SU966629A1 - Device for testing switches with low-resistance shunting resistors - Google Patents

Description

A parallel circuit to which the main circuit of the formation of the restoring voltage, consisting of a series-connected resistor and a capacitor, and an auxiliary circuit consisting of successively connected resistors, a second reactor and a capacitor, are connected, is connected to a connecting element and a disconnecting element a resistor and a GTO reactor, one output of the tripping element is connected to the common output of the switch being tested and a capacitor, the other output of which is connected to the common terminal of resistor element and including aspirants.

The drawing shows a block diagram of the device.

. The device contains a source of 1. high voltage, the first reactor 2 main circuit 3 formation of a reducing voltage (HV, resistor 4, capacitor 5, second reactor 6, the test switch., disconnecting element 8, including element 9.

The device works as follows.

After the breaking of the disconnected current by the switch 7 on the high voltage source 1, there is a voltage. The high voltage source 1 begins to discharge through the first reactor 2 to the main switch 7 connected in parallel with the test switch 7. the HV 3 formation circuit and the resistor 4, the disconnecting element 8 is closed: the switching on element 9 is open, the initial part of the HV is closed. At a certain moment, the element 9 and the capacitor 5 are closed, the air preload begins to discharge through the second reactor 6 and the closed elements 8 and 9, creating a current that flows in the disconnecting element 8 against the current from source 1. At a certain point in time of the current in the tripping element 8 reaches zero and it interrupts this current, thereby transferring the resistor 4 to a series circuit with

WTO {LM reactor 6 and the capacitor with this curve bp reaches the required amplitude.

The use of a device for testing high-voltage switches with shunting resistors allows them to be conducted under conditions close to those of a test in a direct circuit with reduced costs of capacitive elements of a synthetic circuit.

Juvenile Formula

A device for testing switches with low-resistance shunt resistors, containing a series-connected high-voltage source in the form of a condenser battery, the first reactor at the test switch, parallel to which the bases of the restoring voltage are connected, and an additional series-connected resistor and capacitor, and additional a circuit consisting of a series connection of a resistor / second reactor and a capacitor, which is connected to the circuit; By expanding fuykshgonalnyh possibilities, sKJtKngaatayifi element and disconnect elements are introduced into it, and the switching-on element is connected between the resistor and the second reactor the common pin of the resistor and switch on i

Sources of information taken into consideration during the examination

1. Author's Certificate of the USSR 253927, cl. G 01 R 31/02, 1969.

2. Gonchar V.S. Reproduction of transient recovery voltage during testing of high voltage circuit breakers. -Ser. High-voltage devices, transformers, power capacitors. issue 11 (79), 1977.

Claims (1)

Formula Device for testing switches with low resistance shunt resistances, containing a high voltage source connected in series in the form of a capacitor bank, the first reactor 9 is a test switch, in parallel with which is connected the main ^ ΠΒχβΠΒ of the recovery voltage formation, consisting of a resistor and a capacitor connected in series, and an additional circuit consisting of a series-connected resistor, a second reactor and a capacitor, due to the fact that, with the aim functional features, a switching element and a disconnecting element are introduced into it, the switching element being connected between the resistor and the second reactor, one terminal of the disconnecting element is connected to the common terminal of the tested circuit breaker and capacitor, the other terminal of which is connected to the common terminal of the resistor and the switching element.