the random pulse generator 2 according to a certain law, according to the hard program laid down in the additional program unit 6. At the end of the switching of the initial set of components and execution of the setup program, 2 generator of random pulses switching unit 8 and an additional program block 6 Ready provide signals to the control unit. After that, the control unit 1 starts the random pulse generator 2, at the command of which the switching unit 8, in accordance with the predetermined distribution law, randomly connects the test object to the power supply unit 17. At the same time, from a random pulse generator, signals with a given law of distribution of durations between them are fed to the cycle counter and total operating hours and to an additional program unit 6, which, in accordance with the signals of the random pulse generator 2 and a given program, determines the modes and durations of additional disturbing effects on the test object 15 . 5

These disturbing effects are implemented by blocks 9-13, which tightens the test mode and brings it as close as possible to the conditions of actual operation. ⁰

Simultaneously with the start of the random pulse generator, the control unit 1 issues the Resolution command to the following blocks: to the unit 7 for generating tests at the beginning of the formation of tight ^{, 5} test signals arriving at the input of the test object; the analyzer 14, determining in the tolerance field or beyond its limits, contains the input signals of the test object; a count of 20 cycles of 4 cycles' and total operating time, which separately for each sample of the elements of the test object determines the total operating time, as well as the number of switching on and off moments, ²⁵ readings from the information received from the generator of 2 random pulses.

Considering that the durations of the presence and absence of additional disturbing effects reproduced by blocks 9–13 can obey different distribution laws, during the tests, the generator of 2 random pulses is reconfigured in accordance with the test program laid down in program block 5. For of this, block 5 issues a reconfiguration command to an additional program block 6, which, in accordance with its program, carries out the tuning of the generator 2 of random signals. In this case, if necessary, the test process for the duration of the reconfiguration can be stopped by the control unit 1 by a command from prog- 45 frame unit 5. After the end of the reconfiguration, unit 6 gives a Ready signal to the control unit, which issues the appropriate commands to continue the tests. _fifty

In the event of a failure of any element in the test object, the analyzer 14 reports this to the control unit 1, which stops the operation of the entire device. At the same time, the analyzer determines ^{55 the} code of the failed element and reports it to the memory unit 3, counter 4, and program unit 5. At the same time, the total operating time and the number of cycles on and off of the failed element are recorded by the signal from the control unit 1 to the memory unit 3 from counter 4. The corresponding data on the remaining elements of the tested device in the counter 4 remain unchanged. Then, according to the signal from the control unit 1, the program unit 5, in accordance with the test program and the code of the failed element, gives a signal to the switching unit 8 to replace the failed element with a working one from the equivalent load 16, after which the switching unit 8 gives the control unit 1 a signal of readiness to continue testing.

Further, at the command of control unit 1, the tests continue until the next failure of the test object. At the same time, in counter 4, the values of the total operating time and the number of on / off cycles for all elements except the replaced one are accumulated taking into account the previous values.

Tests end when to replace any component. element in the equivalent load 16 there is no serviceable sample. The number of backup serviceable samples in the equivalent load 16 is selected based on the required reliability of the test results. Information about the absence of a backup sample comes to the control unit 1 from the software, unit 5. The control unit 1 stops the operation of the entire device and issues a command to the memory unit 3 and the indication unit 18 to display results in the form of cycle numbers, total operating time and codes that failed in the process testing of elements, as well as the total number of loading cycles and the total operating time of the test unit as a whole. Based on the information received, the reliability indicators of the tested device are recalculated to normal operation.

Claims (2)

1. USSR author's certificate number 217729, cl. G06F 15/46, 1972, 2. USSR Authors ’Observation No. 446856. class. G01R 31/28, 1976 (prototype).